WO2021208185A1 - 一种显示面板及显示装置 - Google Patents

一种显示面板及显示装置 Download PDF

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Publication number
WO2021208185A1
WO2021208185A1 PCT/CN2020/091869 CN2020091869W WO2021208185A1 WO 2021208185 A1 WO2021208185 A1 WO 2021208185A1 CN 2020091869 W CN2020091869 W CN 2020091869W WO 2021208185 A1 WO2021208185 A1 WO 2021208185A1
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WO
WIPO (PCT)
Prior art keywords
circuit board
test
display panel
binding
bonding
Prior art date
Application number
PCT/CN2020/091869
Other languages
English (en)
French (fr)
Inventor
杨佳瑶
张启沛
Original Assignee
武汉华星光电半导体显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 武汉华星光电半导体显示技术有限公司 filed Critical 武汉华星光电半导体显示技术有限公司
Priority to US16/961,102 priority Critical patent/US20210327774A1/en
Publication of WO2021208185A1 publication Critical patent/WO2021208185A1/zh

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays

Definitions

  • This application relates to the field of display technology, and in particular to a display panel and a display device.
  • the embodiments of the present application provide a display panel and a display device, which can effectively avoid the problems of product failure and abnormal reliability caused by bad damage during the test.
  • An embodiment of the present application provides a display panel, the display panel has an effective display area and an ineffective display area, the ineffective display area is arranged around the effective display area, and the display panel includes a first surface disposed oppositely And the second surface and the first side and the second side opposite to each other, wherein a bonding circuit board is arranged on the first surface of the ineffective display area, and the bonding circuit board is arranged close to the On one side of the first side, the bonding circuit board includes at least two bonding pads, a test circuit board is arranged on the first surface, and the test circuit board is arranged in the effective display area and the Between the binding circuit boards, the test circuit board is used to test the display panel, and the test circuit board includes at least two test pads.
  • the test circuit board includes a first test circuit board and a second test circuit board
  • the first test circuit board includes a first end and a second end that are oppositely disposed
  • the second test circuit board It comprises a third end and a fourth end arranged oppositely, the first end and the third end are flush with the two ends of the binding circuit board, and a circuit area is arranged between the second end and the fourth end.
  • the test pad density is less than the bonding pad density, and the number of test pads is less than the number of bonding pads.
  • the density of the bonding pad or the test pad is 50 ⁇ m to 200 ⁇ m.
  • reserved test pads are provided on both sides of the bonding circuit board perpendicular to the first side, and the reserved test pads are connected to the test pads through signal lines.
  • the signal line of the bonding pad extends to a side of the test circuit board away from the first side through any side of the test circuit board.
  • the test pad has a gap
  • the signal line of the bonding pad extends to a side of the test circuit board away from the first side through the gap of the test pad.
  • binding marks are provided on both sides of the binding circuit board, and the binding marks are used to align the binding circuit board with a binding machine during binding.
  • a sealant is further included, and the sealant is disposed on the side of the binding circuit board and the test circuit board away from the first surface, and the sealant is used to bind the The circuit board and the test circuit board are packaged.
  • conductive contacts are provided between the bonding pads and between the test pads.
  • An embodiment of the present application provides a display device, the display device includes a display panel, the display panel has an effective display area and an ineffective display area, the ineffective display area is arranged around the effective display area, the display The panel includes a first side and a second side oppositely arranged and a first side and a second side oppositely arranged, wherein a binding circuit board is arranged on the first side of the inactive display area, and the binding The fixed circuit board is arranged on the side close to the first side, the bonding circuit board includes at least two bonding pads, a test circuit board is arranged on the first surface, and the test circuit board is arranged on the Between the effective display area and the binding circuit board, the test circuit board is used to test the display panel, and the test circuit board includes at least two test pads.
  • the test circuit board includes a first test circuit board and a second test circuit board
  • the first test circuit board includes a first end and a second end that are oppositely disposed
  • the second test circuit board It comprises a third end and a fourth end arranged oppositely, the first end and the third end are flush with the two ends of the binding circuit board, and a circuit area is arranged between the second end and the fourth end.
  • the density of the test pads is less than the density of the bonding pads
  • the number of the test pads is less than the number of the bonding pads
  • the density of the bonding pad or the test pad is 50 ⁇ m to 200 ⁇ m.
  • reserved test pads are provided on both sides of the bonding circuit board perpendicular to the first side, and the reserved test pads are connected to the test pads through signal lines.
  • the signal line of the bonding pad extends to a side of the test circuit board away from the first side through any side of the test circuit board.
  • the test pad has a gap
  • the signal line of the bonding pad extends to a side of the test circuit board away from the first side through the gap of the test pad.
  • binding marks are provided on both sides of the binding circuit board, and the binding marks are used to align the binding circuit board with a binding machine during binding.
  • a sealant is further included, and the sealant is disposed on the side of the binding circuit board and the test circuit board away from the first surface, and the sealant is used to bind the The circuit board and the test circuit board are packaged.
  • conductive contacts are provided between the bonding pads and between the test pads.
  • FIG. 1 is a schematic structural diagram of the first side of a display panel provided by an embodiment of the application
  • FIG. 2 is a schematic diagram of a first partial structure of a first surface of a display panel provided by an embodiment of the application;
  • FIG. 3 is a second partial schematic diagram of the first surface of the display panel provided by an embodiment of the application.
  • FIG. 4 is a first connection method of the bonding pad and the test pad provided by an embodiment of the application
  • FIG. 5 is a second connection method of the bonding pad and the test pad provided by an embodiment of the application.
  • FIG. 6 is a third partial schematic diagram of the first surface of the display panel provided by an embodiment of the application.
  • FIG. 7 is a schematic diagram of a structure of a display panel provided by an embodiment of the application.
  • FIG. 8 is a fourth partial schematic diagram of the first surface of the display panel provided by an embodiment of the application.
  • FIG. 9 is a schematic structural diagram of a display device provided by an embodiment of the application.
  • the embodiments of the present application provide a display panel and a display device.
  • the display panel will be described in detail below.
  • FIG. 1 is a schematic structural diagram of a first surface of a display panel 10 provided by an embodiment of the present application.
  • the display panel has an effective display area 10a and an ineffective display area 10b.
  • the ineffective display area 10b is arranged around the effective display area 10a.
  • the display panel 10 includes a first surface and a second surface arranged oppositely and a first side 10c arranged oppositely. And the second side 10d, wherein a bonding circuit board 101 is provided on the first surface of the non-effective display area 10b, the bonding circuit board 101 is provided on the side close to the first side 10c, and the bonding circuit board 101 includes at least The two bonding pads 101a are provided with a test circuit board 102 on the first surface 10c.
  • the test circuit board 102 is arranged between the effective display area 10a and the bonding circuit board 101.
  • the test circuit board 102 is used to connect the display panel 10
  • the test circuit board 102 includes at least two test pads 102a.
  • the test circuit board 102 and the bonding circuit board 101 are designed as a double row, which can also save the lateral spacing of the display panel 10.
  • the density of the test pads 102a is smaller than the density of the bonding pads 101a, and the number of the test pads 102a is less than the number of the bonding pads 102b.
  • the density of the test pad 102a and the density of the bonding pad 101a refer to the width of the pad plus the space between the pads.
  • the density of the bonding pad 101a or the test pad 102a provided in the present application is 50 ⁇ m to 200 ⁇ m.
  • the density of the bonding pad 101a or the test pad 102a is 50 ⁇ m, 55 ⁇ m, 100 ⁇ m, 150 ⁇ m, 195 ⁇ m, or 200 ⁇ m.
  • the test pads 102a are used for testing in the manufacturing process.
  • the density of the test pads 102a is set to be smaller than that of the bonding pads 101a, and the number of the test pads 102a is set to be less than the number of bonding pads 101a.
  • the precision of the test pad 102a can be reduced, thereby reducing the production time and production cost invested in the testing process in the manufacturing process, which is beneficial to improving the production efficiency of the display panel 10.
  • FIG. 2 is a schematic diagram of the first partial structure of the first surface of the display panel 10 according to an embodiment of the present application.
  • the test circuit board 102 includes a first test circuit board 1021 and a second test circuit board 1022.
  • the first test circuit board 1021 includes a first end 1021a and a second end 1021b that are opposed to each other.
  • the second test circuit board 1022 includes a first end 1021a and a second end 1021b that are opposed to each other.
  • the three ends 1022a and the fourth end 1022b, the first end 1021a and the third end 1022a are flush with the two ends of the binding circuit board 101, and a circuit area 103 is provided between the second end 1021b and the fourth end 1022b.
  • the test circuit board 102 is divided into a first test circuit board 1021 and a second test circuit board 1022, and the circuit area 103 can be set aside for other circuit boards or other components of the display panel 10.
  • the placement of the first test circuit board 1021 and the second test circuit board 1022 at both ends can also prevent damage to the devices or circuit boards in the circuit area 103 during the test process, and prevent defects in the devices or circuit boards in the circuit area 103.
  • FIG. 3 is a second partial schematic diagram of the first surface of the display panel 10 according to an embodiment of the present application.
  • the two sides of the bonding circuit board 101 perpendicular to the first side 10c are provided with reserved test pads 101b, and the reserved test pads 101b and the test pads 102a are connected by a signal line 104.
  • a reserved test pad 101b and a test pad 102a are respectively connected by a signal line 104.
  • the reserved test pads 101b are provided on both sides of the bonding circuit board 101 to make the test more accurate.
  • FIG. 4 is a first connection method of the bonding pad 101 a and the test pad 102 a provided by an embodiment of the application.
  • the signal line 104 of the bonding pad 101a extends through any side of the test circuit board 102 to a side of the test circuit board 102 away from the first side 10c.
  • the extension from the left side is taken as an example, and the arrangement of the signal line 104 is only for illustration, and is not a limitation of the present invention.
  • FIG. 5 is a second connection method of the bonding pad 101 a and the test pad 102 a provided by an embodiment of the application.
  • the test pad 102a has a gap 102b, and the signal line 104 of the bonding pad 101a extends to a side of the test circuit board 102 away from the first side 10c through the gap 102b of the test pad 102a.
  • the arrangement of the signal line 104 in the figure is only for illustration, and is not a limitation of the present invention.
  • connection method of the bonding pad 101a and the test pad 102a provided in the embodiment of the present application can avoid damage or damage to the signal line 104 on the bonding pad 101a during the test process, because the signal line 104 bypasses the test pad
  • the setting of 102a can prevent the signal line 104 from being damaged during the testing process, which may lead to poor bonding of the circuit board 101 and the subsequent manufacturing process.
  • FIG. 6 is a third partial schematic diagram of the first surface of the display panel 10 according to an embodiment of the present application.
  • a binding mark 105 is provided on both sides of the binding circuit board 101, and the binding mark 105 is used to align the binding circuit board 101 with the binding machine during binding.
  • FIG. 7 is a schematic structural diagram of the display panel 10 provided by an embodiment of the present application.
  • the display panel 10 further includes a sealant 106, which is arranged on the side of the binding circuit board 101 and the test circuit board 102 away from the first surface, and the sealant 106 is used to encapsulate the binding circuit board 101 and the test circuit board 102 .
  • FIG. 8 is a fourth partial schematic diagram of the first surface of the display panel 10 according to an embodiment of the present application.
  • Conductive contacts 107 are provided between the bonding pads 101a and between the test pads 102a.
  • the material used for the conductive contact 107 is gold, brass or a combination of the above materials.
  • the conductive contact piece 107 is also called a connecting finger, and can be used to transmit signals between pads, or to transmit signals between the bonding circuit board 101 and a device that is bonded to the bonding circuit board 101.
  • the provision of the conductive contact piece 107 can effectively increase the bonding packaging area and improve the packaging reliability.
  • FIG. 9 is a schematic structural diagram of the display device 100 in an embodiment of the present application.
  • the display panel 100 includes the above-mentioned display panel 10 and the backlight module 20, and the display device 100 may also include other devices.
  • the backlight module 20 and other devices and their assembly in the embodiments of the present application are related technologies well known to those skilled in the art, and will not be repeated here.
  • the display device 100 provided by the embodiment of the present application includes a display panel 10 and a backlight module 20.
  • the display panel 10 does not share the test circuit board used for the test process and the bonding circuit board, thereby reducing the test of the bonding circuit board.
  • the test circuit board and the bonding circuit board are designed as double rows, which can also save the lateral spacing of the display panel 10.

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

一种显示面板(10),显示面板(10)具有有效显示区(10a)和非有效显示区(10b),在非有效显示区(10b)上设置有绑定电路板(101)和测试电路板(102),测试电路板(102)设置在有效显示区(10a)与绑定电路板(101)之间,用于对显示面板(10)进行测试。通过将测试电路板(102)与绑定电路板(101)做不共用设计,降低绑定电路板(101)因测试过程中不良损伤导致的绑定失效及可靠性异常的风险。

Description

一种显示面板及显示装置 技术领域
本申请涉及显示技术领域,特别涉及一种显示面板及显示装置。
背景技术
随着有机发光二极管(Organic Light-Emitting Diode, OLED)显示面板边框的不断减小以及分辨率的不断提升,因测试过程不良损伤等带来的失效及可靠性问题也越来越严重。
技术问题
本申请实施例提供一种显示面板及显示装置,可以有效避免因测试过程中不良损伤导致产品失效及可靠性异常的问题。
技术解决方案
本申请实施例提供一种显示面板,所述显示面板具有有效显示区和非有效显示区,所述非有效显示区设置在所述有效显示区四周,所述显示面板包括相对设置的第一面和第二面以及相对设置的第一边和第二边,其中,在所述非有效显示区的所述第一面上设置有绑定电路板,所述绑定电路板设置在靠近所述第一边的一侧,所述绑定电路板包括至少两个绑定焊盘,在所述第一面上设置有测试电路板,所述测试电路板设置在所述有效显示区与所述绑定电路板之间,所述测试电路板用于对所述显示面板进行测试,所述测试电路板包括至少两个测试焊盘。
在一些实施例中,所述测试电路板包括第一测试电路板和第二测试电路板,所述第一测试电路板包括相对设置的第一端和第二端,所述第二测试电路板包括相对设置的第三端和第四端,所述第一端、第三端与所述绑定电路板两端平齐,所述第二端、第四端之间设置有电路区。
在一些实施例中,所述测试焊盘疏密度小于所述绑定焊盘疏密度,所述测试焊盘的数量小于所述绑定焊盘的数量。
在一些实施例中,所述绑定焊盘或所述测试焊盘的疏密度大小为50 μm至200 μm。
在一些实施例中,所述绑定电路板垂直于所述第一边的两侧设置有预留测试焊盘,所述预留测试焊盘与所述测试焊盘通过信号线连接。
在一些实施例中,所述绑定焊盘的信号线经由所述测试电路板的任意一侧延伸至所述测试电路板远离所述第一边的一侧。
在一些实施例中,所述测试焊盘具有间隙,所述绑定焊盘的信号线经由所述测试焊盘的间隙延伸至所述测试电路板远离所述第一边的一侧。
在一些实施例中,所述绑定电路板两侧设置有绑定标记,所述绑定标记用于在绑定时将所述绑定电路板与绑定机台进行对位。
在一些实施例中,还包括密封胶,所述密封胶设置在所述绑定电路板与所述测试电路板远离所述第一面的一侧,所述密封胶用于对所述绑定电路板以及所述测试电路板进行封装。
在一些实施例中,所述绑定焊盘之间以及所述测试焊盘之间设置有导电触片。
本申请实施例中提供一种显示装置,该显示装置包括显示面板,所述显示面板具有有效显示区和非有效显示区,所述非有效显示区设置在所述有效显示区四周,所述显示面板包括相对设置的第一面和第二面以及相对设置的第一边和第二边,其中,在所述非有效显示区的所述第一面上设置有绑定电路板,所述绑定电路板设置在靠近所述第一边的一侧,所述绑定电路板包括至少两个绑定焊盘,在所述第一面上设置有测试电路板,所述测试电路板设置在所述有效显示区与所述绑定电路板之间,所述测试电路板用于对所述显示面板进行测试,所述测试电路板包括至少两个测试焊盘。
在一些实施例中,所述测试电路板包括第一测试电路板和第二测试电路板,所述第一测试电路板包括相对设置的第一端和第二端,所述第二测试电路板包括相对设置的第三端和第四端,所述第一端、第三端与所述绑定电路板两端平齐,所述第二端、第四端之间设置有电路区。
在一些实施例中,其中,所述测试焊盘疏密度小于所述绑定焊盘疏密度,所述测试焊盘的数量小于所述绑定焊盘的数量。
在一些实施例中,所述绑定焊盘或所述测试焊盘的疏密度大小为50 μm至200 μm。
在一些实施例中,所述绑定电路板垂直于所述第一边的两侧设置有预留测试焊盘,所述预留测试焊盘与所述测试焊盘通过信号线连接。
在一些实施例中,所述绑定焊盘的信号线经由所述测试电路板的任意一侧延伸至所述测试电路板远离所述第一边的一侧。
在一些实施例中,所述测试焊盘具有间隙,所述绑定焊盘的信号线经由所述测试焊盘的间隙延伸至所述测试电路板远离所述第一边的一侧。
在一些实施例中,所述绑定电路板两侧设置有绑定标记,所述绑定标记用于在绑定时将所述绑定电路板与绑定机台进行对位。
在一些实施例中,还包括密封胶,所述密封胶设置在所述绑定电路板与所述测试电路板远离所述第一面的一侧,所述密封胶用于对所述绑定电路板以及所述测试电路板进行封装。
在一些实施例中,所述绑定焊盘之间以及所述测试焊盘之间设置有导电触片。
有益效果
通过将测试电路板与绑定电路板做不共用设计,降低绑定电路板因测试过程中不良损伤导致的绑定失效及可靠性异常的风险。
附图说明
为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为本申请实施例提供的显示面板第一面的结构示意图;
图2为本申请实施例提供的显示面板第一面的第一种局部结构示意图;
图3为本申请实施例提供的显示面板第一面的第二种局部示意图;
图4为本申请实施例提供的绑定焊盘与测试焊盘的第一种连接方式;
图5为本申请实施例提供的绑定焊盘与测试焊盘的第二种连接方式;
图6为本申请实施例提供的显示面板第一面的第三种局部示意图;
图7为本申请实施例提供的显示面板的一种结构示意图;
图8为本申请实施例提供的显示面板第一面的第四种局部示意图;
图9为本申请实施例提供的显示装置的结构示意图。
本发明的实施方式
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述。显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。
需要说明的是,在本申请的描述中,需要理解的是,术语“上”、“下”、“前”、“后”、“左”、“右”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本申请和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本申请的限制。
本申请实施例提供一种显示面板及显示装置,以下对显示面板做详细介绍。
请参阅图1,图1是本申请实施例提供的显示面板10第一面的结构示意图。该显示面板具有有效显示区10a和非有效显示区10b,非有效显示区10b设置在有效显示区10a四周,显示面板10包括相对设置的第一面和第二面以及相对设置的第一边10c和第二边10d,其中,在非有效显示区10b的第一面上设置有绑定电路板101,绑定电路板101设置在靠近第一边10c的一侧,绑定电路板101包括至少两个绑定焊盘101a,在第一面10c上设置有测试电路板102,测试电路板102设置在有效显示区10a与绑定电路板101之间,测试电路板102用于对显示面板10进行测试,测试电路板102包括至少两个测试焊盘102a。通过将测试电路板102与绑定电路板101做不共用设计,降低绑定电路板101因测试过程中不良损伤导致的绑定失效及可靠性异常的风险。另外,测试电路板102与绑定电路板101设计为双排,还能够节省显示面板10的横向间距。
其中,测试焊盘102a疏密度小于绑定焊盘101a疏密度,测试焊盘102a的数量小于绑定焊盘102b的数量。测试焊盘102a的疏密度及绑定焊盘101a的疏密度指的是焊盘的宽度加上焊盘之间间距的大小。具体地,本申请提供的绑定焊盘101a或测试焊盘102a的疏密度大小为50 μm至200 μm。进一步地,绑定焊盘101a或测试焊盘102a的疏密度大小为50 μm、55 μm、100 μm、150 μm、195 μm或200 μm。测试焊盘102a用于在制程中进行测试,因此,将测试焊盘102a疏密度设置为小于绑定焊盘101a的疏密度,以及测试焊盘102a数量设置为小于绑定焊盘101a的数量,能够减小测试焊盘102a的精密度,进而减少制程中在测试过程中投入的生产时间及生产成本,有利于提高显示面板10的生产效率。
其中,请参阅图2,图2是本申请实施例提供的显示面板10第一面的第一种局部结构示意图。测试电路板102包括第一测试电路板1021和第二测试电路板1022,第一测试电路板1021包括相对设置的第一端1021a和第二端1021b,第二测试电路板1022包括相对设置的第三端1022a和第四端1022b,第一端1021a、第三端1022a与绑定电路板101两端平齐,第二端1021b、第四端1022b之间设置有电路区103。将测试电路板102分为第一测试电路板1021和第二测试电路板1022,可以留出电路区103设置显示面板10的其他电路板或其他器件。第一测试电路板1021和第二测试电路板1022设置在两端也可以防止测试制程中对电路区103的器件或电路板造成损伤,避免电路区103内的器件或电路板发生不良。
其中,请参阅图3,图3是本申请实施例提供的显示面板10第一面的第二种局部示意图。绑定电路板101垂直于第一边10c的两侧设置有预留测试焊盘101b,预留测试焊盘101b与测试焊盘102a通过信号线104连接。具体地,一预留测试焊盘101b与一测试焊盘102a通过信号线104分别连接。显示面板10的横向间距较大的情况下,在绑定电路板101的两侧设置有预留测试焊盘101b能够使测试更精准。
其中,请参阅图4,图4为本申请实施例提供的绑定焊盘101a与测试焊盘102a的第一种连接方式。绑定焊盘101a的信号线104经由测试电路板102的任意一侧延伸至测试电路板102远离第一边10c的一侧。图中以从左侧延伸作为示例,信号线104的设置方式也仅为示意,并非对本发明的限制。
其中,请参阅图5,图5为本申请实施例提供的绑定焊盘101a与测试焊盘102a的第二种连接方式。测试焊盘102a具有间隙102b,绑定焊盘101a的信号线104经由测试焊盘102a的间隙102b延伸至测试电路板102远离第一边10c的一侧。图中信号线104的设置方式仅为示意,并非对本发明的限制。
本申请实施例提供的绑定焊盘101a与测试焊盘102a的连接方式能够避免在测试制程中对绑定焊盘101a上信号线104的损伤或破坏,由于信号线104绕开了测试焊盘102a进行设置,能够避免因信号线104在测试过程中损伤进而导致绑定电路板101不良对后续制程的影响。
其中,请参阅图6,图6是本申请实施例提供的显示面板10第一面的第三种局部示意图。绑定电路板101两侧设置有绑定标记105,绑定标记105用于在绑定时将绑定电路板101与绑定机台进行对位。
其中,请参阅图7,图7是本申请实施例提供的显示面板10的一种结构示意图。显示面板10还包括密封胶106,密封胶106设置在绑定电路板101与测试电路板102远离第一面的一侧,密封胶106用于对绑定电路板101以及测试电路板102进行封装。
其中,请参阅图8,图8是本申请实施例提供的显示面板10第一面的第四种局部示意图。绑定焊盘101a之间以及测试焊盘102a之间设置有导电触片107。导电触片107采用的材料为金、黄铜或上述材料的组合。导电触片107又称金手指(connecting finger),可用于传送焊盘之间的信号,或用于传送绑定电路板101和与绑定电路板101进行绑定的器件之间的信号。设置导电触片107,能够有效增加绑定封装区域,提高封装可靠性。
本申请实施例提供一种显示装置100,图9是本申请实施例中显示装置100的结构示意图。其中,显示面板100包括以上所述的显示面板10和背光模组20,显示装置100还可以包括其他装置。本申请实施例中背光模组20和其他装置及其装配是本领域技术人员所熟知的相关技术,在此不做过多赘述。
本申请实施例提供的显示装置100,包括显示面板10和背光模组20,显示面板10通过将用于测试制程的测试电路板与绑定电路板做不共用设计,降低绑定电路板因测试过程中不良损伤导致的绑定失效及可靠性异常的风险。另外,测试电路板与绑定电路板设计为双排,还能够节省显示面板10的横向间距。
以上对本申请实施例提供的显示面板及显示装置进行了详细介绍,本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请。同时,对于本领域的技术人员,依据本申请的思想,在具体实施方式及应用范围上均会有改变之处,综上所述,本说明书内容不应理解为对本申请的限制。

Claims (20)

  1. 一种显示面板,其中,所述显示面板具有有效显示区和非有效显示区,所述非有效显示区设置在所述有效显示区四周,所述显示面板包括相对设置的第一面和第二面以及相对设置的第一边和第二边,其中,在所述非有效显示区的所述第一面上设置有绑定电路板,所述绑定电路板设置在靠近所述第一边的一侧,所述绑定电路板包括至少两个绑定焊盘,在所述第一面上设置有测试电路板,所述测试电路板设置在所述有效显示区与所述绑定电路板之间,所述测试电路板用于对所述显示面板进行测试,所述测试电路板包括至少两个测试焊盘。
  2. 根据权利要求1所述的显示面板,其中,所述测试电路板包括第一测试电路板和第二测试电路板,所述第一测试电路板包括相对设置的第一端和第二端,所述第二测试电路板包括相对设置的第三端和第四端,所述第一端、第三端与所述绑定电路板两端平齐,所述第二端、第四端之间设置有电路区。
  3. 根据权利要求1所述的显示面板,其中,所述测试焊盘疏密度小于所述绑定焊盘疏密度,所述测试焊盘的数量小于所述绑定焊盘的数量。
  4. 根据权利要求3所述的显示面板,其中,所述绑定焊盘或所述测试焊盘的疏密度大小为50 μm至200 μm。
  5. 根据权利要求1所述的显示面板,其中,所述绑定电路板垂直于所述第一边的两侧设置有预留测试焊盘,所述预留测试焊盘与所述测试焊盘通过信号线连接。
  6. 根据权利要求1所述的显示面板,其中,所述绑定焊盘的信号线经由所述测试电路板的任意一侧延伸至所述测试电路板远离所述第一边的一侧。
  7. 根据权利要求1所述的显示面板,其中,所述测试焊盘具有间隙,所述绑定焊盘的信号线经由所述测试焊盘的间隙延伸至所述测试电路板远离所述第一边的一侧。
  8. 根据权利要求1所述的显示面板,其中,所述绑定电路板两侧设置有绑定标记,所述绑定标记用于在绑定时将所述绑定电路板与绑定机台进行对位。
  9. 根据权利要求1所述的显示面板,其中,还包括密封胶,所述密封胶设置在所述绑定电路板与所述测试电路板远离所述第一面的一侧,所述密封胶用于对所述绑定电路板以及所述测试电路板进行封装。
  10. 根据权利要求1所述的显示面板,其中,所述绑定焊盘之间以及所述测试焊盘之间设置有导电触片。
  11. 一种显示装置,其中,包括显示面板,所述显示面板具有有效显示区和非有效显示区,所述非有效显示区设置在所述有效显示区四周,所述显示面板包括相对设置的第一面和第二面以及相对设置的第一边和第二边,其中,在所述非有效显示区的所述第一面上设置有绑定电路板,所述绑定电路板设置在靠近所述第一边的一侧,所述绑定电路板包括至少两个绑定焊盘,在所述第一面上设置有测试电路板,所述测试电路板设置在所述有效显示区与所述绑定电路板之间,所述测试电路板用于对所述显示面板进行测试,所述测试电路板包括至少两个测试焊盘。
  12. 根据权利要求11所述的显示面板,其中,所述测试电路板包括第一测试电路板和第二测试电路板,所述第一测试电路板包括相对设置的第一端和第二端,所述第二测试电路板包括相对设置的第三端和第四端,所述第一端、第三端与所述绑定电路板两端平齐,所述第二端、第四端之间设置有电路区。
  13. 根据权利要求11所述的显示面板,其中,所述测试焊盘疏密度小于所述绑定焊盘疏密度,所述测试焊盘的数量小于所述绑定焊盘的数量。
  14. 根据权利要求13所述的显示面板,其中,所述绑定焊盘或所述测试焊盘的疏密度大小为50 μm至200 μm。
  15. 根据权利要求11所述的显示面板,其中,所述绑定电路板垂直于所述第一边的两侧设置有预留测试焊盘,所述预留测试焊盘与所述测试焊盘通过信号线连接。
  16. 根据权利要求11所述的显示面板,其中,所述绑定焊盘的信号线经由所述测试电路板的任意一侧延伸至所述测试电路板远离所述第一边的一侧。
  17. 根据权利要求11所述的显示面板,其中,所述测试焊盘具有间隙,所述绑定焊盘的信号线经由所述测试焊盘的间隙延伸至所述测试电路板远离所述第一边的一侧。
  18. 根据权利要求11所述的显示面板,其中,所述绑定电路板两侧设置有绑定标记,所述绑定标记用于在绑定时将所述绑定电路板与绑定机台进行对位。
  19. 根据权利要求11所述的显示面板,其中,还包括密封胶,所述密封胶设置在所述绑定电路板与所述测试电路板远离所述第一面的一侧,所述密封胶用于对所述绑定电路板以及所述测试电路板进行封装。
  20. 根据权利要求11所述的显示面板,其中,所述绑定焊盘之间以及所述测试焊盘之间设置有导电触片。
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