WO2017016141A1 - 一种多通道可调激光器的性能测试装置 - Google Patents

一种多通道可调激光器的性能测试装置 Download PDF

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Publication number
WO2017016141A1
WO2017016141A1 PCT/CN2015/097439 CN2015097439W WO2017016141A1 WO 2017016141 A1 WO2017016141 A1 WO 2017016141A1 CN 2015097439 W CN2015097439 W CN 2015097439W WO 2017016141 A1 WO2017016141 A1 WO 2017016141A1
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WIPO (PCT)
Prior art keywords
beam splitter
etalon
photodetector
channel
tunable laser
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PCT/CN2015/097439
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English (en)
French (fr)
Inventor
钱坤
傅焰峰
汤学胜
唐毅
陈义宗
张玓
胡胜磊
马卫东
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武汉光迅科技股份有限公司
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Priority to US15/748,005 priority Critical patent/US10145731B2/en
Priority to JP2018524513A priority patent/JP6491399B2/ja
Publication of WO2017016141A1 publication Critical patent/WO2017016141A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1213—Filters in general, e.g. dichroic, band
    • G01J2003/1217—Indexed discrete filters or choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J2003/423—Spectral arrangements using lasers, e.g. tunable

Definitions

  • the invention relates to a low-cost output performance testing device for a multi-channel tunable laser, in particular to a test device for integrating various output characteristics of a test multi-channel tunable laser, and the test device of the invention is applicable Multi-channel tunable laser performance test in DWDM communication system, the invention belongs to the field of communication.
  • the optical network will be oriented towards the IP network, can integrate more services, can flexibly allocate resources, and have higher reliability.
  • the high-speed and large-capacity optical communication system is the development goal of the future optical transmission network, 100Gbit/
  • the communication system of s has begun to be gradually commercialized, and the communication system of 400 Gbit/s has become an inevitable development trend.
  • the increase in transmission rate places higher demands on the laser as a communication source.
  • Tunable lasers can be implemented in a variety of implementations such as monolithic integration, external cavity, and hybrid integration.
  • high-speed communication systems of 100 Gbit/s mostly use multi-channel tunable lasers with C-band output wavelengths conforming to ITU-T standard wavelengths and channel spacing of 50 GHz.
  • this kind of laser has about 100 channels.
  • the traditional test method mostly uses the power meter to test the laser output power, the wavelength meter to test the laser output wavelength, and the multi-meter test scheme of the side mode suppression ratio of the spectrometer test laser, so that the test work faces many problems such as high instrument, high cost and long time.
  • this work proposes a multi-channel tunable laser test device that integrates multiple performance test functions of the tunable laser, reducing the cost of the test system, reducing the number of test instruments, and being simple to use; It can realize automatic laser test system, effectively improve test efficiency, and can be used for mass production test of tunable laser.
  • the object of the present invention is to overcome the technical defects existing in the prior art solutions, and to test a multi-channel tunable laser tester.
  • a performance test device for multi-channel tunable lasers is proposed, which can simultaneously test the output characteristics of multi-channel tunable lasers such as output power, output wavelength, and side mode suppression ratio, and can be further combined with a computer to realize automatic test. system.
  • a performance testing device for a multi-channel tunable laser comprising a collimating coupling lens, a first beam splitter, a power testing unit, a side mode suppression ratio test unit, a control and driving unit, a control and driving unit with the same power test unit, and a side
  • the mode suppression is connected to the test unit control;
  • the power test unit includes a second beam splitter, a first light detector, the first light detector is located in the transmitted light path of the second beam splitter, and the second beam splitter is located in the first beam splitter The reflected light path;
  • the side mode suppression ratio test unit includes a third beam splitter, a fourth beam splitter, a first etalon, a second etalon, a third etalon, a second photodetector, a third photodetector, a fourth photodetector;
  • the third beam splitter is located in a reflected light path of the second beam splitter, and the reflected beam path of the third beam splitter sequentially
  • the first photodetector of the power test unit needs to be scaled, and the calibration method is: establishing a correspondence between input optical power of the performance test device of the multi-channel tunable laser and sampling photocurrent of the first photodetector .
  • the method further includes a wavelength testing unit disposed on the transmitted light path of the first beam splitter, the wavelength testing unit and the control being connected to the driving unit, wherein the wavelength testing unit comprises a fifth beam splitter, a sixth beam splitter, a tunable optical filter, and a
  • the wavelength testing unit comprises a fifth beam splitter, a sixth beam splitter, a tunable optical filter, and a
  • the four etalon, the fifth photodetector, the sixth photodetector, the seventh photodetector, the transmitted optical path of the fifth beam splitter are sequentially provided with a tunable optical filter, a fifth photodetector; and the fifth splitter
  • the reflected light path is provided with a sixth beam splitter
  • the transmitted light path of the sixth beam splitter is provided with a seventh light detector
  • the reflected light path of the sixth beam splitter is sequentially provided with a fourth etalon and a sixth light detector.
  • the wavelength tunable range of the tunable optical filter is equal to or greater than a wavelength tunable range of the tunable laser to be tested, and the 3 dB bandwidth of the tunable optical filter filter band is smaller than between the two channels of the tunable laser to be tested interval.
  • the tunable optical filter uses a tunable filter composed of a grating and a mechanically adjustable plane mirror or a liquid crystal tunable filter or a temperature-adjustable thermo-optic tunable filter.
  • the first etalon, the second etalon, the third etalon, and the fourth etalon are air gap etalons for plating a partial reflection film on both end faces.
  • the first beam splitter, the second beam splitter, the third beam splitter, the fourth beam splitter, the fifth beam splitter, and the sixth beam splitter adopt a film splitting sheet or a cemented cube prism. Beamer.
  • the third beam splitter and the fourth beam splitter of the side mode suppression ratio test unit are used to distribute the incident light power of the unit The rate of the splitter combination.
  • the splitting ratio of the third beam splitter adopts a ratio of reflected light to transmitted light of 1:2
  • the split ratio of the fourth splitter adopts a ratio of reflected light to transmitted light of 1:1.
  • a computer that can implement setting a multi-channel tunable laser output laser and recording and testing the current channel laser output characteristics.
  • the device of the invention integrates the power test function, the wavelength test and the side mode suppression ratio test of the multi-channel tunable laser into one body, and the test device is simple and effectively reduced compared with the traditional multi-test instrument test method.
  • the performance test device proposed by the invention can build a multi-channel tunable laser automatic test system with a computer, and can improve the test efficiency of the multi-channel tunable laser in the mass production test.
  • FIG. 1 is a schematic structural view of a performance testing device for a multi-channel tunable laser according to the present invention
  • FIG. 2 Schematic diagram of the optical power test unit of the present invention
  • Figure 3 Schematic diagram of the test of the side mode suppression ratio test unit of the present invention.
  • Figure 4 (a) - schematic diagram of the wavelength coarse measurement of the optical wavelength test unit of the present invention
  • 601 third beam splitter
  • 602 first etalon
  • 605 second etalon
  • 606 third photodetector
  • 607 the third etalon
  • 608 the fourth photodetector
  • 701 the fifth beam splitter
  • 702 the tunable optical filter
  • 703 the fifth photodetector
  • 704 the sixth beam splitter
  • FIG. 1 is a structural diagram of a performance testing device for a multi-channel tunable laser according to the present invention.
  • the performance testing device 2 of the multi-channel tunable laser is mainly composed of a collimating coupling lens 3 for beam collimation, and a first point.
  • the beam splitter 4, the power test unit 5, the side mode suppression ratio test unit 6, the wavelength test unit 7, and the control and drive unit 8 are constructed.
  • the control and driving unit 8 is connected to the power test unit 5, the side mode suppression ratio test unit 6, and the wavelength test unit 7.
  • Each test unit feeds back the test signal to the control and drive unit 8, and the test and control unit 8 outputs the laser according to the feedback signal. Characteristic indicators and control each test unit for the next test.
  • the power test unit 5 is composed of a second beam splitter 501, a first light detector 502, a second beam splitter 501 is located in the reflected beam path of the first beam splitter 4, and the first light detector 502 is located in the second beam splitter.
  • the side mode suppression ratio test unit 6 is located in the reflected light path of the second beam splitter 501.
  • the second beam splitter 501 divides the incident light split from the first beam splitter 4 into two parts according to a certain ratio, and the transmitted light is incident on the first light detector 502 for testing the optical power, and the reflected light incident side mode is suppressed.
  • test unit 6 divides the incident light split from the first beam splitter 4 into two parts according to a certain ratio, and the transmitted light is incident on the first light detector 502 for testing the optical power, and the reflected light incident side mode is suppressed.
  • test unit 6 divides the incident light split from the first beam splitter 4 into two parts according to a certain ratio, and the transmitted light is incident on the first light detector 50
  • the side mode suppression ratio test unit 6 includes a third beam splitter 601, a fourth beam splitter 604, a first etalon 602, a second etalon 605, a third etalon 607, a second photodetector 603, and a third light. 606, fourth photodetector 608.
  • the third beam splitter 601 and the fourth beam splitter 604 are used for the distribution of the incident optical power of the side mode suppression ratio test unit 6.
  • the third beam splitter 601 is located in the reflected light path of the second beam splitter 501.
  • the reflected light of the third beam splitter 601 is incident on the first etalon 602, and the second light detector 603 is placed on the first etalon 602.
  • the transmitted light of the third beam splitter 601 is incident on the fourth beam splitter 604.
  • the reflected light of the fourth beam splitter 604 is incident on the second etalon 605, and the third photodetector 606 is placed after the second etalon 605 for detecting the optical power transmitted through the second etalon 605; the fourth beam splitter 604
  • the transmitted light is incident on the third etalon 607, and the fourth photodetector 608 is placed in the third etalon 607 for detecting the optical power transmitted through the fourth etalon 608.
  • the free spectral range of the first etalon 602, the second etalon 605, and the third etalon 607 is three times the channel spacing of the tunable laser to be tested, and the closest distance between the transmission peaks of any two etalons is The channel spacing of the tunable laser 1 to be tested.
  • the wavelength testing unit 7 is located in the transmission optical path of the first beam splitter 4, the wavelength testing unit 7 is connected to the control and driving unit 8, and the wavelength testing unit 7 includes a fifth beam splitter 701, a sixth beam splitter 704, and dimming.
  • the filter 702, the fourth etalon 705, the fifth photodetector 703, the sixth photodetector 706, the seventh photodetector 707, and the transmitted optical path of the fifth beam splitter 701 are provided with a tunable optical filter 702,
  • the five-photodetector 703 is placed behind the tunable optical filter 702; the reflected optical path of the fifth splitter 701 is provided with a sixth splitter 704, and the transmitted optical path of the sixth splitter 704 is provided with a seventh photodetector 707.
  • the reflected light path is provided with a fourth etalon 705, and the sixth light detector 706 is placed behind the fourth etalon 705.
  • the wavelength testing unit 7 is composed of a wavelength coarse measuring portion and a wavelength fine measuring portion, wherein the wavelength coarse measuring portion is used to determine the output wavelength of the laser to be tested (output channel), and the wavelength precision measuring portion is used to test the precise output wavelength of the laser to be tested.
  • the fifth beam splitter 701 divides the incident light of the wavelength testing unit 7 into two beams at a certain ratio, and the transmitted light is incident on the wavelength measuring portion, and the reflected light is incident on the wavelength measuring portion.
  • the wavelength coarse measuring portion of the wavelength testing unit 7 is composed of a tunable optical filter 702 and a fifth optical detector 703, and the transmitted light of the fifth beam splitter 701 is incident on the tunable optical filter 702 for filtering.
  • the fifth optical detector 703 After being placed in the tunable filter 702, it is used to test the optical power transmitted through the tunable optical filter 702.
  • the wavelength tunable range of the tunable optical filter 702 is equal to or greater than the wavelength tunable range of the tunable laser 1 to be tested, and the 3 dB bandwidth of the filter band should be smaller than the interval between the two channels of the tunable laser. There is one and only one laser channel in the 3dB bandwidth.
  • the wavelength refining portion of the wavelength testing unit 7 is composed of a sixth beam splitter 704, a fourth etalon 705 and a sixth photodetector 706, a seventh photodetector 707, and the sixth beam splitter 704 will finely adjust the incident wavelength.
  • the light is divided into two beams according to a certain ratio, the transmitted light is incident on the seventh photodetector 707, the reflected light is incident on the fourth etalon 705, and the sixth photodetector 706 is placed on the fourth etalon 705 for detecting the transmission.
  • the free spectral range of the fourth etalon 705 is the same as the channel spacing of the tunable laser 1 to be tested, and the maximum slope point of the transmission peak corresponds to the standard channel output wavelength of the tunable laser.
  • the tunable optical filter 702 adopts a tunable filter with a combination of a grating and a mechanically adjustable plane mirror, or a liquid crystal tunable filter, and a temperature-adjustable thermo-optic tunable filter. If the tunable filter adopting the combination of grating and mechanically adjustable plane mirror is to use the spectroscopic principle of the grating, the angle of the plane mirror and the grating is changed by mechanically tuning the plane mirror to select different grating diffraction angles to change the center wavelength of the filter strip.
  • thermo-optic tunable filter the photoelectric characteristics of the liquid crystal are utilized, and the center wavelength of the filter band is changed by changing the refractive index of the liquid crystal by changing the voltage applied to the liquid crystal filter. If a thermo-optic tunable filter is used, the thermo-optic characteristics of the material are utilized, and the center wavelength of the filter band is changed by changing the material temperature to change the refractive index of the material.
  • the first beam splitter 4, the second beam splitter 501, the third beam splitter 601, the fourth beam splitter 604, the fifth beam splitter 701, and the sixth beam splitter 704 are configured to achieve a splitting function.
  • the performance of the laser input multi-channel tunable laser for the tunable laser 1 pigtail output to be tested is 2
  • the direct coupling lens 3 is collimated into a parallel beam, and is split by the first beam splitter 4 into the incident power test unit 5, the side mode suppression ratio test unit 6, and the wavelength test unit 7.
  • the test units are respectively The power characteristics, side mode suppression ratio characteristics and wavelength characteristics of the laser output laser are tested, and the test information is fed back to the control and drive unit 8 for analysis, and the test result is output.
  • the computer 9 can be used to set up an automatic test system for a multi-channel tunable laser, the computer 9 sets a multi-channel tunable laser 1 to output different channel lasers, and the performance test device 2 of the multi-channel tunable laser can measure the output characteristics of each channel and Recorded in the computer 9, the computer 9 can realize the next channel laser output of the multi-channel tunable laser after the test is completed. .
  • the power test function of the power test unit 5 is primarily implemented by the first photodetector 502.
  • the performance test device 2 of the multi-channel tunable laser needs to pre-calibrate the first photodetector 502 before use.
  • the optical power test unit test schematic diagram is shown in Figure 2. Before the test device is used, different laser output powers are input to the performance test device 2 in a certain step size within the measurable power range of the test device, and the photocurrent sample values of the first photodetector 502 corresponding to each input power are recorded. .
  • the input optical power-PD1 sampling value relationship curve that is, the curve a in the figure, is fitted to the photocurrent sampling value PD1 of the first photodetector 502, and stored in the control and driving unit 8.
  • the control and driving unit 8 can calculate the current output optical power of the tunable laser 1 to be tested at this time according to the curve a as Pout.
  • the third beam splitter 601 and the fourth beam splitter 604 are provided as a beam splitter combination for distributing the incident light power of the unit.
  • the ratio of the splitting light to the transmitted light of the third beam splitter 601 is 1:2
  • the ratio of the splitting ratio of the fourth beam splitter 604 is 1:1, that is, the ratio of the reflected light to the transmitted light is 1:1.
  • the three-beam splitter 601 and the fourth beam splitter 604 divide the optical power distributed from the beam splitter 501 into three equal-sized pieces, respectively incident through the first etalon 602, the second etalon 605, and the third etalon 607.
  • the three etalons are required to be coated with reflective films of the same reflectivity and have the same thickness, and the three photodetectors have the same responsiveness.
  • the free spectral range of the first etalon 602, the second etalon 605, and the third etalon 607 is three times the channel spacing of the tunable laser to be tested, and the closest distance between the transmission peaks of any two etalons is The channel spacing of the tunable laser 1 to be tested.
  • the first etalon 602, the second etalon 605, and the third etalon 607 each employ an air gap etalon plated with a partially reflective film on both ends to reduce the influence of ambient temperature changes on the etalon transmission spectrum.
  • the test principle diagram of the side mode suppression ratio test unit 6 is as shown in FIG. Assuming that the tunable laser to be tested has n output channels, the peak wavelength of the transmission peak of the first etalon 602 corresponds to the output wavelengths of channel 1, channel 4, channel 7, channel 3*i+1 (i is an integer). The peak wavelength of the transmission peak of the second etalon 605 corresponds to the output wavelength of the channel 2, the channel 5, the channel 8 , the channel 3*i+2, and the peak wavelength of the transmission peak of the third etalon 607 and the channel 3 and the channel 6, channel 9 ... channel 3 * i + 3 output wavelength corresponding.
  • the second etalon 605 is used for checking The main frequency output power of the laser is measured.
  • the first etalon 602 is used to detect the side mode power of the short-wave direction of the main frequency of the laser
  • the third etalon 607 is used to detect the side mode power of the long-wave direction of the main frequency of the laser.
  • the second photodetector 603, the third photodetector 606, and the fourth photodetector 608 respectively detect the magnitude of the photocurrent at this time, and feed back the three photocurrent values to the control and drive unit 8 to find two of the larger
  • the current value is calculated by calculating the ratio of the side mode suppression ratio.
  • the test principle diagram of the wavelength coarse measurement portion of the wavelength test unit 7 is as shown in Fig. 4(a).
  • the tunable optical filter 702 traverses the entire wavelength tunable range in a certain step step from the short-wave direction under the driving of the control and driving unit 8. Assuming that the output wavelength of the laser to be tested is ⁇ 0, the tunable optical filter is near ⁇ 0.
  • the transmittance curve of the 702 is subjected to A ⁇ B ⁇ C, and the sampling photocurrent of the fifth photodetector 703 obtains the maximum value when the transmission peak of the tunable optical filter 702 corresponds to the laser output wavelength ⁇ 0, and the control and driving unit 8
  • the driving condition of the tunable optical filter 702 at this time is recorded, and the transmission peak wavelength of the tunable optical filter 702 corresponding to the driving condition is the coarse measurement wavelength of the laser.
  • the test schematic of the wavelength precision measurement section is shown in Figure 4(b).
  • the fourth etalon 705 adopts an air gap etalon plated with a partially reflective film on both end faces, and the slope of the transmission spectrum is the largest corresponding to the standard output wavelength of the laser to be tested. It is assumed that the optical power incident on the seventh photodetector 707 is P 1 , the sampling photocurrent is I 1 , the optical power incident on the sixth photodetector 706 through the fourth etalon 705 is P 2 , and the sampling photocurrent is I 2 .
  • the test device uses the relationship between the input wavelength and the photocurrent ratio m before use, and the deviation ⁇ between the output wavelength and the standard wavelength can be estimated according to the size of m during the test. Then, according to the coarse measurement wavelength measured by the wavelength measurement part, the standard channel output wavelength closest to the standard is found, and the wavelength deviation ⁇ measured by the precision measurement part is the precise wavelength of the laser measured by the test device.
  • the commercial high-speed communication system requires a wavelength accuracy of ⁇ 20 pm or even ⁇ 12 pm for a multi-channel tunable laser, so the accuracy of the tunable laser output wavelength is very important.
  • the performance testing device 2 of the multi-channel tunable laser proposed by the present invention incorporates a wavelength measuring portion to improve the wavelength testing accuracy of the testing device. It should be noted that the side mode of the multi-channel tunable laser to be tested to which the present invention is applied only appears in a specific channel spaced apart from one channel adjacent to its output channel.

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Abstract

一种多通道可调谐激光器的性能测试装置，包括准直耦合透镜(3)、第一分光束器(4)、功率测试单元(5)、边模抑制比测试单元(6)、波长测试单元(7)、控制与驱动单元(8)，第一分光束器(4)的反射光路设置功率测试单元(5)；第一分光束器(4)的透射光路设置波长测试单元(7)，第二分光束器(501)的反射光路设置边模抑制比测试单元(6)，控制与驱动单元(8)同功率测试单元(5)、边模抑制比测试单元(6)、波长测试单元(7)控制相连，该性能测试装置结构简单、成本低、使用便捷。

Description

一种多通道可调激光器的性能测试装置 技术领域
本发明涉及一种低成本的多通道可调谐激光器的输出性能测试装置，具体地说是一种将测试多通道可调激光器的多种输出特性集成于一体的测试装置，本发明测试装置可适用于DWDM通信***中多通道可调谐激光器性能测试，本发明属于通信领域。
背景技术
随着各种新兴数据应用的发展，用户对高清视频和高速数据业务的需求迅速增加，对网络带宽的需求也随之迅速增大，使得宽带光纤接入网络的建设显得更为迫切，城域网络和骨干网络需要更高的速率。光网络将朝着面向IP网、能融入更多业务、能灵活进行资源配置、具有更高可靠性的方向发展、高速率、大容量的光通信***是未来光传送网络的发展目标，100Gbit/s的通信***已开始逐步商用，而400Gbit/s的通信***已成为必然的发展趋势。传输速率的提高对作为通信光源的激光器提出了更高的要求。若采用传统的固定波长激光器，不但需要多个激光器，增加了***的成本，而且限制了光网络的扩展及网络灵活性。可调谐激光器的使用，不仅可有效减少激光器模块数量、降低成本，还可以增强网络的功能性，是高速相干通信***光源的最佳选择方案。可调谐激光器可以有单片集成、外腔、混合集成等多种实现形式。
目前，100Gbit/s的高速通信***多采用C波段输出波长符合ITU-T标准波长、通道间隔为50GHz的多通道可调谐激光器。通常这种激光器具有100个通道左右，根据***使用要求，需要测试激光器各通道输出功率、输出波长、边模抑制比等多种输出特性，使得激光器的测试工作非常繁琐。传统测试方法多采用功率计测试激光器输出功率、波长计测试激光器输出波长、光谱仪测试激光器的边模抑制比的多仪表测试方案，使测试工作面临仪表多、成本高、耗时长等问题。针对这些问题，本工作提出了一种多通道可调谐激光器测试装置，将可调谐激光器的多种性能测试功能集成于一体，降低了测试***成本、减少测试仪表数量、使用简捷；通过计算机的控制可实现激光器自动测试***，有效提高测试效率，可用于可调谐激光器的批量生产测试工作。
发明内容
本发明的目的是克服现有技术方案存在的技术缺陷，针对多通道可调谐激光器测试工 作，提出了一种多通道可调谐激光器的性能测试装置，该装置可同时测试多通道可调激光器的输出功率、输出波长、边模抑制比等输出特性，并可进一步与计算机组合实现自动测试***。
本发明所采用的技术方案是：
一种多通道可调谐激光器的性能测试装置，包括准直耦合透镜、第一分光束器、功率测试单元、边模抑制比测试单元、控制与驱动单元，控制与驱动单元同功率测试单元、边模抑制比测试单元控制相连；功率测试单元包括第二分光束器、第一光探测器，第一光探测器位于第二分光束器的透射光路，第二分光束器位于第一分光束器的反射光路；边模抑制比测试单元包括第三分光束器、第四分光束器、第一标准具、第二标准具、第三标准具、第二光探测器、第三光探测器、第四光探测器；所述第三分光束器位于第二分光束器的反射光路中，第三分光束器的反射光路依次设置第一标准具、第二光探测器；第三分光束器的透射光路设置有第四光分束器，第四分光束器的反射光路依次设置第二标准具、第三光探测器；第四分光束器的透射光路依次设置第三标准具、第四光探测器；所述第一标准具、第二标准具、第三标准具的自由光谱范围是待测所述可调谐激光器通道间隔的三倍，任意两个标准具的透射峰之间的最近距离为所述待测可调谐激光器的通道间隔。
所述功率测试单元的第一光探测器需定标，其定标方法为：建立所述该多通道可调谐激光器的性能测试装置的输入光功率与第一光探测器采样光电流的对应关系。
进一步包括设置于第一分光束器透射光路的波长测试单元，波长测试单元和控制与驱动单元相连接，波长测试单元包括第五分光束器、第六分光束器、可调光滤波器、第四标准具、第五光探测器、第六光探测器、第七光探测器，第五分光束器的透射光路依次设置可调光滤波器、第五光探测器；第五分光束器的反射光路设置有第六分光束器，第六分光束器的透射光路设置第七光探测器，第六分光束器的反射光路依次设置第四标准具、第六光探测器。
所述可调光滤波器的波长可调谐范围等于或大于待测可调谐激光器的波长可调谐范围，所述可调光滤波器滤波带的3dB带宽小于待测可调谐激光器的两个通道之间间隔。
所述可调光滤波器采用光栅和机械可调平面镜组合而成的可调谐滤波器或者采用液晶可调谐滤波器或者采用温度可调热光可调谐滤波器。
所述第一标准具、第二标准具、第三标准具、第四标准具为两端面镀部分反射膜的空气隙标准具。
所述第一分光束器、第二分光束器、第三分光束器、第四光分束器、第五光分束器、第六光分束器采用薄膜分束片或者胶合立方棱镜分束器。
所述边模抑制比测试单元的第三分光束器、第四分光束器是用于分配该单元的入射光功 率的分光束器组合。
所述第三分光束器的分光比采用反射光与透射光比值为1:2，第四分光束器的分光比采用反射光与透射光比值为1:1。
进一步设置有计算机，所述计算机可实现设置多通道可调谐激光器输出激光，并且记录测试当前通道激光输出特性。
本发明具有以下优点和积极效果：
1)本发明装置将多通道可调谐激光器的功率测试功能、波长测试和边模抑制比测试多种测试功能集成于一体，与传统的多测试仪表测试方法相比，测试装置简单，有效的降低了测试***的成本；
2)本发明提出的性能测试装置可以与计算机搭建多通道可调谐激光器自动测试***，在批量生产测试中可提高多通道可调谐激光器测试效率。
附图说明
图1—本发明一种多通道可调谐激光器的性能测试装置的结构示意图；
图2—本发明光功率测试单元测试原理图；
图3—本发明边模抑制比测试单元测试原理图；
图4(a)—本发明光波长测试单元波长粗测原理图；
图4(b)—本发明光波长测试单元波长精测原理图；
其中：
1—待测可调谐激光器；
2—多通道可调谐激光器的性能测试装置；
3—准直耦合透镜；
4—第一分光束器；
5—功率测试单元；
501—第二分光束器；      502—第一光探测器；
6—边模抑制比测试单元；
601—第三分光束器；      602—第一标准具；
603—第二光探测器；      604—第四分光束器；
605—第二标准具；       606—第三光探测器；
607—第三标准具；       608—第四光探测器；
7—波长测试单元；
701—第五分光束器；     702—可调光滤波器；
703—第五光探测器；     704—第六分光束器；
705—第四标准具；     706—第六光探测器；
707—第七光探测器；
8—控制与驱动单元；
9—计算机；
具体实施方式
下面结合附图和实施例进一步说明。
本发明所涉及的多通道可调谐激光器的性能测试装置的结构图如图1所示，多通道可调谐激光器的性能测试装置2主要由用于光束准直的准直耦合透镜3、第一分光束器4、功率测试单元5、边模抑制比测试单元6、波长测试单元7和控制与驱动单元8构成。控制与驱动单元8同功率测试单元5、边模抑制比测试单元6、波长测试单元7控制相连，各测试单元将测试信号反馈给控制与驱动单元8，测试与控制单元8根据反馈信号输出激光器特性指标并控制各测试单元进行下一步测试。功率测试单元5由第二分光束器501、第一光探测器502组成，第二分光束器501位于第一分光束器4的反射光路中，第一光探测器502位于第二分光束器501的透射光路，边模抑制比测试单元6位于第二分光束器501的反射光路中。第二分光束器501按一定的比例将从第一分光束器4分得的入射光分为两部分，透射光入射第一光探测器502用于光功率的测试，反射光入射边模抑制比测试单元6。
边模抑制比测试单元6包括第三分光束器601、第四分光束器604、第一标准具602、第二标准具605、第三标准具607、第二光探测器603、第三光探测器606、第四光探测器608。其中，第三分光束器601、第四分光束器604用于边模抑制比测试单元6入射光功率的分配。所述第三分光束器601位于第二分光束器501的反射光路中，第三分光束器601的反射光入射第一标准具602，第二光探测器603置于第一标准具602后用于探测透过第一标准具602的光功率；第三分光束器601的透射光入射第四分光束器604。第四分光束器604的反射光入射第二标准具605，第三光探测器606置于第二标准具605后用于探测透过第二标准具605的光功率；第四分光束器604的透射光入射第三标准具607，第四光探测器608置于第三标准具607后用于探测透过第四标准具608的光功率。
第一标准具602、第二标准具605、第三标准具607的自由光谱范围是待测可调谐激光器1通道间隔的3倍，并且任意两个标准具的透射峰之间的最近距离为所述待测可调谐激光器1的通道间隔。
波长测试单元7位于第一分光束器4的透射光路，波长测试单元7与控制与驱动单元8相连接，波长测试单元7包括第五分光束器701、第六分光束器704、可调光滤波器702、第四标准具705、第五光探测器703、第六光探测器706、第七光探测器707，第五分光束器701的透射光路设置有可调光滤波器702，第五光探测器703置于可调光滤波器702后；第五分光束器701的反射光路设置有第六分光束器704，第六分光束器704的透射光路设置第七光探测器707，反射光路设置有第四标准具705，第六光探测器706置于第四标准具705后。
波长测试单元7由波长粗测部分和波长精测部分共同组成，其中波长粗测部分用来确定被测激光器输出波长(输出通道)，波长精测部分用来测试被测激光器的精确输出波长。
第五分光束器701将波长测试单元7的入射光按一定的比例分成两束，透射光入射波长粗测部分，反射光入射波长精测部分。波长测试单元7的波长粗测部分由可调光滤波器702和第五光探测器703组成，第五分光束器701的透射光入射可调光滤波器702进行滤波，第五光探测器703置于可调光滤波器702后，用于测试透过可调光滤波器702的光功率。其中，可调光滤波器702的波长可调谐范围等于或大于待测可调谐激光器1的波长可调谐范围，其滤波带的3dB带宽应小于可调谐激光器的两个通道之间间隔，此时其3dB带宽内有且仅有一个激光器通道可以透过。波长测试单元7的波长精测部分由第六分光束器704、第四标准具705和第六光探测器706、第七光探测器707组成，第六分光束器704将入射波长精调部分的光按一定的比例分成两束，透射光入射第七光探测器707，反射光入射第四标准具705，第六光探测器706置于第四标准具705后，用于探测透过第四标准具705的光功率。其中，第四标准具705的自由光谱范围与待测可调谐激光器1的通道间隔相同，透射峰的斜率最大值点对应可调谐激光器的标准通道输出波长。
所述可调光滤波器702采用光栅和机械可调平面镜组合而成结构的可调谐滤波器、或者采用液晶可调谐滤波器、也可采用温度可调热光可调谐滤波器。若采用光栅和机械可调平面镜组合结构的可调谐滤波器则是利用光栅的分光原理，通过机械调谐平面镜改变平面镜与光栅的夹角选择不同的光栅衍射角进而改变滤波带的中心波长。若采用液晶可调谐滤波器则是利用液晶的光电特性，通过改变加在液晶滤波片上的电压改变液晶折射率进而改变滤波带的中心波长。若采用热光可调谐滤波器则是利用材料的热光特性，通过改变材料温度改变材料折射率进而改变滤波带的中心波长。
第一分光束器4、第二分光束器501、第三分光束器601、第四光分束器604、第五光分束器701、第六光分束器704采用达到分束功能的薄膜分束片或者胶合立方棱镜分束器。
本发明装置的实现的工作过程如下：
待测可调谐激光器1尾纤输出的激光输入多通道可调谐激光器的性能测试装置2后由准 直耦合透镜3准直为平行光束，经第一分光束器4分光入射功率测试单元5、边模抑制比测试单元6、波长测试单元7，在控制与驱动单元8的控制下各测试单元分别测试激光器输出激光的功率特性、边模抑制比特性和波长特性，并将测试信息反馈给控制与驱动单元8分析，输出测试结果。若加上计算机9可组建多通道可调谐激光器的自动测试***，计算机9设置多通道可调谐激光器1输出不同通道激光，多通道可调谐激光器的性能测试装置2可测出各通道的输出特性并记录在计算机9中，计算机9在测试完毕后可实现设置多通道可调谐激光器下一通道激光输出。。
功率测试单元5的功率测试功能主要由第一光探测器502实现。多通道可调谐激光器的性能测试装置2在使用前需要预先对第一光探测器502进行定标。光功率测试单元测试原理图如图2所示。测试装置使用前，在测试装置可测功率范围内以一定的步长设置不同的激光输出功率输入到性能测试装置2，并记录各输入功率所对应的第一光探测器502的光电流采样值。然后，根据测得的输入功率与第一光探测器502的光电流采样值PD1拟合输入光功率—PD1采样值关系曲线，即图中曲线a，并将其存入控制与驱动单元8。测试装置测试使用中，假设第一光探测器502测得光电流采样值为pd1，则控制与驱动单元8可根据曲线a计算此时待测可调谐激光器1的当前输出光功率为Pout。
边模抑制比测试单元6中，第三分光束器601、第四分光束器604设置为用于分配该单元入射光功率的分光束器组合。本发明实施例中，第三分光束器601的分光比采用反射光与透射光比值为1:2，第四分光束器604的分光比采用反射光与透射光比值为1:1，这样第三分光束器601和第四分光束器604将从分光束器501分得的光功率分成大小相等的三份，分别经由第一标准具602、第二标准具605、第三标准具607入射到第二光探测器603、第三光探测器606和第四光探测器608。为了保证测试结果的准确性，要求三个标准具两端面镀有反射率相同的反射膜且具有相同的厚度，三个光探测器具有相同的响应度。第一标准具602、第二标准具605、第三标准具607的自由光谱范围是待测可调谐激光器1通道间隔的3倍，并且任意两个标准具的透射峰之间的最近距离为所述待测可调谐激光器1的通道间隔。第一标准具602、第二标准具605、第三标准具607均采用两端面镀部分反射膜的空气隙标准具以减少环境温度变化对标准具透射谱的影响。
边模抑制比测试单元6的测试原理图如图3所示。假设待测可调谐激光器有n个输出通道，则第一标准具602的透射峰的峰值波长与通道1、通道4、通道7……通道3*i+1(i为整数)输出波长相对应，第二标准具605的透射峰的峰值波长与通道2、通道5、通道8……通道3*i+2输出波长相对应，第三标准具607的透射峰的峰值波长与通道3、通道6、通道9……通道3*i+3输出波长相对应。若当前激光器的输出通道为通道5，则第二标准具605用来检 测激光器主频率输出功率，第一标准具602用来检测激光器主频短波方向的边模功率，第三标准具607用来检测激光器主频长波方向的边模功率。第二光探测器603、第三光探测器606和第四光探测器608分别探测此时光电流的大小，并把三个光电流值反馈给控制与驱动单元8，找出其中两个较大的电流值，求比值推算对应的边模抑制比大小。
波长测试单元7的波长粗测部分的测试原理图如图4(a)所示。可调光滤波器702在控制与驱动单元8的驱动下从短波方向开始以一定的步长依次遍历整个波长可调谐范围，假设待测激光器的输出波长为λ0，则在λ0附近可调光滤波器702的透射率曲线经历A→B→C，第五光探测器703的采样光电流在可调光滤波器702的透射峰值与激光器输出波长λ0相对应的时候取得最大值，控制与驱动单元8记录此时的可调光滤波器702的驱动条件，该驱动条件对应的可调光滤波器702的透射峰值波长即为激光器的粗测波长。
波长精测部分的测试原理图如图4(b)所示。第四标准具705采用两端面镀有部分反射膜的空气隙标准具，其透射谱的斜率最大处对应待测激光器的标准输出波长。假设入射第七光探测器707的光功率为P1，采样光电流为I1，经过第四标准具705入射第六光探测器706的光功率为P2，采样光电流为I2，则第六光探测器706与第七光探测器707的比值为m＝I2/I1。当待测可调激光器1输出标准波长通道3时，对应第四标准具705透射峰的a点，第六光探测器706与第七光探测器707的比值为m0＝I2/I1；当待测可调激光器1输出波长为通道3但略小于通道3标准波长时，对应第四标准具705透射峰的b点，第六光探测器706与第七光探测器707的比值为m1＝I2/I1<m0；当待测可调激光器1输出波长为通道3但略大于通道3标准波长时，对应第四标准具705透射峰的b点，第六光探测器706与第七光探测器707的比值为m2＝I2/I1>m0。测试装置使用前定标输入波长与光电流比值m的关系，测试时可根据m的大小推算输出波长与标准波长之间的偏差△λ。再根据波长粗测部分测出的粗测波长找到与其最相近的标准通道输出波长，加上精测部分测得的波长偏差△λ即为测试装置测出的激光器精确波长。
目前商用高速通信***对多通道可调谐激光器的波长精度要求为±20pm，甚至±12pm，所以可调谐激光器输出波长的准确性非常重要。为此本发明提出的多通道可调谐激光器的性能测试装置2加入了波长精测部分以提高测试装置的波长测试精度。需要声明的是，本发明所适用的待测多通道可调谐激光器的边模仅出现在与其输出通道相邻一个通道间隔的特定通道内。
虽然本发明已经详细示例并描述了相关的特定实施例做参考，但对本领域的技术人员来说，在阅读和理解了该说明书和附图后，在不背离本发明的思想和范围上，可以在多通道可调谐激光器的性能测试装置的结构和制作细节上作出各种改变。这些改变都将落入本发明的 权利要求所要求的保护范围。

Claims (10)

  1. 一种多通道可调谐激光器的性能测试装置，其特征在于：
    包括准直耦合透镜(3)、第一分光束器(4)、功率测试单元(5)、边模抑制比测试单元(6)、控制与驱动单元(8)，控制与驱动单元(8)同功率测试单元(5)、边模抑制比测试单元(6)控制相连；
    功率测试单元(5)包括第二分光束器(501)、第一光探测器(502)，第一光探测器(502)位于第二分光束器(501)的透射光路，第二分光束器(501)位于第一分光束器(4)的反射光路；
    边模抑制比测试单元(6)包括第三分光束器(601)、第四分光束器(604)、第一标准具(602)、第二标准具(605)、第三标准具(607)、第二光探测器(603)、第三光探测器(606)、第四光探测器(608)；所述第三分光束器(601)位于第二分光束器(501)的反射光路中，第三分光束器(601)的反射光路依次设置第一标准具(602)、第二光探测器(603)；第三分光束器(601)的透射光路设置有第四光分束器(604)，第四分光束器(604)的反射光路依次设置第二标准具(605)、第三光探测器(606)；第四分光束器(604)的透射光路依次设置第三标准具(607)、第四光探测器(608)；所述第一标准具(602)、第二标准具(605)、第三标准具(607)的自由光谱范围是待测所述可调谐激光器通道间隔的三倍，任意两个标准具的透射峰之间的最近距离为所述待测可调谐激光器的通道间隔。
  2. 根据权利要求1所述的一种多通道可调谐激光器的性能测试装置，其特征在于：
    所述功率测试单元(5)的第一光探测器(502)需定标，其定标方法为：建立所述该多通道可调谐激光器的性能测试装置的输入光功率与第一光探测器(502)采样光电流的对应关系。
  3. 根据权利要求1所述的一种多通道可调谐激光器的性能测试装置，其特征在于：进一步包括设置于第一分光束器(4)透射光路的波长测试单元(7)，波长测试单元(7)和控制与驱动单元(8)相连接，波长测试单元(7)包括第五分光束器(701)、第六分光束器(704)、可调光滤波器(702)、第四标准具(705)、第五光探测器(703)、第六光探测器(706)、第七光探测器(707)，第五分光束器(701)的透射光路依次设置可调光滤波器(702)、第五光探测器(703)；第五分光束器(701)的反射光路设置有第六分光束器(704)，第六分光束器(704)的透射光路设置第七光探测器(707)，第六分光束器(704)的反射光路依次设置第四标准具(705)、第六光探测器(706)。
  4. 根据权利要求3所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述可调光滤波器(702)的波长可调谐范围等于或大于待测可调谐激光器的波长可调谐范围，所述可调光滤波器(702)滤波带的3dB带宽小于待测可调谐激光器的两个通道之间间隔。
  5. 根据权利要求4所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述可调光滤波器(702)采用光栅和机械可调平面镜组合而成的可调谐滤波器或者采用液晶可调谐滤波器或者采用温度可调热光可调谐滤波器。
  6. 根据权利要求3所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述第一标准具(602)、第二标准具(605)、第三标准具(607)、第四标准具(705)为两端面镀部分反射膜的空气隙标准具。
  7. 根据权利要求3所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述第一分光束器(4)、第二分光束器(501)、第三分光束器(601)、第四光分束器(604)、第五光分束器(701)、第六光分束器(704)采用薄膜分束片或者胶合立方棱镜分束器。
  8. 根据权利要求1或2所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述边模抑制比测试单元(6)的第三分光束器(601)、第四分光束器(604)是用于分配该单元的入射光功率的分光束器组合。
  9. 根据权利要求8所述的一种多通道可调谐激光器的性能测试装置，其特征在于：所述第三分光束器(601)的分光比采用反射光与透射光比值为1:2，第四分光束器(604)的分光比采用反射光与透射光比值为1:1。
  10. 根据权利要求1或2所述的一种多通道可调谐激光器的性能测试装置，其特征在于：进一步设置有计算机(9)，所述计算机(9)可实现设置多通道可调谐激光器输出激光，并且记录测试当前通道激光输出特性。
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CN104538841A (zh) * 2014-12-19 2015-04-22 武汉光迅科技股份有限公司 一种基于阵列波导光栅的混合集成外腔可调激光器
CN104792497A (zh) * 2015-03-25 2015-07-22 武汉光迅科技股份有限公司 一种采用可调谐激光光源的光谱测试***
CN105115700A (zh) * 2015-07-28 2015-12-02 武汉光迅科技股份有限公司 一种多通道可调激光器的性能测试装置

Cited By (2)

* Cited by examiner, † Cited by third party
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CN115078887A (zh) * 2022-07-20 2022-09-20 度亘激光技术（苏州）有限公司 半导体激光器老化测试方法及装置
CN115078887B (zh) * 2022-07-20 2022-11-25 度亘激光技术（苏州）有限公司 半导体激光器老化测试方法及装置

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