CN106525242B - A kind of device can be used for sun polarization Stokes vector real-time measurement - Google Patents

A kind of device can be used for sun polarization Stokes vector real-time measurement Download PDF

Info

Publication number
CN106525242B
CN106525242B CN201611093398.3A CN201611093398A CN106525242B CN 106525242 B CN106525242 B CN 106525242B CN 201611093398 A CN201611093398 A CN 201611093398A CN 106525242 B CN106525242 B CN 106525242B
Authority
CN
China
Prior art keywords
wave plate
polarization
stokes vector
sun
time measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201611093398.3A
Other languages
Chinese (zh)
Other versions
CN106525242A (en
Inventor
饶长辉
姚本溪
顾乃庭
朱磊
程云涛
李程
黄金龙
刘洋毅
张兰强
王志勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Optics and Electronics of CAS
Original Assignee
Institute of Optics and Electronics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Optics and Electronics of CAS filed Critical Institute of Optics and Electronics of CAS
Priority to CN201611093398.3A priority Critical patent/CN106525242B/en
Publication of CN106525242A publication Critical patent/CN106525242A/en
Application granted granted Critical
Publication of CN106525242B publication Critical patent/CN106525242B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Polarising Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The present invention provides a kind of device that can be used for sun polarization Stokes vector real-time measurement, including spectral filter, wave plate array polarize chip arrays and intensity collection camera.Solar magnetic field is driving force and the energy source of solar activity outburst, and sun polarization Stokes vector measurement is the unique channel of solar magnetic field detection.A kind of new device can be used for sun polarization Stokes vector real-time measurement of the invention, microwave chip arrays are made using micro-optics technical principle, micro- polarization chip arrays are processed on this basis, and closed with the photosensitive face paste of intensity collection camera, it is only necessary to which single exposure can obtain sun polarization Stokes vector information.Relative to conventional apparatus, apparatus of the present invention are compact-sized, strong real-time, without accurately debugging and artificially modulating, spectral response range is wide, at low cost and can mass production, the detecting error of the factors such as camera nonuniform response, aberration introducing is avoided simultaneously, and can conveniently spread over other application field.

