CN103645455B - Probe correcting device - Google Patents
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- CN103645455B CN103645455B CN201310705549.6A CN201310705549A CN103645455B CN 103645455 B CN103645455 B CN 103645455B CN 201310705549 A CN201310705549 A CN 201310705549A CN 103645455 B CN103645455 B CN 103645455B
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Abstract
The invention discloses a kind of probe correcting device, this calibrating installation includes positioning datum dish, the first sizing stop and the second sizing stop；First sizing stop includes the first support column that the first support chassis, one end are arranged in the first support chassis and the first measurement assembly being arranged on the first support column other end；Second sizing stop includes the second support column that the second support chassis, one end are arranged in the second support chassis and the second measurement assembly being arranged on the second support column other end；Positioning datum dish is connected by the first connecting plate and the first sizing stop, and first connecting plate one end is hinged with positioning datum dish, the other end and the fixing connection of the first support chassis；First sizing stop is connected by the second connecting plate and the second sizing stop, and one end of the second connecting plate is hinged with the first support chassis, and the other end and the second support chassis are hinged.By i.e. adjustable probe positions the most in rotary moving, thus improve measuring accuracy, operating efficiency.
Description
Technical field
The present invention relates to a kind of probe calibration support, utilize three rotary shafts to carry out particularly to one
The probe calibration support of many test surfaces many test positions points.
Background technology
Along with the development of science and technology, a large amount of electronic apparatus application are at military hardware, civilian installation
Aspect, electromagnetic pulse energy once invades, and can make the electronic component failure in equipment or permanent
Damage, cause large-scale Command, Control, Communications systemic breakdown.Electromagnetic pulse is of short duration wink
The strong electromagnetic radiation phenomenon become, electromagnetic pulse has spontaneous that also have artificial manufacture, the most often
The spontaneous electromagnetic pulse seen is Lightning Electromagnetic Pulse and static discharge electromagnetic pulse.Artificial
Electromagnetic pulse be divided into again nuclear explosion electrical measurement pulse and ordinary electromagnetic pulse.The electricity that nuclear explosion produces
Magnetic field impulse peak electric field is up to 50～100kV/m, and the military power of the world such as the United States, Russia is all being carried out
The exploitation of high power microwave weapon, electromagnetic pulse bomb is exactly the ELECTROMAGNETIC WEAPON of a kind of new ideas, though
So electromagnetic pulse duration is the ofest short duration, but the energy of abrupt release is huge.No matter which kind of
The EMP Coupling that mode of excitation produces all can be to electronic devices and components, line after entering electronic system
Road or even whole system produce impact, and system can be made time serious to suffer that destruction is paralysed, and power network breaks
Road, metal pipe line and buried cable communication network etc. are all affected, thus are absorbed in non-transformer, nothing
Communication, without computer three without the world, its destructive power is known as " the second atom bomb ".
How to improve the electromagnetic pulse-resisting performance of military issue weapons in wartime, equipment and civil equipment, protect
Card equipment can continue normal work after by electromagnetic impulse radiation and become the emphasis of research.The U.S.
With Russia, electromagnetic pulse is had extensively, in-depth study, and attach great importance to weaponry electricity
Subenvironment effect and protective reinforcing technology, and research and development electromagnetic pulse weapon of doing one's utmost.Meanwhile,
They have had multiple large-scale electromagnetic pulse test system except the base as scientific research
Outside Infrastructure, it is mainly used in testing effect and the protection of various electronic system of electromagnetic pulse weapon
Ability.
In order to carry out the inspection of the electromagnetic pulse-resisting ability such as electrical and electronic product, weaponry, examine
Core and examination, the U.S. takes the lead in proposing radiosensitivity examination in American army mark MIL-STD-461F
Proved recipe method, China defines national military standard GJB151A/GJB152A with reference to this standard, therein
RS105 test item, the method for specified in more detail electromagnetic pulse test and grade.American army mark 461F
The test position point that field uniformity of transient electromagnetic field is required by middle RS105 pilot project is, transmission
Four summits of the square homogeneous area on 1 meter of linear distance ground and center point, wherein center
Location point is reference point, and during test, reference probe position remains stationary as.Current laboratory test
When device carries out the test of multiposition point in the Different Plane of space, major part is all the most simply to survey
Bar, is entered by the position of probe on the position of constantly artificial mobile test frame and testing jig
Row test, mobile test frame can introduce displacement error frequently, and operating efficiency is the lowest simultaneously.
When space plane region and space multistory domain test, conventional detection calibration frame, in addition it is also necessary to
Carry out certain mobile test that just can complete whole location point, through movement calibrated mount also
Need to re-start origin reference location, practical operation still exists certain regulation error, with
Time too increase workload, still have much room for improvement in terms of measuring accuracy and operating efficiency.
Summary of the invention
The defect existed for above-mentioned prior art, the technical problem to be solved is to carry
For a kind of transient electromagnetic field three rotary shaft probe calibration support, it is possible not only to improve during test true
Determine the efficiency of location point, but also can guarantee that the degree of accuracy and the degree of reliability of location.
For solving above-mentioned technical problem, the transient electromagnetic field three rotary shaft probe calibration of the present invention props up
Frame includes, including positioning datum dish, the first sizing stop and the second sizing stop；
Described first sizing stop includes that the first support chassis, one end are arranged on the first support chassis
On the first support column and be arranged on the first support column other end first measurement assembly；
Described second sizing stop includes that the second support chassis, one end are arranged on the second support chassis
On the second support column and be arranged on the second support column other end second measurement assembly；
Described positioning datum dish is connected by the first connecting plate and the first sizing stop, and described first
Connecting plate one end is hinged with described positioning datum dish, and the other end and the first support chassis are fixing even
Connect；
Described first sizing stop by the connection of the second connecting plate and the second sizing stop, described the
One end of two connecting plates is hinged with the first support chassis, and the other end and the second support chassis are hinged；
Described first measures assembly includes the first measurement cross bar and is disposed thereon and is sequentially connected with
The first field intensity probe, the first balun and the first photoelectric conversion module, described second measure assembly
Including the second measurement cross bar and the second field intensity probe being disposed thereon and being sequentially connected with, the second bar
Human relations and the second photoelectric conversion module.
It is additionally provided with the ground probe locating support of level in described second support chassis, pops one's head in describedly
One end of locating support is connected with the second support chassis, and another termination is positioned at the second field intensity probe and erects
On central axis.
Described positioning datum dish is provided with the first hole, location, and described first connecting plate is provided with and institute
State the first alignment pin that the first hole, location coupling is corresponding；Described first support chassis is provided with second
Hole, location, it is fixed that described second connecting plate is provided with second corresponding with described second hole, location coupling
Position pin；Second support chassis is provided with the 3rd hole, location, and described second connecting plate is provided with and institute
State the 3rd alignment pin that the 3rd hole, location coupling is corresponding；The center of described positioning datum dish is provided with base
Quasi-hole.
Between vertical central axis and the first support column axis of described first field intensity probe away from
From for 45.2cm, the vertical central axis of described second field intensity probe and the second support column axis
Between distance be 45.2cm, the vertical central axis of described positioning datum dish and first support
Distance between mast axis is 45.2cm, and described first support column axis and second supports axis of a cylinder
Distance range between line is 60～90cm.
Distance between described first support column axis and the second support column axis is 60cm.
Distance between described first support column axis and the second support column axis is 90cm.
Described first hole, location includes the first hole, the second hole and the 3rd hole, described first hole and the
Angle between two holes is 45 degree, and the angle between the second hole and the 3rd hole is 45 degree；Described
Second hole, location includes the 4th hole and the 5th hole, the angle model between described 4th hole and the 5th hole
Enclose is 178～176 degree；Described 3rd location hole include the 6th hole, seven apertures in the human head, octal and
9th hole, the angular range between described 6th hole and seven apertures in the human head is 26～40 degree, seven apertures in the human head
And the angular range between octal is 156～144 degree, the folder between octal and the 9th hole
Angular region is 26～40 degree.
Angle between described 4th hole and the 5th hole is 178 degree, described 6th hole and seven apertures in the human head
Between angle be 26 degree, the angle between seven apertures in the human head and octal is 156 degree, octal
And the angle between the 9th hole is 26 degree.
Angle between described 4th hole and the 5th hole is 176 degree, described 6th hole and seven apertures in the human head
Between angle be 40 degree, the angle between seven apertures in the human head and octal is 144 degree, octal
And the angle between the 9th hole is 40 degree.
Described first support column is height-adjustable structure, and described second support column is adjustable
The structure of height.
The bottom surface of described origin reference location dish is provided with sucker.
It is uniformly arranged 3 around the center of circle on the bottom surface of described first support chassis and the second support chassis
Individual multi-directional ball.
After using said structure, probe correcting device of the present invention is surveyed in field uniformity of transient electromagnetic field
During examination, the test of transient electromagnetic field area of space field uniformity can be completed by simple rotation
Test.Decrease and repeatedly move the measure error adjusting probe positions attitude and introduce, improve and survey
Examination precision, and then improve operating efficiency；And achieve a calibrating installation can meet not
With the test request of field uniformity of transient electromagnetic field standard, improve the applicability of sizing stop.
In the design invention, all of rotating part all has fixing by gross bearings device, improves the accurate of location
Degree and the degree of reliability.
The present invention is with low cost, simple in construction.The all of multi-directional ball being rotated through bottom is carried out
Rotate, it is achieved that each several part rotation and the stable operation of revolution.Reduce mobile operating procedure, subtract
Few error, improves measuring accuracy and operating efficiency.
Accompanying drawing explanation
Below in conjunction with the accompanying drawings the detailed description of the invention of the present invention is described in further detail.
Fig. 1 is the structural representation of the present invention
Fig. 2 is the structural representation of the first sizing stop in the present invention.
Fig. 3 is the top view of the first sizing stop in the present invention.
Fig. 4 is the structural representation of the second sizing stop in the present invention.
Fig. 5 is the top view of the second sizing stop in the present invention.
Fig. 6 is the top view of the positioning datum dish in the present invention.
Fig. 7 is the front view of RS105 test system.
Fig. 8 is the top view of RS105 test system.
Fig. 9 is present invention stereogram when carrying out planar survey.
Figure 10 is present invention top view when carrying out planar survey.
Figure 11 is present invention stereogram when carrying out bulk measurement.
Figure 12 is present invention top view when carrying out bulk measurement.
Figure 13 is present invention stereogram when carrying out bulk measurement.
Figure 14 is present invention top view when carrying out bulk measurement.
Detailed description of the invention
Referring to figs. 1 through shown in Figure 14, a kind of probe correcting device, as it is shown in figure 1, this school
Standard apparatus includes the first sizing stop the 1, second sizing stop 2 and positioning datum dish 3；Location
Reference disk 3 is connected with the first support chassis 101 by the first connecting plate 4, the first connecting plate 4
One end hinged with positioning datum dish 3, the other end and the first support chassis 101 is fixing connects,
First connecting plate 4 is provided with first alignment pin 401 corresponding with the first hole, location coupling.Location
The distance that the vertical central axis of reference disk 3 and first supports between the axis of column jacket 102 is
45.2cm.First support chassis 101 is connected by the second connecting plate 5 and the second support chassis 201
Connecing, one end of the second connecting plate 5 is hinged with the first support chassis 101, the other end and second
Support chassis 201 is hinged.It is respectively equipped with on second connecting plate 5 and the second hole, location and the 3rd location
The second alignment pin 501 and the 3rd alignment pin 502 that hole coupling is corresponding.After using such structure,
First sizing stop 1 can rotate around positioning datum dish 3, and the second sizing stop 2 can enclose
Rotate around the first sizing stop 1.
As in figure 2 it is shown, described first support column is height-adjustable structure, the first calibration
Frame 1 includes that the first support chassis 101, first supports column jacket 102, first and supports inner prop 103
Measuring assembly 104 with first, first measures assembly 104 includes the first measurement cross bar 1041 He
The first field intensity probe 1042, first being sequentially connected with being arranged on the first measurement cross bar 1041
Balun 1043 and the first photoelectric conversion module 1044.First one end supporting column jacket 102 is arranged
In the center of the first support chassis 101, first one end supporting inner prop 103 inserts first
In support column jacket 102, and can slide up and down along the first madial wall supporting column jacket 102, first
Support inner prop 103 sidewall on and first support column jacket 102 sidewall on be respectively equipped with mate corresponding
Fixing hole, first supports the other end company fixing with the first support rail 1041 of inner prop 103
Connect.Use after this spline structure that the height of the first sizing stop 1 can be with up-down adjustment, to adapt to not
Same test request.Support first and also set between column jacket 102 and the first measurement cross bar 1041
There is inclined support bar, in order to strengthen the stability of the first measurement cross bar 1041.First field intensity probe
The distance that the vertical central axis of 1042 and first supports between the axis of column jacket 102 is
45.2cm。
As it is shown on figure 3, the first support chassis 101 is provided with the second hole, location, the second hole, location bag
Include the 4th hole 1011 and the 5th hole 1012.
As shown in Figure 4, described second support column is height-adjustable structure, the second calibration
Frame 2 includes that the second support chassis 201, second supports column jacket 202, second and supports inner prop 203
Measuring assembly 204 with second, second measures assembly 204 includes the second measurement cross bar 2041 He
The second field intensity probe 2042, second being sequentially connected with being arranged on the second measurement cross bar 2041
Balun 2043 and the second photoelectric conversion module 2044.Second two ends supporting column jacket 202 are arranged
In the center of the second support chassis 202, second one end supporting inner prop 203 inserts second
In support column jacket 202, and can slide up and down along the second madial wall supporting column jacket 202, second
Support inner prop 203 sidewall on and second support column jacket 202 sidewall on be respectively equipped with mate corresponding
Fixing hole, second supports the other end company fixing with the second support rail 2041 of inner prop 203
Connect.Use after this spline structure that the height of the second sizing stop 2 can be with up-down adjustment, to adapt to not
Same test request.Support second and also set between column jacket 202 and the second measurement cross bar 2041
There is inclined support bar, in order to strengthen the stability of the second measurement cross bar 2041.Second field intensity probe
The distance that the vertical central axis of 2042 and second supports between the axis of column jacket 202 is
45.2cm.Second sizing stop 2 is popped one's head in locating support 205 with also including, probe location, ground
Frame 205 is in being horizontally disposed with, and its one end is connected with the second support chassis 201, and another termination is positioned at
On the vertical central axis of the second field intensity probe.
As it is shown in figure 5, the second support chassis 201 is provided with the 3rd hole, location, the 3rd hole, location bag
Include the 6th hole 2011, seven apertures in the human head 2012, octal 2013 and the 9th hole 2014.
As shown in Figure 6, positioning datum dish 3 is provided with the first hole, location, and the first hole, location includes
First the 301, second hole, hole 302 and the 3rd hole 303.First hole 301 and the second hole 302 it
Between angle be 45 degree, the angle between the second hole 302 and the 3rd hole 303 is 45 degree.Fixed
The center of position reference disk 3 is additionally provided with datum hole.It is additionally provided with on the bottom surface of positioning datum dish 3
Nonmetal sucker, for stationary positioned reference disk 3.
The survey that in American army mark 461F, field uniformity of transient electromagnetic field is required by RS105 pilot project
Examination location point is: square four summits of homogeneous area and center point, wherein center
Point is reference point, and during test, reference probe position remains stationary as.As shown in Figure 7,8, dotted line
Region is test zone.Probe correcting device test philosophy of the present invention: this device can carry out sky
Between single plane test, it is also possible to carry out spatial cuboids end points and body central point test, be suitable for
In different field uniformity of transient electromagnetic field standard test requirements.
Embodiment 1:
As Fig. 9,10 be the present invention plane OPMN is tested time schematic diagram.Plane
OPMN be the length of side be the square of 1 meter, first support column jacket 102 axis with second support
Distance between the axis of column jacket 202 is 60cm, and cross bar is measured in the 4th hole 1011 and first
Angle between the axis of 1041 is 89 degree, between the 4th hole 1011 and the 5th hole 1012
Angle is 178 degree, and the angle between the 6th hole 2011 and seven apertures in the human head 2012 is 26 degree, the
Angle between seven apertures in the human head 2012 and octal 2013 is 156 degree, octal 2013 and the 9th
Angle between hole 2014 is 26 degree.
