WO2024066740A1 - 检测电路及其控制方法、车载终端设备 - Google Patents
检测电路及其控制方法、车载终端设备 Download PDFInfo
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- WO2024066740A1 WO2024066740A1 PCT/CN2023/111253 CN2023111253W WO2024066740A1 WO 2024066740 A1 WO2024066740 A1 WO 2024066740A1 CN 2023111253 W CN2023111253 W CN 2023111253W WO 2024066740 A1 WO2024066740 A1 WO 2024066740A1
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- temperature
- circuit
- voltage
- sensing circuit
- temperature sensing
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- 238000001514 detection method Methods 0.000 title claims abstract description 92
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000005070 sampling Methods 0.000 claims abstract description 174
- 238000006243 chemical reaction Methods 0.000 claims abstract description 58
- 238000012360 testing method Methods 0.000 claims description 97
- 239000000463 material Substances 0.000 claims description 13
- 230000004044 response Effects 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 8
- 238000012545 processing Methods 0.000 claims description 8
- 238000003860 storage Methods 0.000 claims description 6
- 238000013528 artificial neural network Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 25
- 230000001276 controlling effect Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 4
- 238000009529 body temperature measurement Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000007726 management method Methods 0.000 description 3
- 206010039203 Road traffic accident Diseases 0.000 description 2
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- 230000009118 appropriate response Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 230000008447 perception Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60R—VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
- B60R16/00—Electric or fluid circuits specially adapted for vehicles and not otherwise provided for; Arrangement of elements of electric or fluid circuits specially adapted for vehicles and not otherwise provided for
- B60R16/02—Electric or fluid circuits specially adapted for vehicles and not otherwise provided for; Arrangement of elements of electric or fluid circuits specially adapted for vehicles and not otherwise provided for electric constitutive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
- G05B19/0425—Safety, monitoring
Definitions
- the present application relates to the field of automobile technology, and in particular to a detection circuit and a control method thereof, and a vehicle-mounted terminal device.
- SoC system on chip
- CPU central processing unit
- NPU embedded neural network processor
- ISP image signal processor
- VENC video encoding
- VDEC video decoding
- the present application provides a detection circuit and a control method thereof, and a vehicle-mounted terminal device, which can not only detect the temperature of the sampling point, but also detect whether the first temperature sensing circuit and the second temperature sensing circuit used for temperature measurement are faulty, so as to improve the accuracy of the detection circuit.
- the present application provides a memory, which includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit.
- the first temperature sensing circuit and the second temperature sensing circuit are integrated on multiple sampling points of the SoC in the car, and are configured to detect the temperature of the same sampling point within a preset time.
- the first temperature sensing circuit is also configured to convert the detected temperature into a first voltage according to a temperature-voltage fitting formula.
- the second temperature sensing circuit is also configured to convert the detected temperature into a second voltage according to a temperature-voltage fitting formula, and the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage.
- the comparison circuit is configured to compare the first voltage and the second voltage, and if the difference between the first voltage and the second voltage is greater than a preset parameter, a first comparison result is reported.
- the multiple sampling points may be multiple different physical locations in the SoC.
- locations in the SoC where the SoC is in a working state and where the heat generation and temperature are relatively high may be selected as sampling points.
- the multiple sampling points may include an image processor, a central processing unit, an embedded neural network processor, a video encoder, a video decoder, and the like.
- the present application can use the first temperature sensing circuit and the second temperature sensing circuit to detect the temperature of the sampling point, so as to avoid the temperature of the sampling point exceeding the allowable junction temperature range without being discovered, affecting the working stability of the SoC.
- the detection circuit of the present application also includes a comparison circuit. Since the first temperature sensing circuit and the second temperature sensing circuit integrated on the same sampling point are very close in the physical layout, and the physical distance between the two is in the micron level, the difference between the detection results of the first temperature sensing circuit and the second temperature sensing circuit should be very small in theory. Therefore, the comparison circuit can also be used to compare the first voltage measured by the first temperature sensing circuit and the second voltage measured by the second temperature sensing circuit.
- the comparison circuit can report the first comparison result indicating that the first temperature sensing circuit and/or the second temperature sensing circuit are faulty, and other devices in the vehicle-mounted terminal device handle this problem, thereby improving the accuracy of the detection circuit detecting the temperature.
- the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point.
- the comparison circuit is configured to perform real-time comparison between the received first voltage and the second voltage.
- the first temperature sensing circuit Compared with the time-sharing operation of the first temperature sensing circuit and the second temperature sensing circuit, when the first temperature sensing circuit and the second temperature sensing circuit operate at the same time, the first temperature sensing circuit There is no temperature measurement time difference between the first temperature sensing circuit and the second temperature sensing circuit. Therefore, the comparison result when the first temperature sensing circuit and the second temperature sensing circuit work at the same time is more accurate.
- the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in a time-sharing manner.
- the second temperature sensing circuit does not detect the temperature of the sampling point
- the first temperature sensing circuit detects the first temperature of the sampling point, and converts the first temperature into a first voltage according to the temperature-voltage fitting formula.
- the first temperature sensing circuit stops detecting the temperature of the sampling point
- the second temperature sensing circuit detects the second temperature of the sampling point, and converts the second temperature into a second voltage according to the temperature-voltage fitting formula; the time difference between detecting the second temperature and detecting the first temperature is within a preset time range.
- the second temperature sensing circuit does not need to work in the functional mode, and the first temperature sensing circuit does not need to work in the first test mode, which can reduce the power consumption of the detection circuit.
- the temperature voltage fitting formula is Wherein, T represents the temperature collected by the first temperature sensing circuit and the second temperature sensing circuit, VT represents the first voltage and the second voltage, V25 represents the reference voltage corresponding to the temperature of 25°C, and a represents the linear slope of the temperature-voltage fitting formula.
- T represents the temperature collected by the first temperature sensing circuit and the second temperature sensing circuit
- VT represents the first voltage and the second voltage
- V25 represents the reference voltage corresponding to the temperature of 25°C
- a represents the linear slope of the temperature-voltage fitting formula.
- the first temperature sensing circuit includes a first bandgap reference voltage generator and a first temperature sensor, and the first bandgap reference voltage generator is used to provide a reference voltage for the first temperature sensor.
- the second temperature sensing circuit includes a second bandgap reference voltage generator and a second temperature sensor, and the second bandgap reference voltage generator is used to provide a reference voltage for the second temperature sensor.
- the characteristic that "the first bandgap reference voltage generator and the second bandgap reference voltage generator are very little affected by the power supply and the preparation process parameters, and the relationship with the temperature is determined" can be utilized.
- the first bandgap reference voltage generator is used to provide a reference voltage for the first temperature sensor
- the second bandgap reference voltage generator is used to provide a reference voltage for the second temperature sensor.
- the material of the first temperature sensor is different from the material of the second temperature sensor, and/or the size of the first temperature sensor is different from the size of the second temperature sensor, that is, the first temperature sensor and the second temperature sensor are two heterogeneous bipolar junction transistors.
- the temperature difference between the first temperature and the second temperature is very small.
- the temperature difference detected by the heterogeneous first temperature sensor and the second temperature sensor is very small, which further indicates that the temperatures detected by the first temperature sensor and the second temperature sensor are relatively accurate.
- the comparison circuit is further configured to output a second comparison result when the difference between the first voltage and the second voltage is less than or equal to a preset parameter, and the second comparison result is used to indicate that both the first temperature sensing circuit and the second temperature sensing circuit are fault-free, and that the temperatures of the sampling points detected by the first temperature sensing circuit and the second temperature sensing circuit are both credible and reliable.
- the first temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds a temperature threshold range
- the temperature threshold range is the junction temperature range allowed at the sampling point.
- the second temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds the temperature threshold range. This prevents the temperature at the sampling point from exceeding the allowable junction temperature range without being detected, thereby affecting the working stability of the SoC.
- the first temperature sensing circuit and the second temperature sensing circuit can also be tested. For example, a temperature value can be directly input to the first temperature sensing circuit and the second temperature sensing circuit, and the temperature value exceeds the temperature threshold range to detect whether the first temperature sensing circuit and the second temperature sensing circuit can directly output an over-temperature alarm interrupt signal. If the first temperature sensing circuit and/or the second temperature sensing circuit do not output an over-temperature alarm, If the interrupt signal is received, the fault is reported.
- the detection circuit further includes a multiplexer, an analog-to-digital converter, and a digital conversion circuit.
- the first temperature sensing circuit and/or the second temperature sensing circuit inputs the first voltage and/or the second voltage to the analog-to-digital converter through the multiplexer.
- the analog-to-digital converter is configured to convert the first voltage into a first digital signal, and/or, convert the second voltage into a second digital signal, and send the first digital signal and/or the second digital signal to the digital conversion circuit.
- the digital conversion circuit is configured to convert the first digital signal into a first temperature code value in the form of a digital signal, and/or, convert the second digital signal into a second temperature code value in the form of a digital signal.
- the comparison circuit is configured to compare the first voltage and the second voltage, and if the difference between the first voltage and the second voltage is greater than a preset parameter, then report a first comparison result, including: a comparison circuit is configured to compare the first temperature code value and the second temperature code value, and if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter, then report the first comparison result.
- the first temperature sensing circuit and the second temperature sensing circuit work simultaneously.
- the first temperature sensing circuit can input the first voltage to the analog-to-digital converter through the multiplexer
- the second temperature sensing circuit can also input the second voltage to the analog-to-digital converter through the multiplexer.
- the analog-to-digital conversion circuit receives the first voltage and the second voltage, converts the first voltage into a first digital signal, converts the second voltage into a second digital signal, and then sends the first digital signal and the second digital signal to the digital conversion circuit.
- the digital conversion circuit receives the first digital signal and the second digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the first temperature code value and the second temperature code value to the input end of the comparison circuit.
- the comparison circuit compares the received first temperature code value and the second temperature code value, and reports a first comparison result if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter; and reports a second comparison result if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter.
- the first temperature sensing circuit and the second temperature sensing circuit work in time-sharing mode.
- the first temperature sensing circuit can input the first voltage to the analog-to-digital converter through the multiplexer.
- the analog-to-digital conversion circuit can receive the first voltage, convert the first voltage into a first digital signal, and send the first digital signal to the digital conversion circuit.
- the digital conversion circuit receives the first digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, and sends the first temperature code value to the input end of the comparison circuit.
- the second temperature sensing circuit can input the second voltage to the analog-to-digital converter through the multiplexer.
- the analog-to-digital conversion circuit can receive the second voltage, convert the second voltage into a second digital signal, and send the second digital signal to the digital conversion circuit.
- the digital conversion circuit receives the second digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the second temperature code value to the input end of the comparison circuit.
- the comparison circuit compares the received first temperature code value and the second temperature code value. If the difference between the first temperature code value and the second temperature code value is greater than the preset parameter, the first comparison result is reported; if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter, the second comparison result is reported.
- the detection circuit also includes an amplifier, which is electrically connected between the multiplexer and the analog-to-digital converter and is used to amplify the first voltage and/or the second voltage to avoid the first voltage and the second voltage being too small, the first temperature code value and the second temperature code value being too small, resulting in inaccurate comparison results of the comparison circuit.
- an amplifier which is electrically connected between the multiplexer and the analog-to-digital converter and is used to amplify the first voltage and/or the second voltage to avoid the first voltage and the second voltage being too small, the first temperature code value and the second temperature code value being too small, resulting in inaccurate comparison results of the comparison circuit.
- the detection circuit also includes a test circuit.
- the test circuit can also be used to test the multiplexer, amplifier, analog-to-digital converter, and digital conversion circuit to avoid inaccurate comparison results of the comparison circuit due to failure of the multiplexer, and/or the amplifier, and/or the analog-to-digital converter, and/or the digital conversion circuit.
- the test circuit includes a voltage divider resistor.
- the first temperature sensing circuit and the second temperature sensing circuit stop detecting the temperature of the sampling point, the test circuit inputs the test voltage to the analog-to-digital converter through the multiplexer, and the test voltage outputs the test temperature code value through the analog-to-digital converter and the digital conversion circuit.
- the comparison circuit is also configured to compare the test temperature code value with the expected temperature code value, and if the difference between the test temperature code value and the expected temperature code value is greater than a preset parameter, a third comparison result is reported; the expected temperature code value is used to indicate the ideal temperature code value corresponding to the test voltage.
- the detection circuit further includes a first register.
- the digital conversion circuit is further configured to send the first temperature code value and the second temperature code value to the first register, so as to temporarily store the first temperature code value and the second temperature code value using the first register.
- the first register is configured to output a ready signal.
- the detection circuit further includes a sampling circuit, a second register, and an alarm circuit.
- the comparison circuit is further configured to input the second comparison result to the alarm circuit.
- the alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit.
- the sampling circuit is configured to respond to the received sampling signal, receive a ready signal, and collect the first temperature code value and the second temperature code value corresponding to the second comparison result from the first register, and send the first temperature code value and the second temperature code value to the second register for storage.
- the comparison circuit is further configured to input the first comparison result to the alarm circuit.
- the alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result.
- the sampling circuit is configured to stop collecting the first temperature code value and the second temperature code value corresponding to the first comparison result from the first register in response to the received stop sampling signal.
- the sampling circuit is configured to receive a ready signal, collect multiple first temperature code values and multiple second temperature code values from the first register, calculate the average value of the multiple first temperature code values as the first average value, calculate the average value of the multiple second temperature code values as the second average value, and send the first average value and the second average value to the comparison circuit.
- the comparison circuit is configured to compare the first average value and the second average value.
- the comparison circuit is also configured to send the second comparison result to the alarm circuit.
- the alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit.
- the sampling circuit is configured to respond to the received sampling signal and send the first temperature code value and the second temperature code value corresponding to the second comparison result to the second register for storage.
- the comparison circuit is further configured to send the first comparison result to the alarm circuit.
- the alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result.
- the sampling circuit is configured to stop sending the first temperature code value and the second temperature code value corresponding to the first comparison result to the second register in response to the received stop sampling signal.
- the present application provides a vehicle-mounted terminal device, characterized in that it includes a SoC and the detection circuit described in the first aspect.
- the second aspect and any implementation of the second aspect correspond to the first aspect and any implementation of the first aspect respectively.
- the technical effects corresponding to the second aspect and any implementation of the second aspect can refer to the technical effects corresponding to the first aspect and any implementation of the first aspect, which will not be repeated here.
- the vehicle-mounted terminal device also includes a low-power microcontroller unit, a fault collection circuit, and a safety island integrated on the SoC, and an off-chip microcontroller unit integrated outside the SoC.
- a low-power microcontroller unit is used to configure the working mode of the detection circuit.
- the low-power microcontroller unit initiates a test to detect whether the first temperature sensing circuit and the second temperature sensing circuit can normally output an over-temperature alarm interrupt signal. It can configure a temperature value that exceeds the temperature threshold range for the first temperature sensing circuit and the second temperature sensing circuit to detect whether the first temperature sensing circuit and the second temperature sensing circuit can output an over-temperature alarm interrupt signal after detecting a temperature that exceeds the temperature threshold range.
- the low power micro control unit initiates the second test mode and controls the test circuit to output a test voltage to detect whether the multiplexer, and/or the analog-to-digital converter, and/or the digital conversion circuit fails.
- the low-power microcontroller unit initiates a test to detect whether the first register and the second register have faults, and configures write signals for the first register and the second register to determine whether the first register or the second register has faults based on the signals read from the first register and the second register.
- the fault collection circuit is used to collect the faults of each hardware circuit in the SoC and send the faults to the safety island or the off-chip micro-control unit.
- the hardware circuit includes the detection circuit and the sampling point of the SoC. For example, after the alarm circuit receives the first comparison result, it can also send the first comparison result to the fault collection circuit, and the fault collection circuit decides whether to ignore the first comparison result or continue to report the first comparison result to the safety island or the off-chip micro-control unit.
- the safety island and the off-chip microcontroller unit are used to receive the faults sent by the fault collection circuit and process the faults. For example, outside the polling time of the low-power microcontroller unit, if the first temperature sensing circuit and/or the second temperature sensing circuit detects that the temperature of the sampling point exceeds the allowable junction temperature, not only can the over-temperature alarm interrupt signal be sent to the low-power microcontroller unit, but also the over-temperature alarm interrupt signal can be sent to the off-chip microcontroller unit, and the off-chip microcontroller unit controls the board-level reset circuit or the power control circuit to reset or power off the SoC or the sampling point to avoid burning the SoC.
- the present application provides a control method for a detection circuit, wherein the detection circuit includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit, wherein the first temperature sensing circuit and the second temperature sensing circuit are integrated at multiple sampling points of the SoC in the car.
- the control method of the detection circuit includes: using a first temperature sensing circuit and a second temperature sensing circuit to detect the temperature of the same sampling point within a preset time. According to the temperature-voltage fitting formula, the detected temperature is converted into a first voltage by the first temperature sensing circuit, and the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage. According to the temperature-voltage fitting formula, the detected temperature is converted into a second voltage by the second temperature sensing circuit. Using a comparison circuit, the first voltage and the second voltage are compared, and if the difference between the first voltage and the second voltage is greater than a preset parameter, the first comparison result is reported.
- the third aspect and any implementation of the third aspect correspond to the first aspect and any implementation of the first aspect, respectively.
- the technical effects corresponding to the third aspect and any implementation of the third aspect can refer to the technical effects corresponding to the first aspect and any implementation of the first aspect, which will not be repeated here.
- FIG1 is a diagram showing the relationship between modules in a SoC provided in an embodiment of the present application.
- FIG2a is a diagram showing the locations of the first temperature sensing circuit and the second temperature sensing circuit provided in an embodiment of the present application;
- FIG2b is a connection diagram of various circuits in a detection circuit provided in an embodiment of the present application.
- FIG3 is a temperature voltage fitting diagram provided in an embodiment of the present application.
- FIG4a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG4b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG5a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG5b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG5c is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG6a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG6b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG6c is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application.
- FIG7a is a working timing diagram of a first register and a sampling circuit provided in an embodiment of the present application.
- FIG7b is a working timing diagram of another first register and sampling circuit provided in an embodiment of the present application.
- FIG7c is a working timing diagram of another first register and sampling circuit provided in an embodiment of the present application.
- FIG8a is a test diagram of a first register or a second register provided in an embodiment of the present application.
- FIG8b is another test diagram of the first register or the second register provided in an embodiment of the present application.
- FIG9 is a diagram showing the relationship between modules in the vehicle-mounted terminal device provided in an embodiment of the present application.
- FIG10 is a working sequence diagram of a functional mode, a first test mode, and a second test mode provided in an embodiment of the present application;
- FIG. 11 is a flow chart of a control detection circuit provided in an embodiment of the present application.
- a and/or B in this article is merely a description of the association relationship of associated objects, indicating that three relationships may exist.
- a and/or B can mean: A exists alone, A and B exist at the same time, and B exists alone.
- first and second in the description and claims of the embodiments of the present application are used to distinguish different objects rather than to describe a specific order of objects.
- a first target object and a second target object are used to distinguish different target objects rather than to describe a specific order of target objects.
- words such as “exemplary” or “for example” are used to indicate examples, illustrations or descriptions. Any embodiment or design described as “exemplary” or “for example” in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as “exemplary” or “for example” is intended to present related concepts in a specific way.
- multiple refers to two or more than two.
- multiple processing units refer to two or more processing units; multiple systems refer to two or more systems.
- the embodiment of the present application provides a vehicle-mounted terminal device, which is applied to a vehicle, and the vehicle may be a smart car, an automatic driving car, an ordinary car driven by a human, etc., and the embodiment of the present application does not limit this.
- the following takes an automatic driving car as an example for illustration.
- the International Organization for Standardization ISO
- QM quality management
- ASIL automotive safety integrity level
- the automotive safety integrity level includes four levels: ASIL A, ASIL B, ASIL C, and ASIL D. From ASIL A to ASIL D, the safety level increases successively. Only when the highest hazard combination requirements (i.e., S3+E4+C3) are met can the ASIL D level be achieved.
- SoC is the core of the mobile data center (MDC) platform. It integrates hardware circuits such as the central processing unit (CPU), embedded neural network processor (NPU), image signal processor (ISP), video encoder (VENC), and video decoder (VDEC); it is connected to various sensors, such as light detection and ranging (LIDAR), camera, radio detection and ranging (RADAR), etc.; it carries data analysis and intelligent processing of signals transmitted by these sensors, such as perception and fusion, planning and control, functional safety strategy control, etc. Therefore, ensuring that the core SoC of MDC can work stably and reliably is a basic problem that the autonomous driving system must solve.
- the SoC of MDC is directly related to personal safety. Therefore, the SoC of MDC must pass the automotive-grade safety certification of professional safety certification agencies before it can be truly installed on commercial vehicles.
- the ASIL-D safety level is a necessary condition to meet the L3, L4, and L5 autonomous driving safety level requirements.
- L3 stands for conditional autonomous driving. Under certain conditions, the autonomous driving system completes all driving operations, and the driver provides appropriate responses based on the autonomous driving system's requests.
- L4 stands for highly automated driving.
- the automated driving system can complete all driving operations, and the automated driving car can be driven on some roads without the need for a driver.
- L5 means fully automated driving, where the driver does not need to participate in driving operations at all.
- junction temperature refers to: the actual operating temperature of semiconductor devices in electronic equipment.
- the temperature detected by the sensor may be inaccurate, so that the actual temperature of the sampling point may exceed the allowable junction temperature range without being detected, resulting in the inability to ensure the working stability of the SoC, and even accidents that endanger personal safety may occur.
- the inaccurate temperature detected by the sensor due to the inaccurate temperature detected by the sensor, false alarms are triggered, affecting the user experience.
- an embodiment of the present application provides a detection circuit, which may include a first temperature sensing circuit and a second temperature sensing circuit, and is integrated in a SoC.
- the first temperature sensing circuit and the second temperature sensing circuit can be used to detect the temperature of the same sampling point to avoid at least some sampling points operating outside the allowable junction temperature range without being discovered.
- the temperatures detected by the first temperature sensing circuit and the second temperature sensing circuit can also serve as a reference to each other to avoid inaccurate measured temperatures due to damage to the first temperature sensing circuit and/or the second temperature sensing circuit.
- the detection circuit includes a first temperature sensing circuit 11, a second temperature sensing circuit 12, and a comparison circuit 13.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are integrated at multiple sampling points of the SoC in the car and are configured to detect the temperature of the same sampling point within a preset time.
- the first temperature sensing circuit 11 is further configured to convert the detected temperature into a first voltage according to a temperature-voltage fitting formula.
- the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage.
- the second temperature sensing circuit 12 is further configured to convert the detected temperature into a second voltage according to the temperature-voltage fitting formula.
- the comparison circuit 13 is configured to compare the first voltage and the second voltage, and report a first comparison result if the difference between the first voltage and the second voltage is greater than a preset parameter.
- the first comparison result is used to indicate that the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 is faulty.
- the present application can use the first temperature sensing circuit 11 and the second temperature sensing circuit 12 to detect the temperature of the sampling point to avoid the temperature of the sampling point exceeding the allowable junction temperature range without being discovered, affecting the working stability of the SoC.
- the detection circuit of the present application also includes a comparison circuit 13. Since the first temperature sensing circuit 11 and the second temperature sensing circuit 12 integrated at the same sampling point are very close in the physical layout, and the physical distance between the two is in the micron level, theoretically, the difference in the detection results of the first temperature sensing circuit 11 and the second temperature sensing circuit 12 should be very small. Therefore, the comparison circuit 13 can also be used to compare the first voltage measured by the first temperature sensing circuit 11 and the second voltage measured by the second temperature sensing circuit 12.
- the comparison circuit 13 can report the first comparison result indicating that the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 has a fault, and other components in the vehicle-mounted terminal device can handle this problem, thereby improving the accuracy of the detection circuit in detecting temperature.
- the multiple sampling points may be multiple different physical locations in the SoC.
- locations in the SoC where the SoC is in a working state and where the heat generation and temperature are relatively high may be selected as sampling points.
- the multiple sampling points may include an image processor, a central processing unit, an embedded neural network processor, a video encoder, a video decoder, and the like.
- the detection circuit can operate in a functional mode to monitor the temperature of a sampling point.
- the detection circuit can also operate in a first test mode to test whether the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 fails.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are configured to detect the temperature of the same sampling point within a preset time, which means that the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can both detect the temperature of the same sampling point, and the time difference between the first temperature sensing circuit 11 and the second temperature sensing circuit 12 measuring the temperature of the same sampling point is within a preset time range.
- the embodiment of the present application does not limit the range of the preset time, as long as the temperature of the sampling point does not change rapidly within the preset time.
- the preset time range can be 10ms to 40ms.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 both detect the temperature of the same sampling point at the same time. After the first temperature sensing circuit 11 converts the detected first temperature into a first voltage and the second temperature sensing circuit 12 converts the detected second temperature into a second voltage, the first voltage and the second voltage can be sent to the comparison circuit 13 at the same time.
- the comparison circuit 13 can compare the first voltage and the second voltage in real time each time it receives a first voltage and a second voltage.
- the comparison result when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work at the same time is more accurate.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time sharing.
- the enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 0, indicating that no enable signal is sent to the second temperature sensing circuit 12, the second temperature sensing circuit 12 is in a non-operating state, and the temperature of the sampling point is not detected.
- the enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 1, the first temperature sensing circuit 11 is in a working state, and the first temperature sensing circuit 11 can detect the temperature of the sampling point in real time, which is named the first temperature.
- the first temperature sensing circuit 11 can also convert the first temperature into a first voltage according to the temperature-voltage fitting formula.
- the enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 is 0, indicating that no enable signal is sent to the first temperature sensing circuit 11, and the first temperature sensing circuit 11 can be switched to a non-operating state and stop detecting the temperature of the sampling point.
- the enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 is 1, and the second temperature sensing circuit 12 is switched to an operating state, and the second temperature sensing circuit 12 can detect the temperature of the sampling point, which is named the second temperature.
- the second temperature sensing circuit can also convert the second temperature into a second voltage according to the temperature-voltage fitting formula.
- the second temperature sensing circuit 12 does not need to work in the functional mode, and the first temperature sensing circuit 11 does not need to work in the first test mode, which can reduce the power consumption of the detection circuit.
- the first temperature sensing circuit 11 in the function mode may be The first voltage input to the comparison circuit 13 once is compared with the second voltage input to the comparison circuit 13 for the first time by the second temperature sensing circuit 12, so as to avoid the time interval between detecting the first temperature and the second temperature exceeding the preset time, resulting in a large temperature difference at the sampling point due to the long interval time, and being mistakenly judged as a failure of the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12.
- the comparison circuit 13 may also compare multiple first voltages with multiple second voltages.
- the comparison circuit 13 may compare an average value of 16 first voltages with an average value of 16 second voltages.
- the detection circuit first works in the functional mode and then works in the first test mode when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode.
- the detection circuit may also first work in the first test mode and then work in the functional mode, which is not limited in the embodiments of the present application.
- the temperature-voltage fitting formula may be used to characterize the conversion relationship between temperature and voltage, so as to convert a first temperature into a first voltage and convert a second temperature into a second voltage.
- FIG3 shows a temperature and voltage fitting curve diagram.
- the temperature-voltage fitting formula can be obtained: Wherein, T represents the first temperature detected by the first temperature sensing circuit 11, and VT represents the first voltage; or, T represents the second temperature detected by the second temperature sensing circuit 12, and VT represents the second voltage.
- V25 represents the reference voltage corresponding to the temperature of 25°C.
- a represents the linear slope of the temperature voltage fitting formula.
- the first temperature can be converted into the first voltage and the second temperature can be converted into the second voltage according to the temperature-voltage fitting formula.
- the reference temperature is 25°C and the reference voltage corresponding to the reference temperature is V25, which is only an example.
- the reference temperature and the reference voltage can also be other, as long as the relationship between the reference temperature and the reference voltage can satisfy the ideal temperature-voltage relationship diagram shown in Figure 3.
- the above temperature-voltage fitting formula is only an example, and the temperature-voltage fitting formula can also be other, which is not limited in the embodiments of the present application.
- the embodiments of the present application do not limit the specific circuit structures of the first temperature sensing circuit 11 and the second temperature sensing circuit 12, as long as the first temperature sensing circuit 11 can convert the first temperature into the first voltage based on the temperature-voltage fitting formula, and the second temperature sensing circuit 12 can convert the second temperature into the second voltage based on the temperature-voltage fitting formula.
- the first temperature sensing circuit 11 includes a first bandgap reference voltage generator (BGR) 111 and a first temperature sensor 112, wherein the first bandgap reference voltage generator 111 is used to provide a reference voltage Vref for the first temperature sensor 112.
- the second temperature sensing circuit 12 includes a second bandgap reference voltage generator 121 and a second temperature sensor 122, wherein the second bandgap reference voltage generator 121 is used to provide a reference voltage Vref for the second temperature sensor 122.
- the characteristic that "the first bandgap reference voltage generator 111 and the second bandgap reference voltage generator 121 are very little affected by the power supply and the manufacturing process parameters, and the relationship with the temperature is determined" can be utilized.
- the first bandgap reference voltage generator 111 is used to provide a reference voltage Vref for the first temperature sensor 112
- the second bandgap reference voltage generator 121 is used to provide a reference voltage Vref for the second temperature sensor 122.
- the embodiment of the present application does not limit the specific circuit structure of the first temperature sensor 112 and the second temperature sensor 122, as long as the first temperature sensor 112 and the second temperature sensor 122 can convert the detected temperature into a voltage value according to a predetermined temperature-voltage fitting formula.
- first temperature sensor 112 and the second temperature sensor 122 may both be bipolar junction transistors.
- first temperature sensor 112 and the second temperature sensor 122 can also be different temperature sensors, which is not limited in the embodiment of the present application.
- the size and material of the first temperature sensor 112 may be the same as the size and material of the second temperature sensor 122. In other possible implementations, the size of the first temperature sensor 112 is different from the size of the second temperature sensor 122, and/or the material of the first temperature sensor 112 is different from the material of the second temperature sensor 122, that is, the first temperature sensor 112 and the second temperature sensor 122 are two heterogeneous bipolar junction transistors.
- the temperature difference between the first temperature and the second temperature is very small.
- the temperature difference detected by the heterogeneous first temperature sensor 112 and the second temperature sensor 122 is very small, which further indicates that the temperatures detected by the first temperature sensor 112 and the second temperature sensor 122 are relatively accurate.
- the size of the first temperature sensor 112 may also be the same as the size of the second temperature sensor 122 , and the material of the first temperature sensor 112 may also be the same as the material of the second temperature sensor 122 .
- the detection circuit may further include a third temperature sensing circuit 103 and a fourth temperature sensing circuit 104, and the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 are integrated with the first temperature sensing circuit 11 and the second temperature sensing circuit 12 at the same sampling point.
- the third temperature sensing circuit 103 includes a third bandgap reference voltage generator and a third temperature sensor
- the fourth temperature sensing circuit 104 includes a fourth bandgap reference voltage generator and a fourth temperature sensor.
- the size of the third temperature sensor is the same as that of the fourth temperature sensor, and the material of the third temperature sensor is the same as that of the fourth temperature sensor.
- the size of the third temperature sensor and the fourth temperature sensor is different from the size of the first temperature sensor 112 and the second temperature sensor 122, and the material of the third temperature sensor and the fourth temperature sensor is different from the material of the first temperature sensor 112 and the second temperature sensor 122. That is, the third temperature sensor and the fourth temperature sensor are heterogeneous temperature sensors with the first temperature sensor 112 and the second temperature sensor 122.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can be used for reference with the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104. If the difference between the detection results of the first temperature sensing circuit 11 and the second temperature sensing circuit 12 and the detection results of the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 is within the preset parameter range, it means that the temperatures detected by the first temperature sensor 112, the second temperature sensor 122, the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 are relatively accurate.
- the embodiments of the present application do not limit the specific values and manifestations of the preset parameters.
- the specific values of the preset parameters are related to the object compared by the comparison circuit 13, the preset time and other parameters.
- the comparison circuit 13 compares the first voltage and the second voltage, and the value of the preset parameter can be a preset voltage value.
- the comparison circuit 13 below compares the first temperature code value and the second temperature code value, and the value of the preset parameter can be a preset temperature code value. Whether the preset parameter is a preset voltage value or a preset temperature code value, it can correspond to a temperature value.
- a preset temperature code value of 6 indicates that the temperature value is 0.5°C, that is, if the difference between the first temperature and the second temperature is greater than 0.5°C, the comparison circuit 13 outputs a first comparison result.
- the temperature value corresponding to the preset parameter is 0.5°C for demonstration only.
- the temperature value corresponding to the preset parameter can be 2°C.
- a temperature threshold range may be set for the temperature of the sampling point. Once the temperature detected by the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 exceeds the temperature threshold range, the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 may directly output an over-temperature alarm interrupt signal.
- the temperature threshold range may be an allowable junction temperature range of -40°C to 95°C.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can also be tested. For example, a temperature value can be directly input to the first temperature sensing circuit 11 and the second temperature sensing circuit 12, and the temperature value exceeds the temperature threshold range to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can directly output an over-temperature alarm interrupt signal. If the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 does not output an over-temperature alarm interrupt signal, the fault is reported.
- the SoC includes multiple sampling points to be detected.
- the temperatures of the multiple sampling points can be detected simultaneously, or they can be detected in turn in a sequence. If the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 integrated at one of the sampling points fails, or the temperature of one sampling point exceeds the temperature threshold range, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 integrated at other sampling points will continue to detect.
- the comparison circuit 13 when the difference between the first voltage and the second voltage is greater than the preset parameter, the comparison circuit 13 outputs the first comparison result.
- the difference between the first voltage and the second voltage may also be less than or equal to a preset parameter.
- the comparison circuit 13 may output a second comparison result, and the second comparison result is used to indicate that both the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are fault-free, and the temperatures of the sampling points detected by the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are credible and reliable.
- the detection circuit may further include a multiplexer 14 , an analog-to-digital converter 15 , and a digital conversion circuit 16 .
- the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 may input the first voltage and/or the second voltage to the analog-to-digital converter 15 through the multiplexer 14 .
- the analog-to-digital conversion circuit 15 is configured to convert the first voltage into a first digital signal and/or convert the second voltage into a second digital signal, and send the first digital signal and/or the second digital signal to the digital conversion circuit 16 .
- the digital conversion circuit 16 is configured to convert the first digital signal into a first temperature code value in the form of a digital signal, and/or to convert the second digital signal into a second temperature code value in the form of a digital signal.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work simultaneously. No matter in the functional mode or the first test mode, the first temperature sensing circuit 11 can input the first voltage to the analog-to-digital converter 15 through the multiplexer 14, and the second temperature sensing circuit 12 can also input the second voltage to the analog-to-digital converter 15 through the multiplexer 14.
- the analog-to-digital conversion circuit 15 receives the first voltage and the second voltage, converts the first voltage into a first digital signal, converts the second voltage into a second digital signal, and then sends the first digital signal and the second digital signal to the digital conversion circuit 16 .
- the digital conversion circuit 16 receives the first digital signal and the second digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the first temperature code value and the second temperature code value to the input end of the comparison circuit 13.
- the comparison circuit 13 compares the received first temperature code value and the second temperature code value, and reports a first comparison result if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter; and reports a second comparison result if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter.
- the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode.
- the first temperature sensing circuit 11 can input the first voltage to the analog-to-digital converter 15 through the multiplexer 14.
- the analog-to-digital conversion circuit 15 can receive the first voltage, convert the first voltage into a first digital signal, and send the first digital signal to the digital conversion circuit 16.
- the digital conversion circuit 16 receives the first digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, and sends the first temperature code value to the input end of the comparison circuit 13.
- the second temperature sensing circuit 12 can input the second voltage to the analog-to-digital converter 15 through the multiplexer 14.
- the analog-to-digital conversion circuit 15 can receive the second voltage, convert the second voltage into a second digital signal, and send the second digital signal to the digital conversion circuit 16.
- the digital conversion circuit 16 receives the second digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the second temperature code value to the input end of the comparison circuit 13.
- the comparison circuit 13 compares the received first temperature code value and the second temperature code value. If the difference between the first temperature code value and the second temperature code value is greater than the preset parameter, the first comparison result is reported; if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter, the second comparison result is reported.
- the first comparison result and the second comparison result may also be embodied in the form of digital signals.
- the comparison circuit 13 outputs 0, indicating that the comparison circuit 13 outputs the first comparison result.
- the comparison circuit 13 outputs 1, indicating that the comparison circuit outputs the second comparison result.
- first comparison result and the second comparison result may also be represented by more bits and other digital signals, which is not limited in the embodiment of the present application.
- the embodiments of the present application do not limit the number of bits of the first temperature code value and the second temperature code value.
- the number of bits of the first temperature code value and the second temperature code value can be as many as possible so as to correspond to each temperature more accurately.
- the number of bits of the first temperature code value and the second temperature code value can be 16 bits, 32 bits, etc.
- the following description is based on the assumption that the number of bits of the first temperature code value and the second temperature code value is 16 bits.
- the detection circuit may further include an amplifier 17, which may be electrically connected between the multiplexer 14 and the analog-to-digital converter 15, and is used to amplify the first voltage and/or the second voltage to prevent the first voltage and the second voltage from being too small, the first temperature code value and the second temperature code value from being too small, and causing the comparison result of the comparison circuit 13 to be inaccurate. Yes.
- the multiplexer 14, amplifier 17, analog-to-digital converter 15, and digital conversion circuit 16 may also be tested to avoid inaccurate comparison results of the comparison circuit 13 due to malfunctions of the multiplexer 14, and/or the amplifier 17, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16.
- the detection circuit may further include a test circuit 18, and the detection circuit may also operate in a second test mode.
- the second test mode is used to detect whether the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 has a fault.
- the enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 is set to 0, and the enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 is set to 0, and the first temperature sensing circuit 11 and the second temperature sensing circuit 12 stop detecting the temperature of the sampling point.
- the test circuit 18 inputs a test voltage to the analog-to-digital converter 15 through the multiplexer 14, and then the test voltage outputs a test temperature code value through the analog-to-digital converter 15 and the digital conversion circuit 16.
- the comparison circuit 13 is further configured to compare the test temperature code value with the expected temperature code value, and if the difference between the test temperature code value and the expected temperature code value is greater than a preset parameter, a third comparison result is reported.
- the expected temperature code value is used to indicate an ideal temperature code value corresponding to the test voltage.
- the third comparison result is used to indicate that the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 has a fault, and the comparison circuit 13 outputs the third comparison result.
- the test circuit 18 can output multiple test voltages with different voltage values to detect whether the multiplexer 14, the analog-to-digital converter 15, and the digital conversion circuit 16 fail under different test voltage modes.
- the test voltage can be divided into at least three levels: high, medium, and low, and the specific voltage value of each level can be set according to actual conditions.
- the above-mentioned high, medium, and low test voltages can be the same as the voltage values converted by the high, medium, and third temperature according to the temperature voltage fitting formula.
- the high-range test voltage can be 80°C, which is the same voltage value converted according to the temperature-voltage fitting formula; the mid-range test voltage can be 30°C, which is the same voltage value converted according to the temperature-voltage fitting formula; the low-range test voltage can be -20°C, which is the same voltage value converted according to the temperature-voltage fitting formula.
- test circuit 18 can output multiple test voltages with different voltage values.
- the test circuit 18 can be a voltage divider resistor.
- the test circuit 18 may further include a first register 21 , a sampling circuit 22 , a second register 23 , and an alarm circuit 24 .
- the output end of the comparison circuit 13 is also electrically connected to the alarm circuit 24 .
- the digital conversion circuit 16 can send the first temperature code value and the second temperature code value to the first register 21.
- the first register 21 can send a ready signal ready to the sampling circuit 22.
- the comparison circuit sends the second comparison result to the alarm circuit 24, the alarm circuit 24 sends a sampling signal to the sampling circuit.
- the sampling circuit 22 can receive the ready signal ready, and collect the first temperature code value and the second temperature code value from the first register 21, and send the collected first temperature code value and the second temperature code value to the second register 23 for storage, so as to facilitate subsequent fault analysis and location, as well as responsibility definition and problem tracing after a traffic accident occurs.
- the comparison circuit 13 inputs the first comparison result to the alarm circuit 24, it means that the first temperature code value and the second temperature code value corresponding to the first comparison result are temporarily unreliable and do not need to be stored in the second register 23. Therefore, after receiving the first comparison result, the alarm circuit 24 sends a stop sampling signal to the sampling circuit 22.
- the sampling circuit 22 receives the stop sampling signal and does not collect the first temperature code value and the second temperature code value corresponding to the first comparison result from the first register 21.
- the digital conversion circuit 16 sends the converted first temperature code value to the first register 21.
- the first register 21 can send a ready signal ready to the sampling circuit 22.
- the sampling circuit 22 can collect the first temperature code value.
- the digital conversion circuit 16 sends the converted second temperature code value to the first register 21.
- the first register 21 may send a ready signal ready to the sampling circuit 22.
- the sampling circuit 22 may collect the second temperature code value.
- the comparison circuit 13 compares a first temperature code value with a second temperature code value
- the sampling circuit 22 can send a first temperature code value and a second temperature code value to the comparison circuit 13, and the comparison circuit 13 compares the first temperature code value with the second temperature code value. If the comparison circuit 13 outputs a first comparison result, the comparison circuit 13 can compare the first temperature code value with the second temperature code value. The result is sent to the alarm circuit 24.
- the sampling circuit 22 may also first calculate the average value of the plurality of first temperature code values to obtain a first average value, calculate the average value of the plurality of second temperature code values to obtain a second average value, and then send the first average value and the second average value to the comparison circuit 13, and the comparison circuit 13 compares the first average value with the second average value. If the comparison circuit 13 outputs a first comparison result, the comparison circuit 13 may send the first comparison result to the alarm circuit 24.
- the comparison circuit 13 compares the first average value with the second average value, which can avoid that some first temperature code values or second temperature code values have glitches, resulting in an error in the comparison of the comparison circuit 13, and then causing the alarm circuit 24 to report incorrectly.
- the comparison circuit 13 inputs the first comparison result to the alarm circuit 24, it means that the first temperature code value and the second temperature code value corresponding to the first comparison result are temporarily unreliable and do not need to be stored in the second register 23. Therefore, after receiving the first comparison result, the alarm circuit 24 sends a stop sampling signal to the sampling circuit 22.
- the sampling circuit 22 receives the stop sampling signal and no longer sends the first temperature code value and the second temperature code value corresponding to the first comparison result to the second register 23.
- the alarm circuit 24 sends a sampling signal to the sampling circuit 22.
- the sampling circuit 22 receives the sampling signal and sends the first temperature code value and the second temperature code value corresponding to the second comparison result to the second register 23 for storage, so as to facilitate subsequent fault analysis and location, as well as responsibility definition and problem tracing after a traffic accident occurs.
- connection relationship and the working process of the first register 21, the sampling circuit 22, the second register 23, the alarm circuit 24 and the comparison circuit 13 when the first temperature code value is compared with the second temperature code value exemplarily illustrates the connection relationship and the working process of the first register 21, the sampling circuit 22, the second register 23, the alarm circuit 24 and the comparison circuit 13 when the first temperature code value is compared with the second temperature code value.
- the connection relationship and the working process shown in Figures 6a and 6b can also be used, which will not be repeated here.
- the comparison circuit 13 can compare 16 16-bit first temperature code values with 16 16-bit second temperature code values.
- the number of first temperature code values and second temperature code values compared by the comparison circuit 13 can also be other, and the embodiment of the present application does not limit this.
- FIG7a shows a timing diagram of the operation of each circuit in the detection circuit when the first temperature sensing circuit 11 is working.
- the first temperature sensing circuit 11 detects the first temperature of the sampling point and converts the first temperature into a first voltage. After a series of conversions, the first voltage is stored in the first register 21 as a first temperature code value.
- reg1 ⁇ reg16 can represent 16 first temperature code values. Each time the first register 21 receives a first temperature code value, it sends a ready signal ready to the sampling circuit 22.
- sampling circuit 22 Each time the sampling circuit 22 receives a ready signal ready, it can collect a first temperature code value from the first register 21 until the sampling circuit 22 collects 1 to 16 first temperature code values from the first register 21. While the sampling circuit 22 receives the 17th ready signal ready sent by the first register 21, it can also calculate the first average value reg17 of the 1st to 16th first temperature code values.
- FIG7b shows a timing diagram of the operation of each circuit in the detection circuit when the first temperature sensing circuit 12 is working.
- the second temperature sensing circuit 12 detects the second temperature of the sampling point and converts the second temperature into a second voltage. After a series of conversions, the second voltage is stored in the first register 21 as a second temperature code value.
- reg1 ⁇ reg16 can represent 16 second temperature code values. Each time the first register 21 receives a second temperature code value, it sends a ready signal ready to the sampling circuit 22.
- sampling circuit 22 Each time the sampling circuit 22 receives a ready signal ready, it can collect a second temperature code value from the first register 21 until the sampling circuit 22 collects 1 to 16 second temperature code values from the first register 21. While the sampling circuit 22 receives the 17th ready signal ready sent by the first register 21, it can also calculate the second average value reg17 of the 1st to 16th second temperature code values.
- the detection circuit may further include a counter to detect whether the first register 21 can output a ready signal ready on time.
- a specified counting time such as 25 microseconds, may be configured for the first register 21, and the countdown function of the counter may be started. If the first register 21 should input a ready signal ready to the sampling circuit 22 when the counter is 0, the first register 21 may output a ready signal ready on time.
- the first register 21 has not input a ready signal ready to the sampling circuit 22 when the counter is 0, the first register 21, and/or the digital conversion circuit 16, and/or the analog-to-digital converter 15, and/or the multiplexer 14, and/or the first temperature sensing circuit 11, and/or the second temperature sensing circuit 12, and/or the internal logic of the first register 21 may be faulty, and the fault may be reported.
- the first register 21 and the second register 23 may also be tested to detect whether the signals read out are consistent with the signals written therein.
- 0000 can be directly written to the first register 21 or the second register 23, and then the signal in the first register 21 or the second register 23 can be read.
- the first register 21 or the second register 23 can work normally; as shown in FIG8b, if the signal read from the first register 21 or the second register 23 is inconsistent with 0000, for example, the read signal is 0001, the first register 21 or the second register 23 may have a fault, and the fault should be reported.
- the vehicle-mounted terminal device may further include a low power microcontroller unit (LP MCU), a esception management unit (EMU), and a safety island.
- LP MCU low power microcontroller unit
- EMU esception management unit
- safety island may also be integrated on the SoC.
- the vehicle-mounted terminal device may further include an off-chip microcontroller unit (MCU) integrated outside the SoC.
- MCU off-chip microcontroller unit
- the MCU is used to monitor the working status of each core chip (such as SoC) in the vehicle-mounted terminal device.
- the LP MCU can be an automotive-grade microcontroller unit (for example, ARM's R52 core).
- the LP MCU can run low-power firmware, SoC temperature detection software, etc., switch between various working modes, and read the first temperature code value or the second temperature code value of the sampling point detected in real time by the second register 23 by configuring test parameters and timed polling.
- the LP MCU initiates a test to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can normally output an over-temperature alarm interrupt signal. It can configure a temperature value that exceeds the temperature threshold range for the first temperature sensing circuit 11 and the second temperature sensing circuit 12 to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can output an over-temperature alarm interrupt signal after detecting a temperature that exceeds the temperature threshold range.
- the LP MCU initiates a second test mode and controls the test circuit to output a test voltage to detect whether the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 fails.
- the LP MCU initiates a test to detect whether the first register 21 and the second register 23 have a fault, and configures a write signal for the first register 21 and the second register 23 to determine whether the first register 21 or the second register 23 has a fault based on the signals read from the first register 21 and the second register 23.
- the LP MCU may actively poll the temperature of the sampling point detected by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 at intervals.
- the temperature obtained by the LP MCU through active polling may be the average temperature of the sampling point over a period of time, and the temperature threshold range for detecting the average temperature may be the first temperature threshold range.
- the LP MCU may also receive the temperature of the sampling point sent by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 outside the polling time.
- the first temperature sensing circuit 11 or the second temperature sensing circuit 12 actively sends the temperature of the sampling point to the LP MCU, indicating that the temperature of the sampling point suddenly rises at a certain moment and exceeds the allowable junction temperature.
- the temperature threshold range for detecting that the first temperature sensing circuit 11 or the second temperature sensing circuit 12 actively sends the temperature to the LP MCU may be the second temperature threshold range.
- the second temperature threshold range may be greater than the first temperature threshold range.
- the first temperature threshold range is 90°C
- the second temperature threshold range may be 105°C.
- the embodiments of the present application do not limit the rule for the LP MCU to actively poll the temperature of the sampling point from the first temperature sensing circuit 11 or the second temperature sensing circuit 12, as long as the functional mode is not executed when the first test mode and the second test mode are executed. This prevents the temperature detected by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 in the functional mode from affecting the detection results of the first test mode and the second test mode, causing the comparison result output by the comparison circuit 13 to be unreliable.
- the functional mode should be executed in a time-sharing manner with the first test mode and the second test mode.
- the functional mode, the first test mode, and the second test mode can be executed in sequence.
- the order can also be other, and the embodiments of the present application are not limited to this.
- the time interval can be set according to the fault tolerant time interval (FTTI).
- FTTI fault tolerant time interval
- the time interval can be 30ms.
- the detection circuit when the SoC is powered on, except for the first test mode and the second test mode, can execute the functional mode in real time or at certain periodic intervals, which is not limited in the embodiments of the present application.
- the LP MCU can initiate a predetermined thermal protection measure after receiving an over-temperature alarm interrupt signal during the polling process. For example, if the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 detects that the temperature of the sampling point exceeds 95°C, dynamic voltage and frequency scaling (DVFS) can be called to adjust the frequency and voltage of the sampling point.
- DVFS dynamic voltage and frequency scaling
- the LP MCU can also send the over-temperature warning interrupt signal received during the polling process to the safety island or the off-chip MCU, which will call the dynamic voltage and frequency adjustment.
- EMU can be a hardware circuit used for fault management in SoC, which can gather fault problems of all hardware circuits in SoC, including fault problems of sampling points, first temperature sensing circuit 11, second temperature sensing circuit 12, multiplexer 14, analog-to-digital converter 15, digital conversion circuit 16, amplifier 17, first register 21, second register 23, etc., and can also collect the above-mentioned over-temperature alarm interrupt signal.
- EMU can report the faults of each hardware circuit and the over-temperature alarm interrupt signal to the safety island or the off-chip MCU. For example, after the alarm circuit 24 receives the first comparison result, it can also send the first comparison result to EMU, and EMU decides to ignore the first comparison result or continue to report the first comparison result to the safety island or the off-chip MCU.
- the EMU can ignore the first comparison result and no longer report the first comparison result to the safety island or the off-chip MCU. If the alarm circuit 24 sends multiple second comparison results to the EMU continuously, the EMU continues to report the first comparison result to the safety island or the off-chip MCU, and the safety island or the off-chip MCU handles the fault.
- the safety island is a microcontroller unit on the SoC chip for monitoring personal safety. It can monitor key sampling points such as the CPU and NPU on the SoC, and has clock, power supply and reset logic independent of other sampling points of the SoC.
- On its processor a set of fault management software is running, which is specifically used to receive and process various software and hardware faults and functional failures related to personal safety, as well as over-temperature alarm interrupt signals.
- the off-chip MCU the off-chip automotive-grade MCU is used to monitor the working status of each core chip (such as SoC) in the vehicle-mounted terminal device. Once a fatal fault is detected in the core chip, the off-chip MCU can take over the vehicle control task in a short time, such as controlling the vehicle to pull over urgently. For example, outside the polling time of the LP MCU, if the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 detects that the temperature of the sampling point exceeds the allowable junction temperature, not only can the over-temperature alarm interrupt signal be sent to the LP MCU, but also the over-temperature alarm interrupt signal can be sent to the off-chip MCU.
- the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 detects that the temperature of the sampling point exceeds the allowable junction temperature, not only can the over-temperature alarm interrupt signal be sent to the LP MCU, but also the over-temperature alarm interrupt signal can be sent to the off-chip MCU.
- an embodiment of the present application provides a control method for a detection circuit, the detection circuit includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit, the first temperature sensing circuit and the second temperature sensing circuit are integrated at multiple sampling points of the SoC in the car. As shown in Figure 11, the control method includes the following steps:
- step S120 and step S130 may be performed simultaneously, that is, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 of the aforementioned embodiment operate simultaneously.
- step S120 when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode, step S120 may be performed first and then step S130; or, step S130 may be performed first and then step S120.
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Abstract
一种检测电路,包括第一温感电路(11)、第二温感电路(12)以及比较电路(13)。第一温感电路(11)和第二温感电路(12)集成于汽车中SoC的多个采样点上,配置为在预设时间内检测同一采样点的温度。第一温感电路(11)还配置为根据温度电压拟合公式,将检测到的温度转换为第一电压。第二温感电路(12)还配置为根据温度电压拟合公式,将检测到的温度转换为第二电压,温度电压拟合公式用于表征温度与电压的转换关系。比较电路(13)配置为比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果。还公开了检测电路的控制方法、车载终端设备,涉及汽车技术领域,可检测采样点的温度及用于测温的第一温感电路(11)和第二温感电路(12)是否出现故障,以提高检测电路的准确性。
Description
本申请要求于2022年9月27日提交中国专利局、申请号为202211179615.6、申请名称为“检测电路及其控制方法、车载终端设备”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。
本申请涉及汽车技术领域,尤其涉及一种检测电路及其控制方法、车载终端设备。
***级芯片(system on chip,SoC)作为车辆***的核心,其内部集成了中央处理器(central processing unit,CPU)、嵌入式神经网络处理器(neural-network processing unit,NPU)、图像处理器(image signal processor,ISP)、视频编码(video encoding,VENC)、视频解码(video decode,VDEC)等硬件,工作负载较重,使得SoC工作的环境温度变化大。
而若要使SoC正常工作,必须保证SoC工作在允许的结温范围内,否则SoC的工作稳定性是无法保证的,因此需要提供一套完整的解决方案,在驾驶过程中,能够实时、准确、安全、可靠地检测SoC的实时工作温度。
发明内容
为了解决上述技术问题,本申请提供一种检测电路及其控制方法、车载终端设备,不但可以检测采样点的温度,还可以检测用于测温的第一温感电路和第二温感电路是否出现故障,以提高检测电路的准确性。
第一方面,本申请提供一种存储器,该存储器包括第一温感电路、第二温感电路、以及比较电路。第一温感电路和第二温感电路集成于汽车中SoC的多个采样点上,配置为在预设时间内检测同一采样点的温度。第一温感电路还配置为根据温度电压拟合公式,将检测到的温度转换为第一电压。第二温感电路还配置为根据温度电压拟合公式,将检测到的温度转换为第二电压,温度电压拟合公式用于表征温度与电压的转换关系。比较电路配置为比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果。
多个采样点可以是SoC中多个不同的物理位置。可选的,可以选择SoC处于工作状态下,SoC中发热量较大、温度较高的位置作为采样点。例如,多个采样点可以包括图像处理器、中央处理器、嵌入式神经网络处理器、视频编码器、视频解码器等。
本申请可以利用第一温感电路和第二温感电路对采样点的温度进行检测,避免采样点的温度超出允许的结温范围而未被发现,影响SoC的工作稳定性。在此基础上,本申请的检测电路还包括比较电路,由于在物理版图上,集成在同一采样点上的第一温感电路和第二温感电路位置非常近,二者的物理距离为微米级,所以理论上第一温感电路和第二温感电路的检测结果的差异应非常小。因此,还可以利用比较电路对第一温感电路测得的第一电压和第二温感电路测得的第二电压进行比较,若第一电压与第二电压的差异大于预设参数,则可能是第一温感电路和/或第二温感电路出现故障,导致第一温感电路和/或第二温感电路的检测结果不准确。此情况下,比较电路可以将用于指示第一温感电路和/或第二温感电路出现故障的第一比较结果上报,由车载终端设备中的其他器件对这一问题进行处理,从而提高检测电路检测温度的准确性。
在一些可能实现的方式中,无论是在功能模式下,还是在第一测试模式下,第一温感电路和第二温感电路同时检测同一采样点的温度。比较电路,配置为对接收到的第一电压和第二电压进行实时比较。
相较于第一温感电路与第二温感电路分时工作,因第一温感电路和第二温感电路同时工作时,第
一温感电路与第二温感电路没有测温时间差,因此,第一温感电路和第二温感电路同时工作时的比较结果更加准确。
在一些可能实现的方式中,第一温感电路和第二温感电路分时检测同一采样点的温度。在功能模式下,第二温感电路未检测采样点的温度,第一温感电路检测采样点的第一温度,并根据温度电压拟合公式,将第一温度转换为第一电压。在第一测试模式下,第一温感电路停止检测采样点的温度,第二温感电路检测采样点的第二温度,并根据温度电压拟合公式,将第二温度转换为第二电压;检测第二温度和检测第一温度的时差在预设时间范围内。
相较于第一温感电路与第二温感电路同时工作,因第一温感电路与第二温感电路分时工作时,功能模式下第二温感电路无需工作,第一测试模式下第一温感电路无需工作,可以降低检测电路的功耗。
在一些可能实现的方式中,温度电压拟合公式为其中,T表示第一温感电路和第二温感电路采集到的温度,VT为第一电压和第二电压,V25表示温度为25℃时对应的参考电压,a表示温度电压拟合公式的线性斜率。这样一来,在已知参考温度为25℃,以及参考温度对应的参考电压V25的情况下,即可根据温度电压拟合公式,将第一温度转换为第一电压,将第二温度转换为第二电压。
在一些可能实现的方式中,第一温感电路包括第一带隙基准电压发生器和第一温度传感器,第一带隙基准电压发生器用于为第一温度传感器提供参考电压。第二温感电路包括第二带隙基准电压发生器和第二温度传感器,第二带隙基准电压发生器用于为第二温度传感器提供参考电压。
可以利用“第一带隙基准电压发生器和第二带隙基准电压发生器受电源和制备工艺参数的影响非常小,且与温度的关系是确定的”这一特性,利用第一带隙基准电压发生器为第一温度传感器提供参考电压,利用第二带隙基准电压发生器为第二温度传感器提供参考电压。
以第一温度传感器和第二温度传感器均为双极结晶体管为例,第一温度传感器的材料与第二温度传感器的材料不同,和/或,第一温度传感器的尺寸与第二温度传感器的尺寸不同,即,第一温度传感器与第二温度传感器为两个异构的双极结晶体管。
通过比较电路比较,若异构的第一温度传感器转换的第一电压与第二温度传感器转换的第二电压的差值在预设参数范围内,则第一温度与第二温度的温差非常小。而异构的第一温度传感器与第二温度传感器检测得到的温差非常小,更加说明第一温度传感器和第二温度传感器检测的温度均比较准确。
在一些可能实现的方式中,比较电路,还配置为在第一电压与第二电压的差值小于或等于预设参数时,输出第二比较结果,第二比较结果用于指示第一温感电路和第二温感电路均无故障,第一温感电路和第二温感电路检测到的采样点的温度均为可信、可靠的。
在一些可能实现的方式中,第一温感电路,还配置为在检测到的温度超出温度阈值范围时,输出温度告警中断信号,温度阈值范围为采样点允许的结温范围。第二温感电路,还配置为在检测到的温度超出温度阈值范围时,输出温度告警中断信号。从而避免采样点的温度超出允许的结温范围而未被发现,影响SoC的工作稳定性。
进一步的,为了检测第一温感电路和第二温感电路是否可以在检测到超出温度阈值范围的温度后,输出超温告警中断信号,还可以对第一温感电路和第二温感电路进行测试。例如,可以直接向第一温感电路和第二温感电路输入一个温度值,且该温度值超出温度阈值范围,以检测第一温感电路和第二温感电路是否可以直接输出超温告警中断信号。若第一温感电路和/或第二温感电路未输出超温告警
中断信号,则上报该故障。
在一些可能实现的方式中,检测电路还包括多路选通器、模数转换器、数字转换电路。第一温感电路和/或第二温感电路通过多路选通器将第一电压和/或第二电压输入至模数转换器。模数转换器,配置为将第一电压转换为第一数字信号,和/或,将第二电压转换为第二数字信号,并将第一数字信号和/或第二数字信号发送至数字转换电路。数字转换电路,配置为将第一数字信号转换为数字信号形式的第一温度码值,和/或,将第二数字信号转换为数字信号形式的第二温度码值。比较电路,配置为比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果,包括:比较电路,配置为比较第一温度码值和第二温度码值,若第一温度码值与第二温度码值的差值大于预设参数,则上报第一比较结果。
例如,第一温感电路和第二温感电路同时工作,则无论在功能模式下,还是第一测试模式下,第一温感电路可以通过多路选通器将第一电压输入至模数转换器,第二温感电路也可以通过多路选通器将第二电压输入至模数转换器。
接着,模数转换电路接收第一电压和第二电压,并将第一电压转换为第一数字信号,将第二电压转换为第二数字信号,之后将第一数字信号和第二数字信号发送至数字转换电路。
接着,数字转换电路接收第一数字信号和第二数字信号,将第一数字信号转换为数字信号形式的第一温度码值,将第二数字信号转换为数字信号形式的第二温度码值,并将第一温度码值和第二温度码值发送至比较电路的输入端。比较电路对接收到的第一温度码值和第二温度码值进行比较,若第一温度码值与第二温度码值的差值大于预设参数,则上报第一比较结果;若第一温度码值与第二温度码值的差值小于或等于预设参数,则上报第二比较结果。
又例如,第一温感电路和第二温感电路分时工作,则在功能模式下,第一温感电路可以通过多路选通器将第一电压输入至模数转换器。模数转换电路可以接收第一电压,将第一电压转换为第一数字信号,并将第一数字信号发送至数字转换电路。数字转换电路接收第一数字信号,将第一数字信号转换为数字信号形式的第一温度码值,并将第一温度码值发送至比较电路的输入端。
接着,在第一测试模式下,第二温感电路可以通过多路选通器将第二电压输入至模数转换器。模数转换电路可以接收第二电压,将第二电压转换为第二数字信号,并将第二数字信号发送至数字转换电路。在第一测试模式下,数字转换电路接收第二数字信号,将第二数字信号转换为数字信号形式的第二温度码值,并将第二温度码值发送至比较电路的输入端。
接着,比较电路对接收到的第一温度码值和第二温度码值进行比较,若第一温度码值与第二温度码值的差值大于预设参数,则上报第一比较结果;若第一温度码值与第二温度码值的差值小于或等于预设参数,则上报第二比较结果。
在一些可能实现的方式中,检测电路还包括放大器,放大器电连接于多路选通器与模数转换器之间,用于对第一电压和/或第二电压进行放大,以避免第一电压和第二电压过于微小,第一温度码值和第二温度码值过于微小,导致比较电路的比较结果不准确。
在一些可能实现的方式中,检测电路还包括测试电路。还可以利用测试电路对多路选通器、放大器、模数转换器、以及数字转换电路进行测试,避免因多路选通器,和/或,放大器,和/或,模数转换器,和/或,数字转换电路出现故障,导致比较电路的比较结果不准确。例如,测试电路包括分压电阻。
具体的,在第二测试模式下,第一温感电路和第二温感电路停止检测采样点的温度,测试电路通过多路选通器向模数转换器输入测试电压,测试电压经过模数转换器和数字转换电路输出测试温度码值。比较电路,还配置为对测试温度码值与期望温度码值进行比较,若测试温度码值与期望温度码值的差值大于预设参数,则上报第三比较结果;期望温度码值用于指示与测试电压对应的理想温度码值。
在一些可能实现的方式中,检测电路还包括第一寄存器。数字转换电路,还配置为将第一温度码值和第二温度码值发送至第一寄存器中,以利用第一寄存器暂时存储第一温度码值和第二温度码值。第一寄存器,配置为输出就绪信号。
在一些可能实现的方式中,检测电路还包括采样电路、第二寄存器、以及告警电路。
在第一温感电路和第二温感电路同时检测同一采样点的温度的情况下,比较电路,还配置为向告警电路输入第二比较结果。告警电路,配置为响应于接收的第二比较结果,并向采样电路发送采样信号。采样电路,配置为响应于接收的接收采样信号,接收就绪信号,并从第一寄存器中采集与第二比较结果对应的第一温度码值和第二温度码值,将第一温度码值和第二温度码值发送至第二寄存器中存储。
或者,在第一温感电路和第二温感电路同时检测同一采样点的温度的情况下,比较电路,还配置为向告警电路输入第一比较结果。告警电路,配置为响应于接收的第一比较结果,向采样电路发送停止采样信号。采样电路,配置为响应于接收的停止采样信号,停止从第一寄存器采集与第一比较结果对应的第一温度码值和第二温度码值。
或者,在第一温感电路和第二温感电路分时检测同一采样点的温度的情况下,采样电路,配置为接收就绪信号,并从第一寄存器中采集多个第一温度码值和多个第二温度码值,计算多个第一温度码值的平均值为第一平均值,计算多个第二温度码值的平均值为第二平均值,将第一平均值和第二平均值发送至比较电路。比较电路,配置为比较第一平均值和第二平均值。比较电路,还配置为向告警电路发送第二比较结果。告警电路,配置为响应于接收的第二比较结果,并向采样电路发送采样信号。采样电路,配置为响应于接收的接收采样信号,将与第二比较结果对应的第一温度码值和第二温度码值发送至第二寄存器中存储。
或者,在第一温感电路和第二温感电路分时检测同一采样点的温度的情况下,比较电路,还配置为向告警电路发送第一比较结果。告警电路,配置为响应于接收的第一比较结果,向采样电路发送停止采样信号。采样电路,配置为响应于接收的停止采样信号,停止向第二寄存器发送与第一比较结果对应的第一温度码值和第二温度码值。
第二方面,本申请提供一种车载终端设备,其特征在于,包括SoC和第一方面所述的检测电路。
第二方面以及第二方面的任意一种实现方式分别与第一方面以及第一方面的任意一种实现方式相对应。第二方面以及第二方面的任意一种实现方式所对应的技术效果可参见上述第一方面以及第一方面的任意一种实现方式所对应的技术效果,此处不再赘述。
在一些可能实现的方式中,车载终端设备还包括集成在SoC上的低功耗微控制单元、故障收集电路、安全岛,以及集成于SoC外的片外微控制单元。
低功耗微控制单元,用于配置所述检测电路的工作模式。
例如,低功耗微控制单元发起检测第一温感电路和第二温感电路是否能正常输出超温告警中断信号的测试,其可以为第一温感电路和第二温感电路配置一个超出温度阈值范围的温度值,以检测第一温感电路和第二温感电路是否可以在检测到超出温度阈值范围的温度后,输出超温告警中断信号。
又例如,低功耗微控制单元发起第二测试模式,并控制测试电路输出测试电压,以检测多路选通器,和/或,模数转换器,和/或,数字转换电路是否出现故障。
又例如,低功耗微控制单元发起检测第一寄存器和第二寄存器是否存在故障的测试,为第一寄存器和第二寄存器配置写入信号,以根据第一寄存器和第二寄存器读出的信号,确定第一寄存器或第二寄存器是否存在故障。
故障收集电路,用于收集SoC中的各个硬件电路的故障,并将故障发送至安全岛或片外微控制单元,硬件电路包括所述检测电路以及所述SoC的采样点。例如,告警电路接收到第一比较结果后,还可以将第一比较结果发送至故障收集电路,由故障收集电路决定忽略该第一比较结果,或是继续上报该第一比较结果至安全岛或片外微控制单元。
安全岛和片外微控制单元,用于接收故障收集电路发送的故障,并对故障进行处理。例如,在低功耗微控制单元的轮询时间外,若第一温感电路和/或第二温感电路检测到采样点的温度超出允许的结温,不但可以将超温告警中断信号发送至低功耗微控制单元,还可以超温告警中断信号发送至片外微控制单元,由片外微控制单元控制板级复位电路或电源控制电路,对SoC或者该采样点进行复位或下电,避免烧坏SoC。
第三方面,本申请提供一种检测电路的控制方法,该检测电路包括第一温感电路、第二温感电路、
以及比较电路,所述第一温感电路和所述第二温感电路集成于汽车中SoC的多个采样点上。
检测电路的控制方法包括:利用第一温感电路和第二温感电路在预设时间内检测同一采样点的温度。根据温度电压拟合公式,通过第一温感电路将检测到的温度转换为第一电压,温度电压拟合公式用于表征温度与电压的转换关系。根据温度电压拟合公式,通过第二温感电路将检测到的温度转换为第二电压。利用比较电路,比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果。
第三方面以及第三方面的任意一种实现方式分别与第一方面以及第一方面的任意一种实现方式相对应。第三方面以及第三方面的任意一种实现方式所对应的技术效果可参见上述第一方面以及第一方面的任意一种实现方式所对应的技术效果,此处不再赘述。
图1为本申请实施例提供的SoC中各模块的关系图;
图2a为本申请实施例提供的第一温感电路和第二温感电路的设置位置图;
图2b为本申请实施例提供的一种检测电路中各电路的连接关系图;
图3为本申请实施例提供的温度电压拟合图;
图4a为本申请实施例提供的另一种检测电路中各电路的连接关系图;
图4b为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图5a为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图5b为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图5c为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图6a为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图6b为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图6c为本申请实施例提供的又一种检测电路中各电路的连接关系图;
图7a为本申请实施例提供的一种第一寄存器和采样电路的工作时序图;
图7b为本申请实施例提供的另一种第一寄存器和采样电路的工作时序图;
图7c为本申请实施例提供的又一种第一寄存器和采样电路的工作时序图;
图8a为本申请实施例提供的一种第一寄存器或第二寄存器的测试图;
图8b为本申请实施例提供的另一种第一寄存器或第二寄存器的测试图;
图9为本申请实施例提供的车载终端设备中各模块的关系图;
图10为本申请实施例提供的功能模式、第一测试模式、以及第二测试模式的工作顺序图;
图11为本申请实施例提供的控制检测电路的流程示意图。
附图标记:
11-第一温感电路;12-第二温感电路;13-第三温感电路;14-第四温感电路;15-模数转换器;16-
数字转换电路;17-放大器;18-测试电路;21-第一寄存器;22-采样电路;23-第二寄存器;24-告警电路。
11-第一温感电路;12-第二温感电路;13-第三温感电路;14-第四温感电路;15-模数转换器;16-
数字转换电路;17-放大器;18-测试电路;21-第一寄存器;22-采样电路;23-第二寄存器;24-告警电路。
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。
本文中术语“和/或”,仅仅是一种描述关联对象的关联关系,表示可以存在三种关系,例如,A和/或B,可以表示:单独存在A,同时存在A和B,单独存在B这三种情况。
本申请实施例的说明书和权利要求书中的术语“第一”和“第二”等是用于区别不同的对象,而不是用于描述对象的特定顺序。例如,第一目标对象和第二目标对象等是用于区别不同的目标对象,而不是用于描述目标对象的特定顺序。
在本申请实施例中,“示例性的”或者“例如”等词用于表示作例子、例证或说明。本申请实施例中被描述为“示例性的”或者“例如”的任何实施例或设计方案不应被解释为比其它实施例或设计方案更优选或更具优势。确切而言,使用“示例性的”或者“例如”等词旨在以具体方式呈现相关概念。
在本申请实施例的描述中,除非另有说明,“多个”的含义是指两个或两个以上。例如,多个处理单元是指两个或两个以上的处理单元;多个***是指两个或两个以上的***。
本申请实施例提供一种车载终端设备,应用于车辆,该车辆可以是智能汽车、自动驾驶汽车、人工驾驶的普通汽车等,本申请实施例对此不作限定。为了方便说明,下文以自动驾驶汽车为例进行举例说明。
随着汽车智能化程度越来越高,监管要求、行业准入标准、以及消费者对汽车功能安全的要求和关注也日益增加。为了实现汽车的安全目标,国际标准化组织(international organization for standardization,ISO)将汽车行业的芯片分为质量管理(quality manager,QM)和汽车安全完整性等级(automotive safety integrity level,ASIL)。根据危害严重度S、暴露度E和可控性C三个维度的评估,汽车安全完整性等级包括ASIL A、ASIL B、ASIL C和ASIL D四个等级。从ASIL A至ASIL D,安全等级依次增高,只有达成最高危害组合要求(即,S3+E4+C3)时,才能达到ASIL D等级。
如图1所示,在自动驾驶领域,SoC作为移动数据中心(mobile data center,MDC)平台的核心,其内部集成了中央处理器(central processing unit,CPU)、嵌入式神经网络处理器(neural-network processing unit,NPU)、图像处理器(image signal processor,ISP)、视频编码器(video encoding,VENC)、视频解码器(video decode,VDEC)等硬件电路;对外连接多种传感器,例如,激光雷达(light detection and ranging,LIDAR),摄像机(Camera)、无线电检测和测距(radio detection and ranging,RADAR)等;对内承载对这些传感器传输的信号的数据解析和智能处理,例如,感知和融合、规划和控制、功能安全策略控制等。因此,保证MDC的核心SoC能够稳定可靠地工作,是自动驾驶***必须要解决的基础问题。尤其是MDC的SoC直接事关人身安全,因此,MDC的SoC必须要通过专业安全认证机构的车规级安全认证,才能真正搭载到商用车辆上。其中,ASIL-D安全等级是满足L3、L4、L5自动驾驶安全等级要求的必备条件。
L3,表示有条件自动驾驶。在一定条件下,由自动驾驶***完成所有驾驶操作,驾驶者根据自动驾驶***请求,提供合适的应答。
L4,表示高度自动驾驶。自动驾驶***可以完成所有驾驶操作,自动驾驶汽车在部分道路上行驶时,可以无需驾驶者驾驶。
L5,表示完全自动驾驶。驾驶者可以完全不参与驾驶操控。
背景技术提到,要使得SoC正常工作,必须保证SoC工作在允许的结温范围内,该允许的结温范围通常为-40℃~95℃之间。SoC包括多个不同物理位置的采样点,任意一个采样点的温度超出允许的结温范围,SoC的工作稳定性都可能无法保证,甚至可能会发生危及人身安全的事故。此处,本领域的技术人员应该知道,结温是指:电子设备中半导体器件的实际工作温度。
此外,若用于检测采样点温度的传感器发生故障,可能导致传感器检测的温度不准确,从而可能出现采样点的实际温度超出允许的结温范围,而未被检测到,导致SoC的工作稳定性都可能无法保证,甚至可能会发生危及人身安全的事故。或者,因传感器检测的温度不准确,引发虚假告警,影响用户体验。
基于上述,本申请实施例提供了一种检测电路,该检测电路可以包括第一温感电路和第二温感电路,且集成在SoC中。可以利用第一温感电路和第二温感电路检测同一采样点的温度,避免至少部分采样点工作在允许的结温范围外,而未被发现。同时,第一温感电路和第二温感电路检测到的温度还可以互为参考,避免因第一温感电路和/或第二温感电路损坏,导致测得的温度不准确。
如图2a和图2b所示,该检测电路包括第一温感电路11、第二温感电路12、以及比较电路13。第一温感电路11和第二温感电路12集成于汽车中SoC的多个采样点上,配置为在预设时间内检测同一采样点的温度。
第一温感电路11,还配置为根据温度电压拟合公式,将检测到的温度转换为第一电压。该温度电压拟合公式用于表征温度与电压的转换关系。第二温感电路12,还配置为根据温度电压拟合公式,将检测到的温度转换为第二电压。
比较电路13,配置为比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果。第一比较结果用于指示第一温感电路11和/或第二温感电路12存在故障。
本申请可以利用第一温感电路11和第二温感电路12对采样点的温度进行检测,避免采样点的温度超出允许的结温范围而未被发现,影响SoC的工作稳定性。在此基础上,本申请的检测电路还包括比较电路13,由于在物理版图上,集成在同一采样点上的第一温感电路11和第二温感电路12位置非常近,二者的物理距离为微米级,所以理论上第一温感电路11和第二温感电路12的检测结果的差异应非常小。因此,还可以利用比较电路13对第一温感电路11测得的第一电压和第二温感电路12测得的第二电压进行比较,若第一电压与第二电压的差异大于预设参数,则可能是第一温感电路11和/或第二温感电路12出现故障,导致第一温感电路11和/或第二温感电路12的检测结果不准确。此情况下,比较电路13可以将用于指示第一温感电路11和/或第二温感电路12出现故障的第一比较结果上报,由车载终端设备中的其他器件对这一问题进行处理,从而提高检测电路检测温度的准确性。
在一些可能实现的方式中,多个采样点可以是SoC中多个不同的物理位置。可选的,可以选择SoC处于工作状态下,SoC中发热量较大、温度较高的位置作为采样点。例如,如图2a所示,多个采样点可以包括图像处理器、中央处理器、嵌入式神经网络处理器、视频编码器、视频解码器等。
在一些可能实现的方式中,该检测电路可以工作在功能模式下,以监测采样点的温度。该检测电路还可以工作在第一测试模式下,以测试第一温感电路11和/或第二温感电路12是否发生故障。
在一些可能实现的方式中,第一温感电路11和第二温感电路12,配置为在预设时间内检测同一采样点的温度,是指:第一温感电路11和第二温感电路12均可检测同一采样点的温度,并且,第一温感电路11和第二温感电路12对同一采样点进行测温的时间差在预设时间范围内。本申请实施例不对预设时间的范围进行限定,只要在预设时间内,采样点的温度不会快速变化即可。例如,预设时间的范围可以是10ms~40ms。
一种情况下,无论是在功能模式下,还是在第一测试模式下,第一温感电路11和第二温感电路12均同时检测同一采样点的温度,第一温感电路11将检测到的第一温度转换为第一电压,第二温感电路12将检测到的第二温度转换为第二电压后,可以将第一电压和第二电压同时发送至比较电路13。比较电路13每接收一个第一电压和一个第二电压,即可实时对第一电压和第二电压进行比较。相较于第一温感电路11与第二温感电路12分时工作,因第一温感电路11和第二温感电路12同时工作时,第一温感电路11与第二温感电路12没有测温时间差,因此,第一温感电路11和第二温感电路12同时工作时的比较结果更加准确。
另一种情况下,第一温感电路11和第二温感电路12分时工作。在功能模式下,控制第二温感电路12工作的使能temp_en2=0,表示未向第二温感电路12发送使能信号,第二温感电路12处于非工作状态,未检测采样点的温度。控制第一温感电路11工作的使能temp_en1=1,第一温感电路11处于工作状态,第一温感电路11可以实时检测采样点的温度,该温度命名为第一温度。第一温感电路11还可以根据温度电压拟合公式,将第一温度转换为第一电压。
在第一测试模式下,控制第一温感电路11工作的使能temp_en1=0,表示未向第一温感电路11发送使能信号,第一温感电路11可以切换为非工作状态,停止检测采样点的温度。控制第二温感电路12工作的使能temp_en2=1,第二温感电路12切换为工作状态,第二温感电路12可以检测采样点的温度,该温度命名为第二温度。第二温感电路还可以根据温度电压拟合公式,将第二温度转换为第二电压。
相较于第一温感电路11与第二温感电路12同时工作,因第一温感电路11与第二温感电路12分时工作时,功能模式下第二温感电路12无需工作,第一测试模式下第一温感电路11无需工作,可以降低检测电路的功耗。
可选的,在连续的一个功能模式和一个第一测试模式,可以将功能模式下第一温感电路11最后
一次向比较电路13输入的第一电压,与第二温感电路12第一次向比较电路13输入的第二电压进行比较,以避免检测第一温度和第二温度的时间间隔超出预设时间,导致因间隔时间过长,使得采样点温差变大,被误判为第一温感电路11和/或第二温感电路12故障。
可选的,比较电路13还可以对多个第一电压和多个第二电压进行比较,例如,比较电路13可以对16个第一电压的平均值与16个第二电压的平均值进行比较。
上述示例以第一温感电路11和第二温感电路12分时工作时,检测电路先工作在功能模式,后工作在第一测试模式为例进行说明。在另一些可能实现的方式中,第一温感电路11和第二温感电路12分时工作时,检测电路还可以先工作在第一测试模式,再工作在功能模式,本申请实施例对此不作限定。
在一些可能实现的方式中,温度电压拟合公式可以用来表征温度与电压的转换关系,以将第一温度转换为第一电压,将第二温度转换为第二电压。
图3示出了一种温度与电压的拟合曲线图,拟合的实际温度电压曲线图可以看作线性的理想温度电压关系图,从而得到公式1:V25=25*a+b,公式2:VT=T*a+b。将公式1与公式2相减,可以得到温度电压拟合公式:其中,T表示第一温感电路11检测到的第一温度,VT为第一电压;或者,T表示第二温感电路12检测到的第二温度,VT为第二电压。V25表示温度为25℃时对应的参考电压。a表示所述温度电压拟合公式的线性斜率。
这样一来,在已知参考温度为25℃,以及参考温度对应的参考电压V25的情况下,即可根据温度电压拟合公式,将第一温度转换为第一电压,将第二温度转换为第二电压。
此处需要说明的是,参考温度为25℃,参考温度对应的参考电压为V25仅为示例,可选的,参考温度以及参考电压还可以是其他,只要参考温度与参考电压的关系,可以满足图3示出的理想温度电压关系图即可。上述温度电压拟合公式仅为示例,温度电压拟合公式还可以是其他,本申请实施例对此不作限定。
在一些可能实现的方式中,本申请实施例不对第一温感电路11和第二温感电路12的具体电路结构进行限定,只要第一温感电路11可以基于温度电压拟合公式,将第一温度转换为第一电压,第二温感电路12可以基于温度电压拟合公式,将第二温度转换为第二电压即可。
可选的,如图4a所示,第一温感电路11包括第一带隙基准电压发生器(bandgap reference voltage generator,BGR)111和第一温度传感器112,第一带隙基准电压发生器111用于为第一温度传感器112提供参考电压Vref。第二温感电路12包括第二带隙基准电压发生器121和第二温度传感器122,第二带隙基准电压发生器121用于为第二温度传感器122提供参考电压Vref。
可以利用“第一带隙基准电压发生器111和第二带隙基准电压发生器121受电源和制备工艺参数的影响非常小,且与温度的关系是确定的”这一特性,利用第一带隙基准电压发生器111为第一温度传感器112提供参考电压Vref,利用第二带隙基准电压发生器121为第二温度传感器122提供参考电压Vref。
本申请实施例不对第一温度传感器112和第二温度传感器122的具体电路结构进行限定,只要第一温度传感器112和第二温度传感器122可以根据既定的温度电压拟合公式,将检测到的温度转换为电压值即可。
可选的,第一温度传感器112和第二温度传感器122可以均为双极结晶体管(bipolar junction
transistor,BJT)。当然,第一温度传感器112和第二温度传感器122还可以是不同的温度传感器,本申请实施例对此不作限定。
在一些可能实现的方式中,以第一温度传感器112和第二温度传感器122均为双极结晶体管为例,第一温度传感器112的尺寸和材料可以与第二温度传感器122的尺寸和材料均相同。在另一些可能实现的方式中,第一温度传感器112的尺寸与第二温度传感器122的尺寸不同,和/或,第一温度传感器112的材料与第二温度传感器122的材料不同,即,第一温度传感器112与第二温度传感器122为两个异构的双极结晶体管。
通过比较电路13比较,若异构的第一温度传感器112转换的第一电压与第二温度传感器122转换的第二电压的差值在预设参数范围内,则第一温度与第二温度的温差非常小。而异构的第一温度传感器112与第二温度传感器122检测得到的温差非常小,更加说明第一温度传感器112和第二温度传感器122检测的温度均比较准确。
在另一些可能实现的方式中,第一温度传感器112的尺寸还可以与第二温度传感器122的尺寸相同,第一温度传感器112的材料也可以与第二温度传感器122的材料相同。
在此基础上,如图4b所示,检测电路还可以包括第三温感电路103和第四温感电路104,第三温感电路103和第四温感电路104与第一温感电路11和第二温感电路12集成在同一采样点上。并且,第三温感电路103包括第三带隙基准电压发生器和第三温度传感器,第四温感电路104包括第四带隙基准电压发生器和第四温度传感器。第三温度传感器的尺寸与第四温度传感器的尺寸相同,第三温度传感器的材料与第四温度传感器的材料相同。第三温度传感器和第四温度传感器的尺寸与第一温度传感器112和第二温度传感器122的尺寸不同,第三温度传感器和第四温度传感器的材料与第一温度传感器112和第二温度传感器122的材料不同。即,第三温度传感器和第四温度传感器与第一温度传感器112和第二温度传感器122为异构的温度传感器。
这样一来,可以利用第一温感电路11和第二温感电路12与第三温感电路103和第四温感电路104互相参考,若第一温感电路11和第二温感电路12的检测结果,与第三温感电路103和第四温感电路104的检测结果的差值在预设参数范围内,则说明第一温度传感器112、第二温度传感器122、第三温感电路103和第四温感电路104检测的温度均比较准确。
在一些可能实现的方式中,本申请实施例不对预设参数的具体数值以及体现形式进行限定,预设参数的具体数值与比较电路13比较的对象、预设时间等参数有关。例如,比较电路13对第一电压和第二电压进行比较,则预设参数的数值可以为一预设电压值。又例如,下文比较电路13对第一温度码值和第二温度码值进行比较,则预设参数的数值可以为一预设温度码值。而预设参数无论是预设电压值,还是预设温度码值,其均可以与温度值对应。例如,预设温度码值为6指示该温度值为0.5℃,即,若第一温度与第二温度的差值大于0.5℃,则比较电路13输出第一比较结果。预设参数对应的温度值为0.5℃仅为示范,可选的,预设参数对应的温度值可以为2℃。
在一些可能实现的方式中,还可以为采样点的温度设定温度阈值范围,一旦第一温感电路11和/或第二温感电路12检测到的温度超出温度阈值范围,第一温感电路11和/或第二温感电路12还可以直接输出超温告警中断信号。其中,温度阈值范围可以是允许的结温范围,范围为-40℃~95℃。
为了检测第一温感电路11和第二温感电路12是否可以在检测到超出温度阈值范围的温度后,输出超温告警中断信号,还可以对第一温感电路11和第二温感电路12进行测试。例如,可以直接向第一温感电路11和第二温感电路12输入一个温度值,且该温度值超出温度阈值范围,以检测第一温感电路11和第二温感电路12是否可以直接输出超温告警中断信号。若第一温感电路11和/或第二温感电路12未输出超温告警中断信号,则上报该故障。
在一些可能实现的方式中,SoC包括多个待检测的采样点,在检测过程中,可以同时检测多个采样点的温度,也可以按照先后顺序轮流检测。如果集成在其中一个采样点上的第一温感电路11和/或第二温感电路12出现故障,或者,一个采样点的温度超出温度阈值范围,集成在其他采样点上的第一温感电路11和第二温感电路12仍然继续检测。
前述实施例描述了第一电压与第二电压的差值大于预设参数,比较电路13输出第一比较结果的
情况。在另一些可能实现的方式中,第一电压与第二电压的差值还可以小于或等于预设参数,此情况下,比较电路13可以输出第二比较结果,第二比较结果用于指示第一温感电路11和第二温感电路12均无故障,第一温感电路11和第二温感电路12检测到的采样点的温度均为可信、可靠的。
在一些实施例中,如图5a所示,检测电路还可以包括多路选通器14、模数转换器15、以及数字转换电路16。
第一温感电路11和/或第二温感电路12可以通过多路选通器14将第一电压和/或第二电压输入至模数转换器15。
模数转换电路15,配置为将第一电压转换为第一数字信号,和/或,将第二电压转换为第二数字信号,并将第一数字信号和/或第二数字信号发送至数字转换电路16。
数字转换电路16,配置为将第一数字信号转换为数字信号形式的第一温度码值,和/或,将第二数字信号转换为数字信号形式的第二温度码值。
例如,第一温感电路11和第二温感电路12同时工作,则无论在功能模式下,还是第一测试模式下,第一温感电路11可以通过多路选通器14将第一电压输入至模数转换器15,第二温感电路12也可以通过多路选通器14将第二电压输入至模数转换器15。
接着,模数转换电路15接收第一电压和第二电压,并将第一电压转换为第一数字信号,将第二电压转换为第二数字信号,之后将第一数字信号和第二数字信号发送至数字转换电路16。
接着,数字转换电路16接收第一数字信号和第二数字信号,将第一数字信号转换为数字信号形式的第一温度码值,将第二数字信号转换为数字信号形式的第二温度码值,并将第一温度码值和第二温度码值发送至比较电路13的输入端。比较电路13对接收到的第一温度码值和第二温度码值进行比较,若第一温度码值与第二温度码值的差值大于预设参数,则上报第一比较结果;若第一温度码值与第二温度码值的差值小于或等于预设参数,则上报第二比较结果。
又例如,第一温感电路11和第二温感电路12分时工作,则在功能模式下,第一温感电路11可以通过多路选通器14将第一电压输入至模数转换器15。模数转换电路15可以接收第一电压,将第一电压转换为第一数字信号,并将第一数字信号发送至数字转换电路16。数字转换电路16接收第一数字信号,将第一数字信号转换为数字信号形式的第一温度码值,并将第一温度码值发送至比较电路13的输入端。
接着,在第一测试模式下,第二温感电路12可以通过多路选通器14将第二电压输入至模数转换器15。模数转换电路15可以接收第二电压,将第二电压转换为第二数字信号,并将第二数字信号发送至数字转换电路16。在第一测试模式下,数字转换电路16接收第二数字信号,将第二数字信号转换为数字信号形式的第二温度码值,并将第二温度码值发送至比较电路13的输入端。
接着,比较电路13对接收到的第一温度码值和第二温度码值进行比较,若第一温度码值与第二温度码值的差值大于预设参数,则上报第一比较结果;若第一温度码值与第二温度码值的差值小于或等于预设参数,则上报第二比较结果。
在一些可能实现的方式中,第一比较结果和第二比较结果的体现形式也可以是数字信号。例如,比较电路13输出0,表示比较电路13输出第一比较结果。比较电路13输出1,标识比较电路输出第二比较结果。
当然,还可以以更多位(bit)、以及其他数字信号表示第一比较结果和第二比较结果,本申请实施例对此不作限定。
在一些可能实现的方式中,本申请实施例不对第一温度码值和第二温度码值的位数进行限定,可选的,在内存允许的情况下,第一温度码值和第二温度码值的位数可以尽可能多,以便更加精确地与各个温度对应。例如,第一温度码值和第二温度码值的位数可以是16位、32位等。为了方便说明,下文以第一温度码值和第二温度码值的位数是16位进行说明。
在一些可能实现的方式中,如图5b所示,检测电路还可以包括放大器17,放大器17可以电连接于多路选通器14与模数转换器15之间,用于对第一电压和/或第二电压进行放大,以避免第一电压和第二电压过于微小,第一温度码值和第二温度码值过于微小,导致比较电路13的比较结果不准
确。
在一些实施例中,还可以对上述多路选通器14、放大器17、模数转换器15、以及数字转换电路16进行测试,避免因多路选通器14,和/或,放大器17,和/或,模数转换器15,和/或,数字转换电路16出现故障,导致比较电路13的比较结果不准确。
基于此,如图5c所示,检测电路还可以包括测试电路18,检测电路还可以工作在第二测试模式下。第二测试模式用于检测多路选通器14,和/或,模数转换器15,和/或,数字转换电路16是否出现故障。
在第二测试模式下,控制第一温感电路11工作的使能temp_en1=0,控制第二温感电路12工作的使能temp_en2=0,第一温感电路11和第二温感电路12停止检测采样点的温度。测试电路18通过多路选通器14向模数转换器15输入测试电压,接着,测试电压经过模数转换器15和数字转换电路16输出测试温度码值。
比较电路13,还配置为对测试温度码值与期望温度码值进行比较,若测试温度码值与期望温度码值的差值大于预设参数,则上报第三比较结果。期望温度码值,用于指示与测试电压对应的理想温度码值。第三比较结果,用于指示多路选通器14,和/或,模数转换器15,和/或,数字转换电路16出现故障,比较电路13输出第三比较结果。
在一些可能实现的方式中,测试电路18可以输出多个电压值不同的测试电压,以检测多路选通器14、模数转换器15、数字转换电路16在不同测试电压模式下,是否出现故障。例如,测试电压可以至少分为高、中、低三档,每一档的具体电压值可以根据实际情况设定。上述高、中、低三档测试电压,可以与高、中、第三档温度根据温度电压拟合公式转换的电压值相同。
例如,允许的结温范围时-40℃~105℃,高档测试电压可以是80℃根据温度电压拟合公式转换的电压值相同;中档测试电压可以是30℃根据温度电压拟合公式转换的电压值相同;低档测试电压可以是-20℃根据温度电压拟合公式转换的电压值相同。
本申请不对测试电路18的具体电路结构进行限定,只要测试电路18可以输出多个电压值不同的测试电压即可。可选的,测试电路18可以是分压电阻。
在一些实施例中,如图6a和图6b所示,测试电路18还可以包括第一寄存器21、采样电路22、第二寄存器23、告警电路24。比较电路13的输出端还与告警电路24电连接。
如图6a所示,在第一温感电路11和第二温感电路12同时工作的情况下,数字转换电路16可以将第一温度码值和第二温度码值发送至第一寄存器21,第一寄存器21接收第一温度码值和第二温度码值后,可以向采样电路22发送就绪信号ready。若比较电路向告警电路24发送第二比较结果,则告警电路24向采样电路发送采样信号,采样电路22可以接收到就绪信号ready,并从第一寄存器21采集第一温度码值和第二温度码值,将采集的第一温度码值和第二温度码值发送至第二寄存器23中保存,以便后续进行故障分析定位,以及发生交通事故后的责任界定和问题追溯。
若比较电路13向告警电路24输入第一比较结果,则说明与第一比较结果对应的第一温度码值和第二温度码值暂时是不可信的,无需保存在第二寄存器23中。因此,告警电路24接收到第一比较结果后,向采样电路22发送停止采样信号。采样电路22接收到停止采样信号,不从第一寄存器21采集与第一比较结果对应的第一温度码值和第二温度码值。
如图6b所示,在第一温感电路11和第二温感电路12分时工作的情况下,在功能模式下,数字转换电路16将转换的第一温度码值发送至第一寄存器21。第一寄存器21接收第一温度码值后,可以向采样电路22发送就绪信号ready。采样电路22接收到就绪信号ready后,可以采集第一温度码值。
接着,在第一测试模式下,数字转换电路16将转换的第二温度码值发送至第一寄存器21。第一寄存器21接收第二温度码值后,可以向采样电路22发送就绪信号ready。采样电路22接收到就绪信号ready后,可以采集第二温度码值。
在此基础上,若比较电路13对一个第一温度码值与一个第二温度码值进行比较,则采样电路22可以将一个第一温度码值和一个第二温度码值发送至比较电路13,由比较电路13对一个第一温度码值与一个第二温度码值进行比较,若比较电路13输出第一比较结果,则比较电路13可以将第一比较
结果发送至告警电路24。
如图6c所示,若比较电路13对多个第一温度码值与多个第二温度码值进行比较,则采样电路22还可以先计算多个第一温度码值的平均值,得到第一平均值,计算多个第二温度码值的平均值,得到第二平均值,再将第一平均值和第二平均值发送至比较电路13,由比较电路13对第一平均值与第二平均值进行比较,若比较电路13输出第一比较结果,则比较电路13可以将第一比较结果发送至告警电路24。相较于比较电路13比较一个第一温度码值与一个第二温度码值,比较电路13对第一平均值与第二平均值进行比较,可以避免部分第一温度码值或第二温度码值具有毛刺,导致比较电路13比较有误,进而导致告警电路24误上报。
接着,若比较电路13向告警电路24输入第一比较结果,则说明与第一比较结果对应的第一温度码值和第二温度码值暂时是不可信的,无需保存在第二寄存器23中。因此,告警电路24接收到第一比较结果后,向采样电路22发送停止采样信号。采样电路22接收到停止采样信号,不再将与第一比较结果对应的第一温度码值和第二温度码值发送至第二寄存器23。
若比较电路13向告警电路24输入第二比较结果,则告警电路24向采样电路22发送采样信号。采样电路22接收到采样信号,将与第二比较结果对应的第一温度码值和第二温度码值发送至第二寄存器23中保存,以便后续进行故障分析定位,以及发生交通事故后的责任界定和问题追溯。
上述描述示例性的说明了第一温度码值与第二温度码值进行比较时,第一寄存器21、采样电路22、第二寄存器23、告警电路24与比较电路13的连接关系以及工作过程。在另一些可能实现的方式中,测试温度码值与第一温度码值或第二温度码值进行比较时,也可以利用图6a和图6b示出的连接关系以及工作过程,在此不再赘述。
例如,如图7a-图7c所示,比较电路13可以对16个16位的第一温度码值与16个16位的第二温度码值进行比较。当然,比较电路13比较的第一温度码值和第二温度码值的个数还可以是其他,本申请实施例对此不作限定。
图7a示出了第一温感电路11工作时,检测电路中各电路的工作时序图。如图7a和图7c所示,在使能信号temp_en1的控制下,第一温感电路11检测采样点的第一温度,并将第一温度转换为第一电压。第一电压经过一系列转换后,以第一温度码值存储在第一寄存器21中。其中,reg1~reg16可以表示16个第一温度码值。第一寄存器21每接收到一个第一温度码值,向采样电路22发送一个就绪信号ready。采样电路22每接收到一个就绪信号ready,即可从第一寄存器21采集一个第一温度码值,直至采样电路22从第一寄存器21采集了1~16个第一温度码值,采样电路22接收第一寄存器21发送的第17个就绪信号ready的同时,还可以计算第1~16个第一温度码值的第一平均值reg17。
图7b示出了第一温感电路12工作时,检测电路中各电路的工作时序图。如图7b和图7c所示,在使能信号temp_en2的控制下,第二温感电路12检测采样点的第二温度,并将第二温度转换为第二电压。第二电压经过一系列转换后,以第二温度码值存储在第一寄存器21中。其中,reg1~reg16可以表示16个第二温度码值。第一寄存器21每接收到一个第二温度码值,向采样电路22发送一个就绪信号ready。采样电路22每接收到一个就绪信号ready,即可从第一寄存器21采集一个第二温度码值,直至采样电路22从第一寄存器21采集了1~16个第二温度码值,采样电路22接收第一寄存器21发送的第17个就绪信号ready的同时,还可以计算第1~16个第二温度码值的第二平均值reg17。
在一些可能实现的方式中,检测电路还可以包括计数器,检测第一寄存器21是否可以按时输出就绪信号ready。可以为第一寄存器21配置一个指定的计数时间,例如25微秒,并启动计数器的倒计时功能。若第一寄存器21应该在计数器为0时,向采样电路22输入就绪信号ready,则第一寄存器21可以按时输出就绪信号ready。若计数器为0时,第一寄存器21还未向采样电路22输入就绪信号ready,则第一寄存器21,和/或,数字转换电路16,和/或,模数转换器15,和/或,多路选通器14,和/或,第一温感电路11,和/或,第二温感电路12,和/或,第一寄存器21的内部逻辑可能存在故障,进而可以上报该故障。
在一些可能实现的方式中,如图8a和图8b所示,还可以对上述第一寄存器21和第二寄存器23进行测试,检测其读出的信号与写入的信号是否一致。
示例的,可以直接向第一寄存器21或第二寄存器23写入0000,之后再读取第一寄存器21或第二寄存器23中的信号。如图8a所示,若从第一寄存器21或第二寄存器23读出的信号也为0000,则第一寄存器21或第二寄存器23可以正常工作;如图8b所示,若从第一寄存器21或第二寄存器23读出的信号与0000不一致,例如读出的信号为0001,则第一寄存器21或第二寄存器23可能存在故障,应上报这一故障。
在一些实施例中,如图9所示,车载终端设备还可以包括低功耗微控制单元(low power microcontroller unit,LP MCU)、故障收集电路(esception management unit,EMU)、安全岛(safety island),LP MCU、EMU、安全岛也可以集成在SoC上。除此以外,车载终端设备还可以包括集成在SoC外的片外微控制单元(microcontroller unit,MCU),MCU用于监测车载终端设备中各个核心芯片(例如SoC)的工作状态。
LP MCU可以是车规级的微控制单元(例如,ARM的R52核),LP MCU可以运行低功耗固件、SoC的温度检测软件等,切换各个工作模式,并通过配置测试参数和定时轮询的方式,读取第二寄存器23实时检测到的采样点的第一温度码值或第二温度码值。
例如,LP MCU发起检测第一温感电路11和第二温感电路12是否能正常输出超温告警中断信号的测试,其可以为第一温感电路11和第二温感电路12配置一个超出温度阈值范围的温度值,以检测第一温感电路11和第二温感电路12是否可以在检测到超出温度阈值范围的温度后,输出超温告警中断信号。
又例如,LP MCU发起第二测试模式,并控制测试电路输出测试电压,以检测多路选通器14,和/或,模数转换器15,和/或,数字转换电路16是否出现故障。
又例如,LP MCU发起检测第一寄存器21和第二寄存器23是否存在故障的测试,为第一寄存器21和第二寄存器23配置写入信号,以根据第一寄存器21和第二寄存器23读出的信号,确定第一寄存器21或第二寄存器23是否存在故障。
在一些可能实现的方式中,LP MCU可以隔一段时间主动轮询第一温感电路11或第二温感电路12检测到的采样点的温度,LP MCU主动轮询获取到的温度,可以是采样点一段时间内的平均温度,检测平均温度的温度阈值范围可以是第一温度阈值范围。此外,LP MCU还可以接收第一温感电路11或第二温感电路12在轮询时间外发送的采样点的温度,第一温感电路11或第二温感电路12主动向LP MCU发送采样点的温度,说明某一时刻采样点的温度突然升高并超出允许的结温,检测第一温感电路11或第二温感电路12主动向LP MCU发送温度的温度阈值范围可以是第二温度阈值范围。
可选的,以高温阈值为例,第二温度阈值范围可以大于第一温度阈值范围。例如,第一温度阈值范围为90℃,第二温度阈值范围可以为105℃。
在一些可能实现的方式中,本申请实施例不对LP MCU从第一温感电路11或第二温感电路12主动轮询采样点的温度的规律进行限定,只要在执行第一测试模式和第二测试模式时,不执行功能模式即可。避免功能模式下第一温感电路11或第二温感电路12检测到的温度,影响第一测试模式和第二测试模式的检测结果,导致比较电路13输出的比较结果不可信。
基于此,如图10所示,功能模式应与第一测试模式和第二测试模式分时执行,例如,可以按照顺序依次执行功能模式、第一测试模式、第二测试模式。当然,该顺序还可以是其他,本申请实施例对此不作限定。其中,第一测试与第二测试模式之间具有一定时间间隔,第二测试模式中利用不同测试电压进行测试时,也具有一定时间间隔。该时间间隔可以根据故障容忍时间间隔(fault tolerant time interval,FTTI)进行设定,例如,该时间间隔可以是30ms。
在一些可能实现的方式中,在SoC上电的情况下,除第一测试模式和第二测试模式以外的时间,检测电路可以实时执行功能模式,也可以按照一定周期间隔一段时间执行功能模式,本申请实施例对此不作限定。
在一些可能实现的方式中,LP MCU在轮询过程中,接收到超温告警中断信号后,可以启动预定的温保措施。比如第一温感电路11和/或第二温感电路12检测到采样点的温度超出95℃,可以调用动态电压频率调整(dynamic voltage and frequency scaling,DVFS),来对该采样点进行调频调压,以
降低该采样点的功耗。当然,为了使自动驾驶汽车达到车规级,LP MCU还可以将轮询过程中接收到的超温告警中断信号发送至安全岛或者片外MCU,由安全岛或者片外MCU来调用动态电压频率调整。
EMU可以是SoC中用于故障管理的硬件电路,可以汇聚SoC中所有硬件电路的故障问题,包括采样点、第一温感电路11、第二温感电路12、多路选通器14、模数转换器15、数字转换电路16、放大器17、第一寄存器21、第二寄存器23等的故障问题,还可以收集上述超温告警中断信号。EMU可以将各硬件电路的故障以及超温告警中断信号上报给安全岛或片外MCU。例如,告警电路24接收到第一比较结果后,还可以将第一比较结果发送至EMU,由EMU决定忽略该第一比较结果,或是继续上报该第一比较结果至安全岛或片外MCU。
在一些可能实现的方式中,若告警电路24向EMU发送连续的多个第二比较结果以及一个第二比较结果,则EMU可以忽略该第一比较结果,不再上报该第一比较结果至安全岛或片外MCU。若告警电路24连续向EMU发送多个第二比较结果,则EMU继续上报该第一比较结果至安全岛或片外MCU,由安全岛或片外MCU处理该故障。安全岛是SoC片上用于监测人身安全的微控制单元,可以监测SoC上的CPU、NPU等关键采样点,具有独立于SoC其他采样点的时钟、供电和复位逻辑等。在其处理器上,运行有一套故障管理软件,专门用于接收和处理事关人身安全的各种软硬件故障和功能失效、以及超温告警中断信号。
片外MCU,片外的车规级MCU用于监测车载终端设备中各个核心芯片(例如SoC)的工作状态,一旦检测到核心芯片发生致命故障,则片外MCU可以在短时间内接管控车任务,比如控制车辆紧急靠边停车。例如,在LP MCU的轮询时间外,若第一温感电路11和/或第二温感电路12检测到采样点的温度超出允许的结温,不但可以将超温告警中断信号发送至LP MCU,还可以超温告警中断信号发送至片外MCU,由片外MCU控制板级复位电路或电源控制电路,对SoC或者该采样点进行复位或下电,避免烧坏SoC。另一个实施例中,本申请实施例提供一种检测电路的控制方法,该检测电路包括第一温感电路、第二温感电路、以及比较电路,所述第一温感电路和所述第二温感电路集成于汽车中SoC的多个采样点上。如图11所示,该控制方法包括如下步骤:
S110,利用第一温感电路和第二温感电路在预设时间内检测同一采样点的温度。
S120,根据温度电压拟合公式,通过第一温感电路将检测到的温度转换为第一电压,温度电压拟合公式用于表征温度与电压的转换关系。
S130,根据温度电压拟合公式,通过第二温感电路将检测到的温度转换为第二电压。
在一些可能实现的方式中,步骤S120和步骤S130可以同时执行,即,前述实施例的第一温感电路11与第二温感电路12同时工作。
在另一些可能实现的方式中,在第一温感电路11与第二温感电路12分时工作的情况下,可以先执行步骤S120,再执行步骤S130;或者,也可以先执行步骤S130,再执行步骤S120。
S140,利用比较电路,比较第一电压和第二电压,若第一电压与第二电压的差值大于预设参数,则上报第一比较结果。
本申请实施例的解释说明和有益效果,与前述实施例相同,在此不再赘述。
上面结合附图对本申请的实施例进行了描述,但是本申请并不局限于上述的具体实施方式,上述的具体实施方式仅仅是示意性的,而不是限制性的,本领域的普通技术人员在本申请的启示下,在不脱离本申请宗旨和权利要求所保护的范围情况下,还可做出很多形式,均属于本申请的保护之内。
Claims (22)
- 一种检测电路,其特征在于,包括第一温感电路、第二温感电路、以及比较电路;所述第一温感电路和所述第二温感电路集成于汽车中SoC的多个采样点上,配置为在预设时间内检测同一所述采样点的温度;所述第一温感电路,还配置为根据温度电压拟合公式,将检测到的温度转换为第一电压;所述温度电压拟合公式用于表征温度与电压的转换关系;所述第二温感电路,还配置为根据所述温度电压拟合公式,将检测到的温度转换为第二电压;所述比较电路,配置为比较所述第一电压和所述第二电压,若所述第一电压与所述第二电压的差值大于预设参数,则上报第一比较结果。
- 根据权利要求1所述的检测电路,其特征在于,所述第一温感电路和所述第二温感电路同时检测同一所述采样点的温度;所述比较电路,配置为对接收到的所述第一电压和所述第二电压进行实时比较。
- 根据权利要求1所述的检测电路,其特征在于,所述第一温感电路和所述第二温感电路分时检测同一所述采样点的温度;在功能模式下,所述第二温感电路未检测所述采样点的温度,所述第一温感电路检测所述采样点的第一温度,并根据所述温度电压拟合公式,将所述第一温度转换为所述第一电压;在第一测试模式下,所述第一温感电路停止检测所述采样点的温度,所述第二温感电路检测所述采样点的第二温度,并根据所述温度电压拟合公式,将所述第二温度转换为所述第二电压;检测所述第二温度和检测所述第一温度的时差在所述预设时间范围内。
- 根据权利要求1-3任一项所述的检测电路,其特征在于,所述温度电压拟合公式为其中,T表示所述第一温感电路和所述第二温感电路采集到的温度,VT为所述第一电压和所述第二电压,V25表示温度为25℃时对应的参考电压,a表示所述温度电压拟合公式的线性斜率。
- 根据权利要求4所述的检测电路,其特征在于,所述第一温感电路包括第一带隙基准电压发生器和第一温度传感器,所述第一带隙基准电压发生器用于为所述第一温度传感器提供所述参考电压;所述第二温感电路包括第二带隙基准电压发生器和第二温度传感器,所述第二带隙基准电压发生器用于为所述第二温度传感器提供所述参考电压。
- 根据权利要求5所述的检测电路,其特征在于,所述第一温度传感器和所述第二温度传感器均为双极结晶体管。
- 根据权利要求5或6所述的检测电路,其特征在于,所述第一温度传感器的材料与所述第二温度传感器的材料不同,和/或,所述第一温度传感器的尺寸与所述第二温度传感器的尺寸不同。
- 根据权利要求1所述的检测电路,其特征在于,所述比较电路,还配置为在所述第一电压与所述第二电压的差值小于或等于所述预设参数时,输出第二比较结果。
- 根据权利要求1所述的检测电路,其特征在于,所述第一温感电路,还配置为在检测到的温度超出温度阈值范围时,输出温度告警中断信号;所述温度阈值范围为所述采样点允许的结温范围;所述第二温感电路,还配置为在检测到的温度超出所述温度阈值范围时,输出温度告警中断信号。
- 根据权利要求1-3任一项所述的检测电路,其特征在于,所述检测电路还包括多路选通器、模数转换器、数字转换电路;所述第一温感电路和/或所述第二温感电路通过所述多路选通器将所述第一电压和/或所述第二电压输入至所述模数转换器;所述模数转换器,配置为将所述第一电压转换为第一数字信号,和/或,将所述第二电压转换为第二数字信号,并将所述第一数字信号和/或所述第二数字信号发送至所述数字转换电路;所述数字转换电路,配置为将所述第一数字信号转换为数字信号形式的第一温度码值,和/或,将所述第二数字信号转换为数字信号形式的第二温度码值;所述比较电路,配置为比较所述第一电压和所述第二电压,若所述第一电压与所述第二电压的差值大于预设参数,则上报第一比较结果,包括:所述比较电路,配置为比较所述第一温度码值和所述第二温度码值,若所述第一温度码值与所述第二温度码值的差值大于所述预设参数,则上报所述第一比较结果。
- 根据权利要求10所述的检测电路,其特征在于,所述检测电路还包括放大器,所述放大器电连接于所述多路选通器与所述模数转换器之间。
- 根据权利要求10或11所述检测电路,其特征在于,所述检测电路还包括测试电路;在第二测试模式下,所述第一温感电路和所述第二温感电路停止检测所述采样点的温度,所述测试电路通过所述多路选通器向所述模数转换器输入测试电压,所述测试电压经过所述模数转换器和所述数字转换电路输出测试温度码值;所述比较电路,还配置为对所述测试温度码值与期望温度码值进行比较,若所述测试温度码值与所述期望温度码值的差值大于所述预设参数,则上报第三比较结果;所述期望温度码值用于指示与所述测试电压对应的理想温度码值。
- 根据权利要求12所述的检测电路,其特征在于,所述测试电路包括分压电阻。
- 根据权利要求10-13任一项所述的检测电路,其特征在于,所述检测电路还包括第一寄存器;所述数字转换电路,还配置为将第一温度码值和第二温度码值发送至所述第一寄存器中;所述第一寄存器,配置为输出就绪信号。
- 根据权利要求14所述的检测电路,其特征在于,所述检测电路还包括采样电路、第二寄存器、以及告警电路;所述第一温感电路和所述第二温感电路同时检测同一所述采样点的温度;所述比较电路,还配置为向所述告警电路输入第二比较结果;所述告警电路,配置为响应于接收的所述第二比较结果,并向所述采样电路发送采样信号;所述采样电路,配置为响应于接收的接收所述采样信号,接收所述就绪信号,并从所述第一寄存器中采集与所述第二比较结果对应的所述第一温度码值和所述第二温度码值,将所述第一温度码值和所述第二温度码值发送至所述第二寄存器中存储。
- 根据权利要求15所述的检测电路,其特征在于,所述比较电路,还配置为向所述告警电路输入所述第一比较结果;所述告警电路,配置为响应于接收的所述第一比较结果,向所述采样电路发送停止采样信号;所述采样电路,配置为响应于接收的所述停止采样信号,停止从所述第一寄存器采集与所述第一比较结果对应的所述第一温度码值和第二温度码值。
- 根据权利要求14所述的检测电路,其特征在于,所述检测电路还包括采样电路、第二寄存器、以及告警电路;所述第一温感电路和所述第二温感电路分时检测同一所述采样点的温度;所述采样电路,配置为接收所述就绪信号,并从所述第一寄存器中采集多个所述第一温度码值和多个所述第二温度码值,计算多个所述第一温度码值的平均值为第一平均值,计算多个所述第二温度码值的平均值为第二平均值,将所述第一平均值和所述第二平均值发送至比较电路;所述比较电路,配置为比较所述第一温度码值和所述第二温度码值,包括:所述比较电路,配置为比较所述第一平均值和所述第二平均值;所述比较电路,还配置为向所述告警电路发送第二比较结果;所述告警电路,配置为响应于接收的所述第二比较结果,并向所述采样电路发送采样信号;所述采样电路,配置为响应于接收的接收所述采样信号,将与所述第二比较结果对应的所述第一温度码值和所述第二温度码值发送至所述第二寄存器中存储。
- 根据权利要求17所述的检测电路,其特征在于,所述比较电路,还配置为向所述告警电路发送所述第一比较结果;所述告警电路,配置为响应于接收的所述第一比较结果,向所述采样电路发送停止采样信号;所述采样电路,配置为响应于接收的所述停止采样信号,停止向所述第二寄存器发送与所述第一比较结果对应的所述第一温度码值和第二温度码值。
- 根据权利要求1所述的检测电路,其特征在于,所述采样点包括图像处理器、中央处理器、嵌入式神经网络处理器、视频编码器、视频解码器中的至少一个。
- 一种车载终端设备,其特征在于,包括SoC和权利要求1-19任一项所述的检测电路。
- 根据权利要求20所述的车载终端设备,其特征在于,所述车载终端设备还包括集成在所述SoC上的低功耗微控制单元、故障收集电路、安全岛,以及集成于所述SoC外的片外微控制单元;所述低功耗微控制单元,用于配置所述检测电路的工作模式;所述故障收集电路,用于收集所述SoC中的各个硬件电路的故障,并将所述故障发送至安全岛或所述片外微控制单元;所述硬件电路包括所述检测电路以及所述SoC的采样点;所述安全岛和所述片外微控制单元,用于接收所述故障收集电路发送的所述故障,并对所述故障进行处理。
- 一种检测电路的控制方法,其特征在于,所述检测电路包括第一温感电路、第二温感电路、以及比较电路,所述第一温感电路和所述第二温感电路集成于汽车中SoC的多个采样点上;利用所述第一温感电路和所述第二温感电路在预设时间内检测同一所述采样点的温度;根据温度电压拟合公式,通过所述第一温感电路将检测到的温度转换为第一电压;所述温度电压拟合公式用于表征温度与电压的转换关系;根据温度电压拟合公式,通过所述第二温感电路将检测到的温度转换为第二电压;利用所述比较电路,比较所述第一电压和所述第二电压,若所述第一电压与所述第二电压的差值大于预设参数,则上报第一比较结果。
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