CN106896289A - Separated probes module and possesses the electronic component detection equipment of separated probes module - Google Patents
Separated probes module and possesses the electronic component detection equipment of separated probes module Download PDFInfo
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- CN106896289A CN106896289A CN201510951499.9A CN201510951499A CN106896289A CN 106896289 A CN106896289 A CN 106896289A CN 201510951499 A CN201510951499 A CN 201510951499A CN 106896289 A CN106896289 A CN 106896289A
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- probe
- separated probes
- electronic elements
- actuator
- electronic component
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention relates to a kind of separated probes module and possesses the electronic component detection equipment of separated probes module, the equipment mainly includes feeding device, separated probes module, fetching device and control device；And separated probes module includes probe, two-dimensional movement mechanism and actuator；Wherein, measured electronic elements are transferred to test position by control device control fetching device from feeding device, and actuator is controlled to drive two-dimensional movement mechanism to be moved horizontally and lifting moving, and then drive probe to make electrical contact with and detected with measured electronic elements into test position.Accordingly, by way of making probe and carrying out two-dimensional movement, probe is allowed only to be located in test position when the detection, remaining time then removes test position to avoid influence from feeding and follow-up classification process.
Description
Technical field
The present invention relates to a kind of separated probes module and possess the electronic component detection equipment of separated probes module, it is special
It is not related to a kind of probe module and its testing equipment for detecting crystal grain.
Background technology
With electronic package test industry constantly direction raising tested productivity, raising accurate testing degree, reduce into
This and reduce various pollutions etc. towards development, Ge Jia test equipments manufacturer rack one's brains invariably the various novel device of exploitation with
Meet the requirement of Feng Ce manufacturers.
TaiWan, China utility model patent the M439261st " crystal grain separator probe high speed separating device " is referred to,
This is prior art (hereinafter referred to as known document 1), and it is disclosed and is shifted crystal grain from feedway using vacuum acquisition mechanism
To probe base, and vacuum acquisition mechanism includes the suction nozzle for taking and putting crystalline grain, and vacuum acquisition mechanism is driven using elevating mechanism
Drive suction nozzle lifting, and drive probe base to swing using depression bar during lifting so that the contact of probe convergence or away from
Crystal grain.
However, suction nozzle is during suction, it is possible to because error, the operational error of transfer device of crystallite dimension
Or other external factors cause suction nozzle adsorb crystal grain position have offset, so will influence sorting operation.Further illustrate, please
In the lump refering to Fig. 2 of known document 1, it is accordingly required in particular to which explanation, the reference for being marked below is all known document 1 and illustrates
It is listed in book, rather than the reference of description of the invention.
After detection is finished, gas blow pipe 821 or the meeting of suction nozzle 22 blow gas make crystal grain depart from suction nozzle 22 and fall to known technology
Enter to accept in casket 8, Awaiting Triage disk 9 carries out the classification of non-defective unit or defective products to it；If however, suction nozzle 22 adsorbs the position of crystal grain
Have it is offset (normally for crystal grain center position), when 22 blow gas of gas blow pipe 821 or suction nozzle, will cause
Crystal grain is toward lateral disorderly spray, or even probe below clashing into, probe base or accepts casket 8 and spray and accept outside casket 8.So light then shadow
Ring detection efficiency or damage crystal grain, heavy then accuracy that classification will be influenceed or even result in follow-up whole detection and fail.
Additionally, above-mentioned known device no doubt possesses good tested productivity, but the lift of suction nozzle is contained because of the equipment
Interlinked mechanism that structure and probe base swing etc., causes the mechanism of whole equipment complicated, it is not easy to assembling and repair, and probe with
Intercrystalline contact force is difficult to adjust, and because elevating mechanism uses air pressure component, therefore noise is quite big.And, it is above-mentioned known
The type limitation single kind of equipment crystal grain applicatory, the list that such as fixed dimension, fixed thickness and connecting point position are fixed
The crystal grain of one type, is also more short of in stability.
In sum, a kind of current mechanism of industrial circle active demand is simple, cost is relatively low, assembling maintenance is easy, can be significantly
Reduce noise and detection efficiency can be lifted, polytype measured electronic elements are applicable to again, can more be prevented effectively from crystal grain unrest
The testing equipment of spray.
The content of the invention
It is a primary object of the present invention to providing a kind of separated probes module and possessing the electronics of separated probes module
Element testing equipment, so that reach testing goal with simple mechanism, therefore reduces cost and can lift detection efficiency；Most
Importantly, electronic component can be prevented effectively from disorderly spray, the accuracy and the lifting precision of testing equipment of classification and qualified is lifted
Rate.
To reach above-mentioned purpose, the present invention provides a kind of electronic component detection equipment for possessing separated probes module, main
To include feeding device, separated probes module, fetching device and control device；Wherein, feeding device includes feed zone, and
Feeding device is used to supply at least one measured electronic elements；Separated probes module is used to detect at least one in test position
Measured electronic elements, and separated probes module includes at least one probe, two-dimensional movement mechanism and actuator, actuator connection
Two-dimensional movement mechanism, and at least one probe group is in two-dimensional movement mechanism；Fetching device shifts at least one electronics to be measured
Element；Control device electrical connection feeding device, separated probes module and fetching device；Wherein, control device control picks and places dress
Put from feed zone and be transferred to test position, and control device control actuator to drive two dimension by least one measured electronic elements
Travel mechanism is moved horizontally and lifting moving, and then drives at least one probe to be treated with least one into test position
Electronic component is surveyed to make electrical contact with and detected.
Accordingly, the electronic component detection equipment that the present invention possesses separated probes module can utilize separated probes module
Actuator drives at least one probe to be moved horizontally and lifting moving, and then connects with least one measured electronic elements electricity
Touch, and composition is conducted and detected；Therefore by the present invention in that at least one probe carries out the mode of two-dimensional movement, allow probe
Only it is located in test position when the detection, remaining time then removes test position to avoid influence from feeding and follow-up classification
Flow.
It is preferred that when at least one measured electronic elements of the invention are detected, fetching device constantly draw to
Few measured electronic elements；And work as detection and finish, control device controlled actuator is carried out separately with driving at least one probe
The lifting moving in one direction and move horizontally and exit outside test position.Accordingly, the present invention can completely avoid electronic component from existing
During falling into sorting unit, electronic component sprays the situation from sorting unit caused by shock probe or probe base.
Additionally, the fetching device that the present invention possesses the electronic component detection equipment of separated probes module may include suction nozzle,
Its lower surface may include at least one electrode contact, and control device is electrically connected at least one electrode contact；When at least one
When measured electronic elements are detected, at least one electrode contact and at least one probe of suction nozzle lower surface are in electrical contact with least
One measured electronic elements.Accordingly, the suction nozzle and probe that fetching device can also be used of the invention serves as test electrode, each to adapt to
The different connecting point positions of the electronic component of type.
In addition, in the present invention, the upper surface of each measured electronic elements and lower surface can respectively include two terminal pads；
And the lower surface of the suction nozzle of fetching device includes two electrode contacts；And separated probes module includes the first probe and the second spy
Pin.Wherein, when at least one measured electronic elements are detected, the measured electronic elements of suction at least one, and suction nozzle
Two electrode contacts of lower surface, the first probe and the second probe respectively with the upper surface of at least one measured electronic elements and under
Two terminal pads electrical contact on surface.
Accordingly, the electronic component detection equipment that the present invention possesses separated probes module is equally applicable to detection up and down each two
The electronic component of individual contact (terminal pad), you can using two electrode contacts and separated probes module of suction nozzle lower surface
First probe and the second probe are conducted with two terminal pads electrical contact of electronic component upper and lower surface with constituting respectively, to carry out
Detection.Additionally, the present invention is not also limited with suction nozzle two electrode contacts of configuration and two probes, can be according to the contact of electronic component
Port number configures more electrode contacts and probe.
In addition, the electronic component detection equipment that the present invention possesses separated probes module may also include two brush survey electrodes,
It is electrically connected to control device；And fetching device may include fixed mount, and suction nozzle is mounted on the lower surface of fixed mount；On fixed mount
Including two conductive regions, its two electrode contact for being respectively electrically connected to suction nozzle lower surface.Wherein, when fetching device will at least
When one measured electronic elements is transferred to test position, two brushes are surveyed electrode and are connect with two conductive region electricity of fixed mount respectively
Touch.Accordingly, when at least one measured electronic elements are transferred to test position by fetching device, two brushes survey electrode can just be electrically connected
Two electrode contacts of suction nozzle lower surface are connect, composition is turned on and tested, in addition to the configuration that can simplify circuit, can also carry
High security.
The two-dimensional movement mechanism that the present invention possesses the electronic component detection equipment of separated probes module may include pedestal, cunning
Platform and lifting platform, slide unit be coupled on pedestal and can relative level slide, and lifting platform is coupled on slide unit and can OQ t
Slide, and at least one probe group is in lifting platform；Wherein, actuator is connected to slide unit and lifting platform.Therefore, the present invention can lead to
Cross actuator and drive slide unit and lifting platform, slide unit is made level relative to pedestal and slide and make the lifting platform can be relative to slide unit
Make lifting carriage, and then drive probe to produce level and elevating movement.
Additionally, the actuator that the present invention possesses the electronic component detection equipment of separated probes module may include drive shaft,
Include oblique groove and projection on the outer circumferential surface of its radial direction；And slide unit includes driven rod and leverage, and driven rod is coupled
In oblique groove, leverage is between drive shaft and lifting platform；Work as drive shaft turns, oblique groove can drive driven rod and
Slide unit level is driven to slide, and projection can push against one end of leverage, the leverage other end then pushes against lifting platform and lifts
Slide.Accordingly, the present invention can drive slide unit to move horizontally and drive respectively by the single drive shaft of single actuator
Lifting platform is moved up and down, and design is unique, significantly simplifies drive mechanism, can effective reduces cost, reliability is splendid.
To reach above-mentioned purpose, the present invention provides a kind of separated probes module, and it detects at least one in test position
Measured electronic elements, and separated probes module includes at least one probe, two-dimensional movement mechanism and actuator, actuator connection
Two-dimensional movement mechanism, at least one probe group is in two-dimensional movement mechanism；Wherein, actuator driving two-dimensional movement mechanism is carried out
Move horizontally and lifting moving, and then drive at least one probe electric with least one measured electronic elements into test position
Contact and detected.
Accordingly, separated probes module of the invention moved using at least one probe level and lifting moving come with extremely
Few measured electronic elements electrical contact, and composition is conducted and detected；Therefore by the present invention in that at least one probe enters
The mode of row two-dimensional movement, allows at least one probe except being only located in test position when the detection, and remaining time then moves
Go out test position to avoid influence from feeding and follow-up classification process.
Additionally, in separated probes module of the invention, two-dimensional movement mechanism may include pedestal, slide unit and lifting platform,
Slide unit can be coupled on pedestal and can relative level slide, lifting platform can be coupled on slide unit and can OQ t slip, at least
One probe can be mounted on lifting platform, and actuator may be connected to slide unit and lifting platform.
In addition, in separated probes module of the invention, actuator may include drive shaft, on the outer circumferential surface of its radial direction
May include oblique groove and projection；Slide unit may include driven rod and leverage, and driven rod may couple to oblique groove, Lever machine
Structure can be between drive shaft and lifting platform；Work as drive shaft turns, oblique groove can drive driven rod and drive slide unit level to slide
Dynamic, projection can push against one end of leverage, and the other end of leverage then pushes against lifting platform and does lifting carriage.
Brief description of the drawings
Fig. 1 is one partial top view of preferred embodiment of testing equipment of the present invention.
Fig. 2 is one system architecture diagram of preferred embodiment of testing equipment of the present invention.
Fig. 3 is the schematic perspective view of electronic component that will be detected in a preferred embodiment of the invention.
Fig. 4 A are the top view of the separated probes module of a preferred embodiment of the invention.
Fig. 4 B are the left side view of the separated probes module of a preferred embodiment of the invention.
Fig. 5 is the partial front elevation view of the separated probes module of a preferred embodiment of the invention.
The part of separated probes module and fetching device when Fig. 6 in a preferred embodiment of the invention to be tested
Side view.
Fig. 7 is the close-up schematic view of the suction nozzle of a preferred embodiment of the invention.
Specific embodiment
Separated probes module of the present invention and possesses the electronic component detection equipment of separated probes module in the present embodiment
In be described in detail before, it is important to note that in the following description, similar element will carry out table with identical reference
Show.Additionally, accompanying drawing of the invention is only as schematically illustrate, it is not necessarily drawn to scale, and all details also may not all be presented
In accompanying drawing.
It is the partial top view of a preferred embodiment of the invention also referring to Fig. 1 and Fig. 2, Fig. 1, Fig. 2 is the present invention
One system architecture diagram of preferred embodiment.As shown in FIG., the testing equipment of the present embodiment mainly includes feeding device 2, divides
From formula probe module 3, fetching device 4, control device 5 and sorting unit 6.Wherein, feeding device 2 includes feeding orbit 21, and
Electronic component C can be made to be moved along feeding orbit 21 and arrive at confession by vibrating disc (not shown) come delivering electronic components C
The feed zone As of material track 21 end.
A separated probes module 3, and each separated probes mould are each provided with the end both sides of feeding orbit 21
Block 3 respectively includes a test position At；And the fetching device 4 of the present embodiment include V-arrangement swing arm 44, its reciprocally rotation and turn
Electronic component C is moved, the further feature on separated probes module 3 and fetching device 4 is see aftermentioned.In addition, sorting unit 6
For to having detected the electronic component C for finishing classification, it to may be disposed at test position At lower sections or its elsewhere, not set herein
Limit.Additionally, the electrical connection of control device 5 feeding device 2, separated probes module 3, fetching device 4 and sorting unit 6.
Fig. 3 is referred to, it is the stereogram of the electronic component that will be detected in a preferred embodiment of the invention.Such as
Shown in figure, the upper surface of electronic component C and lower surface respectively include two terminal pads C1, C2, C3, C4, that is, make electrical contact with
Contact.Further illustrate, the present embodiment is that, to detect that upper and lower surface respectively there are two electronic components of contact, but the present invention should
As limit, one side two point, one side multiple-contact, two-sided each single contact or two-sided each multijunction electronic component may be applicable to
The present invention.
Please refer to Fig. 4, Fig. 5 and Fig. 6, Fig. 4 A are the separated probes module and liter of a preferred embodiment of the invention
The top view of falling tone engagement positions, Fig. 4 B are the left side view of the separated probes module of a preferred embodiment of the invention, and Fig. 5 is
The partial front elevation view of the separated probes module of a preferred embodiment of the invention, Fig. 6 is in a preferred embodiment of the invention
The partial side view of separated probes module and fetching device when being tested.
As shown in FIG., separated probes module 3 mainly includes the first probe 31, the second probe 32, actuator 33 and two
Dimension travel mechanism 30；Wherein, two-dimensional movement mechanism 30 includes pedestal 34, slide unit 35 and lifting platform 36 again, and slide unit 35 passes through slide rail
Be coupled on pedestal 34 with slide way mechanism and can relative level slide, and lifting platform 36 is coupled again by slide rail and slide way mechanism
In on slide unit 35 and can OQ t slide, and the first probe 31 and the second probe 32 are mounted on lifting platform 36, therefore can be with
Slide unit 35 is moved horizontally and as lifting platform 36 is moved up and down.
Additionally, the actuator 33 of the present embodiment uses servomotor or stepping motor, therefore equipment fortune can be greatly reduced
Noise produced by row, but actuator of the invention 33 is not limited to servomotor or stepping motor, can also use air pressure
Cylinder, oil hydraulic cylinder or other equivalent actuators.Additionally, actuator 33 includes drive shaft 331, include on the outer circumferential surface of its radial direction oblique
To groove 332 and projection 333, wherein oblique groove 332 includes inclined-plane ring segment Is and radial direction flat segments Ds, and projection 333 is then convex
For the outer circumferential surface of the radial direction of drive shaft 331.
And for example shown in Fig. 4 A and Fig. 4 B, wherein showing leverage 352 for convenience, driven rod is eliminated in Fig. 4 B
351.The side that slide unit 35 is adjacent to the drive shaft 331 of actuator 33 is provided with driven rod 351 and leverage 352, driven rod
351 ends are coupled in oblique groove 332, and leverage 352 is between drive shaft 331 and lifting platform 36.
Therefore, when drive shaft 331 is rotated, oblique groove 332 will drive driven rod 351 to be moved along inclined-plane ring segment Is, and
Driving slide unit 35 carries out level slip, until driven rod 351 is into just maintaining former horizontal level after radial direction flat segments Ds；Connect
, drive shaft 331 is rotated further, gone to push against one end of leverage 352 by projection 333, remove the other end of leverage 352
Pushing and pressing lifting platform 36, carrys out lifting lifting platform 36, i.e., as shown in Figure 4 B, the first probe 31 and the second probe 32 is entered test position
At。
Otherwise similarly, when the first probe 31 and the second probe 32 will exit test position At, drive shaft 331 is inverted,
Projection 333 is set to cancel pushing and pressing lifting platform 36, and lifting platform 36 declines reset by self gravitation, or also can separately set reset machine
Structure such as spring etc. makes lifting platform 36 decline reset；Then, drive shaft 331 continues to invert, and driven rod 351 enters from radial direction flat segments Ds
Enter inclined-plane ring segment Is, gradually drive slide unit 35 to carry out level slip and exit test position At.
Again and, as shown in Figure 6, the testing equipment of the present embodiment also includes that two brushes survey electrodes 431,432, its electrical connection
To control device 5.Each fetching device 4 includes fixed mount 42 and suction nozzle 41.Also referring to Fig. 1, the both sides of V-arrangement swing arm 44
Group sets fixed mount 42 respectively for end, and suction nozzle 41 is then mounted on the lower surface of fixed mount 42, and the lower surface of fixed mount 42 also
Including two conductive regions 421,422.However, when measured electronic elements C is transferred to test position At by fetching device 4, two
Individual brush is surveyed electrode 431,432 and is made electrical contact with two conductive regions 421,422 on the lower surface of fixed mount 42 respectively.
Please refer to Fig. 7 in the lump again, Fig. 7 is the close-up schematic view of the suction nozzle of a preferred embodiment of the invention.As schemed
Shown in, the lower surface of suction nozzle 41 of the present embodiment is provided with two electrode contacts 411,412, and the two electrode contacts 411,412
Between it is insulated from each other, and the two electrode contacts 411,412 be respectively electrically connected to two brush survey electrodes 431,432.However, the two
Electrode contact 411,412 and the first probe 31 and the second probe 32 be respectively used to on the upper surface of electronic component C and lower surface
Two terminal pads C1, C2, C3, C4 contact terminal electrical contact.
The below running of the electronic component detection equipment for possessing separated probes module of simple declaration the present embodiment.It is first
First, the delivering electronic components C of feeding orbit 21 and arrive at the feed zone As of the end of feeding orbit 21；Then, the V-arrangement of fetching device 4
The wherein side of swing arm 44 is moved to feed zone As, and the control suction nozzle 41 of control device 5 draws an electronic component C, and now suction nozzle
Two terminal pads C1, C2 of two electrode contacts 411,412 of 41 lower surfaces respectively with electronic component C upper surfaces make electrical contact with.
Then, the rotation of the control V-arrangement of control device 5 swing arm 44, makes adsorbed electronic component C be transferred to the end of feeding orbit 21
One of separated probes module 3 of both sides is held, and in test position At.Now, two brushes survey electrode 431,432
Respectively with the lower surface of fixed mount 42 on two conductive regions 421,422 electrical contact and composition conduct.
In addition, while fetching device 4 draws simultaneously transferred-electron device C, the control actuator 33 of control device 5 starts,
So as to drive slide unit 35 to move horizontally and drive the lifting moving of lifting platform 36, enter the first probe 31 and the second probe 32 and survey
Examination position At simultaneously makes electrical contact with, and detected with two terminal pads C3, C4 of electronic component C lower surfaces.
In the present embodiment, before fetching device 4 is drawn and electronic component C is transferred into test position At, slide unit 35
Moved horizontally in advance, and worked as electronic component C into after test position At, lifting platform 36 is carried out lifting moving again, made the
One probe 31 and the second probe 32 make electrical contact with two terminal pads C3, C4 of electronic component C lower surfaces, can so shorten and pick and place dress
4 and the mutual idle stand-by period of separated probes module 3 are put, therefore detection efficiency can be substantially improved.
When detection is finished, the control actuator 33 of control device 5 is another to drive the first probe 31 and the second probe 32 to carry out
The lifting moving in direction and move horizontally and exit outside test position At, now suction nozzle 41 sprays gas and makes to finish after testing
Electronic component C smoothly fall and enter, and control device 5 control again sorting unit 6 pairs this finished after testing electronics unit
Part C is classified.
In to sum up, separated probes module of the invention and possesses the electronic component detection equipment of separated probes module
At least include following advantage：
(1) allows probe to be surveyed except being only located at when the detection by the present invention in that probe carries out the mode of two-dimensional movement
In examination position At, remaining time is then removed outside test position At, to avoid influence from feeding and follow-up classification process, therefore can be complete
Electronic component C is avoided during sorting unit is fallen into, electronic component C is sprayed from sorting caused by shock probe or probe base
The situation of device；
(2) the present invention can utilize the suction nozzle 41 and probe of fetching device 4 to serve as test electrode, various types of to adapt to
The different connecting point positions of electronic component C；It is, number of connections and the position of various types of electronic component C are suitable for, elasticity
Change the quantity of suction nozzle and probe, for example one side two point, one side multiple-contact, two-sided each single contact, two-sided each two point and
Two-sided each multiple-contact etc.；
(3) the present invention surveys the setting of electrode 431,432 by brushing；When be transferred to for measured electronic elements C by fetching device 3
During test position At, two brushes survey electrode 431,432 can just electrically connect two electrode contacts 411,412 of the lower surface of suction nozzle 41,
And composition is turned on and tested, in addition to the configuration that can simplify circuit, security can be also improved；
(4) the present invention can respectively drive slide unit 35 to move horizontally by the single drive shaft 331 of single actuator 33
And drive lifting platform 36 to move up and down, significantly simplify drive mechanism, can effective reduces cost, and reliability is splendid；
And
(5) actuators 33 of the invention can use linear motor, and stabilization, reliability and long service life can significantly drop again
Noise produced by low equipment running.
Above-described embodiment is illustrated only for convenient explanation, and the interest field that the present invention is advocated is with claims
It is described to be defined, rather than it is only limitted to above-described embodiment.
Symbol description
2 feeding devices
21 feeding orbits
3 separated probes modules
30 two-dimensional movement mechanisms
31 first probes
32 second probes
33 actuators
331 drive shafts
332 oblique grooves
333 projections
34 pedestals
35 slide units
351 driven rods
352 leverages
36 lifting platforms
4 fetching devices
41 suction nozzles
411,412 electrode contacts
42 fixed mounts
421,422 conductive regions
431,432 brushes survey electrode
44 V-arrangement swing arms
5 control devices
6 sorting units
As feed zones
At test positions
C electronic components
C1, C2, C3, C4 terminal pad
Is inclined-planes ring segment
Ds radial direction flat segments.
Claims (10)
1. a kind of electronic component detection equipment for possessing separated probes module, including：
Feeding device, it includes feed zone, and the feeding device is used to supply at least one measured electronic elements；
Separated probes module, it detects at least one measured electronic elements in test position；The separated probes module bag
At least one probe, two-dimensional movement mechanism and actuator are included, the actuator connects the two-dimensional movement mechanism, at least one probe
It is mounted in the two-dimensional movement mechanism；
Fetching device, it moves at least one measured electronic elements；And
Control device, it electrically connects the feeding device, the separated probes module and the fetching device；
Characterized in that, the control device controls the fetching device to shift at least one measured electronic elements from the feed zone
To the test position, the control device controls the actuator to drive the two-dimensional movement mechanism to be moved horizontally and lifted shifting
It is dynamic, and then drive at least one probe to make electrical contact with and carry out with least one measured electronic elements into the test position
Detection.
2. the electronic component detection equipment of separated probes module is possessed as claimed in claim 1, it is characterised in that this at least one
When measured electronic elements are detected, the fetching device constantly draws at least one measured electronic elements；When detection is finished,
The control device control the actuator with drive at least one probe carry out other direction lifting moving and move horizontally from
And exit outside the test position.
3. the electronic component detection equipment of separated probes module is possessed as claimed in claim 1, it is characterised in that the fetching device
Including suction nozzle, its lower surface includes at least one electrode contact, and the control device is electrically connected at least one electrode contact；When
When at least one measured electronic elements are detected, at least one electrode contact of the suction nozzle lower surface and this at least one
Probe is in electrical contact with least one measured electronic elements.
4. the electronic component detection equipment of separated probes module is possessed as claimed in claim 3, it is characterised in that each is to be measured
The upper surface of electronic component and lower surface respectively include two terminal pads；The lower surface of the suction nozzle of the fetching device includes two electricity
Polar contact；The separated probes module includes the first probe and the second probe；When at least one measured electronic elements are examined
During survey, the suction at least one measured electronic elements, two electrode contacts and the separated probes mould of the suction nozzle
First probe and second probe of block respectively with the upper surface of at least one measured electronic elements and lower surface on should
Two terminal pad electrical contacts.
5. the electronic component detection equipment of separated probes module is possessed as claimed in claim 4, it is characterised in that also including two
Brush surveys electrode, and it is electrically connected to the control device；The fetching device includes fixed mount, and the suction nozzle is mounted on the lower end of the fixed mount
Face, includes two conductive regions, its two electrode contact for being respectively electrically connected to the suction nozzle lower surface on the fixed mount；When this
When at least one measured electronic elements are transferred to the test position by fetching device, this two brushes are surveyed electrode and are fixed with this respectively
Two conductive region electrical contacts of frame.
6. the electronic component detection equipment of separated probes module is possessed as claimed in claim 1, it is characterised in that the two-dimensional movement
Mechanism includes pedestal, slide unit and lifting platform, the slide unit be coupled on the pedestal and can relative level slip, the lifting platform is coupled to
On the slide unit and can OQ t slide, at least one probe group in the lifting platform, the actuator be connected to the slide unit and
The lifting platform.
7. the electronic component detection equipment of separated probes module is possessed as claimed in claim 6, it is characterised in that the actuator bag
Drive shaft is included, oblique groove and projection are included on the outer circumferential surface of its radial direction；The slide unit includes driven rod and leverage, the band
Lever is coupled in the oblique groove, and the leverage is between the drive shaft and the lifting platform；When the drive shaft turns, this is oblique
The driven rod being driven to groove and driving the slide unit level to slide, the projection pushes against one end of the leverage, the leverage
The other end then push against the lifting platform and make lifting carriage.
8. a kind of separated probes module, it detects at least one measured electronic elements, the separated probes mould in test position
Block includes at least one probe, two-dimensional movement mechanism and actuator, and the actuator connects the two-dimensional movement mechanism, and this at least one
Probe group is in the two-dimensional movement mechanism；Characterized in that, the actuator drives the two-dimensional movement mechanism to be moved horizontally
And lifting moving, and then drive at least one probe to be connect with least one measured electronic elements electricity into the test position
Touch and detected.
9. separated probes module as claimed in claim 8, it is characterised in that the two-dimensional movement mechanism includes pedestal, slide unit and liter
Drop platform, the slide unit be coupled on the pedestal and can relative level slip, the lifting platform is coupled on the slide unit and can OQ t
Slide, in the lifting platform, the actuator is connected to the slide unit and the lifting platform at least one probe group.
10. separated probes module as claimed in claim 9, it is characterised in that the actuator includes drive shaft, the outer shroud of its radial direction
Include oblique groove and projection on side face；The slide unit includes driven rod and leverage, and the driven rod is coupled in the oblique groove,
The leverage is between the drive shaft and the lifting platform；When the drive shaft turns, the oblique groove drive the driven rod and
The slide unit level is driven to slide, the projection pushes against one end of the leverage, and the other end of the leverage then pushes against the lifting
Platform carries out lifting carriage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510951499.9A CN106896289A (en) | 2015-12-17 | 2015-12-17 | Separated probes module and possesses the electronic component detection equipment of separated probes module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510951499.9A CN106896289A (en) | 2015-12-17 | 2015-12-17 | Separated probes module and possesses the electronic component detection equipment of separated probes module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106896289A true CN106896289A (en) | 2017-06-27 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510951499.9A Withdrawn CN106896289A (en) | 2015-12-17 | 2015-12-17 | Separated probes module and possesses the electronic component detection equipment of separated probes module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106896289A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111413576A (en) * | 2020-04-14 | 2020-07-14 | 江苏量为石科技股份有限公司 | Detection apparatus for distribution equipment for distribution network of low-voltage line equipment |
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| CN103286076A (en) * | 2012-02-10 | 2013-09-11 | 先进科技新加坡有限公司 | Handling system for testing electronic components |
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| CN205333766U (en) * | 2015-12-17 | 2016-06-22 | 台北歆科科技有限公司 | Disconnect -type probe module and possess electronic component check out test set of disconnect -type probe module |
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| US6414478B1 (en) * | 1999-07-09 | 2002-07-02 | Tokyo Electron Limited | Transfer mechanism for use in exchange of probe card |
| CN201371132Y (en) * | 2009-03-23 | 2009-12-30 | 常州新区爱立德电子有限公司 | Semiconductor chip automatic sorting machine |
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| TWM503570U (en) * | 2015-02-12 | 2015-06-21 | Chroma Ate Inc | Electronic component inspection device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111413576A (en) * | 2020-04-14 | 2020-07-14 | 江苏量为石科技股份有限公司 | Detection apparatus for distribution equipment for distribution network of low-voltage line equipment |
| CN111413576B (en) * | 2020-04-14 | 2023-08-15 | 江苏量为石科技股份有限公司 | Detection device of distribution equipment for low-voltage line equipment distribution network |
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Application publication date: 20170627 |