CN104826821A - Chip-type electronic component checking and classifying apparatus - Google Patents
Chip-type electronic component checking and classifying apparatus Download PDFInfo
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- CN104826821A CN104826821A CN201510063513.1A CN201510063513A CN104826821A CN 104826821 A CN104826821 A CN 104826821A CN 201510063513 A CN201510063513 A CN 201510063513A CN 104826821 A CN104826821 A CN 104826821A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Sorting Of Articles (AREA)
- Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Feeding Of Articles To Conveyors (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Mechanical Engineering (AREA)
- Specific Conveyance Elements (AREA)
- Computer Hardware Design (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- General Engineering & Computer Science (AREA)
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Abstract
The invention relates to a chip-type electronic component checking and classifying apparatus. With the chip-type electronic component checking ans sorting apparatus provided herein, the efficiency of the chip-type electronic component checking sorting apparatus of checking and classifying a tiny chip-type electronic component with high speed is improved and the decrease in the checking accuracy is inhibited to occur. The chip-type electronic component checking and classifying apparatus comprises a chip-type electronic component delivering round disc supported by a base station shaft in a rotary way, a component supply storage part that is sequentially set along the rotating path of the delivery round disc and that enables the chip-type electronic component to be supplied and stored in a through hole of the delivering round disc, a checking part of electric property of the chip-type electronic component, and a classifying part of checked chip-type electric component; the apparatus provided herein is characterized in that a chip-type electronic component removal unit is set between the rear end position of the chip-type electronic component supply storage part and the front end position of the checking part along the position of the rotating path of the delivering round disc so as to enable the chip-type electronic component with abnormal storage state in the through hole to be separate from the through hole.
Description
Technical field
The present invention relates to and the chip electronic parts possessing electrode in each of opposed end face are checked that its electrical characteristic checks selecting device based on this check result chip electronic parts sorting chip electronic parts of classifying subsequently.
Background technology
Along with the increase of the output of the small-sized electric products such as portable phone, smart phone, LCD TV, electronic game machine, the output being programmed into the small chip electronic parts of such electric product increases significantly.Chip electronic parts are generally formed by main part with at each electrode possessed of two opposed end faces of main part, and the small electronic units such as such as chip capacitor (also referred to as sheet capacitor), chip resistor (comprising chip rheostat) and chip inductor are widely utilized.
In recent years, the further miniaturization of the electric product be incorporated into corresponding to chip electronic parts and be programmed into the increase of quantity of chip electronic parts of electric product, the further miniaturization of chip electronic parts is in progress.Such as, about chip capacitor, in recent years, the capacitor of minimum size (such as, being called as the size of the 0.2mm × 0.2mm × 0.4mm of 0402 chip) is used.Small chip electronic parts like this lead to undergone mass production and a collection ofly to be produced with tens thousand of ~ hundreds thousand of such units.
In the electric product that chip electronic parts are incorporated into, generally in order to reduce result from chip electronic parts defect electric product percent defective and exhaustive test is carried out to a large amount of chip electronic parts manufactured.Such as, about chip capacitor, generally it is carried out totally to the inspection of the electrical characteristic such as static capacity, leakage current.
The inspection of the electrical characteristic of a large amount of chip electronic parts needs to carry out at high speed, as the device of the inspection for carrying out this high speed, in recent years, the inspection that general use possesses the electrical characteristic of the chip electronic parts of the conveyance disk (the interim holding plate of chip electronic parts) being formed with many open-works and sort device (after, be sometimes referred to as chip electronic parts check selecting device).At this conveyance disk, many open-works of the chip electronic parts of interim collecting check object are formed with the state of circumferentially being undertaken arranging by row or multiple row.Then, when these chip electronic parts check the use of selecting device, implement following operation: interim collecting chip electronic parts in the open-work of conveyance disk being in rotation status, to the chip electronic parts of this housed state, make the rotate path along this conveyance disk and the pair of electrodes terminal (inspection contact shoe) set up is contacted with each electrode of chip electronic parts to measure the electrical characteristic of the regulation of these chip electronic parts, subsequently, based on this measurement result, chip electronic parts are ejected to carry out sorting (or classification) in the mode of container of accommodating regulation from the open-work of conveyance disk.
That is, the inspection selecting device of chip electronic parts generally can be said into the chip electronic parts comprised as lower part and check selecting device: base station; Chip electronic part conveyance disk, supported by base station axle in revolvable mode, but each has the open-work of the chip electronic parts of electrode this chip electronic part conveyance disk is circumferentially formed with that two or more can be housed in opposed end face temporarily; And along the chip electronic parts supply resettlement section that the rotate path of this conveyance disk is arranged in order, electrical characteristic inspection portion and division, described chip electronic parts supply resettlement section makes chip electronic parts supply and is contained in the open-work of this conveyance disk, the inspection of the electrical characteristic of chip electronic parts is carried out in described electrical characteristic inspection portion, and described division is classified to the complete chip electronic parts of inspection based on check result.
Such as, when the inspection of static capacity carrying out chip capacitor, check that the detector that possesses of selecting device applies to have the inspection voltage of the frequency of regulation to chip capacitor via inspection terminal electrode by electrical characteristic inspection portion from chip electronic parts.Then, detect due to the applying of this inspection voltage at the current value of electric current that chip capacitor produces by detector, the magnitude of voltage based on this detection current value and inspection voltage carries out the inspection of the static capacity of the chip capacitor of check object.
Check the example of selecting device as aforesaid general chip electronic parts, the device described in patent document 1 can be enumerated.That is, in patent document 1, disclose and carry out testing (inspection) then according to the electric circuit part handler that result of the test is classified to electric circuit parts to many electric circuit parts (such as, chip electronic parts).This electric circuit part handler possesses: be provided with the breadboard (chip electronic part conveyance disk) of the plate-like of many parts platforms (open-work), the upside contact being configured at the position of each parts platform close to breadboard and downside contact (pair of electrodes terminal) and be electrically connected on the tester (detector) of each contact.Breadboard such as possesses the row of 72 row, 4 parts platforms (open-work) in the circumferential direction in the mode diametrically vacating interval wherein between the heart and outer peripheral edge each other.To rotate making this breadboard and under the state of having accommodated electric circuit parts at its parts platform, the multiple electric circuit parts being contained in the parts platform of each row being carried out the inspection of electric circuit parts as one group.
Check other example of selecting device as aforesaid general chip electronic parts, the device described in patent document 2 can be enumerated.That is, in patent document 2, the small parts supply carrying device of the inspection selecting device that can be programmed into chip electronic parts is disclosed.This small parts carrying device comprises the device as lower part: movable part, is configured with the many through holes of dispersion and the row in hole that form in the conveyance direction of part conveyance face said chip electronic parts in small parts i.e. this description; Parts absorbing unit, by make with the described through hole of the opposition side, part conveyance face of described movable part near air reduce pressure the small parts in transporting be adsorbed in part conveyance face to keep temporarily; Conveyance path lid, makes the open surface carrying out the space of accommodating be connected on described part conveyance face sliding freely to transport described small parts; And parts agitating unit, to described small parts winding-up, by being arranged at the nozzle in described conveyance path lid, the air after pressurizeing stirs the small parts in conveyance path lid.
Prior art document
Patent document
Patent document 1: Japanese Unexamined Patent Application Publication 2000-501174 publication
Patent document 2: Japanese Unexamined Patent Publication 2001-26318 publication.
Summary of the invention
The problem that invention will solve
When using the chip electronic parts with aforesaid various structure to check selecting device to implement the inspection/sort operation of chip electronic parts, first, while make chip electronic part conveyance disk (following, sometimes conveyance disk is only called) rotate off and on or continuously, while carry out supplying chip electronic unit and the operation of collecting by chip electronic parts supply resettlement section (hereinafter sometimes referred to simply as supply resettlement section) to the open-work being formed at conveyance disk.The supply housing operational of these chip electronic parts is such as undertaken by following method: to the surface supply chip electronic unit being in the conveyance disk under rotating, make chip electronic parts be contained in the method for open-work successively by the surface pivots acting on the conveyance disk of vane electronic unit of accommodating gravity to open-work subsequently; Or chip electronic parts are suspended in atmosphere with stirring, subsequently the chip electronic parts that left floating is attracted successively and be contained in the method etc. in open-work.
In order to the inspection carrying out chip electronic parts at high speed sorts, need to carry out at high speed to the small chip electronic parts of the open-work collecting (or assembling) being in the conveyance disk under rotating.But chip electronic parts need to be contained in the state of regulation to be in the conveyance disk under rotating.Herein, the state that is assembled substantially in parallel of the inwall of the state of the regulation side and open-work that mean chip electronic parts.By chip electronic parts are contained in open-work with the state of such regulation, even if thus in the stroke of the rotary motion of conveyance disk then, also chip electronic parts can be made not come off from open-work, and successfully carry out the contact with the inspection terminal electrode in inspection portion.Checking in selecting device at commercially available chip electronic parts, in order to successfully carry out supply and the collecting of the chip electronic parts of the open-work to the conveyance disk be under rotation, and having carried out accurate adjustment about this supply collecting condition in advance.But, the result of the high speed that the significant microminiaturization of chip electronic parts in recent years and inspection sort is, distinguish and checked in the supply collecting process of the chip electronic parts in selecting device at the chip electronic parts of reality, chip electronic parts are not contained in the open-work of conveyance disk fault with the state (that is, normal state) of regulation occurs with many frequency.As such with abnormal housed state (namely, abnormal housed state) chip electronic parts to the representational state of the assembling of open-work, can enumerate carry out in this manual described later like that, chip electronic parts are contained in the state of open-work with the state tilted.The chip electronic parts being contained in the open-work of conveyance disk with heeling condition come off from open-work sometimes in the rotating distance of conveyance disk then, in addition, exist to become and be difficult to the situation about contacting smoothly with the inspection terminal electrode in inspection portion of carrying out, should as a result, the inspection bringing the electrical characteristic of chip electronic parts sorts the efficiency of operation, the reduction of precision.
Thus, problem of the present invention is to provide and makes it possible to use the raising being required the efficiency sorting operation with the chip electronic parts inspection selecting device checking at a high speed and sort small chip electronic parts to the inspection realizing chip electronic parts, the improvement suppressing the generation of the reduction checking precision.
For solving the scheme of problem
The present inventor to solve the result of carrying out studying for the purpose of above-mentioned problem is, find by arranging the chip electronic parts removing unit making the abnormal chip electronic of the housed state in open-work parts depart from from open-work in the position of the rotate path along chip electronic part conveyance disk and solve above-mentioned problem the front position from the back-end location of chip electronic parts supply resettlement section to inspection portion, thus the present invention to be obtained.
Thus, the present invention is that a kind of chip electronic parts check selecting device, comprising: base station, chip electronic part conveyance disk, supported by base station axle in revolvable mode, but each has the open-work of the chip electronic parts of electrode this chip electronic part conveyance disk is circumferentially formed with that two or more can be housed in opposed end face temporarily, and along the chip electronic parts supply resettlement section that the rotate path of this conveyance disk is arranged in order, electrical characteristic inspection portion, and division, described chip electronic parts supply resettlement section makes chip electronic parts supply and is contained in the open-work of this conveyance disk, the inspection of the electrical characteristic of chip electronic parts is carried out in described electrical characteristic inspection portion, described division is classified to the complete chip electronic parts of inspection based on check result, described chip electronic parts check that the feature of selecting device is, from these chip electronic parts supply resettlement section back-end location to inspection portion front position and the chip electronic parts removing unit that the abnormal chip electronic parts of the housed state in open-work are departed from from open-work is set in the position of the rotate path along chip electronic part conveyance disk.
Below describe the preferred mode that chip electronic parts of the present invention check selecting device.
(1) above-mentioned chip electronic unit removing unit is the unit that the end of the abnormal chip electronic parts of the housed state be physically contacted with in open-work departs to make chip electronic parts from open-work.
(2) above-mentioned chip electronic unit removing unit is the rotating brush rotated along the direction contrary with the direction of rotation of chip electronic part conveyance disk.
(3) near above-mentioned chip electronic unit removing unit, the unit making the chip electronic parts departed from from open-work get back to chip electronic parts supply resettlement section is provided with.
Invention effect
The chip electronic parts of the application of the invention can check that selecting device realizes the high speed of the electrical characteristic of a large amount of small chip electronic parts and high-precision inspection sorts.
Accompanying drawing explanation
Fig. 1 is to illustrate the stereogram of the structure of the chip electronic parts of check object for chip capacitor.
Fig. 2 illustrates that chip electronic parts check the front elevation of an integrally-built example of selecting device.
Fig. 3 shows chip electronic parts and checks the chip electronic part conveyance disk of selecting device and supply resettlement section (supply collecting territory), electrical characteristic inspection portion (inspection territory) and electronic unit division (sorting field) at the rotate path of this conveyance disk along the chip electronic parts that its direction of rotation configures in order.
Fig. 4 is the sectional view of the front elevation of chip electronic part conveyance disk and the supporting construction of conveyance disk and its behind.
Fig. 5 shows front elevation and the side view of chip electronic parts supply resettlement section.Dotted line is depicted further, add in order to the internal structure that chip electronic parts supply resettlement section is shown.
Fig. 6 is the in-built figure that the bailing bucket (bucket) that chip electronic parts supply resettlement section possesses is shown, (a) is the in-built front elevation that bailing bucket is shown, (b) is the side cross-sectional views of bailing bucket.Further, also show the cross section of the side of the substrate (standard station) that conveyance disk possesses with the behind of conveyance disk in the side cross-sectional views of the bailing bucket of the latter.
Fig. 7 illustrates by the sectional view of chip electronic parts supply resettlement section to the state of the open-work supply and collecting chip electronic parts that transport disk, that is, illustrate and circumferentially arrange in arc-shaped on conveyance disk and accommodate in the open-work that configures and transport the figure of the state of chip electronic parts.Arrow illustrates the direction of rotation (moving direction of open-work) of conveyance disk.
Fig. 8 is the sectional view that the state being checked the electrical characteristic of the chip electronic parts of the open-work being contained in conveyance disk by inspection portion is shown.
Fig. 9 illustrates to discharge by division the open-work and the figure of the state of the chip electronic parts finished by the inspection of inspection portion that are contained in conveyance disk.
Figure 10 is the structure of rotating brush and the figure of work of the example as chip electronic parts removing unit illustrated according to the present invention the front position from the back-end location of chip electronic parts supply resettlement section to inspection portion and set by the position of the rotate path along chip electronic part conveyance disk.
Figure 11 is the stereogram of rotating brush.
Detailed description of the invention
Following while with reference to accompanying drawing while check that the structure example of selecting device is described about chip electronic parts of the present invention.Have again, according to a viewpoint, chip electronic parts of the present invention can be checked that selecting device says into the device that the chip electronic parts relating to general structure check the improvement of selecting device (checking sorter also referred to as chip electronic parts), therefore, first illustrate that the chip electronic parts in the past used check the structure example of selecting device with reference to Fig. 1 to Fig. 9 of accompanying drawing.
Fig. 1 be as the chip electronic parts of check object for general chip capacitor to illustrate the stereogram of its structure, chip electronic parts 19 comprise the capacitor main body 21 that is made up of dielectric and opposed pair of electrodes 22a, the 22b being arranged at its two ends.Common chip capacitor 19 is that pottery is used as dielectric chip ceramic capacitor.Further, add the layer of the installation of the various substrates be provided with to chip electronic parts on the surface of the electrode of common chip electronic parts.
As the typical example being checked the chip electronic parts that selecting device checks by chip electronic parts of the present invention, chip capacitor, chip resistor (comprising chip rheostat) and chip inductor can be enumerated.
The chip electronic parts of check object manufacture according to same specification, to illustrate the identical electrical characteristic of regulation.
Thus, the chip electronic parts of above-mentioned check object mostly are the parts that same manufacture is criticized, but mix the chip electronic parts of other batches in the chip electronic parts also can criticized in so same manufacture.But two chip electronic parts to manufacture batch generally manufacture (usually, using manufactured for the purpose of peddling as mutually the same product), to illustrate mutually the same electrical characteristic according to same specification.
Fig. 2 illustrates that chip electronic parts check the front elevation of the structure example of selecting device, and Fig. 3 shows chip electronic parts and checks the chip electronic part conveyance disk of selecting device and supply resettlement section (supply collecting territory), electrical characteristic inspection portion (inspection territory) and electronic unit division (sorting field) at the rotate path of this conveyance disk along the chip electronic parts that its direction of rotation configures in order.Further, the chip electronic parts of Fig. 2 check that selecting device is the device being arranged in the configuration of 6 row at conveyance disk along the many open-works of its circumference, the conveyance disk of Fig. 3 is the device being arranged in 3 row along many open-works of its circumference.(a) of Fig. 4 is the front elevation of the chip electronic part conveyance disk shown in Fig. 3, and (b) of Fig. 4 is the sectional view that conveyance disk and supporting construction behind thereof are shown.
Check in selecting device 10 at the chip electronic parts shown in Fig. 2, can accommodate chip electronic parts (such as temporarily, chip capacitor) plural open-work 11a on the surface of discoid material, circumferentially carry out the configuration that arranges and the chip electronic part conveyance disk (hereinafter sometimes referred to simply as conveyance disk) 11 that formed is supported by base station 41 axle in the mode can carrying out the rotation of the plane along disk.As shown in Figure 3, at the rotate path of conveyance disk 11, be set with the supply resettlement section (supply collecting territory) 101 of chip electronic parts, the inspection portion (inspection territory) 102 of chip electronic parts electrical characteristic and the division (sorting field) 103 of chip electronic parts.In inspection portion 102, possesses pair of electrodes terminal in the position of two opening portions of each open-work 11a of each row close to conveyance disk 11.Detector 14a, 14b are electrically connected on electrode terminal, and, possess the controller 15 being electrically connected on detector supplying the signal that check processing is correlated with to detector.Further, the chip electronic parts of check object enter into hopper 47, be supplied to conveyance disk 11 from chip electronic parts supply port 31 via bailing bucket (with reference to Fig. 5,6).
The open-work 11a of chip electronic part conveyance disk 11 usually in the surface configuration of conveyance disk in this concentrically ringed position of the first-class segmentation of multiple concentric circles.
In device 10 shown in the drawings, be provided with total 6 open-works diametrically arranged between the center and periphery of conveyance disk 11, the inspection of the electrical characteristic of chip electronic parts is carried out to 6 the chip electronic parts that often add up to being contained in each open-work.The quantity of the open-work diametrically arranged between the center and periphery of conveyance disk 11 is preferably in the scope of 2 ~ 20, is more preferably in the scope of 3 ~ 12.
Conveyance disk 11 arranges (fixing) in base station 41 in the mode can carrying out rotating via such as substrate (standard station) 45 and central shaft 42, by making rotating driving device 43 work being disposed in its rear side, the surrounding of central shaft 42 is rotated off and on.
By chip electronic parts supply resettlement section 101, the chip electronic parts of interim collecting check object in the open-work 11a of conveyance disk 11, for its electrical characteristic of inspection.
Show the detailed construction of chip electronic parts supply resettlement section 101 in fig. 5 and fig..Chip electronic parts supply resettlement section 101, also referred to as bailing bucket portion, is the region for making the open-work 11a being contained in conveyance disk 11 from outside by the chip electronic parts of chip electronic parts supply port 31 supply via bailing bucket 32.In fig. 5 and fig., bailing bucket 32 is formed to utilize spaced walls 33 to be separated for making chip electronic parts arrange the grooves of 3 row declined in arc-shaped with 3 as supplying the structure of chip electronic unit to the open-work group of 3 row being arranged at conveyance disk 11.Chip electronic parts that supplied by chip electronic parts supply port 31, that decline along spaced walls 33 in the inside of bailing bucket 32 are attracted by attracting via the gas being formed at substrate (standard station) 45 path 45a to be brought to the strong attraction of the open-work 11a of conveyance disk 11 and accommodate open-work 11a near the bottom of bailing bucket 32.Further, usually make rotating circular disk become inactive state to carry out attraction and the collecting of the open-work 11a of the conveyance plectane 11 to these chip electronic parts.
Fig. 7 shows chip electronic parts and attracts and the state of accommodating to the open-work 11a transporting disk 11.That is, the chip electronic parts 19 gathered near the bottom of bailing bucket 32 are attracted by attracting via the gas being formed at substrate (standard station) 45 path 45a to be brought to the strong attraction of the open-work 11a of conveyance disk 11 and accommodate open-work 11a.Have again, the chip electronic parts 19 gathered near the bottom of this bailing bucket 32 are to the attraction of open-work 11a with when accommodating, in order to successfully carry out attraction and the collecting of chip electronic parts, and preferably near the bottom of bailing bucket 32, be blown into air-flow from outside and suspend with stirring to make chip electronic parts 19.Like this Air blowing portion 37 illustrated in Fig. 6 such as can be utilized to carry out to being blown into of the air-flow from outside near the bottom of bailing bucket 32.
As mentioned above, substrate 45 is equipped with at the dorsal part of chip electronic part conveyance disk 11 or the rear side (being right side in the figure 7) of device.Be formed at substrate 45 and attract path 45a at multiple gases of the surface opening of the side of conveyance plectane 11 respectively.Each gas attracts path to be connected to the gas suction device 46 supplying strong attraction to open-work.When making gas suction device 46 work, gas attracts the gas in path 45 to be attracted by strong attraction, and the gap be formed between conveyance disk 11 and substrate 45 becomes decompression state.
When the direction shown in the arrow that conveyance disk 11 is charged to along Fig. 7 rotate off and on while via chip electronic parts supply port 31 and bailing bucket 32 to the surface supply chip electronic unit of conveyance disk and gas suction device 46 is worked make the gap between conveyance disk 11 and substrate 45 become decompression state time, chip electronic parts 19 are attracted and accommodates each of the open-work 11a transporting disk 11.
In rotary moving by the interval of above-mentioned conveyance disk 11, the chip electronic parts 19 being contained in the open-work 11a of conveyance disk 11 are sent to the inspection portion 102 shown in Fig. 2 and Fig. 3 subsequently.Have again, gap between conveyance disk 11 and substrate 45 until the chip electronic parts 19 that conveyance disk 11 carries out rotating and makes to be contained in open-work 11a move and then arrive division 103 to inspection portion 102, is all made into weak decompression state after completing to the collecting in the open-work 11a of chip electronic parts 19.Therefore, be contained in the chip electronic parts 19 of the open-work 11a of conveyance disk 11 until arrive division 103 by the rotation after conveyance disk 11 via inspection portion 102 by chip electronic parts supply resettlement section 101, all there is no situation about coming off from open-work 11a.
As shown in Figure 8, in order to chip electronic parts being electrically connected on the detector of its electrical characteristic, and be configured with pair of electrodes terminal 12a, 12b in the position of two opening portions of the open-work 11a close to conveyance disk 11 in inspection portion.
Electrode terminal 12a is fixed on substrate 45 via the cylindrical shell of the electrical insulating property be disposed in around it.The surface of the conveyance disk side of electrode terminal 12a and substrate 45 usually utilizes attrition process etc. and is made into level and smooth plane.
Electrode terminal 12b is fixed on electrode terminal support plate 53.
Electrode terminal support plate 53 is moved to the side of conveyance disk 11, thus, is also moved to the side of conveyance disk 11 by the electrode terminal 12b that electrode terminal support plate 53 supports simultaneously.By the movement of this electrode terminal 12b, chip electronic parts are sandwiched between electrode terminal 12a, 12b and become contact condition.Therefore, the electrode 22a of chip electronic parts is electrically connected on electrode terminal 12a, and electrode 22b is electrically connected on electrode terminal 12b.Thus, chip electronic parts are electrically connected on detector via pair of electrodes terminal 12a, 12b.
Have again, two opening portions " close position " of each open-work of the conveyance disk be configured with pair of electrodes terminal mean each electrode terminal when chip electronic parts are accommodated in each open-work and are electrically connected on the position of the electrode of each chip electronic parts, or can be electrically connected on the position of the electrode of chip electronic parts by making each electrode terminal move when each electrode terminal is made into mobile structure.
Then, in inspection portion 102, to along the diametric(al) of conveyance disk 11 be row the mode that arranges accommodate each of 6 chip electronic parts 19a, 19b, 19c, 19d, 19e, 19f of configuration, check the electrical characteristic specified.
Checked the chip electronic parts after electrical characteristic are then sent to the chip electronic parts shown in Fig. 2 and Fig. 3 division 103 by transporting the in rotary moving of the interval of disk 11.
As shown in Figure 9, the piping support lid 61 being formed with multiple open-work 61a in the face side of conveyance disk 11 or the front face side (being left side in fig .9) of device is equipped at division 103.The pipe 62 forming the drain passageway of chip electronic parts 19a is connected to each of the open-work 61a of piping support lid 61.Further, the part pipe among the pipe 62 that illustrate only each of the open-work 61a being connected to piping support lid 61 in fig. 2.
In addition, multiple gas feeding path 45b of the surface opening respectively in the side of conveyance disk 11 in the region of division 103 are formed at the substrate 45 of the rear side (being right side in fig .9) of the dorsal part or device that are configured at conveyance disk 11.Each gas feeding path 45b is connected to pressurized gas supply device 63.
When making pressurized gas supply device 63 work, supply gas-pressurized to gas feeding path 45b, the chip electronic parts 19a to the open-work 11a being contained in conveyance disk 11 sprays gas-pressurized.Thus, chip electronic parts are discharged to pipe 62.
Chip electronic parts 19 pass through the total being in most peripheral side 10 the open-work 61a be such as formed among multiple open-work 61a of the piping support lid 61 shown in Fig. 2.These 10 open-work 61a are connected to chip electronic parts accepting container 64 via pipe 62 respectively.
