Merge the hybrid measurement method of contact type measurement and non-cpntact measurement
Technical field
The present invention relates to the mixed of workpiece calibration technical field more particularly to a kind of fusion contact type measurement and non-cpntact measurement
Close measurement method.
Background technique
In the product processing in the fields such as auto industry, aircraft industry, semi-conductor industry and mould industry, workpiece
Measurement it is particularly significant.The method of measurement workpiece mainly has contact measurement method and noncontact measuring method at present, and contact is surveyed
Amount method low efficiency but precision height, noncontact measuring method is high-efficient but precision is relatively low.How both sides are effectively combined
The advantages of method, takes into account efficiency and precision, so that efficiently obtaining accurate workpiece true form is that a technology urgently to be resolved is asked
Topic.
Paper " research of free form surface contact measurement method and prototype system development " (Zhejiang University's master thesis
2004) point of use contact probe measurement free curve surface work pieces obtain contact type measurement point, and are contacted these using software
Formula measurement point is fitted to curved surface, and this method measurement accuracy is high, but needs point-to-point measurement, and measurement efficiency is lower;Paper
《Evaluating the capability of laser scanning to measure an automotive
artefact A comparison study of touch trigger probe and laser-scanning》
(International Journal of Productivity and Quality Management the 4th phase in 2016) is right
Various comparisons and analysis have been done in point contact type measurement and laser scanning instrumentation measurement, are found relative to point contact type measurement side
Method, laser scanning instrumentation measurement efficiency is high, but other than some special characteristics, laser scanning instrumentation measurement accuracy is relatively low;
Paper " Atomated dimensional inspectionplanning using the combination of laser
Scanning and tactile probe " (Measurement the 5th phase in 2012) according to the local geometric features of workpiece and
Corresponding Product Manufacturing Information (includes: geometric dimension and tolerance, 3D text annotation and measures size, surface roughness and material
Gauge lattice etc.) items selection point contact type is popped one's head in or the measurement of laser scanning instrumentation progress local feature, it ties to a certain extent
Contact type measurement and non-cpntact measurement are closed, but this method is only that point contact type probe and laser scanning instrumentation are separated benefit
With, it is still lower with efficiency when point contact type probe measurement, and precision is still relatively low when being measured with laser scanning instrumentation.
Summary of the invention
Technical problem solved by the invention is to provide the mixing survey of a kind of fusion contact type measurement and non-cpntact measurement
Amount method, to solve the disadvantage in above-mentioned background technique.
Technical problem solved by the invention is realized using following technical scheme:
Merge the hybrid measurement method of contact type measurement and non-cpntact measurement, the specific steps are as follows:
1) first with noncontact measuring method rapid survey surface to be measured, preliminary non-cpntact measurement result is obtained;
2) according to the size on surface to be measured and local complexity, multiple contact type measurement point Pi are planned, and pass through contact
Mensuration measurement obtains the position of above-mentioned contact type measurement point Pi;
3) it will be obtained in step 2) based on the resulting preliminary non-cpntact measurement result of noncontact measuring method in step 1)
The position of contact type measurement point Pi be determined as correcting benchmark, preliminary non-cpntact measurement result resulting to step 1) repairs
Just, it is fitted to curved surface, and then obtains secondary non-cpntact measurement result;
4) position for calculating contact type measurement point Pi obtained in step 2) and secondary non-contact survey obtained in step 3)
Measure the difference and normal direction subpoint Qi of result;
Cross the normal N i that contact type measurement point Pi makees curved surface, intersection point, that is, contact type measurement point Pi of normal N i and fitting surface
Normal direction subpoint Qi, each contact type measurement point Pi to corresponding normal direction subpoint Qi distance, that is, each contact type measurement point
With the size of the difference of secondary non-cpntact measurement result, the symbol of difference is according to contact type measurement point and secondary non-cpntact measurement result
Relative position depending on;
5) normal direction subpoint Qi obtained in step 4) is divided in the resulting preliminary non-cpntact measurement result of step 1)
Grid, and obtain all grid nodes;
6) position further according to contact type measurement point Pi and contact type measurement point Pi and secondary non-cpntact measurement Comparative result
Obtained difference acquires the corresponding difference of each grid node in contact type measurement point Pi coverage area using bilinear interpolation method
Value, and the difference of the grid node outside contact type measurement point Pi coverage area then according to neighbouring four contact type measurement point Pi with
The difference linear interpolation that secondary non-cpntact measurement Comparative result obtains obtains, finally according to the resulting each grid node of calculating
Each grid node is moved in difference, the direction normal N i along preliminary non-cpntact measurement result, using revised grid node as
Point cloud is fitted to new curved surface again, and then completes measurement;
The difference that the contact type measurement point Pi and secondary non-cpntact measurement Comparative result obtain, size, that is, contact
For measurement point Pi to the distance of secondary non-cpntact measurement result, symbol is opposite with secondary non-cpntact measurement result according to measurement point
Depending on position.
The utility model has the advantages that
1) present invention only need to obtain preliminary non-cpntact measurement as a result, closing simultaneously using non-cpntact measurement for surface to be measured
Reason plans that a small amount of contact type measurement point can be by the data obtained by the position of point contact type probe measurement contact type measurement point
Processing obtains final measurement, compared with contact measurement method, further increases measurement efficiency;
2) the obtained final measurement of the present invention is the preliminary non-cpntact measurement result that is obtained using non-cpntact measurement as base
Plinth, the contact type measurement point obtained with contact type measurement are amendment benchmark, are modified to secondary non-cpntact measurement result, and non-
The measurement result that contact measurement obtains is compared, and has higher precision;While playing the odds for effectiveness of non-cpntact measurement, again
The accuracy benefits of contact type measurement are played, so that saving time of measuring improves measurement accuracy.
Detailed description of the invention
Fig. 1 is the workpiece schematic diagram in presently preferred embodiments of the present invention.
Fig. 2 is schematic diagram of the laser scanning instrumentation in presently preferred embodiments of the present invention along proper trajectory scanning workpiece.
Fig. 3 is the contact type measurement point planning schematic diagram in presently preferred embodiments of the present invention.
Fig. 4 is that the point contact type probe in presently preferred embodiments of the present invention measures workpiece acquired results with laser scanning instrumentation
Schematic diagram.
Fig. 5 is mistake normal direction subpoint grid division node signal on fitting surface in presently preferred embodiments of the present invention
Figure.
Fig. 6 is the bilinear interpolation method schematic illustration in presently preferred embodiments of the present invention.
Attached drawing mark: L and D are the size of workpiece in two directions, contact type measurement point Pi, normal N i, normal direction projection
Point Q i, i 1 ..., 9, f (i, j), f (i 10, j), f (i, j 10 1), f (i, j ten v), f (i 10, j ten v), f (i ten u, j ten
V), (1) i 10, j 10 is the difference of contact type measurement point Pi corresponding position to f, u indicates required contact type measurement point Pi to first
The distance of endpoint, v indicate the ratio of the region contact type measurement point Pi frontier distance.
Specific embodiment
In order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, tie below
Conjunction is specifically illustrating, and the present invention is further explained.
Referring to the hybrid measurement method for merging contact type measurement and non-cpntact measurement shown in FIG. 1 to FIG. 5, specific steps are such as
Under:
1) first with laser scanning instrumentation rapid survey surface to be measured, preliminary non-cpntact measurement result is obtained;
2) according to the size on surface to be measured and local complexity, 9 contact type measurement point P1~P9 are planned, and pass through a little
Contact probe measurement obtains the position of above-mentioned contact type measurement point P1~P9;
3) it will be obtained in step 2) based on the resulting preliminary non-cpntact measurement result of noncontact measuring method in step 1)
The position of contact type measurement point P1~P9 be determined as correcting benchmark, preliminary non-cpntact measurement result resulting to step 1) carries out
Amendment, is fitted to curved surface, and then obtain secondary non-cpntact measurement result;
4) position for calculating contact type measurement point P1~P9 obtained in step 2) non-connects with secondary obtained in step 3)
Touch the difference and normal direction subpoint Q i of measurement result;
As shown in figure 4,1~N9 of normal N that contact type measurement point P1~P9 makees curved surface is crossed, the friendship of normal N 1 and fitting surface
Point is the normal direction subpoint Q1 of contact type measurement point P1, distance of each contact type measurement point P1 to corresponding normal direction subpoint Q1
The size of the difference of i.e. each contact type measurement point and secondary non-cpntact measurement result, the symbol of difference according to contact type measurement point with
Depending on the relative position of secondary non-cpntact measurement result;The contact type measurement point Pi one side recessed in fitting surface is set in the present embodiment
Time difference value symbol is positive, then its corresponding 9 normal direction subpoint Qi coordinate of 9 contact type measurement point coordinates, 9 difference such as tables
Shown in 1:
Table 1 crosses the normal direction subpoint and difference data table of contact type measurement point
5) by normal direction subpoint Q1~Q9 obtained in step 4) in the resulting preliminary non-cpntact measurement result of step 1)
Grid division, and obtain all grid nodes;
6) position further according to contact type measurement point Pi and contact type measurement point Pi and secondary non-cpntact measurement Comparative result
Obtained difference acquires the corresponding difference of each grid node in contact type measurement point Pi coverage area using bilinear interpolation method
Value, and the difference of the grid node outside contact type measurement point Pi coverage area then according to neighbouring four contact type measurement point Pi with
The difference linear interpolation that secondary non-cpntact measurement Comparative result obtains obtains, and bilinear interpolation method is as shown in fig. 6, for (i, j+
V), the variation of f (i, j) to f (i, j+1) are linear relationship, then have:
F (i, j+v)=[f (i, j+1)-f (i, j)] * v+f (i, j) (1)
Similarly then have for (i+1, j+v):
F (i+1, j+v)=[f (i+1, j+1)-f (i+1, j)] * v+f (i+1, j) (2)
The variation of from f (i, j+v) to f (i+1, j+v) is also linear relationship, can be derived:
F (i+u, j+v)=(1-u) * (1-v) * f (i, j)+(1-u) * v*f (i, j+1)+u* (1-v) * f (i+1, j)+u*v*
F (i+1, j+1) (3)
With the intersection point Q of the 100th article of line and the 100th article of alignment in Fig. 5 in the net region Q1, Q2, Q4, Q5100.100For
Example, in conjunction with table 1 it is found that Q1To Q2Distance is 700mm, Q4To Q5Distance is 630mm, while setting the 1st article of line and the 100th article of column
Line intersection point is Q1.100If the 630th article of line and the 100th article of alignment intersection point are Q630.100, then Q100.100The value of delta at place100.100, such as
Lower calculating:
Assuming that Q1To Q2Difference variation be linear relationship, then Q1.100The value of delta at place1.100It answers are as follows:
Similarly, Q630.100The value of delta at place630.100It answers are as follows:
Then Q100.100The value of delta at place100.100It answers are as follows:
Assume again that Q1Q2 up the 10th article of line and from Q1 to Q2 the 100th article of alignment intersection point be Q-10.100, then Q-10.100Place
Value of delta-10.100It can calculate as follows:
Similarly, Q630.100The value of delta at place630.100It answers are as follows:
Then Q-10.100The value of delta at place-10.100It answers are as follows:
According to the difference for calculating gained grid node, each net is moved in the direction normal N i along preliminary non-cpntact measurement result
Lattice node is finally fitted to new curved surface using revised grid node as point cloud, to complete to measure again;
The difference that the contact type measurement point Pi and secondary non-cpntact measurement Comparative result obtain, size, that is, contact
For measurement point Pi to the distance of secondary non-cpntact measurement result, symbol is opposite with secondary non-cpntact measurement result according to measurement point
Depending on position;
In grid node, δ is taken100.100With with it go together behind for 9 points, before amendment, this 10 points after amendment
Coordinate and the corresponding difference of each point are as shown in table 2:
2 grid node of table corrects correlation data table
By combining non-cpntact measurement and two kinds of measurement advantages of contact measurement, and then saves time of measuring and improve measurement essence
Degree.
The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.