CN100470782C - 芯片封装结构 - Google Patents

芯片封装结构 Download PDF

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CN100470782C
CN100470782C CNB2006100301150A CN200610030115A CN100470782C CN 100470782 C CN100470782 C CN 100470782C CN B2006100301150 A CNB2006100301150 A CN B2006100301150A CN 200610030115 A CN200610030115 A CN 200610030115A CN 100470782 C CN100470782 C CN 100470782C
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chip
contact
busbar
bonding wire
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CN101127337A (zh
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吴燕毅
李欣鸣
黄志龙
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Unimos Microelectronics(shanghai) Ltd
Chipmos Technologies Inc
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BERMUDA CHIPMOS TECHNOLOGIES Co Ltd
Chipmos Technologies Shanghai Ltd
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Abstract

本发明公开了一种芯片封装结构,其包括一导线架、至少一第一焊线、至少一第二焊线、多条第三焊线以及一封装胶体。导线架包括芯片座、多条内引脚以及至少一汇流条。内引脚配置于芯片座之***。汇流条介于芯片座与这些内引脚之间,且与内引脚之间维持一高度差,且为沉置设计。芯片配置于芯片座上。芯片具有至少一第一接点与第二接点。第一焊线连接于第一接点与汇流条之间。第二焊线连接于汇流条与这些内引脚其中之一之间。第三焊线连接于其他内引脚与第二接点之间。封装胶体包覆芯片座、这些内引脚、汇流条、芯片、第一焊线、第二焊线以及这些第三焊线。

Description

芯片封装结构
技术领域
本发明有关于一种芯片封装结构,且特别有关于一种具有汇流条的芯片封装结构。
背景技术
在半导体产业中,集成电路(integrated circuits,IC)的生产主要可分为三个阶段:集成电路的设计(IC design)、集成电路的制作(IC process)及集成电路的封装(IC package)。
在集成电路的制作中,芯片(chip)是经由大晶片(wafer)制作、形成集成电路以及切割大晶片(wafer sawing)等步骤而完成。大晶片具有一主动面(activesurface),其泛指大晶片的具有主动元件(active device)的表面。当大晶片内部的集成电路完成之后,大晶片的主动面还配置有多个焊垫(bonding pad),以使最终由大晶片切割所形成的芯片可经由这些焊垫而向外电性连接于一承载器(carrier)。承载器例如为一导线架(leadframe)或一封装基板(packagesubstrate)。芯片可以打线接合(wire bonding)或覆晶接合(flip chip bonding)的方式连接至承载器上,使得芯片的这些焊垫(bonding pad)可电性连接于承载器之接点,以构成一芯片封装结构。
图1是现有的芯片封装体的上视示意图。图2是图1芯片封装体的剖面示意图。请共同参照图1与图2,为了说明上的方便,图1与图2是透视封装胶体140的示意图,并且仅以虚线描绘出封装胶体140的轮廓。芯片封装体100包括一导线架110、一芯片120、多条第一焊线(bonding wire)130、多条第二焊线132、多条第三焊线134与一封装胶体(encapsulant)140。导线架110包括一芯片座(diepad)112、多条内引脚114以及多条汇流条116。内引脚114配置于芯片座112的***。汇流条116介于芯片座112与内引脚114之间,且汇流条116与内引脚114共平面。
芯片120具有彼此相对的一主动表面122以及一背面124。芯片120配置于芯片座112上,并且背面124朝向芯片座112。芯片120具有多个接地接点126与多个非接地接点128,其中这些非接地接点128包括多个电源接点以及多个信号接点。接地接点126与非接地接点128均位于主动表面122上。
第一焊线130将接地接点126电性连接于汇流条116。第二焊线132将汇流条116电性连接于这些内引脚114中的接地引脚。第三焊线134则分别将其余的内引脚114电性连接于对应的第二接点128。封装胶体140将芯片座112、内引脚114、汇流条116、芯片120、第一焊线130、第二焊线132以及第三焊线134包覆于其内。
值得注意的是,由于现有的芯片封装结构100的内引脚114与汇流条116是共平面的,因此第三焊线134必须跨越汇流条116。换言之,第三焊线134的高度较高,因此在填入封装胶体140的制程中,封装胶体140容易造成第三焊线134的偏移或断裂。
发明内容
本发明的目的就是在提供一种芯片封装结构,以提高可靠度。
本发明的另一目的就是在提供一种芯片封装结构,以缩小体积。
本发明提出一种芯片封装结构,其包括一导线架、一芯片、至少一第一焊线、至少一第二焊线、多条第三焊线以及一封装胶体。导线架包括一芯片座、多条内引脚以及至少一汇流条。内引脚配置于芯片座的***。汇流条介于芯片座与内引脚之间,且汇流条与内引脚之间维持一第一高度差,且汇流条为沉置(down-set)设计。芯片具有彼此相对的一主动表面以及一背面。芯片配置于芯片座上,并且背面朝向芯片座。芯片具有至少一第一接点与多个第二接点,第一接点与第二接点位于主动表面上。第一焊线连接于第一接点与汇流条之间。第二焊线连接汇流条与内引脚其中之一之间。这些第三焊线分别连接其他内引脚与第二接点之间。封装胶体将芯片座、内引脚、汇流条、芯片、第一焊线、第二焊线以及第三焊线包覆于其内。
在本发明的一实施例中,内引脚与芯片座之间维持一第二高度差,且芯片座为沉置设计。
在本发明的一实施例中,第一接点包括电源接点、接地接点或信号接点。
本发明更提出一种芯片封装结构,其包括一芯片、一导线架、至少一第一焊线、至少一第二焊线、多条第三焊线以及一封装胶体。芯片具有一主动表面与配置于主动表面之至少一第一接点与多个第二接点。芯片固着于导线架下方。导线架包括多条内引脚以及至少一汇流条。内引脚的一端部位于主动表面上,并且位于第一接点与第二接点的***。汇流条位于内引脚以及第一接点与第二接点之间,并位于主动表面的上方。汇流条与内引脚之间维持一高度差,且汇流条为抬升(up-set)设计。第一焊线连接于第一接点与汇流条之间。第二焊线连接于汇流条与内引脚其中之一之间。第三焊线分别连接于其他内引脚与第二接点之间。封装胶体将内引脚、汇流条、芯片、第一焊线、第二焊线以及第三焊线包覆于其内。
在本发明的一实施例中,第一接点包括电源接点、接地接点或信号接点。
由于本发明之汇流条与内引脚之间具有一高度差,因此本发明可以缩小导线架的体积,因此本发明所提出的芯片封装体具有小型化的优点。
为让本发明之上述和其他目的、特征和优点能更明显易懂,下文特举较佳实施例,并配合所附图式,作详细说明如下。
附图说明
图1是现有的芯片封装体的上视示意图。
图2是图1芯片封装体的剖面示意图。
图3是本发明一实施例的芯片封装体的侧视示意图。
图4是图3的芯片封装体的上视示意图。
图5是本发明另一实施例的芯片封装体的侧视示意图。
图6是图5的芯片封装体的上视示意图。
具体实施方式
图3是本发明一实施例的芯片封装体的侧视示意图。图4是图3的芯片封装体的上视示意图。为了说明上的方便,图3与图4是透视封装胶体240的示意图,并且仅以虚线描绘出封装胶体240的轮廓。芯片封装结构200包括一导线架210、一芯片220、至少一第一焊线230、至少一第二焊线232、多条第三焊线234以及一封装胶体240。
导线架210包括一芯片座212、多条内引脚214以及一汇流条216。内引脚214配置于芯片座212的***,其中这些内引脚214包括至少一第一内引脚214a以及多个第二内引脚214b。汇流条216介于芯片座212与内引脚214之间,且汇流条216是以沉置设计的方式来与内引脚214之间维持一第一高度差H1。
