CN102736282A - Method and equipment for inspecting liquid crystal panel - Google Patents
Method and equipment for inspecting liquid crystal panel Download PDFInfo
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- CN102736282A CN102736282A CN2012102124584A CN201210212458A CN102736282A CN 102736282 A CN102736282 A CN 102736282A CN 2012102124584 A CN2012102124584 A CN 2012102124584A CN 201210212458 A CN201210212458 A CN 201210212458A CN 102736282 A CN102736282 A CN 102736282A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The invention provides a method and equipment for inspecting a liquid crystal panel. The inspection method comprises the following steps of: testing the uniformity of common electrodes of the liquid crystal panel; and determining the occurrence probability of residual images of the liquid crystal panel according to a uniformity result of the common electrodes of the liquid crystal panel. The equipment for inspecting the liquid crystal panel comprises a testing device and a determination device, wherein the testing device is used for testing the uniformity of the common electrodes of the liquid crystal panel; and the determination device is used for determining the occurrence probability of the residual images of the liquid crystal panel according to the uniformity result of the common electrodes of the liquid crystal panel. By the method and the equipment for inspecting the liquid crystal panel, the occurrence probability and grades of the residual images of the liquid crystal panel can be accurately determined by testing the uniformity of the common electrodes inside the liquid crystal panel, so that the condition of the residual images of the liquid crystal panel can be quickly determined without the evaluation of the residual images, time is saved, and the working efficiency is improved.
Description
Technical field
The present invention relates to technical field of liquid crystal display, particularly relate to a kind of method of inspection and equipment of the image retention about liquid crystal panel.
Background technology
Existing TFT LCD (TFT-LCD) product nowadays has been widely used in the middle of people's the production and life; This shows product etc. comprising TV, display and portable electronics; Each big liquid crystal panel manufacturer is all making great efforts to improve performance of products; Cut down the consumption of energy, increase the visual angle, reduce the response time.This is wherein particularly important for the improvement that shows the liquid crystal panel image retention.Because it has directly influenced quality of display pictures.
After being meant that long-time driving is specific and stopping portrait (High gray) of image retention, leave the phenomenon of the pattern of original portrait when being transformed to other portraits (Low gray).Image retention is to occur in the inner a kind of phenomenon of liquid crystal cell and since long-time show still frame after, when changing into other images, liquid crystal molecule can not deflect adapting to new picture immediately completely, thereby has influenced display effect.
Image retention can be divided into two kinds of face image retention (area image sticking) and line image retentions (line image sticking) according to the form that takes place is different with the position.Research to image retention mechanism shows, the main cause that produces image retention is the influence of residual charge, and this comprises under the extra electric field effect at the inner polarization charge that produces of liquid crystal cell and in the different distributions of the inner impurity charge of liquid crystal cell.These residual electric charges can influence the orientation of liquid crystal in liquid crystal cell top and bottom, thereby make image retention occur in whole liquid crystal panel zone, and more serious being distributed in has the position, image boundary of obvious color distinction.The generation of image retention also is affected by other factors, such as ambient temperature, picture type and rest time length, brightness degree etc.
In the prior art; It is longer to carry out the image retention evaluation time; Be generally 168 hours, the image retention result only just can judge after estimating end, deviation occur if liquid crystal panel voltage is provided with; Perhaps, also only, the image retention evaluation can obtain corresponding conclusion after finishing owing to reasons such as design and processes make the probability of liquid crystal panel generation image retention become big.But can not judge the method and apparatus of image retention occurrence probability at present through test fluid crystal panel parameter.
Summary of the invention
The method of inspection and the equipment that the purpose of this invention is to provide a kind of liquid crystal panel of the image retention about liquid crystal panel can come fast judgement image retention occurrence probability through test fluid crystal panel parameter.
The method of inspection of liquid crystal panel of the present invention comprises:
The public electrode homogeneity of test fluid crystal panel;
Judge the image retention occurrence probability of said liquid crystal panel according to the public electrode homogeneity result of said liquid crystal panel.
The method of inspection of liquid crystal panel of the present invention, wherein, the public electrode homogeneity of said test fluid crystal panel comprises:
Measure the numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Judge the public electrode homogeneity of said liquid crystal panel according to the numerical value of said best common electric voltage.
The method of inspection of liquid crystal panel of the present invention, wherein, the numerical value of the best common electric voltage of a plurality of diverse locations on the said measurement liquid crystal panel comprises:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm scintillation intensity at the central point in said a plurality of zones respectively less than the numerical value that adds alternating voltage under the situation of a threshold value, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
The method of inspection of liquid crystal panel of the present invention, wherein, the numerical value of the best common electric voltage of a plurality of diverse locations on the said measurement liquid crystal panel comprises:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm the numerical value that adds alternating voltage under the minimum situation of the scintillation intensity of the central point in said a plurality of zones respectively, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
The method of inspection of liquid crystal panel of the present invention, wherein, said numerical value according to said best common electric voltage judges that the public electrode homogeneity of said liquid crystal panel is:
Calculate the standard deviation of the numerical value of said best common electric voltage;
Judge the public electrode homogeneity of said liquid crystal panel according to said standard deviation.
The method of inspection of liquid crystal panel of the present invention, wherein, saidly judge that according to said standard deviation the public electrode homogeneity of said liquid crystal panel comprises:
Judge said best common electric voltage numerical value standard deviation whether less than 0.03, if the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is even less than 0.03; If the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is inhomogeneous greater than 0.03.
The inspection machine of liquid crystal panel of the present invention comprises:
The inhomogeneity proving installation of public electrode that is used for the test fluid crystal panel;
Judge according to the public electrode homogeneity result of said liquid crystal panel and to be electrically connected the judgment means of the image retention occurrence probability of said liquid crystal panel with said proving installation.
The inspection machine of liquid crystal panel of the present invention, wherein, said proving installation comprises:
Be used to measure the measurement mechanism of numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Calculation element receives the numerical value of said best common electric voltage and judges the public electrode homogeneity of said liquid crystal panel according to the numerical value of said best common electric voltage, and said calculation element is electrically connected with said judgment means.
The inspection machine of liquid crystal panel of the present invention, wherein, said measurement mechanism comprises:
The base station that is used for bearing liquid crystal display panel is equipped with the support that can above said base station, move on the said base station;
Be used for measuring respectively the tester of the scintillation intensity of a plurality of diverse locations on the said liquid crystal panel, be fixed on the said support;
D.C. regulated power supply is used for loading to said liquid crystal panel;
Programming controller is electrically connected respectively with said D.C. regulated power supply and said tester, and said programming controller control D.C. regulated power supply is imported the public electrode voltages of the alternation that increases gradually to the test fluid crystal panel and controlled the switch of said tester;
Computing machine; Be electrically connected respectively with said programming controller and said tester; Said computing machine is controlled said support through programming controller and above said zone, is moved; Said computing machine receives the data of the scintillation intensity of a plurality of diverse locations on the said liquid crystal panel of said tester and confirms respectively at the scintillation intensity of said a plurality of positions less than the numerical value that adds alternating voltage under a threshold value or the minimum situation; The numerical value of this voltage of said a plurality of positions is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel, and said computing machine is electrically connected with said calculation element.
The method of inspection of liquid crystal panel of the present invention and inspection machine; Can accurately judge probability and the grade that the liquid crystal panel image retention takes place through the homogeneity of test fluid crystal panel inner male common electrode; Thereby needn't carry out the image retention situation that the image retention evaluation just can be judged liquid crystal panel efficiently; Save the time, improved work efficiency.
Description of drawings
Fig. 1 is the connection synoptic diagram of the inspection machine of liquid crystal panel of the present invention;
Fig. 2 is base station and the structural representation of support in the inspection machine of liquid crystal panel of the present invention.
Embodiment
The invention provides a kind of method of inspection of liquid crystal panel; Through adopting the signal input of programme controlled common electric voltage; The homogeneity of test fluid crystal panel inner male common electrode can accurately be judged probability and the grade that the liquid crystal panel image retention takes place through inhomogeneity data, thereby needn't carry out the image retention situation that the image retention evaluation just can be judged liquid crystal panel efficiently; Save the time, improved work efficiency.
Can know through a large amount of experiments between public electrode homogeneity and the image retention grade of liquid crystal panel has confidential relation, if liquid crystal panel public electrode homogeneity is bad, then image retention also can compare seriously.Therefore we can prejudge the situation of image retention under the prerequisite of not carrying out the image retention evaluation, and the homogeneity of public electrode that can be through improving liquid crystal panel reduces the grade of image retention.
The method of inspection of liquid crystal panel of the present invention comprises:
The public electrode homogeneity of test fluid crystal panel;
Judge the image retention occurrence probability of said liquid crystal panel according to the public electrode homogeneity result of said liquid crystal panel.For example, if the public electrode of said liquid crystal panel is even, the image retention occurrence probability of then judging said liquid crystal panel is little; If the public electrode of said liquid crystal panel is inhomogeneous, the image retention occurrence probability of then judging said liquid crystal panel is for big.
The public electrode homogeneity of test fluid crystal panel can adopt a variety of methods.Among the embodiment of the method for inspection of liquid crystal panel of the present invention, the public electrode homogeneity of test fluid crystal panel comprises:
Measure the numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Judge the public electrode homogeneity of said liquid crystal panel according to the numerical value of said best common electric voltage.
Among the embodiment of the method for inspection of liquid crystal panel of the present invention, the numerical value of the best common electric voltage of a plurality of diverse locations on the said measurement liquid crystal panel comprises:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm scintillation intensity at the central point in said a plurality of zones respectively less than the numerical value that adds alternating voltage under the situation of a threshold value, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
In other embodiment of the method for inspection of liquid crystal panel of the present invention, also can measure the numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel according to following method:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm the numerical value that adds alternating voltage under the minimum situation of the scintillation intensity of the central point in said a plurality of zones respectively, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
Among the embodiment of the method for inspection of liquid crystal panel of the present invention, said numerical value according to said best common electric voltage judges that the public electrode homogeneity of said liquid crystal panel is:
Calculate the standard deviation of the numerical value of said best common electric voltage;
Judge the public electrode homogeneity of said liquid crystal panel according to said standard deviation.For example, whether the standard deviation of the numerical value through judging said best common electric voltage judges less than a certain definite value whether the public electrode homogeneity of said liquid crystal panel is even.
Specifically, among the embodiment of the method for inspection of liquid crystal panel of the present invention, saidly judge that according to said standard deviation the public electrode homogeneity of said liquid crystal panel comprises:
Judge said best common electric voltage numerical value standard deviation whether less than 0.03, if the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is even less than 0.03; If the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is inhomogeneous greater than 0.03.
Like Fig. 1, shown in Figure 2, the inspection machine of liquid crystal panel of the present invention comprises:
The inhomogeneity proving installation of public electrode that is used for the test fluid crystal panel;
Judge the judgment means 2 of the image retention occurrence probability of liquid crystal panel according to the public electrode homogeneity result of liquid crystal panel.If the public electrode of liquid crystal panel is even, the image retention occurrence probability of then judging liquid crystal panel is little; If the public electrode of liquid crystal panel is inhomogeneous, the image retention occurrence probability of then judging liquid crystal panel is for big.Judgment means 2 is electrically connected with above-mentioned proving installation.
Judgment means 2 can be the computing machine that is electrically connected with above-mentioned proving installation, through the result of acceptance test device, judges the image retention occurrence probability of liquid crystal panel.
Among the embodiment of the inspection machine of liquid crystal panel of the present invention, above-mentioned proving installation comprises:
Be used to measure the measurement mechanism 11 of numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Calculation element 12 receives the numerical value of above-mentioned best common electric voltage and judges the public electrode homogeneity of liquid crystal panel according to the numerical value of above-mentioned best common electric voltage, and calculation element 12 is electrically connected with above-mentioned judgment means.
