CN106324482A - LBE bus mainboard automatic test realization method - Google Patents
LBE bus mainboard automatic test realization method Download PDFInfo
- Publication number
- CN106324482A CN106324482A CN201610727077.8A CN201610727077A CN106324482A CN 106324482 A CN106324482 A CN 106324482A CN 201610727077 A CN201610727077 A CN 201610727077A CN 106324482 A CN106324482 A CN 106324482A
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- China
- Prior art keywords
- lbe
- bus
- mainboard
- test
- lbe bus
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to an industrial standard LBE bus mainboard automatic test realization method, and especially relates to the LBE bus mainboard automatic test realization method in the aspect of bus function test after standard LBE mainboard production finishes. The method comprises an LBE tested mainboard slot, an LBE bus special-purpose test board slot and a standard LBE bus bottom board. An LBE mainboard to be tested is inserted into the LBE tested mainboard slot; and an LBE bus special-purpose test board is inserted into the LBE bus special-purpose test board slot. Compared with the prior art, the automatic test realization method, adopting a programmable logic device, ensures flexibility and automation of the LBE bus special-purpose test board, and has the advantages of being simple in structure, reliable to work, high in suitability, portable and easy to operate and the like. The automatic test realization method can also be suitable for other parallel bus mainboard test, such as an ISA bus mainboard, and the automatic test realization method can be applied to the test of mass production products.
Description
Technical field
The present invention relates to the automatic test implementation method of industrial standard LBE bus mainboard, particularly to standard LBE mainboard
Produce the automatic test implementation method based on LBE bus mainboard in terms of rear bus functionality test.
Background technology
Destroy Hong seven A aircraft general purpose computer buses (being called for short LBE bus), belong to parallel communication busses category, there is quantity
Many data wire, address wire and control lines.LBE bus board after volume production, is based especially on the mainboard test surfaces of LBE bus
Face the input of huge test aspect man power and material, need to carry out a large amount of comprehensively test job and just can ensure that product reaches
Required functional parameter, takes artificial manual test LBE bus main board function, and signal testing to be reached is comprehensive, each data wire,
Location line and control line are tested entirely, and except the time and efforts put into is many, and the accuracy of artificial manual test is extremely difficult to 100%.
The method of testing of automatization is in the urgent need to proposing.The present invention proposes automatic test implementation method based on LBE bus mainboard.
Summary of the invention
For the deficiencies in the prior art, the technical problem that the present invention intends to solve is to provide based on LBE bus mainboard automatic
Change test implementation method；The method reliable operation, practical, automatic test can be realized, and be applied to the survey of volume production product
Examination.
The present invention solves the technical solution of described technical problem: a kind of automatization based on LBE bus mainboard surveys
Examination implementation method, including LBE tested mainboard groove, LBE bus special test board slot and standard LBE bus mother board；LBE mainboard to be measured
Insert LBE tested mainboard groove；LBE bus special test plate inserts LBE bus special test board slot；LBE mainboard to be tested and LBE
Bus special test plate is connected by standard LBE bus mother board；LBE bus special test plate includes that standard LBE EBI is even
Connect device, level shifter interface chip, PLD, SRAM memory chip and corresponding power-supplying circuit.
The present invention connects the operation principle of circuit and process is: first, and mainboard to be measured for LBE needs the read-write carried out visit
Ask, interrupt and other control signals test corresponding test program be edited in LBE bus special test plate, test program should wrap
Containing signal in all about bus whether can test: by the read-write of LBE bus special test plate mainboard to be measured to LBE, in
The respective response program editing of disconnected and other control signals is in programmable gate array chip；LBE bus special test plate will mark
Signal in quasi-LBE bus interface connector is connected to PLD by level shifter interface chip；Because of LBE bus
For 5V level bus, and general PLD is 3.3V I/O electric level interface；SRAM storage chip is that LBE bus is read
Write data and memory space is provided, be connected with PLD.
The invention has the beneficial effects as follows, compared with prior art, thisApplicationAutomatic test implementation method, have employed
PLD, it is ensured that the flexible and automatization of LBE bus special test plate, and there is simple in construction, reliable operation,
The suitability is strong, transplantation and the easy feature such as operation.This bus automatic test implementation method is simultaneously suitable for other parallel bus
Mainboard is tested, and such as isa bus mainboard, can be applicable to volume production product test.
Accompanying drawing explanation
Fig. 1 is the electrical principle block diagram of automatic test implementation method of the present invention.
Fig. 2 is that LBE bus special test plate implements circuit block diagram.
Detailed description of the invention
Below in conjunction with embodiment and accompanying drawing thereof, the present invention is described in more detail.
A kind of automatic test implementation method based on LBE bus mainboard, including LBE tested mainboard groove, LBE bus is special
Test board slot and standard LBE bus mother board；LBE mainboard to be measured inserts LBE tested mainboard groove；LBE bus special test plate inserts
LBE bus special test board slot；LBE mainboard to be tested is connected by standard LBE bus mother board with LBE bus special test plate；
LBE bus special test plate include standard LBE bus interface connector, level shifter interface chip, PLD,
SRAM memory chip and corresponding power-supplying circuit.
LBE bus special test plate accesses mutually with LBE bus special test board slot, and user can be in the special survey of LBE bus
All signals in coding test bus on test plate (panel), including address, data and control signal；LBE mainboard to be measured groove is used for
Access LBE mainboard to be measured, response LBE bus special test plate various read-write requests, and the test of the signal such as respective interrupt
Respond；Standard LBE bus mother board is used for connecting LBE mainboard to be measured and LBE bus special test plate so that it is can lead to
Letter.
The various test request of LBE bus special test plate response LBE mainboard to be tested, complete LBE mainboard pair to be tested
The various access of LBE bus special test plate, to test out the state of all signals in LBE bus, whether to confirm LBE bus
Available.
The present invention connects the operation principle of circuit and process is: first, and mainboard to be measured for LBE needs the read-write carried out visit
Ask, interrupt and other control signals test corresponding test program be edited in LBE bus special test plate, test program should wrap
Containing signal in all about bus whether can test: by the read-write of LBE bus special test plate mainboard to be measured to LBE, in
The respective response program editing of disconnected and other control signals is in programmable gate array chip；LBE bus special test plate will mark
Signal in quasi-LBE bus interface connector is connected to PLD by level shifter interface chip；Because of LBE bus
For 5V level bus, and general PLD is 3.3V I/O electric level interface；SRAM storage chip is that LBE bus is read
Write data and memory space is provided, be connected with PLD.
Above example is only the concrete example application of automatic test to LBE bus mainboard of the present invention, not, limits this
Application claim.Every amendment carried out in the application claim technical scheme and non-intrinsically safe improve, all in this Shen
Please be within claims.
The present invention does not addresses part and is applicable to prior art.
Claims (1)
1. an automatic test implementation method based on LBE bus mainboard, it is characterised in that include LBE tested mainboard groove,
LBE bus special test board slot and standard LBE bus mother board；LBE mainboard to be measured inserts LBE tested mainboard groove；LBE bus is special
Test board inserts LBE bus special test board slot；LBE mainboard to be tested and LBE bus special test plate are by standard LBE bus
Base plate connects；LBE bus special test plate includes standard LBE bus interface connector, level shifter interface chip, able to programme patrols
Collect device, SRAM memory chip and corresponding power-supplying circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610727077.8A CN106324482A (en) | 2016-08-26 | 2016-08-26 | LBE bus mainboard automatic test realization method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610727077.8A CN106324482A (en) | 2016-08-26 | 2016-08-26 | LBE bus mainboard automatic test realization method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106324482A true CN106324482A (en) | 2017-01-11 |
Family
ID=57790828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610727077.8A Pending CN106324482A (en) | 2016-08-26 | 2016-08-26 | LBE bus mainboard automatic test realization method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106324482A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1097511A (en) * | 1996-04-16 | 1998-04-14 | Lattice Semiconductor Corp | Parallel programming of in-system programmable device using automatic tester |
| CN204166088U (en) * | 2014-10-23 | 2015-02-18 | 广州供电局有限公司 | Local discharge signal harvester |
| CN204178365U (en) * | 2014-10-29 | 2015-02-25 | 天津市英贝特航天科技有限公司 | Transformational structure between LBE bus and isa bus |
| CN204330907U (en) * | 2014-10-29 | 2015-05-13 | 天津市英贝特航天科技有限公司 | The automatic testing equipment of LBE bus board |
| CN205103324U (en) * | 2015-06-15 | 2016-03-23 | 珠海欧比特控制工程股份有限公司 | 1553B data bus detector |
-
2016
- 2016-08-26 CN CN201610727077.8A patent/CN106324482A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1097511A (en) * | 1996-04-16 | 1998-04-14 | Lattice Semiconductor Corp | Parallel programming of in-system programmable device using automatic tester |
| CN204166088U (en) * | 2014-10-23 | 2015-02-18 | 广州供电局有限公司 | Local discharge signal harvester |
| CN204178365U (en) * | 2014-10-29 | 2015-02-25 | 天津市英贝特航天科技有限公司 | Transformational structure between LBE bus and isa bus |
| CN204330907U (en) * | 2014-10-29 | 2015-05-13 | 天津市英贝特航天科技有限公司 | The automatic testing equipment of LBE bus board |
| CN205103324U (en) * | 2015-06-15 | 2016-03-23 | 珠海欧比特控制工程股份有限公司 | 1553B data bus detector |
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| PB01 | Publication | ||
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170111 |
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| RJ01 | Rejection of invention patent application after publication |