CN108369194A - 检查***及检查方法 - Google Patents

检查***及检查方法 Download PDF

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Publication number
CN108369194A
CN108369194A CN201680071390.9A CN201680071390A CN108369194A CN 108369194 A CN108369194 A CN 108369194A CN 201680071390 A CN201680071390 A CN 201680071390A CN 108369194 A CN108369194 A CN 108369194A
Authority
CN
China
Prior art keywords
photographic device
defect
inspection
prepreg
inspection object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201680071390.9A
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English (en)
Chinese (zh)
Inventor
岸由美子
日野真
坂井直树
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Publication of CN108369194A publication Critical patent/CN108369194A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201680071390.9A 2015-12-16 2016-12-09 检查***及检查方法 Pending CN108369194A (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2015-245600 2015-12-16
JP2015245600 2015-12-16
JP2015-245708 2015-12-16
JP2015245708 2015-12-16
PCT/JP2016/086778 WO2017104575A1 (ja) 2015-12-16 2016-12-09 検査システム及び検査方法

Publications (1)

Publication Number Publication Date
CN108369194A true CN108369194A (zh) 2018-08-03

Family

ID=59056609

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201680071390.9A Pending CN108369194A (zh) 2015-12-16 2016-12-09 检查***及检查方法

Country Status (5)

Country Link
JP (1) JP6677260B2 (ja)
KR (1) KR102141216B1 (ja)
CN (1) CN108369194A (ja)
TW (1) TWI622766B (ja)
WO (1) WO2017104575A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110376203A (zh) * 2019-06-26 2019-10-25 阳程科技股份有限公司 玻璃纤维丝检测机台及其检测方法
CN111982929A (zh) * 2020-08-14 2020-11-24 加藤义晴 一种电子部件检测设备及电子部件检测方法
CN113267514A (zh) * 2021-06-25 2021-08-17 国网河南省电力公司电力科学研究院 一种玻璃丝纤维绝缘拉杆质量的光学检测方法和装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107643291A (zh) * 2017-10-25 2018-01-30 佛山市南海鑫隆机工机械有限公司 一种瓷具把手缺陷检测装置及方法
WO2019142503A1 (ja) * 2018-01-18 2019-07-25 東レ株式会社 プリプレグ表面の樹脂状態の測定方法およびその測定装置
JP7363357B2 (ja) * 2019-10-21 2023-10-18 住友ゴム工業株式会社 ゴム引きコード部材の検査方法及び検査装置
CN111141745B (zh) * 2020-01-07 2022-12-23 武汉精立电子技术有限公司 一种图像检测装置及其检测方法
JP6970866B2 (ja) * 2020-03-06 2021-11-24 フロンティアシステム株式会社 表面検査装置
KR20230046683A (ko) * 2021-09-30 2023-04-06 주식회사 엘지화학 광학 필름의 이물질과 결함을 검출하는 시스템

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006057125A1 (ja) * 2004-11-24 2006-06-01 Asahi Glass Company, Limited 透明板状体の欠陥検査方法および装置
JP2008215862A (ja) * 2007-02-28 2008-09-18 Taiheiyo Cement Corp 異物除去装置
JP2010008170A (ja) * 2008-06-25 2010-01-14 Panasonic Electric Works Co Ltd 光透過性フィルムの欠陥検出装置
CN103076344A (zh) * 2012-12-27 2013-05-01 深圳市华星光电技术有限公司 显示面板的缺陷检测方法及其检测装置
CN103534582A (zh) * 2011-05-10 2014-01-22 旭硝子株式会社 透光性板状体的微小缺陷的检查方法和透光性板状体的微小缺陷的检查装置
CN104007116A (zh) * 2013-02-21 2014-08-27 欧姆龙株式会社 缺陷检查装置及缺陷检查方法
CN104914112A (zh) * 2014-03-12 2015-09-16 欧姆龙株式会社 片材检查装置
JP2015220219A (ja) * 2014-05-21 2015-12-07 株式会社Ｊｏｌｅｄ 有機ｅｌ表示パネルの製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0413954A (ja) * 1990-05-03 1992-01-17 Showa Denko Kk ウエブの欠点検査装置
JP3108428B2 (ja) * 1990-08-13 2000-11-13 株式会社東芝 透明体円形ワークの欠陥検出装置
WO1998058241A1 (fr) * 1997-06-17 1998-12-23 Yuki Engineering System, Ltd Dispositif de controle de conditionnement feuille
JP2006064531A (ja) 2004-08-26 2006-03-09 Matsushita Electric Works Ltd プリプレグの検査方法
CN102015458A (zh) * 2008-04-25 2011-04-13 Lts勒曼治疗***股份公司 贴片转移和检查设备
FR2983583B1 (fr) * 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006057125A1 (ja) * 2004-11-24 2006-06-01 Asahi Glass Company, Limited 透明板状体の欠陥検査方法および装置
JP2008215862A (ja) * 2007-02-28 2008-09-18 Taiheiyo Cement Corp 異物除去装置
JP2010008170A (ja) * 2008-06-25 2010-01-14 Panasonic Electric Works Co Ltd 光透過性フィルムの欠陥検出装置
CN103534582A (zh) * 2011-05-10 2014-01-22 旭硝子株式会社 透光性板状体的微小缺陷的检查方法和透光性板状体的微小缺陷的检查装置
CN103076344A (zh) * 2012-12-27 2013-05-01 深圳市华星光电技术有限公司 显示面板的缺陷检测方法及其检测装置
CN104007116A (zh) * 2013-02-21 2014-08-27 欧姆龙株式会社 缺陷检查装置及缺陷检查方法
CN104914112A (zh) * 2014-03-12 2015-09-16 欧姆龙株式会社 片材检查装置
JP2015220219A (ja) * 2014-05-21 2015-12-07 株式会社Ｊｏｌｅｄ 有機ｅｌ表示パネルの製造方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110376203A (zh) * 2019-06-26 2019-10-25 阳程科技股份有限公司 玻璃纤维丝检测机台及其检测方法
CN111982929A (zh) * 2020-08-14 2020-11-24 加藤义晴 一种电子部件检测设备及电子部件检测方法
CN113267514A (zh) * 2021-06-25 2021-08-17 国网河南省电力公司电力科学研究院 一种玻璃丝纤维绝缘拉杆质量的光学检测方法和装置

Also Published As

Publication number Publication date
JPWO2017104575A1 (ja) 2018-08-30
WO2017104575A1 (ja) 2017-06-22
JP6677260B2 (ja) 2020-04-08
TW201723473A (zh) 2017-07-01
KR102141216B1 (ko) 2020-08-04
TWI622766B (zh) 2018-05-01
KR20180081576A (ko) 2018-07-16

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