WO2018210018A1 - Oled显示基板及其制造方法、显示装置及其封装方法 - Google Patents
Oled显示基板及其制造方法、显示装置及其封装方法 Download PDFInfo
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- WO2018210018A1 WO2018210018A1 PCT/CN2018/075763 CN2018075763W WO2018210018A1 WO 2018210018 A1 WO2018210018 A1 WO 2018210018A1 CN 2018075763 W CN2018075763 W CN 2018075763W WO 2018210018 A1 WO2018210018 A1 WO 2018210018A1
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- 239000000758 substrate Substances 0.000 title claims abstract description 94
- 238000000034 method Methods 0.000 title claims abstract description 35
- 238000004806 packaging method and process Methods 0.000 title claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 239000010410 layer Substances 0.000 claims abstract description 260
- 239000007787 solid Substances 0.000 claims abstract description 140
- 239000000463 material Substances 0.000 claims abstract description 45
- 239000007788 liquid Substances 0.000 claims abstract description 39
- DMLAVOWQYNRWNQ-UHFFFAOYSA-N azobenzene Chemical group C1=CC=CC=C1N=NC1=CC=CC=C1 DMLAVOWQYNRWNQ-UHFFFAOYSA-N 0.000 claims abstract description 25
- 239000002346 layers by function Substances 0.000 claims abstract description 16
- 238000004770 highest occupied molecular orbital Methods 0.000 claims abstract description 10
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 claims abstract description 10
- 238000005538 encapsulation Methods 0.000 claims description 71
- 230000001678 irradiating effect Effects 0.000 claims description 13
- 239000007772 electrode material Substances 0.000 description 7
- 238000005286 illumination Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000005525 hole transport Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000007769 metal material Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 150000003384 small molecules Chemical class 0.000 description 2
- 238000002207 thermal evaporation Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- DYLIWHYUXAJDOJ-OWOJBTEDSA-N (e)-4-(6-aminopurin-9-yl)but-2-en-1-ol Chemical compound NC1=NC=NC2=C1N=CN2C\C=C\CO DYLIWHYUXAJDOJ-OWOJBTEDSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
- H10K77/111—Flexible substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/865—Intermediate layers comprising a mixture of materials of the adjoining active layers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/17—Carrier injection layers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/841—Self-supporting sealing arrangements
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/805—Electrodes
- H10K59/8051—Anodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/141—Organic polymers or oligomers comprising aliphatic or olefinic chains, e.g. poly N-vinylcarbazol, PVC or PTFE
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2101/00—Properties of the organic materials covered by group H10K85/00
- H10K2101/30—Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present disclosure relates to the field of display technologies, and in particular, to a method for fabricating an OLED display substrate, an OLED display substrate obtained by the method, a display device including the OLED display substrate, and a packaging method and utilization of the display device The display device obtained by the packaging method.
- the OLED display device has the advantages of fast response speed, lightness and thinness, and is more and more popular among users. How to reduce the display defect of the OLED display device has become a technical problem to be solved in the art.
- An object of the present disclosure is to provide a method of manufacturing an OLED display substrate, an OLED display substrate obtained by the manufacturing method, a display device including the OLED display substrate, and a packaging method of the display device and obtained by the packaging method Display device.
- the OLED display substrate produced by the manufacturing method according to the present disclosure has a high yield
- the display device obtained by the packaging method according to the present disclosure also has a high yield.
- a first aspect of the present invention provides a method of manufacturing an OLED display substrate, including:
- Forming an initial solid buffer layer on the first electrode layer, and the material forming the initial solid buffer layer comprises a component having an azobenzene group
- the liquid buffer layer Irradiating the liquid buffer layer with visible light to cure the liquid buffer layer to obtain a final solid buffer layer, and the final solid buffer layer has a HOMO energy level between -6 eV and -4.5 eV, the final solid buffer layer
- the LUMO energy level is between -3eV and -2eV;
- a second electrode layer is formed on the light emitting functional layer.
- the material forming the initial solid buffer layer comprises a component of the formula:
- the visible light has a wavelength of 530 nm to 550 nm.
- the ultraviolet light has a wavelength of from 360 nm to 400 nm.
- an OLED display substrate comprising a substrate substrate, a first electrode layer, a light emitting function layer and a second electrode layer, which are sequentially disposed, wherein the OLED display
- the substrate further includes a final solid buffer layer disposed between the light emitting functional layer and the first electrode layer, the material forming the final solid buffer layer comprising a component having an azobenzene group, and the final solid state
- the buffer layer has a HOMO energy level between -6 eV and -4.5 eV
- the final solid state buffer layer has a LUMO energy level between -3 eV and -2 eV.
- the material forming the final solid buffer layer comprises a component of the formula:
- a display device comprising an OLED display substrate and a package cover, characterized in that the OLED display substrate is the above-described OLED display substrate according to the present disclosure.
- a packaging method of a display device including:
- the step of forming the final solid organic encapsulation layer includes:
- Forming an initial solid organic encapsulation layer the material forming the initial solid organic encapsulation layer comprising a component having an azobenzene group;
- the liquid encapsulating layer is irradiated with visible light to cure the liquid encapsulating layer to obtain a final solid organic encapsulating layer.
- the material forming the initial solid organic encapsulation layer comprises a component of the formula:
- the step of providing an OLED display substrate comprises:
- the material forming the initial solid buffer layer comprising a component having an azobenzene group, and the initial solid buffer layer has a HOMO energy level of -6 eV to -4.5 eV
- the LUMO energy level of the initial solid buffer layer is between -3eV and -2eV;
- a second electrode layer is formed on the light emitting functional layer.
- the encapsulation method further comprises the steps of providing an OLED display substrate and forming at least one layer of a final solid organic encapsulation layer:
- An inorganic encapsulation layer is formed on the OLED display substrate.
- the visible light has a wavelength of 530 nm to 550 nm.
- the ultraviolet light has a wavelength of from 360 nm to 400 nm.
- a display device including an OLED display substrate and a package cover, wherein the display device further includes at least one layer disposed between the display substrate and the package cover
- the solid organic encapsulation layer, the material forming the final solid organic encapsulation layer comprises a component having an azobenzene group.
- the display device further includes an inorganic encapsulation layer disposed between the final solid organic encapsulation layer and the OLED display substrate.
- FIG. 1 is a flow chart of a method of manufacturing an OLED display substrate provided by the present invention.
- FIG. 2 is a schematic view of an OLED display substrate provided by the present invention.
- FIG. 3 is a schematic structural view of a display device provided by the present invention.
- FIG. 4 is a flow chart of a packaging method provided by the present invention.
- FIG. 5 is a schematic structural view of another display device provided by the present invention.
- a method of manufacturing an OLED display substrate is provided, wherein, as shown in FIG. 1, the manufacturing method includes:
- Step S110 providing a substrate
- Step S120 forming a first electrode layer on the base substrate
- Step S130 forming an initial solid buffer layer on the first electrode layer, and the material forming the initial solid buffer layer comprises a component having an azobenzene group;
- Step S140 irradiating the initial solid buffer layer with ultraviolet rays to liquefy the initial solid buffer layer into a liquid buffer layer;
- Step S150 irradiating the liquid buffer layer with visible light to cure the liquid buffer layer to obtain a final solid buffer layer having a HOMO energy level between -6 eV and -4.5 eV, the final solid state
- the LUMO energy level of the buffer layer is between -3eV and -2eV;
- Step S160 forming a light emitting functional layer on the final solid buffer layer
- Step S170 forming a second electrode layer on the light emitting function layer.
- the material forming the initial solid buffer layer contains a component having an azobenzene group. Since the azobenzene group has a thermodynamically stable trans isomer and a metastable cis isomer, the azobenzene group is converted from a trans structure to a cis structure under ultraviolet light irradiation, that is, by a solid state It is converted into a liquid state; under the irradiation of visible light, it returns to the trans structure from the cis structure, that is, from a liquid state to a solid state.
- step S140 the liquid buffer layer formed by the ultraviolet light irradiation flows on the surface of the first electrode material layer, thereby covering the protrusions, particles, and the like on the surface of the first electrode material layer, and filling the cracks on the surface of the first electrode material layer, Structures such as pits. That is, the surface of the first electrode material layer is planarized by the liquid buffer layer.
- step S150 the liquid buffer layer is irradiated with visible light so that the thermodynamically metastable cis structure can be reconverted into a trans structure, thereby obtaining the final solid buffer layer.
- the planarization treatment of the first electrode material layer is completed by solid-liquid-solid conversion of the buffer layer, so that a subsequent light-emitting functional layer can be formed on the flat surface, and thus it is not easy to appear Defects such as mura, short circuit, etc., thereby improving the yield of the display device.
- the light-emitting function layer includes a hole transport layer, a light-emitting layer, and an electron transport layer which are laminated.
- the final solid buffer layer has a HOMO level between -6 eV and -4.5 eV and a LUMO level between -3 eV and -2 eV, it can be used as a hole transport layer.
- a voltage is applied across the first electrode layer and the second electrode layer, holes can be transported in the final solid buffer layer and the hole transport layer, thereby ensuring normal illumination of the OLED device.
- the light-emitting functional layer may be formed by any method such as thermal evaporation, inkjet printing, coating, or the like.
- the first electrode layer may be made of a metal material or a transparent electrode material such as an ITO material.
- the second electrode layer may be made of a metal material or a transparent electrode material.
- the first electrode layer refers to the anode layer and the second electrode layer refers to the cathode layer.
- the OLED display substrate includes a plurality of pixel units, and each of the pixel units is provided with a first electrode.
- the material of the initial solid buffer layer may be a conductive material containing a small molecule or polymer of azobenzene, a non-conductive material containing a small molecule of azobenzene group or a dopant of a conductive organic material.
- the material forming the initial solid buffer layer can be any material capable of achieving solid-liquid-solid conversion under illumination.
- the material forming the initial solid buffer layer comprises the components of the following formula I:
- the material undergoes the transformation shown below under the illumination of visible light and ultraviolet light:
- liquid buffer layer comprises a component having the formula II:
- the ultraviolet light has a wavelength of 360 nm to 400 nm, and the visible light has a wavelength of 530 nm to 550 nm.
- the base substrate may include a transparent substrate and an array of TFTs formed on the transparent substrate.
- a buffer material layer may also be disposed between the transparent substrate and the TFT array, and the buffer material layer may be made of a material having an azobenzene group.
- the buffer material layer can be irradiated with ultraviolet light to be liquefied, whereby particles on the transparent substrate can be coated, pit cracks can be filled, and the like.
- the liquid buffer layer is then irradiated with visible light to cure it, and then a TFT array is formed on the cured buffer layer.
- the TFT array thus formed does not suffer from defects such as short circuits.
- the OLED display substrate includes a base substrate 210, a first electrode layer 220, a light emitting function layer 240, and a second electrode layer 250, wherein the OLED display substrate further includes a light emitting device.
- the material of the final solid buffer layer 230 comprising a component having an azobenzene group, and the HOMO energy level of the final solid buffer layer is at - Between 6 eV and -4.5 eV, the final solid buffer layer has a LUMO energy level between -3 eV and -2 eV.
- the material of the final solid buffer layer 230 contains a component having the following formula I:
- a display device including an OLED display substrate and a package cover, wherein the OLED display substrate is the above-described OLED display substrate provided by the present disclosure.
- a packaging method of a display device wherein, as shown in FIG. 3, the packaging method of the display device includes:
- Step S310 providing an OLED display substrate
- Step S330 forming at least one layer of a final solid organic encapsulation layer
- Step S340 providing a package cover on the final layer of the final solid organic packaging layer
- the step of forming the final solid organic encapsulation layer includes:
- the material of the initial solid organic encapsulation layer comprising a component having an azobenzene group
- the liquid encapsulating layer is irradiated with visible light to cure the liquid encapsulating layer to obtain a final solid organic encapsulating layer.
- the material forming the initial solid organic encapsulation layer may be any material capable of achieving solid-liquid-solid conversion under illumination, for example, the material forming the initial solid organic encapsulation layer comprises the following formula I. Components:
- the material undergoes structural transformation as shown below under visible light and ultraviolet light:
- liquid buffer layer comprises the components shown in the following formula II:
- the OLED display substrate in the display device can be provided by the above-described manufacturing method of the OLED display substrate.
- the ultraviolet light has a wavelength of 360 nm to 400 nm
- the visible light having a solidification of the liquid organic encapsulating layer of the above material has a wavelength of 530 nm to 550 nm. .
- the final solid organic encapsulation layer is a plurality of layers
- the multilayer final solid organic encapsulation layers are stacked.
- the packaging method further includes step S320 performed between step S310 and step S330:
- An inorganic encapsulation layer is formed on the OLED display substrate.
- An inorganic encapsulation layer is disposed on the OLED display substrate, and all of the final solid organic encapsulation layers are disposed between the inorganic encapsulation layer and the encapsulation cover, and the material forming the final solid organic encapsulation layer comprises a component having an azobenzene group.
- the material of the inorganic encapsulation layer may be an oxide of silicon and/or a nitride of silicon, which may be obtained by a chemical vapor deposition method.
- the initial solid organic encapsulation layer may be formed by thermal evaporation, for example, the inorganic encapsulation layer and the initial solid organic encapsulation layer may be separately formed by using the same process chamber.
- the initial solid organic encapsulation layer is formed on a solid film layer.
- the solid state film layer may be a second electrode layer of the OLED display substrate, or may be an inorganic encapsulating material layer formed on the OLED display substrate. Since the material forming the initial solid organic encapsulation layer has an azobenzene group, it has thermodynamically stable trans and metastable cis isomers. Under the irradiation of ultraviolet light, the azobenzene group changes from a trans to a cis state. That is, it is converted from a solid state to a liquid state. The liquid organic encapsulating layer flows on the surface of the solid film layer, which can fill the micropores on the solid film layer and coat the particles on the solid film layer during the leveling process, and release the stress of the solid film layer.
- the liquid organic encapsulating material layer is then irradiated with visible light to cure it into a final solid organic encapsulating layer. Since the stress of the solid film layer has been released in step S330, the display device obtained by the packaging method provided by the present disclosure does not cause cracking of the solid film layer due to stress, thereby causing leakage of the display device, thereby Extends the life of the display unit.
- a display device including an OLED display substrate and a package cover 570, wherein the display device further includes a display between the OLED display substrate and the package cover 570 At least one layer of the final solid organic encapsulation layer 560, the material forming the final solid organic encapsulation layer 560 comprises a component having an azobenzene group.
- the display device further includes an inorganic encapsulation layer 550 disposed between the final solid organic encapsulation layer 560 and the OLED display substrate.
- Providing the inorganic encapsulation layer 550 can further improve the sealing performance, thereby extending the service life of the OLED display substrate.
- the OLED display substrate in the display device may be a display substrate having a final solid buffer layer or a conventional display substrate produced by the method of the present disclosure.
- the OLED display substrate includes a substrate substrate 310, a first electrode layer 320, a final solid buffer layer 330, a light emitting function layer 340, and a second electrode layer 350;
- the OLED display substrate includes a base substrate 510, a first electrode layer 520, a light emitting functional layer 530, and a second electrode layer 540.
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Abstract
一种OLED显示基板的制造方法,包括:提供衬底基板(S110);形成第一电极层(S120);在第一电极层上形成初始固态缓冲层(S130),初始固态缓冲层的材料的分子式上具有偶氮苯基团;利用紫外线照射初始固态缓冲层,以使得初始固态缓冲层液化为液态缓冲层(S140);利用可见光照射液态缓冲层,以使得液态缓冲层固化为最终固态缓冲层(S150),最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,最终固态缓冲层的LUMO能级在-3eV至-2eV之间;形成发光功能层(S160)。一种OLED显示基板、一种显示装置的封装方法和一种显示装置,该显示装置具有较高的良率。
Description
相关申请的交叉引用
本申请按照巴黎条约要求于2017年5月17日提交的中国专利申请No.201710347612.1的优先权,其全部内容通过引用并入本文。
本公开涉及显示技术领域,具体地,涉及一种OLED显示基板的制造方法、由该制造方法获得的OLED显示基板、包括所述OLED显示基板的显示装置、以及一种显示装置的封装方法和利用该封装方法获得的显示装置。
OLED显示装置具有响应速度快、轻薄等优点,越来越受到使用者的欢迎。如何降低OLED显示装置的显示不良成为本领域亟待解决的技术问题。
发明内容
本公开的目的在于提供一种OLED显示基板的制造方法、由该制造方法获得的OLED显示基板、包括所述OLED显示基板的显示装置、以及一种显示装置的封装方法和利用该封装方法获得的显示装置。按照本公开所述制造方法制得的OLED显示基板具有较高的良率,且按照本公开所述封装方法获得的显示装置也具有较高的良率。
为了实现上述目的,本发明的第一方面提供一种OLED显示基板的制造方法,其包括:
提供衬底基板;
在衬底基板上形成第一电极层;
在第一电极层上形成初始固态缓冲层,形成所述初始固态缓冲层的材料包含具有偶氮苯基团的组分;
利用紫外线照射所述初始固态缓冲层以使所述初始固态缓冲层 液化为液态缓冲层;
利用可见光照射所述液态缓冲层以使所述液态缓冲层固化从而获得最终固态缓冲层,且所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间;
在最终固态缓冲层上形成发光功能层;
在发光功能层上形成第二电极层。
优选地,形成所述初始固态缓冲层的材料包括下式所示的组分:
优选地,所述可见光的波长为530nm至550nm。
优选地,所述紫外光的波长为360nm至400nm。
作为本发明的第二方面,提供一种OLED显示基板,所述OLED显示基板包括依次设置的衬底基板、第一电极层、发光功能层和第二电极层,其特征在于,所述OLED显示基板还包括设置在所述发光功能层和所述第一电极层之间的最终固态缓冲层,形成所述最终固态缓冲层的材料包含具有偶氮苯基团的组分,且所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间。
优选地,形成所述最终固态缓冲层的材料包含下式所示的组分:
作为本发明的第三方面,提供一种显示装置,所述显示装置包 括OLED显示基板和封装盖板,其特征在于,所述OLED显示基板为根据本公开的上述OLED显示基板。
作为本发明的第四方面,提供一种显示装置的封装方法,其包括:
提供OLED显示基板;
形成至少一层最终固态有机封装层;
在最后一层所述最终固态有机封装层上设置封装盖板,
其中形成所述最终固态有机封装层的步骤包括:
形成初始固态有机封装层,形成所述初始固态有机封装层的材料包含具有偶氮苯基团的组分;
利用紫外线照射所述初始固态有机封装层以使所述初始固态有机封装层液化为液态封装层;
利用可见光照射所述液态封装层以使所述液态封装层固化从而获得最终固态有机封装层。
优选地,形成所述初始固态有机封装层的材料包含下式所示的组分:
优选地,提供OLED显示基板的步骤包括:
提供衬底基板;
在衬底基板上形成第一电极层;
在第一电极层上形成初始固态缓冲层,形成所述初始固态缓冲层的材料包含具有偶氮苯基团的组分,且所述初始固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述初始固态缓冲层的LUMO能级在-3eV至-2eV之间;
利用紫外线照射所述初始固态缓冲层以使所述初始固态缓冲层液化为液态缓冲层;
利用可见光照射所述液态缓冲层以使所述液态缓冲层固化从而获得最终固态缓冲层;
在最终固态缓冲层上形成发光功能层;
在发光功能层上形成第二电极层。
优选地,所述封装方法还包括在提供OLED显示基板的步骤和形成至少一层最终固态有机封装层的步骤之间进行的:
在所述OLED显示基板上形成无机封装层。
优选地,所述可见光的波长为530nm至550nm。
优选地,所述紫外光的波长为360nm至400nm。
作为本发明的第五方面,提供一种显示装置,所述显示装置包括OLED显示基板和封装盖板,其中,所述显示装置还包括设置在显示基板和封装盖板之间的至少一层最终固态有机封装层,形成所述最终固态有机封装层的材料包含具有偶氮苯基团的组分。
优选地,所述显示装置还包括设置在所述最终固态有机封装层和所述OLED显示基板之间的无机封装层。
本公开附图中:
图1是本发明所提供的OLED显示基板的制造方法的流程图;
图2是本发明所提供的OLED显示基板的示意图;
图3是本发明所提供的一种显示装置的结构示意图;
图4是本发明所提供的封装方法的流程图;
图5是本发明所提供的另一种显示装置的结构示意图。
附图标记说明
210、510:衬底基板 220、520:第一电极层
230:最终固态缓冲层 240、530:发光功能层
250、540:第二电极层 260、550:无机封装层
270、560:最终固态有机封装层
280、570:封装盖板
以下结合附图对本公开的具体实施方式进行详细说明。应当理解的是,此处所描述的具体实施方式仅用于说明和解释本公开,并不用于限制本公开。
作为本公开的第一方面,提供一种OLED显示基板的制造方法,其中,如图1所示,所述制造方法包括:
步骤S110,提供衬底基板;
步骤S120,在衬底基板上形成第一电极层;
步骤S130,在第一电极层上形成初始固态缓冲层,形成所述初始固态缓冲层的材料包含具有偶氮苯基团的组分;
步骤S140,利用紫外线照射所述初始固态缓冲层以使所述初始固态缓冲层液化为液态缓冲层;
步骤S150,利用可见光照射所述液态缓冲层以使所述液态缓冲层固化从而获得最终固态缓冲层,所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间;
步骤S160,在所述最终固态缓冲层上形成发光功能层;
步骤S170,在发光功能层上形成第二电极层。
由于形成所述初始固态缓冲层的材料包含具有偶氮苯基团的组分。由于偶氮苯基团具有热力学稳定的反式异构体和亚稳定的顺式异构体,在紫外光的照射下,偶氮苯基团由反式结构转变为顺式结构,即由固态转换为液态;而在可见光的照射下,其由顺式结构重回反式结构,即由液态转换为固态。
步骤S140中,通过紫外光照射形成的液态缓冲层在第一电极材料层的表面流动,从而包覆第一电极材料层表面的凸起、颗粒等,并填充第一电极材料层表面的裂缝、凹坑等结构。也就是说,通过液态缓冲层对第一电极材料层的表面进行了平坦化处理。
步骤S150中,利用可见光照射所述液态缓冲层使得热力学亚稳 定的顺式结构能够重新转变为反式结构,从而获得所述最终固态缓冲层。
在上述显示基板的制造方法中,通过缓冲层的固-液-固转化,完成了对第一电极材料层的平坦化处理,从而能够在平坦表面上形成后续的发光功能层,因此不容易出现云纹(mura)、短路等缺陷,从而提高了显示装置的良率。
在本公开中,发光功能层包括层叠设置的空穴传输层、发光层、电子传输层。
由于最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,LUMO能级在-3eV至-2eV之间,其可以用作空穴传输层。当在第一电极层和第二电极层上施加电压时,空穴可以在最终固态缓冲层和空穴传输层中传输,从而确保OLED器件正常发光。
在本公开中,可以利用热蒸镀、喷墨打印、涂层(coating)等任意一种方法制成所述发光功能层。
所述第一电极层可以由金属材料制成,也可以由透明电极材料(例如ITO材料)制成。第二电极层可以由金属材料制成,也可以由透明电极材料制成。通常,第一电极层是指阳极层,而第二电极层是指阴极层。所述OLED显示基板包括多个像素单元,每个像素单元内都设置有一个第一电极。
所述初始固态缓冲层的材料可以为含有偶氮苯类小分子或者聚合物的导电材料、含有偶氮苯基团类小分子或者聚合物的非导电材料与导电有机材料的掺杂物。在本公开中,形成初始固态缓冲层的材料可以为任何能够在光照下实现固-液-固转化的材料。作为一种实施方式,形成所述初始固态缓冲层的材料包含下式I所示的组分:
该材料在可见光和紫外光的照射下发生如下所示的转变:
其中,液态缓冲层包含具有下式II所示的组分:
当所述初始固态缓冲层的材料为包含上述式I所示的组分时,所述紫外光的波长为360nm至400nm,所述可见光的波长为530nm至550nm。
在本公开中,所述衬底基板可以包括透明基板和形成在所述透明基板上的TFT阵列。
优选地,还可以在透明基板和TFT阵列之间设置缓冲材料层,所述缓冲材料层可以由具有偶氮苯基团的材料制成。可以利用紫外光照射缓冲材料层,使之液化,由此可以对透明基板上的颗粒进行包覆、并对凹坑裂纹进行填充等。随后利用可见光对液态的缓冲材料层进行照射,使之固化,然后再在固化后的缓冲层上形成TFT阵列。由此形成的TFT阵列不会发生短路等缺陷。
作为本公开的第二方面,提供一种OLED显示基板,所述OLED显示基板由本公开所提供的上述方法制得。具体地,如图2所示,所述OLED显示基板依次包括衬底基板210、第一电极层220、发光功能层240和第二电极层250,其中,所述OLED显示基板还包括设置在发光功能层240和第一电极层220之间的最终固态缓冲层230,该最终固态缓冲层230的材料包含具有偶氮苯基团的组分,且所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间。
如上所述,最终固态缓冲层230的材料包含具有下式I所示的组分:
作为本公开的第三方面,提供一种显示装置,所述显示装置包 括OLED显示基板和封装盖板,其中,所述OLED显示基板为本公开所提供的上述OLED显示基板。
作为本公开的第四方面,提供一种显示装置的封装方法,其中,如图3所示,所述显示装置的封装方法包括:
步骤S310,提供OLED显示基板;
步骤S330,形成至少一层最终固态有机封装层;
步骤S340,在最后一层所述最终固态有机封装层上设置封装盖板;
其中,形成所述最终固态有机封装层的步骤包括:
在OLED显示基板上形成初始固态有机封装层,所述初始固态有机封装层的材料包含具有偶氮苯基团的组分;
利用紫外线照射所述初始固态有机封装层以使所述初始固态有机封装层液化为液态封装层;
利用可见光照射所述液态封装层以使液态封装层固化从而获得最终固态有机封装层。
在本公开中,形成所述初始固态有机封装层的材料可以为任何能够在光照下实现固-液-固转化的材料,例如,形成所述初始固态有机封装层的材料包含下式I所示的组分:
该材料在可见光和紫外光照射下发生如下所示的结构转化:
其中,液态缓冲层包含下式II所示的组分:
在该显示装置的封装方法中,可以利用上述OLED显示基板的制造方法提供显示装置中的OLED显示基板。
作为一种优选实施方式,所述紫外光的波长为360nm至400nm,对上述材料的液态有机封装层进行固化的可见光的波长为530nm至550nm。。
容易理解的是,当最终固态有机封装层为多层时,多层最终固态有机封装层层叠设置。
为了提高显示装置的密封性能,优选地,所述封装方法还包括在步骤S310和步骤S330之间进行的步骤S320:
在所述OLED显示基板上形成无机封装层。
无机封装层设置在所述OLED显示基板上,所有最终固态有机封装层均设置在无机封装层和封装盖板之间,形成最终固态有机封装层的材料包含具有偶氮苯基团的组分。
在本公开中,无机封装层的材料可以为硅的氧化物和/或硅的氮化物,可以利用化学气相沉积的方法获得所述无机封装层。本公开中,对如何形成初始固态有机封装层并没有特殊的规定。优选地,可以利用热蒸镀的方式形成所述初始固态有机封装层,例如可以利用同一个工艺腔室分别形成所述无机封装层和所述初始固态有机封装层。在根据本公开的封装方法中,所述初始固态有机封装层形成在固态膜层上。该固态膜层可以是OLED显示基板的第二电极层,也可以是形成在OLED显示基板上的无机封装材料层。由于形成所述初始固态有机封装层的材料具有偶氮苯基团,其具有热力学稳定的反式和亚稳定的顺式两种异构体。在紫外光的照射下,偶氮苯基团发生从反式转变为顺式的状态。即,由固态转换为液态。液态有机封装层在所述固态膜层的表面流动,其在流平的过程中可以填补固态膜层上的微孔并包覆固态膜层上的颗粒,同时释放固态膜层的应力。随后利用可见光对液态有机封装材料层进行照射,可以使之固化成最终固态有机封装层。由于所述固态膜层的应力已经在步骤S330中释放,利用本公开所提供的封装方法所获得的显示装置不会出现因应力而导致的固态膜层破裂进而导致显示装置漏气的现象,从而延长了显示装置的使用寿命。
作为本公开的第五方面,提供一种显示装置,所述显示装置包括OLED显示基板和封装盖板570,其中,所述显示装置还包括设置在所述OLED显示基板和封装盖板570之间的至少一层最终固态有机封装层560,形成最终固态有机封装层560的材料包含具有偶氮苯基团的组分。
优选地,所述显示装置还包括设置在最终固态有机封装层560和所述OLED显示基板之间的无机封装层550。设置无机封装层550可以进一步提高密封性能,从而延长OLED显示基板的使用寿命。
所述显示装置中的OLED显示基板可以为通过本公开方法制得的具有最终固态缓冲层的显示基板或者常规的显示基板。例如,在图4所示的具体实施方案中,OLED显示基板包括衬底基板310、第一电极层320、最终固态缓冲层330、发光功能层340、和第二电极层350;在图5中所示的具体实施方式中,OLED显示基板包括衬底基板510、第一电极层520、发光功能层530、和第二电极层540。
可以理解的是,以上实施方式仅仅是为了说明本公开的原理而采用的示例性实施方式,然而本公开并不局限于此。对于本领域内的普通技术人员而言,在不脱离本公开的精神和实质的情况下,可以做出各种变型和改进,这些变型和改进也视为本公开的保护范围。
Claims (16)
- 一种OLED显示基板的制造方法,其包括:提供衬底基板;在衬底基板上形成第一电极层;在第一电极层上形成初始固态缓冲层,所述初始固态缓冲层的材料包括分子式上具有偶氮苯基团的组分;利用紫外线照射所述初始固态缓冲层以使所述初始固态缓冲层液化为液态缓冲层;利用可见光照射所述液态缓冲层以使所述液态缓冲层固化从而获得最终固态缓冲层,所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述初始固态缓冲层的LUMO能级在-3eV至-2eV之间;在最终固态缓冲层上形成发光功能层;在发光功能层上形成第二电极层。
- 根据权利要求2所述的制造方法,其特征在于,所述可见光的波长为530nm至550nm。
- 根据权利要求2所述的制造方法,其特征在于,所述紫外光的波长为360nm至400nm。
- 一种显示装置的封装方法,其包括:提供OLED显示基板;形成至少一层最终固态有机封装层;在最后一层所述最终固态有机封装层上设置封装盖板,其中,形成所述最终固态有机封装层的步骤包括:形成初始固态有机封装层,所述初始固态有机封装层的材料包含具有偶氮苯基团的组分;利用紫外线照射所述初始固态有机封装层以使所述初始固态有机封装层液化为液态封装层;利用可见光照射所述液态封装层以使所述液态封装层固化从而获得最终固态有机封装层。
- 根据权利要求5所述的封装方法,其特征在于,提供OLED显示基板的步骤包括:提供衬底基板;在衬底基板上形成第一电极层;在第一电极层上形成初始固态缓冲层,所述初始固态缓冲层的材料包括分子式上具有偶氮苯基团的组分;利用紫外线照射所述初始固态缓冲层,以使得所述初始固态缓冲层液化为液态缓冲层;利用可见光照射所述液态缓冲层,以使得所述液态缓冲层固化为最终固态缓冲层,所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间;在最终固态缓冲层上形成发光功能层;在发光功能层上形成第二电极层。
- 根据权利要求5所述的封装方法,其特征在于,所述封装方法还包括在提供OLED显示基板的步骤和形成至少一层最终固态有机封装层的步骤之间进行的:在所述OLED显示基板上形成无机封装层。
- 根据权利要求6所述的封装方法,其特征在于,所述可见光的波长为530nm至550nm。
- 根据权利要求6所述的封装方法,其特征在于,所述紫外光的波长为360nm至400nm。
- 一种OLED显示基板,所述OLED显示基板依次包括衬底基板、第一电极层、发光功能层和第二电极层,其特征在于,所述OLED显示基板还包括设置在所述发光功能层和所述第一电极层之间的最终固态缓冲层,所述最终固态缓冲层的材料包含具有偶氮苯基团的组分,且所述最终固态缓冲层的HOMO能级在-6eV至-4.5eV之间,所述最终固态缓冲层的LUMO能级在-3eV至-2eV之间。
- 一种显示装置,所述显示装置包括OLED显示基板和封装盖板,其特征在于,所述OLED显示基板为权利要求11或12所述的OLED显示基板。
- 根据权利要求13所述的显示装置,其特征在于,所述显示 装置还包括无机封装层、封装盖板和至少一层最终固态有机封装层,所述无机封装层设置在所述OLED显示基板上,所有所述最终固态有机封装层均设置在所述无机封装层和所述封装盖板之间,制成所述最终固态有机封装层的材料包含具有偶氮苯基团的组分。
- 一种通过权利要求5所述的封装方法获得的显示装置,所述显示装置包括OLED显示基板和封装盖板,其特征在于,所述显示装置还包括至少一层最终固态有机封装层,所述最终固态有机封装层设置在所述OLED显示基板和所述封装盖板之间,制成所述最终固态有机封装层的材料的分子式上具有偶氮苯基团。
- 根据权利要求15所述的显示装置,其特征在于,所述显示装置还包括设置在所述最终固态有机封装层和所述OLED显示基板之间的无机封装层。
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