CN104777374B - DC gas insulated metal enclosed electric transmission line isolator surface charge measuring device - Google Patents
DC gas insulated metal enclosed electric transmission line isolator surface charge measuring device Download PDFInfo
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- CN104777374B CN104777374B CN201510221919.8A CN201510221919A CN104777374B CN 104777374 B CN104777374 B CN 104777374B CN 201510221919 A CN201510221919 A CN 201510221919A CN 104777374 B CN104777374 B CN 104777374B
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- Prior art keywords
- disc insulator
- speed camera
- surface charge
- sliding block
- separator
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- 230000005540 biological transmission Effects 0.000 title claims description 11
- 229910052751 metal Inorganic materials 0.000 title claims description 11
- 239000002184 metal Substances 0.000 title claims description 11
- 239000012212 insulator Substances 0.000 claims abstract description 38
- 239000013078 crystal Substances 0.000 claims abstract description 29
- 238000005259 measurement Methods 0.000 claims abstract description 22
- 239000000523 sample Substances 0.000 claims abstract description 21
- 238000009826 distribution Methods 0.000 claims abstract description 15
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 claims abstract description 14
- 238000009413 insulation Methods 0.000 claims abstract description 14
- 230000005697 Pockels effect Effects 0.000 claims abstract description 11
- 230000005684 electric field Effects 0.000 claims description 11
- 230000000694 effects Effects 0.000 claims description 9
- 230000007246 mechanism Effects 0.000 claims description 8
- 238000012360 testing method Methods 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 6
- 238000002474 experimental method Methods 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims description 4
- 238000013519 translation Methods 0.000 claims description 3
- 239000012528 membrane Substances 0.000 claims description 2
- 238000012545 processing Methods 0.000 claims description 2
- 229910052797 bismuth Inorganic materials 0.000 claims 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims 1
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 claims 1
- 235000012239 silicon dioxide Nutrition 0.000 claims 1
- 238000009825 accumulation Methods 0.000 abstract description 7
- 239000007787 solid Substances 0.000 abstract description 5
- 239000011810 insulating material Substances 0.000 abstract description 2
- DQUIAMCJEJUUJC-UHFFFAOYSA-N dibismuth;dioxido(oxo)silane Chemical compound [Bi+3].[Bi+3].[O-][Si]([O-])=O.[O-][Si]([O-])=O.[O-][Si]([O-])=O DQUIAMCJEJUUJC-UHFFFAOYSA-N 0.000 abstract 3
- 238000000034 method Methods 0.000 description 15
- 230000035508 accumulation Effects 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 229910002114 biscuit porcelain Inorganic materials 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- VMQPMGHYRISRHO-UHFFFAOYSA-N benzvalene Chemical group C1=CC2C3C1C32 VMQPMGHYRISRHO-UHFFFAOYSA-N 0.000 description 1
- OIQPTROHQCGFEF-UHFFFAOYSA-L chembl1371409 Chemical compound [Na+].[Na+].OC1=CC=C2C=C(S([O-])(=O)=O)C=CC2=C1N=NC1=CC=C(S([O-])(=O)=O)C=C1 OIQPTROHQCGFEF-UHFFFAOYSA-L 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
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- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
The invention belongs to high voltage direct current solid insulating material surface charge accumulation feature measurement technical field more particularly to a kind of direct current GIL disc insulator surface charge measuring devices based on Pockels effects, including:By He-Ne laser, polarisation separator, high-speed camera, 1/8 wave plate, bi silicate crystals, insulation vacuum tube, sliding block, shaft and insulating guide rod.When measurement, bismuth silicate probe is affixed on disc insulator surface, He-Ne laser sends out feux rouges, become elliptically polarized light through polarisation separator and 1/8 wave plate, light injects bismuth silicate probe, and generates reflection in the interface of bismuth silicate and disc insulator, it is again passed through 1/8 wave plate, right angle occurs in polarisation separator and is refracted into high-speed camera, measures light intensity distributions, the size of the quantity of electric charge is obtained after computer is handled.The measuring device is simple in structure, easy to operate, and effective measurement means are provided for disc insulator surface charge accumulation in researching DC GIL.
Description
Technical field
The invention belongs to high voltage direct current solid insulating material surface charge accumulation feature measurement technical field more particularly to one
DC gas insulated metal enclosed transmission line of electricity disc insulator surface charge measuring device of the kind based on Pockels effects.
