ATE334384T1 - Verfahren zur bestimmung des kalzinierungsgrades und der kalzinierungshomogenität von aluminiumoxiden - Google Patents
Verfahren zur bestimmung des kalzinierungsgrades und der kalzinierungshomogenität von aluminiumoxidenInfo
- Publication number
- ATE334384T1 ATE334384T1 AT00988861T AT00988861T ATE334384T1 AT E334384 T1 ATE334384 T1 AT E334384T1 AT 00988861 T AT00988861 T AT 00988861T AT 00988861 T AT00988861 T AT 00988861T AT E334384 T1 ATE334384 T1 AT E334384T1
- Authority
- AT
- Austria
- Prior art keywords
- calcination
- degree
- refractive index
- image
- alumina
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Compounds Of Alkaline-Earth Elements, Aluminum Or Rare-Earth Metals (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
- Compositions Of Oxide Ceramics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9914951A FR2801673B1 (fr) | 1999-11-26 | 1999-11-26 | Procede de mesure du degre et de l'homogeneite de calcination des alumines |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE334384T1 true ATE334384T1 (de) | 2006-08-15 |
Family
ID=9552612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT00988861T ATE334384T1 (de) | 1999-11-26 | 2000-11-21 | Verfahren zur bestimmung des kalzinierungsgrades und der kalzinierungshomogenität von aluminiumoxiden |
Country Status (11)
Country | Link |
---|---|
US (1) | US6983060B1 (de) |
EP (1) | EP1232385B1 (de) |
JP (1) | JP2003515161A (de) |
AT (1) | ATE334384T1 (de) |
AU (1) | AU775687B2 (de) |
DE (1) | DE60029615D1 (de) |
FR (1) | FR2801673B1 (de) |
HU (1) | HU226972B1 (de) |
RU (1) | RU2242744C2 (de) |
UA (1) | UA66951C2 (de) |
WO (1) | WO2001038855A1 (de) |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7646906B2 (en) * | 2004-01-29 | 2010-01-12 | Kla-Tencor Technologies Corp. | Computer-implemented methods for detecting defects in reticle design data |
JP4904034B2 (ja) * | 2004-09-14 | 2012-03-28 | ケーエルエー−テンカー コーポレイション | レチクル・レイアウト・データを評価するための方法、システム及び搬送媒体 |
US7729529B2 (en) * | 2004-12-07 | 2010-06-01 | Kla-Tencor Technologies Corp. | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle |
DE102005032601A1 (de) * | 2005-01-07 | 2006-07-20 | Heidelberger Druckmaschinen Ag | Druckmaschine |
GB2463824B (en) | 2005-05-17 | 2010-06-09 | Thomas Industries Inc | Pump improvements |
US7769225B2 (en) * | 2005-08-02 | 2010-08-03 | Kla-Tencor Technologies Corp. | Methods and systems for detecting defects in a reticle design pattern |
US7570796B2 (en) | 2005-11-18 | 2009-08-04 | Kla-Tencor Technologies Corp. | Methods and systems for utilizing design data in combination with inspection data |
US8041103B2 (en) * | 2005-11-18 | 2011-10-18 | Kla-Tencor Technologies Corp. | Methods and systems for determining a position of inspection data in design data space |
US7676077B2 (en) * | 2005-11-18 | 2010-03-09 | Kla-Tencor Technologies Corp. | Methods and systems for utilizing design data in combination with inspection data |
CN101512149B (zh) | 2006-09-05 | 2012-04-25 | 嘉德纳丹佛托马斯公司 | 用于压缩机或泵的流体摄入和排出配件 |
US7877722B2 (en) | 2006-12-19 | 2011-01-25 | Kla-Tencor Corp. | Systems and methods for creating inspection recipes |
US8194968B2 (en) * | 2007-01-05 | 2012-06-05 | Kla-Tencor Corp. | Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions |
US7738093B2 (en) | 2007-05-07 | 2010-06-15 | Kla-Tencor Corp. | Methods for detecting and classifying defects on a reticle |
US7962863B2 (en) * | 2007-05-07 | 2011-06-14 | Kla-Tencor Corp. | Computer-implemented methods, systems, and computer-readable media for determining a model for predicting printability of reticle features on a wafer |
US8213704B2 (en) * | 2007-05-09 | 2012-07-03 | Kla-Tencor Corp. | Methods and systems for detecting defects in a reticle design pattern |
US7796804B2 (en) | 2007-07-20 | 2010-09-14 | Kla-Tencor Corp. | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer |
US7711514B2 (en) * | 2007-08-10 | 2010-05-04 | Kla-Tencor Technologies Corp. | Computer-implemented methods, carrier media, and systems for generating a metrology sampling plan |
TWI469235B (zh) * | 2007-08-20 | 2015-01-11 | Kla Tencor Corp | 決定實際缺陷是潛在系統性缺陷或潛在隨機缺陷之由電腦實施之方法 |
US8139844B2 (en) * | 2008-04-14 | 2012-03-20 | Kla-Tencor Corp. | Methods and systems for determining a defect criticality index for defects on wafers |
WO2010014609A2 (en) | 2008-07-28 | 2010-02-04 | Kla-Tencor Corporation | Computer-implemented methods, computer-readable media, and systems for classifying defects detected in a memory device area on a wafer |
US8775101B2 (en) | 2009-02-13 | 2014-07-08 | Kla-Tencor Corp. | Detecting defects on a wafer |
US8204297B1 (en) | 2009-02-27 | 2012-06-19 | Kla-Tencor Corp. | Methods and systems for classifying defects detected on a reticle |
US8112241B2 (en) * | 2009-03-13 | 2012-02-07 | Kla-Tencor Corp. | Methods and systems for generating an inspection process for a wafer |
US8781781B2 (en) | 2010-07-30 | 2014-07-15 | Kla-Tencor Corp. | Dynamic care areas |
US9170211B2 (en) | 2011-03-25 | 2015-10-27 | Kla-Tencor Corp. | Design-based inspection using repeating structures |
US9087367B2 (en) | 2011-09-13 | 2015-07-21 | Kla-Tencor Corp. | Determining design coordinates for wafer defects |
US8831334B2 (en) | 2012-01-20 | 2014-09-09 | Kla-Tencor Corp. | Segmentation for wafer inspection |
US8826200B2 (en) | 2012-05-25 | 2014-09-02 | Kla-Tencor Corp. | Alteration for wafer inspection |
US9189844B2 (en) | 2012-10-15 | 2015-11-17 | Kla-Tencor Corp. | Detecting defects on a wafer using defect-specific information |
US9053527B2 (en) | 2013-01-02 | 2015-06-09 | Kla-Tencor Corp. | Detecting defects on a wafer |
US9134254B2 (en) | 2013-01-07 | 2015-09-15 | Kla-Tencor Corp. | Determining a position of inspection system output in design data space |
US9311698B2 (en) | 2013-01-09 | 2016-04-12 | Kla-Tencor Corp. | Detecting defects on a wafer using template image matching |
WO2014149197A1 (en) | 2013-02-01 | 2014-09-25 | Kla-Tencor Corporation | Detecting defects on a wafer using defect-specific and multi-channel information |
US9865512B2 (en) | 2013-04-08 | 2018-01-09 | Kla-Tencor Corp. | Dynamic design attributes for wafer inspection |
US9310320B2 (en) | 2013-04-15 | 2016-04-12 | Kla-Tencor Corp. | Based sampling and binning for yield critical defects |
RU2564455C1 (ru) * | 2014-07-15 | 2015-10-10 | федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Пермский национальный исследовательский политехнический университет" | Способ определения степени гомогенизации многокомпонентных гетерогенных смесей |
JP7341835B2 (ja) * | 2019-10-09 | 2023-09-11 | 株式会社日立製作所 | 粉体混合システム及び粉体混合方法 |
CN118243654A (zh) * | 2024-05-27 | 2024-06-25 | 黑龙江飞鹤乳业有限公司 | 一种粉末混合均匀度检测方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3936188A (en) * | 1972-11-06 | 1976-02-03 | Sawyer Research Products, Inc. | Color sorting of irradiated materials and a calibrated color comparison array |
US3844780A (en) * | 1972-11-28 | 1974-10-29 | Xerox Corp | Imaging process |
US3941874A (en) * | 1973-02-26 | 1976-03-02 | Anaconda Aluminum Co. | Recovery of aluminum fluoride |
FI81812C (fi) * | 1988-06-30 | 1990-12-10 | Neste Oy | Foerfarande och anordning foer kontroll av aktiveringsreaktioner foer ziegler-natta katalysatorbaerare samt anvaendning av dessa. |
US5303310A (en) * | 1991-08-30 | 1994-04-12 | Imc Fertilizer, Inc. | Method and apparatus for image analysis of composite ores |
-
1999
- 1999-11-26 FR FR9914951A patent/FR2801673B1/fr not_active Expired - Fee Related
-
2000
- 2000-11-21 UA UA2002065256A patent/UA66951C2/uk unknown
- 2000-11-21 AU AU25217/01A patent/AU775687B2/en not_active Ceased
- 2000-11-21 DE DE60029615T patent/DE60029615D1/de not_active Expired - Lifetime
- 2000-11-21 WO PCT/FR2000/003227 patent/WO2001038855A1/fr active IP Right Grant
- 2000-11-21 AT AT00988861T patent/ATE334384T1/de not_active IP Right Cessation
- 2000-11-21 US US10/130,260 patent/US6983060B1/en not_active Expired - Fee Related
- 2000-11-21 RU RU2002117024/28A patent/RU2242744C2/ru not_active IP Right Cessation
- 2000-11-21 JP JP2001540353A patent/JP2003515161A/ja not_active Abandoned
- 2000-11-21 HU HU0203555A patent/HU226972B1/hu not_active IP Right Cessation
- 2000-11-21 EP EP00988861A patent/EP1232385B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FR2801673B1 (fr) | 2001-12-28 |
RU2242744C2 (ru) | 2004-12-20 |
EP1232385A1 (de) | 2002-08-21 |
HUP0203555A3 (en) | 2004-07-28 |
AU775687B2 (en) | 2004-08-12 |
JP2003515161A (ja) | 2003-04-22 |
US6983060B1 (en) | 2006-01-03 |
RU2002117024A (ru) | 2004-02-20 |
HUP0203555A2 (hu) | 2003-02-28 |
FR2801673A1 (fr) | 2001-06-01 |
UA66951C2 (uk) | 2004-06-15 |
HU226972B1 (en) | 2010-03-29 |
AU2521701A (en) | 2001-06-04 |
EP1232385B1 (de) | 2006-07-26 |
WO2001038855A1 (fr) | 2001-05-31 |
DE60029615D1 (de) | 2006-09-07 |
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Legal Events
Date | Code | Title | Description |
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |