ATE35058T1 - Tastkopfanordnung. - Google Patents
Tastkopfanordnung.Info
- Publication number
- ATE35058T1 ATE35058T1 AT84305937T AT84305937T ATE35058T1 AT E35058 T1 ATE35058 T1 AT E35058T1 AT 84305937 T AT84305937 T AT 84305937T AT 84305937 T AT84305937 T AT 84305937T AT E35058 T1 ATE35058 T1 AT E35058T1
- Authority
- AT
- Austria
- Prior art keywords
- centre
- array
- held
- tested
- probe
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08324956A GB2146849B (en) | 1983-09-17 | 1983-09-17 | Electrical test probe head assembly |
EP84305937A EP0135384B1 (de) | 1983-09-17 | 1984-08-30 | Tastkopfanordnung |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE35058T1 true ATE35058T1 (de) | 1988-06-15 |
Family
ID=10548954
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT84305937T ATE35058T1 (de) | 1983-09-17 | 1984-08-30 | Tastkopfanordnung. |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0135384B1 (de) |
AT (1) | ATE35058T1 (de) |
DE (1) | DE3472007D1 (de) |
GB (1) | GB2146849B (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4788496A (en) * | 1982-11-05 | 1988-11-29 | Martin Maelzer | Adapter for a printed circuit board testing device |
GB8518861D0 (en) * | 1985-07-25 | 1985-08-29 | Int Computers Ltd | Testing printed circuit board |
DE3678825D1 (de) * | 1985-11-01 | 1991-05-23 | Hewlett Packard Co | Halterung fuer leiterplattentest. |
DE3539720A1 (de) * | 1985-11-08 | 1987-05-14 | Martin Maelzer | Adapter fuer ein leiterplattenpruefgeraet |
US4783624A (en) * | 1986-04-14 | 1988-11-08 | Interconnect Devices, Inc. | Contact probe devices and method |
DE3638372A1 (de) * | 1986-11-11 | 1988-05-26 | Lang Dahlke Helmut | Vorrichtung zum pruefen von elektrischen leiterplatten |
DE3736689A1 (de) * | 1986-11-18 | 1988-05-26 | Luther Erich | Adapter fuer ein leiterplattenpruefgeraet |
DE3906691A1 (de) * | 1988-03-04 | 1989-09-14 | Manfred Prokopp | Kontaktiervorrichtung fuer pruefvorrichtungen zum pruefen von leiterplatten oder dgl. |
DE3925505A1 (de) * | 1989-04-05 | 1990-10-11 | Siemens Ag | Vorrichtung zum pruefen von leiterplatten |
DE4226069C2 (de) * | 1992-08-06 | 1994-08-04 | Test Plus Electronic Gmbh | Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen |
US6407565B1 (en) | 1996-10-29 | 2002-06-18 | Agilent Technologies, Inc. | Loaded-board, guided-probe test fixture |
US5945836A (en) | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
EP0943924A3 (de) * | 1998-03-19 | 1999-12-01 | Hewlett-Packard Company | Prüfadapter mit Nadelführung für bestückte Leiterplatten |
GB2384373A (en) * | 2002-01-19 | 2003-07-23 | Robert James Hancox | Torch or cycle lamp with display means |
US6784675B2 (en) | 2002-06-25 | 2004-08-31 | Agilent Technologies, Inc. | Wireless test fixture adapter for printed circuit assembly tester |
BE1028241B1 (nl) * | 2020-04-27 | 2021-11-29 | Ipte Factory Automation N V | Inrichting voor het testen van een printplaat |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3564408A (en) * | 1968-08-12 | 1971-02-16 | Bendix Corp | Test device for an electrical circuit card |
US3731191A (en) * | 1969-12-22 | 1973-05-01 | Ibm | Micro-miniature probe assembly |
US4027935A (en) * | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | Contact for an electrical contactor assembly |
US4132948A (en) * | 1977-03-17 | 1979-01-02 | Teradyne, Inc. | Test fixture using stock printed circuit board having test pins mounted thereon |
US4112364A (en) * | 1977-04-04 | 1978-09-05 | Teradyne, Inc. | Circuit board testing apparatus |
GB2038567B (en) * | 1978-12-28 | 1982-12-01 | Philips Electronic Associated | Device for making temporary electrical connections to an electrical assembly |
DE2933862A1 (de) * | 1979-08-21 | 1981-03-12 | Paul Mang | Vorrichtung zur elektronischen pruefung von leiterplatten. |
GB2061630A (en) * | 1979-10-17 | 1981-05-13 | Standard Telephones Cables Ltd | Apparatus for testing printed circuit boards |
DE3038665C2 (de) * | 1980-10-13 | 1990-03-29 | Riba-Prüftechnik GmbH, 7801 Schallstadt | Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten |
DE3142817A1 (de) * | 1980-10-30 | 1982-07-08 | Everett/Charles, Inc., 91730 Rancho Cucamonga, Calif. | Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung |
DE3273554D1 (en) * | 1981-06-30 | 1986-11-06 | Ibm | Contact probe assembly for integrated circuits |
GB2108775B (en) * | 1981-10-21 | 1985-01-03 | Marconi Instruments Ltd | Electrical interface arrangements |
GB2108774B (en) * | 1981-10-21 | 1985-01-09 | Marconi Instruments Ltd | Electrical interface arrangements |
DE3240916C2 (de) * | 1982-11-05 | 1985-10-31 | Luther, Erich, Ing.(Grad.), 3003 Ronnenberg | Vorrichtung zum Prüfen von elektrischen Leiterplatten |
-
1983
- 1983-09-17 GB GB08324956A patent/GB2146849B/en not_active Expired
-
1984
- 1984-08-30 EP EP84305937A patent/EP0135384B1/de not_active Expired
- 1984-08-30 AT AT84305937T patent/ATE35058T1/de not_active IP Right Cessation
- 1984-08-30 DE DE8484305937T patent/DE3472007D1/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
EP0135384B1 (de) | 1988-06-08 |
GB8324956D0 (en) | 1983-10-19 |
DE3472007D1 (en) | 1988-07-14 |
GB2146849B (en) | 1987-08-05 |
EP0135384A1 (de) | 1985-03-27 |
GB2146849A (en) | 1985-04-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |