CN103424601B - A kind of voltage detecting circuit - Google Patents
A kind of voltage detecting circuit Download PDFInfo
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- CN103424601B CN103424601B CN201310366630.6A CN201310366630A CN103424601B CN 103424601 B CN103424601 B CN 103424601B CN 201310366630 A CN201310366630 A CN 201310366630A CN 103424601 B CN103424601 B CN 103424601B
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Abstract
The invention provides a kind of voltage detecting circuit, it comprises: bleeder circuit, buffer circuit, comparative voltage produce circuit, comparator circuit.Circuit is produced by the sample voltage signal after supply voltage dividing potential drop is transferred to comparative voltage through a buffer circuit, and produce in circuit at comparative voltage and produce two comparative voltage signals, compare two voltage comparison signals by a comparator circuit again and export a logical signal, thus achieve the detection to supply voltage.In voltage detecting circuit of the present invention, without the need to additionally adding reference voltage generating circuit, structure is simple, and the trip point of its comparator circuit is by the impact of the electric current in divider resistance and temperature, only relevant with supply voltage, overcome conventional voltage testing circuit by the extraneous impact providing the matching degree factor of reference voltage precision and divider resistance ratio, thus improve the precision of voltage detecting circuit detection.
Description
Technical Field
The invention relates to the field of integrated circuits, in particular to a voltage detection circuit.
Background
In an integrated circuit system, when a supply voltage introduced from the outside of a chip is insufficient, the chip may not operate normally. Therefore, a voltage detection circuit is generally added in the chip to detect the power supply voltage and output a corresponding logic signal to make the chip enter a corresponding state, so as to ensure the normal operation of the chip.
In a voltage detection circuit in the prior art, a comparison circuit is generally used to directly compare a supply voltage with a reference voltage, so as to obtain a corresponding logic signal to detect the voltage and enable a system to enter a corresponding state.
Referring to fig. 1, a conventional voltage detection circuit is shown, in which a power supply voltage VDD in a voltage divider 102 is divided by resistors R1 and R2, a divided voltage sampling signal VIN is provided to a non-inverting input terminal of a comparator 103, a reference voltage VREF generated by a reference voltage generating circuit 101 is provided to an inverting input terminal of the comparator 103, the comparator 103 compares VIN with VREF and outputs a logic signal, and a latch 104 outputs a control signal MRK, thereby detecting the power supply voltage.
In the voltage detection circuit, the ratio of the voltage dividing resistors R1 and R2 and the accuracy of the reference voltage detection value generated by the reference voltage generation circuit have a great influence on the accuracy of the voltage detection circuit. In order to make the voltage detection circuit have high detection accuracy, it is necessary to provide a reference voltage having high accuracy and a voltage dividing resistance ratio having high accuracy. However, even under the condition that the reference voltage reaches a sufficiently high precision, the mismatch of the ratio of the voltage dividing resistors caused by the influence of the process, the environmental temperature and the like can affect the precision of the detection circuit. Therefore, how to solve the problem of low detection accuracy of the voltage detection circuit is a problem to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a voltage detection circuit to solve the problem that in the prior art, the voltage detection circuit is influenced by the accuracy of reference voltage provided by the outside and the matching degree of the ratio of voltage-dividing resistors, so that the detection accuracy is not high when the power supply voltage is detected.
In order to solve the above technical problem, the present invention provides a voltage detection circuit, including: the voltage divider circuit, the isolation circuit, the comparison voltage generating circuit and the comparison circuit are connected in sequence;
the voltage division circuit is used for dividing the power supply voltage to obtain a sample voltage representing the power supply voltage;
the isolation circuit is used for receiving the sample voltage, generating a mirror voltage equivalent to the sample voltage and simultaneously isolating the current in the voltage division circuit from flowing to the comparison voltage generation circuit;
the comparison voltage generation circuit is used for receiving the mirror image voltage and generating a first voltage and a second voltage as two comparison voltages;
the comparison circuit is used for receiving two comparison voltages of the first voltage and the second voltage and generating a logic signal.
Optionally, in the voltage detection circuit, the voltage dividing circuit includes a first resistor and a second resistor, the first resistor and the second resistor are connected in series between the supply voltage and ground, and a voltage at a connection point of the first resistor and the second resistor is the sample voltage.
Optionally, in the voltage detection circuit, the isolation circuit is an operational amplifier, a non-inverting input terminal of the operational amplifier is connected to a connection point of the first resistor and the second resistor, and is configured to receive the sample voltage, an output terminal of the operational amplifier is connected to an inverting input terminal of the operational amplifier, and a voltage at the output terminal of the operational amplifier is the mirror voltage.
Optionally, in the voltage detection circuit, the comparison voltage generation circuit is formed by connecting a first branch and a second branch in parallel, one end of a parallel node of the two branches is connected to the output end of the isolation circuit, and the other end of the parallel node of the two branches is grounded.
Optionally, in the voltage detection circuit, the first branch includes: the base electrode of the first triode is connected with the collector electrode of the first triode, the emitting electrode of the first triode is connected to the ground, and the voltage at the node where the third resistor is connected with the first triode is the first voltage;
the second branch circuit includes: the circuit comprises a fourth resistor, a fifth resistor and a second triode, wherein one end of the fourth resistor is connected with the output end of the operational amplifier, the other end of the fourth resistor is connected with one end of the fifth resistor, the other end of the fifth resistor is connected with the collector of the second triode, the base of the second triode is connected with the collector of the second triode, the emitter of the second triode is connected with the ground, and the voltage at the node where the fourth resistor is connected with the fifth resistor is the second voltage.
Optionally, in the voltage detection circuit, the first triode and the second triode are both NPN-type triodes.
Optionally, in the voltage detection circuit, an emitter area of the second triode is larger than an emitter area of the first triode.
Optionally, in the voltage detection circuit, the comparison circuit is a comparator, a non-inverting input terminal of the comparator is connected to a junction between the third resistor and the first triode in the first branch circuit, and is configured to receive the first voltage, and an inverting input terminal of the comparator is connected to a junction between the fourth resistor and the fifth resistor in the second branch circuit, and is configured to receive the second voltage.
Optionally, the voltage detection circuit further includes an inverter, where the inverter is connected to an output end of the comparator, and is configured to receive the logic signal generated by the comparator and generate an under-voltage locking signal.
Optionally, in the voltage detection circuit, the inverter is a schmitt inverter.
The voltage detection circuit provided by the invention transmits the sample voltage signal after the power supply voltage is divided to the comparison voltage generation circuit through the isolation circuit, generates two comparison voltage signals in the comparison voltage generation circuit, and outputs a logic signal by comparing the two comparison voltage signals through the comparison circuit, thereby realizing the detection of the power supply voltage. In the voltage detection circuit, a reference voltage generation circuit is not required to be additionally arranged, the structure is simple, the trip point of the comparison circuit is not influenced by the current and the temperature in the divider resistor and is only related to the power supply voltage, the influence of the external reference voltage precision and the matching factor of the ratio of the divider resistor on the traditional voltage detection circuit is overcome, and the detection precision of the voltage detection circuit is improved. In addition, the circuit can also realize the detection of different voltages by adjusting the ratio of the two voltage-dividing resistors, and is easy to apply to different circuits.
Drawings
FIG. 1 is a schematic diagram of a conventional voltage detection circuit;
FIG. 2 is a schematic diagram of a voltage detection circuit according to a preferred embodiment of the present invention
Detailed Description
The voltage detection circuit according to the present invention will be described in detail with reference to the accompanying drawings and specific embodiments. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
The invention relates to a voltage detection circuit, which transmits a sample voltage signal after the voltage division of a power supply voltage to a comparison voltage generation circuit through an isolation circuit, generates two comparison voltage signals in the comparison voltage generation circuit, and outputs a logic signal by comparing the two comparison voltage signals through a comparison circuit, thereby realizing the detection of the power supply voltage. The voltage detection circuit designed by the invention does not need to additionally add a reference voltage generation circuit, has a simple structure, and the trip point of the comparison circuit is not influenced by the current and the temperature in the voltage dividing resistor and is only related to the power supply voltage, thereby overcoming the influence of the external reference voltage precision and the matching factor of the voltage dividing resistor ratio on the traditional voltage detection circuit and further overcoming the defect of low detection precision of the voltage detection circuit.
The invention is further described with reference to the drawings and the preferred embodiments.
Please refer to fig. 2, which is a schematic structural diagram of a voltage detection circuit according to a preferred embodiment of the invention. As shown in fig. 2, the voltage detection circuit includes: a voltage divider circuit 20, an isolation circuit 21, a comparison voltage generation circuit 22, and a comparison circuit 23 connected in this order.
The voltage divider circuit 20 is composed of a first resistor Ra and a second resistor Rb, and is configured to obtain a sample voltage representing a supply voltage from the supply voltage VDD. The first resistor Ra and the second resistor Rb are connected in series between the supply voltage VDD and ground, and divide the supply voltage VDD to output a supply voltage sample voltage V1.
The isolation circuit 21 is composed of an operational amplifier OP1, and is used for receiving the sample voltage V1 to generate a mirror voltage V2 having the same value as the sample voltage V1, and simultaneously isolating the current in the voltage divider circuit 20 from flowing to the comparison voltage generation circuit 22. The non-inverting input terminal of the operational amplifier OP1 is connected to the junction of the first resistor Ra and the second resistor Rb in the voltage divider circuit 20, and is configured to receive the sample voltage V1, the output terminal of the operational amplifier OP1 is connected to the inverting input terminal of the operational amplifier OP1, and the voltage at the output terminal of the operational amplifier is the mirror voltage V2.
The comparison voltage generation circuit 22 is formed by connecting a first branch and a second branch in parallel, and is configured to receive the mirror voltage V2 and generate a first voltage Va and a second voltage Vb as two comparison voltages. One end of the parallel node of the two branches is connected with the output end of the isolation circuit 21 and used for receiving the mirror voltage V2, and the other end of the parallel node of the two branches is grounded. The first branch includes: a third resistor R1 and a first triode Q1, wherein one end of the third resistor R1 is connected with the base and collector of the first triode Q1, the emitter is connected to ground, and the voltage generated at the node where the third resistor R1 is connected with the first triode is the first voltage Va; the second sub-circuit includes: a fourth resistor R2, a fifth resistor R3, and a second triode Q2, wherein one end of the fourth resistor R2 is connected to the output end of the operational amplifier OP1, the other end of the fourth resistor R2 is connected to the fifth resistor R3, the other end of the fifth resistor R3 is connected to the collector of the second triode Q2, the base of the second triode is connected to the collector thereof, the emitter is connected to ground, and the voltage generated at the node where the fourth resistor R2 is connected to the fifth resistor R3 is the second voltage Vb. Preferably, the first transistor Q1 and the second transistor Q2 are NPN transistors, and the emitter area of the second transistor Q2 is larger than the emitter area of the first transistor Q1, and the ratio of the emitter area of the second transistor Q2 to the emitter area of the first transistor Q1 is 8: 1.
the comparison circuit 23 is composed of a comparator CMP1, and is used for receiving two comparison voltages, i.e. the first voltage Va and the second voltage Vb, and generating a logic signal. The non-inverting input terminal of the comparator CMP1 is connected to the connection between the third resistor R1 and the first transistor Q1 in the first branch, and is configured to receive the first voltage Va, and the inverting input terminal of the comparator CMP1 is connected to the connection between the fourth resistor R2 and the fifth resistor R3 in the second branch, and is configured to receive the second voltage Vb. A logic signal is generated by the comparator CMP1, from which the state of the supply voltage can be determined, so that the purpose of detecting the supply voltage is achieved.
In order to generate an under-voltage lockout signal UVLO, the voltage detection circuit of the present embodiment further includes an inverter. In order to output a relatively accurate under-voltage lock-out signal UVLO to prevent false triggering, the inverter is preferably a schmitt inverter ST 1. The schmitt inverter ST1 is connected to the output of the comparator CMP1 for receiving the logic signal to generate an under-voltage lockout signal UVLO. And judging whether the power supply voltage reaches a threshold voltage for enabling the chip to normally work according to the undervoltage locking signal UVLO.
Here, the voltage detection circuit implements the principle of voltage detection: when Va is equal to Vb, the reaction mixture,
then, at this time, VBE1 ═ VBE2+ IbR3 (2)
The Vbe1 and the Vbe2 are voltages at two ends of a base collector and an emitter of the first triode Q1 and the second triode Q2, respectively.
Obtained by the formula (2):
wherein,k is boltzmann's constant, Q is the electronic charge, T is the absolute temperature, and n is the ratio of the emitter area of the second transistor Q2 to the emitter area of the first transistor Q1, where n is 8: 1.
Combining the formulas (1), (2) and (3) to obtain:
at this time, the process of the present invention,
since the base and emitter voltages VBE1 and VBE2 of the first transistor Q1 and the second transistor Q2 in the comparison voltage generation circuit 22 are both negative temperature coefficients, and since the emitter area ratio of the two is determined, VBE1-VBE2 are positive temperature coefficient voltages at this moment, zero temperature voltage can be ensured to be presented at the right end of the equation (5) by properly setting the values of the fourth resistor R2 and the fifth resistor R3, and the voltage is defined as Vbg, so that the trip point of the comparator CMP1 can be ensured not to be influenced by temperature, that is, the state of Va Vb is not changed due to temperature change.
Then at this point in time,
therefore, whenWhen Va is equal to Vb, the comparator CMP1 is at the transition point, i.e. the output under-voltage lock signal UVLO is transitioned, and thus the output under-voltage lock signal UVLO is transitionedCan obtain the productCan be used as the threshold voltage of the chip power supply.
The operational amplifier OP1 has a high input impedance, and can prevent the current flowing through the first resistor Ra and the second resistor Rb in the voltage divider circuit 20 from flowing to the comparison voltage generating circuit 22, so as to avoid the change of the state of Va ═ Vb with the change of the current in the first resistor Ra and the second resistor Rb, thereby ensuring that the change of the state of Va ═ Vb is only related to the change of the supply voltage VDD, and thus the present voltage detection circuit has very high accuracy.
When the supply voltage isWhen corresponding to Va>Vb, outputting an undervoltage locking signal UVLO of 1, indicating that the power supply voltage is lower than a threshold voltage for enabling the chip to normally work, and stopping the chip from working;
when the supply voltage isWhen corresponding to Va<Vb, the output undervoltage locking signal UVLO is 0, which indicates that the power supply voltage reaches the threshold voltage for enabling the chip to normally work, and the chip normally works.
Therefore, whether the power supply voltage VDD at the moment reaches the threshold voltage value for enabling the chip to work normally can be known through the state of the under-voltage locking signal UVLO, and the purpose of detecting the power supply voltage is achieved.
In summary, the voltage detection circuit provided by the present invention transmits the sample voltage signal obtained by dividing the supply voltage to the comparison voltage generation circuit through an isolation circuit, generates two comparison voltage signals in the comparison voltage generation circuit, compares the two comparison voltage signals through a comparison circuit to output a logic signal, and finally generates the under-voltage locking signal, thereby realizing the detection of the supply voltage. In the voltage detection circuit, a reference voltage generation circuit is not required to be additionally arranged, the structure is simple, the trip point of the comparison circuit is not influenced by the current and the temperature in the divider resistor and is only related to the power supply voltage, the influence of the external reference voltage precision and the matching factor of the ratio of the divider resistor on the traditional voltage detection circuit is overcome, and the detection precision of the voltage detection circuit is improved.
The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.
Claims (8)
1. A voltage detection circuit, comprising: the voltage divider circuit, the isolation circuit, the comparison voltage generating circuit and the comparison circuit are connected in sequence;
the voltage division circuit is used for dividing the power supply voltage to obtain a sample voltage representing the power supply voltage;
the isolation circuit is used for receiving the sample voltage, generating a mirror voltage equivalent to the sample voltage and simultaneously isolating the current in the voltage division circuit from flowing to the comparison voltage generation circuit;
the comparison voltage generation circuit is used for receiving the mirror image voltage and generating a first voltage and a second voltage as two comparison voltages;
the comparison circuit is used for receiving two comparison voltages of the first voltage and the second voltage and generating a logic signal;
the comparison voltage generating circuit is formed by connecting a first branch and a second branch in parallel, one end of a parallel node of the two branches is connected with the output end of the isolating circuit, and the other end of the parallel node of the two branches is grounded;
the first branch includes: the base electrode of the first triode is connected with the collector electrode of the first triode, the emitting electrode of the first triode is connected to the ground, and the voltage at the node where the third resistor is connected with the first triode is the first voltage;
the second branch circuit includes: the circuit comprises a fourth resistor, a fifth resistor and a second triode, wherein one end of the fourth resistor is connected with the output end of the operational amplifier, the other end of the fourth resistor is connected with one end of the fifth resistor, the other end of the fifth resistor is connected with the collector of the second triode, the base of the second triode is connected with the collector of the second triode, the emitter of the second triode is connected with the ground, and the voltage at the node where the fourth resistor is connected with the fifth resistor is the second voltage.
2. The voltage detection circuit of claim 1, wherein the voltage divider circuit comprises a first resistor and a second resistor connected in series between a supply voltage and ground, wherein the voltage at the junction of the first resistor and the second resistor is the sample voltage.
3. The voltage detection circuit of claim 1 wherein the isolation circuit is an operational amplifier having a non-inverting input connected to the junction of the first resistor and the second resistor for receiving the sample voltage and an output connected to the inverting input of the operational amplifier, the voltage at the output of the operational amplifier being the mirror voltage.
4. The voltage detection circuit of claim 1, wherein the first transistor and the second transistor are NPN transistors.
5. The voltage sensing circuit of claim 1, wherein an emitter area of the second transistor is larger than an emitter area of the first transistor.
6. The voltage detection circuit of claim 5, wherein the comparator circuit is a comparator, a non-inverting input terminal of the comparator is connected to a junction of the third resistor and the first transistor in the first branch for receiving the first voltage, and an inverting input terminal of the comparator is connected to a junction of the fourth resistor and the fifth resistor in the second branch for receiving the second voltage.
7. The voltage detection circuit of claim 6, further comprising an inverter coupled to the output of the comparator for receiving the logic signal generated by the comparator and generating an under-voltage lockout signal.
8. The voltage detection circuit of claim 7, wherein the inverter is a Schmitt inverter.
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Families Citing this family (9)
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| CN103954824B (en) * | 2014-05-07 | 2016-08-24 | 嘉兴中润微电子有限公司 | High pressure pressure differential detection circuit |
| CN106482850B (en) * | 2016-11-25 | 2019-09-17 | 北京兆芯电子科技有限公司 | Temperature-detecting device and temperature checking method |
| CN108664073B (en) * | 2017-03-31 | 2020-10-09 | 中芯国际集成电路制造(上海)有限公司 | Detection circuit |
| CN107894526B (en) * | 2017-11-10 | 2020-02-14 | 北京深思数盾科技股份有限公司 | Battery voltage detection device and method and information safety equipment |
| CN110333457B (en) * | 2018-03-28 | 2021-04-16 | 上海汽车集团股份有限公司 | Power battery pack voltage sampling circuit, power system and new energy automobile |
| CN109245206B (en) * | 2018-09-17 | 2021-10-15 | 上海空间电源研究所 | High-voltage lithium ion battery pack charging control signal generation circuit |
| CN111682503A (en) * | 2020-06-17 | 2020-09-18 | 苏州纳芯微电子股份有限公司 | Undervoltage protection circuit |
| CN113945856B (en) * | 2021-10-15 | 2024-03-12 | 成都思瑞浦微电子科技有限公司 | Power supply voltage UVLO detection circuit based on floating power supply domain |
| CN117849420B (en) * | 2024-03-08 | 2024-06-25 | 上海昇贻半导体科技有限公司 | Heavy current protection circuit in photoelectric TIA circuit |
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