CN103363897A - 用于测量led模块的光轴的装置和方法 - Google Patents

用于测量led模块的光轴的装置和方法 Download PDF

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Publication number
CN103363897A
CN103363897A CN2013101159699A CN201310115969A CN103363897A CN 103363897 A CN103363897 A CN 103363897A CN 2013101159699 A CN2013101159699 A CN 2013101159699A CN 201310115969 A CN201310115969 A CN 201310115969A CN 103363897 A CN103363897 A CN 103363897A
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CN
China
Prior art keywords
led module
luminophor
optical axis
brightness
unit
Prior art date
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Pending
Application number
CN2013101159699A
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English (en)
Chinese (zh)
Inventor
徐承焕
梁先模
崔卿隆
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SEO, SEUNG HWAN
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Individual
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Publication date
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Publication of CN103363897A publication Critical patent/CN103363897A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S362/00—Illumination
    • Y10S362/80—Light emitting diode

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Led Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN2013101159699A 2012-04-03 2013-04-03 用于测量led模块的光轴的装置和方法 Pending CN103363897A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2012-0034647 2012-04-03
KR1020120034647A KR101207146B1 (ko) 2012-04-03 2012-04-03 발광 다이오드 모듈의 광축 측정 장치 및 방법

Publications (1)

Publication Number Publication Date
CN103363897A true CN103363897A (zh) 2013-10-23

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CN2013101159699A Pending CN103363897A (zh) 2012-04-03 2013-04-03 用于测量led模块的光轴的装置和方法

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KR (1) KR101207146B1 (ko)
CN (1) CN103363897A (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105716544A (zh) * 2016-04-28 2016-06-29 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN105865376A (zh) * 2016-04-28 2016-08-17 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN113758681A (zh) * 2021-08-16 2021-12-07 昆山丘钛微电子科技股份有限公司 模组点亮驱动装置以及机台

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101436574B1 (ko) * 2013-01-23 2014-09-01 (주) 인텍플러스 Ｌｅｄ 백라이트 유닛의 검사장치 및 방법
CN104422817A (zh) * 2013-09-09 2015-03-18 太白Hitech公司 用于检测发光二极管模块的装置
KR101472934B1 (ko) 2013-10-02 2014-12-16 태백하이텍 주식회사 발광 다이오드 모듈의 렌즈의 기울기 오차 한계 범위 설정 방법 및 장치
KR101472935B1 (ko) 2013-11-14 2014-12-16 태백하이텍 주식회사 렌즈 기울기 검출 방법
KR101590454B1 (ko) * 2014-08-27 2016-02-01 주식회사 루멘스 발광 소자 패키지 모듈용 렌즈 편심 검사 장치
KR102409966B1 (ko) * 2015-09-17 2022-06-16 삼성전자주식회사 광원 모듈의 제조방법
CN112634827B (zh) * 2021-01-27 2021-11-30 季华实验室 单箱校正平面倾斜纠正方法、装置、电子设备及存储介质

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101334334A (zh) * 2007-06-25 2008-12-31 佛山普立华科技有限公司 镜片偏心检测***及其检测方法
CN101393074A (zh) * 2007-09-18 2009-03-25 株式会社小糸制作所 光轴检查方法及光轴检查装置
US20100026993A1 (en) * 2008-08-01 2010-02-04 Samsung Electronics Co., Ltd. Method and apparatus for manufacturing display device
JP2010286339A (ja) * 2009-06-11 2010-12-24 Rozefu Technol:Kk 光源の指向性検査方法およびその装置
CN101984332A (zh) * 2010-11-26 2011-03-09 台龙电子（昆山）有限公司 Led灯条发光色差检测治具
KR101078296B1 (ko) * 2010-07-06 2011-11-01 주식회사 미르기술 백라이트용 엘이디 검사 장치

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101009618B1 (ko) * 2009-07-30 2011-01-21 윈텍 주식회사 Ｌｅｄ 검사장치

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101334334A (zh) * 2007-06-25 2008-12-31 佛山普立华科技有限公司 镜片偏心检测***及其检测方法
CN101393074A (zh) * 2007-09-18 2009-03-25 株式会社小糸制作所 光轴检查方法及光轴检查装置
US20100026993A1 (en) * 2008-08-01 2010-02-04 Samsung Electronics Co., Ltd. Method and apparatus for manufacturing display device
JP2010286339A (ja) * 2009-06-11 2010-12-24 Rozefu Technol:Kk 光源の指向性検査方法およびその装置
KR101078296B1 (ko) * 2010-07-06 2011-11-01 주식회사 미르기술 백라이트용 엘이디 검사 장치
CN101984332A (zh) * 2010-11-26 2011-03-09 台龙电子（昆山）有限公司 Led灯条发光色差检测治具

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
洪汝渝: "发光二极管的光轴测量", 《半导体光电》, vol. 19, no. 6, 31 December 1998 (1998-12-31) *
洪汝渝: "基于面积加权法的LED光轴测量", 《重庆工商大学学报（自然科学版）》, vol. 22, no. 3, 30 June 2005 (2005-06-30) *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105716544A (zh) * 2016-04-28 2016-06-29 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN105865376A (zh) * 2016-04-28 2016-08-17 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN105865376B (zh) * 2016-04-28 2019-05-17 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN105716544B (zh) * 2016-04-28 2019-05-17 苏州品柏电子贸易有限公司 用于检测led芯片与透镜之间同心度的影像采集装置
CN113758681A (zh) * 2021-08-16 2021-12-07 昆山丘钛微电子科技股份有限公司 模组点亮驱动装置以及机台

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SE01 Entry into force of request for substantive examination
C53 Correction of patent of invention or patent application
CB03 Change of inventor or designer information

Inventor after: Xu Chenghuan

Inventor after: Liang Xianmo

Inventor after: Zhao Zhanghuan

Inventor before: Xu Chenghuan

Inventor before: Liang Xianmo

Inventor before: Cui Qinglong

Inventor after: Xu Chenghuan

Inventor after: Zhao Zhanghuan

Inventor before: Xu Chenghuan

Inventor before: Liang Xianmo

Inventor before: Zhao Zhanghuan

COR Change of bibliographic data

Free format text: CORRECT: INVENTOR; FROM: XU CHENGHUAN LIANG XIANMO ZHAO ZHANGHUAN TO: XU CHENGHUAN ZHAO ZHANGHUAN

Free format text: CORRECT: INVENTOR; FROM: XU CHENGHUAN LIANG XIANMO CUI QINGLONG TO: XU CHENGHUAN LIANG XIANMO ZHAO ZHANGHUAN

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Owner name: TAEBAEK HITECH COMPANY

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Effective date: 20150708

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Address after: Gyeonggi Do, South Korea

Applicant after: SEO, SEUNG HWAN

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C02 Deemed withdrawal of patent application after publication (patent law 2001)
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Application publication date: 20131023