Description

A kind of device can be used for sun polarization Stokes vector real-time measurement
Technical field
The present invention relates to polarimetry field, in particular to one kind can be used for sun polarization Stokes vector real-time measurement Device.
Background technique
Solar magnetic field is driving force and the energy source of solar activity outburst, and sun polarization Stokes vector measurement is The unique channel of solar magnetic field detection.Traditional sun polarimetry is frequently with time division modulation (as shown in Figure 2) and divides amplitude same When modulate (as shown in Figure 3) mode.Time division modulation includes rotating wave plate, modulates Phase Retardation of Wave Plate, modulates wave plate optical axis side To etc..
Fig. 2 (a) show the mode of rotating wave plate, and wherein 2-1 is quarter wave plate, and 2-2 is electric angle turntable, and 2-3 is inclined Shake piece, and 2-4 is intensity collection camera, and 2-5 is controller.Controller controls turntable rotation, and then modulates wave plate fast axis direction, Intensity collection camera successively records light intensity value when wave plate is in different fast axis directions, by the light intensity value measured and wave plate fast axle side It, can be with inverting sunlight Stokes vector to be measured to angle.
Fig. 2 (b) show the mode of modulation Phase Retardation of Wave Plate, and wherein 2-6 is electro-optic crystal, and 2-3 is polarizing film, 2-4 For intensity collection camera, 2-5 is controller.Under the action of external electrical field, the birefringence of electro-optic crystal can change, Its phase-delay quantity changes with applied voltage, and its fast axis direction does not change.Controller passes through additional to electro-optic crystal To be modulated to its phase delay, intensity collection camera successively records when electro-optic crystal out of phase postpones different voltages Light intensity value can be with inverting sunlight Stokes vector to be measured by the light intensity value and retardation of wave plate measured.
Fig. 2 (c) show the mode of modulation wave plate optical axis direction, and wherein 2-7 is FLC crystal, and phase delay is 1/2 wave Long, 2-8 is FLC crystal, and phase delay is 1/4 wavelength, and 2-3 is polarizing film, and 2-4 is intensity collection camera, and 2-5 is controller. Under the action of external electrical field, FLC optical axis of crystal direction is rotated and its phase delay is constant.Controller passes through to FLC crystalline substance In vitro plus different voltages switch its optical axis direction between specific two angles, and intensity collection camera successively records FLC crystal Light intensity value when different optical axis directions, by the light intensity value and FLC optical axis of crystal deflection measured, can with inverting sunlight to be measured this Lentor vector.
Fig. 3 show the mode of point amplitude while modulation, and wherein 3-1 is Amici prism, and 3-2 is quarter wave plate, and 3-3 is inclined Shake piece, and 3-4 is intensity collection camera, and 3-5 is controller.Light beam is divided into 4 beams by Amici prism, is added in each optical path different The wave plate and polarizing film of direction of rotation, controller control 4 intensity collection cameras and the light intensity value of each optical path are carried out while being acquired, The modulation system of the light intensity value and wave plate and polarizing film that are acquired using 4 cameras, can be finally inversed by sunlight Stokes to be measured Vector.
However it is affected by environment, within the intensity collection camera double exposure period, into the sunlight of polarimeter There are the mode measurement accuracy of light intensity flashing, therefore time division modulation to be restricted.Also, there is mechanical vibration in the mode of rotating wave plate It is dynamic, and modulating frequency is low, to reach higher system stability, diagonal turntable has higher requirements, at high cost;Modulate wave plate phase The mode of position delay generally requires additional thermostatic equipment, system complex because electro-optic crystal phase-delay quantity is more sensitive to temperature. The mode of wave plate optical axis direction is modulated because of FLC optical axis direction equally more sensitive, and processing difficulties, higher cost, to certain to temperature A little systems are difficult to meet requirement;The mode that point amplitude is modulated simultaneously by optical path be divided into 4 beams, system complex, and each camera it Between there are inhomogeneities, influence measurement accuracy.
In view of the above problems, a kind of novel dress that can be used for sun polarization Stokes vector real-time measurement of the invention It sets, the microwave chip arrays made of micro-optics technical principle, and processes micro- polarization chip arrays on this basis, and adopt with light intensity Collect the photosensitive face paste of camera to close, it is only necessary to which single exposure can obtain sun polarization Stokes vector information.It is filled relative to tradition Set, apparatus of the present invention are compact-sized, strong real-time, and without accurate debugging and artificial modulation, spectral response range is wide, it is at low cost and Can mass production, while avoiding the factors such as camera nonuniform response, can conveniently spread over other application field.The present invention is real It is strong with property, it is innovative obvious.
Summary of the invention
The technical problem to be solved by the present invention is to:The real-time survey of full Stokes vector parameter is carried out to sun polarization state Amount.
The present invention solve above-mentioned technical problem the technical solution adopted is that:One kind can be used for sun polarization Stokes vector The device of real-time measurement, including spectral filter, wave plate array, polarization chip arrays and intensity collection camera,
Wherein, spectral filter is located at before wave plate array, and the light for entering wave plate array is limited to certain spectrum model In enclosing;Wave plate array is processed into the wave plate combined of out of phase delay using same wave plate in adjacent 2 × 2 four units, And so on, array is ultimately formed;Polarization chip arrays, which are utilized, is processed into different polarization side in adjacent 2 × 2 four units To polarizing film combination, and so on, ultimately form array;Wave plate array is identical as polarization chip arrays each unit size, number It is corresponding;Intensity collection camera is located on horizontal solar telescope system focal plane, and record passes through the light intensity value of array each unit respectively, It fits together with wave plate array, polarization chip arrays, is made into integrating device;
The data handling procedure of the device is as described below:
Firstly, the Stokes vector for defining sunlight to be measured is S=[I Q U V]T;In adjacent 2 × 2 four units There are four types of various combination modes for interior wave plate and polarizing film, are denoted as a, b, c, d respectively.Wave plate Muller matrix is respectively Mwa,Mwb, Mwc,Mwd, polarizing film Muller matrix is Mpa,Mpb,Mpc,Mpd.Combining Muller matrix is respectively Ma,Mb,Mc,Md.Wherein:
Note a unit Muller matrix be:
After labeled as the wave plate of a and polarizer unit, emergent light Stokes vector is sunlight:
Then, sunlight enters intensity collection camera (4), and camera acquires corresponding light intensity value and is:
Ia=a11I+a12Q+a13U+a14V (13)
The Muller matrix of known polarization piece is:
Wherein, α is polarizing film polarizing angle.
The Muller matrix of wave plate is:
Wherein, δ is the phase delay that wave plate generates, and θ is wave plate fast axis direction and coordinate system X-direction angle.
Then:
Similarly, camera acquires 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
Pass through this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunlight to be measured,
Wherein:
The condition of formula (5) existence and unique solution is:Metzler matrix full rank, i.e.,:
Rank (M)=4 (20)
Make α, δ in a, b, c, tetra- units of d, θ takes different values, and Metzler matrix can be made to meet the condition of formula (10).
Wherein, spectral filter effect is limited in the spectrum of incident light in certain bandwidth range, can be used Grating spectrograph, interference light filter, atomic light filter and birefringent filter are wanted as long as meeting system in polarimetry application It asks.
Wherein, the present apparatus can complete polarization Stokes vector measurement for multiple wavelength and the spectrum of bandwidth, not office It is limited to specific wavelength and bandwidth, but is limited to the spectral response of intensity collection camera.
Wherein, the effect of spectral filter is limited in the spectrum of incident light in certain bandwidth range, can be made With grating spectrograph, interference light filter, atomic light filter and birefringent filter etc., it is as long as meeting in polarimetry application System requires.
Wherein, wave plate array, can be using the methods of coining, etching system for generating different phase delay to light beam Make.
Wherein, the etching of wave plate or depth of indentation are related with wavelength and phase-shift phase, are retouched as long as meeting right formula (14) The full rank condition stated can accurately measure polarization Stokes vector parameter.
Wherein, polarization chip arrays are composed using the polarizer unit in different polarization direction, can be using in substrate The mode for plating the wire grating of different orientations is produced, can also be using modes such as nano impression, etchings, as long as meeting this hair The polarization characteristic of bright requirement.
Wherein, the present apparatus uses different Phase Retardation of Wave Plate and polarizing film polarization side in adjacent 2 × 2 four units To combination, but a combination thereof mode is not limited, as long as its modulation matrix M is reversible after combination.
Wherein, intensity collection camera can acquire light distribution required for polarimetry, can for CCD, CMOS, EMCCD, photomultiplier tube etc., as long as meeting intensity collection function.
Wherein, single wave plate array and polarizing film array element size can not only correspond to single photodetector list Member can also correspond to any photodetector unit, as long as can acquire respectively to by the light of each array element.
Wherein, present apparatus medium wave chip arrays, polarization chip arrays and intensity collection camera fit together, and are integrating device, It can be individual devices, be combined together, can also be added respectively on the two sides of same substrate by modes such as glued or pressings Work, as long as meeting the polarimetry function of this patent description.
The principle of the invention lies in:
Stokes vector can completely represent the polarization information of light, and optical element can be with to the transmitting of Stokes vector It is indicated with Muller matrix.It is assumed that the Stokes vector of sunlight to be measured is S=[I Q U V]T, it is known that polarizing film Muller matrix is:
