AU2851489A - Laser chip testing - Google Patents

Laser chip testing

Info

Publication number
AU2851489A
AU2851489A AU28514/89A AU2851489A AU2851489A AU 2851489 A AU2851489 A AU 2851489A AU 28514/89 A AU28514/89 A AU 28514/89A AU 2851489 A AU2851489 A AU 2851489A AU 2851489 A AU2851489 A AU 2851489A
Authority
AU
Australia
Prior art keywords
laser chip
chip testing
testing
laser
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
AU28514/89A
Other versions
AU611523B2 (en
Inventor
Albrecht Mozer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel Lucent NV
Original Assignee
Alcatel NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel NV filed Critical Alcatel NV
Publication of AU2851489A publication Critical patent/AU2851489A/en
Application granted granted Critical
Publication of AU611523B2 publication Critical patent/AU611523B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Semiconductor Lasers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU28514/89A 1988-02-01 1989-01-16 Laser chip testing Ceased AU611523B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3802841 1988-02-01
DE3802841A DE3802841A1 (en) 1988-02-01 1988-02-01 Method for characterising optical properties of semiconductor lasers, and device for carrying out the method

Publications (2)

Publication Number Publication Date
AU2851489A true AU2851489A (en) 1989-08-03
AU611523B2 AU611523B2 (en) 1991-06-13

Family

ID=6346353

Family Applications (1)

Application Number Title Priority Date Filing Date
AU28514/89A Ceased AU611523B2 (en) 1988-02-01 1989-01-16 Laser chip testing

Country Status (3)

Country Link
JP (1) JPH069283B2 (en)
AU (1) AU611523B2 (en)
DE (1) DE3802841A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112041975A (en) * 2018-04-27 2020-12-04 科磊股份有限公司 Process induced displacement characterization during semiconductor production
CN117074836A (en) * 2023-10-12 2023-11-17 成都明夷电子科技有限公司 Laser detection method, detector, electronic equipment and storage medium

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0776795B2 (en) * 1989-01-25 1995-08-16 三菱原子燃料株式会社 Support grid
CA2008898C (en) * 1989-10-25 1998-11-24 Takeshi Endoh Method for detecting partial discharge in an insulation of an electric power apparatus
DE4109727A1 (en) * 1991-03-25 1992-10-01 Standard Elektrik Lorenz Ag METHOD AND DEVICE FOR COATING AN OPTOELECTRONIC COMPONENT
FR2708153B1 (en) * 1993-07-21 1995-09-22 Joindot Irene Method for determining the emission wavelength of semiconductor lasers with Fabry-Perot cavity from electrical measurements.
JP4537082B2 (en) * 2004-01-28 2010-09-01 三菱電機株式会社 Semiconductor laser inspection method and inspection apparatus
CN1333259C (en) * 2004-10-11 2007-08-22 中国科学院半导体研究所 Test desk for high frequency characteristics of semiconductor laser chip with noncoplanar electrode
CN100344982C (en) * 2004-10-11 2007-10-24 中国科学院半导体研究所 Test fixture in high frequency measuring chip of laser in structure of monocoplanar electrode
US20220239056A1 (en) * 2021-01-25 2022-07-28 Mellanox Technologies Tlv Ltd. Wafer level analysis for vcsel screening
US11955778B2 (en) 2021-01-25 2024-04-09 Mellanox Technologies, Ltd. VCSEL binning for optical interconnects

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3016778A1 (en) * 1980-04-30 1981-11-05 Siemens AG, 1000 Berlin und 8000 München LASER DIODE
DE3702184A1 (en) * 1986-01-27 1987-07-30 Feinmetall Gmbh Test device for wafer testing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112041975A (en) * 2018-04-27 2020-12-04 科磊股份有限公司 Process induced displacement characterization during semiconductor production
CN112041975B (en) * 2018-04-27 2024-04-12 科磊股份有限公司 Process induced displacement characterization during semiconductor production
CN117074836A (en) * 2023-10-12 2023-11-17 成都明夷电子科技有限公司 Laser detection method, detector, electronic equipment and storage medium
CN117074836B (en) * 2023-10-12 2024-03-12 成都明夷电子科技有限公司 Laser detection method, detector, electronic equipment and storage medium

Also Published As

Publication number Publication date
JPH01228189A (en) 1989-09-12
AU611523B2 (en) 1991-06-13
DE3802841A1 (en) 1989-08-03
JPH069283B2 (en) 1994-02-02

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Legal Events

Date Code Title Description
MK14 Patent ceased section 143(a) (annual fees not paid) or expired