WO2019086745A3 - System for an atomic force microscope - Google Patents

System for an atomic force microscope Download PDF

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Publication number
WO2019086745A3
WO2019086745A3 PCT/ES2018/070709 ES2018070709W WO2019086745A3 WO 2019086745 A3 WO2019086745 A3 WO 2019086745A3 ES 2018070709 W ES2018070709 W ES 2018070709W WO 2019086745 A3 WO2019086745 A3 WO 2019086745A3
Authority
WO
WIPO (PCT)
Prior art keywords
samples
force microscope
magnetic
nanometric
lever
Prior art date
Application number
PCT/ES2018/070709
Other languages
Spanish (es)
French (fr)
Other versions
WO2019086745A2 (en
Inventor
Miriam JAAFAR RUÍZ-CASTELLANOS
José María De Teresa Nogueras
Agustina Asenjo Barahona
Javier PABLO NAVARRO
Pablo ARES GARCÍA
Cesar MAGEN DOMINGUEZ
Julio Gomez Herrero
Original Assignee
Consejo Superior De Investigaciones Científicas (Csic)
Universidad De Zaragoza
Universidad Autónoma de Madrid
Fundación Agencia Aragonesa Para La Investigacion Y El Desarrollo (Araid)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consejo Superior De Investigaciones Científicas (Csic), Universidad De Zaragoza, Universidad Autónoma de Madrid, Fundación Agencia Aragonesa Para La Investigacion Y El Desarrollo (Araid) filed Critical Consejo Superior De Investigaciones Científicas (Csic)
Publication of WO2019086745A2 publication Critical patent/WO2019086745A2/en
Publication of WO2019086745A3 publication Critical patent/WO2019086745A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Abstract

The invention relates to a system comprising a lever-tip assembly and a magnetic nanopillar located on the end of the tip of the lever-tip assembly, deposited by means of focused electron beam induced deposition. The invention also relates to a magnetic force microscope comprising said system and to the use of the system or microscope for carrying out simultaneous topographical and magnetic studies and/or handling micro and nanometric samples in liquid medium, preferably biological samples. Therefore, the present invention encompasses the area of nanotechnology, specifically the area involved in the production of devices for the characterisation of micro and nanometric samples.
PCT/ES2018/070709 2017-11-03 2018-11-05 System for an atomic force microscope WO2019086745A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ESP201731292 2017-11-03
ES201731292A ES2711860B2 (en) 2017-11-03 2017-11-03 SYSTEM FOR A MICROSCOPE OF ATOMIC FORCES

Publications (2)

Publication Number Publication Date
WO2019086745A2 WO2019086745A2 (en) 2019-05-09
WO2019086745A3 true WO2019086745A3 (en) 2019-06-20

Family

ID=66314346

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/ES2018/070709 WO2019086745A2 (en) 2017-11-03 2018-11-05 System for an atomic force microscope

Country Status (2)

Country Link
ES (1) ES2711860B2 (en)
WO (1) WO2019086745A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112960644A (en) * 2021-02-03 2021-06-15 中国科学院长春光学精密机械与物理研究所 Controllable growth method of electron beam induced carbon-based nano structure based on needle point enhancement

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0759537A2 (en) * 1995-08-18 1997-02-26 Ronald C. Gamble A scanning force microscope with optical device
US5874669A (en) * 1997-10-16 1999-02-23 Raymax Technology, Inc. Scanning force microscope with removable probe illuminator assembly
US20070014148A1 (en) * 2004-05-10 2007-01-18 The University Of North Carolina At Chapel Hill Methods and systems for attaching a magnetic nanowire to an object and apparatuses formed therefrom
US20070114400A1 (en) * 2003-04-25 2007-05-24 National Institute Of Information And Communications Technology, Incorporated Probe
WO2007077842A1 (en) * 2005-12-28 2007-07-12 Japan Science And Technology Agency Nano probe and fabrication method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006292739A (en) * 2005-03-18 2006-10-26 Univ Of North Carolina At Chapel Hill Method and system for sticking magnetic nano wire to object, and device formed therefrom

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0759537A2 (en) * 1995-08-18 1997-02-26 Ronald C. Gamble A scanning force microscope with optical device
US5874669A (en) * 1997-10-16 1999-02-23 Raymax Technology, Inc. Scanning force microscope with removable probe illuminator assembly
US20070114400A1 (en) * 2003-04-25 2007-05-24 National Institute Of Information And Communications Technology, Incorporated Probe
US20070014148A1 (en) * 2004-05-10 2007-01-18 The University Of North Carolina At Chapel Hill Methods and systems for attaching a magnetic nanowire to an object and apparatuses formed therefrom
WO2007077842A1 (en) * 2005-12-28 2007-07-12 Japan Science And Technology Agency Nano probe and fabrication method thereof

Also Published As

Publication number Publication date
ES2711860B2 (en) 2020-06-15
ES2711860A1 (en) 2019-05-07
WO2019086745A2 (en) 2019-05-09

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