CN1030319A - 光学扫描装置其内适用的物镜及其光学记录和/或再现仪 - Google Patents
光学扫描装置其内适用的物镜及其光学记录和/或再现仪 Download PDFInfo
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Abstract
用于光学记录和/或重现仪的扫描装置,包括一
物镜***,该物镜***由安装在透明体(30)表面上的
反射镜(33,35)组成。因为反射镜不但会聚辐射束
(20),而且在透明体(30)中折叠该辐射,所以读出/
写入单元非常紧凑。把辐射源(40)和检测***(60)
固定到透明体(30)的表面,也使扫描装置具有非常坚
固稳定的形式。
Description
本发明涉及一扫描装置,它是利用光辐射扫描光学记录载体中的一个信息面,此扫描装置由一个提供扫描束的辐射源及一个把扫描束聚焦到信息面上扫描点的物镜组成。本发明也涉及到适用于该型扫描装置中的物镜,并涉及到配置有该型扫描装置的光学记录和/或再现仪。
扫描信息面意指两种扫描,即从信息面读出予先记录的信息的扫描,和根据记录的信息,调制辐射束强度将信息写入信息面的扫描。
公开文献描述的扫描装置用于读出光学记录载体公知于英国专利说明书No,1,541,596。此说明书描述一种光学扫描装置,该装置包括有一带两个反射镜的物镜,这两个镜的反射面相对设置。其中一个是凹镜,它的反射面对着记录载体。另一个小得多的是凸镜,它的反射面对着辐射源。来自辐射源的辐射束经过较大的凹镜上的一个通路抵达凸镜。其后,辐射束朝着凹镜反射,并被此镜聚焦至记录载体信息面中的辐射点上。
已知的物镜由一个两级聚焦***部分组成,其中,整个镜片***都悬挂在磁线圈中,以此控制其相对于记录载体的位置。小镜片安装在一片压电材料上,并借助它可以上下移动,这样,在信息面上周期产生的少量散焦可由检测器检测,然后由获得的焦差信号借助于磁线圈重调物镜的位置。
由于利用了两个互相间工作关系紧密的分离反射镜,因此,公知的扫描装置结构相当复杂,并且对机械扰动很敏感。
本发明的目的是给出一种坚固的扫描装置,它包括相互间以紧密工作关系排列着的很少几个部件。
为此目的,附合本发明的扫描装置的特征在于,其物镜包括一透明体,透明体对着辐射源一边与第一表面相接,远离辐射源的一边与第二表面相邻接,所说的第一表面有第一辐射窗,此窗绕物镜光轴中心定位,还有一向里反射的第一反射镜,此镜装在第一辐射窗周围,所说的第二表面有一向里反射的第二反射镜,此镜绕物镜光轴中心定位,在第二反射镜周围装有第二辐射窗,扫描束从辐射源到记录载体的辐射路径是:经第一辐射窗进入物镜,经第二反射镜及第一反射镜来回改变方向,最后穿过第二辐射窗离开物镜。通过一块且是同一块透明体表面上装的两个相对的反射镜,使两镜互相直接耦合,两镜的互相准直在制造时确定,而且其后不变。
这种形式的物镜特别适用于移动式装置,用来再现记录在光学记录载体上的信息,例如:手提或汽车上装的设备。根据本发明的扫描装置有很大的优越性:在透明体中的辐射路经折叠,因此限制了扫描装置的高度,可做成小型仪器。
依照本发明的扫描装置进一步的特征在于:第一反射镜为非球面弯曲,这样,不必在扫描束的辐射路径上安装光学校准器,就可以获得确定性很好的扫描点。
依照本发明的扫描装置的又一个实施例的特征是:第一和第二反射镜呈球面弯曲。本实施例进一步的特征在于:第二辐射窗也为球面弯曲。这样的扫描装置制造相对容易,因为物镜的弯曲表面是球形的。
依据本发明的扫描装置进一步的特征在于:透明体至少包括不同折射率的两部分材料,利用其在透明体内提供合适的辐射-折射面可显著地减小球差。
依据本发明的扫描装置不仅可用来扫描一带有反射信息面的记录载体,而且能用来扫描以透射读取的记录载体。然而,本发明的扫描装置最适合用于有反射信息面的记录载体。物镜也能用于接收来自信息面上扫描点的辐射,并将其聚焦到辐射敏感探测器上。
依据本发明的扫描装置实施例适用于扫描反射信息面,在此实施例中,扫描装置含有一辐射敏感探测器,其特征是:物镜包括一分束元件,此分束元件可空间分离辐射源的发射束以及信息面的反射束。光束分离元件可以是:例如装在第一辐射窗表面上的分光块或分光镜。作为读取单元用的这种扫描装置,因为主要光学性谝桓龅ヒ还辜希虼耸墙舸占峁棠陀玫摹?
依照本发明的扫描装置最好的特征在于:分光器由光栅或全息图组成。光栅既可是寻常栅,全息栅,也可是全息图。光栅或全息图可装在物镜的透明体的呈现面上,也可装在透明体内。
根据本发明的扫描装置的实施例,特征在于:光栅或全息图是反射光栅或反射全息图,它们装在第二反射镜上。光栅或全息图最好是相位结构。
依据本发明的扫描装置进一步的实施例特征在于:光栅或全息图是装在第一辐射窗的透射光栅或透射全息图。
依据本发明的扫描装置进一步的实施例特征在于:物镜的透明体由互相连接的两部分组成,其中,光栅或全息图是透射栅或透射全息图,装在这两部分中任一部分的连接面上。
使用光栅耦合输出反射束具有更多的好处,利用光栅可实现检测轨迹误差。为此目的,依据本发明的扫描装置其特征在于:例如,光栅或全息图至少包括两个不同光栅参数的副栅。例如:副栅的栅线方向和曲率不同或光栅周期等不同。因此,通过一个光栅的分光束与通过另一光栅的分光束偏转角度不同。而分光束在辐射敏感探测器上形成的辐射点之间的距离则依赖于物镜***与信息面之间的距离。此焦差检测方法的原理在“Neues aus der Technik”Volume1980,No·6,Page 3中阐述。
依据本发明的扫描装置的一实施例中用了另一种焦差检测方法,其特征在于:光栅或全息图的栅周期是常数或呈线性变化。这样的光栅能在信息面反射的辐射束中引起象散,这象散可用来确定焦差,例如,美国专利No·4·358,200中所述。
在扫描装置中采用带透明体的物镜进尔有关于辐射源及辐射敏感探测器定位方面的一些优点。
依据本发明的扫描装置的实施例因此有下面特征:辐射源与第一辐射窗为光学连接。例如,辐射源是半导体激光器。它的辐射-发射表面装在辐射窗上,或辐射源通过一条光纤或一组光纤连到辐射窗。
依据本发明的扫描装置的另一实施例是装有一辐射敏感探测器,其特征在于:辐射敏感探测器装在其位置对着从信息面返回又经物镜作用后的光束的路径上。
辐射源,光纤或辐射敏感探测器利用例如透明粘合剂装到第一辐射窗上。这就形成了一非常紧凑坚固的一体化元件,构成扫描装置的整个光学部分。
依据本发明的扫描装置的各种实施例可以用不同类型的辐射源,例如,单个的半导体激光器、半导体激光器列或其它辐射源,它们可直接或利用光纤连到物镜上。
下面将举例并参照附图更详细地阐述本发明,其中:
图1示出了本发明依据的光学扫描装置剖面图。
图2、3和图4示出了三个不同物镜实施例的扫描装置。
图1示出了装有信息面11的光学记录载体10的一部分。扫描装置紧靠记录载体,它的主要元件是物镜30和辐射源40。辐射源40发射一扫描束20,此扫描束由物镜30聚焦到信息面11的扫描点21上。信息面能被扫描点复盖,因为扫描装置和记录载体之间互相可以移动,例如,记录载体可以绕垂直于记录载体面的轴(未示出)旋转,而扫描装置也可以就同一个轴做径向移动。
扫描束20通过物镜并经过第一辐射窗31进入物镜的透明体。接着,扫描束在凸反射镜32上被反射,这样,扫描束加宽并基本入射在凹反射镜33的整个表面上。这反射镜反射的扫描束成为一会聚束,通过辐射窗34和透明记录载体10的一部分聚焦到信息面11中的扫描点21上。
就反射信息表面来说,例如:光学可读数字声盘,又称“袖珍盘”,就装有这种信息面,在点21上的反射束被物镜再接收,并通过其中的逆程路径到辐射窗31。反射束可进入辐射源,并且当用半导体激光器作辐射源时,可在辐射锤浇患觳獬隼础U饩褪撬降姆蠢《脸觯纾谖鞯伦ɡ得魇镹o.1,584,664中所阐述的。然而,最好是在发射与反射光束的公共辐射路径上装一个分光器,例如,分束块50,通过此分束块,一部分反射的辐射束从扫描束20中分出来,并被投射在辐射敏感探测器60上。因为从信息面11反射的辐射束受存贮在所说的信息面上的信息的调制并被辐射光点扫描,所以信息流被检测***60转变为电信号以备进一步处理。
图2、3和4示出了根据本发明的扫描装置,其中,表示了带有光栅分光器的三个不同物镜的实施例。
在图2中,透明体30的第一表面为一非球面,其上有第一辐射窗31,第一表面被第一反射镜33包络。透明体的第二表面包括可透过辐射的环形平面部分34和一中心园部分35。该中心园部分35是弯曲的,并且有一反射光栅,最好是相位光栅。透明体30,辐射窗和反射镜绕着光轴对称任意排列。辐射源40,例如半导体激光器直接或通过光纤连到处于光轴上的第一辐射窗31。
如果扫描装置要从光学记录载体上读取信息,反射栅几何尺寸最好是使反射的辐射束在零级衍射,和第一级或某个较高级衍射上有几乎均匀的分布。这样,回程光束在这个较高级上的衍射与投射光束在零级衍射的乘积是最大的。尽可能抑制其它级。但在扫描装置要写入信息时,最好是绝大部分辐射束在零级反射,这样扫描点强度高而其它辐射束尽可能在第一级或某个较高衍射级反射。
来自辐射源40的辐射束由反射镜35反射向反射镜33,在零级反射的辐射束被反射镜33聚焦在信息面21上形成扫描光点21。从信息面反射的辐射束沿着逆程光路经过反射镜33和35,反射在透明体30的窗31上。由于反射栅35的几何尺寸,一级象点位于辐射源40附近。辐射敏感探测器60装在象点上。
图3示出了据此发明的扫描装置的优化实施例,此实施例基本与图2的实施例一样,不同之处是:支撑窗口31和反射镜33的表面是球形,透明体30由透明材料36和37两部分组成并在这两部分之间装一透射栅38。
36和37两部分可以按如图所示方式或连到透射栅上的方式直接互相联在一起,在36和37部分之间可能留一空腔,空腔是空的或是用一种物质填充,此物质的折射率与两部分材料的折射率有显著不同,如果36和37互相连接,则栅38是黑白栅。在空腔的情况下,换装一相位栅,其优点是在光栅上没有或几乎没有辐射束损失。透射栅38工作方式与图2所示的光栅35完全一样。装有反射器33的36部分由Schott公司的BK7型玻璃或石英玻璃组成。而支撑反射镜35的另一部分由同是Schott公司的SFL6或La KN22制成。
因为透明体是由折射率不同的两部分材料制成,折射率差约为0.3,物镜的球面象差与均匀的透明体的象差相比是相当小的。已发现,折射率差在约0.2至0.4之间就能满足此目的。当然,就勿需为减少球面象差在透明体36和37两部分界面处装一光栅了。反之,光栅38可以装在透明体里,不必用不同折射率的两种材料制造36和37部分。例如,由于物镜数值孔径小,或由于反射镜33的形状,不存在麻烦的球面象差就是这种情况。
图4示出了根据此发明的光学扫描装置的第三个实施例。在此实施例中,第二辐射窗34和第二反射镜32都是球面弯曲。在数值孔径相对较小的情况下,反射镜和窗的曲率半径可以相等。在数值孔径较大的情况下常选择不同的曲率半径。进一步说,在本实施例中,从信息面11反射的辐射束部分耦合出来并且该耦合的辐射束通过装在透明体的第一辐射窗33上的透射栅39射向辐射检测***60。在本实施例中,辐射源40和辐射检测***60离辐射窗33有一段距离。
光栅39(或图2中的光栅35和图3中的光栅38)可由多个副栅组成,每个副栅有不同的栅参数,例如光栅周期及光栅线的方向和曲率等,因此射向辐射检测***的分束分离为许多束,这些束可按照所称的傅科法检测焦点误差,例如:在“Neues aus der technik”,Volume 1980,NO·6,Page 3引用的文献。如果光栅周期不变。或呈线性变化,出射束可能象散,焦差可利用所称的象散法检测,例如,在美国专利No·4·358,200(PHN9597)。光栅可以是寻常光栅,全息光栅或全息图。
Claims (16)
1、利用光辐射扫描光学记录载体中的信息面的扫描装置,它包括一个提供扫描束的辐射源和一个把扫描束聚焦到信息面中扫描点的物镜,其特征在于:物镜包括一透明体,透明体对着辐射源的一面与第一表面邻接,远离辐射源的一面与第二表面邻接,所说的第一表面有一第一辐射窗,此窗绕物镜光轴中心定位,第一表面还有一向内反射的第一反射镜,此镜装在第一辐射窗周围,所说的第二表面有一向内反射的第二反射镜,此镜绕物镜光轴中心定位,第二表面还有一位于第二反射镜周围的第二辐射窗,从辐射源到记录载体的扫描束的辐射路径是:经第一辐射窗进入物镜,在第二反射镜和第一反射镜上反射改变方向,最后穿过第二辐射窗离开物镜。
2、权利要求1的扫描装置,其特征在于第一反射镜为非球面弯曲。
3、权利要求1的扫描装置,其特征在于第一和第二反射镜为球面弯曲。
4、权利要求3中的扫描装置,其特征在于第二辐射窗也是球面弯曲。
5、权利要求1、2、3、或4中的扫描装置,其特征在于透明体至少由具有不同折射率材料制成的两部分组成。
6、权利要求1、2、3、4或5中的扫描装置,用于扫描反射信息面,扫描装置包括一个辐射敏感检测***,其特征在于物镜包括一分光器,它能空间分离幅射源来的光束与信息面的反射束。
7、权利要求6的扫描装置,其特征在于分光器由一光栅或一全息图组成。
8、权利要求7的扫描装置,其特征在于光栅或全息图是装在第二反射镜上的反射栅或反射全息图。
9、权利要求7的扫描装置,其特征在于光栅或全息图是第一辐射窗上装的透射栅或透射全息图。
10、权利要求7的扫描装置,其特征在于物镜的透明体由两部分互相连接组成,其中一部分对着另一部分的面上的光栅或全息图是透射栅或透射全息图。
11、权利要求7、8、9或10的扫描装置,其特征在于光栅或全息图至少由两个不同光栅参数的副栅组成。
12、权利要求7、8、9或10的扫描装置,其特征在于光栅或全息图的光栅周期是常数或呈线性变化。
13、前述任一权项的扫描装置,其特征在于辐射源光学连接到第一辐射窗。
14、前述任一权项的装有辐射敏感检测***的扫描装置,其特征是从信息面反射的辐射,穿过物镜后在辐射路径上的第一辐射窗上装有辐射敏感检测***。
15、由向里反射的,适用于前述任一权项的扫描装置的反射镜组成的透明体。
16、装配有权利要求1到14中任一权利要求的扫描装置的光学记录和/或再现仪。
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NL8701359 | 1987-06-11 | ||
NL8701359 | 1987-06-11 |
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CN1030319A true CN1030319A (zh) | 1989-01-11 |
CN1020215C CN1020215C (zh) | 1993-03-31 |
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CN88103420A Expired - Fee Related CN1020215C (zh) | 1987-06-11 | 1988-06-08 | 光学扫描装置 |
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US (1) | US4835380A (zh) |
EP (1) | EP0294902B1 (zh) |
JP (1) | JP2650967B2 (zh) |
KR (1) | KR0127482B1 (zh) |
CN (1) | CN1020215C (zh) |
AT (1) | ATE70654T1 (zh) |
CS (1) | CS401088A2 (zh) |
DD (1) | DD281673A5 (zh) |
DE (1) | DE3866959D1 (zh) |
ES (1) | ES2028988T3 (zh) |
HK (1) | HK76293A (zh) |
SG (1) | SG67193G (zh) |
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-
1988
- 1988-06-07 AT AT88201165T patent/ATE70654T1/de not_active IP Right Cessation
- 1988-06-07 EP EP88201165A patent/EP0294902B1/en not_active Expired - Lifetime
- 1988-06-07 ES ES198888201165T patent/ES2028988T3/es not_active Expired - Lifetime
- 1988-06-07 DE DE8888201165T patent/DE3866959D1/de not_active Expired - Lifetime
- 1988-06-08 CN CN88103420A patent/CN1020215C/zh not_active Expired - Fee Related
- 1988-06-08 DD DD88316545A patent/DD281673A5/de not_active IP Right Cessation
- 1988-06-09 JP JP63140647A patent/JP2650967B2/ja not_active Expired - Fee Related
- 1988-06-09 CS CS884010A patent/CS401088A2/cs unknown
- 1988-06-11 KR KR1019880007037A patent/KR0127482B1/ko not_active IP Right Cessation
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1993
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Also Published As
Publication number | Publication date |
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JP2650967B2 (ja) | 1997-09-10 |
DD281673A5 (de) | 1990-08-15 |
CS401088A2 (en) | 1991-09-15 |
EP0294902B1 (en) | 1991-12-18 |
ATE70654T1 (de) | 1992-01-15 |
EP0294902A1 (en) | 1988-12-14 |
DE3866959D1 (de) | 1992-01-30 |
US4835380A (en) | 1989-05-30 |
HK76293A (en) | 1993-08-06 |
KR0127482B1 (ko) | 1997-12-29 |
KR890001042A (ko) | 1989-03-18 |
ES2028988T3 (es) | 1992-07-16 |
JPS63313329A (ja) | 1988-12-21 |
SG67193G (en) | 1993-08-06 |
CN1020215C (zh) | 1993-03-31 |
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