Background technology
Gas-insulated metal closed power transmission line (GIL, Gas Insulated Metal Enclosed
Transmission Line) with transmission capacity is big, loss is small, capacitance is small, take up an area less, reliability is high, is suitable for adverse circumstances
The characteristics of, big in height above sea level drop, the occasion that landform, meteorological condition are severe or transmission line capability is big is widely applied.But mesh
Before, realize comercial operation is to exchange GIL, and direct current GIL could not but obtain scale application in Practical Project.Main cause
It is under DC voltage effect, the surface charge accumulation of supporting insulator is serious in direct current GIL, has distorted along face field distribution,
Reduce the withstanding voltage of insulator.Especially when HVDC Equipment polarity of voltage inverts, caused electric field distortion shadow
Sound is especially prominent.
Solve the problems, such as electric field distortion caused by direct current GIL surface charge accumulations, it is necessary first to accumulate to insulator surface
Poly- charge is accurately measured, to study charge buildup characteristic.Since the 1980s, scholars are directed to the problem exhibition
Extensive research is opened.The measurement method of surface charge includes at present:Bisque figure method, capacitance probe method, electrooptic effect method.
Dust figure method is colored solid (such as positively charged red Pb using certain electrifications3O4, electronegative white yellow
S) can and the charge of insulator surface adsorption effect this principle occurs, these special solid powders are sprayed at media table
When face, the charge polarity and charge point of dielectric surface can be judged according to the distribution of color of these solid powders of dielectric surface
Cloth.Its advantage is that it is convenient, intuitive, the disadvantage is that being unable to quantitatively characterizing surface charge, and during spraying dust, it may change and be situated between
The distribution of charges on matter surface.
Capacitance probe method is divided into two kinds of dynamic condenser probe method and direct capacitance probe method.Dynamic condenser probe method is by electrostatic signal
Dynamic Signal is converted into measure, can not have to consider influence of the preposition electric current of preamplifier to output signal.In order to
Improve the resolution ratio of measuring system, it is desirable that the capacitance of capacitance probe itself and the entrance capacitance value of measurement circuit are more steady
It is fixed, but this is difficult to realize during popping one's head in vibration at high speed.Dynamic condenser probe method is difficult to more complicated to shape exhausted simultaneously
Edge sublist face measures.Due to high input impedance in recent years, the development of the operational amplifier of low input bias current, dynamic condenser
Probe method is gradually suffered exit due to the limitation of its own.Direct capacitance probe method is current surface charge measurement field in the world
It is middle using wide method, principle is the insulator surface close to electrification by micro metal probe, due to electrostatic
Induction, probe also will electrification, measure its incude density of surface charge after can Inversion Calculation go out surface Charge density.Direct capacitance
The advantages of holding probe is simple and practicable.But the disadvantage is that metal probe may change close to rear insulator surface field distribution,
Measured surface charge density will be caused to change, be not directly available surface field or charge that people are most interested in.
It is difficult to realize on-line measurement in view of direct capacitance probe method, Kawasaki et al. proposed to utilize Pockels in 1991
(Pu Keersi) effect measurement barrier surface charge.Pockels effects, that is, linear electro-optic effect, for without symmetrical centre
For crystal, when at it in the electric field, refractive index variation it is proportional with added electric field strength, electric field less
It is obviously rendered when strong, thus can reflect electric field by measuring the variation of crystal refractive index under electric field action
Variation.
In conclusion bisque figure method and direct capacitance probe method can not all carry out direct current GIL insulator surface Accumulating charges
It is accurate to measure.The present invention is based on Pockels effects to design a set of disc insulator surface charge measuring device, is researching DC
GIL insulator surface charge accumulations provide a kind of new measurement means.
Invention content
The shortcomings that overcome the above-mentioned prior art, the present invention provides a kind of flow-through gas based on Pockels effects is exhausted
Edge metal closed power transmission line disc insulator surface charge measuring device, includes the experiment cavity of a cylinder, test cavity
It is outer at the top of body that external operating-controlling mechanism is housed, it tests and shaft is installed at cavity top center axis, it is horizontal equipped with insulation in the middle part of shaft
Guide rod, insulating guide rod can rotate around the shaft, and insulating guide rod one end is equipped with sliding block, and sliding block horizontal on insulating guide rod can slide, sliding
Insulation vacuum tube is housed vertically, insulation vacuum tube is sequentially arranged with laser, polarisation separator, 1/8 wave from the top to the bottom on block
Piece;Bi silicate crystals are popped one's head in;High-speed camera is secured by bolts on insulation vacuum tube, and is remained with Pianguan County's separator
In the same horizontal line, to ensure that emergent light is accurately captured;The coaxial left-hand thread of cavity bottom is tested to place as measurement target
Disc insulator, disc insulator top are sequentially installed with shading ring and high-field electrode from the bottom up;Sliding block is with shaft by outer
Portion's operating-controlling mechanism is controlled by stepper motor and gear, realize in test cavity body up and down, left and right translation and rotation, complete pair
The comprehensive measurement of disc insulator surface charge in DC gas insulated metal enclosed transmission line of electricity.
The bi silicate crystals thickness is 0.75mm~1mm.
The laser is He-Ne laser, sends out the feux rouges that wavelength is 651nm.
The polarisation separator is the cube being mutually bonded by the inclined-plane of two right-angle prisms, each prism hypotenuse/facet surfaces
On have multilayer dielectricity membrane coat.
The high-speed camera shooting speed is more than 1000 frames/second.
The high-speed camera is connected with computer, the light intensity distributions that computer is measured using high-speed camera, processing
Size and the distribution of the quantity of electric charge are obtained afterwards.
The beneficial effects of the present invention are:Design is easily achieved, easy to operate, is disc insulator in researching DC GIL
Surface charge accumulation provides effective measurement means.
Description of the drawings
Fig. 1 is that a kind of direct current GIL disc insulators surface charge measurement based on Pockels effects provided by the invention is former
Manage schematic diagram;
Fig. 2 is a kind of direct current GIL disc insulator surface charge measurements dress based on Pockels effects provided by the invention
Set structural schematic diagram;
Wherein:1- He-Ne lasers;2- polarisation separators;3- high-speed cameras;Wave plate;5- bi silicate crystals are visited
Head;6- insulation vacuum tubes;7- insulating guide rods;8- shafts;9- sliding blocks;10- tests cavity;11- disc insulators;12- shading rings;
13- high-field electrodes;Operating-controlling mechanism outside 14-.
Specific implementation mode
Below in conjunction with the accompanying drawings, preferred embodiment is described in detail.
The operation principle of the present invention is as shown in Figure 1, be described as follows:
When the optical axis of the crystal medium without symmetrical centre and the optical axis of incident light are identical, and optical vibration direction and crystal
When the angle at 45 ° of principal oscillation direction, according to Pockels effects, the field distribution E of crystal is acted onzThe size of (x, y) and the electric field
The lower crystal of effect, which generates birefringent polarisation phase difference θ, relationship below:
Wherein λ indicates the wavelength of incident light;n0Indicate the refractive index of ordinary light in crystal;γ41Indicate the Pu Keer of crystal
This constant;D indicates the thickness of crystal.The measurement of the phase difference value can be exchanged into the measurement of light intensity.From physical optics it is found that when one
When beam elliptically polarized light incidence, the intensity distribution Δ I (x, y) and the relationship of phase difference that detect light are represented by:
Using the fairly obvious crystal of Pockels effect, when being close to electrically charged insulator surface on one side, if absolutely
When edge sublist face accumulates charge σ (x, y), corresponding field distribution E will be generated in bi silicate crystalsz(x, y), therefore σ and E
Relationship is represented by:
Wherein, ε0For the dielectric constant in vacuum;εrFor the relative dielectric constant of crystal.
When the elliptically polarized light that a branch of phase difference is π/4 is incident on crystal, incident polarised light is in crystal and insulator
Interface generate reflection, be again passed through crystal, at this time since surface charge generates the effect of electric field, according to Pockels effect,
It is 2 Δ θ (x, y) that the phase difference of emergent light, which increases, can be obtained:
As can be seen from the above equation, as long as measuring light intensity distributions may know that distribution of charges.
As shown in Fig. 2, the device of the invention structure is as follows:He-Ne laser 1, polarisation separator 2, high-speed camera 3,1/
8 wave plates 4, bi silicate crystals 5 are fixedly mounted on insulation vacuum tube 6, together constitute the core cell of measuring device.High speed is taken the photograph
Camera 3 is secured by bolts on insulation vacuum tube 6, and is remained in the same horizontal line with Pianguan County's separator 2, to ensure
Emergent light is accurately captured.Insulation vacuum tube 6 is installed on by sliding block 9 on insulating guide rod 7.At 7 middle part of insulating guide rod by shaft 8
It is fixed on 10 top of experiment cavity.Sliding block 9 is controlled by external operating-controlling mechanism 14 by stepper motor and gear with shaft 8, can
Realize in the cavity up and down, left and right translation and rotation, complete comprehensive measurement to disc insulator surface charge.Test cavity
Shading ring 12 and high-field electrode 13 are also equipped in body 10, bottom is as the disc insulator 11 for measuring target.Swashed by He-Ne
The measurement that light device 1, polarisation separator 2,3,1/8 wave plate 4 of high-speed camera, bi silicate crystals 5 and insulation vacuum tube 6 collectively form
Device core cell is installed in the experiment cavity 10 of sealing, for measuring disc insulator surface charge distribution in direct current GIL
Situation.
Certain DC voltage is applied on high-field electrode 13, under DC voltage effect, 11 surface of disc insulator
There is charge buildup.Before measurement, the DC voltage is disconnected, shaft 8 and sliding block 9 are controlled by external operating-controlling mechanism 14, keep insulation true
Bi silicate crystals probe 5 on blank pipe 6 is close to 11 a certain surface of disc insulator.At this point, will by the electric field that surface charge generates
It acts in bi silicate crystals probe 5, its refractive index is made to change.1 power supply of He-Ne laser is opened, the feux rouges warp sent out
2 rear portion of polarisation separator reflects in people's high-speed camera 3, another beam direct projection such as bi silicate crystals 5 after 1/8 wave plate 4.
The incident light reflects on 11 surface of disc insulator, and reflected light backtracking occurs deviation in Pianguan County's separator 2, penetrates
Enter in high speed camera 3.High-speed camera 3 exports collected intensity signal into computer, and it is exhausted can to calculate benzvalene form
The charge density of edge 11.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
Any one skilled in the art in the technical scope disclosed by the present invention, the change or replacement that can be readily occurred in,
It should be covered by the protection scope of the present invention.Therefore, protection scope of the present invention should be with scope of the claims
Subject to.
Claims (1)
1. a kind of DC gas insulated metal enclosed transmission line of electricity disc insulator surface charge measurement based on Pockels effects
Device, which is characterized in that include the experiment cavity of a cylinder, experiment cavity top is outer to be equipped with external operating-controlling mechanism, experiment
Shaft is installed, level is equipped with insulating guide rod in the middle part of shaft, and insulating guide rod can rotate around the shaft, insulate at cavity top center axis
Guide rod is equipped with sliding block, and sliding block horizontal on insulating guide rod can slide, and insulation vacuum tube is housed vertically, insulate vacuum on sliding block
Pipe is sequentially arranged with laser, polarisation separator, 1/8 wave plate from the top to the bottom;Bi silicate crystals are popped one's head in;High-speed camera passes through
Bolt is fixed on insulation vacuum tube, and is remained in the same horizontal line with Pianguan County's separator, to ensure that emergent light is accurate
Really capture;It tests the coaxial left-hand thread of cavity bottom to place as the disc insulator for measuring target, disc insulator top is from lower past
On be sequentially installed with shading ring and high-field electrode;Sliding block passes through stepper motor and gear control with shaft by external operating-controlling mechanism
System, realize in test cavity body up and down, left and right translation and rotation, complete in DC gas insulated metal enclosed transmission line of electricity
The comprehensive measurement of disc insulator surface charge;
Certain DC voltage is applied on high-field electrode, under DC voltage effect, there is charge product on disc insulator surface
It is poly-;Before measurement, the DC voltage is disconnected, shaft and sliding block are controlled by external operating-controlling mechanism, make the silicic acid on insulation vacuum tube
Bismuth crystal probe is close to a certain surface of disc insulator;At this point, the electric field generated by surface charge will act on bi silicate crystals
In probe, its refractive index is made to change;He-Ne laser power supply is opened, the feux rouges sent out is through polarisation separator rear portion
It is refracted into high-speed camera, the direct projection after 1/8 wave plate of another beam enters bi silicate crystals;The incident light is in disc insulator
Surface is reflected, reflected light backtracking, and deviation occurs in Pianguan County's separator, is injected in high speed camera, high-speed camera
Machine exports collected intensity signal into computer, can calculate the disc insulator charge density;
The bi silicate crystals thickness is 0.75mm~1mm;
The laser is He-Ne laser, sends out the feux rouges that wavelength is 651nm;
The polarisation separator is the cube being mutually bonded by the inclined-plane of two right-angle prisms, is had on each prism hypotenuse/facet surfaces
Multilayer dielectricity membrane coat;
The high-speed camera shooting speed is more than 1000 frames/second;
The high-speed camera is connected with computer, the light intensity distributions that computer is measured using high-speed camera, after processing
Go out size and the distribution of the quantity of electric charge.
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2015
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JPH01191069A (en) * | 1988-01-27 | 1989-08-01 | Mitsubishi Electric Corp | Surface charge measuring instrument |
CN1924593A (en) * | 2006-07-14 | 2007-03-07 | 华北电力大学 | DC electric filed detection method of insulator for high-voltage DC transmission line |
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