CN105787178B - A kind of method and device for testing communication interface specification - Google Patents
A kind of method and device for testing communication interface specification Download PDFInfo
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Abstract
The invention discloses a kind of method and devices for testing communication interface specification, it include: that actual verification is carried out to test board using Bert test, the bit error rate of test board is obtained, and test board is divided into successfully by sample and failure sample according to the bit error rate of test board；It models and emulates respectively using channel of the simulation software to success sample and failure sample, the S parameter of succeed sample and failure sample；The S parameter for analyzing successfully sample and failure sample, the probability density distribution situation of the slotting dynamic loss of succeed sample and failure sample and the probability density distribution situation of return loss；Time-domain-simulation is carried out using S parameter of the Model in Time Domain to success sample and failure sample and is analyzed, the eye high probability Density Distribution situation and the wide probability density distribution situation of eye of succeed sample and failure sample.As it can be seen that in the present embodiment defining communication interface specification in such a way that emulation and measurement combine.
Description
Technical field
The present invention relates to electronic technology fields, more specifically to a kind of method and dress for testing communication interface specification
It sets.
Background technique
In Communication System Design, it will usually encounter many different types of signal communication interfaces, some signals are that have both
Fixed design specification, some signals do not have set consortium specification or this specification generally to be defined not yet.It wants
To such interface definition standard, if using conventional method, the method that verifying is repeatedly tested using test board is needed very big
Workload and a large amount of manpower and material resources of consuming.
Therefore, how to test communication interface specification is those skilled in the art's problem to be solved.
Summary of the invention
The purpose of the present invention is to provide a kind of method and devices for testing communication interface specification, to test communication interface rule
Model.
To achieve the above object, the embodiment of the invention provides following technical solutions:
A method of test communication interface specification, comprising:
Actual verification is carried out to test board using Bert test, obtains the bit error rate of test board, and according to the survey
The test board is divided into successfully sample and failure sample by the bit error rate of test plate (panel) card；
It models and emulates respectively using channel of the simulation software to the success sample and the failure sample, obtain described
Second S parameter of the first S parameter of success sample and the failure sample；
Analyze first S parameter, obtain probability density distribution situation that the first of the success sample inserts dynamic loss and
The probability density distribution situation of first return loss；Second S parameter is analyzed, obtain the failure sample second inserts dynamic damage
The probability density distribution situation of consumption and the probability density distribution situation of the second return loss；
Time-domain-simulation is carried out to first S parameter using Model in Time Domain and is analyzed, the first of the success sample is obtained
Eye high probability Density Distribution situation and the wide probability density distribution situation of First view；Using Model in Time Domain to second S parameter into
Row time-domain-simulation is simultaneously analyzed, and the second high probability Density Distribution situation and second wide probability density of the failure sample are obtained
Distribution situation.
Wherein, described to model and imitate respectively using channel of the simulation software to the success sample and the failure sample
Very, the first S parameter of the success sample and the second S parameter of the failure sample are obtained, comprising:
It is scanned using process parameter variable of the simulation software to the channel of the success sample, assesses the success sample
The influence of this processing procedure factor obtains first S parameter；
It is scanned using process parameter variable of the simulation software to the channel of the failure sample, assesses the failure sample
The influence of this processing procedure factor obtains second S parameter.
Wherein, the test board can refer to for practical board or actually link.
Wherein, described that time-domain-simulation is carried out to first S parameter using Model in Time Domain and is analyzed, obtain the success sample
This First view high probability Density Distribution situation and the wide probability density distribution situation of First view；Using Model in Time Domain to described second
S parameter carries out time-domain-simulation and simultaneously analyzes, and obtains failure second high probability Density Distribution situation of sample and second wide
Probability density distribution situation, comprising:
Time-domain-simulation is carried out to first S parameter using the Model in Time Domain of building, is obtained opposite with first S parameter
The first time domain eye answered, and eye height to first time domain eye and eye is wide analyzes, obtain the success sample
First view high probability Density Distribution situation and the wide probability density distribution situation of First view；
Time-domain-simulation is carried out to second S parameter using the Model in Time Domain of building, is obtained opposite with second S parameter
The second time domain eye answered, and eye height to second time domain eye and eye is wide analyzes, obtain the failure sample
Second high probability Density Distribution situation and second wide probability density distribution situation.
Wherein, the Model in Time Domain is AMI model.
A kind of device for testing communication interface specification, comprising:
Error rate calculation module obtains test board for carrying out actual verification to test board using Bert test
The bit error rate；
Test board categorization module, for the test board to be divided into successfully sample according to the bit error rate of the test board
Sheet and failure sample；
Parameter calculating module, for being built respectively using channel of the simulation software to the success sample and the failure sample
Mould simultaneously emulates, and obtains the first S parameter of the success sample and the second S parameter of the failure sample；
First analysis module, for analyzing first S parameter, obtain the success sample first inserts the general of dynamic loss
The probability density distribution situation of rate Density Distribution situation and the first return loss；
Second analysis module, for analyzing second S parameter, obtain the failure sample second inserts the general of dynamic loss
The probability density distribution situation of rate Density Distribution situation and the second return loss；
Third analysis module obtains institute for carrying out time-domain-simulation to first S parameter using Model in Time Domain and analyzing
State successfully the First view high probability Density Distribution situation and the wide probability density distribution situation of First view of sample；
4th analysis module obtains institute for carrying out time-domain-simulation to second S parameter using Model in Time Domain and analyzing
State unsuccessfully the second high probability Density Distribution situation and second wide probability density distribution situation of sample.
Wherein, comprising:
First parameter calculation unit, for using simulation software to it is described success sample channel process parameter variable into
Row scanning assesses the influence of the success sample processing procedure factor, obtains first S parameter；
Second parameter calculation unit, for using simulation software to it is described failure sample channel process parameter variable into
Row scanning assesses the influence of the failure sample processing procedure factor, obtains second S parameter.
Wherein, the test board can refer to for practical board or actually link.
Wherein, the third analysis module includes:
First simulation unit, for using building Model in Time Domain to first S parameter carry out time-domain-simulation, obtain with
Corresponding first time domain eye of first S parameter；
First analytical unit, for first time domain eye eye height and eye is wide analyzes, obtain the success
The wide probability density distribution situation of First view high probability Density Distribution situation and First view of sample；
4th analysis module includes:
Second simulation unit, for using building Model in Time Domain to second S parameter carry out time-domain-simulation, obtain with
Corresponding second time domain eye of second S parameter；
Second analytical unit, for second time domain eye eye height and eye is wide analyzes, obtain the failure
Second high probability Density Distribution situation of sample and second wide probability density distribution situation.
Wherein, the Model in Time Domain is AMI model.
By above scheme it is found that it is provided in an embodiment of the present invention it is a kind of test communication interface specification method and device,
Include: that actual verification is carried out to test board using Bert test, obtains the bit error rate of test board, and according to the test board
The test board is divided into successfully sample and failure sample by the bit error rate of card；Using simulation software to the success sample and institute
The channel for stating unsuccessfully sample models and emulates respectively, obtain the success sample the first S parameter and the failure sample the
Two S parameters；Analyze first S parameter, obtain probability density distribution situation that the first of the success sample inserts dynamic loss and
The probability density distribution situation of first return loss；Second S parameter is analyzed, obtain the failure sample second inserts dynamic damage
The probability density distribution situation of consumption and the probability density distribution situation of the second return loss；Using Model in Time Domain to the first S
Parameter carries out time-domain-simulation and analyzes, and First view high probability Density Distribution situation and the First view for obtaining the success sample are wide general
Rate Density Distribution situation；Time-domain-simulation is carried out to second S parameter using Model in Time Domain and is analyzed, the failure sample is obtained
Second high probability Density Distribution situation and second wide probability density distribution situation.
As it can be seen that in the present embodiment in such a way that emulation and measuring combines come the design specification of definition signal,
Solve the problems, such as that novel signal interface or non-common interfaces can refer to judgement without specification to a certain extent, to signal integrity
Type design and layout design propose new solution and thinking.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is a kind of method flow schematic diagram for testing communication interface specification disclosed by the embodiments of the present invention；
Fig. 2 is a kind of method schematic diagram of specific test communication interface specification disclosed by the embodiments of the present invention；
Fig. 3 is a kind of apparatus structure schematic diagram for testing communication interface specification disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of method and devices for testing communication interface specification, to test communication interface rule
Model.
Referring to Fig. 1, a kind of method for testing communication interface specification provided in an embodiment of the present invention, comprising:
S101, actual verification is carried out to test board using Bert test, obtains the bit error rate of test board, and according to institute
The test board is divided into successfully sample and failure sample by the bit error rate for stating test board；
Wherein, the test board can refer to for practical board or actually link.
S102, it models and emulates respectively using channel of the simulation software to the success sample and the failure sample, obtain
To the first S parameter of the success sample and the second S parameter of the failure sample；
Wherein, described to model and imitate respectively using channel of the simulation software to the success sample and the failure sample
Very, the first S parameter of the success sample and the second S parameter of the failure sample are obtained, comprising:
It is scanned using process parameter variable of the simulation software to the channel of the success sample, assesses the success sample
The influence of this processing procedure factor obtains first S parameter；
It is scanned using process parameter variable of the simulation software to the channel of the failure sample, assesses the failure sample
The influence of this processing procedure factor obtains second S parameter.
S103, analysis first S parameter obtain the first of the success sample probability density distribution shape for inserting dynamic loss
The probability density distribution situation of condition and the first return loss；Second S parameter is analyzed, obtain the failure sample second inserts
The probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
Specifically, first of the successful sample in the present embodiment inserts the probability density distribution situation and the first echo of dynamic loss
The probability density distribution situation of loss is the frequency domain specification of successfully sample；The second of failure sample inserts the probability density point of dynamic loss
The probability density distribution situation of cloth situation and the second return loss is the frequency domain specification of failure sample.
S104, time-domain-simulation is carried out to first S parameter using Model in Time Domain and is analyzed, obtain the success sample
First view high probability Density Distribution situation and the wide probability density distribution situation of First view；The 2nd S is joined using Model in Time Domain
Number carries out time-domain-simulation and analyzes, and obtains the second high probability Density Distribution situation and second wide probability of the failure sample
Density Distribution situation.
Wherein, the Model in Time Domain in the present embodiment is AMI model, and S104 is specifically included:
Time-domain-simulation is carried out to first S parameter using the Model in Time Domain of building, is obtained opposite with first S parameter
The first time domain eye answered, and eye height to first time domain eye and eye is wide analyzes, obtain the success sample
First view high probability Density Distribution situation and the wide probability density distribution situation of First view；
Time-domain-simulation is carried out to second S parameter using the Model in Time Domain of building, is obtained opposite with second S parameter
The second time domain eye answered, and eye height to second time domain eye and eye is wide analyzes, obtain the failure sample
Second high probability Density Distribution situation and second wide probability density distribution situation.
Specifically, the First view high probability Density Distribution situation and the wide probability of First view of the successful sample in the present embodiment are close
Degree distribution situation is the time domain specification of successfully sample；Second high probability Density Distribution situation of failure sample and second wide general
Rate Density Distribution situation is the time domain specification of failure sample.
Specifically, referring to fig. 2, for a kind of method signal of specific test communication interface specification provided in this embodiment
Figure.The present embodiment defines the time domain in channel and the design specification of frequency domain by the method for Bert test and time-domain and frequency-domain emulation.
Actual verification is carried out to the test board with interface to be tested using Bert test, obtains the bit error rate of real system.It utilizes
Simulation software models the channel of product board, and emulates and obtain the S parameter in the channel, by system in simulation software
Journey parametric variable is scanned to assess the influence of product processing procedure factor and obtain a series of S parameter, joins to obtained some column S
Several Insertion Loss and return loss are analyzed, and are obtained probability density distribution curve by statistic op- timization, are finally obtained the specification of frequency domain.Benefit
Time-domain-simulation is carried out to obtained some column S parameters with the Model in Time Domain of building, finally obtains the probability density point of time domain eye
The reference of cloth and eye figure standardizes.
As it can be seen that in the present embodiment in such a way that emulation and measuring combines come the design specification of definition signal,
Solve the problems, such as that novel signal interface or non-common interfaces can refer to judgement without specification to a certain extent, to signal integrity
Type design and layout design propose new solution and thinking.
The device of test communication interface specification provided in an embodiment of the present invention is introduced below, test described below
The method of the device of communication interface specification and above-described test communication interface specification can be cross-referenced.
Referring to Fig. 3, a kind of device for testing communication interface specification provided in an embodiment of the present invention, comprising:
Error rate calculation module 100 obtains test board for carrying out actual verification to test board using Bert test
The bit error rate；
Test board categorization module 200, for being divided into the test board according to the bit error rate of the test board
Function sample and failure sample；
Parameter calculating module 300, for the channel point using simulation software to the success sample and the failure sample
It does not model and emulates, obtain the first S parameter of the success sample and the second S parameter of the failure sample；
First analysis module 400, for analyzing first S parameter, obtain the success sample first inserts dynamic loss
Probability density distribution situation and the first return loss probability density distribution situation；
Second analysis module 500, for analyzing second S parameter, obtain the failure sample second inserts dynamic loss
Probability density distribution situation and the second return loss probability density distribution situation；
Third analysis module 600 is obtained for carrying out time-domain-simulation to first S parameter using Model in Time Domain and analyzing
To the First view high probability Density Distribution situation and the wide probability density distribution situation of First view of the success sample；
4th analysis module 700 is obtained for carrying out time-domain-simulation to second S parameter using Model in Time Domain and analyzing
To the second high probability Density Distribution situation and second wide probability density distribution situation of the failure sample.
Wherein, the parameter calculating module 300, comprising:
First parameter calculation unit, for using simulation software to it is described success sample channel process parameter variable into
Row scanning assesses the influence of the success sample processing procedure factor, obtains first S parameter；
Second parameter calculation unit, for using simulation software to it is described failure sample channel process parameter variable into
Row scanning assesses the influence of the failure sample processing procedure factor, obtains second S parameter.
Wherein, the test board can refer to for practical board or actually link.
Wherein, the third analysis module 600 includes:
First simulation unit, for using building Model in Time Domain to first S parameter carry out time-domain-simulation, obtain with
Corresponding first time domain eye of first S parameter；
First analytical unit, for first time domain eye eye height and eye is wide analyzes, obtain the success
The wide probability density distribution situation of First view high probability Density Distribution situation and First view of sample；
4th analysis module 700 includes:
Second simulation unit, for using building Model in Time Domain to second S parameter carry out time-domain-simulation, obtain with
Corresponding second time domain eye of second S parameter；
Second analytical unit, for second time domain eye eye height and eye is wide analyzes, obtain the failure
Second high probability Density Distribution situation of sample and second wide probability density distribution situation.
Wherein, the Model in Time Domain is AMI model.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with other
The difference of embodiment, the same or similar parts in each embodiment may refer to each other.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (10)
1. a kind of method for testing communication interface specification characterized by comprising
Actual verification is carried out to test board using Bert test, obtains the bit error rate of test board, and according to the test board
The test board is divided into successfully sample and failure sample by the bit error rate of card；
It models and emulates respectively using channel of the simulation software to the success sample and the failure sample, obtain the success
Second S parameter of the first S parameter of sample and the failure sample；
First S parameter is analyzed, the first of the success sample probability density distribution situation and first for inserting dynamic loss is obtained
The probability density distribution situation of return loss；Second S parameter is analyzed, obtain the failure sample second inserts dynamic loss
The probability density distribution situation of probability density distribution situation and the second return loss；Wherein, the first of success sample inserts dynamic loss
Probability density distribution situation and the first return loss probability density distribution situation be successfully sample frequency domain specification；Failure sample
The probability density distribution situation of probability density distribution situation and the second return loss that this second inserts dynamic loss is failure sample
Frequency domain specification；
Time-domain-simulation is carried out to first S parameter using Model in Time Domain and is analyzed, the First view for obtaining the success sample is high
Probability density distribution situation and the wide probability density distribution situation of First view；When being carried out using Model in Time Domain to second S parameter
Domain emulates and analyzes, and obtains the second high probability Density Distribution situation and second wide probability density distribution of the failure sample
Situation；Wherein, the First view high probability Density Distribution situation and the wide probability density distribution situation of First view of success sample are successfully
The time domain specification of sample；The second high probability Density Distribution situation of sample that fail and second wide probability density distribution situation are
The time domain specification of failure sample.
2. the method according to claim 1, wherein it is described using simulation software to the success sample and described
The channel of failure sample models and emulates respectively, obtains the first S parameter of the success sample and the 2nd S of the failure sample
Parameter, comprising:
It is scanned using process parameter variable of the simulation software to the channel of the success sample, assesses the success sample system
The influence of Cheng Yinsu obtains first S parameter；
It is scanned using process parameter variable of the simulation software to the channel of the failure sample, assesses the failure sample system
The influence of Cheng Yinsu obtains second S parameter.
3. according to the method described in claim 2, it is characterized in that, the test board is practical board or actually can refer to
Link.
4. the method according to claim 1, wherein described carry out first S parameter using Model in Time Domain
Time-domain-simulation is simultaneously analyzed, and the First view high probability Density Distribution situation and the wide probability density of First view point of the success sample are obtained
Cloth situation；Time-domain-simulation is carried out to second S parameter using Model in Time Domain and is analyzed, second of the failure sample is obtained
High probability Density Distribution situation and second wide probability density distribution situation, comprising:
Time-domain-simulation is carried out to first S parameter using the Model in Time Domain of building, is obtained corresponding with first S parameter
First time domain eye, and eye height to first time domain eye and eye is wide analyzes, obtain the first of the success sample
Eye high probability Density Distribution situation and the wide probability density distribution situation of First view；
Time-domain-simulation is carried out to second S parameter using the Model in Time Domain of building, is obtained corresponding with second S parameter
Second time domain eye, and eye height to second time domain eye and eye is wide analyzes, obtain the second of the failure sample
Eye high probability Density Distribution situation and second wide probability density distribution situation.
5. method described in any one of -4 according to claim 1, which is characterized in that the Model in Time Domain is AMI model.
6. a kind of device for testing communication interface specification characterized by comprising
Error rate calculation module obtains the error code of test board for carrying out actual verification to test board using Bert test
Rate；
Test board categorization module, for according to the bit error rate of the test board by the test board be divided into successfully sample and
Failure sample；
Parameter calculating module, for being modeled respectively simultaneously using channel of the simulation software to the success sample and the failure sample
Emulation obtains the first S parameter of the success sample and the second S parameter of the failure sample；
First analysis module, for analyzing first S parameter, the probability for obtaining the first slotting dynamic loss of the success sample is close
Spend the probability density distribution situation of distribution situation and the first return loss；Wherein, the first of success sample inserts the probability of dynamic loss
The probability density distribution situation of Density Distribution situation and the first return loss is the frequency domain specification of successfully sample；
Second analysis module, for analyzing second S parameter, the probability for obtaining the second slotting dynamic loss of the failure sample is close
Spend the probability density distribution situation of distribution situation and the second return loss；Wherein, the second of failure sample inserts the probability of dynamic loss
The probability density distribution situation of Density Distribution situation and the second return loss is the frequency domain specification of failure sample；
Third analysis module, for time-domain-simulation and analyze to first S parameter using Model in Time Domain, obtain it is described at
The wide probability density distribution situation of First view high probability Density Distribution situation and First view of function sample；Wherein, the of success sample
High probability Density Distribution situation and the wide probability density distribution situation of First view are the time domain specification of successfully sample at a glance；
4th analysis module obtains the mistake for carrying out time-domain-simulation to second S parameter using Model in Time Domain and analyzing
Lose the second high probability Density Distribution situation and second wide probability density distribution situation of sample；Wherein, the of failure sample
Two high probability Density Distribution situations and second wide probability density distribution situation are the time domain specification of failure sample.
7. device according to claim 6, which is characterized in that the parameter calculating module, comprising:
First parameter calculation unit, for being swept using process parameter variable of the simulation software to the channel of the success sample
It retouches, assesses the influence of the success sample processing procedure factor, obtain first S parameter；
Second parameter calculation unit, for being swept using process parameter variable of the simulation software to the channel of the failure sample
It retouches, assesses the influence of the failure sample processing procedure factor, obtain second S parameter.
8. device according to claim 7, which is characterized in that the test board is practical board or actually can refer to
Link.
9. device according to claim 8, which is characterized in that
The third analysis module includes:
First simulation unit, for using building Model in Time Domain to first S parameter carry out time-domain-simulation, obtain with it is described
Corresponding first time domain eye of first S parameter；
First analytical unit, for first time domain eye eye height and eye is wide analyzes, obtain the success sample
First view high probability Density Distribution situation and the wide probability density distribution situation of First view；
4th analysis module includes:
Second simulation unit, for using building Model in Time Domain to second S parameter carry out time-domain-simulation, obtain with it is described
Corresponding second time domain eye of second S parameter；
Second analytical unit, for second time domain eye eye height and eye is wide analyzes, obtain the failure sample
Second high probability Density Distribution situation and second wide probability density distribution situation.
10. the device according to any one of claim 6-9, which is characterized in that the Model in Time Domain is AMI model.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110257953A1 (en) * | 2010-04-19 | 2011-10-20 | Peng Li | Simulation tool for high-speed communications links |
| CN102664674A (en) * | 2012-04-01 | 2012-09-12 | 中兴通讯股份有限公司南京分公司 | Test device of communication equipment and use method of test device |
| CN103200044A (en) * | 2013-03-20 | 2013-07-10 | 烽火通信科技股份有限公司 | Backplane test system and method for verifying quality of 100G backplane interconnected signals |
| CN103970699A (en) * | 2014-05-23 | 2014-08-06 | 浪潮电子信息产业股份有限公司 | Method for debugging FPGA pre-emphasis equilibrium value |
-
2016
- 2016-02-26 CN CN201610109749.9A patent/CN105787178B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110257953A1 (en) * | 2010-04-19 | 2011-10-20 | Peng Li | Simulation tool for high-speed communications links |
| CN102870094A (en) * | 2010-04-19 | 2013-01-09 | 阿尔特拉公司 | Simulation tool for high-speed communications links |
| CN102664674A (en) * | 2012-04-01 | 2012-09-12 | 中兴通讯股份有限公司南京分公司 | Test device of communication equipment and use method of test device |
| CN103200044A (en) * | 2013-03-20 | 2013-07-10 | 烽火通信科技股份有限公司 | Backplane test system and method for verifying quality of 100G backplane interconnected signals |
| CN103970699A (en) * | 2014-05-23 | 2014-08-06 | 浪潮电子信息产业股份有限公司 | Method for debugging FPGA pre-emphasis equilibrium value |
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