Among the embodiment of the inspection machine of liquid crystal panel of the present invention, measurement mechanism 11 comprises:
The base station 111 that is used for bearing liquid crystal display panel is equipped with the support 112 that can above base station 111, move on the base station 111;
Be used to measure the tester 113 of the scintillation intensity of the central point in zone on the liquid crystal panel, be fixed on the support 112;
D.C. regulated power supply 116 is used for loading to liquid crystal panel;
Programming controller 114 is electrically connected respectively with D.C. regulated power supply 116 and tester 113, and 116 pairs of test fluid crystal panel of programming controller 114 control D.C. regulated power supplies are imported the public electrode voltages of the alternation that increases gradually and controlled the switch of tester 113;
Computing machine 115; Be electrically connected respectively with programming controller 114 and tester 113; Computing machine 115 is divided into a plurality of zones with the surface of liquid crystal panel; And it is mobile successively above the zone through programming controller 114 control supports 112; The data of the scintillation intensity of a plurality of diverse locations and confirm respectively that at the scintillation intensity of a plurality of positions less than the numerical value that adds alternating voltage under a threshold value or the minimum situation, the numerical value of this voltage of above-mentioned a plurality of positions is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel on the liquid crystal panel of computing machine 115 acceptance test appearance 113.Computing machine 115 is electrically connected with calculation element 12.
Wherein, the both sides of base station 111 are provided with first guide rail 21 of longitudinal extension, and movable stand 22 movably is arranged at base station 111 tops through cooperating with first guide rail 21.Movable stand 22 is provided with second guide rail 23 along horizontal expansion.Support 112 is through movably being arranged at base station 111 tops with cooperating of second guide rail 23.Support 112 can move to any zone of base station 111 tops.Programming controller 114 is electrically connected respectively with the motor of support 112 and the motor of movable stand 22.
In the present embodiment, judgment means 2 be with above-mentioned proving installation in the computing machine that is electrically connected of calculation element 12, through receiving the result of calculation element 12, judge the image retention occurrence probability of liquid crystal panel.
Inspection machine detection liquid crystal panel when the liquid crystal panel that utilizes the embodiment of the invention; Liquid crystal panel is placed on the base station 111; Utilize computing machine 115 that the surface of liquid crystal panel is divided into a plurality of zones, utilize computing machine 115 with movable stand 22 support 112 to be moved successively above above-mentioned zone through programming controller 114 control supports 112; Simultaneously, utilize 116 pairs of test fluid crystal panel of programming controller 114 control D.C. regulated power supplies to import the public electrode voltages of the alternation that increases gradually and control the scintillation intensity that tester 113 is measured the central point of above-mentioned zone on the liquid crystal panels; The above-mentioned scintillation intensity data of computing machine 115 acceptance test appearance 113; And judge scintillation intensity less than the numerical value that adds alternating voltage under the situation of a threshold value (perhaps minimum), the numerical value of this voltage is exactly the numerical value of best common electric voltage of the central point of above-mentioned zone.Computing machine 115 flows to calculation element 12 with the numerical value of the best common electric voltage of the central point of above-mentioned zone, and calculation element 12 calculates the standard deviation of the best common electric voltage of above-mentioned central point; Whether the public electrode of judging liquid crystal panel according to above-mentioned standard deviation is even.In the present embodiment; Calculation element 12 judges that whether three times of standard deviation of best common electric voltage of above-mentioned central point are less than 0.09; If three times of the standard deviation of the best common electric voltage of above-mentioned central point all less than 0.09, judge that then the public electrode of said liquid crystal panel is even; If three times of the standard deviation of the best common electric voltage of above-mentioned central point greater than 0.09, judge that then the public electrode of said liquid crystal panel is inhomogeneous.Judgment means 2 is judged the image retention occurrence probability of liquid crystal panel according to the data of calculation element 12: if the public electrode of liquid crystal panel is even, the image retention occurrence probability of then judging liquid crystal panel is little; If the public electrode of liquid crystal panel is inhomogeneous, the image retention occurrence probability of then judging liquid crystal panel is for big.
In actual test job, utilize the method for inspection of above-mentioned liquid crystal panel and inspection machine to save the time of judging the image retention occurrence probability of liquid crystal panel greatly.And show through the result that the liquid crystal panel of having checked carries out the check of conventional method: the accuracy rate of the method for inspection of the present invention is more than 97%.
The above only is a preferred implementation of the present invention; Should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the principle of the invention; Can also make some improvement and retouching, these improvement and retouching also should be regarded as protection scope of the present invention.
Claims (9)
1. the method for inspection of a liquid crystal panel is characterized in that, comprising:
The public electrode homogeneity of test fluid crystal panel;
Judge the image retention occurrence probability of said liquid crystal panel according to the public electrode homogeneity result of said liquid crystal panel.
2. the method for inspection of liquid crystal panel according to claim 1 is characterized in that, the public electrode homogeneity of said test fluid crystal panel comprises:
Measure the numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Judge the public electrode homogeneity of said liquid crystal panel according to the numerical value of said best common electric voltage.
3. the method for inspection of liquid crystal panel according to claim 2 is characterized in that, the numerical value of the best common electric voltage of a plurality of diverse locations on the said measurement liquid crystal panel comprises:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm scintillation intensity at the central point in said a plurality of zones respectively less than the numerical value that adds alternating voltage under the situation of a threshold value, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
4. the method for inspection of liquid crystal panel according to claim 2 is characterized in that, the numerical value of the best common electric voltage of a plurality of diverse locations on the said measurement liquid crystal panel comprises:
Liquid crystal panel is divided into a plurality of zones;
To said liquid crystal panel energising; Under the flicker picture; Said liquid crystal panel is imported the public electrode voltages of the alternation that increases gradually; Test the size of scintillation intensity of the central point in said a plurality of zones respectively, confirm the numerical value that adds alternating voltage under the minimum situation of the scintillation intensity of the central point in said a plurality of zones respectively, the numerical value of this voltage in said a plurality of zones is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel.
5. the method for inspection of liquid crystal panel according to claim 2 is characterized in that, said numerical value according to said best common electric voltage judges that the public electrode homogeneity of said liquid crystal panel is:
Calculate the standard deviation of the numerical value of said best common electric voltage;
Judge the public electrode homogeneity of said liquid crystal panel according to said standard deviation.
6. the method for inspection of liquid crystal panel according to claim 5 is characterized in that, saidly judges that according to said standard deviation the public electrode homogeneity of said liquid crystal panel comprises:
Judge said best common electric voltage numerical value standard deviation whether less than 0.03, if the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is even less than 0.03; If the standard deviation of the numerical value of said best common electric voltage, judges then that the public electrode of said liquid crystal panel is inhomogeneous greater than 0.03.
7. the inspection machine of a liquid crystal panel is characterized in that, comprising:
The inhomogeneity proving installation of public electrode that is used for the test fluid crystal panel;
Judge according to the public electrode homogeneity result of said liquid crystal panel and to be electrically connected the judgment means of the image retention occurrence probability of said liquid crystal panel with said proving installation.
8. the inspection machine of liquid crystal panel according to claim 7 is characterized in that, said proving installation comprises:
Be used to measure the measurement mechanism of numerical value of the best common electric voltage of a plurality of diverse locations on the liquid crystal panel;
Calculation element receives the numerical value of said best common electric voltage and judges the public electrode homogeneity of said liquid crystal panel according to the numerical value of said best common electric voltage, and said calculation element is electrically connected with said judgment means.
9. the inspection machine of liquid crystal panel according to claim 8 is characterized in that, said measurement mechanism comprises:
The base station that is used for bearing liquid crystal display panel is equipped with the support that can above said base station, move on the said base station;
Be used for measuring respectively the tester of the scintillation intensity of a plurality of diverse locations on the said liquid crystal panel, be fixed on the said support;
D.C. regulated power supply is used for loading to said liquid crystal panel;
Programming controller is electrically connected respectively with said D.C. regulated power supply and said tester, and said programming controller control D.C. regulated power supply is imported the public electrode voltages of the alternation that increases gradually to the test fluid crystal panel and controlled the switch of said tester;
Computing machine; Be electrically connected respectively with said programming controller and said tester; Said computing machine is controlled said support through programming controller and above said zone, is moved; Said computing machine receives the data of the scintillation intensity of a plurality of diverse locations on the said liquid crystal panel of said tester and confirms respectively at the scintillation intensity of said a plurality of positions less than the numerical value that adds alternating voltage under a threshold value or the minimum situation; The numerical value of this voltage of said a plurality of positions is the numerical value of the best common electric voltage of a plurality of diverse locations on the said liquid crystal panel, and said computing machine is electrically connected with said calculation element.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210212458.4A CN102736282B (en) | 2012-06-21 | 2012-06-21 | Method and equipment for inspecting liquid crystal panel |
| PCT/CN2012/084885 WO2013189149A1 (en) | 2012-06-21 | 2012-11-20 | Inspection method and apparatus for liquid crystal panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210212458.4A CN102736282B (en) | 2012-06-21 | 2012-06-21 | Method and equipment for inspecting liquid crystal panel |
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| CN102736282A true CN102736282A (en) | 2012-10-17 |
| CN102736282B CN102736282B (en) | 2014-12-24 |
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| CN201210212458.4A Expired - Fee Related CN102736282B (en) | 2012-06-21 | 2012-06-21 | Method and equipment for inspecting liquid crystal panel |
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| WO (1) | WO2013189149A1 (en) |
Cited By (5)
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| WO2013189149A1 (en) * | 2012-06-21 | 2013-12-27 | 京东方科技集团股份有限公司 | Inspection method and apparatus for liquid crystal panel |
| US20140085571A1 (en) * | 2012-05-25 | 2014-03-27 | Boe Technology Group Co., Ltd. | Liquid Crystal Module Detection Apparatus For Detecting Image-Sticking, And Detection And Evaluation System And Method |
| CN104282251A (en) * | 2014-10-28 | 2015-01-14 | 合肥鑫晟光电科技有限公司 | Residual image grade judging method of display device and display device |
| CN105259689A (en) * | 2015-11-23 | 2016-01-20 | 武汉华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| CN107464513A (en) * | 2017-09-18 | 2017-12-12 | 惠科股份有限公司 | The film flicker automatic checkout system and detection method of a kind of display panel |
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| JP2007212688A (en) * | 2006-02-08 | 2007-08-23 | Toshiba Matsushita Display Technology Co Ltd | Liquid crystal display element |
| US20090213284A1 (en) * | 2008-02-27 | 2009-08-27 | Pei-Chun Liao | Method for improving image sticking of liquid crystal displays |
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| US20140085571A1 (en) * | 2012-05-25 | 2014-03-27 | Boe Technology Group Co., Ltd. | Liquid Crystal Module Detection Apparatus For Detecting Image-Sticking, And Detection And Evaluation System And Method |
| US9939671B2 (en) * | 2012-05-25 | 2018-04-10 | Boe Technology Group Co., Ltd. | Liquid crystal module detection apparatus for detecting image-sticking, and detection and evaluation system and method |
| WO2013189149A1 (en) * | 2012-06-21 | 2013-12-27 | 京东方科技集团股份有限公司 | Inspection method and apparatus for liquid crystal panel |
| CN104282251A (en) * | 2014-10-28 | 2015-01-14 | 合肥鑫晟光电科技有限公司 | Residual image grade judging method of display device and display device |
| WO2016065792A1 (en) * | 2014-10-28 | 2016-05-06 | 京东方科技集团股份有限公司 | Method for determining residual image level of display device and detection device |
| US10140954B2 (en) | 2014-10-28 | 2018-11-27 | Boe Technology Group Co., Ltd. | Method for determining residual image level of display device and detection device |
| CN105259689A (en) * | 2015-11-23 | 2016-01-20 | 武汉华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| CN107464513A (en) * | 2017-09-18 | 2017-12-12 | 惠科股份有限公司 | The film flicker automatic checkout system and detection method of a kind of display panel |
| CN107464513B (en) * | 2017-09-18 | 2023-11-21 | 惠科股份有限公司 | Automatic picture flicker detection system and method for display panel |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102736282B (en) | 2014-12-24 |
| WO2013189149A1 (en) | 2013-12-27 |
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