Thus, the chip electronic parts of being discharged by open-work at division 103 are contained in the electrical characteristic and predetermined chip electronic parts accepting container 64 of distinguishing based on the result checked via any one of total 10 pipes 62 of 10 the open-work 61a being connected to piping support lid 61.
Next, reference Figure 10 and Figure 11 is while explain the chip electronic parts removing unit of the characteristic structural as chip electronic parts selecting device of the present invention.
The figure that Figure 10 and Fig. 6 (b) is corresponding, shows conveyance disk 11, substrate 45 and the bailing bucket 32 in chip electronic parts supply resettlement section in the mode eliminating discreet portions.Further, accommodate (assembling) at the open-work 11a of conveyance disk 11 and have chip electronic parts.The arrow being logged into the top of figure shows the direction of rotation (being equivalent to the moving direction of open-work) of conveyance disk 11.Parts 19m, parts 19p and parts 19q among chip electronic parts that supply from bailing bucket 32, that be contained in open-work are assemblied in open-work with normal state, and parts 19n and parts 19r is assembled with abnormal state of affairs.In Fig. 10, show parts 19n to stroke and the state departed from from open-work by the contact that divides with the brush portion of the rotating brush (direction along arrow rotates) 34 as chip electronic parts removing unit.The chip electronic parts departed from from open-work directly or get back to bailing bucket 32 after the surface dropping to sloping platform 35 for the time being.Further, around rotating brush 34, be preferably previously provided with rotating brush lid 36 to prevent the dispersing of chip electronic parts of disengaging.Have again, in Fig. 10, the chip electronic parts that rotating brush 34 is configured in being contained in conveyance disk 11 are just contacted with such position, the end of chip electronic parts owing to transporting the rotation of disk 11 after chip electronic parts supply resettlement section is deviate from, and the position of such rotating brush 34 is preferred position.
Figure 11 is figure rotating brush 34 being depicted as stereogram.This rotating brush 34 is designed to utilize the chip electronic parts of the conveyance disk of the open-work with 6 row configured in concentric circles to check selecting device.Be preferably, the brush portion of rotating brush 34 divide each as shown in Figure 11 by the board-like material split by many gaps or set fiber that many short fibers are bonded to each other side by side and an end form.Be preferably, the viewpoint that the material of the brush portions being formed of soft of rotating brush 34 prevents according to electrostatic is especially formed by the material (such as, electric conductivity synthetic resin, metal wire, metal slivers) with electric conductivity.
" making the chip electronic parts removing unit that the abnormal chip electronic parts of the housed state in open-work depart from from open-work " of selecting device is checked, preferably Figure 10, rotating brush (particularly brush portion divides the rotating brush formed by the material with flexibility) as shown in Figure 11 as being arranged at chip electronic parts of the present invention.Namely, this is because, by using rotating brush (particularly brush portion divides the rotating brush formed by the material with flexibility), about the chip electronic parts being contained in open-work with normal state, open-work is remained in when not damaging the electrode of its end, on the other hand, easily cause and do not accommodate (assembling) in the reliable disengaging of the chip electronic parts of open-work with normal state.But, as chip electronic parts removing unit, plate object be made up of flexible material etc. can also be utilized to cause these chip electronic parts from the unit of the disengaging of open-work with the nose portion generation physical contact of " the abnormal chip electronic parts of the housed state in open-work ", or the method etc. of nose portion blowing gas stream to " the abnormal chip electronic parts of the housed state in open-work ".
Have again, in this manual, for described in patent document 2 configure chip electronic part conveyance disk in vertical direction and the device that works checks the explanation of structure of selecting device and the explanation as structure improved chip electronic parts removing unit provided by the present invention to describe chip electronic parts, but the chip electronic parts becoming object of the present invention check selecting device can certainly be as described in Patent Document 1, device that chip electronic part conveyance disk is supported by base station axle with the state tilted.Further, can carry out as structure improved chip electronic parts removing unit provided by the present invention distortion that those skilled in the art easily expect and be assemblied in chip electronic part conveyance disk and checked selecting device with the state tilted by the chip electronic parts that base station axle supports.
Description of reference numerals
10 chip electronic parts check selecting device
11 chip electronic part conveyance disks
11a open-work
19 chip electronic parts (chip capacitor)
19a, 19b, 19c chip electronic parts (chip capacitor)
19d, 19e, 19f chip electronic parts (chip capacitor)
21 capacitor main bodies
22a, 22b electrode
31 chip electronic parts supply ports
32 bailing buckets
33 spaced walls
34 rotating brushes
35 sloping platforms
36 rotating brush lids
41 base stations
42 central shafts
43 rotating driving devices
45 substrates (standard station)
101 chip electronic parts supply resettlement sections (supply collecting territory)
102 electrical characteristic inspection portions (inspection territory)
103 electronic unit divisions (sorting field).
Claims (4)
1. chip electronic parts check a selecting device, comprising:
Base station;
Chip electronic part conveyance disk, is supported by base station axle in revolvable mode, but each has the open-work of the chip electronic parts of electrode this chip electronic part conveyance disk is circumferentially formed with that two or more can be housed in opposed end face temporarily; And
Along the chip electronic parts supply resettlement section that the rotate path of this conveyance disk is arranged in order, electrical characteristic inspection portion and division, described chip electronic parts supply resettlement section makes chip electronic parts supply and is contained in the open-work of this conveyance disk, the inspection of the electrical characteristic of chip electronic parts is carried out in described electrical characteristic inspection portion, described division is classified to the complete chip electronic parts of inspection based on check result
Described chip electronic parts check that the feature of selecting device is, from these chip electronic parts supply resettlement section back-end location to inspection portion front position and in the position of the rotate path along chip electronic part conveyance disk, be provided with the chip electronic parts removing unit that the abnormal chip electronic parts of the housed state in open-work are departed from from open-work.
2. chip electronic parts according to claim 1 check selecting device, it is characterized in that, this chip electronic parts removing unit is the makes physical contact of abnormal chip electronic parts with the housed state in open-work and makes the unit that chip electronic parts depart from from open-work.
3. chip electronic parts according to claim 1 check selecting device, and wherein, this chip electronic parts removing unit is the rotating brush rotated along the direction contrary with the direction of rotation of chip electronic part conveyance disk.
4. chip electronic parts according to claim 1 check selecting device, wherein, make to get back to from the chip electronic parts of open-work disengaging the unit that chip electronic parts supply resettlement section being nearby provided with of this chip electronic parts removing unit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014022509A JP6312200B2 (en) | 2014-02-07 | 2014-02-07 | Chip capacitor inspection and sorting equipment |
| JP2014-022509 | 2014-02-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104826821A true CN104826821A (en) | 2015-08-12 |
| CN104826821B CN104826821B (en) | 2018-08-31 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510063513.1A Active CN104826821B (en) | 2014-02-07 | 2015-02-06 | Chip electronic component checks selecting device |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6312200B2 (en) |
| KR (1) | KR102233793B1 (en) |
| CN (1) | CN104826821B (en) |
| TW (1) | TWI640787B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107887288A (en) * | 2016-09-30 | 2018-04-06 | 慧萌高新科技有限公司 | The continuous inspection method of the electrical characteristics of chip electronic part |
| CN114200341A (en) * | 2020-08-28 | 2022-03-18 | 慧萌高新科技有限公司 | Device with roller electrode contact for checking sheet-like electronic component |
| CN117067505A (en) * | 2023-10-17 | 2023-11-17 | 成都宝利根创科电子有限公司 | Feeding device for sheet insert injection molding |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP7149249B2 (en) * | 2019-10-31 | 2022-10-06 | Ｔｏｗａ株式会社 | Transfer module, cutting device, and method for manufacturing cut product |
| JP7075139B2 (en) * | 2020-06-02 | 2022-05-25 | 株式会社ヒューモラボラトリー | Chip electronic component transfer disk for chip electronic component inspection and sorting equipment |
| CN114516539B (en) * | 2022-03-25 | 2024-04-30 | 江苏徐工工程机械研究院有限公司 | Workpiece clamping device and workpiece cleaning equipment |
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| CN117067505A (en) * | 2023-10-17 | 2023-11-17 | 成都宝利根创科电子有限公司 | Feeding device for sheet insert injection molding |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102233793B1 (en) | 2021-03-29 |
| KR20150093596A (en) | 2015-08-18 |
| TW201534936A (en) | 2015-09-16 |
| TWI640787B (en) | 2018-11-11 |
| JP2015147196A (en) | 2015-08-20 |
| CN104826821B (en) | 2018-08-31 |
| JP6312200B2 (en) | 2018-04-18 |
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