BR112015016721A2 - sistema de análise de fluido com elemento de computação integrada formado usando deposição de camada atômica - Google Patents
sistema de análise de fluido com elemento de computação integrada formado usando deposição de camada atômicaInfo
- Publication number
- BR112015016721A2 BR112015016721A2 BR112015016721A BR112015016721A BR112015016721A2 BR 112015016721 A2 BR112015016721 A2 BR 112015016721A2 BR 112015016721 A BR112015016721 A BR 112015016721A BR 112015016721 A BR112015016721 A BR 112015016721A BR 112015016721 A2 BR112015016721 A2 BR 112015016721A2
- Authority
- BR
- Brazil
- Prior art keywords
- fluid analysis
- analysis system
- atomic layer
- layer deposition
- ice
- Prior art date
Links
- 239000012530 fluid Substances 0.000 title abstract 6
- 238000000231 atomic layer deposition Methods 0.000 title abstract 3
- 230000003287 optical effect Effects 0.000 abstract 6
- 238000000034 method Methods 0.000 abstract 2
- 239000000126 substance Substances 0.000 abstract 2
- 230000000704 physical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
- E21B49/08—Obtaining fluid samples or testing fluids, in boreholes or wells
- E21B49/087—Well testing, e.g. testing for reservoir productivity or formation parameters
- E21B49/088—Well testing, e.g. testing for reservoir productivity or formation parameters combined with sampling
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/457—Correlation spectrometry, e.g. of the intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
- G01V8/20—Detecting, e.g. by using light barriers using multiple transmitters or receivers
- G01V8/22—Detecting, e.g. by using light barriers using multiple transmitters or receivers using reflectors
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1213—Filters in general, e.g. dichroic, band
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1226—Interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mining & Mineral Resources (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Fluid Mechanics (AREA)
- Environmental & Geological Engineering (AREA)
- Geochemistry & Mineralogy (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Geophysics (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Filters (AREA)
Abstract
resumo sistema de análise de fluido com elemento de computação integrada formado usando deposição de camada atômica sistemas de análise de fluido com elementos de computação integrada (ices) ou outros componentes de caminho óptico formados usando deposição de camada atômica (ald) permitem tolerâncias melhoradas e flexibilidade de projeto. em algumas das modalidades divulgadas, um sistema de análise de fluido inclui uma fonte de luz e um ice. o sistema de análise de fluido também inclui um detector que converte sinais ópticos em sinais elétricos. o ice compreende uma pluralidade de camadas ópticas, em que pelo menos uma da pluralidade de camadas ópticas é formada utilizando ald. um método relacionado inclui selecionar um projeto ice tendo uma pluralidade de camadas ópticas. o método também inclui formar pelo menos uma da pluralidade de camadas ópticas do ice usando ald para permitir a predição de uma propriedade química ou física de uma substância. uma coluna de perfilagem relacionada inclui uma seção de ferramenta de perfilagem e uma ferramenta de análise de fluido associada com a seção de ferramenta de perfilagem.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2013/025546 WO2014123544A1 (en) | 2013-02-11 | 2013-02-11 | Fluid analysis system with integrated computation element formed using atomic layer deposition |
Publications (1)
Publication Number | Publication Date |
---|---|
BR112015016721A2 true BR112015016721A2 (pt) | 2017-07-11 |
Family
ID=51300016
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112015016721A BR112015016721A2 (pt) | 2013-02-11 | 2013-02-11 | sistema de análise de fluido com elemento de computação integrada formado usando deposição de camada atômica |
Country Status (10)
Country | Link |
---|---|
US (1) | US20150369043A1 (pt) |
EP (1) | EP2939055A4 (pt) |
JP (1) | JP2016507745A (pt) |
CN (1) | CN104981721A (pt) |
AU (1) | AU2013377941B2 (pt) |
BR (1) | BR112015016721A2 (pt) |
CA (1) | CA2897779A1 (pt) |
MX (1) | MX363597B (pt) |
RU (1) | RU2618743C2 (pt) |
WO (1) | WO2014123544A1 (pt) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2962393C (en) | 2014-11-10 | 2019-03-26 | Halliburton Energy Services, Inc. | Systems and methods for real-time measurement of gas content in drilling fluids |
WO2017019072A1 (en) * | 2015-07-29 | 2017-02-02 | Halliburton Energy Services, Inc. | Reconstructing optical spectra using integrated computational element structures |
EP3300508A4 (en) * | 2015-09-03 | 2019-01-16 | Halliburton Energy Services, Inc. | TRAINING FLUID ANALYSIS TOOL COMPRISING AN INTEGRATED COMPUTING ELEMENT AND AN OPTICAL FILTER |
CN108351299A (zh) * | 2015-12-29 | 2018-07-31 | 哈里伯顿能源服务公司 | 用于对管道的监控传输进行测量的光学计算装置 |
US20190025122A1 (en) * | 2016-04-14 | 2019-01-24 | Halliburton Energy Services, Inc. | Fabry-Perot Based Optical Computing |
WO2021137871A1 (en) * | 2020-01-03 | 2021-07-08 | Halliburton Energy Services, Inc. | Ald-thin layer coating applications for sensing telemetry through evanescent wave interactions |
CN112526663A (zh) * | 2020-11-04 | 2021-03-19 | 浙江大学 | 一种基于原子层沉积的吸收膜及其制作方法 |
US20220228265A1 (en) * | 2021-01-15 | 2022-07-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for dynamically adjusting thin-film deposition parameters |
Family Cites Families (25)
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US5506676A (en) * | 1994-10-25 | 1996-04-09 | Pixel Systems, Inc. | Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components |
US6198531B1 (en) * | 1997-07-11 | 2001-03-06 | University Of South Carolina | Optical computational system |
US6529276B1 (en) * | 1999-04-06 | 2003-03-04 | University Of South Carolina | Optical computational system |
TW556004B (en) * | 2001-01-31 | 2003-10-01 | Planar Systems Inc | Methods and apparatus for the production of optical filters |
US7294360B2 (en) * | 2003-03-31 | 2007-11-13 | Planar Systems, Inc. | Conformal coatings for micro-optical elements, and method for making the same |
US20070201136A1 (en) * | 2004-09-13 | 2007-08-30 | University Of South Carolina | Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control |
US7697141B2 (en) * | 2004-12-09 | 2010-04-13 | Halliburton Energy Services, Inc. | In situ optical computation fluid analysis system and method |
US20060139757A1 (en) * | 2004-12-29 | 2006-06-29 | Harris Michael D | Anti-reflective coating for optical windows and elements |
US7659504B1 (en) * | 2005-05-18 | 2010-02-09 | Ric Investments, Llc | Optical sensor with an optical element transmissive to warming radiation |
US7911605B2 (en) * | 2005-11-28 | 2011-03-22 | Halliburton Energy Services, Inc. | Multivariate optical elements for optical analysis system |
US7623233B2 (en) * | 2006-03-10 | 2009-11-24 | Ometric Corporation | Optical analysis systems and methods for dynamic, high-speed detection and real-time multivariate optical computing |
JP2011523225A (ja) * | 2008-06-10 | 2011-08-04 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Ledモジュール |
WO2010044922A1 (en) * | 2008-06-12 | 2010-04-22 | Anguel Nikolov | Thin film and optical interference filter incorporating high-index titanium dioxide and method for making them |
CA2750374A1 (en) * | 2009-01-13 | 2010-07-22 | Schlumberger Canada Limited | In-situ stress measurements in hydrocarbon bearing shales |
KR20110007408A (ko) * | 2009-07-16 | 2011-01-24 | 삼성전자주식회사 | 3차원 컬러 입체 영상 센서용 광학 필터를 갖는 반도체 소자 및 제조 방법 |
WO2011014144A1 (en) * | 2009-07-30 | 2011-02-03 | Halliburton Energy Services, Inc. | Energy intensity transformation |
WO2011018115A1 (en) * | 2009-08-13 | 2011-02-17 | Siemens Aktiengesellschaft | A combustion apparatus |
CA2728594C (en) * | 2010-01-15 | 2017-06-13 | Innovision Inc | An optical spectral filter, angular filter and polariser |
JP4690495B1 (ja) * | 2010-03-09 | 2011-06-01 | 孝司 成澤 | 最適化シミュレーションプログラムおよび最適化シミュレーション装置 |
JP4854098B1 (ja) * | 2010-08-10 | 2012-01-11 | 孝司 成澤 | 成膜方法およびそれを用いた成膜装置 |
US8411262B2 (en) * | 2010-09-30 | 2013-04-02 | Precision Energy Services, Inc. | Downhole gas breakout sensor |
US8717488B2 (en) * | 2011-01-18 | 2014-05-06 | Primesense Ltd. | Objective optics with interference filter |
FR2973939A1 (fr) * | 2011-04-08 | 2012-10-12 | Saint Gobain | Element en couches pour l’encapsulation d’un element sensible |
US20130031972A1 (en) * | 2011-08-05 | 2013-02-07 | Halliburton Energy Services, Inc. | Methods for monitoring a water source using opticoanalytical devices |
US8908165B2 (en) * | 2011-08-05 | 2014-12-09 | Halliburton Energy Services, Inc. | Systems and methods for monitoring oil/gas separation processes |
-
2013
- 2013-02-11 RU RU2015129794A patent/RU2618743C2/ru not_active IP Right Cessation
- 2013-02-11 CA CA2897779A patent/CA2897779A1/en not_active Abandoned
- 2013-02-11 WO PCT/US2013/025546 patent/WO2014123544A1/en active Application Filing
- 2013-02-11 AU AU2013377941A patent/AU2013377941B2/en not_active Ceased
- 2013-02-11 US US14/766,960 patent/US20150369043A1/en not_active Abandoned
- 2013-02-11 JP JP2015553707A patent/JP2016507745A/ja active Pending
- 2013-02-11 EP EP13874410.7A patent/EP2939055A4/en not_active Withdrawn
- 2013-02-11 MX MX2015009318A patent/MX363597B/es unknown
- 2013-02-11 BR BR112015016721A patent/BR112015016721A2/pt not_active IP Right Cessation
- 2013-02-11 CN CN201380070609.XA patent/CN104981721A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
EP2939055A4 (en) | 2016-10-26 |
AU2013377941B2 (en) | 2017-04-13 |
JP2016507745A (ja) | 2016-03-10 |
AU2013377941A1 (en) | 2015-07-23 |
CA2897779A1 (en) | 2014-08-14 |
US20150369043A1 (en) | 2015-12-24 |
MX2015009318A (es) | 2015-09-29 |
RU2618743C2 (ru) | 2017-05-11 |
EP2939055A1 (en) | 2015-11-04 |
CN104981721A (zh) | 2015-10-14 |
MX363597B (es) | 2019-03-28 |
RU2015129794A (ru) | 2017-03-16 |
WO2014123544A1 (en) | 2014-08-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 6A ANUIDADE. |
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B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2500 DE 04-12-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |