CN105787178A - Method and device for testing communication interface specification - Google Patents
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Abstract
The invention discloses a method and device for testing the communication interface specification.The method comprises the steps that a Bert test is used for carrying out actual verification on a test board card, the error rate of the test board card is obtained, and the test board card is divided into a successful sample and a failing sample according to the error rate of the test board card; a channel of the successful sample and a channel of the failing sample are modeled and simulated through simulating software, and a parameter S of the successful sample and a parameter S of the failing sample are obtained; the parameter S of the successful sample and the parameter S of the failing sample are analyzed, the probability density distribution conditions of inserting losses of the successful sample and the failing sample and the probability density distribution conditions of return losses of the successful sample and the failing sample are obtained; the parameter S of the successful sample and the parameter S of the failing sample are subjected to time-domain simulation and analyzed through a time domain model, and the eye height probability density distribution conditions and eye width probability density distribution conditions of the successful sample and the failing sample are obtained.It is clear that a simulation and measurement combined mode is adopted in the embodiment for defining the communication interface specification.
Description
Technical field
The present invention relates to electronic technology field, more particularly, it relates to a kind of method testing communication interface specification and device.
Background technology
In Communication System Design, it will usually run into many different types of signal communication interface, some signal is to have set design specification, and some signal does not have set consortium specification, or this specification is but without generally being defined.To this kind of interface definition specification, if adopting conventional method, to adopt the method that test board repeatedly tests checking, it is necessary to very big workload and the substantial amounts of manpower and materials of consuming.
Therefore, how testing communication interface specification is the problem that those skilled in the art need to solve.
Summary of the invention
It is an object of the invention to provide a kind of method testing communication interface specification and device, to test communication interface specification.
For achieving the above object, following technical scheme is embodiments provided:
A kind of method testing communication interface specification, including:
Utilize Bert test that test board card is carried out actual verification, obtain the bit error rate of test board, and according to the bit error rate of described test board, described test board is divided into successfully sample and failure sample；
Utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample；
Analyze described first S parameter, obtain the first of described successful sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；Analyze described second S parameter, obtain the second of described failed sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
Utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, described utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample, including:
Utilize simulation software that the process parameter variable of the passage of described successful sample is scanned, assess the impact of described successful sample processing procedure factor, obtain described first S parameter；
Utilize simulation software that the process parameter variable of the passage of described failed sample is scanned, assess the impact of described failed sample processing procedure factor, obtain described second S parameter.
Wherein, described test board for actual board or actual is referred to link.
Wherein, described utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample, including:
Utilize the Model in Time Domain built that described first S parameter is carried out time-domain-simulation, obtain first time domain eye corresponding with described first S parameter, and be analyzed the eye of described first time domain eye is high and eye is wide, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Utilize the Model in Time Domain built that described second S parameter is carried out time-domain-simulation, obtain second time domain eye corresponding with described second S parameter, and be analyzed the eye of described second time domain eye is high and eye is wide, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, described Model in Time Domain is AMI model.
A kind of device testing communication interface specification, including:
Error rate calculation module, is used for utilizing Bert test that test board card is carried out actual verification, obtains the bit error rate of test board；
Test board sort module, is used for the bit error rate according to described test board and described test board is divided into successfully sample and failure sample；
Parameter calculating module, for utilizing simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtains the first S parameter of described successful sample and the second S parameter of described failed sample；
First analysis module, is used for analyzing described first S parameter, obtains the first of described successful sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；
Second analysis module, is used for analyzing described second S parameter, obtains the second of described failed sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
3rd analysis module, is used for utilizing Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, and obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
4th analysis module, is used for utilizing Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, and obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, including:
First parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described successful sample is scanned, assesses the impact of described successful sample processing procedure factor, obtains described first S parameter；
Second parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described failed sample is scanned, assesses the impact of described failed sample processing procedure factor, obtains described second S parameter.
Wherein, described test board for actual board or actual is referred to link.
Wherein, described 3rd analysis module includes:
First simulation unit, for utilizing the Model in Time Domain of structure that described first S parameter is carried out time-domain-simulation, obtains first time domain eye corresponding with described first S parameter；
First analytic unit, for being analyzed the eye of described first time domain eye is high and eye is wide, obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Described 4th analysis module includes:
Second simulation unit, for utilizing the Model in Time Domain of structure that described second S parameter is carried out time-domain-simulation, obtains second time domain eye corresponding with described second S parameter；
Second analytic unit, for being analyzed the eye of described second time domain eye is high and eye is wide, obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, described Model in Time Domain is AMI model.
By above scheme, a kind of method testing communication interface specification of embodiment of the present invention offer and device, including: utilize Bert test that test board card is carried out actual verification, obtain the bit error rate of test board, and according to the bit error rate of described test board, described test board is divided into successfully sample and failure sample；Utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample；Analyze described first S parameter, obtain the first of described successful sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；Analyze described second S parameter, obtain the second of described failed sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；Utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Visible, in the present embodiment by utilizing the mode that emulation and measurement combine to carry out the design specification of definition signal, to some extent solve the problem that novel signal interface or non-common interfaces are referred to without specification judge, the design of signal integrity type and layout design are proposed new solution and thinking.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is a kind of method flow schematic diagram testing communication interface specification disclosed in the embodiment of the present invention；
Fig. 2 is the method schematic diagram of a kind of concrete test communication interface specification disclosed in the embodiment of the present invention；
Fig. 3 is a kind of apparatus structure schematic diagram testing communication interface specification disclosed in the embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
The embodiment of the invention discloses a kind of method testing communication interface specification and device, to test communication interface specification.
Referring to Fig. 1, a kind of method testing communication interface specification that the embodiment of the present invention provides, including:
S101, utilize Bert test that test board card is carried out actual verification, obtain the bit error rate of test board, and according to the bit error rate of described test board, described test board is divided into successfully sample and failure sample；
Wherein, described test board for actual board or actual is referred to link.
S102, utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample；
Wherein, described utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample, including:
Utilize simulation software that the process parameter variable of the passage of described successful sample is scanned, assess the impact of described successful sample processing procedure factor, obtain described first S parameter；
Utilize simulation software that the process parameter variable of the passage of described failed sample is scanned, assess the impact of described failed sample processing procedure factor, obtain described second S parameter.
S103, analyze described first S parameter, obtain the first of described successful sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；Analyze described second S parameter, obtain the second of described failed sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
Concrete, the first probability density distribution situation inserting the probability density distribution situation and the first return loss of moving loss of the successful sample in the present embodiment is successfully the frequency domain specification of sample；The second slotting dynamic probability density distribution situation of loss of failure sample and the probability density distribution situation of the second return loss are unsuccessfully the frequency domain specification of sample.
S104, utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, the Model in Time Domain in the present embodiment is AMI model, and S104 specifically includes:
Utilize the Model in Time Domain built that described first S parameter is carried out time-domain-simulation, obtain first time domain eye corresponding with described first S parameter, and be analyzed the eye of described first time domain eye is high and eye is wide, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Utilize the Model in Time Domain built that described second S parameter is carried out time-domain-simulation, obtain second time domain eye corresponding with described second S parameter, and be analyzed the eye of described second time domain eye is high and eye is wide, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Concrete, the First view high probability Density Distribution situation of the successful sample in the present embodiment and First view width probability density distribution situation are successfully the time domain specification of sample；The Second Sight high probability Density Distribution situation of failure sample and Second Sight width probability density distribution situation are unsuccessfully the time domain specification of sample.
Concrete, referring to Fig. 2, for the method schematic diagram of a kind of concrete test communication interface specification that the present embodiment provides.The present embodiment defines the time domain of passage and the design specification of frequency domain by the method for Bert test and time-domain and frequency-domain emulation.Utilize Bert test that the test board card with interface to be tested is carried out actual verification, obtain the bit error rate of real system.Utilize simulation software that the passage of product board is modeled, and emulate the S parameter obtaining this passage, a series of S parameter is obtained by process parameter variable is scanned assessing the impact of product processing procedure factor in simulation software, Insertion Loss and return loss to some the row S parameter obtained are analyzed, obtain probability density distribution curve through statistic op-timization, finally give the specification of frequency domain.Utilize the Model in Time Domain built that some the row S parameter obtained are carried out time-domain-simulation, finally give the probability density distribution of time domain eye and the reference specification of eye pattern.
Visible, in the present embodiment by utilizing the mode that emulation and measurement combine to carry out the design specification of definition signal, to some extent solve the problem that novel signal interface or non-common interfaces are referred to without specification judge, the design of signal integrity type and layout design are proposed new solution and thinking.
The device of the test communication interface the specification below embodiment of the present invention provided is introduced, and the method for the device of test communication interface specification described below and above-described test communication interface specification can be cross-referenced.
Referring to Fig. 3, a kind of device testing communication interface specification that the embodiment of the present invention provides, including:
Error rate calculation module 100, is used for utilizing Bert test that test board card is carried out actual verification, obtains the bit error rate of test board；
Test board sort module 200, is used for the bit error rate according to described test board and described test board is divided into successfully sample and failure sample；
Parameter calculating module 300, for utilizing simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtains the first S parameter of described successful sample and the second S parameter of described failed sample；
First analysis module 400, is used for analyzing described first S parameter, obtains the first of described successful sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；
Second analysis module 500, is used for analyzing described second S parameter, obtains the second of described failed sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
3rd analysis module 600, is used for utilizing Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, and obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
4th analysis module 700, is used for utilizing Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, and obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, described parameter calculating module 300, including:
First parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described successful sample is scanned, assesses the impact of described successful sample processing procedure factor, obtains described first S parameter；
Second parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described failed sample is scanned, assesses the impact of described failed sample processing procedure factor, obtains described second S parameter.
Wherein, described test board for actual board or actual is referred to link.
Wherein, described 3rd analysis module 600 includes:
First simulation unit, for utilizing the Model in Time Domain of structure that described first S parameter is carried out time-domain-simulation, obtains first time domain eye corresponding with described first S parameter；
First analytic unit, for being analyzed the eye of described first time domain eye is high and eye is wide, obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Described 4th analysis module 700 includes:
Second simulation unit, for utilizing the Model in Time Domain of structure that described second S parameter is carried out time-domain-simulation, obtains second time domain eye corresponding with described second S parameter；
Second analytic unit, for being analyzed the eye of described second time domain eye is high and eye is wide, obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
Wherein, described Model in Time Domain is AMI model.
In this specification, each embodiment adopts the mode gone forward one by one to describe, and what each embodiment stressed is the difference with other embodiments, between each embodiment identical similar portion mutually referring to.
Described above to the disclosed embodiments, makes professional and technical personnel in the field be capable of or uses the present invention.The multiple amendment of these embodiments be will be apparent from for those skilled in the art, and generic principles defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention is not intended to be limited to the embodiments shown herein, and is to fit to the widest scope consistent with principles disclosed herein and features of novelty.
Claims (10)
1. the method testing communication interface specification, it is characterised in that including:
Utilize Bert test that test board card is carried out actual verification, obtain the bit error rate of test board, and according to the bit error rate of described test board, described test board is divided into successfully sample and failure sample；
Utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample；
Analyze described first S parameter, obtain the first of described successful sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；Analyze described second S parameter, obtain the second of described failed sample and insert the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
Utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
2. method according to claim 1, it is characterized in that, described utilize simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtain the first S parameter of described successful sample and the second S parameter of described failed sample, including:
Utilize simulation software that the process parameter variable of the passage of described successful sample is scanned, assess the impact of described successful sample processing procedure factor, obtain described first S parameter；
Utilize simulation software that the process parameter variable of the passage of described failed sample is scanned, assess the impact of described failed sample processing procedure factor, obtain described second S parameter.
3. method according to claim 2, it is characterised in that described test board is for actual board or actual is referred to link.
4. method according to claim 1, it is characterised in that described utilize Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；Utilize Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample, including:
Utilize the Model in Time Domain built that described first S parameter is carried out time-domain-simulation, obtain first time domain eye corresponding with described first S parameter, and be analyzed the eye of described first time domain eye is high and eye is wide, obtain First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Utilize the Model in Time Domain built that described second S parameter is carried out time-domain-simulation, obtain second time domain eye corresponding with described second S parameter, and be analyzed the eye of described second time domain eye is high and eye is wide, obtain Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
5. the method according to any one in claim 1-4, it is characterised in that described Model in Time Domain is AMI model.
6. the device testing communication interface specification, it is characterised in that including:
Error rate calculation module, is used for utilizing Bert test that test board card is carried out actual verification, obtains the bit error rate of test board；
Test board sort module, is used for the bit error rate according to described test board and described test board is divided into successfully sample and failure sample；
Parameter calculating module, for utilizing simulation software that the passage of described successful sample and described failed sample is modeled respectively and emulated, obtains the first S parameter of described successful sample and the second S parameter of described failed sample；
First analysis module, is used for analyzing described first S parameter, obtains the first of described successful sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the first return loss；
Second analysis module, is used for analyzing described second S parameter, obtains the second of described failed sample and inserts the probability density distribution situation of dynamic loss and the probability density distribution situation of the second return loss；
3rd analysis module, is used for utilizing Model in Time Domain that described first S parameter is carried out time-domain-simulation and analyzed, and obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
4th analysis module, is used for utilizing Model in Time Domain that described second S parameter is carried out time-domain-simulation and analyzed, and obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
7. device according to claim 6, it is characterised in that described parameter calculating module, including:
First parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described successful sample is scanned, assesses the impact of described successful sample processing procedure factor, obtains described first S parameter；
Second parameter calculation unit, for utilizing simulation software that the process parameter variable of the passage of described failed sample is scanned, assesses the impact of described failed sample processing procedure factor, obtains described second S parameter.
8. device according to claim 7, it is characterised in that described test board is for actual board or actual is referred to link.
9. device according to claim 8, it is characterised in that
Described 3rd analysis module includes:
First simulation unit, for utilizing the Model in Time Domain of structure that described first S parameter is carried out time-domain-simulation, obtains first time domain eye corresponding with described first S parameter；
First analytic unit, for being analyzed the eye of described first time domain eye is high and eye is wide, obtains First view high probability Density Distribution situation and the First view width probability density distribution situation of described successful sample；
Described 4th analysis module includes:
Second simulation unit, for utilizing the Model in Time Domain of structure that described second S parameter is carried out time-domain-simulation, obtains second time domain eye corresponding with described second S parameter；
Second analytic unit, for being analyzed the eye of described second time domain eye is high and eye is wide, obtains Second Sight high probability Density Distribution situation and the Second Sight width probability density distribution situation of described failed sample.
10. the device according to any one in claim 6-9, it is characterised in that described Model in Time Domain is AMI model.
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