WO2020048291A1 - 布线结构、显示基板、显示装置以及制作显示基板的方法 - Google Patents
布线结构、显示基板、显示装置以及制作显示基板的方法 Download PDFInfo
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Classifications
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1237—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a different composition, shape, layout or thickness of the gate insulator in different devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
Definitions
- the wiring structure further includes: a plurality of peripheral connection lines located on a side of the first insulating layer facing away from the base substrate.
- the plurality of peripheral connection lines are connected to respective first ends of the plurality of first-type signal lines.
- the method includes: patterning a first layer of metal thin film on the base substrate to form the plurality of first-type signal lines and the gate in a display area of the display substrate, and The frame area of the substrate forms the second type of signal line and the plurality of conductive blocks; the gate insulating layer is formed on the base substrate and the patterned first layer of metal film; and the gate insulation A portion of the layer opposite to the gate forms the active layer; and a portion of the gate insulating layer not covered by the active layer and a side of the active layer facing away from the gate insulating layer Patterning a second layer of metal thin film to form the source electrode and the drain electrode in the display area, and electrically connecting the plurality of conductive blocks to the second type of signal line.
- FIG. 17 is a schematic flowchart of a method for manufacturing the display substrate shown in FIG. 16;
- the first type of signal line 2, the second type of signal line 3, and the conductive block 22 may be single films such as aluminum film, copper film, molybdenum film, titanium film, chromium film, aluminum neodymium alloy film, or aluminum nickel alloy film.
- the layer metal film may also be a multilayer metal film formed by stacking at least two of an aluminum film, a copper film, a molybdenum film, a titanium film, a chromium film, an aluminum neodymium alloy film, and an aluminum nickel alloy film.
- the gate insulating layer 62 may be formed of a silicon dioxide film layer.
- the gate insulating layer 62 may be composed of a stack of silicon nitride and silicon dioxide.
- the gate insulating layer 62 may be formed by using a PECVD process.
- the first layer of metal thin film may be made of a metal material having a relatively low resistance value, such as aluminum (Al), copper (Cu), molybdenum (Mo), titanium (Ti), or aluminum neodymium alloy (AlNd), a magnetron sputtering process or Formed by evaporation process.
- the data driver 1830 is electrically connected to a first end of each data line DL to output a data voltage to each data line DL.
- the data driver 1830 may include multiple data driving chips operating in parallel.
- the timing controller 1840 controls operations of each of the gate driver 1820 and the data driver 1830. Specifically, the timing controller 1840 outputs data control signals and image data to control the driving operation of the data driver 1830, and outputs a gate control signal to control the driving operation of the gate driver 1820. Data control signals and image data are applied to the data driver 1830. A gate control signal is applied to the gate driver 1820.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Manufacturing & Machinery (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (20)
- 一种布线结构,包括:多条信号线,位于衬底基板上,所述多条信号线包括在第一方向上延伸的多条第一类信号线以及在与所述第一方向交叉的第二方向上延伸的第二类信号线,所述第二类信号线位于所述多条第一类信号线的第一端部且与所述多条第一类信号线间隔开;以及多个导电块,每个导电块位于所述多条第一类信号线中相应的两条相邻信号线的所述第一端部之间,其中所述多个导电块与所述多条第一类信号线绝缘且与所述第二类信号线电连接。
- 根据权利要求1所述的布线结构,其中所述多条第一类信号线、所述第二类信号线以及所述多个导电块同层。
- 根据权利要求2所述的布线结构,其中所述多个导电块与所述第二类信号线直接相连。
- 根据权利要求2所述的布线结构,还包括:多条***连接线,位于所述第二类信号线背离所述衬底基板的一侧;以及绝缘层,位于所述多条***连接线与第一和第二类信号线之间,其中所述多条***连接线通过所述绝缘层中的相应过孔与所述多条第一类信号线的相应第一端部连接。
- 根据权利要求4所述的布线结构,还包括:多条导电连接线,与所述多条***连接线同层,其中所述多条导电连接线通过所述绝缘层中的相应过孔连接到所述第二类信号线和所述多个导电块。
- 根据权利要求1所述的布线结构,还包括:第一绝缘层,位于所述多条第一类信号线与所述第二类信号线之间,其中所述多个导电块与所述多条第一类信号线同层。
- 根据权利要求6所述的布线结构,还包括:多条***连接线,位于所述第一绝缘层背离所述衬底基板的一侧,其中所述多条***连接线与所述多条第一类信号线的相应第一端 部连接。
- 根据权利要求7所述的布线结构,其中所述多条***连接线与所述多条第一类信号线同层且直接相连。
- 根据权利要求7所述的布线结构,其中所述多个导电块通过所述第一绝缘层中的相应过孔与所述第二类信号线连接。
- 根据权利要求7所述的布线结构,还包括:第二绝缘层,位于所述多条***连接线与所述第一绝缘层之间;以及多条导电连接线,与所述多条***连接线同层,其中所述多条***连接线通过所述第二绝缘层中的相应过孔与所述多条第一类信号线的相应第一端部连接,并且其中每条导电连接线的一端通过贯穿所述第二绝缘层的相应过孔与所述多个导电块中的相应一个导电块连接,并且每条导电连接线的另一端通过贯穿第一和第二绝缘层的相应过孔与所述第二类信号线连接。
- 根据权利要求4、5和7-10中任一项所述的布线结构,其中所述多条信号线还包括与所述多条第一类信号线交叉且绝缘的多条第三类信号线,并且其中所述多条第三类信号线与所述多条***连接线同层。
- 根据权利要求4、5和7-10中任一项所述的布线结构,其中所述第二类信号线包括沿所述第二方向延伸的信号线主干以及关于所述信号线主干对称的多个分支部,并且其中每条所述***连接线在所述衬底基板上的正投影位于所述多个分支部中在所述第二方向上相邻的相应两个分支部在所述衬底基板上的正投影之间。
- 根据权利要求12所述的布线结构,其中所述多个分支部每个在所述第二方向上具有第一尺寸,其中所述多条***连接线每个在所述第二方向上具有第二尺寸,并且其中所述第一尺寸大于所述第二尺寸。
- 根据权利要求5或10所述的布线结构,其中所述多条***连接线和所述多条导电连接线与所述多条第一类信号线平行。
- 根据权利要求1所述的布线结构,其中所述多条第一类信号线、所述第二类信号线以及所述多个导电块由铝膜、铜膜、钼膜、钛膜、铬膜、铝钕合金膜以及铝镍合金膜所组成的组中选择的至少一种制成。
- 一种显示基板,包括衬底基板以及如权利要求1至15中任一项所述的布线结构。
- 根据权利要求16所述的显示基板,其中所述多条第一类信号线选自栅线和数据线所组成的组,并且其中所述第二类信号线选自公共电极线、时钟信号线、正极性电压信号线、负极线电压信号线和辅助放电线所组成的组。
- 一种显示装置,包括如权利要求16或17所述的显示基板。
- 一种制作如权利要求16或17所述显示基板的方法,其中所述显示基板还包括底栅型薄膜晶体管,所述底栅型薄膜晶体管包括栅极、栅绝缘层、有源层、源极和漏极,所述方法包括:在所述衬底基板上图案化第一层金属薄膜,以在所述显示基板的显示区域形成所述多条第一类信号线和所述栅极,并在所述显示基板的边框区域形成所述第二类信号线和所述多个导电块;在所述衬底基板和图案化的所述第一层金属薄膜上形成所述栅绝缘层;在所述栅绝缘层上与所述栅极相对的部分形成所述有源层;并且在所述栅绝缘层上未被所述有源层覆盖的部分以及所述有源层背离所述栅绝缘层的一侧图案化第二层金属薄膜,以在所述显示区域形成所述源极和所述漏极,并将所述多个导电块电连接到所述第二类信号线。
- 一种制作如权利要求16或17所述显示基板的方法,其中所述显示基板还包括顶栅型薄膜晶体管,所述顶栅型薄膜晶体管包括栅极、栅绝缘层、有源层、源极和漏极,所述方法包括:在所述衬底基板上形成缓冲层和所述有源层,其中所述有源层堆叠在所述缓冲层上;在所述缓冲层上未被所述有源层覆盖的部分以及所述有源层背离所述缓冲层的一侧形成所述栅绝缘层;在所述栅绝缘层背离所述衬底基板的一侧图案化第一层金属薄膜,以在所述显示基板的显示区域形成所述栅极和所述多条第一类信号线, 并在所述显示基板的边框区域形成所述第二类信号线和所述多个导电块;在所述栅绝缘层上形成层间绝缘层;并且在所述层间绝缘层上图案化第二层金属薄膜,以在所述显示区域形成所述源极和所述漏极,并将所述多个导电块电连接到所述第二类信号线。
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020141232A1 (en) * | 2001-03-27 | 2002-10-03 | Yoshiaki Saito | Magnetic memory device |
CN1920647A (zh) * | 2005-08-26 | 2007-02-28 | 群康科技(深圳)有限公司 | 液晶显示装置 |
CN104614910A (zh) * | 2015-02-13 | 2015-05-13 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
CN106952940A (zh) * | 2017-05-26 | 2017-07-14 | 上海天马有机发光显示技术有限公司 | 一种有机发光显示面板和有机发光显示装置 |
CN207148492U (zh) * | 2017-09-25 | 2018-03-27 | 京东方科技集团股份有限公司 | 一种阵列基板、显示面板及显示装置 |
CN208570607U (zh) * | 2018-09-06 | 2019-03-01 | 京东方科技集团股份有限公司 | 一种布线结构、阵列基板及显示装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7903220B2 (en) * | 2007-10-01 | 2011-03-08 | Sony Corporation | Liquid crystal display device and electronic apparatus |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020141232A1 (en) * | 2001-03-27 | 2002-10-03 | Yoshiaki Saito | Magnetic memory device |
CN1920647A (zh) * | 2005-08-26 | 2007-02-28 | 群康科技(深圳)有限公司 | 液晶显示装置 |
CN104614910A (zh) * | 2015-02-13 | 2015-05-13 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
CN106952940A (zh) * | 2017-05-26 | 2017-07-14 | 上海天马有机发光显示技术有限公司 | 一种有机发光显示面板和有机发光显示装置 |
CN207148492U (zh) * | 2017-09-25 | 2018-03-27 | 京东方科技集团股份有限公司 | 一种阵列基板、显示面板及显示装置 |
CN208570607U (zh) * | 2018-09-06 | 2019-03-01 | 京东方科技集团股份有限公司 | 一种布线结构、阵列基板及显示装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113467142A (zh) * | 2021-06-16 | 2021-10-01 | Tcl华星光电技术有限公司 | 一种显示面板及显示终端 |
CN113467142B (zh) * | 2021-06-16 | 2023-10-31 | Tcl华星光电技术有限公司 | 一种显示面板及显示终端 |
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