ATE504065T1 - Minderung der lesestörungen in nicht-flüchtigen speichern - Google Patents

Minderung der lesestörungen in nicht-flüchtigen speichern

Info

Publication number
ATE504065T1
ATE504065T1 AT06844753T AT06844753T ATE504065T1 AT E504065 T1 ATE504065 T1 AT E504065T1 AT 06844753 T AT06844753 T AT 06844753T AT 06844753 T AT06844753 T AT 06844753T AT E504065 T1 ATE504065 T1 AT E504065T1
Authority
AT
Austria
Prior art keywords
volatile memory
read disturb
reducing reading
reducing
source side
Prior art date
Application number
AT06844753T
Other languages
English (en)
Inventor
Yupin Fong
Jun Wan
Jeffrey Lutze
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/295,776 external-priority patent/US7349258B2/en
Priority claimed from US11/296,087 external-priority patent/US7262994B2/en
Application filed by Sandisk Corp filed Critical Sandisk Corp
Application granted granted Critical
Publication of ATE504065T1 publication Critical patent/ATE504065T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/564—Miscellaneous aspects
    • G11C2211/5642—Multilevel memory with buffers, latches, registers at input or output

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Micro-Organisms Or Cultivation Processes Thereof (AREA)
  • Debugging And Monitoring (AREA)
AT06844753T 2005-12-06 2006-11-30 Minderung der lesestörungen in nicht-flüchtigen speichern ATE504065T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/295,776 US7349258B2 (en) 2005-12-06 2005-12-06 Reducing read disturb for non-volatile storage
US11/296,087 US7262994B2 (en) 2005-12-06 2005-12-06 System for reducing read disturb for non-volatile storage
PCT/US2006/046126 WO2007067447A1 (en) 2005-12-06 2006-11-30 Reducing read disturb for non-volatile storage

Publications (1)

Publication Number Publication Date
ATE504065T1 true ATE504065T1 (de) 2011-04-15

Family

ID=37836814

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06844753T ATE504065T1 (de) 2005-12-06 2006-11-30 Minderung der lesestörungen in nicht-flüchtigen speichern

Country Status (7)

Country Link
EP (2) EP1958206B1 (de)
JP (1) JP4960378B2 (de)
KR (1) KR100948200B1 (de)
AT (1) ATE504065T1 (de)
DE (1) DE602006021058D1 (de)
TW (1) TWI315524B (de)
WO (1) WO2007067447A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101301140B1 (ko) * 2007-07-13 2013-09-03 삼성전자주식회사 읽기 디스터브가 방지되는 불휘발성 반도체 메모리 장치 및그것의 읽기 방법
KR101001449B1 (ko) * 2009-04-14 2010-12-14 주식회사 하이닉스반도체 불휘발성 소자의 독출 동작 방법
JP5044624B2 (ja) * 2009-09-25 2012-10-10 株式会社東芝 不揮発性半導体記憶装置
WO2012082880A1 (en) * 2010-12-14 2012-06-21 University Of Massachusetts Methods and systems for low-power storage
JP5385435B1 (ja) * 2012-07-18 2014-01-08 力晶科技股▲ふん▼有限公司 不揮発性半導体記憶装置とその読み出し方法
KR102067755B1 (ko) * 2013-02-12 2020-01-17 삼성전자주식회사 불휘발성 메모리 장치 및 그것의 제어 방법

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960002006B1 (ko) 1991-03-12 1996-02-09 가부시끼가이샤 도시바 2개의 기준 레벨을 사용하는 기록 검증 제어기를 갖는 전기적으로 소거 가능하고 프로그램 가능한 불휘발성 메모리 장치
US6222762B1 (en) 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5555204A (en) 1993-06-29 1996-09-10 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device
KR0169267B1 (ko) 1993-09-21 1999-02-01 사토 후미오 불휘발성 반도체 기억장치
JPH09251791A (ja) * 1996-03-18 1997-09-22 Toshiba Corp 不揮発性半導体記憶装置
US5903495A (en) 1996-03-18 1999-05-11 Kabushiki Kaisha Toshiba Semiconductor device and memory system
JP3679970B2 (ja) * 2000-03-28 2005-08-03 株式会社東芝 不揮発性半導体記憶装置及びその製造方法
JP3829088B2 (ja) * 2001-03-29 2006-10-04 株式会社東芝 半導体記憶装置
US6522580B2 (en) 2001-06-27 2003-02-18 Sandisk Corporation Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states
US6456528B1 (en) 2001-09-17 2002-09-24 Sandisk Corporation Selective operation of a multi-state non-volatile memory system in a binary mode
US6657891B1 (en) 2002-11-29 2003-12-02 Kabushiki Kaisha Toshiba Semiconductor memory device for storing multivalued data
US6859397B2 (en) 2003-03-05 2005-02-22 Sandisk Corporation Source side self boosting technique for non-volatile memory
JP3913704B2 (ja) 2003-04-22 2007-05-09 株式会社東芝 不揮発性半導体記憶装置及びこれを用いた電子装置
US7237074B2 (en) 2003-06-13 2007-06-26 Sandisk Corporation Tracking cells for a memory system
US6917542B2 (en) 2003-07-29 2005-07-12 Sandisk Corporation Detecting over programmed memory
KR100515060B1 (ko) 2003-08-13 2005-09-14 삼성전자주식회사 비트 라인의 프리차지 레벨을 일정하게 유지하는 불휘발성반도체 메모리 장치
KR100630535B1 (ko) * 2004-03-23 2006-09-29 에스티마이크로일렉트로닉스 엔.브이. 멀티 레벨 낸드 플래시 메모리 셀의 독출 방법 및 회로
US7120051B2 (en) 2004-12-14 2006-10-10 Sandisk Corporation Pipelined programming of non-volatile memories using early data

Also Published As

Publication number Publication date
JP4960378B2 (ja) 2012-06-27
KR100948200B1 (ko) 2010-03-17
KR20080080621A (ko) 2008-09-04
EP1958206A1 (de) 2008-08-20
EP1958206B1 (de) 2011-03-30
JP2009518774A (ja) 2009-05-07
DE602006021058D1 (de) 2011-05-12
WO2007067447A1 (en) 2007-06-14
TWI315524B (en) 2009-10-01
EP2256748B1 (de) 2013-09-11
TW200741719A (en) 2007-11-01
EP2256748A1 (de) 2010-12-01

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