CN104639082B - 振荡器的制造方法、电路装置的制造方法以及电路装置 - Google Patents

振荡器的制造方法、电路装置的制造方法以及电路装置 Download PDF

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Publication number
CN104639082B
CN104639082B CN201410642396.XA CN201410642396A CN104639082B CN 104639082 B CN104639082 B CN 104639082B CN 201410642396 A CN201410642396 A CN 201410642396A CN 104639082 B CN104639082 B CN 104639082B
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China
Prior art keywords
terminal
oscillator
mode
electrically connected
action
Prior art date
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Expired - Fee Related
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CN201410642396.XA
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English (en)
Chinese (zh)
Other versions
CN104639082A (zh
Inventor
石川匡亨
板坂洋佑
山本壮洋
福泽晃弘
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Seiko Epson Corp
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Seiko Epson Corp
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Expired - Fee Related legal-status Critical Current
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/05—Holders; Supports
    • H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
    • H03H9/0547—Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a vertical arrangement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
    • H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
CN201410642396.XA 2013-11-11 2014-11-07 振荡器的制造方法、电路装置的制造方法以及电路装置 Expired - Fee Related CN104639082B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-233039 2013-11-11
JP2013233039A JP6344544B2 (ja) 2013-11-11 2013-11-11 発振器の製造方法、半導体回路装置の製造方法及び半導体回路装置

Publications (2)

Publication Number Publication Date
CN104639082A CN104639082A (zh) 2015-05-20
CN104639082B true CN104639082B (zh) 2019-02-01

Family

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Family Applications (1)

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CN201410642396.XA Expired - Fee Related CN104639082B (zh) 2013-11-11 2014-11-07 振荡器的制造方法、电路装置的制造方法以及电路装置

Country Status (3)

Country Link
US (1) US9246469B2 (ja)
JP (1) JP6344544B2 (ja)
CN (1) CN104639082B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7234656B2 (ja) 2019-01-29 2023-03-08 セイコーエプソン株式会社 発振回路、発振器、電子機器及び移動体
JP7310180B2 (ja) 2019-03-15 2023-07-19 セイコーエプソン株式会社 回路装置、発振器、電子機器及び移動体

Citations (4)

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CN1187716A (zh) * 1997-01-07 1998-07-15 佑华微电子股份有限公司 可自动选用内、外振荡电阻的单晶片振荡产生器
JP2001217650A (ja) * 2000-02-01 2001-08-10 Toyo Commun Equip Co Ltd 圧電発振器
JP2004120293A (ja) * 2002-09-26 2004-04-15 Kyocera Corp 水晶発振器の検査方法
CN101199110A (zh) * 2005-06-14 2008-06-11 吉川工业株式会社 压电振荡器、具有该压电振荡器的通信设备及电子设备

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US5126695A (en) * 1989-06-14 1992-06-30 Seiko Epson Corporation Semiconductor integrated circuit device operated with an applied voltage lower than required by its clock oscillator
TW255052B (ja) * 1992-11-03 1995-08-21 Thomson Consumer Electronics
US5369377A (en) * 1993-10-13 1994-11-29 Zilog, Inc. Circuit for automatically detecting off-chip, crystal or on-chip, RC oscillator option
JP2001007648A (ja) 1999-06-18 2001-01-12 Toyo Commun Equip Co Ltd 圧電発振器
JP2001094347A (ja) 1999-09-24 2001-04-06 Meidensha Corp 水晶発振器及びその発振器における水晶振動子のドライブ特性測定方法
JP2001102870A (ja) 1999-09-30 2001-04-13 Meidensha Corp 水晶発振器
JP3681611B2 (ja) * 2000-04-06 2005-08-10 Ｎｅｃエレクトロニクス株式会社 マイクロコンピュータ
JP2004214799A (ja) 2002-12-27 2004-07-29 Daishinku Corp 圧電発振器および圧電発振器の測定方法
JP4321104B2 (ja) 2003-04-25 2009-08-26 エプソントヨコム株式会社 圧電発振器および圧電発振器の製造方法
JP2006025336A (ja) * 2004-07-09 2006-01-26 Epson Toyocom Corp 圧電発振器とその調整方法
US7378780B2 (en) * 2005-11-09 2008-05-27 Nihon Dempa Kogyo Co., Ltd. Surface mount type crystal oscillator
JP2008187578A (ja) * 2007-01-31 2008-08-14 Epson Toyocom Corp 半導体集積回路、圧電発振器、および特性測定方法
US7626436B2 (en) * 2007-02-12 2009-12-01 Standard Microsystems Corporation Automatic system clock detection system
JP5144166B2 (ja) 2007-08-10 2013-02-13 京セラクリスタルデバイス株式会社 圧電発振器
JP2009164691A (ja) * 2007-12-28 2009-07-23 Nippon Dempa Kogyo Co Ltd 表面実装用の水晶発振器
JP5300425B2 (ja) 2008-01-25 2013-09-25 日本電波工業株式会社 表面実装用の水晶発振器
JP2010062959A (ja) 2008-09-05 2010-03-18 Daishinku Corp 表面実装型圧電発振器およびその特性測定方法
US8143961B2 (en) * 2010-03-30 2012-03-27 Silicon Laboratories Inc. Technique for detecting crystals
US8461934B1 (en) * 2010-10-26 2013-06-11 Marvell International Ltd. External oscillator detector
DE102010050314B4 (de) * 2010-11-05 2018-02-15 Texas Instruments Deutschland Gmbh Automatische Testausrüstung zum Testen eines Schwingkristalls und Verfahren zum Betreiben derselben
US9112449B2 (en) * 2012-11-15 2015-08-18 Mediatek Inc. Self-powered crystal oscillator and method of generating oscillation signal

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1187716A (zh) * 1997-01-07 1998-07-15 佑华微电子股份有限公司 可自动选用内、外振荡电阻的单晶片振荡产生器
JP2001217650A (ja) * 2000-02-01 2001-08-10 Toyo Commun Equip Co Ltd 圧電発振器
JP2004120293A (ja) * 2002-09-26 2004-04-15 Kyocera Corp 水晶発振器の検査方法
CN101199110A (zh) * 2005-06-14 2008-06-11 吉川工业株式会社 压电振荡器、具有该压电振荡器的通信设备及电子设备

Also Published As

Publication number Publication date
JP6344544B2 (ja) 2018-06-20
JP2015095709A (ja) 2015-05-18
US9246469B2 (en) 2016-01-26
CN104639082A (zh) 2015-05-20
US20150130547A1 (en) 2015-05-14

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