CN107024488B - 一种玻璃缺陷检测方法 - Google Patents
一种玻璃缺陷检测方法 Download PDFInfo
- Publication number
- CN107024488B CN107024488B CN201710174896.9A CN201710174896A CN107024488B CN 107024488 B CN107024488 B CN 107024488B CN 201710174896 A CN201710174896 A CN 201710174896A CN 107024488 B CN107024488 B CN 107024488B
- Authority
- CN
- China
- Prior art keywords
- light
- sample
- fourier
- glass
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000011521 glass Substances 0.000 title claims abstract description 82
- 230000007547 defect Effects 0.000 title claims abstract description 49
- 238000001514 detection method Methods 0.000 title claims abstract description 21
- 238000006073 displacement reaction Methods 0.000 claims abstract description 24
- 230000003287 optical effect Effects 0.000 claims abstract description 22
- 230000009466 transformation Effects 0.000 claims abstract description 17
- 230000002950 deficient Effects 0.000 claims abstract description 12
- 238000005286 illumination Methods 0.000 claims abstract description 11
- 230000005540 biological transmission Effects 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 5
- 230000010363 phase shift Effects 0.000 claims description 5
- 238000009738 saturating Methods 0.000 claims description 2
- 238000001228 spectrum Methods 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims 1
- 238000009795 derivation Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005816 glass manufacturing process Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 238000012372 quality testing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710107558 | 2017-02-27 | ||
CN2017101075583 | 2017-02-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107024488A CN107024488A (zh) | 2017-08-08 |
CN107024488B true CN107024488B (zh) | 2019-08-13 |
Family
ID=59526205
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710174896.9A Active CN107024488B (zh) | 2017-02-27 | 2017-03-22 | 一种玻璃缺陷检测方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107024488B (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI647465B (zh) * | 2017-08-16 | 2019-01-11 | 旺矽科技股份有限公司 | 光學檢測系統 |
CN107782741A (zh) * | 2017-10-26 | 2018-03-09 | 德清晨英电子科技有限公司 | 一种通过光线判定气泡的装置 |
CN108844494A (zh) * | 2018-06-25 | 2018-11-20 | 新视界视光健康产业(南京)有限公司 | 基于光学方法检测眼镜曲面曲率参数的方法 |
CN109211920B (zh) * | 2018-09-04 | 2021-09-21 | 东旭光电科技股份有限公司 | 用于载板玻璃的紫外光透过率测试装置及设备 |
CN111213029A (zh) * | 2018-09-27 | 2020-05-29 | 合刃科技(深圳)有限公司 | 检测透明/半透明材料缺陷的方法、装置及*** |
CN109297991B (zh) * | 2018-11-26 | 2019-12-17 | 深圳市麓邦技术有限公司 | 一种玻璃表面缺陷检测***及方法 |
CN110057841A (zh) * | 2019-05-05 | 2019-07-26 | 电子科技大学 | 一种基于透射结构光的缺陷检测方法 |
CN110031481B (zh) * | 2019-05-05 | 2021-11-12 | 苏州天准科技股份有限公司 | 一种基于偏振的方波结构光照明实现方法 |
CN110715931B (zh) * | 2019-10-29 | 2022-04-12 | 上海御微半导体技术有限公司 | 一种透明样品缺陷自动检测方法和检测装置 |
CN111158131B (zh) * | 2019-12-31 | 2021-09-28 | 杭州电子科技大学 | 一种基于傅里叶叠层成像的led矩阵校正方法 |
CN111290660A (zh) * | 2020-01-21 | 2020-06-16 | 上海悦易网络信息技术有限公司 | 屏幕坐标转换为触笔坐标的方法及设备 |
CN112750113B (zh) * | 2021-01-14 | 2021-11-26 | 深圳信息职业技术学院 | 基于深度学习和直线检测的玻璃瓶缺陷检测方法及装置 |
CN113554636B (zh) * | 2021-07-30 | 2024-06-28 | 西安电子科技大学 | 一种基于生成对抗网络和计算全息的芯片缺陷检测方法 |
CN118010637B (zh) * | 2024-04-09 | 2024-06-07 | 江苏迪莫工业智能科技有限公司 | 一种生产工具用螺母检测***及其检测方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
CN102865832A (zh) * | 2012-09-18 | 2013-01-09 | 西安电子科技大学 | 基于相位恢复的4f镜面检测成像***及其方法 |
CN105066904A (zh) * | 2015-07-16 | 2015-11-18 | 太原科技大学 | 基于相位梯度阈值的流水线产品三维面型检测方法 |
-
2017
- 2017-03-22 CN CN201710174896.9A patent/CN107024488B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
CN102865832A (zh) * | 2012-09-18 | 2013-01-09 | 西安电子科技大学 | 基于相位恢复的4f镜面检测成像***及其方法 |
CN105066904A (zh) * | 2015-07-16 | 2015-11-18 | 太原科技大学 | 基于相位梯度阈值的流水线产品三维面型检测方法 |
Non-Patent Citations (2)
Title |
---|
Experimental techniques using 4f coherent imaging system for measuring nonlinear refraction;K.Fedus等;《Optics Communications》;20131231(第292期);第14-148页 * |
用傅里叶相移特性估计位移;吴元昊等;《光电工程》;20050831;第32卷(第8期);第73-76页 * |
Also Published As
Publication number | Publication date |
---|---|
CN107024488A (zh) | 2017-08-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107024488B (zh) | 一种玻璃缺陷检测方法 | |
CN100371677C (zh) | 衬底表面检测方法与设备 | |
CN104061873B (zh) | 形变测量成像*** | |
CN207992081U (zh) | 一种光学膜缺陷检测设备 | |
CN104870967A (zh) | 用于检查眼镜片的光学特性的符合性的方法以及相关设备 | |
JP2009516852A (ja) | 板ガラスを検査するための傾斜型透過照明検査システム及び方法 | |
KR20200010461A (ko) | 반사 표면의 곡률을 측정하기 위한 방법 및 관련 광학 디바이스 | |
KR20090084245A (ko) | 두께 측정방법 | |
CN104536172A (zh) | 一种检测装置和检测方法 | |
CN105300308A (zh) | 一种基于浅景深成像的深度测量方法及*** | |
WO2018219145A1 (zh) | 检测装置、检测方法和液晶滴注设备、液晶滴注方法 | |
CN103148800A (zh) | 一种基于光场传播的非标记三维显微方法和装置 | |
CN110044929A (zh) | 一种基于暗场照明的曲面玻璃次表面缺陷检测装置 | |
US11313805B2 (en) | Differential interference-based optical film defect detection method | |
WO2018072446A1 (zh) | 非对称式光学干涉测量方法及装置 | |
CN115950890A (zh) | 用于工业检测的谱域光学相干层析成像检测方法及*** | |
US7619190B2 (en) | Tilting adjustable surface profilometer | |
JP2009168813A (ja) | 光ファイバの残留応力測定装置 | |
Kim et al. | Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry | |
CN108956571B (zh) | 一种基于泄露辐射成像在ccd靶面与安装定位面夹角误差的校准方法及装置 | |
CN104880913B (zh) | 一种提高工艺适应性的调焦调平*** | |
EP0128183B1 (en) | Inspection apparatus and method | |
CN211086081U (zh) | 一种双轴晶体主轴方向光学均匀性的测试装置 | |
CN107923735A (zh) | 用于推导物体表面的形貌的方法和设备 | |
CN101604080A (zh) | 透镜基板的检测方法及其应用于显示装置的制造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Yan Chenggang Inventor after: Lv Binbin Inventor after: Wu Jiamin Inventor after: Wang Jiachen Inventor after: Song Jiayin Inventor before: Lv Binbin Inventor before: Yan Chenggang Inventor before: Wu Jiamin Inventor before: Wang Jiachen Inventor before: Song Jiayin |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201217 Address after: Room 3003-1, building 1, Gaode land center, Jianggan District, Hangzhou City, Zhejiang Province Patentee after: Zhejiang Zhiduo Network Technology Co.,Ltd. Address before: 310018 No. 2 street, Xiasha Higher Education Zone, Hangzhou, Zhejiang Patentee before: HANGZHOU DIANZI University Effective date of registration: 20201217 Address after: 314500 Tongxiang, Jiaxing, Zhejiang, Wutong Street East Road (East) 55, Tongxiang chamber of Commerce Building 1 unit 1702, 1703 room -A-218 Patentee after: Jiaxing Baoqiao Machinery Technology Co.,Ltd. Address before: Room 3003-1, building 1, Gaode land center, Jianggan District, Hangzhou City, Zhejiang Province Patentee before: Zhejiang Zhiduo Network Technology Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20210121 Address after: 516000 floor 1 and 2, building a, no.6, Keji Avenue, Dongjiang high tech Zone, Shuikou, Huizhou, Guangdong Patentee after: HUIZHOU HENGSHU ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: 314500 Tongxiang, Jiaxing, Zhejiang, Wutong Street East Road (East) 55, Tongxiang chamber of Commerce Building 1 unit 1702, 1703 room -A-218 Patentee before: Jiaxing Baoqiao Machinery Technology Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220712 Address after: 341000 ruixinglong Industrial Park, electronic information technology city, Longnan economic and Technological Development Zone, Longnan City, Ganzhou City, Jiangxi Province Patentee after: Jiangxi Xinying Electronic Technology Co.,Ltd. Address before: 516000 floor 1 and 2, building a, no.6, Keji Avenue, Dongjiang high tech Zone, Shuikou, Huizhou, Guangdong Patentee before: HUIZHOU HENGSHU ELECTRONIC TECHNOLOGY CO.,LTD. |