CN106872142B - The measurement method of image retention after a kind of cmos image sensor proton irradiation - Google Patents
The measurement method of image retention after a kind of cmos image sensor proton irradiation Download PDFInfo
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- CN106872142B CN106872142B CN201710058863.8A CN201710058863A CN106872142B CN 106872142 B CN106872142 B CN 106872142B CN 201710058863 A CN201710058863 A CN 201710058863A CN 106872142 B CN106872142 B CN 106872142B
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Abstract
The invention discloses a kind of measurement methods of image retention after cmos image sensor proton irradiation.Temperature control has been carried out using temperature control box, has realized the accurate measurement of image retention after cmos image sensor proton irradiation；By the calculating of the i-th frame (1,2,3 ... M of i) image using the method for taking multiple series of images to average, random error caused by single measurement can be excluded；By removing part abnormal image when calculating, the measurement accuracy of image retention after cmos image sensor proton irradiation is improved.The present invention has many advantages, such as that stability is good, measuring accuracy is high and measurement method is easy, is applicable to the precise measurement of cmos image sensor image retention after proton irradiation, provides technical support for the radiation injury assessment of cmos image sensor.
Description
Technical field
The present invention relates to radiation effect the field of test technology, and in particular to after a kind of cmos image sensor proton irradiation
The measurement method of image retention.
Background technique
Complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor, CMOS) figure
As sensor has the advantages that small in size, light weight, low in energy consumption, integrated level is high, it is sensitive to be widely used in star sensor, the sun
The space fields such as device, remotely sensed image, in star identification, star tracking, posture determination, space articulation, signature tracking, Landing Control
It played an important role in the space tasks such as landing imaging and target following.However, when cmos image sensor is applied to upper
Spacial Proton irradiation damage will be will receive when stating field, lead to the even disabler of cmos image sensor performance degradation.Therefore
Carry out the damage research of cmos image sensor proton irradiation to have great importance.
Image retention is one of the important indicator of cmos image sensor institute collection image quality, it characterizes this frame image
Whether there are a parameters of previous frame LCD image traces, are the important ginsengs of cmos image sensor proton irradiation degree of injury assessment
Number.
After proton irradiation, cmos image sensor imaging results are very sensitive to environment temperature.Traditional measurement cmos image
Sensor image be detained system often ignore temperature factor, cause irradiation after cmos image sensor image retention test because
Uncertainty is caused to increase for variation of ambient temperature, in some instances it may even be possible to occur causing the changing value of image retention big due to temperature fluctuation
In the degradation values for irradiating induced image retention.Cmos image sensor is likely to occur random Code Signal after proton irradiation, leads
It causes uncertainty of measurement to increase and mistake even occurs.In addition, after proton irradiation, cmos image sensor continuous acquisition multiple image
When, former frames are likely to occur the larger problem of gray value, lead to not accurately survey cmos image sensor image retention
Amount has seriously affected the accuracy of cmos image sensor irradiation damage assessment.
Summary of the invention
The present invention is directed to the deficiency of the above prior art, proposes cmos image sensor figure after a kind of measurement proton irradiation
Method as being detained.
Technical scheme is as follows：
The measurement method of image retention, mainly includes the following steps that after the cmos image sensor proton irradiation：
1) cmos image sensor after proton irradiation is placed in camera bellows, camera bellows is in isoperibol, sets inside camera bellows
Light source is set for the Uniform Irradiation cmos image sensor when test needs；
2) setting is in the n time of integration of arithmetic progression, n >=10, each time of integration continuous acquisition M frame image, M >=20
And be even number, and only open light source in the M/2 image frame grabber time, so that cmos image sensor is in uniform illumination environment；
And during other image frame grabbers, light source does not shine, and cmos image sensor is in dark field environment；
3) for each time of integration, the average gray value of every frame image is calculated separately；Wherein M/2 frame is average grey for judgement
Whether angle value is consistent (in the error range of permission) with 50% saturation gray value：If it is, with the corresponding product of M/2 frame
As the test time of integration between timesharing；If it is not, then adjusting the difference and/or initial value of the arithmetic progression, step is executed again
2), step 3) finally determines the test time of integration until M/2 frame average gray value is consistent with 50% saturation gray value；
4) under the identified test time of integration, continuous acquisition M frame image, and beaten in the M/2 image frame grabber time
It opens the light source, cmos image sensor is made to be in uniform illumination environment；And during other image frame grabbers, light source is not sent out
Light, cmos image sensor are in dark field environment；
5) average gray value for calculating every frame image removes theFrame andFrame image and according to calculated result
The mean value for comparing determining abnormal image, calculating remaining frame image averaging gray value, is denoted as X1；TheFrame image averaging gray scale
Value is denoted as X2, theFrame image averaging gray value is denoted as X3；
6) the image retention I of the cmos image sensor is calculated according to the following formulag:
Above-mentioned steps 4) average gray of every frame image in each group of data can be calculated with duplicate measurements multi-group data, step 5)
Value, then corresponding 1st frame of each group, the 2nd frame ... M frame image averaging gray value are averaged respectively, it is tied in this, as calculating
Then fruit removesFrame andFrame image and according to the determining abnormal image of calculated result comparison, calculate remaining
The mean value of frame image averaging gray value.
Above-mentioned cmos image sensor is mountable in test evaluation board, is collectively disposed in camera bellows；Test evaluation board and meter
Calculation machine is connected, and adopts to computerized control and tests evaluation board, realizes cmos image sensor Image Acquisition under the different times of integration
And light source luminescent time control function.
The usually continuous several frames in front.
The present invention has many advantages, such as that stability is good, measuring accuracy is high and measurement method is easy compared with prior art, specifically
Effect is as follows：
1, when continuously exporting multiple image for cmos image sensor after proton irradiation, former frame imaging sensors are secretly believed
Number increase, cause measurement accuracy decline even occur mistake problem, using exclude remove part abnormal image method, improve
The measurement accuracy of image retention after cmos image sensor proton irradiation.
2, the image retention of cmos image sensor is more sensitive to temperature after proton irradiation, leads to image retention after irradiation
It can not accurately measure.The present invention controls test environment temperature using temperature control device, excludes since temperature change is to spoke
According to the influence of rear cmos image sensor image retention test result.
3, for cmos image sensor after proton irradiation it is possible that random Code Signal, causes individual images to occur
The problem of dark signal increases, using the method for taking multiple series of images to average, eliminates random error caused by single measurement.
Detailed description of the invention
Fig. 1, cmos image sensor image retention test macro block diagram；
Fig. 2, cmos image sensor image retention test flow chart；
After Fig. 3, proton irradiation, cmos image sensor image retention schematic diagram；
Fig. 4, cmos image sensor image retention with proton fluence change curve.
Specific embodiment
The present invention is described further with reference to the accompanying drawing：Present embodiments provide a cmos image sensor matter
After son irradiation, the test method of image retention.Cmos image sensor is 3MeV, matter by the energy of irradiation proton in the present embodiment
Sub- fluence is respectively 1.0 × 1010p/cm2, 5.0 × 1010p/cm2, 1.0 × 1011p/cm2.Sample after proton irradiation is in CMOS
Test image is detained on imaging sensor irradiation effect parameter test system, and test result is as shown in Figure 4.
As shown in Figure 1, test macro includes uniform source of light, surveys the image retention test macro block diagram of cmos image sensor
Evaluation board, camera bellows, temperature control box and computer etc. are tried, provides uniform illumination condition when wherein uniform source of light is detained for test image,
Test evaluation board is that measured device powers and provides the operating conditions such as driver' s timing and driving frequency, and camera bellows is device detection mistake
Dark field environment is provided in journey, temperature control box is that isoperibol is provided in device test procedures, and computer passes through control test evaluation board
Realize cmos image sensor Image Acquisition, image data storage and processing.
With reference to Fig. 2, the present invention measures the test method of cmos image sensor image retention, includes the following steps：
Step 1: the cmos image sensor after proton irradiation is mounted in test evaluation board, and place them in
In camera bellows, cmos image sensor is made to be in no light environment.
Step 2: uniform source of light is fixed on camera bellows inner wall right above cmos image sensor, provided when test needs
Uniform illumination.
It is 25 DEG C by temperature control box temperature setting Step 3: camera bellows is placed in temperature control box.
Step 4: test evaluation board is connected to a computer, test evaluation board is controlled by computer, realization is not equally had
Lower cmos image sensor Image Acquisition and light source luminescent time control function between timesharing.
Step 5: choosing 10 time of integration (t being spacedly distributed1、t2…t10).The initial value and difference of time of integration ordered series of numbers
The distance between the setting (adjustment) of value and the intensity of light source, light source and cmos image sensor and cmos image sensor are most made public
Factors are related between light time etc..Each 20 frame image of time of integration continuous acquisition, and sent out in the 10th image frame grabber time inner light source
Light, cmos image sensor are in uniform illumination environment.During other 19 image frame grabbers, light source does not shine, CMOS
Imaging sensor is in no light environment.
Step 6: calculating the average gray value of every frame image, wherein whether the 10th frame average gray value is 50% full for judgement
And gray value：If it is, using the 10th frame corresponding time of integration as the test time of integration；If it is not, then adjustment integral
Time, until the 10th frame average gray value is equal to 50% saturation gray value, as the test time of integration.
Step 7: under the selected test time of integration (1.243ms), 20 frame image of continuous acquisition, and in the 10th frame
Image acquisition time inner light source shines, and cmos image sensor is in uniform illumination environment.In the mistake of other 19 image frame grabbers
Cheng Zhong, light source do not shine, and cmos image sensor is in no light environment.Duplicate measurements multi-group data (is with 20 groups below
Example).
Step 8: calculate every frame image averaging gray value in every group of data, and by corresponding 1st frame of each group, the 2nd frame ...
20 frame image averaging gray values are averaged (x respectively1、x2…x20), i.e. x1 is the 1st frame image averaging gray scale in all groups of data
The average value of value, x2 are the average value ... of the 2nd frame image averaging gray value in all groups of data.Calculated result is as shown in Figure 3.
Step 9: the mean value for removing the 1st frame (abnormal image), the 10th frame and the 11st frame image averaging gray value is calculated, note
For X1.10th frame image averaging gray value is X2, the 11st frame image averaging gray value is denoted as X3。
Step 10: according to X1、X2And X3Calculate the image retention I of the cmos image sensorg:
Claims (3)
1. the measurement method of image retention after a kind of cmos image sensor proton irradiation, which is characterized in that include the following steps：
1) cmos image sensor after proton irradiation is placed in camera bellows, camera bellows is in isoperibol, and light is arranged inside camera bellows
Source is used for the Uniform Irradiation cmos image sensor when test needs；
2) setting is in the n time of integration of arithmetic progression, n >=10, and each time of integration continuous acquisition M frame image and is at M >=20
Even number, and light source only is opened in the M/2 image frame grabber time, so that cmos image sensor is in uniform illumination environment；And
During other image frame grabbers, light source does not shine, and cmos image sensor is in dark field environment；
3) for each time of integration, the average gray value of every frame image is calculated separately；Judge wherein M/2 frame average gray value
It is whether consistent with 50% saturation gray value：If it is, using the M/2 frame corresponding time of integration as the test time of integration；
If it is not, then adjusting the difference and/or initial value of the arithmetic progression, step 2), step 3) are executed again, until M/2 frame is flat
Equal gray value is consistent with 50% saturation gray value, finally determines the test time of integration；
4) under the identified test time of integration, continuous acquisition M frame image, and light is opened in the M/2 image frame grabber time
Source makes cmos image sensor be in uniform illumination environment；And during other image frame grabbers, light source does not shine,
Cmos image sensor is in dark field environment；
5) average gray value for calculating every frame image removes theFrame andIt frame image and is compared according to calculated result
Determining abnormal image, the mean value for calculating remaining frame image averaging gray value, are denoted as X1；TheFrame image averaging gray value is denoted as
X2, theFrame image averaging gray value is denoted as X3；
6) the image retention I of the cmos image sensor is calculated according to the following formulag:
2. the measurement method of image retention, feature exist after cmos image sensor proton irradiation according to claim 1
In：Step 4) duplicate measurements multi-group data, step 5) calculate the average gray value of every frame image in each group of data, then by each group pair
The 1st frame, the 2nd frame ... the M frame image averaging gray value answered are averaged respectively, in this, as calculated result, then removeFrame andFrame image and according to the determining abnormal image of calculated result comparison, calculate remaining frame image averaging gray scale
The mean value of value.
3. the measurement method of image retention, feature exist after cmos image sensor proton irradiation according to claim 1
In：The cmos image sensor is mounted in test evaluation board, is collectively disposed in camera bellows；Test evaluation board is connected with computer
It connects, adopts to computerized control and test evaluation board, realize cmos image sensor Image Acquisition and light source hair under the different times of integration
Light time control function.
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| DE102010028904A1 (en) * | 2010-05-11 | 2011-11-17 | Movolution Gmbh | Motion analysis and / or tracking system |
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