CN107262428A - A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its method of cleaning - Google Patents

A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its method of cleaning Download PDF

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Publication number
CN107262428A
CN107262428A CN201710481978.8A CN201710481978A CN107262428A CN 107262428 A CN107262428 A CN 107262428A CN 201710481978 A CN201710481978 A CN 201710481978A CN 107262428 A CN107262428 A CN 107262428A
Authority
CN
China
Prior art keywords
cleaning
pressure
super
washed
handled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710481978.8A
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Chinese (zh)
Inventor
卢国云
贺贤汉
惠朝先
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anhui Fule De Science and Technology Development Co., Ltd.
Original Assignee
Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Shenhe Thermo Magnetics Electronics Co Ltd filed Critical Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
Priority to CN201710481978.8A priority Critical patent/CN107262428A/en
Publication of CN107262428A publication Critical patent/CN107262428A/en
Pending legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24CABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
    • B24C1/00Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods
    • B24C1/08Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods for polishing surfaces, e.g. smoothing a surface by making use of liquid-borne abrasives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/02Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
    • B08B7/026Using sound waves
    • B08B7/028Using ultrasounds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24CABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
    • B24C9/00Appurtenances of abrasive blasting machines or devices, e.g. working chambers, arrangements for handling used abrasive material

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning In General (AREA)

Abstract

The present invention provides a kind of cleaning method for the semiconductor equipment Encore Ta device features for being equipped with described cleaning protection tool, using the film layer overlay area of Ta/TaN in removing component by the way of super-pressure is washed;Part after being washed by super-pressure is handled using blasting craft, a small amount of residual film of removing component surface attachment;The part after blasting craft is handled is cleaned using pure water ultrasonic wave.The design method can ensure that the assembly area of part is not gone membrane process to be influenceed in cleaning process by physics, effectively reduce the loss that part is produced during cleaning and regeneration, so as to improve the cleaning quality and access times of part, suitable for precision equipment area of maintenance large-scale promotion application.

Description

A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its clean Method
Technical field
The present invention relates to clean renovation process, precision equipment area of maintenance, and in particular to a kind of semiconductor equipment Encore Ta device feature cleaning protection tools and its method of cleaning.
Background technology
As semiconductor integrated circuit chip processing line width enters nanometer era, LOW K technologies obtain playing stage so that The Cu lead technology scope of applications are more and more extensive.But, because Cu molecules easily spread, deep levels defect is easily caused, therefore need Deposit one layer of Ta/TaN barrier layer to prevent Cu diffusion pollution, Encore Ta devices are semiconductor integrated circuit Cu The key equipment in processing procedure field.
In conventional cleaning, using the hydrofluoric acid or nitre fluoric acid (mixed solution of nitric acid and hydrofluoric acid) of high concentration To remove the Ta/TaN films on Encore Ta device inner shield body inner shield, although the process cleaning performance Substantially, but concentrated acid can not be avoided to the etching problem of hardware body aluminium material.Section components are in conventional regeneration in Encore Ta chambers During produce compared with lossy, with the increase of regeneration times, section components can be bad because of deformation, thinning, perforation etc., finally leads Complete equipment part is caused not use normally.
The content of the invention
The problem of existing for prior art, the present invention provides a kind of semiconductor equipment Encore Ta device features cleaning Tool and its method of cleaning are protected, is a kind of protection tool of Ta/TaN films on physical removal inner shield body inner shield Application method, coordinate corresponding physics to clean technique, with cleaning performance substantially, part reuse often, it is pollution-free, The advantages of no chemical residues risk, it is adapted to send out energetically in terms of semiconductor, liquid crystal flat-panel such as show at the maintaining of precision equipment Exhibition.
The technical scheme is that:A kind of semiconductor equipment Encore Ta device feature cleaning protection tools, are to be used for The covering of the inner shield body cup assembly areas in Encore Ta devices is covered, the covering offers centre bore and relative In symmetrical two positioning holes of centre bore, the centre bore is used for the perforation for being directed at the cup assembly areas, two positioning Hole be used to being respectively aligned to the cup assembly areas relative to symmetrical two spacing holes of the perforation.
The present invention also provides a kind of semiconductor equipment Encore Ta device features for being equipped with described cleaning protection tool Cleaning method, comprise the following steps that:
Step 1: using the film layer overlay area of Ta/TaN in removing component by the way of super-pressure is washed;
Step 2: the part after being washed in step one by super-pressure is handled using blasting craft, removal portion A small amount of residual film of part surface attachment;
Step 3: being cleaned using pure water ultrasonic wave to the part in step 2 after blasting craft is handled.
Further, in step one, super-pressure hydraulic giant muzzle sprayed fiber concrete is about 45-55mm.
Further, in step one, super-pressure washing pressure is 1800~2000Kg/CM2
Further, in step 2, the part after being washed in step one by super-pressure is sprayed using WA60# white fused aluminas Sand technique is handled.
The beneficial effects of the invention are as follows:
1st, the present invention relates to the design and preparation method that a kind of Encore Ta device features cleaning and regeneration protects tool, use Assembled in a kind of cup (functional plastics structure member) for the inner shield body (Inner shield) for covering Encore Ta devices Region, the design method can ensure that the assembly area of part is not gone membrane process to be influenceed in cleaning process by physics, effectively The loss that part is produced during cleaning and regeneration is reduced, so that the cleaning quality and access times of part are improved, suitable for precision Plant maintenance field large-scale promotion application.
2nd, using the film layer overlay area of Ta/TaN in removing component by the way of super-pressure is washed.Gone using physical method When adhering to Ta except inner surface, the protective effect due to protection tool to cup assembly areas can effectively reduce removal inner surface additional The generation of the bad phenomenon such as deformation, perforation during Ta/TaN.
3rd, sandblasting can be with a small amount of residual film of removing component surface attachment, and the part after being washed for super-pressure is used The blasting crafts such as WA60# white fused aluminas are handled, and can ensure overall appearance and cleaning quality after part striping.
4th, high-pressure washing can be matched with the weaker particle of removing component surface adhesion with pure water ultrasonic cleaning process Close, can effectively reduce the probability of happening of the bad problems of parts surface particle.
Brief description of the drawings
Fig. 1 is Encore Ta device feature structural representations;
Fig. 2 is cup locality protection jig structure schematic diagrames;
Fig. 3 is Fig. 1 and Fig. 2 assembling design sketch.
In figure:1 is hole centered on cup assembly sections, 2, and 3 be positioning hole, and 4 be Encore Ta device features, and 5 be cup regions Tool is protected, 6 be the heavy diaphragm areas of cavity inner wall Ta/TaN.
Embodiment
The present invention is described further below in conjunction with the accompanying drawings.
Encore Ta device features cleaning and regeneration protection tool is the interior screen for covering the Encore Ta devices Cover the covering of the cup assembly areas of body (Inner shield).
As shown in Fig. 2 covering offers centre bore 2 and relative to symmetrical two positioning holes 3 of centre bore, the center Hole 2 is used for the perforation for being directed at the cup assembly areas 1, and two positioning holes 3 are used to be respectively aligned to the cup assembly areas 1 Relative to symmetrical two spacing holes of the perforation.Cleaning and regeneration protection tool 5 in the present invention is to be used to cover Encore The covering of inner shield body cup assembly areas in Ta devices 4 (Fig. 1).
Cup assembly areas very thin thickness in inner shield body (Fig. 1), regenerative process causes certain loss to this region, With the increase of wash number, this region can be deformed perforation etc. it is bad, cause part to scrap in advance.Shown in Fig. 3, with above-mentioned Encore Ta device features cleaning and regenerations protection tool (Fig. 2) cover the inner shield bodies of the Encore Ta devices Cup assembly areas, will protect the perforation of cup assembly areas described in tool central aperture, and two positioning holes are respectively aligned to described Cup assembly areas relative to symmetrical two spacing holes of perforating, Encore Ta device features cleaning and regeneration is protected into tool 2 Assembled with the cup assembly areas.
Physics striping (cavity inner wall Ta/TaN sink diaphragm area 6) technique for Encore Ta device features is specific as follows:
Step 1: super-pressure washing process peels off Ta/TaN films
Using the film layer overlay area of Ta/TaN in removing component by the way of super-pressure is washed.Super-pressure washes technological parameter For 1800~2000Kg/CM of pressure2, super-pressure hydraulic giant muzzle sprayed fiber concrete is about 50mm.In being removed using physical method During surface attachment Ta, the protective effect due to protection tool to cup assembly areas can effectively reduce and remove inner surface attachment The generation of the bad phenomenon such as deformation, perforation during Ta/TaN.
Step 2: sandblasting
Sandblasting can be with a small amount of residual film of removing component surface attachment, and the part after being washed for super-pressure uses WA60# The blasting crafts such as white fused alumina are handled, and can ensure overall appearance and cleaning quality after part striping.
Step 3: pure water ultrasonic wave
High-pressure washing can be engaged with the weaker particle of removing component surface adhesion with pure water ultrasonic cleaning process, The probability of happening of parts surface particle (particulate, particle diameter≤0.3 μm) bad problem can effectively be reduced.
Described above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should It is considered as protection scope of the present invention.

Claims (5)

1. a kind of semiconductor equipment Encore Ta device feature cleaning protection tools, it is characterised in that:It is to be used to cover The covering of inner shield body cup assembly areas (1) in EncoreTa devices, the covering offers centre bore (2) and phase Two positioning holes (3) symmetrical for centre bore, the centre bore (2) is used for the perforation for being directed at the cup assembly areas (1), Two positioning holes (3) are used to be respectively aligned to the spacing relative to symmetrical two of the perforation of the cup assembly areas (1) Hole.
2. a kind of semiconductor equipment Encore Ta device features of cleaning protection tool being equipped with described in claim 1 is clear Washing method, it is characterised in that:Comprise the following steps that:
Step 1: using the film layer overlay area of Ta/TaN in removing component by the way of super-pressure is washed;
Step 2: the part after being washed in step one by super-pressure is handled using blasting craft, removing component table A small amount of residual film of face attachment;
Step 3: being cleaned using pure water ultrasonic wave to the part in step 2 after blasting craft is handled.
3. method according to claim 2, it is characterised in that:In step one, super-pressure hydraulic giant muzzle sprayed fiber concrete is about For 45-55mm.
4. method according to claim 2, it is characterised in that:In step one, super-pressure washing pressure be 1800~ 2000Kg/CM2
5. method according to claim 2, it is characterised in that:In step 2, it will be washed by super-pressure in step one Part afterwards is handled using WA60# white fused alumina blasting crafts.
CN201710481978.8A 2017-06-22 2017-06-22 A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its method of cleaning Pending CN107262428A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710481978.8A CN107262428A (en) 2017-06-22 2017-06-22 A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its method of cleaning

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710481978.8A CN107262428A (en) 2017-06-22 2017-06-22 A kind of semiconductor equipment EncoreTa device feature cleaning protection tools and its method of cleaning

Publications (1)

Publication Number Publication Date
CN107262428A true CN107262428A (en) 2017-10-20

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109590267A (en) * 2018-12-28 2019-04-09 深圳仕上电子科技有限公司 Cleaning method
CN111715590A (en) * 2020-07-23 2020-09-29 安徽富乐德科技发展股份有限公司 Cleaning method of evaporation equipment in electronic industry
CN111871950A (en) * 2020-07-27 2020-11-03 安徽富乐德科技发展股份有限公司 Surface treatment device and process for graphite component of semiconductor ion implantation device
CN111993287A (en) * 2020-07-31 2020-11-27 上海富乐德智能科技发展有限公司 Regeneration method of anodic oxidation part in dry etching equipment for semiconductor
CN112226742A (en) * 2020-07-29 2021-01-15 安徽富乐德科技发展股份有限公司 Method for cleaning holes of gas distribution aluminum component in CVD (chemical vapor deposition) equipment
CN114749407A (en) * 2022-04-08 2022-07-15 安徽富乐德科技发展股份有限公司 Ultrahigh-pressure physical film removing method for semiconductor component

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102021512A (en) * 2010-11-04 2011-04-20 上海申和热磁电子有限公司 Encore Ta device part cleaning regeneration protective jig and related cleaning regeneration method
CN104674263A (en) * 2014-12-26 2015-06-03 昆山硕磁金属材料制品有限公司 Metal surface cleaning method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102021512A (en) * 2010-11-04 2011-04-20 上海申和热磁电子有限公司 Encore Ta device part cleaning regeneration protective jig and related cleaning regeneration method
CN104674263A (en) * 2014-12-26 2015-06-03 昆山硕磁金属材料制品有限公司 Metal surface cleaning method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109590267A (en) * 2018-12-28 2019-04-09 深圳仕上电子科技有限公司 Cleaning method
CN111715590A (en) * 2020-07-23 2020-09-29 安徽富乐德科技发展股份有限公司 Cleaning method of evaporation equipment in electronic industry
CN111715590B (en) * 2020-07-23 2021-06-08 安徽富乐德科技发展股份有限公司 Cleaning method of evaporation equipment in electronic industry
CN111871950A (en) * 2020-07-27 2020-11-03 安徽富乐德科技发展股份有限公司 Surface treatment device and process for graphite component of semiconductor ion implantation device
CN112226742A (en) * 2020-07-29 2021-01-15 安徽富乐德科技发展股份有限公司 Method for cleaning holes of gas distribution aluminum component in CVD (chemical vapor deposition) equipment
CN111993287A (en) * 2020-07-31 2020-11-27 上海富乐德智能科技发展有限公司 Regeneration method of anodic oxidation part in dry etching equipment for semiconductor
CN114749407A (en) * 2022-04-08 2022-07-15 安徽富乐德科技发展股份有限公司 Ultrahigh-pressure physical film removing method for semiconductor component

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PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right

Effective date of registration: 20181210

Address after: 244000 Jinqiao Economic Development Zone, Tongling, Anhui

Applicant after: Anhui Fule De Science and Technology Development Co., Ltd.

Address before: No. 181 Shanlian Road, Baoshan City Industrial Park, Baoshan District, Shanghai, 2004

Applicant before: Shanghai Shenhe Thermo-magenetic Electronic Co., Ltd.

TA01 Transfer of patent application right
RJ01 Rejection of invention patent application after publication

Application publication date: 20171020

RJ01 Rejection of invention patent application after publication