CN102043070A - Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument - Google Patents

Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument Download PDF

Info

Publication number
CN102043070A
CN102043070A CN 201010516422 CN201010516422A CN102043070A CN 102043070 A CN102043070 A CN 102043070A CN 201010516422 CN201010516422 CN 201010516422 CN 201010516422 A CN201010516422 A CN 201010516422A CN 102043070 A CN102043070 A CN 102043070A
Authority
CN
China
Prior art keywords
gradometer
amplitude
dynamometry
amplitude modulation
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 201010516422
Other languages
Chinese (zh)
Other versions
CN102043070B (en
Inventor
施益智
陆轻铀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Science and Technology of China USTC
Original Assignee
University of Science and Technology of China USTC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Science and Technology of China USTC filed Critical University of Science and Technology of China USTC
Priority to CN 201010516422 priority Critical patent/CN102043070B/en
Publication of CN102043070A publication Critical patent/CN102043070A/en
Application granted granted Critical
Publication of CN102043070B publication Critical patent/CN102043070B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

The invention discloses an amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes. The gradometer provided by the invention comprises a force sensor, a force sensor signal detector, a piezoelectric oscillator, an amplitude detector, a comparator, a variable gain amplifier and a deviation signal amplifier, wherein the force sensor fixed on the piezoelectric oscillator is output to the amplitude detector by the force sensor signal detector; the signal input end and signal output end of the comparator are respectively connected with the output end of the amplitude detector and the input end of the deviation signal amplifier; the gain control input end and gain control output end of the variable gain amplifier are respectively connected with the output end of the deviation signal amplifier and the piezoelectric oscillator; and the output end, frequency input end and amplitude set input end of the dynamometric gradometer are respectively composed of the output end of the deviation signal amplifier, the input end of the variable gain amplifier and the reference input end of the comparator. An XYZ locator is arranged between a sample and the piezoelectric oscillator so as to form a scanning force microscopy. The dynamometric gradometer also can be used for measuring the signal frequency (to be measured) of the frequency input end. According to the invention, the measuring velocity of a traditional amplitude-modulated dynamometric gradometer can be greatly improved, but the loss of frequency resolution is not caused.

Description

Amplitude modulation dynamometry gradometer and the scanning force microscopy and the frequency meter of feedback fixed ampllitude
Technical field
The present invention relates to a kind of dynamometry gradometer, particularly a kind ofly feed back the Modulation and Amplitude Modulation dynamometry gradometer of fixed ampllitude and, belong to the scanning probe microscopy technical field with its scanning force microscopy of making and frequency meter.
Background technology
The main imaging pattern of atomic force microscope comprises contact mode and noncontact mode.Though the former also can provide periodic product table images, but not real atom definition (because measure be resultant action between many probe atoms and many sample atoms), having only the latter just can provide real atom resolution image (true atomic resolution), is than the former much important imaging pattern.In noncontact mode, probe does not contact with sample, but vibrates above sample by the force transducer drive, and by measuring force transducer dynamic resonance frequencies omega in the scanning process 0Variation come the acting force gradient F ' of probe and sample room is carried out imaging.So the image quality of noncontact mode directly is subject to it to force transducer dynamic resonance frequencies omega 0Resolution characteristic.Noncontact mode is realized by modulation method in early days: signal generator is with force transducer dynamic resonance frequencies omega 0Near a certain fixed frequency ω 00The driving force sensor vibrates, and can cause the amplitude A of force transducer in the variation of scanning process middle probe and sample room acting force gradient F ' SrChange, this amplitude variations is converted into voltage signal and comes imaging.The advantage of this method is: for the very high force transducer of quality factor q, its amplitude is to its dynamic resonance frequencies omega 0The response sensitivity that changes is very high, very high frequency resolution is arranged, because the resonance peak of the force transducer of high-quality-factor Q is very sharp-pointed.But this method also has a fatal shortcoming: quality factor q is high more, and the time of amplitude response is long more, causes that imaging time is long to be stood to being difficult to.So this amplitude modulation noncontact mode is just eliminated by the frequency modulation noncontact mode after coming out soon, though the latter's frequency resolution is lower.This eliminating is very completely, can not see the use of amplitude modulation noncontact mode so far.
The present invention proposes a kind of new amplitude modulation noncontact mode: the frequency of driving force sensor vibration is still fixed, but amplitude is remained unchanged by a close-loop feedback control loop, since the force transducer amplitude remains unchanged, just do not needed the very long response time, and imaging signal can be from the constant driving modulation signal of maintenance energy sensor amplitude.We have successfully realized fast imaging with this method under high Q vibration condition, and as we expected: image quality was very high, and speed is near the acceptable stage.
This technology is not only applicable to atomic force microscope, is applicable to other scanning force microscopy yet, and as magnetic force microscopy, scanning friction force microscope scans electrostatic force microscope etc., can also be used to directly measuring the frequency of unknown signaling.
Summary of the invention
Purpose of the present invention:, propose a kind of amplitude modulation dynamometry gradometer of the feedback fixed ampllitude that can improve amplitude modulation noncontact dynamometry gradient mode measuring speed and with its scanning force microscopy of making and frequency meter for addressing the aforementioned drawbacks.
The present invention realizes that the technical scheme of above-mentioned purpose is:
The present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude, comprise force transducer, the force sensor signals detecting device, piezoelectric oscillator, amplitude detector, force transducer is fixed on the piezoelectric oscillator, force transducer exports the force sensor signals detecting device to, the force sensor signals detecting device exports the input of amplitude detector to, it is characterized in that also comprising comparer, variable gain amplifier, the deviation signal amplifier, the deviation signal of the signal input and output of described comparer connects the output of amplitude detector and the input of deviation signal amplifier respectively, the gain control input and output of described variable gain amplifier connect output of deviation signal amplifier and piezoelectric oscillator respectively, and the present invention feeds back the output of the amplitude modulation dynamometry gradometer of fixed ampllitude, frequency input and amplitude are provided with input respectively by the output of deviation signal amplifier, the signal input of variable gain amplifier and the reference input of comparer constitute.
Described deviation signal amplifier is one of following: (a) proportional amplifier P, (b) integrator I, (c) ratio-integrator PI, (d) ratio-differentiator PD, (e) integration-differentiator ID, (f) proportional-integral-differential device PID.
Described variable gain amplifier is made of multiplier, and two input constitutes the signal input and the gain control input of described variable gain amplifier respectively.
Described amplitude detector is one of following: (a) root mean square is to direct current transducer, and (b) two input end short circuits become the multiplier of an input end to output to a low-pass filter.
Described force transducer is micro-cantilever or quartz tuning-fork.
Described force transducer is a micro-cantilever, and described force sensor signals detecting device is the reflector laser Position-Sensitive Detector.
Described force transducer is a quartz tuning-fork, and described force sensor signals detecting device is that electric current is to electric pressure converter.
Described force transducer is the pressure drag micro-cantilever, and described force sensor signals detecting device is to survey conducting bridge.
The scanning force microscopy that the amplitude modulation dynamometry gradometer of feedback fixed ampllitude constitutes, it is characterized in that comprising the amplitude modulation dynamometry gradometer of sample, probe, XYZ steady arm and described feedback fixed ampllitude, described probe stationary is on force transducer, and the XYZ steady arm places between sample and the piezoelectric oscillator.
Feed back the measured frequency device of the amplitude modulation dynamometry gradometer formation of fixed ampllitude, it is characterized in that comprising the amplitude modulation dynamometry gradometer of frequency measured signal and described feedback fixed ampllitude, described frequency measured signal connects the frequency input of the amplitude modulation dynamometry gradometer of described feedback fixed ampllitude.
The principle of work that the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude is: force transducer is fixed on the piezoelectric oscillator, force transducer exports the force sensor signals detecting device to, and force transducer is converted into tractable electric signal V to the response of the gradient F ' of testing force by the force sensor signals detecting device Sr(F '), its amplitude size is measured by amplitude detector thereafter, is made as V APL, this amplitude signal V APLBe sent to comparer to obtain it and user voltage V in order to set amplitude Set-pointDeviation signal V between (connect the amplitude that the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude input is set) Error, this deviation signal V ErrorQuilt deviation signal amplifier thereafter becomes stronger deviation signal V after amplifying, handling Error2, this signal is modulated the user by variable gain amplifier and is fed back the amplitude of the oscillator signal that the frequency of the amplitude modulation dynamometry gradometer of fixed ampllitude imports by the present invention, this Modulation and Amplitude Modulation oscillator signal V DPVibration of drive pressure electrical oscillator and drive sensor oscillation.Above-mentioned closed-loop path has constituted the feedback control loop of the permanent amplitude vibration of force transducer: the force transducer oscillation amplitude change causes non-vanishing deviation signal V Error, after being exaggerated, it removes to modulate the amplitude of the drive signal of driving force sensor vibration, make deviation signal V ErrorRemain near the O, i.e. maintenance energy sensor amplitude near constant.Compare with the power gradiometry of traditional amplitude modulation pattern, the present invention with Modulation and Amplitude Modulation drive signal go driving force sensor vibration can make force transducer do the time spent and still can keep good permanent width of cloth vibration being subjected to power gradient F ' from the variation of sample, this does not just need the very long stand-by period of flower to go pointwise to wait for that the amplitude stability of force transducer is to the desired amplitude of this power gradient F ', shorten Measuring Time greatly, realized purpose of the present invention.Since the amplitude constant of force transducer just can not be with its amplitude signal direct imaging, but the modulation forces sensor is done the modulation signal of permanent width of cloth vibration, that is: the output signal of deviation signal amplifier is as the measurement result output of testing force gradient F '.According to our measured data, the present invention can improve measuring speed more than 20 times, and has kept the original high frequency resolution of amplitude modulation pattern.
According to above-mentioned principle, force transducer vibrates by it responds to testing force gradient F ', so can be any vibratile power inductor, comprise: micro-cantilever (cantilever), pressure drag micro-cantilever (piezo-resistive cantilever), quartz tuning-fork (quartz fork), piezoelectic oscillatory sheet etc.Described force sensor signals detecting device is to be used for the induction of force transducer output is converted to tractable electric signal, and it is respectively reflector laser Position-Sensitive Detector, survey conducting bridge and electric current to electric pressure converter for micro-cantilever, pressure drag micro-cantilever and quartz tuning-fork force transducer.Described amplitude detector is to be used for the amplitude of detection oscillator signal, connects a low-pass filter after can selecting for use root mean square to become the multiplier of an input end to direct current transducer (RMS to DC converter) or two input end short circuits.Described variable gain amplifier is to be used for the amplitude of a vibration drive signal is modulated, and can be a voltage-controlled amplifier or multiplier, and for the latter, one of two signal being taken advantage of are vibration drive signals to be modulated, and another is a modulation signal.Described deviation signal amplifier is used for stronger control signal is amplified, is processed into to little deviation signal, is chosen as: proportional amplifier (P), integrator (I), ratio-integrator (PI), ratio-differentiator (PD), integration-differentiator (ID) or proportional-integral-differential device (PID).
According to above-mentioned principle, the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude can be in order to make corresponding scanning force microscopy: be fixedly connected with the force transducer and the testing sample of probe with the XYZ steady arm, in order to regulate and the control probe with respect to the position of sample and realize the scanning of probe with respect to sample.The amplitude modulation dynamometry gradometer that the present invention feeds back fixed ampllitude also can be in order to make corresponding frequency meter: described frequency measured signal is connect the frequency input of the amplitude modulation dynamometry gradometer of described feedback fixed ampllitude, the frequency of this frequency measured signal can evoke the response that the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude when changing near described force transducer resonant frequency.
Beneficial effect of the present invention is embodied in: can improve measuring speed more than 20 times (multiple of the high more then speedup of Q is big more), and keep the original high frequency resolution of amplitude modulation pattern.
Description of drawings
Fig. 1 is the structural representation of the amplitude modulation dynamometry gradometer of basic model feedback fixed ampllitude of the present invention.
The structural representation of the scanning force microscopy that the amplitude modulation dynamometry gradometer that Fig. 2 is to use basic model of the present invention to feed back fixed ampllitude is made.
Number in the figure: SR force transducer, DP piezoelectric oscillator, SSD force sensor signals detecting device, APD amplitude detector, CP comparer, ESP deviation signal amplifier, VG variable gain amplifier, V In1The present invention feeds back frequency input, the V of the amplitude modulation dynamometry gradometer of fixed ampllitude In2The amplitude that the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude is provided with input, V OutThe present invention feeds back output, XYZ XYZ steady arm, tip probe, the smp sample of the amplitude modulation dynamometry gradometer of fixed ampllitude.
Below the invention will be further described by embodiment and structure accompanying drawing.
Embodiment
Embodiment 1: the amplitude modulation dynamometry gradometer of basic model feedback fixed ampllitude
Referring to accompanying drawing 1, present embodiment comprises force transducer SR, force sensor signals detecting device SSD, piezoelectric oscillator DP, amplitude detector APD, force transducer SR is fixed on the piezoelectric oscillator DP, force transducer SR exports force sensor signals detecting device SSD to, force sensor signals detecting device SSD exports the input of amplitude detector APD to, it is characterized in that also comprising comparator C P, variable gain amplifier VG, deviation signal amplifier ESP, the deviation signal of the signal input and output of described comparator C P connects the output of amplitude detector APD and the input of deviation signal amplifier ESP respectively, the gain control input and output of described variable gain amplifier VG meet deviation signal amplifier ESP output and piezoelectric oscillator DP respectively, and the present invention feeds back the output V of the amplitude modulation dynamometry gradometer of fixed ampllitude Out, frequency input V In1With amplitude input V is set In2Constitute by the output of deviation signal amplifier ESP, the signal input of variable gain amplifier VG and the reference input of comparator C P respectively.
The principle of work of present embodiment is: force transducer SR exports force sensor signals detecting device SSD to, and force transducer SR is converted into tractable electric signal V to the response of the gradient F ' of testing force by force sensor signals detecting device SSD Sr(F '), its amplitude size is measured by amplitude detector APD thereafter, is made as V APL, this amplitude signal V APLBe sent to comparator C P to obtain it and user voltage V in order to set amplitude Set-point(connect the amplitude that the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude input V is set In2) between deviation signal V Error, this deviation signal V ErrorQuilt deviation signal amplifier ESP thereafter becomes stronger deviation signal V after amplifying, handling Error2, this signal is modulated the frequency input V of the user feeds back fixed ampllitude by the present invention amplitude modulation dynamometry gradometer by variable gain amplifier VG InlAnd the amplitude of oscillator signal of input, this Modulation and Amplitude Modulation oscillator signal V DPDrive pressure electrical oscillator DP vibration and drive sensor SR vibration.Above-mentioned closed-loop path has constituted the feedback control loop of the permanent amplitude vibration of force transducer SR: force transducer SR oscillation amplitude change causes non-vanishing deviation signal V Error, after being exaggerated, it removes to modulate the amplitude of the drive signal of driving force sensor SR vibration, make deviation signal V ErrorRemain near the O, i.e. maintenance energy sensor SR amplitude near constant.Compare with the power gradiometry of traditional amplitude modulation pattern, the present invention with Modulation and Amplitude Modulation drive signal go driving force sensor SR vibration can make force transducer SR do the time spent and still can keep good permanent width of cloth vibration being subjected to power gradient F ' from the variation of sample, this does not just need the very long stand-by period of flower to go pointwise to wait for that the amplitude stability of force transducer SR is to the desired amplitude of this power gradient F ', shorten Measuring Time greatly, realized purpose of the present invention.Since the amplitude constant of force transducer SR just can not be with its amplitude signal direct imaging, but modulation forces sensor SR is done the modulation signal of permanent width of cloth vibration, that is: the output signal of deviation signal amplifier ESP is as the measurement result output of testing force gradient F '.According to our measured data, the present invention can improve measuring speed more than 20 times, and has kept the original high frequency resolution of amplitude modulation pattern.
Embodiment 2: the amplitude modulation dynamometry gradometer of the feedback fixed ampllitude of various dissimilar force transducers
In the foregoing description, force transducer SR vibrates by it and responds to testing force gradient F ', so can be any vibratile power inductor, comprise: micro-cantilever (cantilever), pressure drag micro-cantilever (piezo-resistivecantilever), quartz tuning-fork (quartzfork), piezoelectic oscillatory sheet etc.Described force sensor signals detecting device SSD is used for the induction of force transducer SR output is converted to tractable electric signal, and it is respectively reflector laser Position-Sensitive Detector, survey conducting bridge and electric current to electric pressure converter for micro-cantilever, pressure drag micro-cantilever and quartz tuning-fork force transducer.
Embodiment 3: the amplitude modulation dynamometry gradometer of the feedback fixed ampllitude of various dissimilar amplitude detectors
In the foregoing description, described amplitude detector APD is used for the amplitude of detection oscillator signal, connects a low-pass filter after can selecting for use root mean square to become the multiplier of an input end to direct current transducer (RMS to DC converter) or two input end short circuits.
Embodiment 4: the amplitude modulation dynamometry gradometer of the feedback fixed ampllitude of various dissimilar variable gain amplifiers
In the foregoing description, described variable gain amplifier VG is used for the amplitude of a vibration drive signal is modulated, and can be a voltage-controlled amplifier or multiplier, for the latter, one of two signal being taken advantage of are vibration drive signals to be modulated, and another is a modulation signal.
Embodiment 5: the amplitude modulation dynamometry gradometer of the feedback fixed ampllitude of various dissimilar deviation signal amplifiers
In the foregoing description, described deviation signal amplifier ESP is used for stronger control signal is amplified, is processed into to little deviation signal, is chosen as: proportional amplifier (P), integrator (I), ratio-integrator (PI), ratio-differentiator (PD), integration-differentiator (ID) or proportional-integral-differential device (PID).
Embodiment 5: the present invention feeds back the scanning force microscopy that the amplitude modulation dynamometry gradometer of fixed ampllitude is made
In the foregoing description 1, according to its principle of work, the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude can be in order to make corresponding scanning force microscopy: be fixedly connected with force transducer SR and the testing sample smp of probe tip with XYZ steady arm XYZ, in order to regulate and control probe tip with respect to the position of sample smp and realize the scanning of probe tip with respect to sample smp.
Embodiment 6: the present invention feeds back the frequency meter that the amplitude modulation dynamometry gradometer of fixed ampllitude is made
In the foregoing description 1, according to its principle of work, the present invention feeds back the amplitude modulation dynamometry gradometer of fixed ampllitude can be in order to make frequency meter: it is characterized in that comprising the amplitude modulation dynamometry gradometer of frequency measured signal and described feedback fixed ampllitude, described frequency measured signal meets the frequency input V of the amplitude modulation dynamometry gradometer of described feedback fixed ampllitude In1

Claims (10)

1. amplitude modulation dynamometry gradometer that feeds back fixed ampllitude, comprise force transducer, the force sensor signals detecting device, piezoelectric oscillator, amplitude detector, force transducer is fixed on the piezoelectric oscillator, force transducer exports the force sensor signals detecting device to, the force sensor signals detecting device exports the input of amplitude detector to, it is characterized in that also comprising comparer, variable gain amplifier, the deviation signal amplifier, the deviation signal of the signal input and output of described comparer connects the output of amplitude detector and the input of deviation signal amplifier respectively, the gain control input and output of described variable gain amplifier connect output of deviation signal amplifier and piezoelectric oscillator respectively, and the present invention feeds back the output of the amplitude modulation dynamometry gradometer of fixed ampllitude, frequency input and amplitude are provided with input respectively by the output of deviation signal amplifier, the signal input of variable gain amplifier and the reference input of comparer constitute.
2. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 1, it is characterized in that described deviation signal amplifier is one of following: (a) proportional amplifier P, (b) integrator I, (c) ratio-integrator PI, (d) ratio-differentiator PD, (e) integration-differentiator ID, (f) proportional-integral-differential device PID.
3. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 1 and 2 is characterized in that described variable gain amplifier is made of multiplier, and two input constitutes the signal input and the gain control input of described variable gain amplifier respectively.
4. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 1 and 2, it is characterized in that described amplitude detector is one of following: (a) root mean square is to direct current transducer, and (b) two input end short circuits become the multiplier of an input end to output to a low-pass filter.
5. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 1 and 2 is characterized in that described force transducer is micro-cantilever or quartz tuning-fork.
6. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 5 is characterized in that described force transducer is a micro-cantilever, and described force sensor signals detecting device is the reflector laser Position-Sensitive Detector.
7. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 5 is characterized in that described force transducer is a quartz tuning-fork, and described force sensor signals detecting device is that electric current is to electric pressure converter.
8. the amplitude modulation dynamometry gradometer of feedback fixed ampllitude according to claim 5 is characterized in that described force transducer is the pressure drag micro-cantilever, and described force sensor signals detecting device is to survey conducting bridge.
9. scanning force microscopy that constitutes by the amplitude modulation dynamometry gradometer of the described feedback fixed ampllitude of claim 1, it is characterized in that comprising the amplitude modulation dynamometry gradometer of sample, probe, XYZ steady arm and described feedback fixed ampllitude, described probe stationary is on force transducer, and the XYZ steady arm places between sample and the piezoelectric oscillator.
10. measured frequency device that constitutes by the amplitude modulation dynamometry gradometer of the described feedback fixed ampllitude of claim 1, it is characterized in that comprising the amplitude modulation dynamometry gradometer of frequency measured signal and described feedback fixed ampllitude, described frequency measured signal connects the frequency input of the amplitude modulation dynamometry gradometer of described feedback fixed ampllitude.
CN 201010516422 2010-10-22 2010-10-22 Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument Expired - Fee Related CN102043070B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201010516422 CN102043070B (en) 2010-10-22 2010-10-22 Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201010516422 CN102043070B (en) 2010-10-22 2010-10-22 Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument

Publications (2)

Publication Number Publication Date
CN102043070A true CN102043070A (en) 2011-05-04
CN102043070B CN102043070B (en) 2013-04-17

Family

ID=43909410

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201010516422 Expired - Fee Related CN102043070B (en) 2010-10-22 2010-10-22 Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument

Country Status (1)

Country Link
CN (1) CN102043070B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109387670A (en) * 2017-08-07 2019-02-26 中国科学院沈阳自动化研究所 A kind of SICM voltage modulated imaging device and method based on difference noise reduction

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1211811A (en) * 1995-02-15 1999-03-24 Basf公司 Chemically differentiated imaging by scanning atomic force microscopy
JP2001305037A (en) * 2000-02-14 2001-10-31 Koji Maeda Scanning probe microscope, light absorbing material detecting method using it, and microspectroscopy method
JP2009210361A (en) * 2008-03-03 2009-09-17 Yokohama National Univ Atomic force microscopic system
US20100043107A1 (en) * 2006-04-25 2010-02-18 Asylum Research Corporation Multiple Frequency Atomic Force Microscopy

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1211811A (en) * 1995-02-15 1999-03-24 Basf公司 Chemically differentiated imaging by scanning atomic force microscopy
JP2001305037A (en) * 2000-02-14 2001-10-31 Koji Maeda Scanning probe microscope, light absorbing material detecting method using it, and microspectroscopy method
US20100043107A1 (en) * 2006-04-25 2010-02-18 Asylum Research Corporation Multiple Frequency Atomic Force Microscopy
JP2009210361A (en) * 2008-03-03 2009-09-17 Yokohama National Univ Atomic force microscopic system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
《Appl. Phys. Lett.》 20060818 H. Hölscher 等 Q-controlled amplitude modulation atomic force microscopy in liquids: An analysis 073117-1至073117-3 1-10 第89卷, *
《International Journal of Non-Linear Mechanics》 20070118 Hendrik Hölscher等 Theory of amplitude modulation atomic force microscopy with and withoutQ-Control 608-625 1-10 第42卷, *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109387670A (en) * 2017-08-07 2019-02-26 中国科学院沈阳自动化研究所 A kind of SICM voltage modulated imaging device and method based on difference noise reduction
CN109387670B (en) * 2017-08-07 2020-12-29 中国科学院沈阳自动化研究所 SICM voltage modulation imaging device and method based on differential noise reduction

Also Published As

Publication number Publication date
CN102043070B (en) 2013-04-17

Similar Documents

Publication Publication Date Title
CN108802431B (en) Detection method of scanning probe microscope with magnetic-electric signal detection function
CN102662111B (en) Piezoelectric coefficient detection method
US6605941B2 (en) Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes
CN105137125A (en) Double-frequency multichannel synchronization detection method for electric domain imaging
CN103245819B (en) Magnetic excitation resonant piezoresistive cantilever beam is adopted to measure the method for DC current or DC voltage
US8065908B2 (en) Scan type probe microscope
JP6184521B2 (en) A microscope with a multimode local probe, a tip-enhanced Raman microscope, and a method for controlling the distance between the local probe and the sample.
CN105258786A (en) Rapid measurement of resonant frequency and quality factor of high-frequency harmonic oscillator
CN106501552B (en) Method that is a kind of while measuring surface magnetism and surface potential
JP2012184959A (en) Displacement detection mechanism and scanning probe microscope having the same
US20080229813A1 (en) Phase Feedback AFM and Control Method Therefor
CN104155477A (en) Method of tracking atomic force acoustical microscopy probe contact resonant frequency
JP2002230728A (en) Measuring device for magnetic head and measuring method applied to the device
CN102043070B (en) Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument
CN102998483A (en) Atomic force microscope system with quartz tuning fork
CN209840953U (en) Leading device of taking care of eddy current sensor that low temperature floats
CN112213671B (en) Device and method for measuring magnetostriction effect
US11946949B2 (en) Method and control unit for demodulation
JP2003085717A (en) Magnetic recording head measuring device and measuring method applied to the device
KR20120043234A (en) Scanning probe microscopy
JP2016023952A (en) Scanning probe microscope
CN212931330U (en) Measure device of magnetostrictive effect
CN104950142A (en) Method for measuring vibration characteristic of cantilever and device for measuring vibration characteristic of cantilever
JP6001728B2 (en) Displacement detection mechanism and scanning probe microscope using the same
Schelchshorn et al. On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130417

Termination date: 20191022