CN210604796U - Electromagnetic noise test system - Google Patents
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- CN210604796U CN210604796U CN201921135148.0U CN201921135148U CN210604796U CN 210604796 U CN210604796 U CN 210604796U CN 201921135148 U CN201921135148 U CN 201921135148U CN 210604796 U CN210604796 U CN 210604796U
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Abstract
The utility model relates to an electromagnetic compatibility technical field provides an electromagnetic noise test system, include: a functional unit selected from the group consisting of: the device comprises a noise source positioning unit, an electromagnetic noise pre-testing unit, a difference common mode component testing unit, a filter simulation design unit and an insertion loss testing unit; a noise detector adapted to be connected to any one of the functional units in the combination; and the controller is connected to the noise detector and is suitable for selecting a corresponding configuration according to the functional unit connected with the noise detector and testing the device to be tested. Compared with the prior art, the utility model provides an electromagnetic noise test system can overcome the limitation of single instrument and equipment, improves the flexibility of configuration accessory combination, simplifies and accelerates the solution electromagnetic interference problem by a wide margin.
Description
Technical Field
The utility model relates to an electromagnetic compatibility test field especially relates to an electromagnetic noise test system.
Background
As the volume of electronic products is continuously reduced and the operating frequency is continuously increased, the problem of electromagnetic interference becomes more and more serious. The traditional three major means for solving the electromagnetic interference problem, namely shielding, filtering and grounding, need to depend on the experience of engineers, and can not meet the requirements of smaller and smaller size, low cost and automatic process of electronic products. Electromagnetic noise diagnostic functions such as noise source localization, differential-common mode component testing, filter simulation design, insertion loss testing, etc. are gradually being used to solve the electromagnetic interference problem.
In each electromagnetic noise diagnostic function, noise source localization typically requires the aid of a spectrum analyzer and a near field probe. The differential-common mode component test generally requires a differential-common mode separation module, a two-way Linear Impedance Stabilization Network (LISN) and a receiver. The filter simulation design needs to incorporate software installed into a computer. Insertion loss testing typically requires the use of a network analyzer, a common mode signal, and a differential mode signal generator. The functions relate to a plurality of independent equipment, instruments, tools and computer software, are respectively from different companies, are complex to operate and cannot be used by engineers without special skill training. These factors have led to the failure of the above-described emi diagnostic measures to be widely adopted by the relevant industry engineers.
For the model selection and performance test of a filter and a filter device, the existing bridge and impedance analyzer cannot obtain key filtering performance indexes of differential mode insertion loss and common mode insertion loss, and although the network analyzer can obtain the insertion loss performance indexes, the expensive price and the complex operation of the network analyzer are forbidden by enterprises and engineers.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model is to provide an electromagnetic noise test system to provide electromagnetic noise diagnostic function such as noise source location, poor common mode component test, wave filter simulation design, insertion loss test, in order to overcome single instrument and equipment's limitation, improve the flexibility of configuration accessory combination, simplify by a wide margin and accelerate the solution electromagnetic interference problem.
In order to solve the technical problem, the utility model provides an electromagnetic noise test system, include: a functional unit selected from the group consisting of: the device comprises a noise source positioning unit, an electromagnetic noise pre-testing unit, a difference common mode component testing unit, a filter simulation design unit and an insertion loss testing unit; a noise detector adapted to be connected to any one of the functional units in the combination; and the controller is connected to the noise detector and is suitable for selecting a corresponding configuration according to the functional unit connected with the noise detector and testing the device to be tested.
In an embodiment of the present invention, the noise source positioning unit includes a near field probe, and the near field probe is suitable for being connected to the device under test.
In an embodiment of the present invention, the noise source positioning unit includes a plurality of near field probes having different detection accuracies.
In an embodiment of the present invention, the electromagnetic noise pre-test unit includes a linear impedance stabilization network, and the linear impedance stabilization network is adapted to be connected to the device under test.
In an embodiment of the present invention, the differential-common mode component testing unit includes a linear impedance stabilization network and a differential-common mode separation module, an output end of the linear impedance stabilization network is connected to an input end of the differential-common mode separation module, and the differential-common mode separation module is suitable for being connected to the noise detector.
In an embodiment of the present invention, the insertion loss test unit includes an insertion loss test shielding box, and the insertion loss test shielding box is suitable for being connected to the device under test.
In an embodiment of the present invention, the device further includes a shielding case, and the device under test is disposed in the shielding case.
In an embodiment of the present invention, the noise detector is a spectrum analyzer or an electromagnetic interference receiver.
Compared with the prior art, the utility model has the advantages of it is following: the utility model provides an electromagnetic noise test system, this electromagnetic noise test system provide electromagnetic noise diagnostic function such as noise source location, poor common mode component test, wave filter simulation design, insertion loss test, can overcome single instrument and equipment's limitation, improve the flexibility of configuration accessory combination, simplify and accelerate the solution electromagnetic interference problem by a wide margin.
Drawings
In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings, wherein:
fig. 1 is a schematic diagram of an electromagnetic noise testing system according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of an electromagnetic noise testing system providing a noise source positioning unit according to an embodiment of the present invention.
Fig. 3 is a result diagram of a noise source location test according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of an electromagnetic noise testing system providing an electromagnetic noise pre-testing unit according to an embodiment of the present invention.
Fig. 5 is a diagram illustrating the results of an electromagnetic noise pretest according to an embodiment of the present invention.
Fig. 6 is a schematic diagram of an electromagnetic noise testing system providing a differential-common mode component testing unit according to an embodiment of the present invention.
Fig. 7 is a diagram illustrating the result of the differential-common mode component test according to an embodiment of the present invention.
Fig. 8 is a schematic diagram of an electromagnetic noise testing system providing a filter simulation design unit according to an embodiment of the present invention.
Fig. 9A to 9B are schematic diagrams of a simulation design unit user display interface according to an embodiment of the present invention.
Fig. 10 is a diagram illustrating results of a simulation design according to an embodiment of the present invention.
Fig. 11 is a schematic diagram of an electromagnetic noise testing system providing an insertion loss testing unit according to an embodiment of the present invention.
Fig. 12 is a diagram illustrating the result of an insertion loss test according to an embodiment of the present invention.
Description of the reference numerals
100 functional unit
110 noise source positioning unit
110a near field probe
120 electromagnetic noise pretest unit
120a linear impedance stabilization network
130 difference common mode component test unit
130a linear impedance stabilization network
130b differential-common mode separation module
140 filter simulation design unit
150 insertion loss test unit
150a insertion loss test shielding box
200 noise detector
300 controller
400 device under test
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be practiced in other ways than those specifically described herein, and thus the present invention is not limited by the specific embodiments disclosed below.
As used in this application and the appended claims, the terms "a," "an," "the," and/or "the" are not intended to be inclusive in the singular, but rather are intended to be inclusive in the plural unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that steps and elements are included which are explicitly identified, that the steps and elements do not form an exclusive list, and that a method or apparatus may include other steps or elements.
In describing the embodiments of the present invention in detail, the cross-sectional view showing the structure of the device is not enlarged partially according to the general scale for the convenience of illustration, and the schematic diagram is only an example, which should not limit the protection scope of the present invention. In addition, the three-dimensional dimensions of length, width and depth should be included in the actual fabrication.
It will be understood that when an element is referred to as being "on," "connected to," "coupled to" or "contacting" another element, it can be directly on, connected or coupled to, or contacting the other element or intervening elements may be present. In contrast, when an element is referred to as being "directly on," "directly connected to," "directly coupled to" or "directly contacting" another element, there are no intervening elements present. Similarly, when a first component is said to be "in electrical contact with" or "electrically coupled to" a second component, there is an electrical path between the first component and the second component that allows current to flow. The electrical path may include capacitors, coupled inductors, and/or other components that allow current to flow even without direct contact between the conductive components.
The utility model provides an electromagnetic noise test system, this electromagnetic noise test system provide electromagnetic noise diagnostic function such as noise source location, poor common mode component test, wave filter simulation design, insertion loss test, can overcome single instrument and equipment's limitation, improve the flexibility of configuration accessory combination, simplify and accelerate the solution electromagnetic interference problem by a wide margin.
Fig. 1 is a schematic diagram of an electromagnetic noise testing system according to an embodiment of the present invention. As shown in fig. 1, the electromagnetic noise test system includes a functional unit 100, a noise detector 200, a controller 300, and a device under test 400.
The functional units 100 may be selected from the following combinations: the device comprises a noise source positioning unit, an electromagnetic noise pre-testing unit, a difference common mode component testing unit, a filter simulation design unit and an insertion loss testing unit. The noise source positioning unit can execute a noise source positioning function, the electromagnetic noise pre-testing unit can execute an electromagnetic noise pre-testing function, the difference and common mode component testing unit can execute a difference and common mode component testing function, the filter simulation designing unit can execute a filter simulation designing function, and the insertion loss testing unit can execute an insertion loss testing function. The structure and implementation of each combination in the functional unit 100 will be exemplarily described below.
The noise detector 200 is adapted to be connected to any one of the functional units in the combination, i.e. the noise detector 200 is adapted to be connected to a noise source locating unit, an electromagnetic noise pre-testing unit, a difference-common mode component testing unit, a filter simulation designing unit and an insertion loss testing unit, and can detect the electromagnetic noise signal transmitted by the connected functional unit. The noise detector 200 may be a spectrum analyzer, an electromagnetic noise receiver, or other device that can measure electromagnetic noise. Preferably, the noise detector 200 may be a spectrum analyzer.
In some embodiments, the noise detector 200 may be connected to the functional unit by a coaxial cable. A coaxial cable shielding layer can be arranged outside the coaxial cable to shield external interference and improve the accuracy of electromagnetic noise signal detection.
The controller 300 is connected to the noise detector 200 and is adapted to select a corresponding configuration according to the functional unit to which the noise detector 200 is connected to test the device under test 400. For example, the controller 300 may select the EMI standard limit line, may select the common mode noise component scan and the differential mode noise component scan, and may select to recall historical test data. Specifically, when a functional unit is connected to the noise detector 200, the controller 300 may identify the functional unit to which the noise detector 200 is connected and select a corresponding configuration according to the identified functional unit. For example, when the noise detector 200 is connected to a noise source localization unit, the controller 300 is adapted to select a corresponding configuration for performing noise source localization for the device under test 400. For another example, when the noise detector 200 is connected to an electromagnetic noise pretest unit, the controller 300 is adapted to select a corresponding configuration to perform the electromagnetic noise pretest on the device under test 400. For another example, when the noise detector 200 is connected to the differential-to-common mode component test, the controller 300 is adapted to select the corresponding configuration to perform the differential-to-common mode component test on the device under test 400.
The controller 300 may be a hardware controller. The hardware controller may be a control circuit, for example, by a combination of a plurality of electronic switches to identify the functional unit and to select the corresponding configuration. The electronic switch can be a MOS tube or a triode.
The controller 300 may mark and measure the current test result, may also call stored historical test data, and may analyze the improvement effect of different solutions by comparing the current test data with the historical test data.
The device under test 400 may include a printed circuit board. The printed circuit board may include various electronic components (electronic components) or Integrated Circuits (ICs), and the electronic components and the ICs form an electronic circuit. Electromagnetic noise is present in the electronic circuit and typically includes both common mode noise and differential mode noise. The electromagnetic noise of the device under test 400 may be collected and processed by the functional unit and then passed to the noise detector 200 for detection and analysis.
In some embodiments, the electromagnetic noise testing system may further include a shielded enclosure in which the device under test 400 is disposed. By arranging the shielding shell, the interference of external electromagnetic noise on the electromagnetic noise testing system can be eliminated, and the testing accuracy of the electromagnetic noise testing system is improved.
The functions of the electromagnetic noise test system of the present invention will be described below with reference to fig. 2 to 12.
Noise source localization
Fig. 2 is a schematic diagram of an electromagnetic noise testing system providing a noise source positioning unit according to an embodiment of the present invention. As shown in fig. 2, when the noise detector 200 is connected to the noise source localization unit 110, the controller 300 is adapted to select a corresponding configuration for performing noise source localization on the device under test 400.
The noise source locating unit 100 includes a near field probe 110 a. The near field probe 110a may be connected to the device under test 400, for example, in contact with a printed circuit board, and may transmit electromagnetic noise onto the near field probe 110a, so as to collect an electromagnetic noise signal.
The noise source positioning unit 110 may include a plurality of near field probes with different detection accuracies, and the positioning accuracy may reach 2mm by the plurality of near field probes with different detection accuracies, so as to provide an important basis for solving the problem of electromagnetic interference.
Fig. 3 is a result diagram of a noise source location test according to an embodiment of the present invention. In fig. 3, the abscissa represents frequency (in MHz) and the ordinate represents amplitude (in dBuv). The lower curve is the instantaneous value and the upper curve is the peak hold value obtained by processing the instantaneous value. Firstly, performing an electromagnetic noise pretest to determine an overproof frequency point. And after the standard exceeding frequency points are determined, obtaining the amplitude of each test point at the standard exceeding frequency points. Because the strength of the common mode noise is the largest at the noise source, the test point with the largest amplitude at the standard exceeding frequency point can be determined to be the noise source, and the positioning of the noise source is realized. Electromagnetic noise is collected through the near-field probe 110a, the amplitude of the electromagnetic noise is analyzed, a noise source can be positioned, the positioning precision can reach 2mm, and an important basis is provided for solving the problem of electromagnetic interference.
Electromagnetic noise pretest
Fig. 4 is a schematic diagram of an electromagnetic noise testing system providing an electromagnetic noise pre-testing unit according to an embodiment of the present invention. As shown in fig. 4, when the noise detector 200 is connected to the electromagnetic noise pretest unit 120, the controller 300 is adapted to select a corresponding configuration for performing the electromagnetic noise pretest on the device under test 400.
The electromagnetic noise pretest unit 120 may include a linear impedance stabilization network 120 a. The linear impedance stabilization network 120a provides a stable impedance for measuring the noise voltage emitted by the device under test 400 along the power line to the power grid.
The controller 300 may select or add an electromagnetic interference standard limit line that the device under test 400 needs to meet, test the electromagnetic noise of the device under test 400, and determine whether the detected electromagnetic noise exceeds the corresponding electromagnetic interference standard limit line, thereby implementing an electromagnetic noise pretest. The controller 300 may invoke the saved historical test results to analyze the improvement of the different solutions.
Fig. 5 is a diagram illustrating the results of an electromagnetic noise pretest according to an embodiment of the present invention. In fig. 5, the abscissa represents frequency (in MHz) and the ordinate represents amplitude (in dBuv). Two approximately horizontal lines in fig. 5 represent selected emi standard limit lines and the curves represent real-time measurements and a plurality of historical test values. The controller 300 may invoke the saved historical test results to analyze the improvement of the different solutions. Electromagnetic noise pretests may be implemented by the linear impedance stabilization network 120 a.
Differential and common mode component testing
Fig. 6 is a schematic diagram of an electromagnetic noise testing system providing a differential-common mode component testing unit according to an embodiment of the present invention. As shown in fig. 6, when the noise detector 200 is connected to the differential-to-common mode component testing unit 130, the controller 300 is adapted to select a corresponding configuration for performing the differential-to-common mode component test on the device under test 400.
The differential-to-common mode component test unit 130 may include a linear impedance stabilization network 130a and a differential-to-common mode separation module 130 b. The output of the linear impedance stabilization network 130a is connected to the input of the differential-to-common mode separation module 130b, and the differential-to-common mode separation module 130b is adapted to be connected to the noise detector 200. The linear impedance stabilization network 130a provides a stabilizing impedance for measuring the noise voltage emitted by the device under test 400 along the power line to the power grid. The differential-to-common mode separation module 130b may separate the common mode noise from the differential mode noise in the electromagnetic noise.
By connecting the dual-output linear impedance stabilizing network 130a to the input end of the differential-mode and common-mode separation module 130b, the differential-mode component and the common-mode component of the noise in the device under test 400 can be obtained at the common-mode output end and the differential-mode output end of the differential-mode and common-mode separation module 130b, then the controller 300 controls the noise detector 200 to scan the common-mode component and the differential-mode component of the noise, the electromagnetic interference standard limit lines which need to be met by the device under test are compared, and the margin between the limit lines and the electromagnetic interference standard limit lines is confirmed to be used as the design input of the EMI filter and the basis of the electromagnetic interference solution.
Fig. 7 is a diagram illustrating the result of the differential-common mode component test according to an embodiment of the present invention. In fig. 7, the abscissa represents frequency (in MHz) and the ordinate represents amplitude (in dBuv). Two approximately horizontal lines in fig. 7 represent selected emi standard limit lines, and the curves represent the differential mode component test result and the common mode component test result, respectively. Through the linear impedance stabilization network 130a and the differential-common mode separation module 130b, a differential-common mode component test can be realized.
Filter simulation design
Fig. 8 is a schematic diagram of an electromagnetic noise testing system providing a filter simulation design unit according to an embodiment of the present invention. As shown in fig. 8, when the noise detector 200 is connected to the filter simulation design unit 140, the controller 300 is adapted to select a corresponding configuration for simulation design of the device under test 400.
When simulation design is carried out, allowance (exceeding amplitude) between the noise intensity of a tested object and an electromagnetic interference standard limiting line and frequency information of a superscript point can be input, then a filter device is selected to build a filter circuit, and simulation design of the filter can be realized.
Fig. 9A to 9B are schematic diagrams of a simulation design unit user display interface according to an embodiment of the present invention. As shown in fig. 9A, the user interface includes 6 superscalar frequency input boxes in which a user can input a superscalar frequency and 6 superscalar amplitude input boxes in which a user can input a superscalar amplitude. The number of input boxes is not limited to 6 shown in fig. 9A, and other numbers of input boxes are also possible. As shown in fig. 9B, the left side of the diagram shows that a filter circuit is built by selecting 2 capacitors and 2 inductors, and the input differential mode capacitor can be adjusted by fine tuning the capacitors and the inductors, so as to realize the simulation design of the filter.
Fig. 10 is a diagram illustrating results of a simulation design according to an embodiment of the present invention. In fig. 10, the abscissa represents frequency (in MHz), the ordinate represents amplitude (in dBuv), two approximately horizontal lines represent selected emi standard limit lines, and the curve represents the emi test results of the simulation circuit. As can be seen from fig. 10, the margin between the electromagnetic noise and the electromagnetic interference standard limit line of the built filter circuit is greater than the standard exceeding amplitude, which can meet the design requirement of the filter circuit.
Insertion loss test
Fig. 11 is a schematic diagram of an electromagnetic noise testing system providing an insertion loss testing unit according to an embodiment of the present invention. As shown in fig. 11, when the noise detector 200 is connected to the insertion loss testing unit 150, the controller 300 is adapted to select a corresponding configuration for performing insertion loss testing on the device under test 400. The common mode insertion loss and the differential mode insertion loss of the filter can be tested, and the common mode insertion loss and the differential mode insertion loss of the filter can also be tested.
The insertion loss test unit 150 may include an insertion loss test shield case 150 a. The insertion loss test shielding box 150a can shield interference of external electromagnetic noise on the insertion loss test, and improve the accuracy of the noise test. The insertion loss test step length can realize the insertion loss test result of different step lengths of the sub-frequency band according to the fixed step length or the different step lengths of the sub-frequency band in the EMI standard, so that the insertion loss test result is consistent with or close to the noise suppression effect in the EMI test result.
By utilizing the tracking source and the spectrum analysis function in the noise detector 200, the common mode insertion loss and differential mode insertion loss test function of the filter can be realized, the common mode insertion loss and differential mode insertion loss test function of the filter can also be realized, and the insertion loss test function of a network analyzer is replaced.
Fig. 12 is a diagram illustrating the result of an insertion loss test according to an embodiment of the present invention. Fig. 12 shows the test results of common mode insertion loss and differential mode insertion loss, respectively. The insertion loss test unit 150 can implement insertion loss test of the device under test.
The embodiment of the utility model provides an electromagnetic noise test system, this electromagnetic noise test system provide electromagnetic noise diagnostic function such as noise source location, difference common mode component test, wave filter simulation design, insertion loss test, can overcome single instrument and equipment's limitation, improve the flexibility of configuration accessory combination, simplify by a wide margin and accelerate and solve the electromagnetic interference problem.
This application uses specific words to describe embodiments of the application. Reference throughout this specification to "one embodiment," "an embodiment," and/or "some embodiments" means that a particular feature, structure, or characteristic described in connection with at least one embodiment of the present application is included in at least one embodiment of the present application. Therefore, it is emphasized and should be appreciated that two or more references to "an embodiment" or "one embodiment" or "an alternative embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, some features, structures, or characteristics of one or more embodiments of the present application may be combined as appropriate.
Although the present invention has been described with reference to the present specific embodiments, it will be understood by those skilled in the art that the above embodiments are merely illustrative of the present invention, and various equivalent changes and substitutions may be made without departing from the spirit of the present invention, and therefore, changes and modifications to the above embodiments within the spirit of the present invention will fall within the scope of the claims of the present application.
Claims (8)
1. An electromagnetic noise testing system, comprising:
a functional unit selected from the group consisting of: the device comprises a noise source positioning unit, an electromagnetic noise pre-testing unit, a difference common mode component testing unit, a filter simulation design unit and an insertion loss testing unit;
a noise detector adapted to be connected to any one of the functional units in the combination;
and the controller is connected to the noise detector and is suitable for selecting a corresponding configuration according to the functional unit connected with the noise detector and testing the device to be tested.
2. The electromagnetic noise testing system of claim 1, wherein the noise source locating unit comprises a near field probe adapted to connect to the device under test.
3. The electromagnetic noise testing system of claim 2, wherein the noise source locating unit comprises a plurality of near field probes having different detection accuracies.
4. The electromagnetic noise testing system of claim 1, wherein the electromagnetic noise pretesting unit comprises a linear impedance stabilization network adapted to be connected to the device under test.
5. The electromagnetic noise testing system of claim 1, wherein the differential-to-common mode component testing unit comprises a linear impedance stabilization network and a differential-to-common mode separation module, an output of the linear impedance stabilization network being connected to an input of the differential-to-common mode separation module, the differential-to-common mode separation module being adapted to be connected to the noise detector.
6. The electromagnetic noise testing system of claim 1, wherein the insertion loss testing unit comprises an insertion loss testing shield box adapted to be connected to the device under test.
7. The electromagnetic noise testing system of claim 1, further comprising a shielded enclosure in which the device under test is disposed.
8. The electromagnetic noise testing system of claim 1, wherein the noise detector is a spectrum analyzer or an electromagnetic interference receiver.
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| CN111781457A (en) * | 2020-07-24 | 2020-10-16 | 上海擎度汽车科技有限公司 | Test system and method for EMC conduction emission of electronic product |
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| CN111781457A (en) * | 2020-07-24 | 2020-10-16 | 上海擎度汽车科技有限公司 | Test system and method for EMC conduction emission of electronic product |
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