ATE353538T1 - Einrichtung zur bestimmung eines positionsfehlers - Google Patents
Einrichtung zur bestimmung eines positionsfehlersInfo
- Publication number
- ATE353538T1 ATE353538T1 AT00402847T AT00402847T ATE353538T1 AT E353538 T1 ATE353538 T1 AT E353538T1 AT 00402847 T AT00402847 T AT 00402847T AT 00402847 T AT00402847 T AT 00402847T AT E353538 T1 ATE353538 T1 AT E353538T1
- Authority
- AT
- Austria
- Prior art keywords
- determining
- position error
- hole
- alignment
- laser beam
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0008—Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09009—Substrate related
- H05K2201/09063—Holes or slots in insulating substrate not used for electrical connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Laser Beam Processing (AREA)
- Body Structure For Vehicles (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Automatic Control Of Machine Tools (AREA)
- Numerical Control (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9913725A FR2800565B1 (fr) | 1999-11-03 | 1999-11-03 | Dispositif de mesure d'erreur de position relative |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE353538T1 true ATE353538T1 (de) | 2007-02-15 |
Family
ID=9551646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT00402847T ATE353538T1 (de) | 1999-11-03 | 2000-10-16 | Einrichtung zur bestimmung eines positionsfehlers |
Country Status (11)
Country | Link |
---|---|
US (1) | US6683684B1 (de) |
EP (1) | EP1098556B1 (de) |
JP (1) | JP2001188007A (de) |
KR (1) | KR20010060196A (de) |
CN (1) | CN1220116C (de) |
AT (1) | ATE353538T1 (de) |
CA (1) | CA2324913A1 (de) |
DE (1) | DE60033258T2 (de) |
ES (1) | ES2281329T3 (de) |
FR (1) | FR2800565B1 (de) |
TW (1) | TW556456B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106767556A (zh) * | 2016-12-26 | 2017-05-31 | 重庆越发机械制造有限公司 | 高精度变档拨叉同心度检测设备 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7110099B2 (en) * | 2001-10-10 | 2006-09-19 | Accent Optical Technologies, Inc. | Determination of center of focus by cross-section analysis |
JP4338577B2 (ja) * | 2004-04-28 | 2009-10-07 | 株式会社ブイ・テクノロジー | 露光装置 |
JP4391545B2 (ja) * | 2007-03-30 | 2009-12-24 | 日立ビアメカニクス株式会社 | ワーク加工機 |
CN101450788B (zh) * | 2007-12-05 | 2011-04-13 | 中国科学院微电子研究所 | 石英晶圆深微孔加工设备及方法 |
CN102865815B (zh) * | 2012-09-24 | 2015-01-07 | 上海功源电子科技有限公司 | 一种新型的单视觉相机对位pcb的定位补偿方法 |
CN104378916B (zh) * | 2013-08-13 | 2018-04-03 | 达观科技有限公司 | 物件校正方法 |
CN104897070B (zh) * | 2014-03-07 | 2018-04-17 | 达观科技有限公司 | 加工物件基础规格的检测方法 |
JP6483536B2 (ja) * | 2015-06-05 | 2019-03-13 | 株式会社アドテックエンジニアリング | パターン描画装置及びパターン描画方法 |
CN105043269B (zh) * | 2015-07-08 | 2017-09-29 | 上海与德通讯技术有限公司 | 一种物体尺寸的测量方法及电子设备 |
JP6979513B2 (ja) * | 2017-09-11 | 2021-12-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び方法 |
CN109209546B (zh) * | 2018-09-30 | 2019-12-27 | 东风汽车集团有限公司 | 连续可变气门升程机构的间隙调节装置及调节方法 |
CN112179286B (zh) * | 2020-08-18 | 2021-12-21 | 江苏瑞尔隆盛叶轮科技有限公司 | 一种gom三维光学扫描仪专用夹具 |
CN111928873A (zh) * | 2020-09-28 | 2020-11-13 | 快克智能装备股份有限公司 | 一种标定测高中心与相机中心的方法 |
CN112857220B (zh) * | 2021-01-13 | 2022-08-09 | 德阳市产品质量监督检验所 | 一种发电设备零部件的检测结构 |
CN113207232A (zh) * | 2021-04-30 | 2021-08-03 | 东莞市五株电子科技有限公司 | 一种三维pcb的制作方法及pcb |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE241562C (de) | 1909-07-31 | 1911-12-05 | ||
DD241562A1 (de) * | 1985-10-10 | 1986-12-17 | Robotron Bueromasch | Messtechnische anordnung zur ueberwachung des schneidvorganges beim lasertrennen |
US5264869A (en) * | 1991-08-19 | 1993-11-23 | Xerox Corporation | Electro-optical control apparatus and system for spot position control in an optical output device |
FR2703558B1 (fr) * | 1993-03-31 | 1995-06-30 | Automa Tech Sa | Installation d'exposition à la lumière d'une plaque de circuit imprimé double face à travers les clichés. |
US5814826A (en) * | 1996-08-26 | 1998-09-29 | Demminer Maschinen Technik Gmbh | Method and apparatus for aligning photoprinting plates in a production line |
-
1999
- 1999-11-03 FR FR9913725A patent/FR2800565B1/fr not_active Expired - Fee Related
-
2000
- 2000-10-16 US US09/688,900 patent/US6683684B1/en not_active Expired - Fee Related
- 2000-10-16 EP EP00402847A patent/EP1098556B1/de not_active Expired - Lifetime
- 2000-10-16 DE DE60033258T patent/DE60033258T2/de not_active Expired - Fee Related
- 2000-10-16 ES ES00402847T patent/ES2281329T3/es not_active Expired - Lifetime
- 2000-10-16 AT AT00402847T patent/ATE353538T1/de not_active IP Right Cessation
- 2000-10-23 KR KR1020000062366A patent/KR20010060196A/ko not_active Application Discontinuation
- 2000-10-31 CA CA002324913A patent/CA2324913A1/en not_active Abandoned
- 2000-11-02 JP JP2000336242A patent/JP2001188007A/ja not_active Withdrawn
- 2000-11-02 TW TW089123119A patent/TW556456B/zh not_active IP Right Cessation
- 2000-11-03 CN CNB001338080A patent/CN1220116C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106767556A (zh) * | 2016-12-26 | 2017-05-31 | 重庆越发机械制造有限公司 | 高精度变档拨叉同心度检测设备 |
Also Published As
Publication number | Publication date |
---|---|
ES2281329T3 (es) | 2007-10-01 |
JP2001188007A (ja) | 2001-07-10 |
CN1220116C (zh) | 2005-09-21 |
CN1295268A (zh) | 2001-05-16 |
TW556456B (en) | 2003-10-01 |
DE60033258D1 (de) | 2007-03-22 |
KR20010060196A (ko) | 2001-07-06 |
DE60033258T2 (de) | 2007-11-22 |
EP1098556B1 (de) | 2007-02-07 |
EP1098556A1 (de) | 2001-05-09 |
CA2324913A1 (en) | 2001-05-03 |
FR2800565B1 (fr) | 2002-10-25 |
FR2800565A1 (fr) | 2001-05-04 |
US6683684B1 (en) | 2004-01-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification |
Ref document number: 1098556 Country of ref document: EP |
|
REN | Ceased due to non-payment of the annual fee |