CN101937949B - Method for improving conversion efficiency of amorphous silicon solar cell - Google Patents

Method for improving conversion efficiency of amorphous silicon solar cell Download PDF

Info

Publication number
CN101937949B
CN101937949B CN2010102379917A CN201010237991A CN101937949B CN 101937949 B CN101937949 B CN 101937949B CN 2010102379917 A CN2010102379917 A CN 2010102379917A CN 201010237991 A CN201010237991 A CN 201010237991A CN 101937949 B CN101937949 B CN 101937949B
Authority
CN
China
Prior art keywords
solar cell
amorphous silicon
weak
silicon solar
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2010102379917A
Other languages
Chinese (zh)
Other versions
CN101937949A (en
Inventor
李兆廷
陈志维
李鹏
陈启聪
王恩忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chengdu Zhongpu Technology Co ltd
Original Assignee
CHENGDU TAIYISI SOLAR TECHNOLOGY Co Ltd
Tunghsu Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHENGDU TAIYISI SOLAR TECHNOLOGY Co Ltd, Tunghsu Group Co Ltd filed Critical CHENGDU TAIYISI SOLAR TECHNOLOGY Co Ltd
Priority to CN2010102379917A priority Critical patent/CN101937949B/en
Publication of CN101937949A publication Critical patent/CN101937949A/en
Application granted granted Critical
Publication of CN101937949B publication Critical patent/CN101937949B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

The invention discloses a method for improving the conversion efficiency of an amorphous silicon solar cell, and solves the technical problems of current loss and voltage loss of the amorphous silicon solar cell caused by a reverse PN junction formed between a weak N-type conductive thin film and a P-type amorphous silicon thin film. The adopted technical scheme is that: the method is implemented in a process for preparing the amorphous silicon solar cell, wherein the process comprises steps of preparing a matrix of the solar cell, the weak N-type conductive thin film, a PIN-type amorphous silicon thin film and a back electrode; and in the conventional process for the amorphous silicon solar cell, a step of preparing an intrinsic buffer layer is added between the steps of preparing the weak N-type conductive thin film and the P-type amorphous silicon thin film after the weak N-type conductive thin film is prepared on the matrix. The key point is that: the intrinsic buffer layer for slowing down the current loss and the voltage loss of the amorphous silicon solar cell caused by the reverse PN junction formed between the weak N-type conductive thin film and the P-type amorphous silicon thin film is prepared on the weak N-type conductive thin film, so that the width of a depletion layer is reduced, and the voltage loss and the current loss caused by the reverse PN junction are reduced.

