CN102830293A - Method and system for quickly calibrating field uniformity of transient electromagnetic field - Google Patents
Method and system for quickly calibrating field uniformity of transient electromagnetic field Download PDFInfo
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- CN102830293A CN102830293A CN2012103094853A CN201210309485A CN102830293A CN 102830293 A CN102830293 A CN 102830293A CN 2012103094853 A CN2012103094853 A CN 2012103094853A CN 201210309485 A CN201210309485 A CN 201210309485A CN 102830293 A CN102830293 A CN 102830293A
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- test bar
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- probe
- transient electromagnetic
- calibration plane
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Abstract
The invention discloses a method and a system for quickly calibrating field uniformity of transient electromagnetic field. The method includes the steps of selecting apexes of a rectangular calibrating plane as measuring points; placing a rotary shaft (2) at the center of the calibrating plane, adjusting a positioning device (4) to limit a test bar (3) in the calibrating plane, and selecting length of the test bar (3) to enable a probe (6) to reach the apexes of the calibrating planes; rotating the test bar (3) in the calibrating plane to enable the probe (6) to locate at the apexes of the calibrating plane respectively, and using the probe (6) to measure values of field intensity of the apexes of the calibrating plane. The method and the system require no frequent movement of a support for supporting and fixing the probe, and after the support is fixed, repeated adjustment of the specific position and angle of the probe on the support is not needed. The method and the system are simple in calibrating process, fast in calibration and short in calibrating time.
Description
Technical field
The present invention relates to the collimation technique field of the field uniformity of electromagnetic field, particularly a kind of method and system of quickly calibrated transient electromagnetic field field uniformity.
Background technology
In the prior art, the calibration steps of transient electromagnetic field field uniformity and system usually need the frequent position that be used to support with the support of static probe of moving; And after the stationkeeping of support, also need the particular location of adjustment probe on support repeatedly.Therefore, the calibration steps of prior art and system exist calibration process complicated, loaded down with trivial details, and calibration speed is slow, calibrates the problem of length consuming time.
At present, be starved of that a kind of process is easy, speed is fast, the calibration steps and the system of the transient electromagnetic field field uniformity of weak point consuming time.
Summary of the invention
The system that the purpose of this invention is to provide a kind of quickly calibrated transient electromagnetic field field uniformity.
Another object of the present invention provides a kind of method of quickly calibrated transient electromagnetic field field uniformity.
The system of quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises support bar, rotating shaft, reference test bar, locating device, probe and oscillograph; The top of said support bar is located in said rotating shaft; One end of said reference test bar is installed in the said rotating shaft and can rotates around said rotating shaft; Said probe is fixed in the free end of said reference test bar, and said probe is electrically connected with said oscillograph, and the junction of said reference test bar and said rotating shaft is provided with said locating device; Said locating device is used for said reference test bar is limited in the plane at said reference test bar place, and can make said reference test bar fixing at an arbitrary position.
Preferably, said system also comprises the base affixed with the bottom of said support bar.
Preferably, the adjustable height of said support bar.
Preferably, said system also comprises the length adjustment device of being located on the said reference test bar, is used to regulate the length of said reference test bar.
The method of quickly calibrated transient electromagnetic field field uniformity provided by the invention adopts the system of described quickly calibrated transient electromagnetic field field uniformity, and this method comprises the steps:
The summit of selected rectangle calibration plane is a measurement point;
Said rotating shaft is placed the center of calibration plane, make said reference test bar be limited in the calibration plane, make said probe can arrive each place, summit of calibration plane through the length of selecting said reference test bar through said adjusting locating device;
In calibration plane, rotate said reference test bar, make said probe lay respectively at each place, summit of calibration plane, obtain the field intensity value at each place, summit of calibration plane through said probe measurement.
The length of preferably, regulating said reference test bar through said length adjustment device makes said probe can arrive each summit of calibration plane.
Preferably, said rectangle calibration plane comprises square calibration plane.
The present invention has following beneficial effect:
(1) compare with system with the calibration steps of prior art, said method and system do not need frequent to move the position that is used to support with the support of static probe, and after the stationkeeping of support, do not need to adjust repeatedly the particular location of probe on support yet;
(2) calibration process of said method and system is easy, and calibration speed is fast, calibrates weak point consuming time.
Description of drawings
The synoptic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 1 provides for the embodiment of the invention 1;
The process flow diagram of the method for the quickly calibrated transient electromagnetic field field uniformity that Fig. 2 provides for various embodiments of the present invention;
The synoptic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 3 provides for the embodiment of the invention 2;
The synoptic diagram of the method and system of the quickly calibrated transient electromagnetic field field uniformity that Fig. 4 provides for the embodiment of the invention 3.
Embodiment
Below in conjunction with accompanying drawing and embodiment summary of the invention of the present invention is done further to describe.
Embodiment 1:
The system of the quickly calibrated transient electromagnetic field field uniformity that present embodiment provides comprises support bar 1, rotating shaft 2, reference test bar 3, locating device 4, base 5, probe 6 and oscillograph 7, and is as shown in Figure 1.The top of support bar 1 is located in rotating shaft 2.The bottom of support bar 1 and base 5 are affixed.In the present embodiment, the height of support bar 1 is for example adjustable.One end of reference test bar 3 is installed in the rotating shaft 2 and can 2 rotates around the shaft.Probe 6 is fixed in the free end of reference test bar 3, and pops one's head in and 6 be electrically connected with oscillograph 7.Reference test bar 3 is provided with locating device 4 with the junction of rotating shaft 2.Locating device 4 is used for reference test bar 3 is limited in the plane at reference test bar 3 places, and can make reference test bar 3 fixing at an arbitrary position.In the present embodiment, the length of reference test bar 3 is for example non-adjustable, need be according to the length of the size Selection reference test bar 3 of calibration plane.
As depicted in figs. 1 and 2, the method for the quickly calibrated transient electromagnetic field field uniformity that present embodiment provides adopts said system, and this method comprises the steps:
S1: four summits of selected rectangle calibration plane ABCD are that A, B, C and D point are measurement point;
S2: the center that the rotating shaft 2 of above-mentioned calibration system is placed rectangle calibration plane ABCD; Make reference test bar 3 be limited in the calibration plane ABCD through regulating locating device 4, make probe 6 can arrive each place, summit of calibration plane ABCD through the length of selecting reference test bar 3;
S3: in calibration plane ABCD, rotate reference test bar 3, make probe 6 lay respectively at each place, summit of calibration plane ABCD, through pop one's head in 6 measure each place, summit of calibration plane ABCD respectively field intensity value E
A, E
B, E
CAnd E
D
The field intensity value E at each place, summit of the calibration plane ABCD that said method obtains
A, E
B, E
CAnd E
DBe used to analyze and estimate the field uniformity of the transient electromagnetic field of calibration plane ABCD.
Embodiment 2:
The system of the quickly calibrated transient electromagnetic field field uniformity that present embodiment provides comprises support bar 1, rotating shaft 2, reference test bar 3, locating device 4, base 5, probe 6, oscillograph 7 and length adjustment device 8, and is as shown in Figure 3.The top of support bar 1 is located in rotating shaft 2.The bottom of support bar 1 and base 5 are affixed.In the present embodiment, the height of support bar 1 is for example adjustable.One end of reference test bar 3 is installed in the rotating shaft 2 and can 2 rotates around the shaft.Probe 6 is fixed in the free end of reference test bar 3, and pops one's head in and 6 be electrically connected with oscillograph 7.Reference test bar 3 is provided with locating device 4 with the junction of rotating shaft 2.Locating device 4 is used for reference test bar 3 is limited in the plane at reference test bar 3 places, and can make reference test bar 3 fixing at an arbitrary position.Length adjustment device 8 is located on the reference test bar 3, is used to regulate the length of reference test bar 3.
As shown in Figures 2 and 3, the method for the quickly calibrated transient electromagnetic field field uniformity that present embodiment provides adopts said system, and this method comprises the steps:
S1: selected for example four summits of square calibration plane FGHI are that F, G, H and I point are measurement point;
S2: the center that the rotating shaft 2 of above-mentioned calibration system is placed calibration plane FGHI; Make reference test bar 3 be limited in the calibration plane FGHI through regulating locating device 4, make probe 6 can arrive each place, summit of calibration plane FGHI through the length of regulating reference test bar 3;
S3: in calibration plane FGHI, rotate reference test bar 3, make probe 6 lay respectively at each place, summit of calibration plane FGHI, through pop one's head in 6 measure each place, summit of calibration plane FGHI respectively field intensity value E
F, E
G, E
HAnd E
I
The field intensity value E at each place, summit of the calibration plane FGHI that said method obtains
F, E
G, E
HAnd E
IBe used to analyze and estimate the field uniformity of the transient electromagnetic field of calibration plane FGHI.
Embodiment 3:
Present embodiment adopts the system of the quickly calibrated transient electromagnetic field field uniformity identical with embodiment 2.
As shown in Figure 4, the selected for example foursquare first calibration plane JKLM, and be directed against the field intensity value E that this calibration plane employing embodiment 2 described calibration stepss obtain J, K, L and M point place
J, E
K, E
LAnd E
MThe selected foursquare second calibration plane NOPQ, and four summits of the second calibration plane NOPQ for example are respectively the mid point on each limit of the first calibration plane JKLM.To the second calibration plane NOPQ, adopt embodiment 2 described calibration stepss to obtain the field intensity value E at N, O, P and Q point place
N, E
O, E
PAnd E
QThe field intensity value E that said method obtains
J, E
K, E
L, E
M, E
N, E
O, E
PAnd E
QBe used to analyze and estimate the field uniformity of the transient electromagnetic field of the first calibration plane JKLM.The field intensity value E that said method obtains
N, E
O, E
PAnd E
QBe used to analyze and estimate the field uniformity of the transient electromagnetic field of the second calibration plane NOPQ.
Compare with system with the calibration steps of prior art, said method and system do not need frequent to move the position that is used to support with the support of static probe, and after the stationkeeping of support, do not need to adjust repeatedly the particular location of probe on support yet.The calibration process of said method and system is easy, and calibration speed is fast, calibrates weak point consuming time.
Should be appreciated that the above detailed description of technical scheme of the present invention being carried out by preferred embodiment is schematic and nonrestrictive.Those of ordinary skill in the art is reading on the basis of instructions of the present invention and can make amendment to the technical scheme that each embodiment put down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these are revised or replacement, do not make the spirit and the scope of the essence disengaging various embodiments of the present invention technical scheme of relevant art scheme.
Claims (7)
1. the system of quickly calibrated transient electromagnetic field field uniformity; It is characterized in that; This system comprises support bar (1), rotating shaft (2), reference test bar (3), locating device (4), probe (6) and oscillograph (7); The top of said support bar (1) is located in said rotating shaft (2), and an end of said reference test bar (3) is installed in the said rotating shaft (2) and can rotates around said rotating shaft (2), and said probe (6) is fixed in the free end of said reference test bar (3); And said probe (6) is electrically connected with said oscillograph (7); Said reference test bar (3) is provided with said locating device (4) with the junction of said rotating shaft (2), and said locating device (4) is used for said reference test bar (3) is limited in the plane at said reference test bar (3) place, and can make said reference test bar (3) fixing at an arbitrary position.
2. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, said system also comprises the base (5) affixed with the bottom of said support bar (1).
3. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, the adjustable height of said support bar (1).
4. the system of quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, said system also comprises the length adjustment device of being located on the said reference test bar (3) (8), the length that is used to regulate said reference test bar (3).
5. the method for quickly calibrated transient electromagnetic field field uniformity, this method adopts the system of the described quickly calibrated transient electromagnetic field field uniformity of claim 1, it is characterized in that this method comprises the steps:
The summit of selected rectangle calibration plane is a measurement point;
Said rotating shaft (2) is placed the center of calibration plane; Make said reference test bar (3) be limited in the calibration plane through said adjusting locating device (4), make said probe (6) can arrive each place, summit of calibration plane through the length of selecting said reference test bar (3);
In calibration plane, rotate said reference test bar (3), make said probe (6) lay respectively at each place, summit of calibration plane, measure the field intensity value at each place, summit of calibration plane through said probe (6).
6. the method for quickly calibrated transient electromagnetic field field uniformity according to claim 5 is characterized in that, the length of regulating said reference test bar (3) through said length adjustment device (8) makes said probe (6) can arrive each summit of calibration plane.
7. the method for quickly calibrated transient electromagnetic field field uniformity according to claim 5 is characterized in that, said rectangle calibration plane comprises square calibration plane.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309485.3A CN102830293B (en) | 2012-08-27 | 2012-08-27 | Method and system for quickly calibrating field uniformity of transient electromagnetic field |
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| CN201210309485.3A CN102830293B (en) | 2012-08-27 | 2012-08-27 | Method and system for quickly calibrating field uniformity of transient electromagnetic field |
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| CN102830293B CN102830293B (en) | 2014-11-12 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103645455A (en) * | 2013-12-19 | 2014-03-19 | 北京无线电计量测试研究所 | Probe calibration device |
| CN107121600A (en) * | 2017-06-07 | 2017-09-01 | 中国工程物理研究院应用电子学研究所 | A kind of automatic testing equipment for testing aerial radiation field uniformity |
| CN109613343A (en) * | 2018-12-05 | 2019-04-12 | 北京无线电计量测试研究所 | A kind of quasi-optical measuring system and method for terahertz emission body normal emittance |
| CN111337756A (en) * | 2020-04-24 | 2020-06-26 | 中国人民解放军63892部队 | Method for evaluating electric field uniformity of test region of pulse excitation reverberation chamber |
| CN111551794A (en) * | 2020-06-11 | 2020-08-18 | 中国人民解放军军事科学院国防工程研究院工程防护研究所 | Simple field uniformity testing device and testing method thereof |
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| CN102590642A (en) * | 2012-02-29 | 2012-07-18 | 北京无线电计量测试研究所 | Calibrating method and system for field uniformity of transient electromagnetic field |
| CN102608558A (en) * | 2012-03-31 | 2012-07-25 | 上海市计量测试技术研究院 | Radiation field uniformity calibration positioner |
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Patent Citations (5)
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| JPH07270468A (en) * | 1994-03-31 | 1995-10-20 | Otsuka Sci Kk | Electromagnetic wave reflecting desk |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103645455A (en) * | 2013-12-19 | 2014-03-19 | 北京无线电计量测试研究所 | Probe calibration device |
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| CN107121600A (en) * | 2017-06-07 | 2017-09-01 | 中国工程物理研究院应用电子学研究所 | A kind of automatic testing equipment for testing aerial radiation field uniformity |
| CN107121600B (en) * | 2017-06-07 | 2023-04-07 | 中国工程物理研究院应用电子学研究所 | Automatic testing device for testing uniformity of antenna radiation field |
| CN109613343A (en) * | 2018-12-05 | 2019-04-12 | 北京无线电计量测试研究所 | A kind of quasi-optical measuring system and method for terahertz emission body normal emittance |
| CN109613343B (en) * | 2018-12-05 | 2020-10-27 | 北京无线电计量测试研究所 | Quasi-optical measurement system and method for normal emissivity of terahertz radiator |
| CN111337756A (en) * | 2020-04-24 | 2020-06-26 | 中国人民解放军63892部队 | Method for evaluating electric field uniformity of test region of pulse excitation reverberation chamber |
| CN111551794A (en) * | 2020-06-11 | 2020-08-18 | 中国人民解放军军事科学院国防工程研究院工程防护研究所 | Simple field uniformity testing device and testing method thereof |
| CN111551794B (en) * | 2020-06-11 | 2022-06-28 | 中国人民解放军军事科学院国防工程研究院工程防护研究所 | Simple field uniformity testing device and testing method thereof |
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| CN102830293B (en) | 2014-11-12 |
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