When plane test position fix starts, first with the datum hole on positioning datum dish 3 and test
Localized ground orthogonal centre lines carries out origin reference location, and the first hole, location is on the right side of test plane, non-
Metal sucker positions.Adjust the angle of the first sizing stop 1 relative positioning benchmark pallet 3,
Make the first sizing stop 1 vertical with MN, and utilize the second hole 302 and the first alignment pin 401
First field intensity probe 1042 is carried out fixing by gross bearings, regulates the height of the first sizing stop 1 simultaneously
Degree, makes the first field intensity probe 1042 be centrally located at the center of plane OPMN.Again by adjusting
Whole second sizing stop 2, makes the second alignment pin 501 and the 4th hole on the second connecting plate 5
1011 overlap, and the 3rd alignment pin 502 overlaps with seven apertures in the human head 2012, adjust the second calibration simultaneously
The height of support 2 is 1 meter.Now the first field intensity probe 1042 is positioned at the face of plane OPMN
Central point, the second field intensity probe 2042 are positioned at O point and the termination of ground probe locating support 205
It is positioned at N point.
After O point test completes, need the second sizing stop 2 by being rotatably moved to P
Point is tested.Take off the second alignment pin 501, make the second sizing stop 2 around the first calibration
Support 1 turns clockwise 182 degree, makes the second alignment pin 501 overlap with the 5th hole 1012.
Again the 3rd alignment pin 502 is taken out, make the second sizing stop 2 support column jacket 202 around second
Axis both clockwise rotates 204 degree, makes the 3rd alignment pin 502 overlap with octal 2013.This
Time the second field intensity probe 2042 be positioned at P point and ground probe locating support 205 termination be positioned at M
Point.
The bottom surface of the first support chassis 101 and the second support chassis 201 is additionally provided with around all
3 multi-directional ball of cloth so that the movement of sizing stop is convenient.Whole sizing stop is in wink
During the test of Electromagnetic Field field uniformity, wink in 461F standard can be completed by simple rotation
Electromagnetic Field field uniformity requires the location point test in perpendicular.Survey is changed as tested needs
Examination plane, then re-start adjustment test by the position of conversion origin reference location dish 3.
Embodiment 2:
The present embodiment is with the difference of embodiment 1: when plane OPMN be the length of side be 1.5
Rice square time, the height adjusting the first sizing stop 1 is 0.75 meter, second calibration
The height of frame 2 is 1.5 meters.First axis supporting column jacket 102 and second supports column jacket 202
Axis between distance be 90cm, the axle of cross bar 1041 is measured in the 4th hole 1011 and first
Angle between line is 88 degree, and the angle between the 4th hole 1011 and the 5th hole 1012 is 176
Degree, the angle between the 6th hole 2011 and seven apertures in the human head 2012 is 40 degree, seven apertures in the human head 2012 with
Angle between octal 2013 is 144 degree, between octal 2013 and the 9th hole 2014
Angle be 40 degree.
Embodiment 3:
In field uniformity of transient electromagnetic field calibration operation, except RS105 in American army mark 461F
Outside pilot project, also has the test request of some other field uniformity of transient electromagnetic field.It is wanted
The test zone asked is cubical 8 summits and body midpoint.Figure 11 to Figure 14 is this
Bright schematic diagram time cube ABCDEFGH is tested.Cube ABCDEFGH
The length of side be 1 meter, the height adjusting the first sizing stop 1 is 0.5 meter, the second sizing stop
The height of 2 is 1 meter.First axis supporting column jacket 102 and second supports the axle of column jacket 202
Distance between line is 60cm, the 4th hole 1011 and first measure cross bar 1041 axis it
Between angle be 89 degree, the angle between the 4th hole 1011 and the 5th hole 1012 is 178 degree,
Angle between 6th hole 2011 and seven apertures in the human head 2012 is 26 degree, seven apertures in the human head 2012 and the 8th
Angle between hole 2013 is 156 degree, the folder between octal 2013 and the 9th hole 2014
Angle is 26 degree.
Eight summits and body central point for cube ABCDEFGH carry out location, position, fixed
Position reference disk 3 is that location mode is identical with face test.Datum hole on positioning datum dish 3 and survey
Examination localized ground orthogonal centre lines carries out origin reference location, the first hole, location towards BF line direction,
Nonmetal sucker positions.End points testing sequence is H-E, C-B, D-A, G-F.
One, H-E point location: the 3rd hole 303 and the first alignment pin 401 are overlapped, from
And the first field intensity probe 1042 is carried out fixing by gross bearings, then make the second alignment pin 501 with
4th hole 1011 overlaps, and the 3rd alignment pin 502 overlaps with the 6th hole 2011.Now
One field intensity probe 1042 is positioned at cube center, and the second field intensity probe 2042 is positioned at
Cubical end points H position, the termination of ground probe bracket 205 is positioned at E point position.
Two, C-B point location: by the second sizing stop 2 around the first sizing stop 1 center
Turn clockwise after 182 degree, make the second alignment pin 501 overlap with the 5th hole 1012,
Two sizing stops 2 self turn clockwise 152 degree again, make the 3rd alignment pin 502 and
Nine holes 2014 overlap.Now the second field intensity probe 2042 is positioned at cubical end points C point
It is positioned at B point with the termination of ground probe bracket 205.
Three, D-A point location: the first sizing stop 1 is in a good mood in positioning datum dish 3
Hour hands 90-degree rotation, makes the first alignment pin 401 overlap with the first hole 301, and now second
Field intensity probe 2042 is positioned at cubical end points D point and the position, termination of ground probe bracket 205
In A point.
Four, G-F point location: by the second sizing stop 2 around the first sizing stop 1 center
After rotating 182 degree counterclockwise, the second alignment pin 501 is made to overlap with the 4th hole 1011, the
Two sizing stops 2 self counterclockwise rotate 152 degree again, make the 3rd alignment pin 502 and the
Six holes 2011 overlap.Now the second field intensity probe 2042 is positioned at cubical end points G point
It is positioned at F point with the termination of ground probe bracket 205.
Embodiment 4:
The present embodiment is with the difference of embodiment 3: when the length of side of cube ABCDEFGH is
When 1.5 meters, the height adjusting the first sizing stop 1 is 0.75 meter, the second sizing stop 2
Height be 1.5 meters.First axis supporting column jacket 102 and second supports the axle of column jacket 202
Distance between line is 90cm, the 4th hole 1011 and first measure cross bar 1041 axis it
Between angle be 88 degree, the angle between the 4th hole 1011 and the 5th hole 1012 is 176 degree,
Angular range between 6th hole 2011 and seven apertures in the human head 2012 is 40 degree, seven apertures in the human head 2012 with
Angular range between octal 2013 is 144 degree, octal 2013 and the 9th hole 2014
Between angular range be 40 degree.
In whole test process, test point remains constant.Whole probe correcting device is in wink
During the test of Electromagnetic Field field uniformity, transient electromagnetic field space can be completed by simple rotation
The test of regional field uniformity test.Decrease repeatedly mobile adjustment probe positions attitude and introduce
Measure error, improve measuring accuracy, and then improve operating efficiency；And achieve one
Sizing stop can meet the test request of different field uniformity of transient electromagnetic field standard, improves
The applicability of sizing stop.
The word in the description orientation employed in Ben Wen " on ", D score, "left", "right" etc. all
For the convenience illustrated that is based on the orientation shown in drawing in accompanying drawing, in actual device
These orientation are likely to be due to the disposing way of device and different.
Above in conjunction with accompanying drawing, the detailed description of the invention of the present invention is explained in detail, but this
Bright it is not limited to above-mentioned embodiment, in the ken that those skilled in the art are possessed,
Can also various changes can be made without departing from the inventive concept of the premise.
Claims (10)
1. a probe correcting device, it is characterised in that: this calibrating installation includes positioning datum
Dish, the first sizing stop and the second sizing stop；
Described first sizing stop includes that the first support chassis, one end are arranged on the first support chassis
On the first support column and be arranged on the first support column other end first measurement assembly；
Described second sizing stop includes that the second support chassis, one end are arranged on the second support chassis
On the second support column and be arranged on the second support column other end second measurement assembly；
Described positioning datum dish is connected by the first connecting plate and the first sizing stop, and described first
Connecting plate one end is hinged with described positioning datum dish, and the other end and the first support chassis are fixing even
Connect；
Described first sizing stop by the connection of the second connecting plate and the second sizing stop, described the
One end of two connecting plates is hinged with the first support chassis, and the other end and the second support chassis are hinged；
Described first measures assembly includes the first measurement cross bar and is disposed thereon and is sequentially connected with
The first field intensity probe, the first balun and the first photoelectric conversion module, described second measure assembly
Including the second measurement cross bar and the second field intensity probe being disposed thereon and being sequentially connected with, the second bar
Human relations and the second photoelectric conversion module.
Calibrating installation the most according to claim 1, it is characterised in that: described second
It is additionally provided with the ground probe locating support of level, the one end of locating support of popping one's head on support chassis describedly
Being connected with the second support chassis, another termination is positioned on the second vertical central axis of field intensity probe.
Calibrating installation the most according to claim 1, it is characterised in that: described location base
Quasi-dish is provided with the first hole, location, and described first connecting plate is provided with and described first hole, location
The first alignment pin that pairing is answered；Described first support chassis is provided with the second hole, location, and described
Two connecting plates are provided with second alignment pin corresponding with described second hole, location coupling；Second supports
Chassis is provided with the 3rd hole, location, and described second connecting plate is provided with and described 3rd hole, location
The 3rd alignment pin that pairing is answered；The center of described positioning datum dish is provided with datum hole.
Calibrating installation the most according to claim 1, it is characterised in that: described first
Distance between vertical central axis and the first support column axis of strong probe is 45.2cm, institute
The distance stated between the vertical central axis of the second field intensity probe and the second support column axis is
45.2cm, between vertical central axis and the first support column axis of described positioning datum dish away from
From for 45.2cm, the distance model between described first support column axis and the second support column axis
Enclose is 60～90cm.
Calibrating installation the most according to claim 4, it is characterised in that: described first
Distance between dagger axis and the second support column axis is 60cm.
Calibrating installation the most according to claim 4, it is characterised in that: described first
Distance between dagger axis and the second support column axis is 90cm.
Calibrating installation the most according to claim 3, it is characterised in that: described first is fixed
Hole, position includes the first hole, the second hole and the 3rd hole, the angle between described first hole and the second hole
Being 45 degree, the angle between the second hole and the 3rd hole is 45 degree；Described second hole, location includes
4th hole and the 5th hole, the angular range between described 4th hole and the 5th hole is 178～176
Degree；Described 3rd hole, location includes the 6th hole, seven apertures in the human head, octal and the 9th hole, described the
Angular range between six holes and seven apertures in the human head is 26～40 degree, and between seven apertures in the human head and octal
Angular range is 156～144 degree, and the angular range between octal and the 9th hole is 26～40
Degree.
Calibrating installation the most according to claim 7, it is characterised in that: described 4th hole
And the angle between the 5th hole is 178 degree, the angle between described 6th hole and seven apertures in the human head is
26 degree, the angle between seven apertures in the human head and octal is 156 degree, between octal and the 9th hole
Angle be 26 degree.
Calibrating installation the most according to claim 7, it is characterised in that: described 4th hole
And the angle between the 5th hole is 176 degree, the angle between described 6th hole and seven apertures in the human head is
40 degree, the angle between seven apertures in the human head and octal is 144 degree, between octal and the 9th hole
Angle be 40 degree.
Calibrating installation the most according to claim 1, it is characterised in that: described first
Dagger is height-adjustable structure, and described second support column is height-adjustable structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310705549.6A CN103645455B (en) | 2013-12-19 | 2013-12-19 | Probe correcting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310705549.6A CN103645455B (en) | 2013-12-19 | 2013-12-19 | Probe correcting device |
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| Publication Number | Publication Date |
|---|---|
| CN103645455A CN103645455A (en) | 2014-03-19 |
| CN103645455B true CN103645455B (en) | 2016-08-24 |
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| CN201310705549.6A Expired - Fee Related CN103645455B (en) | 2013-12-19 | 2013-12-19 | Probe correcting device |
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| CN104567672B (en) * | 2014-12-25 | 2017-07-04 | 北京无线电计量测试研究所 | A kind of large-scale scanning frame for compact antenna test range system and the method for adjustment to the scanning support system space geometric sense |
| CN106441633B (en) * | 2016-09-28 | 2019-04-23 | 天津大学 | A kind of low latitude matrixing temperature and humidity sampling error caliberating device and scaling method |
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| CN108828485A (en) * | 2018-03-19 | 2018-11-16 | 北京无线电计量测试研究所 | A kind of field intensity probe omni-directional calibration system, method and holder device |
| CN108407728A (en) * | 2018-03-19 | 2018-08-17 | 李晓 | A kind of vehicle laser radar installation auxiliary device |
| CN109596898B (en) * | 2018-12-18 | 2021-11-16 | 北京无线电计量测试研究所 | Probe supporting device and concentric conical TEM chamber |
| CN111721347A (en) * | 2019-03-20 | 2020-09-29 | 深圳市道通科技股份有限公司 | Calibration support |
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