CN102736013B - 一种SoC芯片的空闲状态测试方法、***及测试装置 - Google Patents
一种SoC芯片的空闲状态测试方法、***及测试装置 Download PDFInfo
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Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103364711B (zh) * | 2013-07-31 | 2015-12-09 | 哈尔滨工业大学 | 温度约束下基于软核的三维SoC测试调度方法 |
CN103884979B (zh) * | 2014-03-13 | 2016-09-07 | 江苏钜芯集成电路技术股份有限公司 | 一种无线二合一鼠标端芯片的批量测试方法 |
CN105823975B (zh) * | 2015-01-07 | 2018-12-21 | 展讯通信(上海)有限公司 | 一种处理波形文件的方法 |
CN110879546A (zh) * | 2019-10-30 | 2020-03-13 | 西安海云物联科技有限公司 | 一种通过软硬件结合方式实现双芯片电源管理的方法 |
CN112035346B (zh) * | 2020-08-25 | 2023-09-12 | 华东计算技术研究所(中国电子科技集团公司第三十二研究所) | 基于嵌入式dsp操作***的自动化测试方法、***及介质 |
CN112542200B (zh) * | 2020-12-30 | 2021-09-21 | 芯天下技术股份有限公司 | 非易失型闪存上电参数检查方法、装置、存储介质和终端 |
CN115952100B (zh) * | 2023-01-10 | 2024-07-12 | 北京百度网讯科技有限公司 | 接口测试方法、装置、***、电子设备和存储介质 |
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CN101620566A (zh) * | 2009-07-23 | 2010-01-06 | 北京航空航天大学 | 一种动态随机测试方法 |
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US6874111B1 (en) * | 2000-07-26 | 2005-03-29 | International Business Machines Corporation | System initialization of microcode-based memory built-in self-test |
CN1744056A (zh) * | 2004-09-04 | 2006-03-08 | 华为技术有限公司 | 一种应用程序的自动测试方法 |
CN1746862A (zh) * | 2004-09-09 | 2006-03-15 | 北京航空航天大学 | 软件关联缺陷检测方法 |
CN101447991A (zh) * | 2008-11-19 | 2009-06-03 | 中国人民解放军信息安全测评认证中心 | 用于测试入侵检测***的测试装置及测试方法 |
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