WO2019037386A1 - 一种基于图像处理技术的快速评判及优化导光板发光质量的方法 - Google Patents

一种基于图像处理技术的快速评判及优化导光板发光质量的方法 Download PDF

Info

Publication number
WO2019037386A1
WO2019037386A1 PCT/CN2018/073770 CN2018073770W WO2019037386A1 WO 2019037386 A1 WO2019037386 A1 WO 2019037386A1 CN 2018073770 W CN2018073770 W CN 2018073770W WO 2019037386 A1 WO2019037386 A1 WO 2019037386A1
Authority
WO
WIPO (PCT)
Prior art keywords
light guide
guide plate
gray level
optimizing
image processing
Prior art date
Application number
PCT/CN2018/073770
Other languages
English (en)
French (fr)
Inventor
钱维莹
高淑梅
李萍
曹建军
孔艳
Original Assignee
江南大学
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 江南大学 filed Critical 江南大学
Publication of WO2019037386A1 publication Critical patent/WO2019037386A1/zh
Priority to US16/415,335 priority Critical patent/US11055839B2/en

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
    • F21S8/00—Lighting devices intended for fixed installation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0011—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form
    • G02B6/0066—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form characterised by the light source being coupled to the light guide
    • G02B6/0073—Light emitting diode [LED]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/40—Image enhancement or restoration using histogram techniques
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
    • F21Y2115/00—Light-generating elements of semiconductor light sources
    • F21Y2115/10—Light-emitting diodes [LED]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection

Definitions

  • the invention belongs to the field of LED display and illumination, and particularly relates to a method for quickly judging and optimizing the illumination quality of a light guide plate based on image processing technology.
  • the light guide plate is an important part of the side-entry LED panel light.
  • the light emitted by the LED is refracted through the bottom mesh point and then emitted from the light exit surface.
  • the light output quality determines the final lighting effect of the flat light.
  • the uniformity of the light guide plate mainly depends on the scattering area and distribution law of the dot.
  • the design of the dot is mainly achieved by adjusting the pitch, size, shape or density.
  • Uniformity is the main part of the evaluation of the light quality of the light guide.
  • the existing methods for evaluating the uniformity of the light guide plate are mainly software evaluation or multi-point measurement method.
  • the evaluation methods are different, and the optimization results are not comparable.
  • these evaluation methods do not comprehensively calculate all the brightness information of the smooth surface, and the selected pixel points. It has a certain one-sidedness, and the evaluation results are not objective. Therefore, it is crucial to propose a reasonable and effective evaluation method in the optimization process.
  • the technical problem to be solved by the present invention is to provide a method for quickly judging and optimizing the illumination quality of a light guide plate based on image processing technology.
  • the present invention adopts the following technical solutions: first, the illuminance information of the light guide plate is converted into a gray level, the gray level of all the pixel points is counted by the gray histogram, and the light guide plate is analyzed according to the gray histogram.
  • Light quality through the find function in the Matlab programming language to set the loop, you can quickly find the position of the discrete gray level in the gray histogram on the illuminance map, and then optimize the dot filling rate of the corresponding area of the bottom surface of the light guide plate. which eliminates; uniformity of light guide plate is assessed by uniformity evaluation criterion equation of P with accuracy, uniformity U is defined for all gray levels within the scope of frequency N g P around the most frequent gray level g m /N sum:
  • the illuminance diagram of the light guide plate is first regarded as a monochrome image, that is, the original illuminance values are all represented by gray scales, so that the illuminance information of all points on the light guide plate can be grayed out at one time.
  • the degree is characterized, and the gray level is stored in the form of a matrix, and the frequency of occurrence of the gray level of each point is represented in the form of a histogram, which can intuitively and comprehensively analyze the overall illumination distribution, the distribution range of the gray level.
  • the uniformity is reflected.
  • the size of the gray level can reflect the level of the illuminance value.
  • the uniformity of the light guide plate is analyzed according to the degree of dispersion of the gray level, the gray level range is reduced to improve the uniformity, and the gray level is raised as a whole to increase the light effect.
  • the gray level in the gray histogram the gray level is distributed, and the specific position on the illuminance map is determined.
  • the target illuminance value can be determined according to the extracted gray level. Find the fill rate that needs to be adjusted in any area of the bottom surface of the light guide plate.
  • the frequency N g /N of the gray level in a certain range P and the evaluation formula of the uniformity U with the accuracy P evaluation criterion are selected around the gray level g m having the highest frequency,
  • the find function in the Matlab programming language or other language sets the gray level after the calibration to find the specific position in the illuminance map.
  • the dot shape may be a truncated cone shape, a spherical shape or a conical shape.
  • the dot fill rate can be adjusted by changing the dot size, pitch or density.
  • the illuminance map may be an image obtained by software simulation or other detecting elements such as a CCD.
  • the invention has the beneficial effects that the illuminance map is grayed out and the illuminance information is stored in the matrix, and the information extraction becomes fast and convenient; the illuminance surface information is comprehensively calculated based on the gray histogram, and the gradation level distribution can be directly Analysis of the illuminating quality of the light guide plate can avoid the accidental error caused by the existing evaluation formulas of TracePro software and multi-point measurement method because it is impossible to count all the illuminance data; programming to find the specific position corresponding to the discrete large gray level, and then Optimizing the dot filling rate of the corresponding area on the bottom surface of the light guide plate is beneficial to the realization of precise and rapid optimization, and the optimization result is closer to the actual visual effect; the concept of judging precision P is proposed, so that products with different industries can have different evaluation standards.
  • FIG. 1 is a schematic view showing a model of a light guide plate used in the present invention
  • Figure 2 is an illuminance diagram before optimization
  • Figure 3 is a gray histogram of the optimized front illuminance map
  • Figure 4 is an optimized illuminance diagram
  • Figure 5 is a gray histogram of the optimized illuminance map.
  • FIG. 1 is a model diagram used in the simulation process of the present invention, taking the truncated dot mesh 1 as an example to model the light guide plate 2, the light source is the LED light source 3, and the detection screen 4 is added above the light exiting surface to detect the brightness information to obtain illumination.
  • Figure 2 grayscale histogram representation illuminance map information as shown in Figure 3, the final optimized illuminance diagram is shown in Figure 4, the optimized grayscale histogram is shown in Figure 5.
  • a method for quickly judging and optimizing the illumination quality of a light guide plate based on image processing technology the specific production steps are as follows:
  • the size of the light guide plate in the further step 1 is 184*314*0.55 mm 3 .
  • the chasing software in the further step 1 may be any one of TracePro and Lightools.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Planar Illumination Modules (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Facsimile Image Signal Circuits (AREA)

Abstract

本发明公布了一种基于图像处理技术的快速评判及优化导光板发光质量的方法。该方法将导光板的照度图看作是一幅单色图像，将照度信息转化成灰度级，用灰度直方图统计所有像素点的灰度级，根据灰度级的分布情况分析导光板的出光质量，编程找出灰度直方图中分布较离散的灰度级所在照度图上的位置，直接优化对应区域的网点填充率将其消除，并给出带有精度P评判标准的均匀度评价公式。本发明可有效提高导光板优化效率，优化结果更接近实际视觉效果。

Description

一种基于图像处理技术的快速评判及优化导光板发光质量的方法 技术领域
本发明属于LED显示和照明领域，具体涉及一种基于图像处理技术的快速评判及优化导光板发光质量的方法。
背景技术
导光板是侧入式LED平板灯的重要组成部分，将LED发出的光经底面网点折射后从出光面射出，它的出光质量决定了平板灯的最终照明效果。导光板的均匀度主要取决于网点的散射面积和分布规律，目前对网点的设计主要是通过调整间距、大小、形状或密度的方法达成的。而在优化设计过程中，对均匀度的判断环节是必不可少的，如何快速准确地评判出导光板亮度的分布情况和出现偏差点或区域的位置，是提升导光板的优化速度和质量的关键所在，它决定了设计者下一步决策的正确与否，从而影响最终的设计结果。均匀度是导光板发光质量评判的主要部分。现有对导光板均匀度的评价方法主要是软件评价或多点测量法，评价方式不一，优化结果不具可比性，且这些评价方法均没有全面统计出光面所有的亮度信息，选取的像素点具有一定片面性，评价结果客观性不足，因此，提出一种优化过程中合理有效的评价方法是至关重要的。
发明内容
本发明要解决的技术问题，是提供一种基于图像处理技术的快速评判及优化导光板发光质量的方法。
为了解决这一技术问题，本发明采用以下技术方案：先将导光板的照度信息转化成灰度级，用灰度直方图统计所有像素点的灰度级，根据灰度直方图分析导光板的出光质量，通过Matlab编程语言中的find函数设置循环就可以快速找出灰度直方图中分布较离散的灰度级在照度图上的确定位置，进而优化导光板底面对应区域的网点填充率将其消除；导光板的出光均匀性由带有精度P评判标准的均匀度评价公式评定，均匀度U定义为频率最高的灰度级g m左右各P的范围内所有灰度级的频率N g/N之和：
Figure PCTCN2018073770-appb-000001
实施本方案时，先将导光板的照度图看作是一幅单色图像，即原来的照度值均用灰度级来表征，这样可以一次性地把导光板上所有点的照度信息以灰度级表征出来，并以矩阵的形式贮存灰度级，再将各个点的灰度级出现的频率以直方图的形式表征出来，可以直观全面地分析整体的照度分布，灰度级的分布范围体现均匀度，灰度级的大小可以反映照度值的高低， 根据灰度级的离散程度分析导光板均匀度，将灰度级范围缩小提高均匀性，将灰度级整体提升以增加光效，对灰度直方图中分布较离散的灰度级，编程确定其在照度图上的具***置，根据网点填充率与照度值成正相关的关系，确定目标照度值后，可根据提取的灰度级求得导光板底面任意区域需要调整到的填充率。并基于灰度直方图在频率最高的灰度级g m左右选取一定范围P内的灰度级的频率N g/N和作为带有精度P评判标准的均匀度U的评价公式，
Figure PCTCN2018073770-appb-000002
进一步，通过Matlab编程语言中的find函数或其他语言设置需要定标的灰度级后循环找出其在照度图中的具***置。
进一步，所述的网点形状可以是圆台形、球形或圆锥形。
进一步，所述的网点填充率可通过改变网点大小，间距或密度调整。
进一步，所述的照度图可以是软件仿真、或CCD等其他探测元件获得的图像。
本发明的有益效果：本发明通过将照度图灰度化，照度信息储存于矩阵中，信息提取变得快速方便；基于灰度直方图将照度面信息全面统计出来，根据灰度级分布可以直接分析导光板的发光质量，可以避免现有TracePro软件与多点测量法所用的评价公式因为无法统计所有的照度数据而造成的偶然性误差；编程找出离散大的灰度级对应的具***置，进而优化导光板底面对应区域的网点填充率，有利于精准、快速优化的实现，且优化结果更接近实际视觉效果；提出评判精度P的概念，这样方便针对不同行业的产品可以有不同评价标准。
附图说明
图1是本发明所用导光板的模型示意图；
图2是优化前的照度图；
图3是优化前照度图的灰度直方图；
图4是优化后的照度图；
图5是优化后照度图的灰度直方图。
图中：1-网点，2-导光板，3-LED光源，4-探测屏。
具体实施方式
为了对本发明进行详细阐述，以下结合附图进行说明。但以下所举实例仅仅用于解释本发明所述的方法，不可用于判定或限制其适用范围。
实施例一
图1是本发明在仿真过程中所用的模型图，以圆台形网点1为例进行导光板2的建模，光源是LED光源3，在出光面上方加入探测屏4，探测出光亮度信息得到照度图图2，灰度直方图表征照度图信息如图3，最终优化的照度图如图4，优化后的灰度直方图如图5。
一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其具体制作步骤如下：
1、在追光软件中进行建模如图1，LED光源3排布在导光板2的一侧，出光面上方加入探测屏4，底面排布圆台形网点1，初始追光；
2、得到优化前导光板照度图2，软件评价均匀度为56.6％，光效为46.2％；将其灰度化后，以灰度直方图统计各像素点信息如图3，此时频率最高的灰度级g m＝148，当P＝20时，根据均匀度定义公式，U＝27.6％，灰度级分布范围为147；
3、在图3的基础上找出离散大的灰度级优化网点填充率将其消除，使灰度级集中分布，优化后得到照度图4，软件评价均匀性达到93％，光效为66.5％，灰度直方图5中g m＝227,当P＝20时，U＝90.3％，灰度级分布范围为90，相比优化前光效提升了20.3％，均匀度提升了62.7％，灰度级分布范围减少了57；
进一步步骤1中所述导光板的尺寸为184*314*0.55mm 3。
进一步步骤1中的追光软件可以是TracePro，Lightools中的任一种。
以上显示和描述了本发明的基本原理、主要特征和优点。上述实施例和说明书中描述的只是说明本发明的原理，在不脱离本发明精神和范围的前提下，本发明还会有各种变化和改进，这些变化和改进都落入要求保护的本发明范围内。本发明要求保护范围由所附的权利要求书及其等效物界定。

Claims (11)

  1. 一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：将导光板的照度信息转化成灰度级，用灰度直方图统计所有像素点的灰度级，根据灰度级的离散程度分析导光板的出光均匀性，通过Matlab编程语言中的find函数设置循环找出灰度直方图中分布较离散的灰度级在照度图中的位置，直接优化导光板底面对应区域的网点填充率将其消除。
  2. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：导光板的出光均匀性由带有精度P评判标准的均匀度评价公式评定，均匀度U定义为频率最高的灰度级g m左右各P的范围内所有灰度级的频率N g/N之和：
    Figure PCTCN2018073770-appb-100001
  3. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：一次性地把导光板上所有点的照度信息以灰度级表征出来，并以矩阵的形式贮存灰度级，再将各个点的灰度级出现的频率以直方图的形式表征出来。
  4. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：灰度级的分布范围体现均匀性，灰度级的大小反映照度值的高低。
  5. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：根据灰度级的离散程度分析导光板的出光均匀性，编程找出灰度直方图中分布较离散的灰度级在照度图中的位置具体为：
    根据灰度级的离散程度分析导光板均匀度，将灰度级范围缩小提高均匀性，将灰度级整体提升以增加光效，对灰度直方图中分布较离散的灰度级，编程确定分布较离散的灰度级在照度图上的具***置。
  6. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：根据网点填充率与照度值成正相关的关系，确定目标照度值后，根据提取的灰度级求得导光板底面任意区域需要调整到的网点填充率。
  7. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：所述网点的形状为圆台形、球形或圆锥形。
  8. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：所述的网点填充率通过改变网点大小，间距或密度调整。
  9. 根据权利要求1所述一种基于图像处理技术的快速评判及优化导光板发光质量的方法，其特征在于：所述的照度图为软件仿真或CCD探测元件获得的图像。
  10. 权利要求1-9任一所述的一种基于图像处理技术的快速评判及优化导光板发光质量的方法的应用。
  11. 一种基于权利要求1-9任一所述的一种基于图像处理技术的快速评判及优化导光板发光质量的方法的设备。
PCT/CN2018/073770 2017-08-25 2018-01-23 一种基于图像处理技术的快速评判及优化导光板发光质量的方法 WO2019037386A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US16/415,335 US11055839B2 (en) 2017-08-25 2019-05-17 Method for fast judging and optimizing light emitting quality of light guide plate based on image processing technology

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201710741221.8A CN107527340B (zh) 2017-08-25 2017-08-25 一种基于图像处理技术的快速评判及优化导光板发光质量的方法
CN201710741221.8 2017-08-25

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US16/415,335 Continuation US11055839B2 (en) 2017-08-25 2019-05-17 Method for fast judging and optimizing light emitting quality of light guide plate based on image processing technology

Publications (1)

Publication Number Publication Date
WO2019037386A1 true WO2019037386A1 (zh) 2019-02-28

Family

ID=60682255

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2018/073770 WO2019037386A1 (zh) 2017-08-25 2018-01-23 一种基于图像处理技术的快速评判及优化导光板发光质量的方法

Country Status (3)

Country Link
US (1) US11055839B2 (zh)
CN (1) CN107527340B (zh)
WO (1) WO2019037386A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118090168A (zh) * 2024-04-28 2024-05-28 常州星宇车灯股份有限公司 贯穿式汽车灯具发光质量的检测方法、设备及其介质

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107527340B (zh) * 2017-08-25 2020-10-09 江南大学 一种基于图像处理技术的快速评判及优化导光板发光质量的方法
CN110782456B (zh) * 2019-11-26 2023-04-18 中航华东光电有限公司 基于数字图像处理的导光板网点检测方法
CN116337879B (zh) * 2023-05-23 2023-08-04 青岛豪迈电缆集团有限公司 一种电缆绝缘表皮磨损缺陷快速检测方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120043221A (ko) * 2010-10-26 2012-05-04 주식회사 엘앤피아너스 레이저 가공기를 이용한 도광판 패턴형성 방법
CN102829435A (zh) * 2012-09-03 2012-12-19 广州创维平面显示科技有限公司 Led背光模组的扩散板网点生成方法和装置
CN103698938A (zh) * 2013-12-18 2014-04-02 京东方科技集团股份有限公司 一种网点分布方法及生成装置
CN106932853A (zh) * 2016-11-25 2017-07-07 上海三思电子工程有限公司 导光板设计方法及导光板、网点分布方法及照明器具
CN107527340A (zh) * 2017-08-25 2017-12-29 江南大学 一种基于图像处理技术的快速评判及优化导光板发光质量的方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3429387B2 (ja) * 1995-03-31 2003-07-22 株式会社エンプラス サイドライト型面光源装置
US6865325B2 (en) * 2001-04-19 2005-03-08 International Business Machines Corporation Discrete pattern, apparatus, method, and program storage device for generating and implementing the discrete pattern
TW200528849A (en) * 2004-02-27 2005-09-01 Hon Hai Prec Ind Co Ltd Light guide plate
KR100770929B1 (ko) * 2006-05-26 2007-10-26 삼성전자주식회사 도광판 및 이를 이용한 백라이트 유닛
WO2009144853A1 (ja) * 2008-05-30 2009-12-03 シャープ株式会社 照明装置、表示装置、並びに導光板
CN101672981B (zh) * 2008-09-12 2012-05-30 清华大学 导光板的设计及制造方法
CN102102829A (zh) * 2009-12-21 2011-06-22 富准精密工业(深圳)有限公司 发光二极管灯具
TWI412840B (zh) * 2010-03-22 2013-10-21 Au Optronics Corp 光源模組
CN102768404A (zh) * 2012-07-30 2012-11-07 青岛海信电器股份有限公司 一种改善暗影的方法及导光板和显示装置
CN104637455B (zh) * 2013-11-15 2019-07-09 徐赤豪 利用局部变暗背光对lcd的图像数据的调整
CN104065959A (zh) * 2014-06-20 2014-09-24 成都绿洲电子有限公司 一种基于led显示屏亮度均匀性评估方法
CN104065958A (zh) * 2014-06-20 2014-09-24 成都绿洲电子有限公司 一种led显示屏亮度采集***
US9477102B2 (en) * 2014-12-22 2016-10-25 Shenzhen China Star Optoelectronics Technology Co., Ltd Method of promoting brightness uniformity of liquid crystal module
US10488704B2 (en) * 2015-06-19 2019-11-26 Sharp Kabushiki Kaisha Lighting device and display device
CN105068173A (zh) * 2015-08-28 2015-11-18 安比斯特殊玻璃（苏州）有限公司 一种大尺寸导光板玻璃及其制作方法
CN106166649B (zh) * 2016-07-22 2018-02-27 江苏大学 一种高均匀度的激光导光板加工方法及装置
CN106273571A (zh) * 2016-08-29 2017-01-04 江西中创光电科技有限公司 一种导光板网点及其制作方法
CN106651818A (zh) * 2016-11-07 2017-05-10 湖南源信光电科技有限公司 基于改进的直方图均衡化低照度图像增强算法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120043221A (ko) * 2010-10-26 2012-05-04 주식회사 엘앤피아너스 레이저 가공기를 이용한 도광판 패턴형성 방법
CN102829435A (zh) * 2012-09-03 2012-12-19 广州创维平面显示科技有限公司 Led背光模组的扩散板网点生成方法和装置
CN103698938A (zh) * 2013-12-18 2014-04-02 京东方科技集团股份有限公司 一种网点分布方法及生成装置
CN106932853A (zh) * 2016-11-25 2017-07-07 上海三思电子工程有限公司 导光板设计方法及导光板、网点分布方法及照明器具
CN107527340A (zh) * 2017-08-25 2017-12-29 江南大学 一种基于图像处理技术的快速评判及优化导光板发光质量的方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118090168A (zh) * 2024-04-28 2024-05-28 常州星宇车灯股份有限公司 贯穿式汽车灯具发光质量的检测方法、设备及其介质

Also Published As

Publication number Publication date
CN107527340A (zh) 2017-12-29
US20190272629A1 (en) 2019-09-05
CN107527340B (zh) 2020-10-09
US11055839B2 (en) 2021-07-06

Similar Documents

Publication Publication Date Title
WO2019037386A1 (zh) 一种基于图像处理技术的快速评判及优化导光板发光质量的方法
US10755403B2 (en) Apparatus and methods for shot peening evaluation
TWI699732B (zh) 用於缺陷分類之方法及系統
TWI603074B (zh) 光學薄膜缺陷辨識方法及其系統
US11106648B2 (en) Method and system for providing a clarity grade for a gem
CN101256157B (zh) 表面缺陷检测方法和装置
CN103456021B (zh) 一种基于形态学分析的布匹瑕疵检测方法
CN103440671B (zh) 一种***检测方法及***
CN110310596B (zh) 一种oled模组的gamma调节初值预测方法及***
CN104915716B (zh) 用于带钢表面检测的照明led阵列光源的均匀优化方法
CN104951842A (zh) 一种新的油田产量预测方法
TW201824180A (zh) 檢查裝置、檢查方法以及電腦可讀取的記錄媒體
TWI507947B (zh) 修正觸控訊號的裝置、系統以及其方法
US10520424B2 (en) Adaptive method for a light source for inspecting an article
CN111189840B (zh) 近场均匀照明的纸病检测方法
CN110969153A (zh) 一种基于空间光学特性的气泡识别方法
CN109345521A (zh) 一种基于皮革表面缺陷检测的led自由曲面阵列
WO2019007164A1 (zh) 纸币涂鸦的检测方法及装置
JP2022049874A (ja) 検査装置、検査方法及び検査プログラム
CN109060314B (zh) 一种灯板光照均匀性检测方法
CN114693681A (zh) 基于光学手段的拉链生产缺陷智能检测方法及***
US20200166497A1 (en) Analysis apparatus, stratum age estimation apparatus, analysis method, stratum age estimation method, and program
CN103873786A (zh) 影像调整方法以及使用这个影像调整方法的光学导航装置
TWI723941B (zh) 缺陷分類裝置、缺陷分類程式
JP2019106696A (ja) 照明光源の調整方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 18849031

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 18849031

Country of ref document: EP

Kind code of ref document: A1

122 Ep: pct application non-entry in european phase

Ref document number: 18849031

Country of ref document: EP

Kind code of ref document: A1