Wherein, θ is polarizing film polarizing angle.
The Muller matrix of wave plate is:
Wherein, δ is the phase delay that wave plate generates, and θ is wave plate fast axis direction and coordinate system X-direction angle.
Successively after wave plate and polarizing film, Stokes vector is sunlight to be measured:
At specific wave plate and polarizing film modulation condition a, it is assumed that its Muller matrix is:
Camera acquisition light intensity value be:
Ia=a11I+a12Q+a13U+a14V (19)
Equally, in b, c, camera acquisition light intensity is I under d stateb,Ic,Id, have:
Pass through this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunlight to be measured
Wherein:
It selects wave plate array (2) and polarizes the combination of chip arrays (3) in adjacent 2 × 2 four units, make to modulate Matrix M is reversible, i.e.,:
Rank (M)=4 (23)
The present invention has the following advantages compared with prior art:
(1) a kind of new device that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention, is realized Real-time measurement is carried out to sun polarization state, does not need time division modulation, it is only necessary to which single exposure can calculate this full support of target Gram this vector parameters avoid the influence of traditional timesharing measurement light intensity flashing, effectively improve detection accuracy and sensitivity.
(2) a kind of new device that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention, is not necessarily to Beam splitter and relay optical system can be completed single intensity collection and realize sun light polarization Stokes vector real-time measurement, Its structure is substantially reduced, and structural compactness greatly improves, system stability enhancing.
(3) a kind of new device that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention, is not necessarily to Relay optical system and additional beam splitter, it is of less demanding to the dispersion of transmissive element, improve effective detecting light spectrum range. Meanwhile system aberration and spectra overlap are substantially reduced, improve the accuracy and sensitivity of polarization Stokes vector detection.
(4) a kind of new device that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention, uses Integrated Light micro-optical device realizes the function of conventional geometric optical device, easy to operate without accurate debugging and artificial modulation. Its process understands that repeatability and sequencing degree are high, is conducive to the standardization and mass production of measurement device, substantially reduces The cost of mass production.
(5) a kind of new device that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention, only Needing to measure a width intensity distribution image can be completed polarization Stokes vector measurement, and strong real-time can be used for high-speed motion The polarimetry of target.It is low to environmental requirement, effectively extend the application field and application of polarization Stokes vector sensitive detection parts Range.
In short, by a kind of novel dress that can be used for sun polarization Stokes vector real-time measurement proposed by the present invention It sets, breaks through traditional modulation, it is only necessary to which single exposure can obtain sun polarization Stokes vector information.Relative to tradition Device, apparatus of the present invention are compact-sized, strong real-time, and without accurate debugging and artificial modulation, spectral response range is wide, at low cost And can mass production, while avoiding the factors such as camera nonuniform response, can conveniently spread over other application field.The present invention It is practical, it is innovative obvious.
Detailed description of the invention
Fig. 1 is a kind of device that can be used for the sun and polarize Stokes vector real-time measurement.Wherein, 1-1 is spectral filtering Device, 1-2 are wave plate array, and 1-3 is polarization chip arrays, and 1-4 is intensity collection camera.
Fig. 2 is time division modulation polarimeter, wherein Fig. 2 (a) is the mode of rotating wave plate, and Fig. 2 (b) is modulating wave The mode of piece phase delay, Fig. 2 (c) are the mode for modulating wave plate optical axis direction.Wherein, 2-1 is quarter wave plate, and 2-2 is electric angle Turntable, 2-3 are polarizing film, and 2-4 is intensity collection camera, and 2-5 is controller, and 2-6 is electro-optic crystal, and 2-7,2-8 are FLC brilliant Body.
Fig. 3 is to divide amplitude modulating polarization measuring device simultaneously.Wherein, 3-1 is Amici prism, and 3-2 is quarter wave plate, and 3-3 is Polarizing film, 3-4 are intensity collection camera, and 3-5 is controller.
Fig. 4 is wave plate array processing method.
Fig. 5 is polarization chip arrays processing method.
Fig. 6 is the integrated of wave plate array, polarization chip arrays and intensity collection camera, wherein 6-1 is wave plate array, and 6-2 is Chip arrays are polarized, 6-3 is CCD camera.
Fig. 7 is that the present apparatus acquires example images.
Fig. 8 be by the present apparatus acquire image inverting Stokes example distribution schematic diagram, wherein Fig. 8 (a) be incident light this Lentor parameter I distribution schematic diagram, Fig. 8 (b) be incident light stokes parameter Q distribution schematic diagram, Fig. 8 (c) be incident light this Lentor parameter U distribution schematic diagram, Fig. 8 (d) are incident light stokes parameter V distribution schematic diagram.
Specific embodiment
With reference to the accompanying drawing and specific example further illustrates the present invention.
Basic thought of the invention is to provide a kind of device that can be used for sun polarization Stokes vector real-time measurement, By spectral filter 1-1, wave plate array 1-2, chip arrays 1-3 is polarized, intensity collection camera 1-4 is formed, as shown in Figure 1.
Wherein, spectral filter 1-1 is located at before wave plate array 1-2, keeps the standard into the certain bandwidth of light of wave plate single Coloured light;Wave plate array 1-2 is processed into the wave plate group of out of phase delay using same wave plate in adjacent 2 × 2 four units It closes, and so on, ultimately forms array;Polarization chip arrays 1-3, which is utilized, is processed into difference in adjacent 2 × 2 four units The polarizing film of polarization direction combines, and and so on, ultimately forms array;Wave plate array 1-2 and polarization chip arrays 1-3 each unit ruler Very little identical, number is corresponding;Intensity collection camera 1-4 is located on horizontal solar telescope system focal plane, and record passes through array respectively The light intensity value of each unit fits together with wave plate array 1-2, polarization chip arrays 1-3, is made into integrating device.
The data handling procedure of the device is as described below:
Firstly, the Stokes vector for defining sunlight to be measured is S=[I Q U V]T;In adjacent 2 × 2 four units There are four types of various combination modes for interior wave plate and polarizing film, are denoted as a, b, c, d respectively.Wave plate Muller matrix is respectively Mwa,Mwb, Mwc,Mwd, polarizing film Muller matrix is Mpa,Mpb,Mpc,Mpd.Combining Muller matrix is respectively Ma,Mb,Mc,Md.Wherein:
Note a unit Muller matrix be:
After labeled as the wave plate of a and polarizer unit, Stokes vector is sunlight:
Then, sunlight enters intensity collection camera 1-4, and camera acquires corresponding light intensity value and is:
Ia=a11I+a12Q+a13U+a14V (26)
Similarly, camera acquires 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
By changing Phase Retardation of Wave Plate, fast axis direction, polarizing film polarizing angle, only modulation matrix M need to be made reversible, i.e. its order It is 4, this group of light intensity value I can be passed througha,Ib,Ic,IdThe Stokes vector of inverting sunlight to be measured.
Wherein:
The Muller matrix of known wave plate is:
Wherein, δ is the phase delay that wave plate generates, and θ is wave plate fast axis direction and coordinate system X-direction angle.
Known Phase Retardation of Wave Plate is:
Wherein no,neThe respectively refractive index of o light and e light in crystal, for certain material, specific wavelength, no,neIt is permanent Fixed, phase delay of δ is the function of crystal thickness d, by changing crystal thickness d, can postpone δ with phase modulation.Wave plate array 1-2 Using calcite material, the optical axis of crystal is vertical with incident light, and fast axis direction is fixed as -45 °.Calcite material etch is added Work is wave plate array, and processing method is as shown in fig. 4 a.Tetra- units of a, b, c, d select Phase Retardation of Wave Plate group to be combined into shown in table 1:
Table 1
As depicted in fig. 4b, the light for being 656.3 nanometers for wavelength, no=1.6544, ne=1.4846, by calcite plus Work is quarter wave plate, to meet b, the phase delay of c unit.In a, d unit etches wave plate, and groove depth d=966.284 receives Rice, to meet its phase delay.
The Muller matrix of known polarization piece is:
Wherein, θ is polarizing film polarizing angle.
As shown in Figure 5 b, polarization chip arrays 1-3 using the plating metal wiregrating in substrate by the way of, polarizing film polarization direction and Wire grating orientation is orthogonal.As shown in Figure 5 b, a, b, c, d unit polarizing film polarization direction group are combined into shown in table 2:
Table 2
Sequence a b c d
Polarizing angle θ 45° -45°
Polarization Modulation matrix is at this time:
Camera 6-3 is located on horizontal solar telescope system focal plane, and the characteristics such as Pixel size and quantity meet the sun and look in the distance Mirror observation requires.Wave plate array 6-1 and polarization chip arrays 6-2 fits together with camera 6-3 target surface, as shown in Figure 6.The sun is hoped Remote mirror institute is acquired after spectroscopy equipment and wave plate array and polarization chip arrays with camera at image, with four of adjacent 2 × 2 Pixel record light intensity value:
Incident light Stokes vector is calculated using four light intensity values and Polarization Modulation matrix of acquisition:
S=M-1·I′ (33)
For more intuitive display present apparatus using effect, We conducted analog simulations.Assume that incident sunlight is in simulation Partial poolarized light, stokes parameter is random value at each picture point.When sunlight to be measured by the present apparatus modulation acquisition after, obtain Image is as shown in Figure 7.After complementary operation, show that each stokes parameter distribution of incident light is as shown in Figure 8.Wherein, Fig. 8 It (a) is incident light stokes parameter I distribution schematic diagram, Fig. 8 (b) is incident light stokes parameter Q distribution schematic diagram, Fig. 8 It (c) is incident light stokes parameter U distribution schematic diagram, Fig. 8 (d) is incident light stokes parameter V distribution schematic diagram.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any The people of the technology is familiar in disclosed technical scope, it will be appreciated that the replacement or increase and decrease arrived should all be covered in this hair Within bright scope, therefore, the scope of protection of the invention shall be subject to the scope of protection specified in the patent claim.

Claims (10)

1. a kind of device that can be used for sun polarization Stokes vector real-time measurement, it is characterised in that:The device includes spectrum Optical filter (1-1), wave plate array (1-2), polarization chip arrays (1-3) and intensity collection camera (1-4);
Wherein, spectral filter (1-1) is located at before wave plate array (1-2), will be limited to one into the light of wave plate array (1-2) In fixed spectral region;Wave plate array (1-2) is processed into out of phase in adjacent 2 × 2 four units using same wave plate The wave plate combined of delay and so on ultimately forms array;Polarization chip arrays (1-3) utilizes four lists adjacent 2 × 2 It is processed into the polarizing film combination in different polarization direction in member, and so on, ultimately forms array;Wave plate array (1-2) and polarization Chip arrays (1-3) each unit size is identical, and number is corresponding;It is flat that intensity collection camera (1-4) is located at horizontal solar telescope system coke On face, record passes through the light intensity value of array each unit respectively, is fitted in one with wave plate array (1-2), polarization chip arrays (1-3) It rises, is made into integrating device;
The data handling procedure of the device is as described below:
Firstly, the Stokes vector for defining sunlight to be measured is S=[I Q U V]T;The wave in adjacent 2 × 2 four units There are four types of various combination modes for piece and polarizing film, are denoted as a, b, c, d respectively, wave plate Muller matrix is respectively Mwa,Mwb,Mwc, Mwd, polarizing film Muller matrix is Mpa,Mpb,Mpc,Mpd, combination Muller matrix is respectively Ma,Mb,Mc,Md, wherein:
Note a unit Muller matrix be:
After labeled as the wave plate of a and polarizer unit, emergent light Stokes vector is sunlight:
Then, sunlight enters intensity collection camera (4), and camera acquires corresponding light intensity value and is:
Ia=a11I+a12Q+a13U+a14V (3)
The Muller matrix of known polarization piece is:
Wherein, α is polarizing film polarizing angle;
The Muller matrix of wave plate is:
Wherein, δ is the phase delay that wave plate generates, and θ is wave plate fast axis direction and coordinate system X-direction angle;Then:
Similarly, camera acquires 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
Pass through this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunlight to be measured,
Wherein:
The condition of formula (5) existence and unique solution is:Metzler matrix full rank, i.e.,:
Rank (M)=4 (10)
Make α, δ in a, b, c, tetra- units of d, θ takes different values, and Metzler matrix can be made to meet the condition of formula (10).
2. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Spectral filter effect is limited in the spectrum of incident light in certain bandwidth range, using grating spectrograph, is done Optical filter, atomic light filter or birefringent filter are related to, as long as meeting system requirements in polarimetry application.
3. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:The device can complete polarization Stokes vector measurement for multiple wavelength and the spectrum of bandwidth, be not limited to specific Wavelength and bandwidth, but it is limited to the spectral response of intensity collection camera.
4. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Wave plate array is made for generating different phase delay to light beam of coining/lithographic method.
5. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1 or 4, special Sign is:The etching or depth of indentation of wave plate are related with wavelength and phase-shift phase, are retouched as long as meeting formula in claim 1 (7) The full rank condition stated can accurately measure polarization Stokes vector parameter.
6. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Polarization chip arrays (1-3) is composed using the polarizer unit in different polarization direction, using plating different rows in substrate The mode of the wire grating of column direction is produced, or uses nano impression or etching mode, as long as the polarization characteristic met the requirements ?.
7. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Using the combination of different Phase Retardation of Wave Plate and polarizing film polarization direction in adjacent 2 × 2 four units, but not A combination thereof mode is limited, as long as its modulation matrix M is reversible after combination.
8. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Intensity collection camera can acquire light distribution required for polarimetry, be CCD, CMOS, EMCCD or photoelectricity times Increase pipe, as long as meeting intensity collection function.
9. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:Single wave plate array and polarizing film array element size can not only correspond to single photodetector unit, also can Corresponding any photodetector unit.
10. a kind of device that can be used for sun polarization Stokes vector real-time measurement according to claim 1, feature It is:The device medium wave chip arrays (1-2), ((1-3) ((1-4's polarization chip arrays) fits together, and is with intensity collection camera Integrating device is individual devices, is combined together by glued or pressing mode, or add respectively on the two sides of same substrate Work.
CN201611093398.3A 2016-12-02 2016-12-02 A kind of device can be used for sun polarization Stokes vector real-time measurement Active CN106525242B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611093398.3A CN106525242B (en) 2016-12-02 2016-12-02 A kind of device can be used for sun polarization Stokes vector real-time measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611093398.3A CN106525242B (en) 2016-12-02 2016-12-02 A kind of device can be used for sun polarization Stokes vector real-time measurement

