ATE386257T1 - Integrierte schaltung mit temperaturerkennungsschaltung und verfahren zur kalibrierung der temperaturerkennungsschaltung - Google Patents
Integrierte schaltung mit temperaturerkennungsschaltung und verfahren zur kalibrierung der temperaturerkennungsschaltungInfo
- Publication number
- ATE386257T1 ATE386257T1 AT05256839T AT05256839T ATE386257T1 AT E386257 T1 ATE386257 T1 AT E386257T1 AT 05256839 T AT05256839 T AT 05256839T AT 05256839 T AT05256839 T AT 05256839T AT E386257 T1 ATE386257 T1 AT E386257T1
- Authority
- AT
- Austria
- Prior art keywords
- temperature detection
- detection circuit
- integrated circuit
- calibration
- input signal
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title abstract 6
- 238000000034 method Methods 0.000 title abstract 2
- 230000001419 dependent effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31704—Design for test; Design verification
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/982,019 US7102417B2 (en) | 2004-11-05 | 2004-11-05 | Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE386257T1 true ATE386257T1 (de) | 2008-03-15 |
Family
ID=35724322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05256839T ATE386257T1 (de) | 2004-11-05 | 2005-11-04 | Integrierte schaltung mit temperaturerkennungsschaltung und verfahren zur kalibrierung der temperaturerkennungsschaltung |
Country Status (6)
Country | Link |
---|---|
US (1) | US7102417B2 (de) |
EP (1) | EP1655591B1 (de) |
JP (1) | JP4279825B2 (de) |
CN (1) | CN100454542C (de) |
AT (1) | ATE386257T1 (de) |
DE (1) | DE602005004720T2 (de) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7842044B2 (en) * | 2003-12-17 | 2010-11-30 | Depuy Spine, Inc. | Instruments and methods for bone anchor engagement and spinal rod reduction |
US7826998B1 (en) * | 2004-11-19 | 2010-11-02 | Cypress Semiconductor Corporation | System and method for measuring the temperature of a device |
US20060192597A1 (en) * | 2005-02-04 | 2006-08-31 | Johns Charles R | Temperature sensing circuits, and temperature detection circuits including same |
US7356716B2 (en) * | 2005-02-24 | 2008-04-08 | International Business Machines Corporation | System and method for automatic calibration of a reference voltage |
US20060229839A1 (en) * | 2005-03-29 | 2006-10-12 | United Memories, Inc. Colorado Springs | Temperature sensing and monitoring technique for integrated circuit devices |
US7590473B2 (en) * | 2006-02-16 | 2009-09-15 | Intel Corporation | Thermal management using an on-die thermal sensor |
US7603249B1 (en) * | 2006-04-19 | 2009-10-13 | Darryl Walker | Semiconductor device having variable parameter selection based on temperature and test method |
US7642809B2 (en) * | 2007-02-06 | 2010-01-05 | Rapid Bridge Llc | Die apparatus having configurable input/output and control method thereof |
KR100816150B1 (ko) * | 2007-02-14 | 2008-03-21 | 주식회사 하이닉스반도체 | 온도 감지 장치 |
TWI355484B (en) * | 2007-12-14 | 2012-01-01 | Ind Tech Res Inst | Apparatus and method for measuring character and c |
US8615205B2 (en) | 2007-12-18 | 2013-12-24 | Qualcomm Incorporated | I-Q mismatch calibration and method |
US8075178B2 (en) * | 2008-02-11 | 2011-12-13 | Zentrum Mikroelektronic Desden AG | Circuit arrangement to adjust and calibrate a MEMS-sensor device for flow measurement of gases or liquids |
US8449173B1 (en) * | 2008-04-10 | 2013-05-28 | Google Inc. | Method and system for thermal testing of computing system components |
US8970272B2 (en) | 2008-05-15 | 2015-03-03 | Qualcomm Incorporated | High-speed low-power latches |
US8712357B2 (en) * | 2008-11-13 | 2014-04-29 | Qualcomm Incorporated | LO generation with deskewed input oscillator signal |
US8718574B2 (en) | 2008-11-25 | 2014-05-06 | Qualcomm Incorporated | Duty cycle adjustment for a local oscillator signal |
US8847638B2 (en) | 2009-07-02 | 2014-09-30 | Qualcomm Incorporated | High speed divide-by-two circuit |
US8791740B2 (en) | 2009-07-16 | 2014-07-29 | Qualcomm Incorporated | Systems and methods for reducing average current consumption in a local oscillator path |
CN101995301B (zh) * | 2009-08-20 | 2012-08-01 | 上海华虹Nec电子有限公司 | 集成电路温度检测电路及其校准方法 |
US20110169551A1 (en) * | 2010-01-08 | 2011-07-14 | Stanescu Cornel D | Temperature sensor and method |
KR101132795B1 (ko) * | 2010-02-25 | 2012-04-02 | 주식회사 하이닉스반도체 | 온도센서 |
US8854098B2 (en) | 2011-01-21 | 2014-10-07 | Qualcomm Incorporated | System for I-Q phase mismatch detection and correction |
US8734006B2 (en) | 2011-03-02 | 2014-05-27 | International Business Machines Corporation | Calibration of an on-die thermal sensor |
CN102779555A (zh) * | 2011-05-13 | 2012-11-14 | 英特格灵芯片(天津)有限公司 | 用于校准模拟集成电路的方法和装置 |
US9927266B2 (en) * | 2012-02-27 | 2018-03-27 | Nxp Usa, Inc. | Multi-chip device with temperature control element for temperature calibration |
US9154077B2 (en) | 2012-04-12 | 2015-10-06 | Qualcomm Incorporated | Compact high frequency divider |
WO2014094901A1 (en) | 2012-12-21 | 2014-06-26 | Telefonaktiebolaget L M Ericsson (Publ) | An electronic load module and a method and a system therefor |
CN103698691B (zh) * | 2013-12-27 | 2016-08-17 | 珠海银隆电器有限公司 | 电动汽车网桥板自动检测校准方法 |
US9958339B2 (en) * | 2014-02-07 | 2018-05-01 | Boston Scientific Neuromodulation Corporation | Temperature sensing circuitry for an implantable medical device |
US9939330B2 (en) | 2014-03-28 | 2018-04-10 | Darryl G. Walker | Semiconductor device having subthreshold operating circuits including a back body bias potential based on temperature range |
US20160054378A1 (en) | 2014-08-20 | 2016-02-25 | Darryl G. Walker | Testing and setting performance parameters in a semiconductor device and method therefor |
US9613719B1 (en) | 2015-02-17 | 2017-04-04 | Darryl G. Walker | Multi-chip non-volatile semiconductor memory package including heater and sensor elements |
CN109932630B (zh) * | 2017-12-15 | 2021-08-03 | 朋程科技股份有限公司 | 过温度检测电路及其测试方法 |
CN110954248B (zh) * | 2019-12-26 | 2021-05-07 | 上海贝岭股份有限公司 | 具有自动校准功能的温度传感器及校准方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5781075A (en) | 1996-11-01 | 1998-07-14 | Motorola, Inc. | Temperature sensing apparatus |
US6283628B1 (en) | 1998-09-11 | 2001-09-04 | Airpax Corporation, Llc | Intelligent input/output temperature sensor and calibration method therefor |
SE517457C2 (sv) * | 2000-08-29 | 2002-06-11 | Ericsson Telefon Ab L M | Metod och anordning för bakgrundskalibrering av A/D- omvandlare |
JP3721119B2 (ja) * | 2001-11-08 | 2005-11-30 | 株式会社東芝 | 温度センサ |
JP4101590B2 (ja) * | 2002-08-30 | 2008-06-18 | エスアイアイ・ナノテクノロジー株式会社 | 熱分析装置 |
US7042301B2 (en) | 2002-10-15 | 2006-05-09 | Marvell International Ltd. | Crystal oscillator emulator |
-
2004
- 2004-11-05 US US10/982,019 patent/US7102417B2/en not_active Expired - Fee Related
-
2005
- 2005-11-04 EP EP05256839A patent/EP1655591B1/de active Active
- 2005-11-04 JP JP2005320851A patent/JP4279825B2/ja active Active
- 2005-11-04 DE DE602005004720T patent/DE602005004720T2/de active Active
- 2005-11-04 AT AT05256839T patent/ATE386257T1/de not_active IP Right Cessation
- 2005-11-07 CN CNB2005101373927A patent/CN100454542C/zh active Active
Also Published As
Publication number | Publication date |
---|---|
DE602005004720D1 (de) | 2008-03-27 |
EP1655591A1 (de) | 2006-05-10 |
JP4279825B2 (ja) | 2009-06-17 |
JP2006133228A (ja) | 2006-05-25 |
CN100454542C (zh) | 2009-01-21 |
US20060097757A1 (en) | 2006-05-11 |
DE602005004720T2 (de) | 2009-02-12 |
CN1815737A (zh) | 2006-08-09 |
US7102417B2 (en) | 2006-09-05 |
EP1655591B1 (de) | 2008-02-13 |
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Legal Events
Date | Code | Title | Description |
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |