CN107231595A - A kind of MEMS and preparation method thereof, electronic installation - Google Patents

A kind of MEMS and preparation method thereof, electronic installation Download PDF

Info

Publication number
CN107231595A
CN107231595A CN201610172712.0A CN201610172712A CN107231595A CN 107231595 A CN107231595 A CN 107231595A CN 201610172712 A CN201610172712 A CN 201610172712A CN 107231595 A CN107231595 A CN 107231595A
Authority
CN
China
Prior art keywords
backboard
vibrating diaphragm
substrate
mems
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610172712.0A
Other languages
Chinese (zh)
Inventor
周鸣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Manufacturing International Shanghai Corp
Semiconductor Manufacturing International Beijing Corp
Original Assignee
Semiconductor Manufacturing International Shanghai Corp
Semiconductor Manufacturing International Beijing Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Manufacturing International Shanghai Corp, Semiconductor Manufacturing International Beijing Corp filed Critical Semiconductor Manufacturing International Shanghai Corp
Priority to CN201610172712.0A priority Critical patent/CN107231595A/en
Publication of CN107231595A publication Critical patent/CN107231595A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R19/00Electrostatic transducers
    • H04R19/04Microphones
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R19/00Electrostatic transducers
    • H04R19/005Electrostatic transducers using semiconductor materials

Abstract

The present invention relates to a kind of MEMS and preparation method thereof, electronic installation.The MEMS includes:Substrate;Vibrating diaphragm, positioned at the top of the substrate, the vibrating diaphragm includes graphene layer;Backboard, positioned at the top of the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.The present invention is in order to solve problems of the prior art there is provided a kind of MEMS, and the device includes substrate;Vibrating diaphragm, including graphene layer, positioned at the semiconductor substrate;Backboard, above the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.The vibrating diaphragm selects graphene in the present invention, and graphene causes the performance of the MEMS to be further improved due to its excellent physics, chemical property, electric property and mechanical performance.

Description

A kind of MEMS and preparation method thereof, electronic installation
Technical field
The present invention relates to semiconductor applications, in particular it relates to a kind of MEMS and its preparation Method, electronic installation.
Background technology
With continuing to develop for semiconductor technology, in the in the market of sensor (motion sensor) class product, Smart mobile phone, integrated CMOS and MEMS (MEMS) device are increasingly becoming most main flow, at first The technology entered, and with the renewal of technology, the developing direction of this kind of transmission sensors product be scale more Small size, high-quality electric property and lower loss.
Wherein, MEMS sensor is widely used in automotive electronics:Such as TPMS, engine oil pressure Sensor, automobile brake system air pressure probe, air intake manifold of automotive engine pressure sensor (TMAP), common rail for diesel engine pressure sensor;Consumer electronics:As tire gauge, sphygmomanometer, cupboard scale, Health scale, washing machine, dish-washing machine, refrigerator, micro-wave oven, baking box, dust catcher pressure sensor, A/C pressure sensor, washing machine, water dispenser, dish-washing machine, solar water heater Liquid level pressure Sensor;Industrial electronic:Such as digital pressure gauge, digital stream scale, industrial batching weighing, electronics sound As field:The equipment such as microphone.
In MEMS fields, the operation principle of the MEMS is by vibrating diaphragm (Membrane) Motion produce electric capacity change, using capacitance change carry out computing and work, it is existing conventional MEMS microphone includes vibrating diaphragm, backboard and the back of the body chamber composition below backboard.By vibrating diaphragm by sound Signal is converted into electric signal.
Need to the current MEMS microphone and preparation method thereof cumbersome and complexity, it is therefore desirable to make It is further to improve.
The content of the invention
A series of concept of reduced forms is introduced in Summary, this will be in embodiment It is further described in part.The Summary of the present invention is not meant to attempt to limit institute The key feature and essential features of claimed technical scheme, do not mean that more and attempt to determine to want Seek the protection domain of the technical scheme of protection.
The invention provides a kind of MEMS, the MEMS includes:
Substrate;
Vibrating diaphragm, positioned at the top of the substrate, the vibrating diaphragm includes graphene layer;
Backboard, positioned at the top of the vibrating diaphragm;
Cavity, between the vibrating diaphragm and the backboard.
Alternatively, doped with Au, Ag, Cu, Ni, P, In and Ga in the graphene layer It is one or more.
Alternatively, back of the body chamber, vibrating diaphragm described in exposed portion are formed with the substrate.
Alternatively, some openings are formed with the backboard.
Present invention also offers a kind of preparation method of MEMS, it is characterised in that methods described bag Include:
Substrate is provided, the vibrating diaphragm of patterning is formed with the substrate, the vibrating diaphragm includes graphene layer;
The sacrifice layer with opening is formed in the substrate and the vibrating diaphragm, the opening exposes described shake Film;
Backboard is formed on the sacrifice layer, to cover the sacrifice layer and the opening, and is shaken described Cavity is formed between film and the backboard.
Alternatively, doped with Au, Ag, Cu, Ni, P, In and Ga in the graphene layer It is one or more.
Alternatively, the step of forming the sacrifice layer includes:
Sacrifice layer is formed in the substrate and the vibrating diaphragm;
The sacrifice layer is patterned, is open with being formed in the middle part of the sacrifice layer, exposes described shake Film.
Alternatively, the step of forming the backboard includes:
The sacrifice layer is engaged with backboard wafer, to cover the sacrifice layer and the opening, and in institute State and form cavity between vibrating diaphragm and the backboard;
Backboard wafer described in thinning, to reduce the thickness of the backboard wafer;
Passivation layer is formed on the backboard wafer, to cover the backboard wafer;
The passivation layer is patterned, to form the first opening, backboard wafer described in exposed portion;
The backboard wafer is patterned, is opened with forming some spaced second in the backboard wafer Mouthful.
Alternatively, methods described still further comprises the back side for patterning the substrate, with the substrate It is middle to form back of the body chamber, vibrating diaphragm described in exposed portion.
Present invention also offers a kind of electronic installation, the electronic installation includes above-mentioned MEMS.
The present invention is described in order to solve problems of the prior art there is provided a kind of MEMS Device includes substrate;Vibrating diaphragm, including graphene layer, positioned at the semiconductor substrate;Backboard, position Above the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.It is described in the present invention to shake Film selects graphene, and graphene is due to its excellent physics, chemical property, electric property and mechanical performance So that the performance of the MEMS is further improved.
Brief description of the drawings
The drawings below of the present invention is used to understand the present invention in this as the part of the present invention.Show in accompanying drawing Embodiments of the invention and its description are gone out, for explaining the device and principle of the present invention.In the accompanying drawings,
Fig. 1 is the preparation technology flow chart of heretofore described MEMS;
Fig. 2 a-2h are the preparation process schematic diagram of heretofore described MEMS;