Publications (2)

Publication Number Publication Date
CN106525242A CN106525242A (en) 2017-03-22
CN106525242B true CN106525242B (en) 2018-11-30

Family

ID=58354254

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611093398.3A Active CN106525242B (en) 2016-12-02 2016-12-02 A kind of device can be used for sun polarization Stokes vector real-time measurement

Country Status (1)

Country Link
CN (1) CN106525242B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6869655B2 (en) * 2016-07-11 2021-05-12 キヤノン株式会社 Optical equipment and imaging equipment
CN107014490A (en) * 2017-04-17 2017-08-04 大连理工大学 One kind point focal plane type real-time polarization imaging system
CN108007575A (en) * 2017-11-29 2018-05-08 中国科学院光电技术研究所 A kind of full Stokes vector polarization imaging device of miniaturization based on binary digit coding birefringece crystal
CN109655160A (en) * 2018-03-05 2019-04-19 曹毓 A kind of extension target divides visual field polarization measurement system and method in real time
CN108490214B (en) * 2018-03-14 2020-03-20 中国科学院光电技术研究所 Solar atmosphere apparent velocity field measuring method based on tunable optical filter imaging observation
CN110631705B (en) * 2019-09-17 2021-04-20 哈尔滨理工大学 Method and device for carrying out real-time Stokes polarization measurement by using DMD
CN114166348B (en) * 2021-12-16 2023-09-19 中国科学院光电技术研究所 Rapid polarization imaging method based on full Stokes vector

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5734473A (en) * 1997-02-27 1998-03-31 United States Of America As Represented By The Secretary Of The Army Method of determining polarization profiles for polychromatic sources
CN1930462A (en) * 2003-09-17 2007-03-14 株式会社光学格子 Polarization analysis apparatus and polarization analysis method
CN102539119A (en) * 2011-12-27 2012-07-04 上海大学 Mueller matrix testing device based on rotatable wave plate and method
CN103454712A (en) * 2013-09-10 2013-12-18 中国科学技术大学 Wave plate array based on pixels and preparation methods of wave plate array
CN103630336A (en) * 2013-12-02 2014-03-12 南京理工大学 Dynamic interference measuring method based on random fast axis azimuth delay array
CN103837476A (en) * 2012-11-21 2014-06-04 中国科学院国家天文台 Mueller matrix self calibration measurement method
CN104833977A (en) * 2015-05-11 2015-08-12 福州大学 Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5140409B2 (en) * 2007-12-26 2013-02-06 株式会社フォトニックラティス Polarimeter, measurement system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5734473A (en) * 1997-02-27 1998-03-31 United States Of America As Represented By The Secretary Of The Army Method of determining polarization profiles for polychromatic sources
CN1930462A (en) * 2003-09-17 2007-03-14 株式会社光学格子 Polarization analysis apparatus and polarization analysis method
CN102539119A (en) * 2011-12-27 2012-07-04 上海大学 Mueller matrix testing device based on rotatable wave plate and method
CN103837476A (en) * 2012-11-21 2014-06-04 中国科学院国家天文台 Mueller matrix self calibration measurement method
CN103454712A (en) * 2013-09-10 2013-12-18 中国科学技术大学 Wave plate array based on pixels and preparation methods of wave plate array
CN103630336A (en) * 2013-12-02 2014-03-12 南京理工大学 Dynamic interference measuring method based on random fast axis azimuth delay array
CN104833977A (en) * 2015-05-11 2015-08-12 福州大学 Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
微光偏振成像***设计及实验;陈振跃 等;《光子学报》;20140430;第43卷(第4期);第0411003-1至0411003-5页 *

Also Published As

Publication number Publication date
CN106525242A (en) 2017-03-22

Similar Documents

Publication Publication Date Title
CN106525242B (en) A kind of device can be used for sun polarization Stokes vector real-time measurement
US9976906B2 (en) Light polarization state modulation and detection apparatuses and detection method
JP6702689B2 (en) Liquid crystal Fourier transform imaging spectrometer
CN104833977A (en) Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof
CN103822714B (en) Polarizing optical splitter-based high-spatial resolution snapshot-type imaging spectrograph and imaging method
JP2012507027A (en) Spectroscopic polarimetry apparatus and method in visible and near infrared region
CN103776445B (en) Amplitude-division polarization navigation angle sensing design method and device
CN108007574B (en) The fast illuminated image spectrum linear polarization detection device of resolution ratio adjustable type and method
CN111562223A (en) Polarizing imaging device and method based on micro-polarizer array
CN104457995A (en) Fast polarization detector and detecting method
CN107367329A (en) A kind of image, spectrum, polarization state integration acquisition device and detection method
CN103822715B (en) A kind of fast illuminated imaging spectrometer based on polarizing beam splitter and formation method
CN105157836B (en) Optical spectrum imaging device and its method that a kind of polarization state is synchronously obtained
CN104568765A (en) Miniature spectroscopic ellipsometer device and measuring method
CN108489614A (en) A kind of full Stokes vector polarization imaging device of compact type based on double glued digital coding birefringece crystal thin slices
CN203572768U (en) Crystal liquid birefraction effect-based high-resolution polarization spectrum imaging system
CN113375800A (en) Adjustable optical filter based on optical super-surface and spectral imaging system
CN111208067A (en) Spectrum-polarization imaging measurement system
CN104535232B (en) Device and method for testing stress of infrared optical material
US11656484B2 (en) Voltage-tunable polarizer
Ning et al. Single-shot measurement of polarization state at low light field using Mueller-mapping star test polarimetry
Zhang et al. Modular division of focal plane polarimeter system
CN104897580A (en) Optical system and optical method for detecting atmospheric components through non-intuitive imaging
CN109991792B (en) Color filter for use with liquid crystal polarization interferometer
CN104535191B (en) Polarization spectral imaging measuring structure based on magnetic vortice light and AOTF

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant