CN107529625A - A kind of continuous/burst ultrafast imaging method of bimodulus for real-time monitored micro-nano transient phenomena - Google Patents

A kind of continuous/burst ultrafast imaging method of bimodulus for real-time monitored micro-nano transient phenomena Download PDF

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CN107529625A
CN107529625A CN201710936470.2A CN201710936470A CN107529625A CN 107529625 A CN107529625 A CN 107529625A CN 201710936470 A CN201710936470 A CN 201710936470A CN 107529625 A CN107529625 A CN 107529625A
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imaging
burst
ultrafast
continuous
module
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CN107529625B (en
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雷诚
刘胜
孙启盟
张国庆
李辉
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Wuhan University WHU
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Wuhan University WHU
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Abstract

The invention discloses a kind of continuous/burst ultrafast imaging method of bimodulus for real-time monitored micro-nano transient phenomena, a kind of light path converting module is specially provided, change laser direction, the femtosecond laser of same ultrafast pulsed laser device output is subjected to imaging by entering continuous imaging or burst imaging after light path converting module.When observing same micro-nano transient phenomena, fast dynamics under micro-nano environment can either be continuously captured, the enough significant instants in experiment of and can obtain the imaging that number frame time resolution capability reaches femtosecond magnitude.

Description

A kind of continuous/burst ultrafast imaging of bimodulus for real-time monitored micro-nano transient phenomena Method
Technical field
The present invention relates to a kind of ultrafast imaging technique, more particularly to a kind of company for real-time monitored micro-nano transient phenomena Continuous/burst ultrafast imaging method of bimodulus.
Background technology
Traditional CCD (charge coupling device imaging sensor) and CMOS (Complimentary Metal-Oxide semiconductor) imagings are should With widest imaging technique.The dynamic that CCD and CMOS clearly can not sensitively capture ultrafast process occurs, especially to micro-nano The object of observation of yardstick is imaged.Very high temporal resolution is also required to even if dynamic phenomenon is very slow, under micro/nano-scale.
Optical imagery common problem is:Frame per second is higher, and the photon collected by per frame is fewer.It is higher in order to obtain Temporal resolution, it is common to use method be to reduce spatial resolution and using high power light source, but this is not preferable Solution, optical noise can be not only produced, and when carrying out micro/nano-scale imaging, light concentrates on very small region, can It can damage and be observed object.
Needing to observe in the occasion of transient phenomena, such as studying photochemistry, phonon, plasma physics and living cells egg During the fast dynamics such as white matter, its observation not only needs to reach nanosecond (10-9S) continuous imaging of magnitude, it is also necessary to during number frame Between resolution capability be femtosecond (10-15S) magnitude burst imaging, so as to the crucial moment of its research process carry out it is ultrashort when Between be spaced continuous take pictures.However, current continuous imaging technology, can only achieve the level of nanosecond, and if experimental observation exists The a certain moment needs the imaging for reaching femtosecond magnitude, then using pump probe technology and ultrafast burst imaging technique.Needing to see Survey in the occasion of transient phenomena, in order to observe the fast dynamics of material, that is, need ultrafast continuous imaging, need again super Fast burst imaging.
The content of the invention
The purpose of the present invention is to be directed to real-time monitored micro-nano transient phenomena, there is provided one kind shows for real-time monitored micro-nano transition Continuous/burst ultrafast imaging method of bimodulus of elephant, can continuously capture fast dynamics under micro-nano environment, and testing Significant instant can obtain the imaging that number frame time resolution capability reaches femtosecond magnitude.
To achieve these goals, the continuous/burst for being used for real-time monitored micro-nano transient phenomena involved in the present invention is double The ultrafast imaging method of mould, it is characterized in that:A kind of light path converting module is provided, changes laser direction, by same ultrafast arteries and veins The femtosecond laser for rushing laser output carries out imaging by entering continuous imaging or burst imaging after light path converting module.
Further, the light path converting module includes multiple upset mirrors.
Further, the light path converting module includes the first upset mirror, the second upset mirror and reflective mirror, the light path The ultrafast burst imaging pulse of the ultrafast continuous imaging pulse interval dispersion compensation module and burst imaging of modular converter and continuous imaging Time domain Shaping Module is collectively forming integrated bimodulus shaping pulse module, wherein:
First upset mirror is used to change femtosecond laser path, hence into ultrafast continuous imaging pulse interval dispersion compensation module or The ultrafast burst imaging pulse time domain Shaping Module of person;
The reflective mirror is used to change the output laser of ultrafast continuous imaging pulse interval dispersion compensation module, it is acted on the On two upset mirrors;
The second upset mirror is used for the laser of reflective mirror conversion or ultrafast burst imaging pulse time domain Shaping Module The path for exporting laser changes the subsequent operation being imaged to continuous imaging or burst.
Yet further, the bimodulus shaping pulse module output end is additionally provided with the 3rd upset mirror, the 3rd upset Mirror changes bimodulus shaping pulse module output laser the subsequent operation to continuous imaging or burst imaging.
The advantage of the invention is that:
1st, all it is conventional optical instrument used in this imaging method, is easy to implement.
2nd, when observing same micro-nano transient phenomena, fast dynamics under micro-nano environment can either be continuously captured, The enough significant instants in experiment of and can obtain the imaging that number frame time resolution capability reaches femtosecond magnitude.Make full use of ultrafast femtosecond The time-frequency characteristic of pulse, the double-mode imaging that can flexibly switch imaging mode is realized, can be according to application demand to ultrafast mistake The whole continuous detections of Cheng Jinhang or the emphasis detection of particular point in time, and can real-time cuts detection methods.Will be a variety of independent Detection mode organically combine, for retrofit process detection provide brand-new one-stop solution.
Brief description of the drawings
Fig. 1 is the structural representation of one embodiment of patent of the present invention;
Fig. 2 is the schematic diagram of pulse Shaping Module in structural representation;
Fig. 3 is the schematic diagram of ultrafast continuous imaging pulse interval dispersion compensation module;
Fig. 4 is the schematic diagram of ultrafast burst imaging pulse time domain Shaping Module;
Fig. 5 be structural representation intermediate frequency-when conversion with optical amplifier module;
Fig. 6 is the schematic diagram of continuous/burst ultrafast imaging of bimodulus.
In figure:101:Ultrafast pulsed laser device;102:The ultrafast anti-spatial dispersion module of continuous imaging pulse;103:Light path is accurate Straight device;104:Bimodulus shaping pulse module;105:3rd upset mirror;106:Beam path alignment device;107:Convex lens;108:Observation pair As;109:Frequently-when conversion with optical amplifier module;110:Single pixel photodiode;111:Reflective mirror;112:Scattered grating; 113:Alignment grating;114:Pulse after the shaping of spatial domain;115:Image processing system.
201:Femtosecond pulse;202:First upset mirror;203:Ultrafast continuous imaging pulse interval dispersion compensation module;204:It is ultrafast Happen suddenly imaging pulse time domain Shaping Module;205:Reflective mirror;206:Second upset mirror.
301:Collimater;302:Convex lens;303:Convex lens;304:Cylindrical mirror;305:Virtual image phased array;306:Diffraction Grating.
401:Pulse stretcher;402:Laser pulse after broadening;403:Wide wavestrip speculum;404:Grating;405:Thoroughly Mirror;406:Spatial light modulator;407:Lens;408:Grating;409:Wide wavestrip speculum;410:More height after time domain shaping Pulse.
501:Erbium-doped fiber amplifier;502:Raman pump;503:Wavelength division multiplexer;504:Dispersion compensating fiber;505: Wavelength division multiplexer;506:Raman pump.
Embodiment
The present invention is described in further detail with specific implementation below in conjunction with the accompanying drawings:
Continuous/burst ultrafast the imaging method of bimodulus for being used for real-time monitored micro-nano transient phenomena designed by the present invention, tool Body is:A kind of light path converting module is provided, changes laser direction, the femtosecond laser that same ultrafast pulsed laser device exports is passed through Enter continuous imaging after light path converting module or burst imaging carries out imaging.
Wherein, the light path converting module includes multiple upset mirrors.Light path converting module is turned over including first in the present embodiment The ultrafast continuous imaging pulse interval dispersion compensation module of tilting mirror, the second upset mirror and reflective mirror, light path converting module and continuous imaging Integrated bimodulus shaping pulse module is collectively forming with the ultrafast burst imaging pulse time domain Shaping Module of burst imaging, its In:
First upset mirror is used to change femtosecond laser path, hence into ultrafast continuous imaging pulse interval dispersion compensation module or The ultrafast burst imaging pulse time domain Shaping Module of person;
The reflective mirror is used to change the output laser of ultrafast continuous imaging pulse interval dispersion compensation module, it is acted on the On two upset mirrors;
The second upset mirror is used for the laser of reflective mirror conversion or ultrafast burst imaging pulse time domain Shaping Module The path for exporting laser changes the subsequent operation being imaged to continuous imaging or burst.
For convenience of the arrangement of subsequent operation, bimodulus shaping pulse module output end is additionally provided with the 3rd upset mirror, and described the Three upset mirrors change bimodulus shaping pulse module output laser the subsequent operation to continuous imaging or burst imaging.
The specific implementation process of the present invention is as follows:
As shown in drawings, this double-mode imaging method include light path a and light path b, light path a and light path b represent respectively continuously into As STEAM and burst imaging STAMP, the two overturns mirror 206 by the first upset mirror 202, second and switched over.Specially:When It is light path a when the first upset upset mirror 206 of mirror 202, second goes to horizontal level;When the first upset mirror 202, second overturns mirror 206 when going to 45 degree, is light path b.
Its light path a is moved towards:First, ultrafast pulsed laser device 101 is used to export femtosecond laser;Then, by collimater 103 enter ultrafast continuous imaging pulse interval dispersion compensation module 203 in bimodulus shaping pulse modules 104, by collimater 301 to ultrashort Pulse adjusts spot size by lens group (302,303), into by post lens 304, virtual image phased array 305 and diffraction grating The dispersion element of 306 compositions, pulse spatially deploy according to frequency, form rainbow hot spot;Then, by the 3rd upset He of mirror 105 The lens 107 of collimater 106, rainbow hot spot are converged on sample 108;Then, by diffusing reflection, the pulse after coding is ultrafast continuous The anti-spatial dispersion module 102 of imaging pulse, rainbow hot spot are reduced into short pulse, into the conversion of frequency-when and optical amplifier module 109, the information of frequency domain is transformed into time domain, because the irreflexive optical signal of object of observation is very faint and frequency spectrum is wider, Frequently-when conversion before carry out bandpass filtering, and pass through erbium-doped fiber amplifier 501 and distributed raman amplification, specially Raman Pumping 502,506, wavelength division multiplexer 503, dispersion compensating fiber 504, wavelength division multiplexer 505 are realized;Finally, the time domain letter of light beam Breath passes through the opto-electronic conversion of photodiode 110 and image processing system 115, obtains the continuous imaging of nanosecond order.
Its light path b is moved towards:First, ultrafast pulsed laser device 101 is used to export femtosecond laser;Then, by collimater 103 enter ultrafast burst imaging pulse time domain Shaping Module 204 in bimodulus shaping pulse module 104, and speculum is passed through in pulse 402 Light beam will be passed through liquid crystalline phase by beam emissions to grating 404, grating 404 by 403 according to frequency spread, lens 405 after beam collimation Position delayer 406, liquid crystal phase retarders 406 carry out frequency domain Fourier transformation so as to carry out time domain shaping to light beam.Shaping light Beam, and the more sub- arteries and veins after speculum 409 forms time domain shaping are focused and close by lens 407 and grating 408 Punching 410.The frequency spectrum of former laser pulse 402 is divided into some sections on frequency domain, and each wave band forms a subpulse, after time domain shaping Multiple subpulses 410 there is different time intervals;Then, multiple subpulses 410 after time domain shaping pass sequentially through the 3rd Mirror 105 and the lens 107 of collimater 106 are overturn, are converged on sample 108, and the two-dimensional image information of target surface is encoded Onto these pulse spectrums, due to having certain time interval between subpulse, so these subpulses will encode it is extremely short Information in time at different moments, condition is provided for ultrafast burst imaging;Then, reflective mirror is passed through by diffusing reflection, during return 111st, scattered grating 112 and alignment grating 113, the spectrum of subpulse different frequency is spatially evenly distributed;Finally by Image processing system 115 obtains the imaging that time resolution is femtosecond magnitude.
All it is conventional optical instrument used in the imaging method of the present invention, is easy to implement.Observing same micro-nano transient phenomena When, fast dynamics under micro-nano environment can either be continuously captured, when the enough significant instants in experiment of and can obtain number frame Between resolution capability reach the imaging of femtosecond magnitude.The time-frequency characteristic of ultrafast femtosecond pulse is made full use of, realizing flexibly to cut The double-mode imaging of imaging mode is changed, whole continuous detection or particular point in time can be carried out to ultrafast process according to application demand Emphasis detection, and can real-time cuts detection methods.A variety of individually detection modes are organically combined, added to be fine The detection of work process provides brand-new one-stop solution.

Claims (4)

  1. A kind of 1. continuous/burst ultrafast imaging method of bimodulus for real-time monitored micro-nano transient phenomena, it is characterised in that:There is provided A kind of light path converting module, change laser direction, the femtosecond laser that same ultrafast pulsed laser device exports is passed through into light path converting Enter continuous imaging after module or burst imaging carries out imaging.
  2. 2. continuous/burst ultrafast imaging method of bimodulus according to claim 1 for real-time monitored micro-nano transient phenomena, It is characterized in that:The light path converting module includes multiple upset mirrors.
  3. 3. continuous/burst ultrafast imaging method of bimodulus according to claim 2 for real-time monitored micro-nano transient phenomena, It is characterized in that:The light path converting module includes the first upset mirror, the second upset mirror and reflective mirror, the light path converting module With the ultrafast continuous imaging pulse interval dispersion compensation module of continuous imaging and the ultrafast burst imaging pulse time domain shaping of burst imaging Module is collectively forming integrated bimodulus shaping pulse module, wherein:
    First upset mirror is used to change femtosecond laser path, hence into ultrafast continuous imaging pulse interval dispersion compensation module or super Fast burst imaging pulse time domain Shaping Module;
    The reflective mirror is used for the output laser for changing ultrafast continuous imaging pulse interval dispersion compensation module, it is acted on second and turns over On tilting mirror;
    The second upset mirror is used for the laser of reflective mirror conversion or ultrafast burst imaging pulse time domain Shaping Module output The path of laser changes the subsequent operation to continuous imaging or burst imaging.
  4. 4. continuous/burst ultrafast imaging method of bimodulus according to claim 3 for real-time monitored micro-nano transient phenomena, It is characterized in that:The bimodulus shaping pulse module output end is additionally provided with the 3rd upset mirror, and the described 3rd overturns mirror by bimodulus Shaping pulse module output laser changes the subsequent operation to continuous imaging or burst imaging.
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CN108375774A (en) * 2018-02-28 2018-08-07 中国科学技术大学 A kind of single photon image detecting laser radar of no-raster
CN108956432A (en) * 2018-08-10 2018-12-07 武汉大学 A kind of streaming high speed super-resolution imaging device and method based on structure light
CN111685728A (en) * 2020-04-14 2020-09-22 武汉大学 Tumor and lymphocyte rapid circulating detection and identification system and method
CN112033538A (en) * 2020-08-11 2020-12-04 华东师范大学 Ultrafast image device based on spectrum-time mapping
CN115268200A (en) * 2022-08-10 2022-11-01 武汉大学 Multi-frame ultrafast phase imaging system and method
CN116593399A (en) * 2023-07-17 2023-08-15 杭州创锐光测技术有限公司 Ultra-fast time-resolved shadow imaging system and testing method based on sCMOS

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CN107085220A (en) * 2017-06-21 2017-08-22 中国工程物理研究院流体物理研究所 A kind of full light framing 3D hologram imaging device of trillion amplitude-frequencies and method

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WO2016008336A1 (en) * 2014-07-16 2016-01-21 深圳大学 High spatial resolution real-time ultrafast framing optical imaging device
CN104375374A (en) * 2014-11-25 2015-02-25 北京理工大学 Ultra-fast continuous electron dynamic state observation device and method based on frequency domain space-time transformation
CN106406019A (en) * 2016-08-31 2017-02-15 中国人民解放军国防科学技术大学 Multi-framing optical imaging device with high temporal-spatial resolution and imaging method
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Cited By (9)

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Publication number Priority date Publication date Assignee Title
CN108375774A (en) * 2018-02-28 2018-08-07 中国科学技术大学 A kind of single photon image detecting laser radar of no-raster
CN108956432A (en) * 2018-08-10 2018-12-07 武汉大学 A kind of streaming high speed super-resolution imaging device and method based on structure light
CN108956432B (en) * 2018-08-10 2020-08-07 武汉大学 Flow type high-speed super-resolution imaging device and method based on structured light
CN111685728A (en) * 2020-04-14 2020-09-22 武汉大学 Tumor and lymphocyte rapid circulating detection and identification system and method
CN112033538A (en) * 2020-08-11 2020-12-04 华东师范大学 Ultrafast image device based on spectrum-time mapping
CN115268200A (en) * 2022-08-10 2022-11-01 武汉大学 Multi-frame ultrafast phase imaging system and method
CN115268200B (en) * 2022-08-10 2023-07-21 武汉大学 Multi-frame ultrafast phase imaging system and method
CN116593399A (en) * 2023-07-17 2023-08-15 杭州创锐光测技术有限公司 Ultra-fast time-resolved shadow imaging system and testing method based on sCMOS
CN116593399B (en) * 2023-07-17 2023-09-19 杭州创锐光测技术有限公司 Ultra-fast time-resolved shadow imaging system and testing method based on sCMOS

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