CN2773698Y - Insulating resistance tester of 30 loop thin-membrane capacitor - Google Patents
Insulating resistance tester of 30 loop thin-membrane capacitor Download PDFInfo
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- CN2773698Y CN2773698Y CN 200520025219 CN200520025219U CN2773698Y CN 2773698 Y CN2773698 Y CN 2773698Y CN 200520025219 CN200520025219 CN 200520025219 CN 200520025219 U CN200520025219 U CN 200520025219U CN 2773698 Y CN2773698 Y CN 2773698Y
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Abstract
The utility model relates to an insulating resistance tester for thirty thin-membrane capacitors, which is composed of an outer shell, a panel, a main control board and an inserting board correspondingly provided with a test clamp which are connected; the circuit of the main control board is provided with a DC test power supply part and a test circuit part, wherein the DC test power supply part comprises a high-voltage AC commutation filtering circuit, a switch circuit, a partial pressure output circuit, a regulation circuit and a test voltage output circuit; the test part comprises a test voltage circuit, a signal amplification circuit, a comparator circuit, a result output circuit, a multiplying factor control circuit, a digital-to-analogue converter circuit and a reference voltage circuit. The tester adopts a common test power supply of a rapid charging on a voltage aspect, and one loop test voltage can be simultaneously used by thirty loops. On the aspect of multiplying power control, the test multiplying power of each loop adopts a miniature relay to control and to convert; a relay is completely isolated from a test circuit in electricity, which is favorable to improve test accuracy of the tester. The tester can simultaneously and fast test thirty capacitors, with high efficiency, energy saving and low cost.
Description
Technical field
The utility model relates to the capacitor insulation resistance proving installation, particularly a kind of No. 30 thin film capacitor Insulation Resistance Testers.
Background technology
At present, the capacitor insulation resistance tester that generally uses of electron trade can only be tested the insulation resistance of single channel capacitor mostly.No matter how soon detection speed has, and also can only detect single capacitor simultaneously; If think to detect simultaneously many capacitors, will work simultaneously by standby many Insulation Resistance Testers.So not only increase the input amount of workload and instrument and equipment, strengthen production cost simultaneously.And simply many testers are scrabbled up an Insulation Resistance Tester, also can increase the volume of testing tool, and make its reliability, stability be difficult to guarantee.For the thin film capacitor production of industrialization enterprise, this test link will restrict the normal operation of whole production streamline.
The utility model content
The purpose of this utility model is to overcome above-mentioned weak point, provides a kind of and can test 30 containers simultaneously, and the selection of 30 drive tests examination parameter is adopted No. 30 thin film capacitor Insulation Resistance Testers of unified control.
The technical scheme that the utility model adopted is for achieving the above object: a kind of No. 30 thin film capacitor Insulation Resistance Testers, connecting institute by shell, panel, master control borad and the corresponding test fixture plate that is provided with constitutes, the master control borad circuit is provided with DC test power supply and test circuit two parts, it is characterized in that the DC test power unit comprises high pressure AC current rectifying and wave filtering circuit, on-off circuit, branch voltage follower circuit, adjusts circuit and five unit of test voltage output circuit; Connect on-off circuit, divide voltage follower circuit by high pressure AC current rectifying and wave filtering circuit, the branch voltage follower circuit connects respectively adjusts circuit and test voltage output circuit, adjust circuit and be connected with on-off circuit, the test voltage output circuit is connected with the part of detecting of master control borad circuit; Test circuit partly comprises test voltage circuit, signal amplification circuit, comparator circuit, output circuit, multiplying power control circuit, D/A converting circuit, seven unit of reference voltage circuit as a result; The test voltage circuit, the multiplying power control circuit connects signal amplification circuit, reference voltage circuit linking number analog conversion circuit, D/A converting circuit connects comparator circuit, comparator circuit connects output circuit as a result, it between test voltage circuit and the signal amplification circuit test lead, connect test fixture plate test lead respectively, two of output circuit kinds of way of outputs are as a result: the one, and whether every drive test test result passes through the diode displaying by test fixture, and the 2nd, the resistance value on every road is shown by the tester panel.
Described DC test power unit adopts the common test power supply of rapid charging, and its mesohigh AC current rectifying and wave filtering circuit is by diode D5, D6, D7, D8, resistance R 13, and capacitor C 6, C7, C8, C9, C11, switching tube Q1 connects to form; On-off circuit is by diode D9, D10, D11, D12, capacitor C 10, C17, C12, C18, C13, C15, C14, C16, resistance R 14, R15, R16, R17, switching tube Q2, Q3, Q4, the integrated U2 of voltage stabilizing (LM7812), optocoupler U3, U4 (4N25) form; Bleeder circuit is by resistance R 18～R29, and capacitor C 20 connects to form, and sets three kinds of test voltages, is respectively 500V, 250V, 100V; The selection of test voltage output, promptly the output to 30 capacity measurement voltages is to control realization by relay K 3, K4; The test voltage output circuit connects the test voltage circuit of master control borad circuit test circuit part.
Described multiplying power control circuit unit is made of multiplying power control and discharge circuit, and the multiplying power control circuit is made up of relay K 1, K2, capacitor C 1, resistance R 1, R2, R3, R4, R5; The multiplying power on every road adopts the relay control transformation, and relay K 1, K2 change with the contact feedback resistance R1, R2, R3, R4, the R5 of test circuit first order amplifier U1, when multiplying power is 10
2The time, K1, K2 adhesive; When multiplying power is 10
3The time, the K1 adhesive, K2 resets; When multiplying power is 10
4The time, K1, K2 reset; Test circuit first order discharge circuit is by resistance R 6, R8～R12, capacitor C 2～C5, and diode D1～D4 connects to form, and first order amplifier U1 output enters second level amplifier, and the relay K 1 in the multiplying power control circuit, K2 meet first order amplifier U1.
The beneficial effects of the utility model are: the utility model adopts the common test power supply of rapid charging aspect voltage, and promptly 1 tunnel test voltage can be used for 30 the tunnel simultaneously.Aspect multiplying power control, the test multiplying power on every road adopts the miniature relay control transformation, and relay is isolated fully with test circuit on electric, the measuring accuracy of favourable raising tester.This thin film capacitor Insulation Resistance Tester can be tested 30 capacitors simultaneously fast.Compare with common Insulation Resistance Tester, efficient can improve 30 times.The testing standard standard, reliable and stable, high conformity.When enhancing productivity, reduce production costs greatly.For the thin film capacitor production of industrialization enterprise, this tester is that prerequisite has been created in the normal operation of whole production streamline as the key of test link.
Description of drawings
Fig. 1 is the utility model circuit block diagram;
Fig. 2 is the utility model DC test power unit circuit theory diagrams;
Fig. 3 is the multiplying power control unit circuit schematic diagram in the utility model test circuit part.
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, details are as follows to embodiment, structure, feature that foundation the utility model provides:
Referring to Fig. 1, Fig. 2, this tester connects institute by shell, panel, master control borad and the corresponding test fixture plate that is provided with and constitutes, the master control borad circuit is provided with DC test power supply and test circuit two parts, it is characterized in that the DC test power unit comprises high pressure AC current rectifying and wave filtering circuit 1.1, on-off circuit 1.2, branch voltage follower circuit 1.3, adjusts circuit 1.4 and 1.5 5 unit of test voltage output circuit; Connect on-off circuit 1.2, divide voltage follower circuit 1.3 by high pressure AC current rectifying and wave filtering circuit 1.1, divide voltage follower circuit 1.3 to connect respectively and adjust circuit 1.4 and test voltage output circuit 1.5, adjust circuit 1.4 and be connected with on-off circuit 1.2, test voltage output circuit 1.5 is connected with the part of detecting of master control borad circuit; Test circuit partly comprises test voltage circuit 2.1, signal amplification circuit 2.2, comparator circuit 2.3, output circuit 2.4, multiplying power control circuit 2.5, D/A converting circuit 2.6,2.7 7 unit of reference voltage circuit as a result; Test voltage circuit 2.1, multiplying power control circuit 2.5 connects signal amplification circuit 2.2, reference voltage circuit 2.7 linking number analog conversion circuits 2.6, D/A converting circuit 2.6 connects comparator circuit 2.3, comparator circuit 2.3 connects output circuit 2.4 as a result, be test lead between test voltage circuit 2.1 and the signal amplification circuit 2.2, connect test fixture plate test lead respectively, output circuit 2.4 has two kinds of way of outputs as a result: the one, and whether every drive test test result passes through the diode displaying by test fixture, and the 2nd, the resistance value on every road is shown by the tester panel.
Described direct supply partly adopts the common test power supply of rapid charging, and by high pressure AC current rectifying and wave filtering circuit 1.1, on-off circuit 1.2, branch voltage follower circuit 1.3, adjustment circuit 1.4 and 1.5 5 unit of test voltage output circuit are formed.Its mesohigh AC current rectifying and wave filtering circuit 1.1 is by diode D5, D6, D7, D8, resistance R 13, and capacitor C 6, C7, C8, C9, C11, switching tube Q1 connects to form; On-off circuit 1.2 is mainly connected to form by Q2, Q3, Q4; Divide voltage follower circuit 1.3 by resistance R 18～R29, capacitor C 20 connects to form, and sets three kinds of test voltages, is respectively 500V, 250V, 100V; The selection of test voltage output, promptly the output to 30 capacity measurement voltages is to control realization by relay K 3, K4; The test voltage output circuit connects the test voltage circuit of master control borad circuit test part.Referring to Fig. 2,, after high pressure AC480V passes through diode D5, D6, D7, D8 rectification, produce stable high voltage direct current through the active power filtering of forming by capacitor C 6, C7, C8, C9, C11 resistance R 13, switching tube Q1 in high pressure AC rectifying and wave-filtering part.Diode D9, the D10 of on-off circuit, D11, D12, capacitor C 10, C17, C12, C18, the integrated U2 of voltage stabilizing (LM7812), optocoupler U3 (4N25), resistance R 14 are formed switching tube Q2 base drive circuit, carry out voltage sampling by R16, feed back to the adjustment circuit, the adjustment circuit is a prior art, adjust circuit output signal to U3, thus the base drive voltage of gauge tap pipe Q2 output Q4.By capacitor C 13, C15, C14, C16, resistance R 15, R16, R17, switching tube Q3, the switching tube Q4 base drive circuit that optocoupler U4 forms, carry out voltage sampling by the bleeder circuit of forming by resistance R 18～R29 and feed back to the adjustment circuit, adjust circuit output and adjust signal, thereby control Q4 output test voltage is to dividing voltage follower circuit to U4.The test voltage output circuit control that 100V, the 250V of output, 500V test voltage are made up of relay K 1, K2.Wherein the on-off circuit of mainly being made up of switching tube Q2, Q3, Q4 plays a key effect to 30 electric capacity while rapid charges.
Described multiplying power control circuit unit 2.5 is made of multiplying power control and discharge circuit, and the multiplying power control circuit is made up of relay K 1, K2, capacitor C 1, resistance R 1, R2, R3, R4, R5; The multiplying power on every road adopts the relay control transformation, and relay K 1, K2 change with the contact feedback resistance R1, R2, R3, R4, the R5 of test circuit first order amplifier U1, when multiplying power is 10
2The time, K1, K2 adhesive; When multiplying power is 10
3The time, the K1 adhesive, K2 resets; When multiplying power is 10
4The time, K1, K2 reset; Test circuit first order discharge circuit is by resistance R 6, R8～R12, capacitor C 2～C5, and diode D1～D4 connects to form, and first order amplifier U1 output enters second level amplifier, and the relay K 1 in the multiplying power control circuit, K2 meet first order amplifier U1.Referring to Fig. 3, test signal is input to the first order amplifier based on amplifier U1 (CA3140), and the feedback resistance of first order amplifier is made up of R1～R5, by relay K 1, K2 R1～R5 is carried out different connections, just can obtain corresponding 10
2, 10
3, 10
4Multiplying power control.
The test of thin film capacitor insulation resistance is mainly used two parameters: multiplying power, voltage.The utility model is aspect multiplying power control, and the test multiplying power on every road adopts the miniature relay control transformation, and relay is isolated fully with test circuit on electric, the measuring accuracy of favourable raising tester.Aspect voltage, adopt the common test power supply of rapid charging, promptly 1 tunnel test voltage can be simultaneously for 30 tunnel uses, change 1 tunnel test voltage and have just changed 30 tunnel test voltage.Amid all these factors, the utility model has adopted unified control criterion to 30 drive tests examination parameter, is an Insulation Resistance Tester that Ji30Lu is an one.
The components and parts model that adopts in the circuit is with reference to as follows: it is C1942 that switching tube Q1, Q2, Q3, Q4 adopt model, it is 1N4001 that diode D1～D4 adopts model, it is 1N548 that diode D5～D12 adopts model, it is CA3140 that amplifier U1 adopts model, it is LM7812 that the integrated U2 of voltage stabilizing adopts model, and it is 4N25 that optocoupler U3, U4 adopt model.
No. 30 thin film capacitor Insulation Resistance Testers that relate in the utility model embodiment can be formed according to the circuit of same design concept as required, increase or reduce the test way of setting, all should belong within the invention scope.
Claims (3)
1, a kind of No. 30 thin film capacitor Insulation Resistance Testers, connecting institute by shell, panel, master control borad and the corresponding test fixture plate that is provided with constitutes, the master control borad circuit is provided with DC test power supply and test circuit two parts, it is characterized in that the DC test power unit comprises high pressure AC current rectifying and wave filtering circuit, on-off circuit, branch voltage follower circuit, adjusts circuit and five unit of test voltage output circuit; Connect on-off circuit, divide voltage follower circuit by high pressure AC current rectifying and wave filtering circuit, the branch voltage follower circuit connects respectively adjusts circuit and test voltage output circuit, adjust circuit and be connected with on-off circuit, the test voltage output circuit is connected with the part of detecting of master control borad circuit; Test circuit partly comprises test voltage circuit, signal amplification circuit, comparator circuit, output circuit, multiplying power control circuit, D/A converting circuit, seven unit of reference voltage circuit as a result; The test voltage circuit, the multiplying power control circuit connects signal amplification circuit, reference voltage circuit linking number analog conversion circuit, D/A converting circuit connects comparator circuit, comparator circuit connects output circuit as a result, it between test voltage circuit and the signal amplification circuit test lead, connect test fixture plate test lead respectively, two of output circuit kinds of way of outputs are as a result: the one, and whether every drive test test result passes through the diode displaying by test fixture, and the 2nd, the resistance value on every road is shown by the tester panel.
2, No. 30 thin film capacitor Insulation Resistance Testers according to claim 1, it is characterized in that described DC test power unit adopts the common test power supply of rapid charging, its mesohigh AC current rectifying and wave filtering circuit is by diode D5, D6, D7, D8, resistance R 13, capacitor C 6, C7, C8, C9, C11, switching tube Q1 connects to form; On-off circuit is by diode D9, D10, D11, D12, capacitor C 10, C17, C12, C18, C13, C15, C14, C16, resistance R 14, R15, R16, R17, switching tube Q2, Q3, Q4, the integrated U2 of voltage stabilizing (LM7812), optocoupler U3, U4 (4N25) form; Bleeder circuit is by resistance R 18～R29, and capacitor C 20 connects to form, and sets three kinds of test voltages, is respectively 500V, 250V, 100V; The selection of test voltage output, promptly the output to 30 capacity measurement voltages is to control realization by relay K 3, K4; The test voltage output circuit connects the test voltage circuit of master control borad circuit test part.
3, No. 30 thin film capacitor Insulation Resistance Testers according to claim 1, it is characterized in that described multiplying power control circuit unit is made of multiplying power control and discharge circuit, the multiplying power control circuit is made up of relay K 1, K2, capacitor C 1, resistance R 1, R2, R3, R4, R5; The multiplying power on every road adopts the relay control transformation, and relay K 1, K2 change with the contact feedback resistance R1, R2, R3, R4, the R5 of test circuit first order amplifier U1, when multiplying power is 102, and K1, K2 adhesive; When multiplying power is 103, the K1 adhesive, K2 resets; When multiplying power was 104, K1, K2 resetted; Test circuit first order discharge circuit is by resistance R 6, R8～R12, capacitor C 2～C5, and diode D1～D4 connects to form, and first order amplifier U1 output enters second level amplifier, and the relay K 1 in the multiplying power control circuit, K2 meet first order amplifier U1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520025219 CN2773698Y (en) | 2005-01-28 | 2005-01-28 | Insulating resistance tester of 30 loop thin-membrane capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520025219 CN2773698Y (en) | 2005-01-28 | 2005-01-28 | Insulating resistance tester of 30 loop thin-membrane capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2773698Y true CN2773698Y (en) | 2006-04-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200520025219 Expired - Fee Related CN2773698Y (en) | 2005-01-28 | 2005-01-28 | Insulating resistance tester of 30 loop thin-membrane capacitor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2773698Y (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101833038A (en) * | 2010-04-13 | 2010-09-15 | 中国科学院长春光学精密机械与物理研究所 | Conductive grid relative resistance contact measuring heads on deep concave curved surface and measuring method thereof |
| CN102854435A (en) * | 2012-08-31 | 2013-01-02 | 南通市通州区华昌电子有限公司 | High-temperature electric leakage testing system for diodes |
| CN107621572A (en) * | 2013-11-22 | 2018-01-23 | 三菱电机株式会社 | Insulation detector and electronic equipment |
| CN107656164A (en) * | 2017-10-16 | 2018-02-02 | 东莞市杰发电子有限公司 | Capacitor detecting system |
| CN108344916A (en) * | 2017-10-16 | 2018-07-31 | 东莞市弘富瑞电子有限公司 | Thin-film capacitor tests mechanism |
| CN110441612A (en) * | 2019-07-26 | 2019-11-12 | 深圳市峰泳科技有限公司 | Fexible film capacitor's capacity test macro and method |
| CN110927463A (en) * | 2019-12-20 | 2020-03-27 | 李彦吉 | Insulation resistance tester for safety tools and instruments |
-
2005
- 2005-01-28 CN CN 200520025219 patent/CN2773698Y/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101833038A (en) * | 2010-04-13 | 2010-09-15 | 中国科学院长春光学精密机械与物理研究所 | Conductive grid relative resistance contact measuring heads on deep concave curved surface and measuring method thereof |
| CN101833038B (en) * | 2010-04-13 | 2012-07-25 | 中国科学院长春光学精密机械与物理研究所 | Conductive grid relative resistance contact measuring heads on deep concave curved surface and measuring method thereof |
| CN102854435A (en) * | 2012-08-31 | 2013-01-02 | 南通市通州区华昌电子有限公司 | High-temperature electric leakage testing system for diodes |
| CN107621572A (en) * | 2013-11-22 | 2018-01-23 | 三菱电机株式会社 | Insulation detector and electronic equipment |
| CN107621572B (en) * | 2013-11-22 | 2020-06-19 | 三菱电机株式会社 | Insulation detector and electronic device |
| CN107656164A (en) * | 2017-10-16 | 2018-02-02 | 东莞市杰发电子有限公司 | Capacitor detecting system |
| CN108344916A (en) * | 2017-10-16 | 2018-07-31 | 东莞市弘富瑞电子有限公司 | Thin-film capacitor tests mechanism |
| CN108344916B (en) * | 2017-10-16 | 2023-10-24 | 东莞市弘富瑞电子有限公司 | Thin film capacitor experiment mechanism |
| CN110441612A (en) * | 2019-07-26 | 2019-11-12 | 深圳市峰泳科技有限公司 | Fexible film capacitor's capacity test macro and method |
| CN110927463A (en) * | 2019-12-20 | 2020-03-27 | 李彦吉 | Insulation resistance tester for safety tools and instruments |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060419 |