CN102759695A - Method and device for judging quality of silicon briquettes - Google Patents
Method and device for judging quality of silicon briquettes Download PDFInfo
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- CN102759695A CN102759695A CN201210237553XA CN201210237553A CN102759695A CN 102759695 A CN102759695 A CN 102759695A CN 201210237553X A CN201210237553X A CN 201210237553XA CN 201210237553 A CN201210237553 A CN 201210237553A CN 102759695 A CN102759695 A CN 102759695A
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Abstract
The embodiment of the invention discloses a method for judging quality of silicon briquettes. The method comprises the following steps: scanning a silicon briquette to obtain an all minority carrier lifetime distribution map of the silicon briquette; analyzing the all minority carrier lifetime distribution map to obtain the proportion of low minority carrier lifetime in the silicon briquette and the proportion of the low minority carrier lifetime in all intervals from the head to the tail of the silicon briquette; and judging the quality of the silicon briquette as per the proportion of low minority carrier lifetime in the silicon briquette and the proportion of the low minority carrier lifetime in all intervals from the head to the tail of the silicon briquette. The embodiment of the invention further includes a device for judging quality of silicon briquettes. Through the adoption of the device and the method, the entire quality of the silicon briquette can be judged accurately, and the output of low-efficiency silicon chips is effectively reduced.
Description
Technical field
The present invention relates to area of solar cell, relate in particular to a kind of judgement silico briquette method for quality and device.
Background technology
At present in the detection of casting polycrystalline silicon ingot; It is very important link that the minority carrier life time of silico briquette detects, and the size of minority carrier life time has characterized the electric property of silico briquette usually, after the silico briquette that minority carrier life time is low cuts into silicon chip; The conversion efficiency of solar cell of making is lower, is difficult to satisfy user's user demand.
Detection mode in the production procedure is at present mainly judged the quality of silico briquette through detecting minority carrier life time mean value, and judges the silico briquette length of required removal end to end through the minority carrier life time mean value interval of setting.And after silico briquette removed the suitable break area of head and afterbody, but have method preferably the quality of break area is not characterized.And the quality that adopts the average minority carrier lifetime of utilizing silico briquette in the prior art to characterize silico briquette is inaccurate, and still might cause some second-rate silico briquettes to flow to the flow process of section.
Summary of the invention
Embodiment of the invention technical matters to be solved is, a kind of judgement silico briquette method for quality and device are provided.Can judge the total quality of silico briquette more accurately, reduce the output of poor efficiency silicon chip effectively.
In order to solve the problems of the technologies described above, the embodiment of the invention provides a kind of judgement silico briquette method for quality, comprising: the scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette;
Analyze ratio that said full minority carrier life time distribution plan obtains hanging down in the said silico briquette shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody;
Reach the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette.
Wherein, obtain at said scanning silico briquette also comprising before the step of full minority carrier life time distribution plan of said silico briquette:
Chemical passivation is carried out on said silico briquette surface to be handled.
Wherein, the said full minority carrier life time distribution plan of said analysis obtain in the said silico briquette the shared ratio of low minority carrier life time and each from said silico briquette head to afterbody interval in step of ratio of low minority carrier life time comprise:
Adjusting said full minority carrier life time distribution plan is gray-scale map, wherein, shown in the gray-scale value of gray-scale map zones of different corresponding one by one with the life value of few son;
Calculate the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns in the said gray-scale map and each interval from said silico briquette head to afterbody, obtain shared ratio of low minority carrier life time in the said silico briquette and each from said silico briquette head to afterbody interval in ratio of low minority carrier life time.
Wherein, the said full minority carrier life time distribution plan of said analysis obtain in the said silico briquette the shared ratio of low minority carrier life time and each from said silico briquette head to afterbody interval in step of ratio of low minority carrier life time comprise:
From said full minority carrier life time distribution plan, read the 2-D data that full minority carrier life time distributes;
Calculate the ratio of hanging down the shared ratio of minority carrier life time and each interval interior low minority carrier life time in the said silico briquette from said silico briquette head to afterbody according to said 2-D data.
Wherein, said each interval interior ratio of hanging down minority carrier life time that reaches from said silico briquette head to afterbody according to the shared ratio of low minority carrier life time in the said silico briquette judges that the step of the quality of said silico briquette comprises:
In judgement each interval from said silico briquette head to afterbody, whether the shared ratio of said low minority carrier life time is less than proportion threshold value K;
If this interval in the then said silico briquette is that good quality is interval, keeps slices such as said good quality interval;
If not, this in the then said silico briquette is interval between the difference quality area, removes between said poor quality area.
Correspondingly, the embodiment of the invention also provides a kind of device of judging the silico briquette quality, comprising:
Scan module is used to scan the full minority carrier life time distribution plan that silico briquette obtains said silico briquette;
Analysis module is used for analyzing the ratio that said full minority carrier life time distribution plan obtains shared ratio of the low minority carrier life time of said silico briquette and each the interval interior low minority carrier life time from said silico briquette head to afterbody;
Judge module is used for reaching the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of the low minority carrier life time of said silico briquette.
Adopt high precision to line by line scan when wherein, said scan module scans said silico briquette.
Wherein, It is gray-scale map that said scan module is further used for adjusting said full minority carrier life time distribution plan; Wherein, Shown in the gray-scale value of gray-scale map zones of different corresponding one by one with the life value of few son; Said analysis module is further used for calculating the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns in the said gray-scale map and each interval from said silico briquette head to afterbody, obtain shared ratio of low minority carrier life time in the said silico briquette and each from said silico briquette head to afterbody interval in ratio of low minority carrier life time.
Wherein, Said analysis module also is used for reading the 2-D data that full minority carrier life time distributes from said full minority carrier life time distribution plan, calculates the ratio of hanging down shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody in the said silico briquette according to said 2-D data.
Wherein, said judge module is further used for judging in each interval from said silico briquette head to afterbody, and whether the shared ratio of said low minority carrier life time is less than proportion threshold value K;
If this interval in the then said silico briquette is that good quality is interval, keeps slices such as said good quality interval;
If not, this in the then said silico briquette is interval between the difference quality area, removes between said poor quality area.
Embodiment of the present invention embodiment has following beneficial effect:
Reach the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette; Replace the method for judging according to average minority carrier lifetime in the past; Judged result is more accurate; But and filled up blank to the break area quality characterization, reduced the output of poor efficiency silicon chip effectively; Through being carried out analytical calculation, the gray-scale map of full minority carrier life time distribution plan or 2-D data obtain low shared ratio and the residing zone of minority carrier life time in the silico briquette; For the accurate judgement of silico briquette quality provides foundation, and indicated slice position accurately for follow-up section flow process; Silico briquette through to different process production or processing detects, and compares according to the quality results of the different silico briquettes that obtain at last, for the process optimization of silico briquette production provides direction, helps in the subsequent production flow process, improves the total quality of silico briquette.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the first embodiment schematic flow sheet that the present invention judges the silico briquette method for quality;
Fig. 2 is the second embodiment schematic flow sheet that the present invention judges the silico briquette method for quality;
Fig. 3 is the 3rd embodiment schematic flow sheet that the present invention judges the silico briquette method for quality;
Fig. 4 is the 4th embodiment schematic flow sheet that the present invention judges the silico briquette method for quality;
Fig. 5 is the composition synoptic diagram that the embodiment of the invention is judged the device of silico briquette quality;
Fig. 6 is the full minority carrier life time distribution plan that adopts the said method scanning of third embodiment of the invention silico briquette a to obtain;
Fig. 7 is the full minority carrier life time distribution plan that adopts the said method scanning of third embodiment of the invention silico briquette b to obtain;
Fig. 8 is the gray-scale map of the silico briquette a that obtains after full minority carrier life time distribution plan shown in Figure 6 is handled;
Fig. 9 is the gray-scale map of the silico briquette b that obtains after full minority carrier life time distribution plan shown in Figure 7 is handled;
Figure 10 is that the silico briquette a that obtains after gray-scale map shown in Figure 8 is handled arrive ratio trend map that each of afterbody hangs down minority carrier life time in interval from the head;
Figure 11 is that the silico briquette b that obtains after gray-scale map shown in Figure 9 is handled arrive ratio trend map that each of afterbody hangs down minority carrier life time in interval from the head.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.
Please, judge the first embodiment schematic flow sheet of silico briquette method for quality for the present invention with reference to Fig. 1.Said judgement silico briquette method for quality may further comprise the steps:
S101, the scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette.
Wherein, said silico briquette is polysilicon block or type monocrystalline silico briquette.
S102 analyzes ratio that said full minority carrier life time distribution plan obtains hanging down in the said silico briquette shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody.
S103 reaches the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette.
Adopt the said method of present embodiment to judge the quality of silico briquette; Each the interval interior ratio of hanging down minority carrier life time that promptly reaches from said silico briquette head to afterbody according to the shared ratio of low minority carrier life time in the said silico briquette is judged; Replace the method for judging according to average minority carrier lifetime in the past; Judged result is more accurate, but and filled up the blank to the break area quality characterization, reduced the output of poor efficiency silicon chip effectively.
Please, judge the second embodiment schematic flow sheet of silico briquette method for quality for the present invention with reference to Fig. 2.Said judgement silico briquette method for quality may further comprise the steps:
S201 carries out chemical passivation to said silico briquette surface and handles.
Avoid said silico briquette in follow-up testing process oxidized corrosion to influence final testing result.
S202, the scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette.
S203 analyzes ratio that said full minority carrier life time distribution plan obtains hanging down in the said silico briquette shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody.
S204 reaches the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette.
Please, judge the 3rd embodiment schematic flow sheet of silico briquette method for quality for the present invention with reference to Fig. 3.Said judgement silico briquette method for quality may further comprise the steps:
S301 carries out chemical passivation to said silico briquette surface and handles.
S302, the scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette.
S303, adjusting said full minority carrier life time distribution plan is gray-scale map.
The gray-scale value of the zones of different of gray-scale map wherein, is corresponding one by one with the life value of few son.
S304; Calculate the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns in the said gray-scale map and each interval from said silico briquette head to afterbody, obtain shared ratio of low minority carrier life time in the said silico briquette and each from said silico briquette head to afterbody interval in ratio of low minority carrier life time.
S305 judges in each interval from said silico briquette head to afterbody, and whether the shared ratio of said low minority carrier life time is less than proportion threshold value K.If, execution in step S306 then, otherwise execution in step S307.
Wherein, the concrete numerical value of said proportion threshold value K changes because of the difference of enterprise or product to some extent.As the product of the last moulding of said silico briquette be used for military affairs or other require strict fashionable; The concrete numerical value of said proportion threshold value K can be set at 80% or higher; Be used for when civilian or commercial like the product of the last moulding of said silico briquette, a certain numerical value that the concrete numerical value of said proportion threshold value K then is set between the 40%-60% gets final product.
S306, this interval in the said silico briquette is that good quality is interval, keeps slices such as said good quality interval.
S307, this in the said silico briquette is interval between the difference quality area, removes between said poor quality area.
In the present embodiment; Through calculating the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns and each interval from said silico briquette head to afterbody; Obtain hanging down in the said silico briquette ratio of the shared ratio of minority carrier life time and each interval interior low minority carrier life time from said silico briquette head to afterbody; And then confirm low shared ratio and the residing zone of minority carrier life time, for the accurate judgement of silico briquette quality provides foundation, and indicated slice position accurately for follow-up section flow process.
Please, judge the 4th embodiment schematic flow sheet of silico briquette method for quality for the present invention with reference to Fig. 4.Said judgement silico briquette method for quality may further comprise the steps:
S401 carries out chemical passivation to said silico briquette surface and handles.
S402, the scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette.
S403 reads the 2-D data that full minority carrier life time distributes from said full minority carrier life time distribution plan.
S404 calculates the ratio of hanging down shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody in the said silico briquette according to said 2-D data.
S405 judges in each interval from said silico briquette head to afterbody, and whether the shared ratio of said low minority carrier life time is less than proportion threshold value K.If, execution in step S406 then, otherwise execution in step S407.
S406, this interval in the said silico briquette is that good quality is interval, keeps slices such as said good quality interval.
S407, this in the said silico briquette is interval between the difference quality area, removes between said poor quality area.
In the present embodiment; Through from said full minority carrier life time distribution plan, reading the 2-D data that full minority carrier life time distributes, calculate the ratio of hanging down the shared ratio of minority carrier life time and each interval interior low minority carrier life time in the said silico briquette from said silico briquette head to afterbody, and then definite low shared ratio and residing zone of minority carrier life time; Compare with the 3rd embodiment; This is implemented said method and obtains the result identical with the 3rd embodiment through the analysis to concrete 2-D data, and method is different, purpose with come to the same thing; The accurate judgement that is similarly the silico briquette quality provides foundation, and has indicated slice position accurately for follow-up section flow process.
Please, judge the composition synoptic diagram of the device of silico briquette quality for the embodiment of the invention with reference to Fig. 5.The device of said judgement silico briquette quality comprises: scan module 100, analysis module 200 and judge module 300.
Said scan module 100 is used to scan the full minority carrier life time distribution plan that silico briquette obtains said silico briquette; Said analysis module is used for analyzing the ratio that said full minority carrier life time distribution plan obtains shared ratio of the low minority carrier life time of said silico briquette and each the interval interior low minority carrier life time from said silico briquette head to afterbody; Said judge module is used for reaching the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of the low minority carrier life time of said silico briquette.
Please in the lump with reference to Fig. 6, Fig. 7, Fig. 8 and Fig. 9; The full minority carrier life time distribution plan of Fig. 6 for adopting the said method scanning of third embodiment of the invention silico briquette a to obtain; The full minority carrier life time distribution plan of Fig. 7 for adopting the said method scanning of third embodiment of the invention silico briquette b to obtain; The gray-scale map of the silico briquette b that the gray-scale map of the silico briquette a that Fig. 8 obtains after handling for full minority carrier life time distribution plan shown in Figure 6, Fig. 9 obtain after handling for full minority carrier life time distribution plan shown in Figure 7.
Wherein, said silico briquette a and said silico briquette b still adopt different casting ingot process to handle from the same position of silicon ingot.Utilize said scan module 100 said silico briquette a of scanning and silico briquette b to obtain Fig. 6 and full minority carrier life time distribution plan shown in Figure 7 respectively.Can detect the average minority carrier lifetime that obtains said silico briquette a according to method of the prior art is 4.631 microseconds; The average son less of said silico briquette b is 4.188 microseconds; Can find out intuitively that from Fig. 6 and Fig. 7 the low minority carrier life time zone of said silico briquette a obviously is less than said silico briquette b, but but but the exact mass that can not confirm said silico briquette a and silico briquette b break area reaches the good quality zone in the break area.Obtain Fig. 8 and gray-scale map shown in Figure 9 respectively after confirming to remove height end to end and adjust the gray scale of Fig. 6 and image shown in Figure 7 by existing red sector standard, wherein, the gray-scale value of zones of different is corresponding one by one with few sub life value.But the slice length that can find out said silico briquette a and silico briquette b through Fig. 8 and Fig. 9 is roughly the same.Through said analysis module 200 respectively in calculating charts 8 and the gray-scale map shown in Figure 9 the shared ratio of different gray-scale value patterns and from said silico briquette a or silico briquette b head to each interval of afterbody in the ratio of different gray-scale value patterns, obtain ratio that shared ratio of low minority carrier life time among said silico briquette a or the silico briquette b and from said silico briquette a or silico briquette b head to afterbody each hang down minority carrier life time in interval.
Please in the lump with reference to Figure 10 and Figure 11; The silico briquette a that Figure 10 obtains after handling for gray-scale map shown in Figure 8 arrive from the head each of afterbody interval in ratio trend map of low minority carrier life time, the silico briquette b that Figure 11 obtains after handling for gray-scale map shown in Figure 9 arrive each interval interior ratio trend map that hangs down minority carrier life time of afterbody from the head.
Wherein, the horizontal ordinate of Figure 10 and Figure 11 is the data point that silico briquette arrives afterbody from the head, and said data point is corresponding one by one with each interval that silico briquette arrives afterbody from the head, and ordinate is the shared ratio value of low minority carrier life time of said silico briquette corresponding data point.
Here; The concrete numerical value of setting said proportion threshold value K is 50%, when the shared ratio of said low minority carrier life time less than 50% the time, the battery efficiency that make this interval silico briquette section back is higher; Can meet consumers' demand; When the shared ratio of said low minority carrier life time was not less than 50%, the battery efficiency that make this interval silico briquette section back was lower, can't meet consumers' demand.Boundary value according to 50% combines Figure 10 and Figure 11, can obtain following form:
| Silico briquette | The difference quality region | Difference quality length | The good quality zone | Good quality length |
| Silico briquette a | 0-10mm，210-223mm | 23mm | 10-210mm | 200mm |
| Silico briquette b | 0-10mm，122-217mm | 105mm | 10-122mm | 112mm |
But obtain the good quality zone in the break area of said silico briquette a and silico briquette b thus, remove the poor quality region in the silico briquette at last, retain quality region and cut into slices, can significantly reduce the output of poor efficiency silicon chip, improve the efficient and the quality of final battery product.And final detection result through said silico briquette a of contrast and silico briquette b; Can the casting ingot process of the bigger silico briquette b of the low shared regional percentage of minority carrier life time be improved; To promote the quality of said silico briquette b, like this, direction is provided to the process optimization of silico briquette production; Help in the subsequent production flow process, improve the total quality of silico briquette.
Through the description of the foregoing description, the present invention has the following advantages:
Reach the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette; Replace the method for judging according to average minority carrier lifetime in the past; Judged result is more accurate; But and filled up blank to the break area quality characterization, reduced the output of poor efficiency silicon chip effectively; Through being carried out analytical calculation, the gray-scale map of full minority carrier life time distribution plan or 2-D data obtain low shared ratio and the residing zone of minority carrier life time in the silico briquette; For the accurate judgement of silico briquette quality provides foundation, and indicated slice position accurately for follow-up section flow process; Silico briquette through to different process production or processing detects, and compares according to the quality results of the different silico briquettes that obtain at last, for the process optimization of silico briquette production provides direction, helps in the subsequent production flow process, improves the total quality of silico briquette.
One of ordinary skill in the art will appreciate that all or part of flow process that realizes in the foregoing description method; Be to instruct relevant hardware to accomplish through computer program; Described program can be stored in the computer read/write memory medium; This program can comprise the flow process like the embodiment of above-mentioned each side method when carrying out.Wherein, described storage medium can be magnetic disc, CD, read-only storage memory body (Read-Only Memory, ROM) or at random store memory body (Random Access Memory, RAM) etc.
Above disclosedly be merely preferred embodiment of the present invention, can not limit the present invention's interest field certainly with this, the equivalent variations of therefore doing according to claim of the present invention still belongs to the scope that the present invention is contained.
Claims (10)
1. judge the silico briquette method for quality for one kind, it is characterized in that, comprising:
The scanning silico briquette obtains the full minority carrier life time distribution plan of said silico briquette;
Analyze ratio that said full minority carrier life time distribution plan obtains hanging down in the said silico briquette shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody;
Reach the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of low minority carrier life time in the said silico briquette.
2. the method for claim 1 is characterized in that, obtains at said scanning silico briquette also comprising before the step of full minority carrier life time distribution plan of said silico briquette:
Chemical passivation is carried out on said silico briquette surface to be handled.
3. the method for claim 1 is characterized in that, the said full minority carrier life time distribution plan of said analysis obtains each interval interior step of hanging down the ratio of minority carrier life time that the shared ratio of low minority carrier life time reaches from said silico briquette head to afterbody in the said silico briquette and comprises:
Adjusting said full minority carrier life time distribution plan is gray-scale map, wherein, shown in the gray-scale value of gray-scale map zones of different corresponding one by one with the life value of few son;
Calculate the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns in the said gray-scale map and each interval from said silico briquette head to afterbody, obtain shared ratio of low minority carrier life time in the said silico briquette and each from said silico briquette head to afterbody interval in ratio of low minority carrier life time.
4. the method for claim 1 is characterized in that, the said full minority carrier life time distribution plan of said analysis obtains each interval interior step of hanging down the ratio of minority carrier life time that the shared ratio of low minority carrier life time reaches from said silico briquette head to afterbody in the said silico briquette and comprises:
From said full minority carrier life time distribution plan, read the 2-D data that full minority carrier life time distributes;
Calculate the ratio of hanging down the shared ratio of minority carrier life time and each interval interior low minority carrier life time in the said silico briquette from said silico briquette head to afterbody according to said 2-D data.
5. the method for claim 1 is characterized in that, said each interval interior ratio of hanging down minority carrier life time that reaches from said silico briquette head to afterbody according to the shared ratio of low minority carrier life time in the said silico briquette judges that the step of the quality of said silico briquette comprises:
In judgement each interval from said silico briquette head to afterbody, whether the shared ratio of said low minority carrier life time is less than proportion threshold value K;
If this interval in the then said silico briquette is that good quality is interval, keeps slices such as said good quality interval;
If not, this in the then said silico briquette is interval between the difference quality area, removes between said poor quality area.
6. a device of judging the silico briquette quality is characterized in that, comprising:
Scan module is used to scan the full minority carrier life time distribution plan that silico briquette obtains said silico briquette;
Analysis module is used for analyzing the ratio that said full minority carrier life time distribution plan obtains shared ratio of the low minority carrier life time of said silico briquette and each the interval interior low minority carrier life time from said silico briquette head to afterbody;
Judge module is used for reaching the quality that the ratio of hanging down minority carrier life time in each interval from said silico briquette head to afterbody is judged said silico briquette according to the shared ratio of the low minority carrier life time of said silico briquette.
7. device as claimed in claim 6 is characterized in that, adopts high precision to line by line scan when said scan module scans said silico briquette.
8. device as claimed in claim 6; It is characterized in that; It is gray-scale map that said scan module is further used for adjusting said full minority carrier life time distribution plan; Wherein, Shown in the gray-scale value of gray-scale map zones of different corresponding one by one with the life value of few son, said analysis module is further used for calculating the ratio of different gray-scale value patterns in the shared ratio of different gray-scale value patterns in the said gray-scale map and each interval from said silico briquette head to afterbody, obtains ratio that shared ratio of low minority carrier life time in the said silico briquette and from said silico briquette head to afterbody each hang down minority carrier life time in interval.
9. device as claimed in claim 6; It is characterized in that; Said analysis module also is used for reading the 2-D data that full minority carrier life time distributes from said full minority carrier life time distribution plan, calculates the ratio of hanging down shared ratio of minority carrier life time and each the interval interior low minority carrier life time from said silico briquette head to afterbody in the said silico briquette according to said 2-D data.
10. device as claimed in claim 6 is characterized in that, said judge module is further used for judging in each interval from said silico briquette head to afterbody, and whether the shared ratio of said low minority carrier life time is less than proportion threshold value K;
If this interval in the then said silico briquette is that good quality is interval, keeps slices such as said good quality interval;
If not, this in the then said silico briquette is interval between the difference quality area, removes between said poor quality area.
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| CN103308520A (en) * | 2013-06-28 | 2013-09-18 | 常州天合光能有限公司 | Evaluation method for polycrystal battery technical level and slice source |
| CN104866975A (en) * | 2015-06-01 | 2015-08-26 | 山东大海新能源发展有限公司 | Quality evaluation method for polycrystalline silicon ingot |
| CN105785251A (en) * | 2014-12-23 | 2016-07-20 | 浙江昱辉阳光能源有限公司 | Minority carrier lifetime detection method for silicon blocks |
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| CN107255572A (en) * | 2017-05-12 | 2017-10-17 | 宜昌南玻硅材料有限公司 | The minority carrier life time methods of sampling of silicon ingot in fritting casting ingot process |
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| CN109760219A (en) * | 2019-03-12 | 2019-05-17 | 赛维Ldk太阳能高科技(新余)有限公司 | A kind of silico briquette head-tail minimizing technology and removal device |
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