GB8408917D0 - Printed circuit board testers - Google Patents

Printed circuit board testers

Info

Publication number
GB8408917D0
GB8408917D0 GB848408917A GB8408917A GB8408917D0 GB 8408917 D0 GB8408917 D0 GB 8408917D0 GB 848408917 A GB848408917 A GB 848408917A GB 8408917 A GB8408917 A GB 8408917A GB 8408917 D0 GB8408917 D0 GB 8408917D0
Authority
GB
United Kingdom
Prior art keywords
circuit board
printed circuit
board testers
testers
printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB848408917A
Other versions
GB2139019A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co PLC
Original Assignee
General Electric Co PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB838311888A external-priority patent/GB8311888D0/en
Application filed by General Electric Co PLC filed Critical General Electric Co PLC
Priority to GB08408917A priority Critical patent/GB2139019A/en
Publication of GB8408917D0 publication Critical patent/GB8408917D0/en
Publication of GB2139019A publication Critical patent/GB2139019A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
GB08408917A 1983-04-29 1984-04-06 Printed circuit board testers Withdrawn GB2139019A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08408917A GB2139019A (en) 1983-04-29 1984-04-06 Printed circuit board testers

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB838311888A GB8311888D0 (en) 1983-04-29 1983-04-29 Printed circuit board testers
GB08408917A GB2139019A (en) 1983-04-29 1984-04-06 Printed circuit board testers

Publications (2)

Publication Number Publication Date
GB8408917D0 true GB8408917D0 (en) 1984-05-16
GB2139019A GB2139019A (en) 1984-10-31

Family

ID=26285997

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08408917A Withdrawn GB2139019A (en) 1983-04-29 1984-04-06 Printed circuit board testers

Country Status (1)

Country Link
GB (1) GB2139019A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0215146B1 (en) * 1985-09-16 1988-08-03 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Device for electronic testing of printed boards or similar devices
US4771234A (en) * 1986-11-20 1988-09-13 Hewlett-Packard Company Vacuum actuated test fixture
FR2639154B1 (en) * 1988-11-15 1990-12-21 Thomson Csf CONNECTOR FOR TRANSFORMING A SPECIFIC HOUSING OF INTEGRATED CIRCUIT WITH CONNECTION PLOTS INTO A STANDARD HOUSING WITH CONNECTING PIN
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
AT405991B (en) * 1994-04-19 2000-01-25 Egston Eggenburger Syst Elektr INTERMEDIATE PLUG WITH ADDITIONAL FUNCTION
CN111735993A (en) * 2020-08-21 2020-10-02 深圳市森美协尔科技有限公司 Triaxial probe clamp for wafer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564408A (en) * 1968-08-12 1971-02-16 Bendix Corp Test device for an electrical circuit card
FR2088118A1 (en) * 1970-05-20 1972-01-07 Comp Generale Electricite
DE3038665C2 (en) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Testing device for testing printed circuit boards provided with conductor tracks
DE3113375A1 (en) * 1981-04-02 1982-10-21 Siemens AG, 1000 Berlin und 8000 München ADAPTER DEVICE AND METHOD FOR ELECTRICALLY WIRING TESTING Bare PCBs

Also Published As

Publication number Publication date
GB2139019A (en) 1984-10-31

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)