WO2017161781A1 - 假压测试方法与装置 - Google Patents

假压测试方法与装置 Download PDF

Info

Publication number
WO2017161781A1
WO2017161781A1 PCT/CN2016/089627 CN2016089627W WO2017161781A1 WO 2017161781 A1 WO2017161781 A1 WO 2017161781A1 CN 2016089627 W CN2016089627 W CN 2016089627W WO 2017161781 A1 WO2017161781 A1 WO 2017161781A1
Authority
WO
WIPO (PCT)
Prior art keywords
thin film
film transistor
pseudo
circuit board
flexible circuit
Prior art date
Application number
PCT/CN2016/089627
Other languages
English (en)
French (fr)
Inventor
熊彬
王英琪
黄俊宏
Original Assignee
武汉华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 武汉华星光电技术有限公司 filed Critical 武汉华星光电技术有限公司
Priority to US15/320,764 priority Critical patent/US10354567B2/en
Publication of WO2017161781A1 publication Critical patent/WO2017161781A1/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/13338—Input devices, e.g. touch panels
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13458—Terminal pads
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Definitions

  • the invention relates to the field of liquid crystal display, in particular to a false pressure test method and device for a liquid crystal or OLED display panel.
  • the cutting at the step of the liquid crystal display panel is a right angle cutting, so that not only the fanout area can be placed in the step area of the thin film transistor, but also the panel used for the false pressure test can be placed, as shown in FIG.
  • the test board 10 and the driver integrated circuit 11 are included therein.
  • the fixture is used to transmit the corresponding signal, so that the panel can display a partial pattern without displaying the driver IC, thereby preventing the defective product from flowing to the next stage.
  • the polarizer can not cover the entire panel, such as the panel and flip chip (Chip) On Film, CF)
  • the step of the panel is bonded, that is, the integrated IC and flexible circuit board (FPC), and the wire array (wire on array, The WOA) trace and the Fanout area are very weak.
  • the present invention aims to improve the dense wiring of the fan-out area at the step of the thin film transistor, resulting in a false-pressure test board (Cell Test Pad) can't be placed.
  • a false pressure test (Cell The method includes the following steps: when the length of the semi-finished bonded glass flexible circuit board (FOG) end is greater than a critical value, an additional dummy pressure test is required at the semi-finished bonded glass flexible circuit board end. a false pressure test board; placing a registration mark at the false pressure test board; and using a charge coupled device (charge Coupled Device) to perform a false pressure registration procedure.
  • the pseudo-pressure test transmits a signal through a multiplexing process of a partial pin of a flexible circuit board (FPC), and passes through a metal oxide semiconductor (MOS). To control the conduction of the control signal.
  • the multiplexing process includes the steps of: pulling a trace on a portion of the board of the circuit board (FPC); and placing a trace of the metal oxide semiconductor (MOS) on the trace.
  • the fabricated thin film transistor utilizes the thin film transistor to control the conduction of the signal.
  • a gate of the thin film transistor is connected to one of a thin film transistor turn-on voltage (VGH) and a thin film transistor turn-off voltage (VGL), and a source and a drain of the thin film transistor are respectively Connect the dummy voltage test number required to test the semi-finished product and some of the pins of the flexible circuit board.
  • VGH thin film transistor turn-on voltage
  • VGL thin film transistor turn-off voltage
  • a gate of the thin film transistor is turned on during the pseudo-pressure test, and is turned off when the pseudo-pressure test is not performed.
  • An embodiment of the present invention further provides a pseudo-pressure testing device comprising: a half-finished board; a flexible circuit board for performing a pseudo-pressure test; and a charge-coupled device for performing a pseudo-pressure aligning program;
  • the pseudo-pressure test transmits signals by multiplexing processing of partial pins of the flexible circuit board, and controls the conduction of signals through the metal oxide semiconductor.
  • the dummy voltage testing device after the multiplexing process comprises: a trace drawn from a portion of the pins of the flexible circuit board; and a thin film transistor made of the metal oxide semiconductor. It is placed on the go online for the conduction of the tube control signal.
  • a gate of the thin film transistor is connected to one of a thin film transistor turn-on voltage and a thin film transistor turn-off voltage, and a source and a drain of the thin film transistor are respectively connected to a test semi-finished product.
  • a gate of the thin film transistor is turned on during the pseudo-pressure test, and is turned off when the pseudo-pressure test is not performed.
  • An embodiment of the present invention further provides a liquid crystal panel comprising the above described pseudo pressure testing device.
  • the invention solves the problem of placing the false pressure test board, is beneficial to product quality control, and can also realize automatic panel inspection.
  • Figure 1 is a schematic view showing the placement of a conventional false pressure test board
  • FIG. 2 is a schematic view showing oblique cutting of a conventional thin film transistor
  • FIG. 3 is a schematic diagram of multiplexing a semi-finished bonded glass flexible circuit board according to an embodiment of the invention.
  • FIG. 4 is a flow chart of the false pressure test method of FIG. 3;
  • FIG. 5 is a flow chart of a multiplexing method according to an embodiment of the present invention.
  • FIG. 2 is a schematic diagram of oblique cutting of a conventional thin film transistor
  • FIG. 3 is a schematic diagram of multiplexing a semi-finished bonded glass flexible circuit board according to an embodiment of the present invention.
  • the panel is irregularly cut, the area of the area 20 is limited, resulting in a false pressure test board (Cell Test The placement of the Pad) is restricted. That is to say, when the glass 21 is subjected to the oblique cutting process, the area 20 on which the false pressure test plate is originally placed is greatly reduced.
  • the present invention is directed to the above-mentioned constraints, and proposes to use a semi-finished joint to bond a glass flexible circuit board (FOG, FPC on Glass) Partial pin sharing method, in conjunction with the flexible circuit board 22 pseudo-pressure test method for quality inspection of the panel (Cell).
  • FOG glass flexible circuit board
  • FCP FPC on Glass
  • the test plate 30 required for the pseudo-pressure test can be additionally added to the semi-finished FOG end if the length of the semi-finished FOG end is allowed.
  • the pin 32 of the flexible circuit board 22 portion can be multiplexed if the length of the semi-finished FOG end is not allowed. Specifically, a lead 32 of the flexible circuit board 22 is connected to the original corresponding board, and then a thin film transistor 34 (N-type thin film transistor or P-type film) is placed on the trace 33.
  • a transistor can be used, wherein a gate of the thin film transistor 34 is connected to a turn-on voltage VGH or a turn-off voltage VGL, and a source and a drain of the thin film transistor 34 are respectively connected to a dummy voltage test number S_FOG and a test piece required for testing a semi-finished product.
  • the thin film transistor 34 is made of a metal oxide semiconductor (MOS).
  • MOS metal oxide semiconductor
  • FIG. 4 is a flowchart of the pseudo-pressure test method of FIG. 3, the method comprising the following steps:
  • S400 determining whether the length of the half finished FOG end is less than a critical value; if less, proceeding to S404, otherwise proceeding to S401;
  • the critical values described above are based on the size of the panel being tested and are generally proportional to the panel area.
  • FIG. 5 is a flowchart of a multiplexing method according to an embodiment of the present invention. The method includes the following steps:
  • S501 Place a thin film transistor on the trace and use the thin film transistor to control whether the pseudo pressure test signal is transmitted to the dummy pressure test board.
  • the invention solves the problem of placing the false pressure test board, is beneficial to product quality control, and can also realize automatic panel inspection.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Human Computer Interaction (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Thin Film Transistor (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种假压测试方法，用于液晶或OLED显示面板台阶处的扇出区。该方法包括以下步骤：当半成品接合玻璃软性电路板端长度大于一临界值时，在所述半成品接合玻璃软性电路板端额外加入进行假压测试所需的一假压测试板（30）；在假压测试板（30）处放置对位标记（32）；以及使用一电荷耦合装置来进行一假压对位程序。当半成品接合玻璃软性电路板端长度小于一临界值时，假压测试是通过软性电路板（22）的部分接脚来传输信号，并通过金属氧化半导体（34）来管控制信号的导通。

Description

假压测试方法与装置 技术领域
本发明涉及一种液晶显示领域，特别是用于液晶或OLED显示面板的假压测试方法与装置。
 背景技术
在液晶显示器制造过程中，需要不断地监测产品的质量问题，从监测的过程中，及时的筛选出不合格的产品，以保证精确地生产。从监测的结果中，能了解生产过程中出现问题或存在风险的环节。目前在绑定显示驱动集成电路(Display Driver IC)和触控控制器集成电路(Touch Controller IC)之前，需要对面板进行假压测试（即Cell Test），只有画面显示效果正常的面板才会流到下一阶段进行显示驱动IC (Display Driver Integrated Circuit, DDIC)键接动作，完成数字诊断集成电路键接之后，还需要进行模块整体显示效果和其他性能测试，直到完全符合质量规范和客户要求。
目前液晶显示面板台阶处的切割都是直角切割，那么在薄膜晶体管台阶区域不仅可以放置扇出区(Fanout)的走线，还可以放置用来做假压测试的面板，如图1所示，其中包括测试板10与驱动集成电路11。配合治具输送相应的信号，这样就可以在没有显示驱动IC的情况下，使得面板能够显示部分图案(Pattern)，从而阻止不良产品流到下一个阶段。随着技术和工艺不断地提高，消费者对终端产品的外形尺寸，尤其是轻薄方面特别关注。这样就使得面板大厂不断地提高研磨工艺，从而尽可能的减薄玻璃厚度，这样就会造成玻璃的强度下降；另外，现在的背光基本都是塑料件，而且周围基本和面板边缘平齐，这样就使得玻璃没有任何缓冲保护。更为重要的是由于绑定集成(Bonding)IC和软性电路板(FPC)工艺需求，偏光片也无法贴覆整个面板，这样面板和覆晶薄膜(Chip on Film, CF)面板贴合的台阶处，即绑定集成IC和软性电路板(FPC)，线路阵列(wire on array, WOA)走线，以及扇出(Fanout)区域就非常薄弱。随着触控技术的发展，越来越多的面板厂商不断开发新技术，争取把触控集成在自家生产的模组里。一方面可以提高产品的集成度，提高客户体验，另一方面可以节约成本，包括生产制造成本，包装运输成本。上述客观事实的存在，使得现在部分面板厂商在薄膜晶体管台阶处使用斜切割处理；另外，随着面板集成触控功能，那我们也需要测试其品质。为此，本发明我们旨在改善薄膜晶体管台阶处扇出区域走线密集而导致假压测试板(Cell Test Pad)无法摆放造成的影响。
 技术问题
本发明的目的在于提供一种假压测试(Cell Test)方法，能够解决上述假压测试板无法摆放的问题。
 技术解决方案
为解决上述问题，本发明的技术方案如下：
一种假压测试(Cell Test)方法，所述方法包括以下步骤：当半成品接合玻璃软性电路板(FOG)端长度大于一临界值时，在所述半成品接合玻璃软性电路板端额外加入进行假压测试所需的一假压测试板；在所述假压测试板处放置对位标记；以及使用一电荷耦合装置(charge coupled device)来进行一假压对位程序。当半成品接合玻璃软性电路板端长度小于一临界值时，所述假压测试是通过软性电路板(FPC)的部分接脚的复用处理来传输信号，并通过金属氧化半导体(MOS)来管控制信号的导通。
较佳地，所述复用处理包括以下步骤：在所述电路板(FPC)的部分接脚多拉出一条走线；以及在所述走在线放置一由所述金属氧化半导体(MOS)所制成的薄膜晶体管并利用所述薄膜晶体管来管控制信号的导通。
较佳地，所述薄膜晶体管的一栅极接至一薄膜晶体管导通电压(VGH)与一薄膜晶体管关断电压(VGL)的其中一个，所述薄膜晶体管的一源极与一漏极分别连接测试半成品所需的假压测试号和所述软性电路板的部分引脚。
较佳地，所述薄膜晶体管的一栅极在进行假压测试时是被导通的，不进行假压测试时是被关断的。
本发明一实施例还提出了一种假压测试装置包括：一半成品板；一软性电路板，用于进行假压测试；以及一电荷耦合装置，用于进行一假压对位程序；
其中，所述假压测试是通过软性电路板的部分接脚的复用处理来传输信号，并通过金属氧化半导体来管控制信号的导通。
较佳地，进行复用处理之后的假压测试装置包括：一条走线，被拉出于所述软性电路板的部分接脚；以及一薄膜晶体管，由所述金属氧化半导体所制成，被放置于所述走在线，用于管控制信号的导通。
较佳地，所述薄膜晶体管的一栅极接至一薄膜晶体管导通电压与一薄膜晶体管关断电压的其中一个，所述薄膜晶体管的一源极与一漏极分别连接测试半成品所需的假压测试号和所述软性电路板的部分引脚。
较佳地，所述薄膜晶体管的一栅极在进行假压测试时是被导通的，不进行假压测试时是被关断的。
本发明一实施例还提供了一种液晶面板包括上述所述的假压测试装置。
 有益效果
本发明解决假压测试板摆放问题，有利于产品质量管控，还可以实现自动面板检验。
 附图说明
图1是现有的假压测试板放置示意图；
图2是现有薄膜晶体管斜切割的示意图；
图3是依据本发明一实施例对半成品接合玻璃软性电路板进行复用的示意图；
图4是图3的假压测试方法流程图；以及
图5是依据本发明所述实施例的复用方法流程图。
 本发明的最佳实施方式
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。
请参照图2与图3，图2是现有薄膜晶体管斜切割的示意图，图3是依据本发明一实施例对半成品接合玻璃软性电路板进行复用的示意图。如图2所示，面板做不规则切割时，由于区域20面积受限，导致假压测试板(Cell Test Pad)的摆放受到制约。也就是说，当对玻璃21进行斜切割处理时，原本放置假压测试板的区域20就会大幅度减小。本发明针对上述制约因素，提出利用半成品接合接合玻璃软性电路板(FOG, FPC on Glass)部分引脚共享的方式，配合软性电路板22假压测试的方法对面板(Cell)进行品质检测。
如图3所示，在半成品FOG端长度允许的情况下，可以在半成品FOG端额外加入假压测试所需的测试板30。为了能使用电荷耦合装置进行对位，需要在新增加的假压测试板30放置对位标记32，以便能更加精准的进行假压对位处理。另外，在半成品FOG端长度不允许的情况下，可以复用软性电路板22部分的引脚32。具体的做法是在原来的对应的板多拉出一条走线33連接软性电路板22的引脚32，然后在这条走线33上放置一个薄膜晶体管34（N型薄膜晶体管或者P型薄膜晶体管都可以），其中所述薄膜晶体管34的一栅极接导通电压VGH或者关断电压VGL，所述薄膜晶体管34的源极和漏极分别接测试半成品所需的假压测试号S_FOG和软性电路板22的引脚32。所述薄膜晶体管34系由金属氧化半导体(MOS)所制成。当要进行假压测试时，让所述栅极导通，而此时没有键接集成电路(IC)，所以假压测试的信号不会输入到集成电路。当测试完成后，把栅极关断，测试这条路径就不导通。键接集成电路后对应半成品接合玻璃软性电路板输入正常所需的信号即可。
请参照图4，图4是图3的假压测试方法流程图，所述方法包括以下步骤：
S400：判断一半成品FOG端的长度是否小于一临界值；如果小于，则进行S404，否则进行S401；
S401：在所述半成品FOG端额外加入进行假压测试所需的一假压测试板；
S402：在所述假压测试板处放置对位标记；
S403：使用一电荷耦合装置(charge coupled device)来进行一假压对位程序；
S404：对所述连接软性电路板上部分的引脚板实施一复用处理。
以上所述的临界值是依据受检测面板的大小而定，一般来说是与面板面积大小成正比。
请参照图5，图5是依据本发明所述实施例的复用方法流程图，所述方法包括以下步骤：
S500：在所述连接软性电路板的引脚上多拉出一条走线;
S501：在所述走线放置一薄膜晶体管并利用所述薄膜晶体管来控制所述假压测试讯号是否传送至所述假压测试板。
本发明解决假压测试板摆放问题，有利于产品质量管控，还可以实现自动面板检验。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。

Claims (12)

  1. 一种假压测试方法，包括以下步骤：
    当半成品接合玻璃软性电路板端长度大于一临界值时，在所述半成品接合玻璃软性电路板端额外加入进行假压测试所需的一假压测试板；
    在所述假压测试板处放置对位标记；以及
    使用一电荷耦合装置来进行一假压对位程序；
    当半成品接合玻璃软性电路板端长度小于一临界值时，所述假压测试是通过软性电路板的部分接脚的复用处理来传输信号，并通过金属氧化半导体来管控制信号的导通。
  2. 如权利要求1所述的假压测试方法，其中，所述复用处理包括以下步骤：
    在所述软性电路板的部分接脚多拉出一条走线；以及
    在所述走在线放置一由所述金属氧化半导体所制成的薄膜晶体管并利用所述薄膜晶体管来管控制信号的导通。
  3. 如权利要求2所述的假压测试方法，其中，所述薄膜晶体管的一栅极接至一薄膜晶体管导通电压与一薄膜晶体管关断电压的其中一个，所述薄膜晶体管的一源极与一漏极分别连接测试半成品所需的假压测试号和所述软性电路板的部分引脚。
  4. 如权利要求2所述的假压测试方法，其中，所述薄膜晶体管的一栅极在进行假压测试时是被导通的，不进行假压测试时是被关断的。
  5. 一种假压测试装置，包括：
    一半成品接合玻璃软性电路板；
    一软性电路板，用于进行假压测试；以及
    一电荷耦合装置，用于进行一假压对位程序；
    其中，所述假压测试是通过软性电路板的部分接脚的复用处理来传输信号，并通过金属氧化半导体来管控制信号的导通。
  6. 如权利要求5所述的假压测试装置，其中，进行复用处理之后的假压测试装置包括：
    一条走线，被拉出于所述软性电路板的部分接脚；以及
    一薄膜晶体管，由所述金属氧化半导体所制成，被放置于所述走在线，用于管控制信号的导通。
  7. 如权利要求6所述的假压测试装置，其中，所述薄膜晶体管的一栅极接至一薄膜晶体管导通电压与一薄膜晶体管关断电压的其中一个，所述薄膜晶体管的一源极与一漏极分别连接测试半成品所需的假压测试号和所述软性电路板的部分引脚。
  8. 如权利要求6所述的假压测试装置，其中，所述薄膜晶体管的一栅极在进行假压测试时是被导通的，不进行假压测试时是被关断的。
  9. 一种液晶面板，包括：
    一假压测试装置；
    所述一假压测试装置包括
    一半成品接合玻璃软性电路板；
    一软性电路板，用于进行假压测试；以及一电荷耦合装置，用于进行一假压对位程序；
    其中，所述假压测试是通过软性电路板的部分接脚的复用处理来传输信号，并通过金属氧化半导体来管控制信号的导通。
  10. 如权利要求9所述的一种液晶面板，其中，进行复用处理之后的假压测试装置包括：
    一条走线，被拉出于所述软性电路板的部分接脚；以及
    一薄膜晶体管，由所述金属氧化半导体所制成，被放置于所述走在线，用于管控制信号的导通。
  11. 如权利要求9所述的一种液晶面板，其中，所述薄膜晶体管的一栅极接至一薄膜晶体管导通电压与一薄膜晶体管关断电压的其中一个，所述薄膜晶体管的一源极与一漏极分别连接测试半成品所需的假压测试号和所述软性电路板的部分引脚。
  12. 如权利要求9所述的一种液晶面板，其中，所述薄膜晶体管的一栅极在进行假压测试时是被导通的，不进行假压测试时是被关断的。
PCT/CN2016/089627 2016-03-23 2016-07-11 假压测试方法与装置 WO2017161781A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/320,764 US10354567B2 (en) 2016-03-23 2016-07-11 Cell test method and cell test device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610168070.7A CN105609028B (zh) 2016-03-23 2016-03-23 假压测试方法与装置
CN201610168070.7 2016-03-23

Publications (1)

Publication Number Publication Date
WO2017161781A1 true WO2017161781A1 (zh) 2017-09-28

Family

ID=55988923

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2016/089627 WO2017161781A1 (zh) 2016-03-23 2016-07-11 假压测试方法与装置

Country Status (3)

Country Link
US (1) US10354567B2 (zh)
CN (1) CN105609028B (zh)
WO (1) WO2017161781A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180329544A1 (en) * 2017-05-10 2018-11-15 Hannstar Display (Nanjing) Corporation In-cell touch display device and methods for testing and manufacturing the same

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105609028B (zh) * 2016-03-23 2018-03-27 武汉华星光电技术有限公司 假压测试方法与装置
CN109493799B (zh) 2018-11-29 2020-09-29 昆山国显光电有限公司 显示面板一次性可编程otp调节的辅助方法及装置
CN109272913A (zh) * 2018-12-04 2019-01-25 武汉华星光电半导体显示技术有限公司 一种假压测试结构、假压测试方法及显示面板
CN110444135B (zh) * 2019-06-11 2022-12-23 重庆惠科金渝光电科技有限公司 一种显示装置及其检测方法和覆晶薄膜

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201909918U (zh) * 2010-12-30 2011-07-27 京东方科技集团股份有限公司 液晶面板检测装置
CN104360509A (zh) * 2014-11-21 2015-02-18 京东方科技集团股份有限公司 点灯测试方法及装置
CN204479877U (zh) * 2015-04-10 2015-07-15 合肥京东方光电科技有限公司 一种假压装置
US9147619B2 (en) * 2013-10-02 2015-09-29 Samsung Display Co., Ltd. Organic light-emitting display panel
CN104991358A (zh) * 2015-07-21 2015-10-21 合肥鑫晟光电科技有限公司 阵列基板及其制作方法、控制方法、显示装置
CN105609028A (zh) * 2016-03-23 2016-05-25 武汉华星光电技术有限公司 假压测试方法与装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6603467B1 (en) * 2000-10-04 2003-08-05 Industrial Technologies Research Institute Method and apparatus for LCD panel power up test
US6836260B2 (en) * 2001-07-31 2004-12-28 Eastman Kodak Company Light emitting flat-panel display
KR100682962B1 (ko) * 2006-02-03 2007-02-15 삼성전자주식회사 평판표시장치 및 그 제조방법
KR20080016271A (ko) * 2006-08-18 2008-02-21 삼성전자주식회사 유기 발광 표시 장치 및 그 제조 방법
CN103268744B (zh) * 2012-12-28 2016-12-28 厦门天马微电子有限公司 一种显示装置的测试电路
KR101987434B1 (ko) * 2013-01-15 2019-10-01 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그것의 테스트 방법
KR102334547B1 (ko) * 2014-06-17 2021-12-03 삼성디스플레이 주식회사 어레이 기판 및 이를 이용한 집적 회로 실장 방법
CN104933989B (zh) * 2015-06-26 2017-04-26 京东方科技集团股份有限公司 检测电路、像素电信号采集电路、显示面板和显示装置
US10580336B2 (en) * 2016-07-14 2020-03-03 Samsung Electronics Co., Ltd. Display driver device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201909918U (zh) * 2010-12-30 2011-07-27 京东方科技集团股份有限公司 液晶面板检测装置
US9147619B2 (en) * 2013-10-02 2015-09-29 Samsung Display Co., Ltd. Organic light-emitting display panel
CN104360509A (zh) * 2014-11-21 2015-02-18 京东方科技集团股份有限公司 点灯测试方法及装置
CN204479877U (zh) * 2015-04-10 2015-07-15 合肥京东方光电科技有限公司 一种假压装置
CN104991358A (zh) * 2015-07-21 2015-10-21 合肥鑫晟光电科技有限公司 阵列基板及其制作方法、控制方法、显示装置
CN105609028A (zh) * 2016-03-23 2016-05-25 武汉华星光电技术有限公司 假压测试方法与装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180329544A1 (en) * 2017-05-10 2018-11-15 Hannstar Display (Nanjing) Corporation In-cell touch display device and methods for testing and manufacturing the same

Also Published As

Publication number Publication date
CN105609028B (zh) 2018-03-27
US10354567B2 (en) 2019-07-16
US20180061289A1 (en) 2018-03-01
CN105609028A (zh) 2016-05-25

Similar Documents

Publication Publication Date Title
WO2017161781A1 (zh) 假压测试方法与装置
US9897830B2 (en) Display panel inspection system and inspection method for the same
CN102636928B (zh) 液晶显示面板配线区线路结构及液晶显示面板测试方法
US9483969B2 (en) Liquid crystal panel, and testing circuit and testing method thereof
US9835917B2 (en) Baseplate circuit and display panel
US20150077681A1 (en) Liquid crystal display panel
WO2016011781A1 (zh) 显示装置
WO2018196473A1 (zh) 液晶显示面板封装结构及其绑定测试方法
US11158221B2 (en) Display panel, panel lighting test method of the same and display device
CN106200161A (zh) 液晶显示面板***设计电路及采用该电路的液晶显示面板
US9983450B2 (en) GOA circuit module, method for testing the same, display panel and display apparatus
WO2014023049A1 (zh) 测试装置及测试方法
WO2015000264A1 (zh) 显示模组的检测电路及其制作方法、显示模组
US20160343279A1 (en) Display device
WO2013086729A1 (zh) 测试***
US20130271168A1 (en) Wiring structure of wiring area on liquid crystal displaying panel and testing method of liquid crystal displaying panel
WO2016206143A1 (zh) 基于ltps的传输门多路复用电路及液晶显示面板
WO2016008223A1 (zh) 液晶面板及其制备方法
KR20110032328A (ko) 액정표시장치
WO2020113714A1 (zh) 一种触控屏、显示装置
CN106205444A (zh) 显示面板及其检测方法
KR101146526B1 (ko) 라인 온 글래스형 액정표시장치의 데이터 구동부 및 이를포함하는 액정표시장치
KR100692691B1 (ko) 액정표시장치
KR100952386B1 (ko) 액정 표시 모듈의 연결 방법
CN110827729B (zh) 检测结构、显示面板及制作方法、检测方法

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 15320764

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 16895131

Country of ref document: EP

Kind code of ref document: A1

122 Ep: pct application non-entry in european phase

Ref document number: 16895131

Country of ref document: EP

Kind code of ref document: A1