CN102565082A - 对位装置及对位方法 - Google Patents
对位装置及对位方法 Download PDFInfo
- Publication number
- CN102565082A CN102565082A CN2011103530218A CN201110353021A CN102565082A CN 102565082 A CN102565082 A CN 102565082A CN 2011103530218 A CN2011103530218 A CN 2011103530218A CN 201110353021 A CN201110353021 A CN 201110353021A CN 102565082 A CN102565082 A CN 102565082A
- Authority
- CN
- China
- Prior art keywords
- image
- mentioned
- processing procedure
- procedure program
- power processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010-250948 | 2010-11-09 | ||
JP2010250948A JP5653724B2 (ja) | 2010-11-09 | 2010-11-09 | 位置合わせ装置、位置合わせ方法および位置合わせプログラム |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102565082A true CN102565082A (zh) | 2012-07-11 |
Family
ID=46267519
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011103530218A Pending CN102565082A (zh) | 2010-11-09 | 2011-11-09 | 对位装置及对位方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5653724B2 (ja) |
KR (1) | KR20120049826A (ja) |
CN (1) | CN102565082A (ja) |
TW (1) | TW201229500A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106353318A (zh) * | 2015-07-15 | 2017-01-25 | 通用汽车环球科技运作有限责任公司 | 使用手持式检查设备的安装的部件的引导检查 |
CN110268266A (zh) * | 2017-02-08 | 2019-09-20 | 富士胶片株式会社 | 免疫检查装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113125434A (zh) * | 2019-12-31 | 2021-07-16 | 深圳迈瑞生物医疗电子股份有限公司 | 图像分析***和控制拍摄样本图像的方法 |
JP2023032759A (ja) * | 2021-08-27 | 2023-03-09 | 株式会社Screenホールディングス | 描画システム、描画方法およびプログラム |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0634233B2 (ja) * | 1987-05-26 | 1994-05-02 | 株式会社安川電機 | 階層化構造的テンプレ−ト・マッチング方法 |
JP3246616B2 (ja) * | 1992-10-01 | 2002-01-15 | 株式会社ニコン | 位置合わせ方法 |
JP2001201338A (ja) * | 2000-01-20 | 2001-07-27 | Jeol Ltd | 座標リンク機構 |
JP3993817B2 (ja) * | 2002-12-11 | 2007-10-17 | 株式会社日立製作所 | 欠陥組成分析方法及び装置 |
JP4847685B2 (ja) * | 2004-04-16 | 2011-12-28 | 株式会社日立ハイテクノロジーズ | パターンサーチ方法 |
JP5059297B2 (ja) * | 2005-05-09 | 2012-10-24 | 株式会社日立ハイテクノロジーズ | 電子線式観察装置 |
JP2008152555A (ja) * | 2006-12-18 | 2008-07-03 | Olympus Corp | 画像認識方法及び画像認識装置 |
JP2008311668A (ja) * | 2008-07-07 | 2008-12-25 | Hitachi High-Technologies Corp | 基板又は半導体ウエーハに形成されたパターンの,重ね合わせ誤差検査装置及び重ね合わせ誤差検査方法 |
JP2010107412A (ja) * | 2008-10-31 | 2010-05-13 | Toshiba Corp | 欠陥観察装置、欠陥観察方法 |
JP5315076B2 (ja) * | 2009-02-06 | 2013-10-16 | 株式会社日立ハイテクノロジーズ | 電子線の影響を考慮した半導体検査方法及び装置 |
-
2010
- 2010-11-09 JP JP2010250948A patent/JP5653724B2/ja not_active Expired - Fee Related
-
2011
- 2011-10-24 TW TW100138492A patent/TW201229500A/zh unknown
- 2011-11-08 KR KR1020110115802A patent/KR20120049826A/ko not_active Application Discontinuation
- 2011-11-09 CN CN2011103530218A patent/CN102565082A/zh active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106353318A (zh) * | 2015-07-15 | 2017-01-25 | 通用汽车环球科技运作有限责任公司 | 使用手持式检查设备的安装的部件的引导检查 |
CN106353318B (zh) * | 2015-07-15 | 2019-11-15 | 通用汽车环球科技运作有限责任公司 | 使用手持式检查设备的安装的部件的引导检查 |
CN110268266A (zh) * | 2017-02-08 | 2019-09-20 | 富士胶片株式会社 | 免疫检查装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201229500A (en) | 2012-07-16 |
JP5653724B2 (ja) | 2015-01-14 |
KR20120049826A (ko) | 2012-05-17 |
JP2012103072A (ja) | 2012-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120711 |