CN104081174B - 半导体发光元件用的发光量推定装置以及发光量推定方法 - Google Patents
半导体发光元件用的发光量推定装置以及发光量推定方法 Download PDFInfo
- Publication number
- CN104081174B CN104081174B CN201280068743.1A CN201280068743A CN104081174B CN 104081174 B CN104081174 B CN 104081174B CN 201280068743 A CN201280068743 A CN 201280068743A CN 104081174 B CN104081174 B CN 104081174B
- Authority
- CN
- China
- Prior art keywords
- light
- emitting elements
- semiconductor light
- luminous quantity
- luminous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims description 56
- 238000009826 distribution Methods 0.000 claims description 85
- 239000000284 extract Substances 0.000 claims description 5
- 230000010354 integration Effects 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 abstract description 15
- 238000010586 diagram Methods 0.000 description 31
- 239000000523 sample Substances 0.000 description 17
- 238000009792 diffusion process Methods 0.000 description 12
- 238000005259 measurement Methods 0.000 description 7
- 238000003860 storage Methods 0.000 description 5
- 230000015556 catabolic process Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 238000012886 linear function Methods 0.000 description 4
- 238000004020 luminiscence type Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000011796 hollow space material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0266—Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Led Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2012/057225 WO2013140556A1 (ja) | 2012-03-21 | 2012-03-21 | 半導体発光素子用の発光量推定装置及び発光量推定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104081174A CN104081174A (zh) | 2014-10-01 |
CN104081174B true CN104081174B (zh) | 2016-02-10 |
Family
ID=49222050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201280068743.1A Expired - Fee Related CN104081174B (zh) | 2012-03-21 | 2012-03-21 | 半导体发光元件用的发光量推定装置以及发光量推定方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5779711B2 (zh) |
CN (1) | CN104081174B (zh) |
WO (1) | WO2013140556A1 (zh) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62211538A (ja) * | 1986-03-12 | 1987-09-17 | Oki Electric Ind Co Ltd | 半導体発光素子の発光特性測定方法 |
JP4771346B1 (ja) * | 2010-12-07 | 2011-09-14 | パイオニア株式会社 | 半導体検査装置 |
JP2011216794A (ja) * | 2010-04-01 | 2011-10-27 | Sharp Corp | 発光測定装置および発光測定方法、制御プログラム、可読記録媒体 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62175640A (ja) * | 1986-01-29 | 1987-08-01 | Sharp Corp | 発光素子光分布特性測定装置 |
JPS6438617A (en) * | 1987-08-04 | 1989-02-08 | Yaskawa Denki Seisakusho Kk | Measuring apparatus of light distribution |
JPH0613461Y2 (ja) * | 1989-05-12 | 1994-04-06 | 株式会社安川電機 | 光分布測定装置 |
JP4061822B2 (ja) * | 2000-06-26 | 2008-03-19 | 松下電工株式会社 | 赤外線モジュールの特性測定方法 |
JP2008076142A (ja) * | 2006-09-20 | 2008-04-03 | Seiko Epson Corp | 光量測定装置および光量測定方法 |
JP2011214885A (ja) * | 2010-03-31 | 2011-10-27 | Konica Minolta Opto Inc | 輝度分布測定装置 |
CN102686990A (zh) * | 2010-11-30 | 2012-09-19 | 日本先锋公司 | 发光元件用光接收模块及发光元件用检查装置 |
-
2012
- 2012-03-21 CN CN201280068743.1A patent/CN104081174B/zh not_active Expired - Fee Related
- 2012-03-21 WO PCT/JP2012/057225 patent/WO2013140556A1/ja active Application Filing
- 2012-03-21 JP JP2014505886A patent/JP5779711B2/ja active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62211538A (ja) * | 1986-03-12 | 1987-09-17 | Oki Electric Ind Co Ltd | 半導体発光素子の発光特性測定方法 |
JP2011216794A (ja) * | 2010-04-01 | 2011-10-27 | Sharp Corp | 発光測定装置および発光測定方法、制御プログラム、可読記録媒体 |
JP4771346B1 (ja) * | 2010-12-07 | 2011-09-14 | パイオニア株式会社 | 半導体検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2013140556A1 (ja) | 2015-08-03 |
JP5779711B2 (ja) | 2015-09-16 |
CN104081174A (zh) | 2014-10-01 |
WO2013140556A1 (ja) | 2013-09-26 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Co-patentee after: PIONEER FA Corp. Patentee after: PIONEER Corp. Address before: Kanagawa Co-patentee before: Pioneer Fa Corp. Patentee before: PIONEER Corp. |
|
CP02 | Change in the address of a patent holder | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Tokyo, Japan Co-patentee after: PFA Co. Patentee after: PIONEER Corp. Address before: Tokyo, Japan Co-patentee before: Pioneer Fa Corp. Patentee before: PIONEER Corp. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180827 Address after: Tokyo, Japan Co-patentee after: PFA Co. Patentee after: SHINKAWA Ltd. Address before: Tokyo, Japan Co-patentee before: PFA Co. Patentee before: PIONEER Corp. |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160210 Termination date: 20190321 |