CN103189983A - 具有改善的电荷检出单元和像素几何结构的cmos光栅3d照相机*** - Google Patents
具有改善的电荷检出单元和像素几何结构的cmos光栅3d照相机*** Download PDFInfo
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- CN103189983A CN103189983A CN2009801283113A CN200980128311A CN103189983A CN 103189983 A CN103189983 A CN 103189983A CN 2009801283113 A CN2009801283113 A CN 2009801283113A CN 200980128311 A CN200980128311 A CN 200980128311A CN 103189983 A CN103189983 A CN 103189983A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US8140008P | 2008-07-17 | 2008-07-17 | |
US61/081,400 | 2008-07-17 | ||
PCT/IB2009/053113 WO2010007594A1 (en) | 2008-07-17 | 2009-07-17 | Cmos photogate 3d camera system having improved charge sensing cell and pixel geometry |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103189983A true CN103189983A (zh) | 2013-07-03 |
CN103189983B CN103189983B (zh) | 2016-10-26 |
Family
ID=41137069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200980128311.3A Active CN103189983B (zh) | 2008-07-17 | 2009-07-17 | 具有改善的电荷检出单元和像素几何结构的cmos光栅3d照相机*** |
Country Status (5)
Country | Link |
---|---|
US (1) | US8264581B2 (zh) |
EP (1) | EP2304795A1 (zh) |
JP (1) | JP5501358B2 (zh) |
CN (1) | CN103189983B (zh) |
WO (1) | WO2010007594A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104134676A (zh) * | 2014-07-23 | 2014-11-05 | 中国航天科技集团公司第九研究院第七七一研究所 | 基于辐射环境应用的快速电荷转移像素结构 |
CN110164745A (zh) * | 2014-08-29 | 2019-08-23 | 科磊股份有限公司 | 扫描式电子显微镜及检验及复检样本的方法 |
CN110913154A (zh) * | 2018-09-18 | 2020-03-24 | 亚德诺半导体无限责任公司 | 有源像素图像传感器 |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5489570B2 (ja) * | 2009-07-27 | 2014-05-14 | キヤノン株式会社 | 光電変換装置及び撮像システム |
JP5471174B2 (ja) * | 2009-08-28 | 2014-04-16 | ソニー株式会社 | 固体撮像装置とその製造方法、及び電子機器 |
US8717469B2 (en) | 2010-02-03 | 2014-05-06 | Microsoft Corporation | Fast gating photosurface |
KR101818587B1 (ko) * | 2010-08-11 | 2018-01-15 | 삼성전자주식회사 | 광감지 장치의 단위 픽셀, 광감지 장치 및 이를 이용한 거리 측정 방법 |
US9823339B2 (en) | 2010-12-21 | 2017-11-21 | Microsoft Technology Licensing, Llc | Plural anode time-of-flight sensor |
US20120261730A1 (en) * | 2011-04-15 | 2012-10-18 | Omnivision Technologies, Inc. | Floating diffusion structure for an image sensor |
US9083905B2 (en) * | 2011-04-26 | 2015-07-14 | Semiconductor Components Industries, Llc | Structured light imaging system |
JP5846554B2 (ja) * | 2011-07-29 | 2016-01-20 | 国立大学法人静岡大学 | 固体撮像装置、及び画素 |
JP6026755B2 (ja) | 2012-02-28 | 2016-11-16 | 浜松ホトニクス株式会社 | 距離センサ及び距離画像センサ |
JP5932400B2 (ja) | 2012-03-02 | 2016-06-08 | 浜松ホトニクス株式会社 | 距離センサ及び距離画像センサ |
JP6006514B2 (ja) * | 2012-03-27 | 2016-10-12 | 浜松ホトニクス株式会社 | 距離センサ及び距離画像センサ |
US9826214B2 (en) | 2014-09-08 | 2017-11-21 | Microsoft Technology Licensing, Llc. | Variable resolution pixel |
US9602804B2 (en) * | 2015-03-26 | 2017-03-21 | Intel Corporation | Methods of forming integrated package structures with low Z height 3D camera |
DE102018108379B4 (de) * | 2018-04-09 | 2024-03-07 | pmdtechnologies ag | Lichtlaufzeitpixel |
US11032496B2 (en) * | 2019-07-22 | 2021-06-08 | Omnivision Technologies, Inc. | Enhanced shutter efficiency time-of-flight pixel |
KR102314944B1 (ko) * | 2020-09-07 | 2021-10-21 | 울산과학기술원 | 실리콘 링 전계효과트랜지스터 어레이에 의한 활성 안테나 장치 |
CN114896927B (zh) * | 2022-05-17 | 2024-04-30 | 中国科学院新疆理化技术研究所 | 一种不同光强对辐照后cmos图像传感器像素单元满阱容量影响的仿真方法 |
WO2024024469A1 (ja) * | 2022-07-25 | 2024-02-01 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置 |
Citations (3)
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EP0757476A2 (en) * | 1995-08-02 | 1997-02-05 | Canon Kabushiki Kaisha | Solid state image pickup apparatus |
JPH10289992A (ja) * | 1997-04-15 | 1998-10-27 | Sony Corp | 固体撮像装置とその製造方法 |
JP2006041189A (ja) * | 2004-07-27 | 2006-02-09 | Hamamatsu Photonics Kk | 固体撮像素子 |
Family Cites Families (20)
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JPH0666446B2 (ja) * | 1984-03-29 | 1994-08-24 | オリンパス光学工業株式会社 | 固体撮像素子 |
US5625210A (en) | 1995-04-13 | 1997-04-29 | Eastman Kodak Company | Active pixel sensor integrated with a pinned photodiode |
US6320617B1 (en) | 1995-11-07 | 2001-11-20 | Eastman Kodak Company | CMOS active pixel sensor using a pinned photo diode |
US6008486A (en) * | 1997-12-31 | 1999-12-28 | Gentex Corporation | Wide dynamic range optical sensor |
US6239456B1 (en) | 1998-08-19 | 2001-05-29 | Photobit Corporation | Lock in pinned photodiode photodetector |
JP4165250B2 (ja) * | 2003-02-21 | 2008-10-15 | セイコーエプソン株式会社 | 固体撮像装置 |
JP2004259733A (ja) | 2003-02-24 | 2004-09-16 | Seiko Epson Corp | 固体撮像装置 |
US6897519B1 (en) * | 2003-02-26 | 2005-05-24 | Dialog Semiconductor | Tunneling floating gate APS pixel |
JP2004349430A (ja) * | 2003-05-21 | 2004-12-09 | Sharp Corp | 固体撮像素子とその駆動方法 |
US7187018B2 (en) | 2003-06-25 | 2007-03-06 | Micron Technology, Inc. | Reduced barrier photodiode/transfer gate device structure of high efficiency charge transfer and reduced lag and method of formation |
US7115855B2 (en) | 2003-09-05 | 2006-10-03 | Micron Technology, Inc. | Image sensor having pinned floating diffusion diode |
JP2005244434A (ja) * | 2004-02-25 | 2005-09-08 | Sharp Corp | 固体撮像装置 |
JP4389737B2 (ja) * | 2004-09-22 | 2009-12-24 | セイコーエプソン株式会社 | 固体撮像装置及びその駆動方法 |
US7910964B2 (en) * | 2005-08-30 | 2011-03-22 | National University Corporation Shizuoka University | Semiconductor range-finding element and solid-state imaging device |
JP2007081083A (ja) * | 2005-09-14 | 2007-03-29 | Seiko Epson Corp | ラインセンサ及び画像情報読取装置 |
JP2007174289A (ja) | 2005-12-22 | 2007-07-05 | Fujitsu Ltd | センサ用アナログ多段増幅回路 |
WO2008088981A1 (en) * | 2007-01-11 | 2008-07-24 | Micron Technology, Inc. | Missing pixel architecture |
US20080258187A1 (en) * | 2007-04-18 | 2008-10-23 | Ladd John W | Methods, systems and apparatuses for the design and use of imager sensors |
TWI479887B (zh) | 2007-05-24 | 2015-04-01 | Sony Corp | 背向照明固態成像裝置及照相機 |
EP2235563A1 (en) | 2007-12-19 | 2010-10-06 | Microsoft International Holdings B.V. | 3d camera and methods of gating thereof |
-
2009
- 2009-07-17 EP EP09786633A patent/EP2304795A1/en not_active Withdrawn
- 2009-07-17 US US12/504,687 patent/US8264581B2/en active Active
- 2009-07-17 CN CN200980128311.3A patent/CN103189983B/zh active Active
- 2009-07-17 WO PCT/IB2009/053113 patent/WO2010007594A1/en active Application Filing
- 2009-07-17 JP JP2011518052A patent/JP5501358B2/ja active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0757476A2 (en) * | 1995-08-02 | 1997-02-05 | Canon Kabushiki Kaisha | Solid state image pickup apparatus |
JPH10289992A (ja) * | 1997-04-15 | 1998-10-27 | Sony Corp | 固体撮像装置とその製造方法 |
JP2006041189A (ja) * | 2004-07-27 | 2006-02-09 | Hamamatsu Photonics Kk | 固体撮像素子 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104134676A (zh) * | 2014-07-23 | 2014-11-05 | 中国航天科技集团公司第九研究院第七七一研究所 | 基于辐射环境应用的快速电荷转移像素结构 |
CN110164745A (zh) * | 2014-08-29 | 2019-08-23 | 科磊股份有限公司 | 扫描式电子显微镜及检验及复检样本的方法 |
CN110164745B (zh) * | 2014-08-29 | 2020-10-27 | 科磊股份有限公司 | 扫描式电子显微镜及检验及复检样本的方法 |
CN110913154A (zh) * | 2018-09-18 | 2020-03-24 | 亚德诺半导体无限责任公司 | 有源像素图像传感器 |
Also Published As
Publication number | Publication date |
---|---|
US20100039546A1 (en) | 2010-02-18 |
EP2304795A1 (en) | 2011-04-06 |
WO2010007594A1 (en) | 2010-01-21 |
US8264581B2 (en) | 2012-09-11 |
JP5501358B2 (ja) | 2014-05-21 |
JP2011528499A (ja) | 2011-11-17 |
CN103189983B (zh) | 2016-10-26 |
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Effective date of registration: 20191018 Address after: Washington State Patentee after: MICROSOFT TECHNOLOGY LICENSING, LLC Address before: Washington State Patentee before: Microsoft Corp. Effective date of registration: 20191018 Address after: Washington State Patentee after: Microsoft Corp. Address before: Amsterdam, The Netherlands Patentee before: MICROSOFT INTERNATIONAL HOLDINGS B.V. |