CN102854435A - High-temperature electric leakage testing system for diodes - Google Patents
High-temperature electric leakage testing system for diodes Download PDFInfo
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- CN102854435A CN102854435A CN2012103156436A CN201210315643A CN102854435A CN 102854435 A CN102854435 A CN 102854435A CN 2012103156436 A CN2012103156436 A CN 2012103156436A CN 201210315643 A CN201210315643 A CN 201210315643A CN 102854435 A CN102854435 A CN 102854435A
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Abstract
The invention discloses a high-temperature electric leakage testing system for diodes. The high-temperature electric leakage testing system comprises a stabilized voltage supply, a sampling module, a dynamic scanning measuring circuit, an electric leakage setting circuit and a comparison outputting module, wherein the stabilized voltage supply provides output voltage for the sampling module; the dynamic scanning measuring circuit sequentially automatically measures different testing samples in the sampling module through an analog switch, and outputs measured values to the comparison outputting module; and moreover, the dynamic scanning measuring circuit compares each measured value with a value set by the electric leakage setting circuit in the comparison outputting module, and then outputs judgment results. The high-temperature electric leakage testing system specially used for measuring the diodes can replace the traditional and troublesome method of manually measuring leakage current of the diodes to detect whether the diodes are qualified or not, has the advantage of high measurement accuracy, and can realize manual single-button switching measurement and automatic measurement switching.
Description
Technical field
The present invention relates to a kind of test macro of electrical property, belong to the leakage tests system, especially diode high temperature leakage tests system.
Background technology
As one of the product of diode use amount maximum electronic energy-saving lamp, LED electricity-saving lamp with its high light efficiency, high colour developing, economize on electricity can, the fashionable whole world of long-life excellent properties.And the employed diode long-term work of electricity-saving lamp has higher requirement to the phase high-temperature behavior under hot environment, and the electrical properties in high temperatures of diode mainly is exactly the high-temperature current leakage of diode.Therefore diode production producer provides the high-temperature current leakage test data of this product to the diode product that provides the time, detects and will carry out supplied materials to the high-temperature electric leakage current characteristic of product when using producer to the product supplied materials.
But owing to not having testing apparatus and the instrument of special detection diode high-temperature current leakage on the market, thereby use very loaded down with trivial details high-temperature test chamber, high-tension current, leakage tests instrument to add the manual switching sample and measure, exist many defectives such as test is very loaded down with trivial details, test sample book quantity is very limited, measuring accuracy is limited.And use producer's test to be difficult to especially realize.
Summary of the invention
Technical matters to be solved by this invention is for above problem, proposes a kind of testing tool that is specifically designed to the measuring diode high-temperature current leakage, i.e. a kind of diode high temperature leakage tests system.
The present invention is for solving the problems of the technologies described above by the following technical solutions:
A kind of diode high temperature leakage tests system comprises stabilized voltage supply, specimen sample module, dynamic scan metering circuit, electric leakage initialization circuit, comparison output module; Wherein, described stabilized voltage supply provides output voltage to the specimen sample module; Described dynamic scan metering circuit is measured the different test sample books in the specimen sample module successively automatically by analog switch, and outputting measurement value is to comparing output module; Simultaneously, the dynamic scan metering circuit compares the setting value of described measured value and described electric leakage initialization circuit in comparing output module, then export result of determination.
Further, a kind of diode high temperature leakage tests of the present invention system, described stabilized voltage supply adopts the high pressure adjustable stabilized voltage supply, comprises power supply, input sampling circuit, comparator circuit, voltage follower circuit; Wherein, described input sampling circuit is sampled to line voltage, sampled result and supply voltage is compared in comparator circuit draw comparative result, and voltage follower circuit changes the output voltage size according to comparative result.
Further, a kind of diode high temperature leakage tests of the present invention system, described specimen sample module comprises test sample frame, holding circuit, current sampling circuit; Wherein, described test sample frame is used for putting the Test Diode sample; When the dynamic scan metering circuit by analog switch control wherein during a certain test sample book path; described holding circuit is protected to the output voltage of this test sample book and from the leakage current that this test sample book flows out, and described current sampling circuit is sampled to the leakage current of this test sample book.
Further, a kind of diode high temperature leakage tests of the present invention system, described holding circuit comprises comparer, the first amplifier and reference power supply; The output voltage of test sample book compares in comparer with reference power supply after by the first amplifier; The leakage current that flows out from test sample book compares comparer with reference power supply after by the first amplifier; When output voltage or leakage current surpass reference value, then control this test sample book circuit by analog switch and disconnect.
Further, a kind of diode high temperature leakage tests of the present invention system, described current sampling circuit is the measuring resistance sampling, namely each test sample book connects a sampling resistor, each sampling resistor stabilivolt in parallel.
Further, a kind of diode high temperature leakage tests of the present invention system, described dynamic scan circuit comprises clock generator, counter, code translator, the analog switch that connects successively; Wherein, described clock generator clocking, this clock signal access counter produces a binary number, so that each clock count is once; Be sent to analog switch after the binary number decoding of code translator with gained, select relevant passage.
Further, a kind of diode high temperature leakage tests of the present invention system, described analog switch is noncontacting switch, is comprised of 3 CD4067 chips.
Further, a kind of diode high temperature leakage tests of the present invention system, described relatively output module comprises the second amplifier, comparison output circuit, judges output indicating device and measures display device; Wherein, access measurement display device showed after the measured value of described dynamic scan metering circuit amplified through the second amplifier; Simultaneously, compare by comparing output circuit through the leakage current setting value of the measured value after the amplification of the second amplifier with the electric leakage initialization circuit, by comparing output circuit comparative result is exported to the judgement output indicating device.
Further, a kind of diode high temperature leakage tests of the present invention system, described judgement output indicating device comprises visual alarm and voice guard.
Further, a kind of diode high temperature leakage tests of the present invention system, described voltage follower circuit is relay.
The present invention adopts above technical scheme compared with prior art, has following technique effect:
Native system adopts the adjustable high voltage regulated power supply of simulation, reduce electronic interferences, voltage stabilization, raising measuring accuracy, the effect of native system is simulated adjustable high voltage regulated power supply and is adopted the voltage difference of automatically identifying on the adjustment device to carry out step-by-step movement control inputs voltage, to reach the power consumption on the control adjustment device, improve power-efficient; Adopt the dynamic scan metering circuit, realize a manual key handover measurement and automatically switch measuring.Swift and convenient to operate; Native system uses analog switch, has the characteristics such as switch speed is fast, reliable and stable, the life-span is long, noiseless.
Description of drawings
Fig. 1 is diode leakage test system module figure;
Fig. 2 is diode leakage tester test philosophy figure;
Fig. 3 is specimen sample module principle figure;
Fig. 4 is the stabilized voltage supply schematic diagram;
Fig. 5 is the holding circuit schematic diagram;
Fig. 6 is the dynamic scan circuit schematic diagram;
Fig. 7 is comparison output module schematic diagram.
Embodiment
Below in conjunction with accompanying drawing technical scheme of the present invention is described in further detail:
In conjunction with shown in Figure 2, a kind of diode high temperature leakage tests of the present invention system comprises stabilized voltage supply such as Fig. 1, specimen sample module, dynamic scan metering circuit, electric leakage initialization circuit and output module relatively.Power module of voltage regulation provides output voltage to the specimen sample module; The dynamic scan metering circuit is switched for sample, and different samples in the sampling module are measured successively automatically according to number order; Output module compares and outputting measurement value and relatively rear result of determination by comparing for the setting value of electric leakage setting module and the measured value that the dynamic scan metering circuit draws.
Adopt the high pressure adjustable stabilized voltage supply such as Fig. 4 stabilized voltage supply, comprise input sampling circuit, comparator circuit and voltage follower circuit; In the analog input mode.Because the required stable high voltage of this instrument, thus need to carry out the voltage stabilizing rectification, with scope be 320V ~ 1600V voltage commutation for the highest 1500V about.Input sampling circuit is converted into low-voltage to transformer line voltage being carried out the dividing potential drop sampling after the sampling, sampled result and output voltage are compared on year-on-year basis comparative result pilot relay conversion gear after the step-down.Output voltage is divided to do 5 gears, every 300V one gear of output voltage.Because line voltage is 220V, can't reach the first gear stepped voltage value, therefore, the first gear comparative voltage is made as is 250V.
Comprise test sample frame, holding circuit and current sampling circuit such as Fig. 3 specimen sample module.The test sample frame is used for putting sample, and with its numbering, place in circuit; When the dynamic scan metering circuit by analog switch control wherein during a certain sample path; the electric current that the high pressure adjustable stabilized voltage supply provides is by behind this sample; holding circuit is protected to output voltage and from the leakage current that sample flows out, and sample circuit is sampled to the sample leakage current.Comprise after comparer, amplifier and reference power supply output voltage are by amplifier such as Fig. 5 holding circuit and to compare at comparer with reference power supply; The leakage current that flows out from sample compares at comparer with reference power supply after by amplifier; If output electricity or electric current surpass reference value, then circuit disconnects.If sample damage, then automatic cutout connects, and prevents that electric current or voltage are excessive and burns out circuit.
Current sampling circuit is the measuring resistance sampling, and each sample connects a sampling resistor, each sampling resistor stabilivolt in parallel.Reverse leakage current is with 1% measuring resistance, and stabilivolt can guarantee to protect when current oscillation aanalogvoltage is protected.
Comprise clock generator, counter, code translator, analog switch such as Fig. 6 dynamic scan circuit, the clock generator clocking, clock signal access counter so that each clock count once, is selected the analog switch passage with the binary number of gained by decoder for decoding.Analog switch is noncontacting switch, adopts 3 CD4067 chips, totally 48 passages, and wherein 44 passages link to each other with the specimen sample module, and a passage in other 4 passages links to each other with the leakage current initialization circuit.Because being 11 one group for the routine test of the qualified detection of diode, manufacturer samples, so this test macro can carry out 1 to 4 group test.
Comprise amplifier, comparison output circuit, judge output indicating device and measure display device such as Fig. 7 comparison output module, the measured value of dynamic scan metering circuit amplifies by amplifier, the result who amplifies exports to the judgement output indicating device by after relatively output circuit and leakage current setting value compare with Output rusults; After the measured value of dynamic scan metering circuit amplified by amplifier simultaneously, the result directly was shown to the measurement display device.Judge that output indicating device comprises visual alarm and voice guard, visual alarm is a red led and a green indicating lamp, and red led is defective indication, and green indicating lamp is qualified indication, if product is defective, hummer vibration sounding simultaneously then.
Claims (10)
1. a diode high temperature leakage tests system is characterized in that: comprise stabilized voltage supply, specimen sample module, dynamic scan metering circuit, electric leakage initialization circuit, comparison output module; Wherein, described stabilized voltage supply provides output voltage to the specimen sample module; Described dynamic scan metering circuit is measured the different test sample books in the specimen sample module successively automatically by analog switch, and outputting measurement value is to comparing output module; Simultaneously, the dynamic scan metering circuit compares the setting value of described measured value and described electric leakage initialization circuit in comparing output module, then export result of determination.
2. a kind of diode high temperature leakage tests according to claim 1 system, it is characterized in that: described stabilized voltage supply adopts the high pressure adjustable stabilized voltage supply, comprises power supply, input sampling circuit, comparator circuit, voltage follower circuit; Wherein, described input sampling circuit is sampled to line voltage, sampled result and supply voltage is compared in comparator circuit draw comparative result, and voltage follower circuit changes the output voltage size according to comparative result.
3. a kind of diode high temperature leakage tests according to claim 1 system, it is characterized in that: described specimen sample module comprises test sample frame, holding circuit, current sampling circuit; Wherein, described test sample frame is used for putting the Test Diode sample; When the dynamic scan metering circuit by analog switch control wherein during a certain test sample book path; described holding circuit is protected to the output voltage of this test sample book and from the leakage current that this test sample book flows out, and described current sampling circuit is sampled to the leakage current of this test sample book.
4. a kind of diode high temperature leakage tests according to claim 3 system, it is characterized in that: described holding circuit comprises comparer, the first amplifier and reference power supply; The output voltage of test sample book compares in comparer with reference power supply after by the first amplifier; The leakage current that flows out from test sample book compares comparer with reference power supply after by the first amplifier; When output voltage or leakage current surpass reference value, then control this test sample book circuit by analog switch and disconnect.
5. a kind of diode high temperature leakage tests according to claim 3 system, it is characterized in that: described current sampling circuit is the measuring resistance sampling, and namely each test sample book connects a sampling resistor, each sampling resistor stabilivolt in parallel.
6. a kind of diode high temperature leakage tests according to claim 1 system, it is characterized in that: described dynamic scan circuit comprises clock generator, counter, code translator, the analog switch that connects successively; Wherein, described clock generator clocking, this clock signal access counter produces a binary number, so that each clock count is once; Be sent to analog switch after the binary number decoding of code translator with gained, select relevant passage.
7. a kind of diode high temperature leakage tests according to claim 6 system, it is characterized in that: described analog switch is noncontacting switch, is comprised of 3 CD4067 chips.
8. a kind of diode high temperature leakage tests according to claim 1 system, it is characterized in that: described relatively output module comprises the second amplifier, comparison output circuit, judges output indicating device and measures display device; Wherein, access measurement display device showed after the measured value of described dynamic scan metering circuit amplified through the second amplifier; Simultaneously, compare by comparing output circuit through the leakage current setting value of the measured value after the amplification of the second amplifier with the electric leakage initialization circuit, by comparing output circuit comparative result is exported to the judgement output indicating device.
9. a kind of diode high temperature leakage tests according to claim 8 system, it is characterized in that: described judgement output indicating device comprises visual alarm and voice guard.
10. a kind of diode high temperature leakage tests according to claim 2 system, it is characterized in that: described voltage follower circuit is relay.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210315643.6A CN102854435B (en) | 2012-08-31 | 2012-08-31 | High-temperature electric leakage testing system for diodes |
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| CN201210315643.6A CN102854435B (en) | 2012-08-31 | 2012-08-31 | High-temperature electric leakage testing system for diodes |
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| CN102854435A true CN102854435A (en) | 2013-01-02 |
| CN102854435B CN102854435B (en) | 2014-06-18 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104459502A (en) * | 2013-09-22 | 2015-03-25 | 中国振华集团永光电子有限公司 | Electrical parameter testing device and method for current regulating diodes |
| CN109991521A (en) * | 2019-04-04 | 2019-07-09 | 惠州雷曼光电科技有限公司 | Light emitting diode detection circuit and device |
| CN113176490A (en) * | 2021-05-06 | 2021-07-27 | 天津市中环电子计算机有限公司 | Method for evaluating and testing service life of screen of industrial all-in-one machine |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459502A (en) * | 2013-09-22 | 2015-03-25 | 中国振华集团永光电子有限公司 | Electrical parameter testing device and method for current regulating diodes |
| CN109991521A (en) * | 2019-04-04 | 2019-07-09 | 惠州雷曼光电科技有限公司 | Light emitting diode detection circuit and device |
| CN109991521B (en) * | 2019-04-04 | 2021-01-22 | 惠州雷曼光电科技有限公司 | Light emitting diode detection circuit and device |
| CN113176490A (en) * | 2021-05-06 | 2021-07-27 | 天津市中环电子计算机有限公司 | Method for evaluating and testing service life of screen of industrial all-in-one machine |
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| CN102854435B (en) | 2014-06-18 |
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