Description

A kind of method that improves the non-crystal silicon solar cell transformation efficiency
Technical field
The present invention relates to a kind of method that improves the non-crystal silicon solar cell transformation efficiency, belong to the semiconductor application field, particularly, improve the non-crystal silicon solar cell transformation efficiency by adopting the method for between TCO and PIN type amorphous silicon membrane, setting up resilient coating.
Background technology
The demand of world energy sources makes solar battery technology obtain swift and violent development, the technology of the ripe main flow of existing market is based on monocrystalline silicon and polycrystalline silicon solar cell, but because the environmental problem that exists in the cost limit that the shortage of silicon materials causes and the production crystalline silicon process, advantages such as amorphous silicon film solar battery has that consumptive material is few, environmental friendliness, cost decline space are bigger, research and production unit one after another with non-crystal silicon solar cell as research and development principal direction.The structure of non-crystal silicon solar cell is based on the p-i-n type, and the structure sheaf of this non-crystal silicon solar cell comprises matrix, conductive film, PIN type amorphous silicon membrane and the back electrode etc. that prepare solar cell.The subject matter of non-crystal silicon solar cell existence at present is how to improve transformation efficiency and reduce photic attenuating effect.In the prior art, processing technology of interface to P type amorphous silicon membrane and I type amorphous silicon membrane is a lot, for the interface between conductive film and the P type amorphous silicon membrane, because conductive film presents weak N type, form reverse PN junction with P type amorphous silicon membrane, cause electric current, the loss of voltage of solar cell, how to have addressed this problem a difficult problem into this area.
Summary of the invention
The present invention for solving non-crystal silicon solar cell since weak N type conductive film and P type amorphous silicon membrane form reverse PN junction, cause the technical problem of the electric current and the loss of voltage, designed a kind of method that improves the non-crystal silicon solar cell transformation efficiency, generate the resilient coating of the reverse PN junction that slows down weak N type conductive film and the formation of P type amorphous silicon membrane by deposition on weak N type conductive film, improved the amorphous silicon solar cell transformation efficiency, reduce photic attenuating effect, energy savings.
The present invention for realizing the technical scheme that goal of the invention adopts is, a kind of method that improves the non-crystal silicon solar cell transformation efficiency, above method realizes in preparation amorphous silicon solar cell technology, said technology comprises the matrix for preparing solar cell, the weak N type conductive film of preparation, preparation PIN type amorphous silicon membrane and preparation back electrode, in the non-crystal silicon solar cell common process, after weak N type conductive film is finished in preparation on the matrix, increased the operation of the Intrinsical resilient coating between weak N type conductive film of preparation and the P type amorphous silicon membrane, specifically may further comprise the steps:
A, behind the weak N type conductive film of preparation on the matrix, the control substrate temperature is 160~220 ℃ and sends into chemical vapor deposition chamber that the vacuum degree of adjusting deposition chamber is 5 * 10 -5~1 * 10 -4Pa;
B, at ambient temperature, in mixing chamber with CO 2, H 2, SiH 4By charging into deposition chamber after the following percent by volume mixing:
CO 2Content is 2~4%, H 2Content is 90~93%, SiH 4Content 5~8%;
C, control deposition chamber deposition pressure are 90~140pa, and depositing temperature is that 160 ℃~250 ℃, radio frequency power density are 0.2W/cm 2~0.5W/cm 2
D, in above deposition atmosphere, deposit 10S~30S after, on weak N type conductive film, deposit the Intrinsical resilient coating;
E, the Intrinsical resilient coating form the back continue to finish later process according to the non-crystal silicon solar cell common process.
Key of the present invention is, preparation is used to slow down weak N type conductive film and P type amorphous silicon membrane forms reverse PN junction, causes the resilient coating of non-crystal silicon solar cell electric current, the loss of voltage on weak N type conductive film.Resilient coating is the very low intrinsic semiconductor layer of doping content, intrinsic semiconductor has enlarged the depletion width of the reverse PN junction of weak N type conductive film and the formation of P type amorphous silicon membrane, thereby voltage, current loss that reverse PN junction causes have been reduced, improve the transformation efficiency of amorphous silicon solar cell, reduced photic attenuating effect.
The present invention is described in detail below in conjunction with accompanying drawing.
Description of drawings
Fig. 1 is the structure sheaf schematic diagram of amorphous silicon solar cell among the present invention.
In the accompanying drawing, 1 represents matrix, the weak N type conductive film of 2 representatives, and 3 represent resilient coating, and 4 represent PIN type amorphous silicon membrane, and 5 represent back electrode.
Embodiment
Referring to Fig. 1, a kind of method that improves the non-crystal silicon solar cell transformation efficiency, above method realizes in preparation amorphous silicon solar cell technology, said technology comprises the weak N type conductive film 2 of matrix 1, preparation, preparation PIN type amorphous silicon membrane 4 and the preparation back electrode 5 for preparing solar cell, in the non-crystal silicon solar cell common process, after weak N type conductive film 2 is finished in preparation on the matrix 1, increased the operation of the Intrinsical resilient coating 3 between weak N type conductive film 2 of preparation and the P type amorphous silicon membrane, specifically may further comprise the steps:
A, behind the weak N type conductive film 2 of preparation on the matrix 1, control matrix 1 temperature is 160~220 ℃ and sends into chemical vapor deposition chamber that the vacuum degree of adjusting deposition chamber is 5 * 10 -5~1 * 10 -4Pa;
B, at ambient temperature, in mixing chamber with CO 2, H 2, SiH 4By charging into deposition chamber after the following percent by volume mixing:
CO 2Content is 2~4%, H 2Content is 90~93%, SiH 4Content 5~8%;
C, control deposition chamber deposition pressure are 90~140pa, and depositing temperature is that 160 ℃~250 ℃, radio frequency power density are 0.2W/cm 2~0.5W/cm 2
D, in above deposition atmosphere, deposit 10S~30S after, on weak N type conductive film 2, deposit Intrinsical resilient coating 3;
E, form the back at Intrinsical resilient coating 3 and continue to finish later process according to the non-crystal silicon solar cell common process.
Among the above-mentioned step D, the thicknesses of layers that Intrinsical resilient coating 3 forms is 20~
CO by control preparation Intrinsical resilient coating 3 usefulness 2, SiH 4, H 2The volume percent content of gas can obtain 2.8~3.5 high band gap, and the backward current that increase Intrinsical resilient coating 3 can reduce between weak N type conductive film 2 and the P type amorphous silicon membrane greatly makes the conversion efficiency of battery obtain 0.2~0.5% raising.
Difference according to preparation Intrinsical resilient coating 3 thicknesses of layers feeds CO 2Asynchronism(-nization).
The present invention is owing to increase the Intrinsical resilient coating 3 of high band gap between weak N type conductive film 2 and P type amorphous silicon membrane, efficiently solve the reverse PN junction problem between weak N type conductive film 2 and the P type amorphous silicon membrane, make the generating efficiency of solar cell obtain 0.2~0.5% lifting; Simultaneously because the Intrinsical resilient coating 3 band gap height that increase, just can not exert an influence to the light absorption of amorphous silicon solar cell; Its preparation technology is also fairly simple.
A specific embodiment of the present invention before deposition P type amorphous silicon membrane, at first prepares Intrinsical resilient coating 3 on weak N type conductive film 2, general power supply stimulating frequency adopts 13.56MHz.With the tin ash electro-conductive glass is matrix, earlier glass basis is preheating to 180 ℃, sends into plasma reinforced chemical vapor deposition system, earlier preparation Intrinsical resilient coating 3.Settling chamber's vacuum is evacuated to vacuum degree 8 * 10 -5Pa, depositing temperature are controlled at 200 ℃, with CO 2, H 2, SiH 4After following volume percent content mixing, charge into the settling chamber: CO 2Content is 2%, H 2Content is 91%, SiH 4Content is 7%; Bleeding regulating rate controlled deposition pressure is 120Pa, and radio-frequency power adopts 0.4W/cm 2In above deposition atmosphere, by the time of control feeding mist, behind the deposition 20S, just deposit Intrinsical resilient coating 3 on weak N type conductive film surface, its thickness exists
Figure BSA00000206477700051
About; At last, on Intrinsical resilient coating 3, prepare PIN type amorphous silicon membrane according to common process.
The operation principle of solar cell is based on the photovoltaic effect of PN junction, and referring to Fig. 1, the weak N type conductive film 2 in the solar cell is as the output cathode of battery, and back electrode 5 is as the output negative pole of battery, and P, I, N type amorphous silicon membrane 4 are as the photogenic voltage layer.When absorbing solar energy, battery produces electron hole pair, under the effect of battery internal electric field, light induced electron and hole are separated, the hole flows into P type amorphous silicon membrane, electronics flows into N type amorphous silicon membrane, the result makes N type amorphous silicon membrane store superfluous electronics, and P type amorphous silicon membrane has superfluous hole, thus near P type amorphous silicon membrane and PN junction that N type amorphous silicon membrane forms the formation photoproduction electric field opposite with internal electric field.The photoproduction electric field also makes P type amorphous silicon membrane positively charged, N type amorphous silicon membrane electronegative except part is supported the effect of internal electric field, and the thin layer between N district and P district just produces electromotive force, Here it is photovoltaic effect.At this moment, if with the external circuit short circuit, then just have the photoelectric current that is directly proportional with the incident light energy to flow through in the external circuit, this electric current is called short circuit current, on the other hand, if opened a way in the PN junction two ends, then, make the Fermi level height of the Fermi level in N district, between these two Fermi levels, just produced potential difference VOC than the P district because electronics and hole flow into N district and P district respectively, can record this value, and be called open circuit voltage.
In like manner, between weak N type conductive film 2 and P type amorphous silicon membrane, also exist the photoproduction effect, but because the direction of the PN junction that they form is opposite with the PN junction direction that PIN type amorphous silicon membrane 4 forms, can cause the electric energy of solar cell to run off, cause the wasting of resources, by between weak N type conductive film 2 and P type amorphous silicon membrane, setting up the very low Intrinsical semiconductor layer of doping content, increased the width of the depletion region of reverse PN junction, reduced the energy loss of solar cell.