Fig. 3 is the external view of the example of mobile phone handsets in the present invention.
Embodiment
In the following description, a large amount of concrete details are given to provide to the present invention more thoroughly Understand.It is, however, obvious to a person skilled in the art that the present invention can be without one Or these multiple details and be carried out.In other examples, in order to avoid obscuring with the present invention, It is not described for some technical characteristics well known in the art.
It should be appreciated that the present invention can be implemented in different forms, and it should not be construed as being limited to this In the embodiment that proposes.On the contrary, providing these embodiments disclosure will be made thoroughly and complete, and will be originally The scope of invention fully passes to those skilled in the art.In the accompanying drawings, for clarity, Ceng He areas Size and relative size may be exaggerated.Same reference numerals represent identical element from beginning to end.
It should be understood that be referred to as when element or layer " ... on ", " with ... it is adjacent ", " being connected to " or " coupling Close " other elements or layer when, its can directly on other elements or layer, it is adjacent thereto, connection Or other elements or layer are coupled to, or there may be element or layer between two parties.On the contrary, when element is claimed For " on directly existing ... ", " with ... direct neighbor ", " being directly connected to " or " being directly coupled to " other members When part or layer, then in the absence of element or layer between two parties.Although it should be understood that term first, the can be used 2nd, the third various elements of description, part, area, floor and/or part, these elements, part, area, Layer and/or part should not be limited by these terms.These terms be used merely to distinguish element, part, Area, floor or part and another element, part, area, floor or part.Therefore, the present invention is not being departed from Under teaching, the first element discussed below, part, area, floor or part be represented by the second element, Part, area, floor or part.
Spatial relationship term for example " ... under ", " ... below ", " below ", " ... under ", " ... On ", " above " etc., can describe for convenience herein and by using so as to shown in description figure One element or feature and other elements or the relation of feature.It should be understood that except the orientation shown in figure In addition, spatial relationship term is intended to also including the use of the different orientation with the device in operation.For example, such as In fruit accompanying drawing device upset, then, be described as " below other elements " or " under it " or " under it " element or feature will be oriented to other elements or feature " on ".Therefore, exemplary term " ... below " and " ... under " it may include upper and lower two orientations.Device can additionally be orientated (rotation Turn 90 degrees or other orientations) and spatial description language as used herein correspondingly explained.
The purpose of term as used herein is only that description specific embodiment and not as the limit of the present invention System.Herein in use, " one " of singulative, " one " and " described/should " be also intended to include plural number Form, unless context is expressly noted that other mode.It is also to be understood that term " composition " and/or " comprising ", When in this specification in use, determining the feature, integer, step, operation, element and/or part Presence, but be not excluded for one or more other features, integer, step, operation, element, part And/or the presence or addition of group.Herein in use, term "and/or" includes any of related Listed Items And all combinations.
In order to thoroughly understand the present invention, detailed step and detailed knot will be proposed in following description Structure, to explain technical scheme.Presently preferred embodiments of the present invention is described in detail as follows, but In addition to these detailed descriptions, the present invention can also have other embodiment.
The present invention is described in order to solve problems of the prior art there is provided a kind of MEMS Device includes
Substrate 201;
Vibrating diaphragm 203, including graphene layer, positioned at the semiconductor substrate;
Backboard 205, positioned at the top of vibrating diaphragm 203;
Cavity, between the vibrating diaphragm 105 and the backboard 103.
Wherein, the vibrating diaphragm 203 include graphene, wherein, the graphene be known world it is most thin, Most hard nano material, it is almost fully transparent, only absorbs 2.3% light;Thermal conductivity factor is high 5300W/mK, higher than CNT and diamond, its electron mobility exceedes under normal temperature 15000cm2/Vs, and higher than CNT or silicon crystal, and resistivity only about 1 Ω m, than copper or silver more It is low, it is the minimum material of world resistivity.Because its resistivity is extremely low, the speed of electron transfer is exceedingly fast, because This is further improved from the performance and stability of the MEMS of graphene.
Graphene is both most thin material, is also most tough material, fracture strength is than best steel also Want high 200 times.It has good elasticity again simultaneously, and stretch range can reach the 20% of own dimensions.Such as Fruit makes hammock with the graphene of one piece of 1 square metre of area, and weight itself can bear one less than 1 milligram Only one kilogram of cat.
Alternatively, doped with Au, Ag, Cu, Ni, P, In and Ga in the graphene layer It is one or more.
Alternatively, the graphene layer can include one or more layers.
Alternatively, back of the body chamber is formed with the substrate, exposes the vibrating diaphragm in the back of the body chamber.
Alternatively, some openings are formed with the backboard 205.
The present invention is described in order to solve problems of the prior art there is provided a kind of MEMS Device includes substrate;Vibrating diaphragm, including graphene layer, positioned at the semiconductor substrate;Backboard, position Above the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.It is described in the present invention to shake Film selects graphene, and graphene is due to its excellent physics, chemical property, electric property and mechanical performance So that the performance of the MEMS is further improved.
Embodiment one
The MEMS includes:
Substrate 201;
Vibrating diaphragm 203, including graphene layer, positioned at the semiconductor substrate;
Backboard 205, positioned at the top of vibrating diaphragm 203;
Cavity, between the vibrating diaphragm 105 and the backboard 103.
Wherein, the substrate 201 can select the substrate of Semiconductor substrate or MEMS microphone device, Such as described substrate 201 can be at least one of following material being previously mentioned:Silicon, silicon-on-insulator (SOI) silicon (SSOI), stacking SiGe (S-SiGeOI), insulation on insulator, are laminated on insulator SiGe (SiGeOI) and germanium on insulator (GeOI) etc. on body.
Wherein, the vibrating diaphragm 203 include graphene, wherein, the graphene be known world it is most thin, Most hard nano material, it is almost fully transparent, only absorbs 2.3% light;Thermal conductivity factor is high 5300W/mK, higher than CNT and diamond, its electron mobility exceedes under normal temperature 15000cm2/Vs, and higher than CNT or silicon crystal, and resistivity only about 1 Ω m, than copper or silver more It is low, it is the minimum material of world resistivity.Because its resistivity is extremely low, the speed of electron transfer is exceedingly fast, because This is further improved from the performance and stability of the MEMS of graphene.
Graphene is both most thin material, is also most tough material, fracture strength is than best steel also Want high 200 times.It has good elasticity again simultaneously, and stretch range can reach the 20% of own dimensions.Such as Fruit makes hammock with the graphene of one piece of 1 square metre of area, and weight itself can bear one less than 1 milligram Only one kilogram of cat.
Alternatively, doped with Au, Ag, Cu, Ni, P, In and Ga in the graphene layer It is one or more.
Alternatively, the graphene layer can include one or more layers.
Exemplarily, the graphene layer can be multi-layer graphene, and the material of the graphene layer includes The mixture of graphene and graphite.Multi-layer graphene refers to by 3-10 layers with benzene ring structure (i.e. hexagonal honeycomb Structure) periodically closelypacked carbon atom is with different way of stacking (including ABC stackings, ABA heaps Pile etc.) stacking constitute a kind of two-dimentional carbon material.In this embodiment, the number of plies of multi-layer graphene can reach To 10 layers.
Can be using including but not limited to silicon carbide epitaxial growth method, organic synthesis method, chemical vapor deposition Or the deposition process such as plasma reinforced chemical vapour deposition method (PECVD) is formed (CVD).
The sacrifice layer can be from interlayer metal layer or oxide skin(coating).
Wherein, the backboard 205 selects conductive material or the semi-conducting material of doping, alternatively, From the silicon of doping in the embodiment.
Wherein, the Doped ions are not limited to a certain kind, such as can be B, P, N, As, It will not enumerate.
The backboard 205 passes through eutectic bond or the method for thermal bonding and the sacrifice layer in this step Bonding, to form integral structure.
Back of the body chamber is formed with the substrate, the vibrating diaphragm is exposed in bottom.
The backboard is fixed electrode in the present invention, and the vibrating diaphragm is moving electrode, the backboard and described Cavity between vibrating diaphragm is dielectric medium, after vibrating diaphragm is under pressure, and vibrating diaphragm (Membrane) produces deformation, As shown in Figure 2 g, the motion of vibrating diaphragm produces the change of electric capacity, and computing and work are carried out using capacitance change, Voice signal is converted into by electric signal by vibrating diaphragm.
The present invention is described in order to solve problems of the prior art there is provided a kind of MEMS Device includes substrate;Vibrating diaphragm, including graphene layer, positioned at the semiconductor substrate;Backboard, position Above the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.It is described in the present invention to shake Film selects graphene, and graphene is due to its excellent physics, chemical property, electric property and mechanical performance So that the performance of the MEMS is further improved.
Embodiment two
There is provided a kind of preparation of MEMS in order to solve problems of the prior art by the present invention Method, below in conjunction with the accompanying drawings 2a-2h methods described is further described.
Wherein, Fig. 2 a-2h are the preparation process schematic diagram of heretofore described MEMS;Fig. 3 is The external view of the example of mobile phone handsets in the present invention.
Fig. 1 is the preparation technology flow chart of heretofore described MEMS, specifically includes following steps:
Step S1:Substrate is provided, the vibrating diaphragm of patterning is formed with the substrate, the vibrating diaphragm includes Graphene layer;
Step S2:The sacrifice layer with opening, the opening dew are formed in the substrate and the vibrating diaphragm Go out the vibrating diaphragm;
Step S3:Backboard is formed on the sacrifice layer, to cover the sacrifice layer and the opening, and Cavity is formed between the vibrating diaphragm and the backboard.
Below based on the process chart in accompanying drawing 1, methods described expansion is described in detail.
Step one is performed there is provided substrate 201, the vibrating diaphragm 203 of patterning, institute are formed with the substrate Stating vibrating diaphragm 203 includes graphene layer.
Specifically, as shown in Figure 2 a, the substrate 201 can select Semiconductor substrate or MEMS The substrate of microphone device, such as described substrate 201 can be at least one in the following material being previously mentioned Kind:Silicon, silicon-on-insulator (SOI), stacking silicon (SSOI) on insulator, on insulator it is laminated germanium Silicon (S-SiGeOI), germanium on insulator SiClx (SiGeOI) and germanium on insulator (GeOI) etc..
Alternatively, dielectric layer 202 can also be formed in the substrate 201, such as described dielectric layer 202 Oxide can be selected.
Wherein, the vibrating diaphragm 203 include graphene, wherein, the graphene be known world it is most thin, Most hard nano material, it is almost fully transparent, only absorbs 2.3% light;Thermal conductivity factor is high 5300W/mK, higher than CNT and diamond, its electron mobility exceedes under normal temperature 15000cm2/Vs, and higher than CNT or silicon crystal, and resistivity only about 1 Ω m, than copper or silver more It is low, it is the minimum material of world resistivity.Because its resistivity is extremely low, the speed of electron transfer is exceedingly fast, because This is further improved from the performance and stability of the MEMS of graphene.
Graphene is both most thin material, is also most tough material, fracture strength is than best steel also Want high 200 times.It has good elasticity again simultaneously, and stretch range can reach the 20% of own dimensions.Such as Fruit makes hammock with the graphene of one piece of 1 square metre of area, and weight itself can bear one less than 1 milligram Only one kilogram of cat.
Alternatively, doped with Au, Ag, Cu, Ni, P, In and Ga in the graphene layer It is one or more.
Alternatively, the graphene layer can include one or more layers.
Exemplarily, the graphene layer can be multi-layer graphene, and the material of the graphene layer includes The mixture of graphene and graphite.Multi-layer graphene refers to by 3-10 layers with benzene ring structure (i.e. hexagonal honeycomb Structure) periodically closelypacked carbon atom is with different way of stacking (including ABC stackings, ABA heaps Pile etc.) stacking constitute a kind of two-dimentional carbon material.In this embodiment, the number of plies of multi-layer graphene can reach To 10 layers.
Can be using including but not limited to silicon carbide epitaxial growth method, organic synthesis method, chemical vapor deposition Or the deposition process such as plasma reinforced chemical vapour deposition method (PECVD) is formed (CVD).
The specific preparation process of wherein chemical vapour deposition technique includes:Then gaseous carbon source is led into reative cell Pyrolytic on cathode substrate surface in the reaction chamber.Wherein, gaseous carbon source can select methane (CH4)、 Ethene (C2H4) and acetylene (C2H2) etc..Deposition temperature range is controlled at 600~1200 DEG C.Wherein, When deposition temperature range is 900~1000 DEG C, the number of plies of graphene can reach 10 layers.
Methane (CH is selected in this embodiment4) and hydrogen (H2) as reacting gas, flow-rate ratio is Methane (CH4):Hydrogen (H2)=150:10, depositing temperature is 750 DEG C, and pressure is 50mtorr.
Methods described is still further comprised from 1M FeCl3Or 0.1M (NH4)2S2O8Etch Ni metal, And remove PMMA from acetone.
Step 2 is performed, the vibrating diaphragm 203 is patterned, the vibrating diaphragm with required plane pattern is formed.
Specifically, as shown in Figure 2 b, in this step by dry etching vibrating diaphragm 203, Etching gas can be selected according to the difference of selected materials in the present invention, for example in the present invention can be with Select CF4、CO2、O2、N2In one or more, the etching pressure can be 20-300mTorr, Preferably 50-150mTorr, power is 200-600W.
Step 3 is performed, sacrifice layer 204 is formed in the substrate 201 and the vibrating diaphragm 203;Pattern Change the sacrifice layer, be open with being formed in the middle part of the sacrifice layer, expose the vibrating diaphragm 203.
Specifically, as shown in Figure 2 b, wherein the sacrifice layer 204 can be from interlayer metal layer or oxygen Compound layer.
The step of patterning the sacrifice layer includes:Mask layer, such as photoetching are formed on the sacrifice layer Glue-line, is then exposed development to the photoresist layer, forms opening, then using the mask layer as Sacrifice layer described in mask etch, is open with being formed in the middle part of the sacrifice layer, exposes the vibrating diaphragm 203。
Dry etching is selected in this step, for example, can select and select CF4、CO2、O2、N2In one Plant or a variety of.
Step 4 is performed, in sacrifice layer engagement backboard wafer 205, to cover the sacrifice layer and institute State opening.
Specifically, as shown in Figure 2 c, backboard wafer 205 is formed in this step, with follow-up step Middle formation fixed electrode.
Therefore the backboard wafer 205 selects conductive material or the semi-conducting material of doping, alternatively, In this embodiment from the silicon of doping.
Wherein, the Doped ions are not limited to a certain kind, such as can be B, P, N, As, It will not enumerate.
In this step the backboard wafer 205 by eutectic bond or the method for thermal bonding with it is described sacrificial Domestic animal layer bonding, to form integral structure.
Step 5 is performed, the backboard wafer is thinned, to reduce the thickness of the backboard wafer.
Specifically, as shown in Figure 2 d, in this step the front of the backboard wafer is ground to beat The thin backboard wafer, obtains pattern as shown in Figure 2 d.
The thickness thinned in this step is not limited to a certain number range, and the method that thins can be selected With method commonly used in the art, not according in a certain kind, it will not be repeated here.
Step 6 is performed, passivation layer is formed on the backboard wafer, to cover the backboard wafer.
Specifically, as shown in Figure 2 e, the passivation layer can select oxide either nitride or two The combination of person.The passivation layer is from the oxide 206 and nitride being sequentially depositing in this embodiment 207。
The deposition can select deposition process commonly used in the prior art, for example, can be by chemical gas Mutually deposit the shapes such as (CVD) method, physical vapour deposition (PVD) (PVD) method or ald (ALD) method Into.Preferred ald (ALD) method in the present invention.
Step 7 is performed, the passivation layer is patterned, to form the first opening, exposes the backboard wafer; The backboard wafer is patterned, to form some the second spaced openings in the backboard wafer.
Specifically, as shown in figure 2f, the passivation layer is patterned, with the insulating barrier 102 and described The first opening is formed with passivation layer, exposes the backboard wafer.
Wherein, the forming method of first opening includes forming patterning first on the passivation layer Mask layer, such as photoresist layer, then using the mask layer described in mask etch passivation layer, with institute State and the first opening is formed in passivation layer.
The size of first opening is larger, to expose the backboard wafer in centre.
Then the backboard wafer is patterned, to form some spaced in the backboard wafer Two openings, expose the opening in the sacrifice layer.
Specifically, the mask layer of patterning is formed on the backboard wafer, such as photoresist layer, then Using the mask layer described in mask etch backboard wafer, with the backboard wafer formed it is some each other Every second opening, as shown in Figure 2 g, formed backboard, while exposing the opening in the sacrifice layer.
Blue film layer can be formed on the passivation layer or backboard wafer in this step, with to the back of the body Lath circle is protected.
Step 8 is performed, the back side of the substrate is patterned, to form back of the body chamber in the substrate, the bottom of at Expose the vibrating diaphragm in portion.
Specifically, as shown in fig. 2h, the shape first on the passivation layer or backboard wafer in this step Into blue film layer, to be protected to the backboard wafer.
Then the device is inverted, the back side of the substrate is etched, with the lower section of the vibrating diaphragm The air formed in back of the body chamber, the cavity is then as dielectric layer, to form MEMS microphone capacitor.
Further, the mask layer of patterning, such as photoresist layer, then with institute are formed on the substrate The back side that mask layer is substrate described in mask etch is stated, to form back of the body chamber in the substrate, in bottom dew Go out the vibrating diaphragm.
In this step, it is etched from hydrofluoric acid HF or dilute hydrofluoric acid DHF, wherein composition is HF:H2O=1:2-1:10, the etch temperature is 20-25 DEG C.
So far, the introduction of the preparation process of the MEMS of the embodiment of the present invention is completed.In above-mentioned step After rapid, other correlation steps can also be included, here is omitted.Also, except above-mentioned steps it Outside, the preparation method of the present embodiment can also include among each above-mentioned step or between different step Other steps, these steps can be realized by various techniques of the prior art, no longer be gone to live in the household of one's in-laws on getting married herein State.
Embodiment three
It is described present invention also offers a kind of electronic installation, including the MEMS described in embodiment one MEMS is prepared according to the methods described of embodiment two.
The electronic installation of the present embodiment, can be mobile phone, tablet personal computer, notebook computer, net book, Game machine, television set, VCD, DVD, navigator, DPF, camera, video camera, recording Any electronic product such as pen, MP3, MP4, PSP or equipment, or any centre including circuit Product.The electronic installation of the embodiment of the present invention, the above-mentioned circuit due to having used, thus with more preferable Performance.
Wherein, Fig. 3 shows the example of mobile phone handsets.Mobile phone handsets 300 be equipped with including Display portion 302, operation button 303, external connection port 304, loudspeaker 305 in shell 301, Microphone 306 etc..
Wherein described mobile phone handsets include the MEMS described in embodiment one, the MEMS Device includes substrate;Vibrating diaphragm, including graphene layer, positioned at the semiconductor substrate;Backboard, position Above the vibrating diaphragm;Cavity, between the vibrating diaphragm and the backboard.It is described in the present invention to shake Film selects graphene, and graphene is due to its excellent physics, chemical property, electric property and mechanical performance So that the performance of the MEMS is further improved.
The present invention is illustrated by above-described embodiment, but it is to be understood that, above-described embodiment The purpose illustrated and illustrated is only intended to, and is not intended to limit the invention to described scope of embodiments It is interior.In addition it will be appreciated by persons skilled in the art that the invention is not limited in above-described embodiment, root More kinds of variants and modifications can also be made according to the teachings of the present invention, these variants and modifications all fall within this Invent within scope claimed.Protection scope of the present invention is by the appended claims and its waits Effect scope is defined.

Claims (10)

1. a kind of MEMS, it is characterised in that the MEMS includes:
Substrate (201);
Vibrating diaphragm (203), the top positioned at the substrate (201), the vibrating diaphragm (203) includes graphite Alkene layer;
Backboard (205), the top positioned at the vibrating diaphragm (203);
Cavity, between the vibrating diaphragm (105) and the backboard (103).
2. the MEMS according to right 1, it is characterised in that adulterated in the graphene layer There are the one or more in Au, Ag, Cu, Ni, P, In and Ga.
3. the MEMS according to right 1, it is characterised in that the back of the body is formed with the substrate Chamber, vibrating diaphragm described in exposed portion.
4. the MEMS according to right 1, it is characterised in that shape in the backboard (205) Into there is some openings.
5. a kind of preparation method of MEMS, it is characterised in that methods described includes:
Substrate (201) is provided, the vibrating diaphragm (203) of patterning, the vibrating diaphragm are formed with the substrate (203) graphene layer is included;
The sacrifice layer with opening is formed in the substrate (201) and the vibrating diaphragm (203), it is described Opening exposes the vibrating diaphragm (203);
Backboard (205) is formed on the sacrifice layer, to cover the sacrifice layer and the opening, and Cavity is formed between the vibrating diaphragm (105) and the backboard (103).
6. method according to claim 5, it is characterised in that in the graphene layer doped with One or more in Au, Ag, Cu, Ni, P, In and Ga.
7. method according to claim 5, it is characterised in that the step of forming the sacrifice layer is wrapped Include:
Sacrifice layer is formed in the substrate (201) and the vibrating diaphragm (203);
The sacrifice layer is patterned, is open with being formed in the middle part of the sacrifice layer, exposes described shake Film (203).
8. method according to claim 5, it is characterised in that form the backboard (205) Step includes:
The sacrifice layer is engaged with backboard wafer, to cover the sacrifice layer and the opening, and in institute State and form cavity between vibrating diaphragm (105) and the backboard (103);
Backboard wafer described in thinning, to reduce the thickness of the backboard wafer;
Passivation layer is formed on the backboard wafer, to cover the backboard wafer;
The passivation layer is patterned, to form the first opening, backboard wafer described in exposed portion;
The backboard wafer is patterned, is opened with forming some spaced second in the backboard wafer Mouthful.
9. method according to claim 5, it is characterised in that methods described still further comprises figure The back side of substrate described in case, to form back of the body chamber, vibrating diaphragm described in exposed portion in the substrate.
10. a kind of electronic installation, it is characterised in that the electronic installation include Claims 1-4 it MEMS described in one.
CN201610172712.0A 2016-03-24 2016-03-24 A kind of MEMS and preparation method thereof, electronic installation Pending CN107231595A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610172712.0A CN107231595A (en) 2016-03-24 2016-03-24 A kind of MEMS and preparation method thereof, electronic installation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610172712.0A CN107231595A (en) 2016-03-24 2016-03-24 A kind of MEMS and preparation method thereof, electronic installation

Publications (1)

Publication Number Publication Date
CN107231595A true CN107231595A (en) 2017-10-03

Family

ID=59931935

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610172712.0A Pending CN107231595A (en) 2016-03-24 2016-03-24 A kind of MEMS and preparation method thereof, electronic installation

Country Status (1)

Country Link
CN (1) CN107231595A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110896518A (en) * 2019-12-17 2020-03-20 安徽奥飞声学科技有限公司 Manufacturing method of MEMS structure
CN117294996A (en) * 2023-11-23 2023-12-26 苏州上声电子股份有限公司 High pitch loudspeaker and vibrating diaphragm thereof

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101854578A (en) * 2010-06-01 2010-10-06 无锡芯感智半导体有限公司 Miniature microphone manufacturing method based on Si-Si bonding process
JP2010245797A (en) * 2009-04-06 2010-10-28 Panasonic Corp Capacitor microphone
CN102638753A (en) * 2012-03-16 2012-08-15 中北大学 MEMS (micro-electro-mechanical system) acoustic sensor based on graphene
WO2014100012A1 (en) * 2012-12-20 2014-06-26 The Regents Of The University Of California Electrostatic graphene speaker
CN104113810A (en) * 2014-07-18 2014-10-22 瑞声声学科技(深圳)有限公司 MEMS microphone and preparation method thereof and electronic device
CN105228076A (en) * 2014-06-30 2016-01-06 英飞凌科技股份有限公司 The method of MEMS and manufacture MEMS
CN105282678A (en) * 2014-06-06 2016-01-27 英飞凌科技股份有限公司 System and method for a microphone

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010245797A (en) * 2009-04-06 2010-10-28 Panasonic Corp Capacitor microphone
CN101854578A (en) * 2010-06-01 2010-10-06 无锡芯感智半导体有限公司 Miniature microphone manufacturing method based on Si-Si bonding process
CN102638753A (en) * 2012-03-16 2012-08-15 中北大学 MEMS (micro-electro-mechanical system) acoustic sensor based on graphene
WO2014100012A1 (en) * 2012-12-20 2014-06-26 The Regents Of The University Of California Electrostatic graphene speaker
CN105282678A (en) * 2014-06-06 2016-01-27 英飞凌科技股份有限公司 System and method for a microphone
CN105228076A (en) * 2014-06-30 2016-01-06 英飞凌科技股份有限公司 The method of MEMS and manufacture MEMS
CN104113810A (en) * 2014-07-18 2014-10-22 瑞声声学科技(深圳)有限公司 MEMS microphone and preparation method thereof and electronic device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘玉荣: "《碳材料在超级电容器中的应用》", 31 January 2013, 北京:国防工业出版社 *
蒋保江: "《石墨烯基复合材料的制备与性能研究》", 31 May 2014, 哈尔滨:黑龙江大学出版社 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110896518A (en) * 2019-12-17 2020-03-20 安徽奥飞声学科技有限公司 Manufacturing method of MEMS structure
CN117294996A (en) * 2023-11-23 2023-12-26 苏州上声电子股份有限公司 High pitch loudspeaker and vibrating diaphragm thereof

Similar Documents

Publication Publication Date Title
Yu et al. Graphene/MoS2 hybrid technology for large-scale two-dimensional electronics
CN105229793B (en) It is manufactured using the nano-wire transistor of hard mask layer
CN104137282B (en) Comprise the heterogeneous stacked of Graphene and comprise this heterogeneous stacked thermoelectric material, electrothermal module and thermoelectric device
CN102915993B (en) There is the integrated circuit of transducer and manufacture the method for this integrated circuit
CN106877836A (en) A kind of FBAR and its manufacture method and electronic installation
CN105092112B (en) A kind of MEMS pressure sensor and preparation method thereof
CN107231595A (en) A kind of MEMS and preparation method thereof, electronic installation
CN102376624A (en) Graphene device and production method thereof
CN105236347B (en) A kind of semiconductor device and preparation method thereof and electronic installation
CN106586946A (en) MEMS (microelectromechanical system) device, preparation method thereof and electronic device
CN106185787B (en) A kind of MEMS device and preparation method thereof, electronic device
CN101913550B (en) The manufacture method of microbridge structure of micro-electromechanical system
CN107226450A (en) A kind of MEMS and preparation method thereof, electronic installation
CN103915348A (en) Method for manufacturing graphene nanowire device
CN107978673A (en) A kind of semiconductor devices and preparation method, electronic device
CN108083225A (en) A kind of MEMS device and preparation method thereof, electronic device
CN107857233A (en) A kind of MEMS and preparation method thereof and electronic installation
CN105384143B (en) Semiconductor device and production method thereof, and electronic apparatus
CN109708766A (en) A kind of detector and its manufacturing method using acoustic resonator and carbon nanotube
CN108529552A (en) A kind of MEMS device and preparation method thereof, electronic device
CN105384144B (en) A kind of MEMS and preparation method thereof, electronic installation
CN107364827B (en) Semiconductor device, preparation method and electronic device
CN107154439A (en) A kind of semiconductor photo detector and preparation method thereof, electronic installation
US20120160292A1 (en) Thermoelectric device and manufacturing method thereof
CN109830436A (en) A kind of semiconductor devices and preparation method thereof, electronic device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20171003