ATE392628T1 - Reichweitenbildsensor - Google Patents

Reichweitenbildsensor

Info

Publication number
ATE392628T1
ATE392628T1 AT05785265T AT05785265T ATE392628T1 AT E392628 T1 ATE392628 T1 AT E392628T1 AT 05785265 T AT05785265 T AT 05785265T AT 05785265 T AT05785265 T AT 05785265T AT E392628 T1 ATE392628 T1 AT E392628T1
Authority
AT
Austria
Prior art keywords
range image
image
detection period
image sensor
detecting element
Prior art date
Application number
AT05785265T
Other languages
English (en)
Inventor
Fumikazu Kurihara
Yuji Takada
Yusuke Hashimoto
Fumi Tsunesada
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=35447510&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE392628(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from JP2004272000A external-priority patent/JP3906858B2/ja
Priority claimed from JP2004272001A external-priority patent/JP3906859B2/ja
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Application granted granted Critical
Publication of ATE392628T1 publication Critical patent/ATE392628T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4913—Circuits for detection, sampling, integration or read-out
    • G01S7/4914—Circuits for detection, sampling, integration or read-out of detector arrays, e.g. charge-transfer gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4918—Controlling received signal intensity, gain or exposure of sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/493—Extracting wanted echo signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
    • G01S17/36—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated with phase comparison between the received signal and the contemporaneously transmitted signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Optical Distance (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measuring Fluid Pressure (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Burglar Alarm Systems (AREA)
AT05785265T 2004-09-17 2005-09-16 Reichweitenbildsensor ATE392628T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004272000A JP3906858B2 (ja) 2004-09-17 2004-09-17 距離画像センサ
JP2004272001A JP3906859B2 (ja) 2004-09-17 2004-09-17 距離画像センサ

Publications (1)

Publication Number Publication Date
ATE392628T1 true ATE392628T1 (de) 2008-05-15

Family

ID=35447510

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05785265T ATE392628T1 (de) 2004-09-17 2005-09-16 Reichweitenbildsensor

Country Status (8)

Country Link
US (1) US7362419B2 (de)
EP (1) EP1668384B1 (de)
KR (1) KR100778904B1 (de)
AT (1) ATE392628T1 (de)
DE (1) DE602005006080T2 (de)
HK (1) HK1088394A1 (de)
TW (1) TWI280042B (de)
WO (1) WO2006030989A1 (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1944622B1 (de) 2006-10-18 2013-04-10 Panasonic Corporation Erkennungsgerät für rauminformation
JP4757779B2 (ja) * 2006-11-15 2011-08-24 浜松ホトニクス株式会社 距離画像センサ
KR101030263B1 (ko) * 2006-11-30 2011-04-22 고쿠리츠 다이가꾸 호우진 시즈오까 다이가꾸 반도체 거리 측정 소자 및 고체 촬상 장치
JP2008241695A (ja) * 2007-02-27 2008-10-09 Fujifilm Corp 測距装置及び測距方法
JP2008209298A (ja) * 2007-02-27 2008-09-11 Fujifilm Corp 測距装置及び測距方法
EP2147465B1 (de) * 2007-03-30 2016-02-24 Panasonic Intellectual Property Management Co., Ltd. Ccd-bildaufnahmeanordnung mit einem zweifachen einzelbildspeicherteil und verfahren zur verwendung der anordnung
WO2010021090A1 (ja) * 2008-08-20 2010-02-25 パナソニック株式会社 距離推定装置、距離推定方法、プログラム、集積回路およびカメラ
DE102008052064B4 (de) * 2008-10-17 2010-09-09 Diehl Bgt Defence Gmbh & Co. Kg Vorrichtung zur Aufnahme von Bildern einer Objektszene
DE102009009047A1 (de) * 2009-02-16 2010-08-19 Daimler Ag Verfahren zur Objektdetektion
US8531651B2 (en) * 2009-03-05 2013-09-10 Panasonic Corporation Distance measuring device, distance measuring method, program, and integrated circuit
US8324602B2 (en) * 2009-04-14 2012-12-04 Intersil Americas Inc. Optical sensors that reduce specular reflections
US8232541B2 (en) * 2009-04-14 2012-07-31 Intersil Americas Inc. Optical sensors that reduce specular reflections
KR101668869B1 (ko) * 2009-05-29 2016-10-28 삼성전자주식회사 거리 센서, 3차원 이미지 센서 및 그 거리 산출 방법
WO2011020921A1 (en) * 2009-08-21 2011-02-24 Iee International Electronics & Engineering S.A. Time-of-flight sensor
KR101565969B1 (ko) * 2009-09-01 2015-11-05 삼성전자주식회사 깊이 정보를 추정할 수 있는 방법과 장치, 및 상기 장치를 포함하는 신호 처리 장치
US9442196B2 (en) * 2010-01-06 2016-09-13 Heptagon Micro Optics Pte. Ltd. Demodulation sensor with separate pixel and storage arrays
US8644376B2 (en) * 2010-09-30 2014-02-04 Alcatel Lucent Apparatus and method for generating compressive measurements of video using spatial and temporal integration
KR101669412B1 (ko) * 2010-11-01 2016-10-26 삼성전자주식회사 3ｄ 카메라를 위한 깊이 정보 측정 방법 및 장치
TWI403697B (zh) * 2010-12-16 2013-08-01 Univ Nat Taipei Technology 以單一影像擷取裝置提供距離量測的系統及其方法
EP2492668B1 (de) * 2011-02-28 2013-08-28 C.R.F. Società Consortile per Azioni System und Verfahren zur Überwachung der Lackqualität von Komponenten, insbesondere von Kraftfahrzeugskarosserien
KR101888564B1 (ko) * 2011-12-29 2018-08-16 삼성전자주식회사 깊이 센서, 및 이의 깊이 계산 방법
JP5774512B2 (ja) * 2012-01-31 2015-09-09 株式会社東芝 測距装置
KR101977711B1 (ko) 2012-10-12 2019-05-13 삼성전자주식회사 깊이 센서, 이의 이미지 캡쳐 방법, 및 상기 깊이 센서를 포함하는 이미지 처리 시스템
TWI549506B (zh) 2013-05-21 2016-09-11 原相科技股份有限公司 光學偵測裝置及其同步調整方法
US10203399B2 (en) 2013-11-12 2019-02-12 Big Sky Financial Corporation Methods and apparatus for array based LiDAR systems with reduced interference
US9360554B2 (en) 2014-04-11 2016-06-07 Facet Technology Corp. Methods and apparatus for object detection and identification in a multiple detector lidar array
JP6507529B2 (ja) 2014-08-29 2019-05-08 株式会社デンソー 光飛行型測距装置
US10036801B2 (en) 2015-03-05 2018-07-31 Big Sky Financial Corporation Methods and apparatus for increased precision and improved range in a multiple detector LiDAR array
JP6747822B2 (ja) 2016-02-23 2020-08-26 株式会社トプコン 距離測定装置、距離測定方法および距離測定用プログラム
JP2017150893A (ja) * 2016-02-23 2017-08-31 ソニー株式会社 測距モジュール、測距システム、および、測距モジュールの制御方法
US9866816B2 (en) 2016-03-03 2018-01-09 4D Intellectual Properties, Llc Methods and apparatus for an active pulsed 4D camera for image acquisition and analysis
WO2017217745A1 (ko) * 2016-06-13 2017-12-21 엘지전자 주식회사 야간 영상표시 장치
US11560091B2 (en) * 2016-06-13 2023-01-24 Lg Electronics Inc. Night vision display device
WO2019044487A1 (ja) * 2017-08-28 2019-03-07 ソニーセミコンダクタソリューションズ株式会社 測距装置、及び、測距方法
WO2019053896A1 (ja) * 2017-09-15 2019-03-21 三菱電機株式会社 信号処理装置、センサ装置および信号処理方法
US10999524B1 (en) * 2018-04-12 2021-05-04 Amazon Technologies, Inc. Temporal high dynamic range imaging using time-of-flight cameras
JP7030607B2 (ja) * 2018-04-27 2022-03-07 ソニーセミコンダクタソリューションズ株式会社 測距処理装置、測距モジュール、測距処理方法、およびプログラム
US10708484B2 (en) 2018-06-20 2020-07-07 Amazon Technologies, Inc. Detecting interference between time-of-flight cameras using modified image sensor arrays
US10681338B1 (en) 2018-07-24 2020-06-09 Amazon Technologies, Inc. Detecting interference in depth images captured using overlapping depth cameras
US10915783B1 (en) 2018-12-14 2021-02-09 Amazon Technologies, Inc. Detecting and locating actors in scenes based on degraded or supersaturated depth data

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4440613C1 (de) 1994-11-14 1996-07-25 Leica Ag Vorrichtung und Verfahren zur Detektion und Demodulation eines intensitätsmodulierten Strahlungsfeldes
JPH09257418A (ja) 1996-03-26 1997-10-03 Matsushita Electric Works Ltd 光走査型変位測定装置
US6219097B1 (en) * 1996-05-08 2001-04-17 Olympus Optical Co., Ltd. Image pickup with expanded dynamic range where the first exposure is adjustable and second exposure is predetermined
WO1998010255A1 (de) 1996-09-05 1998-03-12 Rudolf Schwarte Verfahren und vorrichtung zur bestimmung der phasen- und/oder amplitudeninformation einer elektromagnetischen welle
DE59809883D1 (de) 1997-12-23 2003-11-13 Siemens Ag Verfahren und vorrichtung zur aufnahme eines dreidimensionalen abstandsbildes
DE19821974B4 (de) 1998-05-18 2008-04-10 Schwarte, Rudolf, Prof. Dr.-Ing. Vorrichtung und Verfahren zur Erfassung von Phase und Amplitude elektromagnetischer Wellen
JP3861475B2 (ja) 1998-09-29 2006-12-20 コニカミノルタセンシング株式会社 ３次元入力装置
EP1152261A1 (de) 2000-04-28 2001-11-07 CSEM Centre Suisse d'Electronique et de Microtechnique SA Vorrichtung und Verfahren zur ortsauflösende Photodetektion und Demodulation von modulierten elektromagnetischen Wellen
EP1356664A4 (de) 2000-12-11 2009-07-22 Canesta Inc Cmos-kompatible dreidimensionale bilderfassung durch quanteneffizienzmodulation
JP4644958B2 (ja) * 2001-03-19 2011-03-09 パナソニック電工株式会社 距離測定装置
JP3832441B2 (ja) 2002-04-08 2006-10-11 松下電工株式会社 強度変調光を用いた空間情報の検出装置
US6810207B2 (en) * 2002-05-13 2004-10-26 Olympus Corporation Camera
JP3906824B2 (ja) 2003-05-30 2007-04-18 松下電工株式会社 強度変調光を用いた空間情報の検出装置
EP1521981B1 (de) * 2002-07-15 2008-02-20 Matsushita Electric Works, Ltd. Lichtempfangsvorrichtung mit regelbarer empfindlichkeit und gerät zur detektion der räumlichen information welche diese verwendet
JP3758618B2 (ja) 2002-07-15 2006-03-22 松下電工株式会社 撮像素子を用いた測距装置および測距方法
JP2004272001A (ja) 2003-03-10 2004-09-30 Olympus Corp 非球面単レンズ光学系および非球面単レンズ光学系を備えた光学システム。
JP3906818B2 (ja) 2003-04-07 2007-04-18 松下電工株式会社 受光素子の感度制御方法、強度変調光を用いた空間情報の検出装置
JP3906858B2 (ja) 2004-09-17 2007-04-18 松下電工株式会社 距離画像センサ
JP3906859B2 (ja) 2004-09-17 2007-04-18 松下電工株式会社 距離画像センサ

Also Published As

Publication number Publication date
US7362419B2 (en) 2008-04-22
DE602005006080D1 (de) 2008-05-29
KR100778904B1 (ko) 2007-11-22
US20070057209A1 (en) 2007-03-15
WO2006030989A1 (en) 2006-03-23
DE602005006080T2 (de) 2009-05-07
EP1668384A1 (de) 2006-06-14
KR20060055553A (ko) 2006-05-23
EP1668384B1 (de) 2008-04-16
TW200614792A (en) 2006-05-01
HK1088394A1 (en) 2006-11-03
TWI280042B (en) 2007-04-21

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