Claims (2)

1. method that improves the non-crystal silicon solar cell transformation efficiency, above method realizes in preparation amorphous silicon solar cell technology, said technology comprises the matrix (1) for preparing solar cell, the weak N type transparent conductive film (2) of preparation, preparation PIN type amorphous silicon membrane (4) and preparation back electrode (5), it is characterized in that: in the non-crystal silicon solar cell common process, after weak N type transparent conductive film (2) is finished in the last preparation of matrix (1), increased the operation of the Intrinsical resilient coating (3) between weak N type transparent conductive film (2) of preparation and the P type amorphous silicon membrane, specifically may further comprise the steps:
A, after matrix (1) is gone up the weak N type conductive film (2) of preparation, control matrix (1) temperature is 160~220 ℃ and sends into chemical vapor deposition chamber that the scope of adjusting the body vacuum degree of deposition chamber is 5 * 10 -5~1 * 10 -4Pa;
B, at ambient temperature, in mixing chamber with CO 2, H 2, SiH 4By charging into deposition chamber after the following percent by volume mixing:
CO 2Content is 2~4%, H 2Content is 90~93%, SiH 4Content 5~8%;
C, control deposition chamber deposition pressure are 90~140Pa, and depositing temperature is that 160~250 ℃, radio frequency power density are 0.2W/cm 2~0.5W/cm 2
D, in above deposition atmosphere, deposit 10~30s after, on weak N type conductive film (2), deposit Intrinsical resilient coating (3);
E, form the back at Intrinsical resilient coating (3) and continue to finish later process according to the non-crystal silicon solar cell common process.
2. a kind of method that improves the non-crystal silicon solar cell transformation efficiency according to claim 1 is characterized in that: among the described step D, the thicknesses of layers that Intrinsical resilient coating (3) forms is 20~
Figure FSA00000206477600011
CN2010102379917A 2010-07-28 2010-07-28 Method for improving conversion efficiency of amorphous silicon solar cell Active CN101937949B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010102379917A CN101937949B (en) 2010-07-28 2010-07-28 Method for improving conversion efficiency of amorphous silicon solar cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010102379917A CN101937949B (en) 2010-07-28 2010-07-28 Method for improving conversion efficiency of amorphous silicon solar cell

Publications (2)

Publication Number Publication Date
CN101937949A CN101937949A (en) 2011-01-05
CN101937949B true CN101937949B (en) 2011-11-30

Family

ID=43391159

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010102379917A Active CN101937949B (en) 2010-07-28 2010-07-28 Method for improving conversion efficiency of amorphous silicon solar cell

Country Status (1)

Country Link
CN (1) CN101937949B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2624359B2 (en) * 1990-08-28 1997-06-25 キヤノン株式会社 Solar cell
CN101379622A (en) * 2006-01-30 2009-03-04 本田技研工业株式会社 Solar cell and its manufacturing method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3342257B2 (en) * 1995-10-03 2002-11-05 三洋電機株式会社 Photovoltaic element
KR100833517B1 (en) * 2006-12-05 2008-05-29 한국전자통신연구원 Optoconductive compound and method of producing the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2624359B2 (en) * 1990-08-28 1997-06-25 キヤノン株式会社 Solar cell
CN101379622A (en) * 2006-01-30 2009-03-04 本田技研工业株式会社 Solar cell and its manufacturing method

Also Published As

Publication number Publication date
CN101937949A (en) 2011-01-05

Similar Documents

Publication Publication Date Title
Sun et al. Toward efficiency limits of crystalline silicon solar cells: recent progress in high‐efficiency silicon heterojunction solar cells
CN102110734B (en) Nanocrystalline silicon/crystalline silicon heterojunction photovoltaic cell
CN103915523B (en) A kind of preparation method containing composed emission layer silicon heterojunction solar battery
CN102157577B (en) Nanometer silicon/monocrystalline silicon heterojunction radial nanowire solar cell and preparation method thereof
CN103346214B (en) A kind of silica-based radial homogeneity heterojunction solar cell and preparation method thereof
CN102208477B (en) Amorphous silicon/microcrystalline silicon laminated solar cell and preparation method thereof
CN101562220B (en) Process for manufacturing amorphous silicon thin film solar cell
Fang et al. Amorphous silicon/crystal silicon heterojunction double-junction tandem solar cell with open-circuit voltage above 1.5 V and high short-circuit current density
CN102569481B (en) Nano silicon window layer with gradient band gap characteristic and preparation method thereof
CN103219413A (en) Grapheme radial heterojunction solar cell and preparation method thereof
CN102157617B (en) Preparation method of silicon-based nano-wire solar cell
CN101771097A (en) Silicon substrate heterojunction solar cell with band gap being controllable
CN103078001A (en) Manufacturing method of silicon-based thin-film laminated solar battery
CN103227247A (en) Preparation method of efficient crystalline silicon heterojunction solar cell
CN106449815A (en) Heterojunction solar cell device production method based on amorphous silicon thin films
CN103035772A (en) Heterojunction with intrinsic Thinlayer (HIT) solar battery structure
CN102433545A (en) Suede-structured ZnO film prepared by alternative growth technology and application thereof
CN106449850A (en) High efficiency silicon-based heterojunction double-sided battery and its preparation method
CN101707219B (en) Solar cell with intrinsic isolation structure and production method thereof
CN101937949B (en) Method for improving conversion efficiency of amorphous silicon solar cell
CN103066153A (en) Silicon-based thin-film lamination solar cell and manufacturing method thereof
CN203260611U (en) HIT solar cell structure
CN210156405U (en) Heterojunction cell structure with hydrogen annealed TCO conductive film
CN102332504A (en) Method for improving interface performance of P-type layer and I-type layer in amorphous silicon solar cell
CN102185001B (en) Structure and manufacturing of silicon-based nanometer zinc oxide powder thin film hetero-junction solar cell

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Free format text: FORMER OWNER: CHENGDU TAIYISI SOLAR TECHNOLOGY CO., LTD.

Effective date: 20140331

Owner name: CHENGDU XUSHUANG SOLAR TECHNOLOGY CO., LTD.

Free format text: FORMER OWNER: TUNGHSU GROUP CO., LTD.

Effective date: 20140331

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: 050021 SHIJIAZHUANG, HEBEI PROVINCE TO: 610200 CHENGDU, SICHUAN PROVINCE

TR01 Transfer of patent right

Effective date of registration: 20140331

Address after: 610200 Sichuan city of Chengdu province Shuangliu County West Port Economic Development Zone and two Hua Road No. 1518

Patentee after: CHENGDU XUSHUANG SOLAR TECHNOLOGY Co.,Ltd.

Address before: 050021 No. 94, Huitong Road, Hebei, Shijiazhuang

Patentee before: TUNGHSU GROUP Co.,Ltd.

Patentee before: CHENGDU TAIYISI SOLAR TECHNOLOGY Co.,Ltd.

CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: No. 1518, Section 2, Muhua Road, xihanggang Economic Development Zone, Shuangliu County, Chengdu, Sichuan 610200

Patentee after: CHENGDU ZHONGPU TECHNOLOGY Co.,Ltd.

Address before: No. 1518, Section 2, Muhua Road, xihanggang Economic Development Zone, Shuangliu County, Chengdu, Sichuan 610200

Patentee before: CHENGDU XUSHUANG SOLAR TECHNOLOGY Co.,Ltd.

PE01 Entry into force of the registration of the contract for pledge of patent right

Denomination of invention: A method to improve the conversion efficiency of amorphous silicon solar cells

Effective date of registration: 20220720

Granted publication date: 20111130

Pledgee: Jinzhou Bank Co.,Ltd. Beijing Fuchengmen sub branch

Pledgor: CHENGDU ZHONGPU TECHNOLOGY Co.,Ltd.

Registration number: Y2022990000470

PE01 Entry into force of the registration of the contract for pledge of patent right