WO2024109503A1 - Electromagnetic interference measurement method and system - Google Patents
Electromagnetic interference measurement method and system Download PDFInfo
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- WO2024109503A1 WO2024109503A1 PCT/CN2023/128894 CN2023128894W WO2024109503A1 WO 2024109503 A1 WO2024109503 A1 WO 2024109503A1 CN 2023128894 W CN2023128894 W CN 2023128894W WO 2024109503 A1 WO2024109503 A1 WO 2024109503A1
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- 238000005259 measurement Methods 0.000 claims abstract description 10
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Definitions
- the present invention relates to an interference testing method and system, and in particular to an electromagnetic interference testing method and system for a circuit.
- the circuits contained in electronic products generate electromagnetic interference (EMI) when they are working, which interferes with the operation of other devices and must be suppressed.
- EMI electromagnetic interference
- the near-field interference generated by the circuit will propagate conducted interference through the connection with the power supply network, and the far-field interference generated by the circuit will propagate radiated interference through space.
- Existing circuit interference measurement technologies such as EM scanners, sense changes in the electromagnetic field strength on the board by bringing a near-field probe close to the circuit board contained in the circuit and moving it on the surface, which is very time-consuming; and the interference strength sensed by the probe is related to the distance between the probe and the circuit board, so the measurement accuracy is not high; and the calculation of converting the near-field signal obtained by scanning into a far-field signal is very complicated.
- the circuit that generates interference is also affected by other man-made and natural environmental interference.
- the cables of the circuit and the wiring and components on the circuit board act like antennas, receiving interference from the environment, which may cause the circuit to not work properly.
- the induced potential generated by this environmental interference on the interfered circuit is difficult to be sensed by the magnetic field probe and electric field probe of the traditional EM scanner because it is not generated by the interfered circuit.
- the present invention application discloses a circuit electromagnetic interference testing method and system, which can not only locate the near-field and far-field interference generated by the circuit (not limited to the circuit board), but also identify the impact of environmental interference on the circuit, helping circuit designers to efficiently optimize product EMC design and reduce the cost of product EMC design.
- a circuit near-field interference and far-field interference test method including:
- test point 1 and test point 2 Select any two points on the circuit under test as test point 1 and test point 2;
- channel 1 of the test unit to measure a voltage signal S1 of the test point 1 relative to the reference point
- channel 2 of the test unit to measure a voltage signal S2 of the test point 2 relative to the reference point
- Identifying interference components included in test point 1 and test point 2 includes: comparing S1 and S2, where components with the same polarity are far-field interference, and comparing S1 and S2, where components with opposite polarities are near-field interference.
- the method as described above is characterized in that the influence of environmental interference on the circuit can be tested by disconnecting the power supply of the circuit under test and disconnecting the physical connection with the outside. If the working power supply is connected, the test obtains mainly the interference generated by the circuit under test, superimposed with the induced potential generated by the environmental interference on the circuit under test; if the power supply is not connected and the circuit is disconnected from the outside, the test obtains the induced potential generated by the environmental magnetic field and the radiation interference on the circuit under test.
- test point 1 and the test point 2 are not limited to being or constituting power ports.
- the method as described above is characterized in that the reference point does not require grounding.
- the method as described above is characterized in that the voltage signal S1 of test point 1 relative to the reference point is measured by channel 1, and the voltage signal S2 of test point 2 relative to the reference point is measured by channel 2, including: the channel probe contacts the test point and the channel probe does not contact the test point.
- the method as described above is characterized in that the identification includes: obtaining components with the same polarity by adding S1 and S2, and obtaining components with opposite polarity by subtracting S1 and S2.
- the method as described above is characterized in that other test points on the circuit are continuously selected and measured by the method described above, and the far-field interference between different test points is compared to find out the test point with a larger far-field interference value, that is, the location of the stronger radiation interference on the circuit; the near-field interference between different test points is compared to find out the test point with a larger near-field interference value, that is, the location of the stronger conducted interference on the circuit.
- An interference measurement system comprises an interface unit, a measurement unit and an identification unit; the interface unit is configured to include a probe 1 and a probe 2, and the test unit is configured to include a test channel 1, a test channel 2, a reference point and a signal ground of the test channels 1 and 2; the probe 1 and the probe 2 are contact type or non-contact type, the probe 1 is connected to the test channel 1, the probe 2 is connected to the test channel 2, and the reference point is connected to the signal ground; when the test system tests a circuit under test, the probes 1 and 2 are used simultaneously, and the reference point is not connected to the circuit under test; the probes 1 and 2 contact the test points 1 and 2 of the circuit under test, and the test unit is configured to control the test channels 1 and 2 to synchronously measure the voltage signals S1 and S2 of the test points 1 and 2 to the reference point, and send the test results to the identification unit; the identification unit is configured to identify components with the same polarity in S1 and S2 as far-field interference, and identify components with opposite polarities in S
- the device as described above is characterized in that the probe 1 is connected to the test channel 1, and the probe 2 is connected to the test channel 2, including direct connection and indirect connection through a step-down or isolated DC circuit.
- the device as described above is characterized in that the identification unit is configured to include: a hardware module or software module that obtains time domain components with the same polarity by adding S1 and S2, obtains time domain components with opposite polarity by subtracting S1 and S2, and then converts the time domain components into frequency domain components.
- the identification unit is configured to include: a hardware module or software module that obtains time domain components with the same polarity by adding S1 and S2, obtains time domain components with opposite polarity by subtracting S1 and S2, and then converts the time domain components into frequency domain components.
- the device as described above is characterized in that the position movement of the probe relative to the circuit is controlled by a mechanical device.
- testing and locating the near-field and far-field interference sources of the circuit is conducive to reducing the conducted and radiated interference of the product from the source;
- Fig. 1 is a flow chart of the method of the present invention
- Fig. 2 is a schematic diagram of the system of the present invention.
- Figure 1 is a flow chart of the method of the present invention.
- the method of the present invention specifically comprises:
- test channels 1 and 2 are connected to form a reference point, and the reference point is not connected to the circuit being tested;
- FIG2 is a schematic diagram of the system of the present invention.
- the interface unit 1 of the test system is configured to connect to any test point on the external EUT (not shown in the figure) not limited to the circuit board during testing, and to connect to the test unit 2 internally.
- the test unit 2 is configured to connect to the identification unit 3 so as to send the test data to the identification unit 3 for identification;
- the identification unit 3 is configured to include a hardware module or software module for identifying and calculating the near-field and far-field components of the signal.
- the system of the present invention sets a reference point, which is connected to the signal ground of the test channel.
- the reference point is not connected to the EUT circuit.
- the system of the present invention tests the signal voltage of a test point on the EUT to the reference point of the test system, rather than testing the signal voltage of a test point on the EUT to another point on the EUT.
- Another difference from the traditional tester is that when the system of the present invention is used to test the near-field and far-field interference of the EUT circuit, channels 1 and 2 are tested synchronously to obtain the voltage signal of the EUT circuit, especially any two points on the circuit board included in the EUT to the reference point of the test system, and then the near-field and far-field interference are calculated.
- the system in Figure 2 does not require grounding when implementing the test function, which brings great convenience to users in specific applications; however, considering the user's electricity safety, in practice the reference point is usually connected to the protective ground (PE) of the power grid to prevent the risk of electric shock caused by leakage of the test system, which does not affect the operation of the system; because the electromagnetic interference test frequency is much higher than 50Hz, in high-frequency conditions, even if the circuit being tested is connected to PE, the high impedance on the PE line prevents the reference point from being connected to the circuit being tested.
- PE protective ground
- FIG. 1-FIG . 2 The following describes more embodiments in conjunction with FIG. 1-FIG . 2 to further illustrate the working principle of the method and system of the present invention.
- a DC/DC conversion circuit is used as an EUT, and is connected to the test system shown in FIG2 to test and locate the interference generated on the board when the EUT is working.
- the specific connection method is that the probe 101 of the test system interface unit 1 contacts the solder joint or wiring conductor of any component on the EUT, that is, the test point 1, and the probe 102 contacts the solder joint or wiring conductor of another arbitrary component on the EUT, that is, the test point 2.
- the power ground is selected as the test point 2; it is not required that the test point 1 and the test point 2 must be or must constitute a power port; the test unit 2 simultaneously tests the voltage signal S1 of the test point 1 to the reference point 103 of the test unit 2 and the voltage signal S2 of the test point 2 to the reference point 103 of the test unit 2, and obtains a set of data including S1 and S2.
- the obtained data is sent to the identification unit 3 by the test unit 2.
- the identification unit 3 identifies the interference components contained in the data, and the identification method is to compare S1 and S2, where the components with the same polarity are far-field interference, and compare S1 and S2, where the components with opposite polarities are near-field interference.
- the identification unit 3 further converts the near-field and far-field interference components from the time domain to the frequency domain through Fourier transform.
- Example 2 It is basically the same as Example 1. The difference is that after the identification unit 3 calculates the interference amplitude of a certain frequency point in the spectrum of the near-field and far-field interference components of all test points, the test point is marked on the circuit board image, and the interference amplitude of the frequency point of each test point is represented by color, the redder the color, the stronger the interference intensity, so that the distribution of the near-field interference and far-field interference of the frequency point on the board can be easily observed on the image.
- Example 2 It is basically the same as Example 1. The difference is that a set of data is tested on the input power line connected to the EUT in the same way and compared with the test data on the board, and the overall distribution results of the near-field interference and far-field interference of the EUT including the cables outside the circuit board are obtained.
- test unit 2 obtains the data, it automatically or manually uploads the data to the cloud, and the recognition unit 3 composed of the cloud computing module performs recognition and calculation.
- the test system of this embodiment separates data collection and data analysis, which not only reduces the cost of the test system and the test fee, but also facilitates the sharing of test data and further data mining.
- the embodiment is basically the same as the embodiment 1. The difference is that the probes 101 and 102 contact the test points on the board after passing through the step-down or isolated DC circuit.
- probes 101 and 102 do not contact the test points on the board, including using a magnetic field probe or an electric field probe or a composite sensing probe that can sense both the magnetic field and the electric field to sense the intensity of the magnetic field, electric field or electromagnetic field on the board.
- Example 2 It is basically the same as Example 1. The difference is that one of the probes 101 and 102 does not contact the test point on the board, including using a magnetic field probe or an electric field probe or a composite sensing probe that can sense both the magnetic field and the electric field to sense the strength of the electromagnetic field on the board, and one probe contacts the test point on the board to directly measure the voltage of the test point to the reference point.
- one of the probes 101 and 102 does not contact the test point on the board, including using a magnetic field probe or an electric field probe or a composite sensing probe that can sense both the magnetic field and the electric field to sense the strength of the electromagnetic field on the board, and one probe contacts the test point on the board to directly measure the voltage of the test point to the reference point.
- Example 2 It is basically the same as Example 1. The difference is that the probe is clamped by a mechanical device, and the mechanical device moves the probe in the three-dimensional directions of X, Y, and Z under manual or program control.
- Example 2 It is basically the same as Example 1.
- the test unit 3 composed of the cloud computing module identifies the near-field and far-field interference components of different test points, and marks the test points on the circuit board image in the cloud, and represents the interference amplitude of each test point with color. The redder the color, the stronger the interference intensity, so that the distribution of near-field interference and far-field interference on the EUT board can be observed remotely.
- an STM32 single-board computer is used as the EUT. Cut off the working power supply, make the EUT in a floating state without any physical connection to the outside and place it in a non-shielded environment to test the impact of environmental radiation interference on different parts of the circuit board.
- the specific connection method is to connect the EUT to the test system shown in Figure 2, the probe 101 of the test system interface unit 1 contacts the solder joints of different components on the EUT, namely test point 1, and the probe 102 contacts the power ground of the EUT, namely test point 2; it is not required that test point 1 and test point 2 must constitute a power port; the same method as embodiment 1 is used for testing, and the results show that channel 1 on the circuit board measures an induced potential with an amplitude of approximately plus or minus 12 millivolts; channel 2 measures an induced potential with an amplitude of approximately plus 3.5 millivolts and minus 7.5 millivolts.
- the spectrum finally obtained by the test system shows that interference peaks appear at different test points at frequencies of 300KHz, 3MHz and 12MHz, but the amplitudes are different, with the maximum difference being as high as 30dB.
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Abstract
An electromagnetic interference measurement method for a circuit. The method comprises: simultaneously measuring the voltage between any two points on a circuit and a reference point on a test instrument, so as to identify near-field interference components and far-field interference components; and repeating same to perform measurement on other test points on the circuit, and comparing measurement results of different points, so as to determine a test point having a higher near-field or far-field interference value, i.e. the location of relatively strong interference on the circuit. A measurement apparatus based on the method can not only locate near-field interference and far-field interference which are generated by a circuit, but also identify the impact of environmental interference on the circuit, so as to assist circuit designers in efficiently optimizing the EMC design of products, thereby reducing the cost of the EMC design of products.
Description
本发明涉及一种干扰测试方法和***，特别是涉及一种电路的电磁干扰测试方法和***。The present invention relates to an interference testing method and system, and in particular to an electromagnetic interference testing method and system for a circuit.
电子产品包含的电路工作时会产生电磁干扰（EMI），干扰其他设备的工作，必需予以抑制。通常电路产生的近场干扰会通过与供电网络的连接传播传导干扰，电路产生的远场干扰会通过空间传播辐射干扰。现有的电路干扰测量技术，例如EM扫描仪，通过将近场探头接近电路包含的电路板并且在表面移动来感知板上的电磁场强度变化，十分耗时；且探头感应的干扰强度与探头和电路板的距离相关，测量精度不高；并且，将扫描获得的近场信号换算成远场信号计算十分复杂。The circuits contained in electronic products generate electromagnetic interference (EMI) when they are working, which interferes with the operation of other devices and must be suppressed. Usually, the near-field interference generated by the circuit will propagate conducted interference through the connection with the power supply network, and the far-field interference generated by the circuit will propagate radiated interference through space. Existing circuit interference measurement technologies, such as EM scanners, sense changes in the electromagnetic field strength on the board by bringing a near-field probe close to the circuit board contained in the circuit and moving it on the surface, which is very time-consuming; and the interference strength sensed by the probe is related to the distance between the probe and the circuit board, so the measurement accuracy is not high; and the calculation of converting the near-field signal obtained by scanning into a far-field signal is very complicated.
另一方面，产生干扰的电路本身也受到其它人为的和自然产生的环境干扰侵害。在干扰环境下，电路的电缆以及电路板上的布线和元器件就像天线，接收来自环境的干扰，可能导致电路无法正常工作。这种环境干扰在被干扰电路上产生的感应电势，由于不是由被干扰电路产生，很难被传统的EM扫描仪的磁场探头和电场探头感知。On the other hand, the circuit that generates interference is also affected by other man-made and natural environmental interference. In an interference environment, the cables of the circuit and the wiring and components on the circuit board act like antennas, receiving interference from the environment, which may cause the circuit to not work properly. The induced potential generated by this environmental interference on the interfered circuit is difficult to be sensed by the magnetic field probe and electric field probe of the traditional EM scanner because it is not generated by the interfered circuit.
本发明申请披露一种电路的电磁干扰测试方法和***，不仅能够定位电路（不局限于电路板）产生的近场和远场干扰，而且能够识别环境干扰对电路的影响，帮助电路设计者高效率地优化产品EMC设计，降低产品EMC设计的成本。The present invention application discloses a circuit electromagnetic interference testing method and system, which can not only locate the near-field and far-field interference generated by the circuit (not limited to the circuit board), but also identify the impact of environmental interference on the circuit, helping circuit designers to efficiently optimize product EMC design and reduce the cost of product EMC design.
提出一种电路的近场干扰和远场干扰测试方法，包括：A circuit near-field interference and far-field interference test method is proposed, including:
在被测试电路上任选两点作为测试点1和测试点2；Select any two points on the circuit under test as test point 1 and test point 2;
定义一个参考点，参考点不连接被测试电路；Define a reference point that is not connected to the circuit being tested;
用测试单元的通道1测量测试点1对参考点的电压信号S1，用测试单元的通道2测量测试点2对参考点的电压信号S2，所说的测量同时进行；Using channel 1 of the test unit to measure a voltage signal S1 of the test point 1 relative to the reference point, and using channel 2 of the test unit to measure a voltage signal S2 of the test point 2 relative to the reference point, the measurements being performed simultaneously;
识别测试点1和测试点2包含的干扰分量，包括：比较S1和S2，其中极性相同的分量为远场干扰，比较S1和S2，其中极性相反的分量为近场干扰。Identifying interference components included in test point 1 and test point 2 includes: comparing S1 and S2, where components with the same polarity are far-field interference, and comparing S1 and S2, where components with opposite polarities are near-field interference.
以上逐一描述了方法所包括的多个要素，不意味着这些要素必需按照描述的顺序执行。The above describes the multiple elements included in the method one by one, which does not mean that these elements must be executed in the described order.
如上所述的方法，其特征在于，能够通过将所说的被测试电路不接通电源并且断开与外部的物理连接的方法，来测试环境干扰对电路的影响。如果接通工作电源，测试获得的主要是被测试电路产生的干扰，叠加了环境干扰在被测试电路上产生的感应电势；如果不接通电源并且与外部断开，测试获得的是环境磁场和辐射干扰在被测试电路上产生的感应电势。The method as described above is characterized in that the influence of environmental interference on the circuit can be tested by disconnecting the power supply of the circuit under test and disconnecting the physical connection with the outside. If the working power supply is connected, the test obtains mainly the interference generated by the circuit under test, superimposed with the induced potential generated by the environmental interference on the circuit under test; if the power supply is not connected and the circuit is disconnected from the outside, the test obtains the induced potential generated by the environmental magnetic field and the radiation interference on the circuit under test.
如上所述的方法，其特征在于，所说的测试点1和测试点2不限定为必须是或者必须构成电源端口。The method as described above is characterized in that the test point 1 and the test point 2 are not limited to being or constituting power ports.
如上所述的方法，其特征在于，所说的参考点不要求接地。The method as described above is characterized in that the reference point does not require grounding.
如上所述的方法，其特征在于，所说的用通道1测量测试点1对参考点的电压信号S1，用通道2测量测试点2对参考点的电压信号S2，包括：通道探头接触测试点和通道探头不接触测试点。 The method as described above is characterized in that the voltage signal S1 of test point 1 relative to the reference point is measured by channel 1, and the voltage signal S2 of test point 2 relative to the reference point is measured by channel 2, including: the channel probe contacts the test point and the channel probe does not contact the test point.
如上所述的方法，其特征在于，所说的识别，包括：通过将S1和S2相加获得极性相同的分量，通过将S1和S2相减获得极性相反的分量。The method as described above is characterized in that the identification includes: obtaining components with the same polarity by adding S1 and S2, and obtaining components with opposite polarity by subtracting S1 and S2.
如上所述的方法，其特征在于，继续以所说的方法选择并且测量电路上其它测试点，比较不同的测试点之间的远场干扰，找出远场干扰量值较大的测试点，也就是电路上较强辐射干扰的所在位置；比较不同测试点之间的近场干扰，找出近场干扰量值较大的测试点，也就是电路上较强传导干扰的所在位置。The method as described above is characterized in that other test points on the circuit are continuously selected and measured by the method described above, and the far-field interference between different test points is compared to find out the test point with a larger far-field interference value, that is, the location of the stronger radiation interference on the circuit; the near-field interference between different test points is compared to find out the test point with a larger near-field interference value, that is, the location of the stronger conducted interference on the circuit.
为实现本发明申请披露的上述方法，提出一种电路的近场干扰和远场干扰测试***：In order to implement the above method disclosed in the present invention application, a circuit near-field interference and far-field interference test system is proposed:
一种干扰测量***，包含有接口单元，测量单元和识别单元；所说的接口单元配置为包括探头1和探头2，所说的测试单元配置为包括测试通道1，测试通道2，参考点和测试通道1和2的信号地；探头1和探头2为接触式或非接触式，探头1连接测试通道1，探头2连接测试通道2，参考点连接信号地；测试***测试被测试电路时，同时使用探头1，2，参考点不连接被测试电路；探头1，2接触被测试电路测试点1，2，测试单元配置为控制测试通道1和2同步测量测试点1和2对参考点的电压信号S1和S2，并且将测试结果送识别单元；识别单元配置为识别出S1和S2中极性相同的分量，为远场干扰，识别出S1和S2中极性相反的分量，为近场干扰。An interference measurement system comprises an interface unit, a measurement unit and an identification unit; the interface unit is configured to include a probe 1 and a probe 2, and the test unit is configured to include a test channel 1, a test channel 2, a reference point and a signal ground of the test channels 1 and 2; the probe 1 and the probe 2 are contact type or non-contact type, the probe 1 is connected to the test channel 1, the probe 2 is connected to the test channel 2, and the reference point is connected to the signal ground; when the test system tests a circuit under test, the probes 1 and 2 are used simultaneously, and the reference point is not connected to the circuit under test; the probes 1 and 2 contact the test points 1 and 2 of the circuit under test, and the test unit is configured to control the test channels 1 and 2 to synchronously measure the voltage signals S1 and S2 of the test points 1 and 2 to the reference point, and send the test results to the identification unit; the identification unit is configured to identify components with the same polarity in S1 and S2 as far-field interference, and identify components with opposite polarities in S1 and S2 as near-field interference.
如上所述的装置，其特征在于，所说的探头1连接测试通道1，探头2连接测试通道2，包括直接连接和通过降压或隔离直流电路的间接连接。The device as described above is characterized in that the probe 1 is connected to the test channel 1, and the probe 2 is connected to the test channel 2, including direct connection and indirect connection through a step-down or isolated DC circuit.
如上所述的装置，其特征在于，所说的识别单元，被配置为包括：通过将S1和S2相加获得极性相同的时间域分量，通过将S1和S2相减获得极性相反的时间域分量，然后将时间域分量转换成频率域分量的硬件模块或者软件模块。The device as described above is characterized in that the identification unit is configured to include: a hardware module or software module that obtains time domain components with the same polarity by adding S1 and S2, obtains time domain components with opposite polarity by subtracting S1 and S2, and then converts the time domain components into frequency domain components.
如上所述的装置，其特征在于，所说的探头，其相对电路的位置移动受机械装置的控制。The device as described above is characterized in that the position movement of the probe relative to the circuit is controlled by a mechanical device.
本发明申请所披露的方法及***，其有益效果在于：The method and system disclosed in the present invention have the following beneficial effects:
1、测试和定位电路的近场和远场干扰源，有利于从源头上降低产品的传导和辐射干扰；1. Testing and locating the near-field and far-field interference sources of the circuit is conducive to reducing the conducted and radiated interference of the product from the source;
2、测量和识别环境干扰在电路上建立的感应电势分布，有助于提高电路的抗干扰能力； 2. Measuring and identifying the induced potential distribution created by environmental interference in the circuit will help improve the circuit’s anti-interference ability;
3、操作简单，成本低，易于推广。 3. Simple operation, low cost and easy to promote.
图1为本发明方法的流程图；Fig. 1 is a flow chart of the method of the present invention;
图2为本发明***的原理图；Fig. 2 is a schematic diagram of the system of the present invention;
以下结合附图和实施例对本发明作进一步详细说明。The present invention is further described in detail below with reference to the accompanying drawings and embodiments.
图1为本发明方法的流程图。本发明方法，具体包括: Figure 1 is a flow chart of the method of the present invention. The method of the present invention specifically comprises:
在被测试电路上选择测试点1和2；Select test points 1 and 2 on the circuit under test;
连接测试通道1和2的信号地构成参考点，参考点不连接被测试电路；The signal grounds of test channels 1 and 2 are connected to form a reference point, and the reference point is not connected to the circuit being tested;
同时测量测试点1对参考点的电压S1和测试点2对参考点的电压S2;Simultaneously measure the voltage S1 of test point 1 to the reference point and the voltage S2 of test point 2 to the reference point;
比较S1和S2，极性相同的分量为远场干扰，极性相反的分量为近场干扰。Comparing S1 and S2, the components with the same polarity are far-field interference, and the components with opposite polarity are near-field interference.
图2为本发明***的原理图。图2中，测试***的接口单元1被配置为测试时对外连接外部EUT(没有在图中画出)上不局限于电路板的任意测试点，对内连接测试单元2，测试单元2被配置为连接识别单元3，以便把测试数据送往识别单元3识别；识别单元3被配置为包括了识别和计算信号近场和远场分量的硬件模块或者软件模块。与传统的测试仪器不同，本发明***设置了一个参考点，参考点与测试通道的信号地连通，应用本发明***测试EUT电路近场和远场干扰时，参考点不连接EUT电路。也就是说，应用本发明***进行测试时，本发明***测试的是EUT上某测试点对测试***参考点的信号电压，而不是测试EUT上某测试点对EUT上另外一点的信号电压。与传统测试仪的另外一个不同，应用本发明***测试EUT电路近场和远场干扰时，通道1，2同步测试以获得EUT电路的，尤其是EUT包含的电路板上的任意两点对测试***参考点的电压信号，进而计算出近场和远场干扰。FIG2 is a schematic diagram of the system of the present invention. In FIG2, the interface unit 1 of the test system is configured to connect to any test point on the external EUT (not shown in the figure) not limited to the circuit board during testing, and to connect to the test unit 2 internally. The test unit 2 is configured to connect to the identification unit 3 so as to send the test data to the identification unit 3 for identification; the identification unit 3 is configured to include a hardware module or software module for identifying and calculating the near-field and far-field components of the signal. Different from the traditional test instrument, the system of the present invention sets a reference point, which is connected to the signal ground of the test channel. When the system of the present invention is used to test the near-field and far-field interference of the EUT circuit, the reference point is not connected to the EUT circuit. In other words, when the system of the present invention is used for testing, the system of the present invention tests the signal voltage of a test point on the EUT to the reference point of the test system, rather than testing the signal voltage of a test point on the EUT to another point on the EUT. Another difference from the traditional tester is that when the system of the present invention is used to test the near-field and far-field interference of the EUT circuit, channels 1 and 2 are tested synchronously to obtain the voltage signal of the EUT circuit, especially any two points on the circuit board included in the EUT to the reference point of the test system, and then the near-field and far-field interference are calculated.
应当指出，图2***实现测试功能时并不要求接地，这在具体应用中给用户带来很大的便利；然而，考虑到用户的用电安全，实践中通常将参考点与电网的保护地（PE）连接以防范测试***漏电导致的触电风险，这不影响***的工作；因为电磁干扰测试频率远远高于50Hz，在高频情况下，即便被测试电路也连接了PE，PE线上呈现的高阻抗，阻止了参考点与被测试电路的连通。It should be pointed out that the system in Figure 2 does not require grounding when implementing the test function, which brings great convenience to users in specific applications; however, considering the user's electricity safety, in practice the reference point is usually connected to the protective ground (PE) of the power grid to prevent the risk of electric shock caused by leakage of the test system, which does not affect the operation of the system; because the electromagnetic interference test frequency is much higher than 50Hz, in high-frequency conditions, even if the circuit being tested is connected to PE, the high impedance on the PE line prevents the reference point from being connected to the circuit being tested.
以下通过结合图1-图2描述更多实施例进一步说明本发明方法和***的工作原理。The following describes more embodiments in conjunction with FIG. 1-FIG . 2 to further illustrate the working principle of the method and system of the present invention.
本实施例中，一个DC/DC变换电路作为EUT，连接如图2所示的测试***以测试和定位EUT工作时板上产生的干扰。具体连接方式为，测试***接口单元1的探头101接触EUT上任意元器件的焊点或者布线导体也即测试点1，探头102接触EUT上另外一个任意元器件的焊点或者布线导体也即测试点2，本实施例选择了电源地作为测试点2；不要求测试点1和测试点2必须是或者必须构成电源端口；测试单元2同时测试测试点1对测试单元2的参考点103的电压信号S1和测试点2对测试单元2的参考点103的电压信号S2，获得一组包括S1,S2的数据。获得的数据由测试单元2送往识别单元3。识别单元3识别数据包含的干扰分量，识别方法为，比较S1和S2，其中极性相同的分量为远场干扰，比较S1和S2，其中极性相反的分量为近场干扰。有许多识别S1,S2中极性相同或者不同分量的方法；例如，可以将S1和S2相加，极性相反的分量彼此抵消，剩下的就是极性相同的远场干扰时间域分量，将S1和S2相减，极性相同的分量相互抵消，剩下的就是极性相反的近场干扰时间域分量。考虑到EMC标准对干扰的评估是在频率域进行，识别单元3还进一步通过傅里叶变换将近场和远场干扰分量从时间域转到频率域。In this embodiment, a DC/DC conversion circuit is used as an EUT, and is connected to the test system shown in FIG2 to test and locate the interference generated on the board when the EUT is working. The specific connection method is that the probe 101 of the test system interface unit 1 contacts the solder joint or wiring conductor of any component on the EUT, that is, the test point 1, and the probe 102 contacts the solder joint or wiring conductor of another arbitrary component on the EUT, that is, the test point 2. In this embodiment, the power ground is selected as the test point 2; it is not required that the test point 1 and the test point 2 must be or must constitute a power port; the test unit 2 simultaneously tests the voltage signal S1 of the test point 1 to the reference point 103 of the test unit 2 and the voltage signal S2 of the test point 2 to the reference point 103 of the test unit 2, and obtains a set of data including S1 and S2. The obtained data is sent to the identification unit 3 by the test unit 2. The identification unit 3 identifies the interference components contained in the data, and the identification method is to compare S1 and S2, where the components with the same polarity are far-field interference, and compare S1 and S2, where the components with opposite polarities are near-field interference. There are many methods for identifying components with the same or different polarities in S1 and S2; for example, S1 and S2 can be added, and the components with opposite polarities cancel each other, and what remains is the time domain component of far-field interference with the same polarity; S1 and S2 can be subtracted, and the components with the same polarity cancel each other, and what remains is the time domain component of near-field interference with opposite polarity. Considering that the EMC standard evaluates interference in the frequency domain, the identification unit 3 further converts the near-field and far-field interference components from the time domain to the frequency domain through Fourier transform.
移动探头101并接触EUT上另外一个元器件的焊点或者布线导体也即测试点1，移动探头102并接触EUT电源地的不同部位也即测试点2，也可以保持探头102不动；同步测试获得另外一组数据，以此类推，直到识别单元3计算出所有测试点的近场和远场干扰分量的频谱。比较不同测试点找出远场干扰频谱中某一频率对应的幅度值较大的测试点，也就是电路板上该频率辐射干扰较强的位置；比较不同测试点找出近场干扰频谱中某一频率对应的幅度值较大的测试点，也就是电路板上该频率传导干扰较强的位置。Move the probe 101 and contact the solder joint or wiring conductor of another component on the EUT, that is, test point 1; move the probe 102 and contact different parts of the EUT power supply ground, that is, test point 2; or keep the probe 102 still; perform synchronous testing to obtain another set of data, and so on, until the identification unit 3 calculates the spectrum of the near-field and far-field interference components of all test points. Compare different test points to find the test point with a larger amplitude value corresponding to a certain frequency in the far-field interference spectrum, that is, the position on the circuit board where the radiation interference of this frequency is stronger; compare different test points to find the test point with a larger amplitude value corresponding to a certain frequency in the near-field interference spectrum, that is, the position on the circuit board where the conducted interference of this frequency is stronger.
与实施例1基本相同。不同之处，在识别单元3计算出所有测试点的近场和远场干扰分量的频谱中某频率点的干扰幅度后，将测试点在电路板图像上标出，并且将各测试点的该频率点干扰幅度用颜色表示，颜色越红，干扰强度越强，从而能够在图像上方便地观察到该频率点的近场干扰和远场干扰在板上的分布。It is basically the same as Example 1. The difference is that after the identification unit 3 calculates the interference amplitude of a certain frequency point in the spectrum of the near-field and far-field interference components of all test points, the test point is marked on the circuit board image, and the interference amplitude of the frequency point of each test point is represented by color, the redder the color, the stronger the interference intensity, so that the distribution of the near-field interference and far-field interference of the frequency point on the board can be easily observed on the image.
与实施例1基本相同。不同之处在于，在连接EUT的输入电源线上也用同样方法测试一组数据并且与板上测试数据对比，得到了包括电路板以外电缆在内的EUT的近场干扰和远场干扰的整体分布结果。It is basically the same as Example 1. The difference is that a set of data is tested on the input power line connected to the EUT in the same way and compared with the test data on the board, and the overall distribution results of the near-field interference and far-field interference of the EUT including the cables outside the circuit board are obtained.
与实施例1基本相同。不同之处，测试单元2获得数据后，自动或者手工将数据上传到云端，由云计算模块构成的识别单元3进行识别和计算。本实施例的测试***将数据采集和数据分析分离，不仅降低了测试***成本和测试费用，并且有利于测试数据的共享和进一步的数据挖掘。 It is basically the same as Example 1. The difference is that after the test unit 2 obtains the data, it automatically or manually uploads the data to the cloud, and the recognition unit 3 composed of the cloud computing module performs recognition and calculation. The test system of this embodiment separates data collection and data analysis, which not only reduces the cost of the test system and the test fee, but also facilitates the sharing of test data and further data mining.
与实施例1基本相同。不同之处，探头101和102通过降压或隔离直流电路后接触板上测试点。The embodiment is basically the same as the embodiment 1. The difference is that the probes 101 and 102 contact the test points on the board after passing through the step-down or isolated DC circuit.
与实施例1基本相同。不同之处为，探头101和102不接触板上的测试点，包括，采用磁场探头或者电场探头或者同时可感应磁场和电场的复合式感应探头来感知板上磁场或者电场或者电磁场的强度。 It is basically the same as Example 1. The difference is that probes 101 and 102 do not contact the test points on the board, including using a magnetic field probe or an electric field probe or a composite sensing probe that can sense both the magnetic field and the electric field to sense the intensity of the magnetic field, electric field or electromagnetic field on the board.
与实施例1基本相同。不同之处为，探头101和102中的一个探头不接触板上的测试点，包括，采用磁场探头或者电场探头或者同时可感应磁场和电场的复合式感应探头感知板上电磁场的强度，一个探头接触板上的测试点直接测量测试点对参考点的电压。 It is basically the same as Example 1. The difference is that one of the probes 101 and 102 does not contact the test point on the board, including using a magnetic field probe or an electric field probe or a composite sensing probe that can sense both the magnetic field and the electric field to sense the strength of the electromagnetic field on the board, and one probe contacts the test point on the board to directly measure the voltage of the test point to the reference point.
与实施例1基本相同。不同之处，不同之处为，用机械装置夹持探头，机械装置在人工或者程序控制下将探头沿X,Y,Z三维方向移动。It is basically the same as Example 1. The difference is that the probe is clamped by a mechanical device, and the mechanical device moves the probe in the three-dimensional directions of X, Y, and Z under manual or program control.
与实施例1基本相同。不同之处，测试单元2获得的数据，自动或手工通过Internet上传到云端，由云计算模块构成的测试单元3识别出不同测试点的近场和远场干扰分量，并且将测试点在云端的电路板图像上标出，将各测试点的干扰幅度用颜色表示，颜色越红，干扰强度越强，从而能够远程观察近场干扰和远场干扰在EUT板上的分布。It is basically the same as Example 1. The difference is that the data obtained by the test unit 2 is automatically or manually uploaded to the cloud via the Internet, and the test unit 3 composed of the cloud computing module identifies the near-field and far-field interference components of different test points, and marks the test points on the circuit board image in the cloud, and represents the interference amplitude of each test point with color. The redder the color, the stronger the interference intensity, so that the distribution of near-field interference and far-field interference on the EUT board can be observed remotely.
本实施例中，一个STM32单板计算机作为EUT。切断工作电源，令EUT处于与外部没有任何物理连接的浮置状态并且放置于非屏蔽环境，以测试环境辐射干扰对电路板上不同部位的影响。首先，用频谱仪分别连接磁场探头和电场探头并测试EUT的电路板多个测试点，由于脱离电源并且与外部断开连接的EUT不产生电场和磁场，频谱仪无法测试到环境干扰在EUT板上的感应电势。需要指出，如果仅仅将电路的电源开关关闭使得电路不工作，而电路与外部的仍然保持物理连接，则外部的传导干扰仍然有可能抵达电路板并且被EM扫描仪测到，这将干扰我们对环境干扰在EUT板上建立的感应电势的测试。In this embodiment, an STM32 single-board computer is used as the EUT. Cut off the working power supply, make the EUT in a floating state without any physical connection to the outside and place it in a non-shielded environment to test the impact of environmental radiation interference on different parts of the circuit board. First, use a spectrum analyzer to connect the magnetic field probe and the electric field probe respectively and test multiple test points of the EUT circuit board. Since the EUT that is disconnected from the power supply and disconnected from the outside does not generate an electric field and a magnetic field, the spectrum analyzer cannot test the induced potential of environmental interference on the EUT board. It should be pointed out that if only the power switch of the circuit is turned off to make the circuit not work, and the circuit is still physically connected to the outside, the external conducted interference may still reach the circuit board and be detected by the EM scanner, which will interfere with our test of the induced potential established by environmental interference on the EUT board.
应用本发明披露的技术方案，能够测试和定位环境干扰对EUT板上不同部位的影响。具体连接方式为，将EUT连接如图2所示的测试***，测试***接口单元1的探头101接触EUT上不同元器件的焊点也即测试点1，探头102接触EUT的电源地也即测试点2；不要求测试点1和测试点2必须构成电源端口；用实施例1相同方法进行测试，结果表明，电路板上通道1测得了幅度大约为正负12毫伏的感应电势；通道2测得了幅度大约为正3.5毫伏，负7.5毫伏的感应电势。测试***最终获得的频谱表明不同测试点在频率300KHz，3MHz和12MHz都出现干扰峰值，但是幅度各不相同，最大差异高达30dB。By applying the technical solution disclosed in the present invention, the influence of environmental interference on different parts of the EUT board can be tested and located. The specific connection method is to connect the EUT to the test system shown in Figure 2, the probe 101 of the test system interface unit 1 contacts the solder joints of different components on the EUT, namely test point 1, and the probe 102 contacts the power ground of the EUT, namely test point 2; it is not required that test point 1 and test point 2 must constitute a power port; the same method as embodiment 1 is used for testing, and the results show that channel 1 on the circuit board measures an induced potential with an amplitude of approximately plus or minus 12 millivolts; channel 2 measures an induced potential with an amplitude of approximately plus 3.5 millivolts and minus 7.5 millivolts. The spectrum finally obtained by the test system shows that interference peaks appear at different test points at frequencies of 300KHz, 3MHz and 12MHz, but the amplitudes are different, with the maximum difference being as high as 30dB.
上述实施例只为说明本发明的技术构思及特点，其目的在于让本领域普通技术人员能够了解本发明的内容并据以实施，并不能以此限制本发明的保护范围。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。The above embodiments are only for illustrating the technical concept and features of the present invention, and their purpose is to enable ordinary technicians in the field to understand the content of the present invention and implement it accordingly, and they cannot be used to limit the protection scope of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present invention.
Claims (10)
- 一种电路的干扰测量方法，其特征在于，包括:A method for measuring interference of a circuit, characterized by comprising:在被测试电路上任选两点作为测试点1和测试点2；Select any two points on the circuit under test as test point 1 and test point 2;定义一个参考点，参考点不连接被测试电路；Define a reference point that is not connected to the circuit being tested;用测试单元的通道1测量测试点1对参考点的电压信号S1，用测试单元的通道2测量测试点2对参考点的电压信号S2，所说的测量同时进行；Using channel 1 of the test unit to measure a voltage signal S1 of the test point 1 relative to the reference point, and using channel 2 of the test unit to measure a voltage signal S2 of the test point 2 relative to the reference point, the measurements being performed simultaneously;识别测试点1和测试点2包含的干扰分量，包括：比较S1和S2，其中极性相同的分量为远场干扰，比较S1和S2，其中极性相反的分量为近场干扰。Identifying interference components included in test point 1 and test point 2 includes: comparing S1 and S2, where components with the same polarity are far-field interference, and comparing S1 and S2, where components with opposite polarities are near-field interference.
- 根据权利要求1所述的方法，其特征在于，能够通过将所说的被测试电路不接通电源并且断开与外部的物理连接的方法，来测试环境干扰对电路的影响。The method according to claim 1 is characterized in that the influence of environmental interference on the circuit can be tested by disconnecting the tested circuit from power and disconnecting the physical connection with the outside.
- 根据权利要求1所述的方法，其特征在于，所说的参考点不要求接地。The method according to claim 1 is characterized in that the reference point is not required to be grounded.
- 根据权利要求1所述的方法，其特征在于，所说的用通道1测量测试点1对参考点的电压信号S1，用通道2测量测试点2对参考点的电压信号S2，包括：通道探头接触测试点和通道探头不接触测试点。 The method according to claim 1 is characterized in that the use of channel 1 to measure the voltage signal S1 of test point 1 relative to the reference point, and the use of channel 2 to measure the voltage signal S2 of test point 2 relative to the reference point include: the channel probe contacts the test point and the channel probe does not contact the test point.
- 根据权利要求1所述的方法，其特征在于，所说的识别，包括：通过将S1和S2相加获得极性相同的分量，通过将S1和S2相减获得极性相反的分量。 The method according to claim 1 is characterized in that the identification includes: obtaining components with the same polarity by adding S1 and S2, and obtaining components with opposite polarity by subtracting S1 and S2.
- 根据权利要求1所述的方法，其特征在于，继续以所说的方法选择并且测量电路上其它测试点，比较不同的测试点之间的远场干扰，找出远场干扰量值较大的测试点，也就是电路上较强辐射干扰的所在位置；比较不同测试点之间的近场干扰，找出近场干扰量值较大的测试点，也就是电路上较强传导干扰的所在位置。The method according to claim 1 is characterized in that other test points on the circuit are continuously selected and measured by the method, and the far-field interference between different test points is compared to find the test point with larger far-field interference value, which is the location of stronger radiation interference on the circuit; the near-field interference between different test points is compared to find the test point with larger near-field interference value, which is the location of stronger conducted interference on the circuit.
- 一种干扰测量***，其特征在于，包含有接口单元，测量单元和识别单元；所说的接口单元配置为包括探头1和探头2，所说的测试单元配置为包括测试通道1，测试通道2，参考点和测试通道1和2的信号地；探头1和探头2为接触式或非接触式，探头1连接测试通道1，探头2连接测试通道2，参考点连接信号地；测试***测试被测试电路时，同时使用探头1，2，参考点不连接被测试电路；探头1，2接触被测试电路测试点1，2，测试单元配置为控制测试通道1和2同步测量测试点1和2对参考点的电压信号S1和S2，并且将测试结果送识别单元；识别单元配置为识别出S1和S2中极性相同的分量，为远场干扰，识别出S1和S2中极性相反的分量，为近场干扰。 An interference measurement system, characterized in that it includes an interface unit, a measuring unit and an identification unit; the interface unit is configured to include probe 1 and probe 2, and the test unit is configured to include test channel 1, test channel 2, a reference point and a signal ground of test channels 1 and 2; probe 1 and probe 2 are contact or non-contact, probe 1 is connected to test channel 1, probe 2 is connected to test channel 2, and the reference point is connected to the signal ground; when the test system tests the circuit under test, probes 1 and 2 are used simultaneously, and the reference point is not connected to the circuit under test; probes 1 and 2 contact test points 1 and 2 of the circuit under test, and the test unit is configured to control test channels 1 and 2 to synchronously measure voltage signals S1 and S2 of test points 1 and 2 to the reference point, and send the test results to the identification unit; the identification unit is configured to identify components with the same polarity in S1 and S2 as far-field interference, and identify components with opposite polarity in S1 and S2 as near-field interference.
- 根据权利要求7所述的***，其特征在于，所说的探头1连接测试通道1，探头2连接测试通道2，包括直接连接和通过降压或隔离直流电路的间接连接。The system according to claim 7 is characterized in that the probe 1 is connected to the test channel 1, and the probe 2 is connected to the test channel 2, including a direct connection and an indirect connection through a step-down or isolated DC circuit.
- 根据权利要求7所述的***，其特征在于，所说的识别单元，被配置为包括：通过将S1和S2相加获得极性相同的时间域分量，通过将S1和S2相减获得极性相反的时间域分量，然后将时间域分量转换成频率域分量的硬件模块或者软件模块。The system according to claim 7 is characterized in that the identification unit is configured to include: a hardware module or software module that obtains time domain components with the same polarity by adding S1 and S2, obtains time domain components with opposite polarity by subtracting S1 and S2, and then converts the time domain components into frequency domain components.
- 根据权利要求7所述的***，其特征在于，所说的探头，其相对电路的位置移动受机械装置的控制。The system according to claim 7 is characterized in that the position movement of the probe relative to the circuit is controlled by a mechanical device.
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