芯片220具有彼此相对的一主动表面222以及一背面224。芯片220配置于芯片座212上,并且背面224朝向芯片座212。芯片220具有至少一第一接点226与多个第二接点228,其中第一接点226与第二接点228均位于主动表面222上。
第一焊线230连接于第一接点226与汇流条216之间。第二焊线232连接于汇流条216与第一内引脚214a之间。如此一来,第一接点226便能够经由第一焊线230、汇流条216以及第二焊线232来与第一内引脚214电性连接。第三焊线234则是连接于第二内引脚214b与这些第二接点228之间。
封装胶体240将芯片座212、内引脚214、汇流条216、芯片220、第一焊线230、第二焊线232以及第三焊线234包覆于其内。更佳的是,本实施例还可以经由沉置设计的方式,令芯片座212与内引脚214之间维持一第二高度差H2,以提高可靠度。
基于上述的结构,本实施例便能够以汇流条216为转接点,来将多个具有相同电位的第一接点226电性连接于与其相应的第一内引脚214a上。举例而言,当这些第一接点226是接地接点时,并且当这些第一内引脚214a是接地引脚时,本实施例就可以经由第一焊线230、汇流条216以及第二焊线232,来将这些第一接点226(接地接点)电性连接于这些第一内引脚214a(接地引脚)上。值得注意的是,由于汇流条216的各个部分的电位均相同,因此本实施例能够调整第一焊线230、第二焊线232与汇流条216接合的位置,以使得本实施例能够以较短的焊线长度(即第一焊线230以及第二焊线232的长度)来完成第一接点226与第一内引脚214a之间的电性连接。
当然在本发明的其他实施例中第一接点226也可以是电源接点或是信号接点。值得一提的是,当第一接点226是信号接点时,只有单一个第一接点226可以经由第一焊线230来电性连接于汇流条216上。
另外,本实施例的导线架210除了可以具有单一个汇流条216外,还可以顺应设计上的需要而具有多个汇流条216。举例而言,本实施例除了可以将一汇流条216形成于芯片座212的一侧外,还可以将另一汇流条216形成于芯片座212的另一侧。
当导线架210具有多个汇流条216时,本实施例的这些第一接点226还可以由多个接地接点、多个电源接点或是多个信号接点组成外,还可以是上述三种接点中任意两者的组合,甚至是上述三种接点所组合而成。需注意的是,当多个第一接点226连接至同一个汇流条216时,这些第一接点226的在任一时间点的电位必须是相同的。
图5是本发明另一实施例的芯片封装体的侧视示意图。图6是图5的芯片封装体的上视示意图。为了说明上的方便,图5与图6是透视封装胶体360的示意图,并且仅以虚线描绘出封装胶体360的轮廓。请共同参照图5与图6,芯片封装结构300,包括一芯片310、一导线架320、至少一第一焊线330、至少一第二焊线340、多条第三焊线350以及一封装胶体360。
芯片310具有一主动表面312。芯片310还具有至少一第一接点314与多个第二接点316,其中第一接点314与第二接点316是配置于主动表面312上。芯片310固着于导线架320的下方。导线架320包括多条内引脚322、一汇流条324。这些内引脚322的一端部位于主动表面312上,并且位于第一接点314与第二接点316的***,其中这些内引脚322包括多个第一内引脚322a以及多个第二内引脚322b。
汇流条324位于这些内引脚322与第一接点314、第二接点316之间,并位于主动表面212的上方,其中汇流条324是经由抬升(up-set)设计的方式,来与内引脚322之间维持一高度差H3。
第一焊线330连接于第一接点314与汇流条324之间。第二焊线340连接于汇流条324与第一内引脚322a之间。第三焊线350连接于第二内引脚222b与第二接点216之间。封装胶体360将内引脚322、汇流条324、芯片310、第一焊线330、第二焊线340以及第三焊线350包覆于其内。
基于上述的结构,本实施例便能够以汇流条324为转接点,来将多个具有相同电位的第一接点314电性连接于与其相应的第一内引脚322a上。举例而言,当这些第一接点314是接地接点时,并且当这些第一内引脚322a是接地引脚时,本实施例就可以经由第一焊线330、汇流条324以及第二焊线340,来将这些第一接点314(接地接点)电性连接于这些第一内引脚322a(接地引脚)上。值得注意的是,由于汇流条324的各个部分的电位均相同,因此本实施例能够调整第一焊线330、第二焊线340与汇流条324接合的位置,以使得本实施例能够以较短的焊线长度(即第一焊线330以及第二焊线340的长度)来完成第一接点314与第一内引脚322a之间的电性连接。
当然在本发明的其他实施例中第一接点314也可以是电源接点或是信号接点。值得一提的是,当第一接点314是信号接点时,只有单一个第一接点314可以经由第一焊线330来电性连接于汇流条324上。
另外,本实施例的导线架320除了可以具有单一个汇流条324外,还可以顺应设计上的需要而具有多个汇流条324。举例而言,本实施例除了可以将一汇流条324形成于第一接点314的一侧外,还可以将另一汇流条324形成于第一接点314的另一侧。
当导线架320具有多个汇流条324时,本实施例的这些第一接点314还可以由多个接地接点、多个电源接点或是多个信号接点组成外,还可以是上述三种接点中任意两者的组合,甚至是上述三种接点所组合而成。需注意的是,当多个第一接点314连接至同一个汇流条324时,这些第一接点314的电位必须是相同的。
相较于现有技术而言,由于本发明的汇流条与内引脚之间具有高度差,因此本发明可以缩小导线架所占的空间、缩短第一焊线以及第二焊线的线长。因此本发明所提出的芯片封装体具有小型化的优点。
虽然本发明已以较佳实施例揭示如上,然其并非用以限定本发明,任何本领域普通技术人员,在不脱离本发明的精神和范围内,当可作些许更动与润饰,因此本发明的保护范围当以权利要求所界定的为准。

Claims (5)

1.一种芯片封装结构,包括:
一导线架,包括:
一芯片座;
多条内引脚,配置于该芯片座的***;
至少一汇流条,介于该芯片座与该多条内引脚之间,且该汇流条与该多条内引脚之间维持一第一高度差,且该汇流条为沉置设计;
一芯片,具有彼此相对的一主动表面以及一背面,该芯片配置于该芯片座上,并且该背面朝向该芯片座,该芯片具有至少一第一接点与多个第二接点,该第一接点与该多个第二接点位于该主动表面上;
至少一第一焊线,连接于该第一接点与该汇流条之间;
至少一第二焊线,连接该汇流条与该多条内引脚其中之一之间;
多条第三焊线,分别连接其他该多条内引脚与该多个第二接点之间;以及
一封装胶体,包覆该芯片座、该多条内引脚、该汇流条、该芯片、该第一焊线、该第二焊线以及该多个第三焊线。
2.如权利要求1所述的芯片封装结构,其特征在于,该多条内引脚与该芯片座之间维持一第二高度差,且该芯片座为沉置设计。
3.如权利要求1所述的芯片封装结构,其特征在于,该第一接点包括电源接点、接地接点或信号接点。
4.一种芯片封装结构,包括:
一芯片,具有一主动表面与配置于该主动表面的至少一第一接点与多个第二接点;
一导线架,该芯片固着于该导线架下方,该导线架包括:
多条内引脚,该多条内引脚的一端部位于该主动表面上,并且位于该第一接点与该多个第二接点的***;
至少一汇流条,位于该多条内引脚以及该第一接点与该多个第二接点之间,并位于该主动表面的上方,其中该汇流条与该多条内引脚之间维持一高度差,且该汇流条为抬升设计;
至少一第一焊线,连接于该第一接点与该汇流条之间;
至少一第二焊线,连接于该汇流条与该多条内引脚其中之一之间;
多条第三焊线,分别连接于其他该多条内引脚与该多个第二接点之间;以及
一封装胶体,包覆该多条内引脚、该汇流条、该芯片、该第一焊线、该第二焊线以及该多个第三焊线。
5.如权利要求4所述的芯片封装结构,其特征在于,该第一接点包括电源接点、接地接点或信号接点。
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